Multiple nuclide imaging in live mouse using semiconductor compton camera for multiple molecular imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Motomura; Y. Kanayama; H. Haba; Y. Watanabe; S. Enomoto
Year: 2007
Digital autoradiography imaging using CMOS technology: First tritium autoradiography with a back-thinned CMOS detector and comparison of CMOS imaging performance with autoradiography film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cabello; K. Wells; A. Metaxas; A. Bailey; I. Kitchen; A. Clark; M. Prydderch; R. Turchetta
Year: 2007
Experimental evaluation of the bilinear transformation used in the CT-based attenuation correction for small animal PET imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianhua Yu; J. Seidel; M. Pomper; B.M.W. Tsui
Year: 2007
Small-animal PET registration method with intrinsic validation designed for large datasets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Pascau; J.D. Gispert; M. Soto-Montenegro; A. Rodriguez-Ruano; V. Garcia-Vazquez; A. Udias; J.J. Vaquero; M. Desco
Year: 2007
Spatial resolution of a small cubic LYSO scintillator crystal detector with depth-of-interaction capabilities in a small animal PET scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Perera; M. Lerch; A. Rosenfeld; S.R. Meikle; J. Chan
Year: 2007
Fusion of myocardial perfusion data with CT coronary angiography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.L. Faber; C.A. Santana; Ji Chen; E.V. Garcia
Year: 2007
Development of a dual modality imaging system: A combined gamma camera and optical imager
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Ho Jung; Yong Choi; Key Jo Hong; Byung Jun Min; Seyjoon Park; Joon Young Choi; Yearn Seong Choe; Kyung-Han Lee; Byung-Tae Kim
Year: 2007
Coincidence timing analysis of APD based PET detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lenox; A. McFarland; Z. Burbar; C. Hayden
Year: 2007
Performance evaluation of a small field-of-view, mobile PET/SPECT system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.T. Studenski; J.G. Parker; D.R. Gilland; S. Majewski; B. Hammond
Year: 2007
Investigation of PET/MRI image fusion schemes for enhanced breast cancer diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.G. Baum; K. Rafferty; M. Helguera; E. Schmidt
Year: 2007
Initial patient study with dedicated dual-modality SPECT-CT mammotomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Madhav; S.J. Cutler; K.L. Perez; D.J. Crotty; R.L. McKinley; T.Z. Wong; M.P. Tornai
Year: 2007
Development of dental tomosynthesis system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.K. Cho; H.K. Kim; S.-S. Kim; T.W. Kim; S.T. Kim; S.H. Shin
Year: 2007
Experimental verification of a hand held electronically-collimated radiation detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.H. Hill; K.L. Matthews
Year: 2007
New directions for dMiCE - a depth-of-interaction detector design for PET scanners.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.K. Lewellen; L.R. MacDonald; R.S. Miyaoka; W. McDougald; K. Champley
Year: 2007
Maximum likelihood positioning of scintillation events: Preliminary experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenze Xi; J. Seidel; J. Kakareka; J. Proffitt; A.G. Weisenberger; S. Majewski; T. Pohida; M.V. Green; P. Choyke
Year: 2007
Optimization of a rotating modulation collimator for neutron stimulated emission computed tomography (NSECT) imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C. Sharma; A.J. Kapadia; B.P. Harrawood; G.D. Tourassi
Year: 2007
A prototype CZT-based PET scanner for high resolution mouse brain imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Vaska; A. Dragone; W. Lee; D.-H. Kim; J.-F. Pratte; Y.-G. Cui; J. Fried; S. Krishnamoorthy; A. Bolotnikov; S.-J. Park; P. O'Connor; F.A. Dilmanian; R.B. James
Year: 2007
SNR performance comparison of dual-layer detector and dual-kVp spectral CT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.J. Heismann; S. Wirth
Year: 2007
Tomosynthesis through a time delay integration sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Frosio; N.A. Borghese
Year: 2007
Optimization of energy window widths in basis material decomposition using a multi-window photon counting X-ray detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaolan Wang; Jingyan Xu; E.C. Frey
Year: 2007
Imaging characteristics of the direct and mobile indirect digital radiographic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyo-Min Cho; Hee-Joung Kim; Chang-Lae Lee; Sora Nam; Ji-Young Jung
Year: 2007
New concurrent acquisition and reconstruction (CAR) system for PET study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.K. Hong; H.K. Kim; Z. Burbar; Y.B. Kim; Z.H. Cho
Year: 2007
A fast statistical image reconstruction algorithm for TOF-PET using DRAMA (Dynamic RAMLA) strategy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Tanaka; K. Ote; T. Isobe; M. Watanabe; T. Yamashita
Year: 2007
Determination of the system matrix used in list-mode EM reconstruction of PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Chen; S.J. Glick
Year: 2007
A penalized Algebraic Reconstruction Technique (pART) for PET image reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long Zhang; S. Vandenberghe; S. Staelens; I. Lemahieu
Year: 2007
Revised consistency conditions for PET data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Herraiz; S. Espana; E. Vicente; E. Herranz; J.J. Vaquero; M. Desco; J.M. Udias
Year: 2007
Dual gating method for eliminating motion-related inaccuracies in cardiac PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kokki; M. Teras; H.T. Sipila; T. Noponen; J. Knuuti
Year: 2007
Improved image reconstruction in small animal PET using a priori estimates of single-pixel events
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Espaa; J.L. Herraiz; E. Vicente; E. Herranz; J.J. Vaquero; M. Desco; J.M. Udias
Year: 2007
Quantitative accuracy of penalized-likelihood reconstruction for ROI activity estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Fu; J.R. Stickel; R.D. Badawi; Jinyi Qi
Year: 2007
Direct 3D-reconstruction from a single 2D-image obtained through a coded-aperture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X. Hubert; D. Chambellan; S. Legoupil; J.-R. Deverre; N. Paragios
Year: 2007
Spatially-adaptive analytical reconstruction of quantitative gated cardiac SPECT in KL domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Fan; Hongbing Lu; Xin Liu; Shuyi Wang; Zhengrong Liang
Year: 2007
Four-dimensional gated cardiac SPECT reconstruction and evaluation study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mingwu Jin; Yongyi Yang; J.G. Brankov; M.N. Wernick; Bing Feng; P.H. Pretorius; M.A. King
Year: 2007
Quantitative evaluation of Half-Cone-Beam data acquisition trajectories in triple- camera brain SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Ter-Antonyan; R.J. Jaszczak; J.E. Bowsher; K.L. Greer; S.D. Metzler
Year: 2007
An optimized reprojection method with least angle-dependent error
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Guedouar; B. Zarrad
Year: 2007
On the aliasing artifacts in airect aourier methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianping Cheng; Hewei Gao; Li Zhang; Yuxiang Xing; Zhiqiang Chen
Year: 2007
Comparison of reconstruction algorithms to extend CT reconstruction field-of-view
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baojun Li; Jiang Hsieh
Year: 2007
Combined algorithmic and hardware acceleration for ultra-fast backprojection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Brokish; Y. Bresler
Year: 2007
3D ROI imaging with a detector smaller than the imaged object
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junguo Bian; Xiaochuan Pan
Year: 2007
GPU-based 3D cone-beam CT image reconstruction: application to micro CT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xing Zhao; Junguo Bian; E.Y. Sidky; Seungryong Cho; Peng Zhang; Xiaochuan Pan
Year: 2007
Real-time cone-beam CT image reconstruction using a mercury’s dual cell-based system (DCBS) and a Sony’s Playstation 3 (PS3) cluster
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Knaup; M. Kachelriess
Year: 2007
3D analytic cone-beam reconstruction for less than a full scan using a multi-source CT system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhye Yin; B.K. DeMan
Year: 2007
Evaluation of three analytical methods for reconstruction from cone-beam data on a short circular scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Dennerlein; F. Noo; S. Hoppe; J. Hornegger; G. Lauritsch
Year: 2007
A segmentation algorithm for heterogeneous tumor automatic delineation in PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hatt; C. Roux; D. Visvikis
Year: 2007
Respiratory-motion errors in quantitative myocardial perfusion with PET/CT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Shkvorets; R.A. deKemp; R.G. Wells
Year: 2007
Collimator-detector response compensation in quantitative SPECT reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shaoying Liu; T.H. Farncombe
Year: 2007
Recombining respiratory gated PET frames
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Kesner; M. Dahlbom; J. Czernin; D.H.S. Silverman
Year: 2007
Influence of random, pile-up and scatter corrections in the quantification properties of small-animal PET scanners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Vicente; M. Soto-Montenegro; S. Espaa; J.L. Herraiz; E. Herranz; J.J. Vaquero; M. Desco; J.M. Udias
Year: 2007
A unified system identification approach to dynamic PET parametric imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuang Deng; Pengcheng Shi
Year: 2007
Movement correction of [18F]FDDNP PET studies for brain amyloid imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koon-Pong Wong; M. Wardak; Weber Shao; Zicong Zhou; M. Dahlbom; L. Smid; D. Truong; V. Kepe; G.W. Small; J.R. Barrio; Sung-Cheng Huang
Year: 2007
Rapid optimization of SPECT scatter correction using model LROC observers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kulkarni; P. Khurd; L. Zhou; G. Gindi
Year: 2007
Monte Carlo simulations studies in small animal PET using GATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Branco; S. Jan; P. Almeida
Year: 2007
SIMIND based pinhole imaging: Development and validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Sundin; M. Ljungberg
Year: 2007
A generalized simulation description language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.L. Harrison; P.E. Kinahan; T.K. Lewellen
Year: 2007
Image processing method for analyzing cerebral blood-flow using SPECT and MRI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kudo; M. Nomura; T. Asada; T. Takeda
Year: 2007
PET Imaging with 62Cu-ETS in a human clinical trial at the university of wisconsin - madison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Lacy; L. Guerrero; R. Chiu; Liang Sun; L. Hall; C.K. Stone
Year: 2007
Image-guided surgery planning for breast reconstruction flap design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pengfei Huang; Lixu Gu; Hua Xu; Jiasheng Dong; Jie Liu; Jingsi Zhang; Jiasi Song; Xiao Yu; Weitao Chen; Hongshan Zhou; Bowen Li; Wei Pei
Year: 2007
Kinetic modeling of PET data and FDG continuous infusion in rat tumors simultaneously treated with PDT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bentourkia; P. Boubacar; V. Berard; J.E. van Lier; R. Lecomte
Year: 2007
Molecular breast imaging with directly opposing compact gamma cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.G. Judy; B. Welch; T. St. Saviour; D. Kieper; S. Majewski; J. McKisson; B. Kross; J. Proffitt; A. Stolin; M.J. More; N.L. Dinion; M.B. Williams
Year: 2007
Comparison of reduced angle and fully 3D acquisition sequencing and trajectories for dual-modality mammotomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.J. Cutler; P. Madhav; K.L. Perez; D.J. Crotty; M.P. Tornai
Year: 2007
Feasibility studies for extracting an input function for quantitative positron emission tomography using a wrist scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kriplani; D. Schlyer; P. Vaska; C. Woody; S. Stoll; J. Logan; S. Southekal; S. Junnarkar; J.F. Pratte
Year: 2007
Geiger photodiodes for diffuse optical correlation tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sia; C.J. Stapels; E.B. Johnson; T. Durduran; C. Zhou; G. Yu; A.G. Yodh; F.L. Augustine; J.F. Christian
Year: 2007
Tiny a priori knowledge solves the interior problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kudo; M. Courdurier; F. Noo; M. Defrise
Year: 2007
List-mode data reconstruction via the finite Hilbert transform of the derivative of the backprojection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.L. Zeng
Year: 2007
Implementation of the derivative back projection - finite Hilbert inverse algorithm in projection reconstruction MRI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.K. Barral; N.J. Pelc; J.M. Pauly; D.G. Nishimura
Year: 2007
Constriction of cone-beam artifacts by the Z-smart reconstruction method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Dennerlein; F. Noo; W. Harer; J. Hornegger; G. Lauritsch
Year: 2007
Evaluation of the impact of view differentiation and backprojection weight in circle-plus-line cone-beam tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hoppe; F. Dennerlein; G. Lauritsch; J. Hornegger; F. Noo
Year: 2007
Attenuation corrected tensor tomography - attenuation helps in the case of insufficient measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiu Huang; G.T. Gullberg
Year: 2007
“PlanTIS: A positron emission tomograph for imaging 11C Transport in Plants”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Streun; S. Beer; T. Hombach; S. Jahnke; M. Khodaverdi; H. Larue; S. Minwuyelet; C. Pari; G. Roeb; U. Schurr; K. Ziemons
Year: 2007
Comparison of in-beam and off-beam PET experiments at hard photons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Mockel; T. Kluge; J. Pawelke; W. Enghardt
Year: 2007
The initial design and feasibility study of an affordable high-resolution 100-cm long PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wai-Hoi Wong; Yuxuan Zhang; Hongdi Li; H. Baghaei; R. Ramirez; Jiguo Liu; Shitao Liu
Year: 2007
Fisher information-based evaluation of image quality for time-of-flight PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Vunckx; Lin Zhou; S. Matej; M. Defrise; J. Nuyts
Year: 2007
An anatomically based regionally adaptive prior for MAP reconstruction in emission tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung Chan; R. Fulton; D.D. Feng; Weidong Cai; S. Meikle
Year: 2007
New anatomical-prior-based image reconstruction method for PET/SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Mameuda; H. Kudo
Year: 2007
The use of mutual information and joint entropy for anatomical priors in emission tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Nuyts
Year: 2007
A nonparametric bayesian approach for PET reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Barat; C. Comtat; T. Dautremer; T. Montagu; R. Trebossen
Year: 2007
PET image reconstruction with anatomical prior using multiphase level set method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinxiu Liao; Jinyi Qi
Year: 2007
Potential equivalence of sinogram and image-domain penalized likelihood methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.J. La Riviere; P. Vargas
Year: 2007
The feasibility of performing longitudinal measurements in mice using small animal PET imaging and a microfluidic blood sampling device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsiao-Ming Wu; A.S. Yu; Hong-Dun Lin; W. Ladno; Sung-Cheng Huang; M.E. Phelps
Year: 2007
Performance characterization of a high-sensitivity small-animal PET scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chien-Min Kao; Qingguo Xie; Yun Dong; Lu Wan; Chin-Tu Chen
Year: 2007
The design and performance of the 2nd-generation RatCAP awake rat brain PET system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Vaska; C. Woody; D. Schlyer; J.-F. Pratte; S. Junnarkar; S. Southekal; S. Stoll; D. Schulz; W. Schiffer; D. Alexoff; D. Lee; V. Patel; M. Purschke; W. Lee; J. Fried; W. Lenz; S. Krishnamoorthy; S. Maramraju; A. Kriplani; V. Radeka; P. O'Connor; R. Lecomte; R. Fontaine
Year: 2007
Performance evaluation of the LabPET™ APD-based digital PET scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bergeron; J. Cadorette; J.-F. Beaudoin; J.A. Rousseau; M. Dumoulin; M.D. Lepage; G. Robert; V. Selivanov; M.-A. Tetrault; N. Viscogliosi; T. Dumouchel; S. Thorn; J. DaSilva; R.A. deKemp; J.P. Norenberg; R. Fontaine; R. Lecomte
Year: 2007
Quantification Issues in Imaging Data of MADPET-II small animal PET scanner using a system matrix based on Monte Carlo techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Torres-Espallardo; V.C. Spanoudaki; M. Rafecas; J. Schirmer; S.I. Ziegler
Year: 2007
Initial studies of PET-SPECT dual-tracer imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yiping Shao; Rutao Yao; Tianyu Ma; P. Manchiraju
Year: 2007
3D-OSEM Reconstruction from truncated data in pinhole SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Zeniya; H. Watabe; T. Inomata; H. Iida; A. Sohlberg; H. Kudo
Year: 2007
Attenuation correction in SPECT images reconstructed on multi-resolution point clouds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Boutchko; A. Sitek; G.T. Gullberg
Year: 2007
Correction for photon attenuation without transmission measurements using compton scatter information in SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sitek; S.C. Moore; M.F. Kijewski
Year: 2007
Fully 4-D dynamic cardiac SPECT image reconstruction using spatiotemporal B-spline voxelization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.W. Reutter; G.T. Gullberg; R. Boutchko; K. Balakrishnan; E.H. Botvinick; R.H. Huesman
Year: 2007
Choosing anatomical-prior strength for MAP SPECT reconstruction to maximize lesion detectability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Lehovich; H.C. Gifford; P.B. Schneider; M.A. King
Year: 2007
Impact of mismatched detector-blur models on 67Ga SPECT tumor detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.C. Gifford; M.A. King
Year: 2007
Real time digital implementation of the high-yield-pileup-event-recover (HYPER) method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiguo Liu; Hongdi Li; Yu Wang; Soonseok Kim; Yuxuan Zhang; Shitao Liu; H. Baghaei; R. Ramirez; Wai-Hoi Wong
Year: 2007
Low-cost high-resolution 3rd generation PMT-quadrant- sharing (PQS) BGO block detectors for human and animal PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shitao Liu; Jiguo Liu; Yuxuan Zhang; Hongdi Li; R.A. Ramirez; Yu Wang; H. Baghaei; Wai-Hoi Wong
Year: 2007
PET gantry simulation: Concepts and methods for inexpensively reproducing the PET data acquisition environment using a single PC with the PDT card
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.F. Jones; E. Breeding; C. Olarte; J. Everman; S. Tolbert; J.H. Reed; M. Casey
Year: 2007
Use of anatomical priors in the segmentation of PET lung tumor images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinman Kim; Lingfeng Wen; S. Eberl; R. Fulton; D.D. Feng
Year: 2007
Impact of crystal quality, geometry and surface finish for 3D impact position measurements in gamma ray detection systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.R. Garcia; C.W. Lerche; A. Munar; F. Sanchez; A. Sebastia; J.M. Benlloch
Year: 2007
Development of anatomically realistic PET and PET/CT phantoms with rapid prototyping technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Miller; G.D. Hutchins
Year: 2007
Quantifying the effects of defective block detectors in a 3D whole body pet camera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Samiee; A.L. Goertzen
Year: 2007
Continuously sampled digital pulse processing for inveon small animal PET scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.R. McFarland; S. Siegel; D.F. Newport; R. Mintzer; B. Atkins; M. Lenox
Year: 2007
Impact of instrumentation parameters on the performance of neural network based positioning algorithms for monolithic scintillator blocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bruyndonckx; Li Zhi; C. Lemaitre; J.M. Perez; P. Rato; D. Schaart; M. Maas; D. Van der Laan; S. Tavernier; Wang Yonggang
Year: 2007
Potential advantages of digitally sampling scintillation pulses in timing determination in PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qingguo Xie; Chien-Min Kao; Xi Wang; Ning Guo; Caigang Zhu; H. Frisch; W.W. Moses; Chin-Tu Chen
Year: 2007
Expanding SimSET to include block detectors: performance with pseudo-blocks and a true block model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.E. Schmitz; S.B. Gillispie; R.L. Harrison; L.R. MacDonald; P.E. Kinahan; T.K. Lewellen
Year: 2007
High-sensitivity SPECT imaging using large collimator holes and geometric blurring compensation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Zhang; G.L. Zeng
Year: 2007
Determination of geometrical parameters for slit-slat SPECT imaging on MicroPET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tianyu Ma; Rutao Yao; Yiping Shao
Year: 2007
Motion capture of chest and abdominal markers using a flexible multi-camera motion-tracking system for correcting motion-induced artifacts in cardiac SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.E. McNamara; Bing Feng; K. Johnson; Sonxiang Gu; M.A. Gennert; M.A. King
Year: 2007
Small animal imaging with attenuation correction using clinical SPECT/CT scanners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Boutchko; K. Balakrishnan; B.W. Reutter; A. Sauve; G.T. Gullberg
Year: 2007
Four-layer DOI detector with a relative offset in animal PET system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ito; Seong Jong Hong; Jae Sung Lee; Sun Il Kwon; Geon Song Lee; Kwang Suk Park; Byungsik Hong; Kyong Sei Lee; Seok Jae Lee; June Tak Rhee; Kwang-Souk Sim
Year: 2007
Design study for the ClearPET/XPAD small animal PET/CT scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Khodaverdi; S. Nicol; J. Loess; F.C. Brunner; S. Karkar; C. Morel
Year: 2007
Semi-automatic elastic registration applied to a ß-Autoradiography brain atlas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cabello; K. Wells; A. Bailey; I. Kitchen
Year: 2007
Improving the intrinsic spatial resolution performance of the continuous miniature crystal element (cMiCE) detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao Ling; T.K. Lewellen; R.S. Miyaoka
Year: 2007
Calibration procedure for a continuous miniature crystal element (cMiCE) detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.S. Miyaoka; Tao Ling; C. Lockhart; T.K. Lewellen
Year: 2007
Anatomical priors to improve image quality in small-animal SPECT/CT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.G. Wells
Year: 2007
Evaluation of a MR-compatible CZT detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Despres; E.W. Izaguirre; Siyuan Liu; L.J. Cirignano; Hadong Kim; M.F. Wendland; K.S. Shah; B.H. Hasegawa
Year: 2007
Alternative methods for attenuation correction for PET images in MR-PET scanners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.R. Kops; H. Herzog
Year: 2007
Difference imaging of inter- and intra-ictal SPECT images for the localization of seizure onset in epilepsy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Hahn; V. Daum; J. Hornegger; W. Bautz; T. Kuwert
Year: 2007
Investigation of respiratory motion gating with geometric sensitivity in Allegro PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianfeng He; G.J. O'Keefe; S.J. Gong; T. Saunder; G. Jones; A.M. Scott; M. Geso
Year: 2007
Nerve fiber mapping of the human visual cortex using Polarized Light Imaging (PLI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Axer; H. Axer; D. Grassel; K. Amunts; K. Zilles; U. Pietrzyk
Year: 2007
Optical and electrical crosstalk in pin photodiode array for medical imaging applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Goushcha; B. Tabbert; A.O. Goushcha
Year: 2007
Method of calibrating response statistics for ML estimation of 3D interaction position in a thick-detector gamma camera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.C.J. Hunter; H.H. Barrett; L.R. Furenlid; S.K. Moore
Year: 2007
Improvement of the imaging resolution for a Compton camera by determination of the interaction depth in a 25-segmented germanium detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyo Soon Jung; Ju Hahn Lee; Young Kwan Kwon; Hee Seo; Chan Hyeong Kim; Chun Sik Lee
Year: 2007
Automatic exposure control (AEC) for dual energy computed tomography (DECT)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Stenner; M. Kachelriess
Year: 2007
Development of a multi-energy CT for small animals: Characterization of the quasi-monochromatic X-ray source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Masetti; M. Fiaschetti; A. Turco; L. Roma; P.L. Rossi; M. Mariselli; N. Lanconelli; G. Baldazzi
Year: 2007
Achieving uniform noise in direct fan-beam CT reconstruction through bowtie filter design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Wunderlich; F. Noo
Year: 2007
A novel approach to the visualization of four-dimensional cerebral angiography with cine angiography data measured at several views
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Nyui; K. Ogawa; E. Kunieda
Year: 2007
Estimating the optimal iteration number in iterative reconstruction: A statistical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Conti; M.E. Casey
Year: 2007
Influence of the time of flight information on the reconstruction of in-beam PET data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Shakirin; P. Crespo; H. Braess; W. Enghardt
Year: 2007
Reconstruction of 4-Layer DOI detector equipped C-shaped PEM via list-mode iterative algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Yamada; K. Kitamura; N. Hashizume; Y. Yamakawa; Y. Kumazawa
Year: 2007
Fully 4D reconstruction applied to respiratory gated PET acquisitions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Grotus; A.J. Reader; R. Brinks; P. Maniawski; V. Servois; J.-C. Rosenwald; P. Giraud; I. Buvat
Year: 2007
Analysis of the dependence of PET/CT quantification on iterative reconstruction parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.C. Kappadath; Tinsu Pan; W.D. Erwin; O. Mawlawi
Year: 2007
Bayesian reconstructions with PDE image model for emission tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhentian Wang; Li Zhang; Yuxiang Xing; Ziran Zhao; Kejun Kang
Year: 2007
An LOR-based fully-3D PET image reconstruction using a blob-basis function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Hu; W. Wang; E.E. Gualtieri; Y.L. Hsieh; J.S. Karp; S. Matej; M.J. Parma; C.H. Tung; E.S. Walsh; M. Werner; D. Gagnon
Year: 2007
Simulation of compton reconstruction in liquid xenon PET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Bryman; L. Kurchaninov; P. Lu; F. Retiere; V. Sossi
Year: 2007
Estimation of detector response function for PET from point source measurements: Effect of point source configuration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Tohme; Jinyi Qi
Year: 2007
Analysis of organ uniformity in low count density penalized likelihood PET images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Asma; R. Manjeshwar
Year: 2007
The signature of drifting sensitivity and centre-of-rotation in SPM analysis of multi-head gammacamera brain SPECT and a method of correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Barnden
Year: 2007
Application of neural networks to the identification of the compton interaction sequence in compton imagers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Zoglauer; S.E. Boggs
Year: 2007
Half-cone-beam data sufficiency in triple-camera SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Ter-Antonyan; R.J. Jaszczak; J.E. Bowsher; K.L. Greer; S.D. Metzler
Year: 2007
Non-uniform resolution compensation in tomographic image reconstruction methods using median based priors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ahmad; A. Todd-Pokropek
Year: 2007
Study of an iterative super-resolution algorithm and its feasibility in high-resolution animal imaging with low-resolution SPECT cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.J. Caramelo; G. Almeida; L. Mendes; N.C. Ferreira
Year: 2007
Rawdata-Based Dual Energy CT (DECT) from inconsistent scans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Knaup; P. Stenner; M. Kachelriess
Year: 2007
Ultra-fast hierarchical backprojection for Micro-CT reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Brokish; Y. Bresler
Year: 2007
Fast GPU-Based CT Reconstruction using the Common Unified Device Architecture (CUDA)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Scherl; B. Keck; M. Kowarschik; J. Hornegger
Year: 2007
Comparative evaluation of two analytical methods for Helical Cone-Beam Tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Schondube; K. Stierstorfer; F. Dennerlein; F. Noo
Year: 2007
Comparative assessment of ESSE and DEW Scatter Compensation Methods for Myocardial Perfusion SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Devakumar; Xin He; E.C. Frey
Year: 2007
A Global and a segmented plane scatter calibration: improving the quantitative accuracy of frames with high random fraction and/or low number of counts in dynamic high resolution PET brain imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ju-Chieh Cheng; A. Rahmim; S. Blinder; V. Sossi
Year: 2007
Single input multiple output (SIMO) optimization for input function estimation: a simulation study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Su; M.J. Welch; K.I. Shoghi
Year: 2007
Accuracy of CT-Based attenuation correction in bone imaging with PET/CT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Abella; D. Mankof; J.J. Vaquero; M. Desco; P.E. Kinahan
Year: 2007
Parametric image of regional bone metabolism using F-18 PET using a multiple linear regression analysis method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Su Jin Kim; Jae Sung Lee; Won Woo Lee; Yu Kyeong Kim; Sung-June Jang; Kyu Ri Son; Hyo-Cheol Kim; Jin Wook Chung; Dong Soo Lee
Year: 2007
Estimation accuracy of ejection fraction in gated cardiac SPECT/CT imaging using iterative reconstruction with 3D resolution recovery in rapid acquisition Protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Zeintl; Xinhong Ding; A.H. Vija; E.G. Hawman; J. Hornegger; T. Kuwert
Year: 2007
Effects of LSO detector intrisic radioactivity on SPECT imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rutao Yao; Tianyu Ma; Yiping Shao
Year: 2007
Impact of variability in respiration on estimation and correction of respiratory motion of the heart in SPECT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Dey; K.J. Johnson; P.H. Pretorius; J. Mitra; M.A. King
Year: 2007
Omission of serial arterial blood sampling for quantitative analysis of monkey PET data using independent component analysis-based method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Naganawa; H. Tsukada; H. Ohba; K. Ishiwata; C. Seki; M. Shidahara; Y. Kimura
Year: 2007
Benchmarking of a motion sensing system for medical imaging and radiotherapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Barnes; C. Baldock; S. Meikle; R. Fulton
Year: 2007
Effect of different reconstruction algorithms on the dynamics and modeling parameters of 18F-Galacto-RGD in mice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.W. Weber; R. Haubner; B. Wolf; S.I. Ziegler
Year: 2007
System evaluation for in vivo imaging of amyloid beta plaques in a mouse brain using statistical tecision theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shokouhi; D.W. Wilson; W. Pham; T.E. Peterson
Year: 2007
Comparative evaluation of three microPET series systems using Monte Carlo simulation: sensitivity and scatter fraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Su Kim; Jae Sung Lee; Min Jae Park; Seong Jong Hong; Dong Soo Lee
Year: 2007
Effect of respiratory motion on abdominal C-arm CT angiography using the 4D NCAT phantom
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.S.K. Fung; W.P. Segars; J.-F.H. Geschwind; B.M.W. Tsui; K. Taguchi
Year: 2007
Effect of measurement uncertainty on region of interest based and parametric binding potential estimates for the high resolution research tomograph (HRRT)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sossi; S. Blinder; A. Rahmim; K. Dinelle; K.J.-C. Cheng; S.C. Lidstone
Year: 2007
Least-square pinhole SPECT calibration using a forward projector modeling misalignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Wietholt; Chin-Tu Chen; Geng Fu; Ling-Jian Meng
Year: 2007
Fast analytical modeling of Compton scatter using point clouds and graphics processing unit (GPU)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sitek; G. El Fakhri; Jinsong Ouyang; J.S. Maltz
Year: 2007
Simulating lung tumor motion for dynamic tumor-tracking irradiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nakao; A. Kawashima; M. Kokubo; K. Minato
Year: 2007
Development of a gamma camera based on an 8×8 array of LaBr3(Ce) scintillator pixels coupled to a 64-channel multi-anode PMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kubo; K. Hattori; C. Ida; S. Iwaki; S. Kabuki; S. Kurosawa; K. Miuchi; T. Nagayoshi; H. Nishimura; Y. Okada; R. Orito; A. Takada; T. Tanimori; K. Tsuchiya; K. Ueno
Year: 2007
Development of the fully-depleted thick back- illuminated CCD by Hamamatsu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Suzuki; M. Muramatsu; K. Yamamoto; S. Miyazaki; Y. Kamata
Year: 2007
Integrated signal processing of CMOS Geiger photodiode arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.J. Stapels; E.B. Johnson; R. Sia; F.L. Augustine; J.F. Christian
Year: 2007
Spectroscopy and timing with Multi-Pixel Photon Counters (MPPC) and LYSO scintillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Szawlowski; D. Meier; G. Maehlum; D.J. Wagenaar; B.E. Patt
Year: 2007
New time to digital converter, signal processing, data acquisition, calibration and test hardware for RatCAP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Junnarkar; J. Fried; S. Southekal; S.H. Maramraju; J.-F. Pratte; P. O'Connor; V. Radeka; P. Vaska; C. Woody; D. Schlyer; R. Fontaine
Year: 2007
A radiation hard pixel design for x-ray imagers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Zelakiewicz; D. Albagli; W. Hennessy; A. Couture
Year: 2007
Modeling charge-sharing effects in pixellated CZT detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Iniewski; H. Chen; G. Bindley; I. Kuvvetli; C. Budtz-Jorgensen
Year: 2007
Novel front-end pulse processing scheme for PET system based on pulse width modulation and pulse train method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Shimazoe; H. Takahashi; S. Boxuan; T. Furumiya; J. Ooi; Y. Kumazawa; H. Murayama
Year: 2007
Optimization of design parameters of a prototype CCD-based lens-coupled imaging system for the detection of beta particles in a microfluidic chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.S. Cho; N.T. Vu; Z.T.F. Yu; R.W. Silverman; R. Taschereau; Hsian-Rong Tseng; A.F. Chatziioannou
Year: 2007
Global-local-grouping multi-grid-type MSGC for neutron applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Takada; H. Takahashi; K. Fujita; H. Niko; M. Furusaka; H. Toyokawa; K. Ishitoya; N. Hikida; Y. Yarimizu; K. Tsuji; M. Hirota; M. Nikaido
Year: 2007
Development of neutron gaseous detector with GEM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Uno; M. Sekimoto; T. Murakami; M. Tanaka; S. Nakagawa; E. Nakano; F. Sugiyama; K. Nagaya; A. Sugiyama; T. Uchida
Year: 2007
The photon-assisted cascaded electron multiplier operation in CF4 for ion backflow suppression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.D. Amaro; J.F.C. Veloso; J.M.F. dos Santos; A. Breskin; R. Chechik; A. Lyashenko
Year: 2007
A study of GEM foils produced at Tech-Etch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Azmoun; A. Caccavano; D. Crary; J. Herstoff; K. Kearney; G. Keeler; R. Majka; G. Saini; J. Sinsheimer; F. Simon; N. Smirnov; B. Surrow; C. Woody
Year: 2007
Large bulk-micromegas detectors for TPC applications in HEP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Baron; M. Boyer; D. Calvet; P. Colas; X. De La Broise; E. Delagnes; A. Delbart; F. Druillole; S. Emery; A. Giganon; I. Giomataris; E. Mazzucato; E. Monmarthe; F. Nizery; F. Pierre; J.-M. Reymond; J.-L. Ritou; A. Sarrat; M. Zito; R. De Oliveira
Year: 2007
Development and performance evaluation of Thick-GEM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Yamaguchi; H. Hamagaki; T. Gunji; S. Oda; Y. Aramaki; S. Sano; T. Tamagawa
Year: 2007
Development of new hole-type avalanche detectors and the first results of their applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Charpak; P. Benaben; P. Breuil; A. Di Mauro; P. Martinengo; V. Peskov
Year: 2007
High spatial resolution in β-imaging with a PIM device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Donnard; D. Thers; N. Servagent; L. Luquin
Year: 2007
The commissioning of the GEM detector for the muon apparatus of the LHCb experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Alfonsi; G. Bencivenni; W. Bonivento; A. Cardini; F. Murtas; R. Oldeman; M.P. Lener; B. Saitta
Year: 2007
Radiation sensor research and development in New Zealand
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Krofcheck
Year: 2007
Biological dose distribution analysis with microdosimetry; experiment and monte carlo simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nose; N. Matsufuji; Y. Kase; T. Kanai
Year: 2007
Proton computed tomography: Update on current status
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.A. Bashkirov; R.W. Schulte; S.N. Penfold; A.B. Rosenfeld
Year: 2007
Development of 3D detectors for very high luminosity colliders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Fleta
Year: 2007
Recent development on triple well 130 nm CMOS MAPS with in-pixel signal processing and data sparsification capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Rizzo; G. Batignani; S. Bettarini; F. Bosi; G. Calderini; R. Cenci; A. Cervelli; M. Dell'Orso; F. Forti; P. Giannetti; M.A. Giorgi; A. Lusiani; G. Marchiori; M. Massa; F. Morsani; N. Neri; E. Paoloni; J. Walsh; C. Andreoli; L. Gaioni; E. Pozzati; L. Ratti; V. Speziali; M. Manghisoni; V. Re; G. Traversi; M. Bomben; L. Bosisio; G. Giacomini; L. Lanceri; I. Rachevskaia; L. Vitale; G.F. Dalla Betta; G. Soncini; G. Fontana; L. Pancher; G. Verzellesi; D. Gamba; G. Giraudo; P. Mereu; M. Bruschi; A. Gabrielli; B. Giacobbe; N. Semprini; R. Spighi; M. Villa; A. Zoccoli
Year: 2007
A novel CMOS monolithic active pixel sensor with analog signal processing and 100% fill factor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Crooks; J.A. Ballin; P.D. Dauncey; A.-M. Magnan; Y. Mikami; O. Miller; M. Noy; V. Rajovic; M. Stanitzki; K.D. Stefanov; R. Turchetta; M. Tyndel; E.G. Villani; N.K. Watson; J.A. Wilson
Year: 2007
CMOS APS sensor characterization with infrared, visible and ultraviolet laser sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Passeri; A. Marras; P. Placidi; P. Delfanti; D. Biagetti; L. Servoli; G.M. Bilei
Year: 2007
Simulated performance of the Gamma Tracker CdZnTe handheld radioisotope identifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Seifert; M.J. Myjak; D.V. Jordan
Year: 2007
Hand-held gamma-ray spectrometer based on high-efficiency Frisch-ring CdZnTe detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Cui; A. Bolotnikov; G. Camarda; A. Hossain; R.B. James; G. De Geronimo; J. Fried; P. O'Connor; A. Kargar; M.J. Harrison; D.S. McGregor
Year: 2007
A fieldable-prototype, large-area, gamma-ray imager for orphan source search
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Ziock; L. Fabris; D. Carr; J. Collins; M. Cunningham; F. Habte; T. Karnowski; W. Marchant
Year: 2007
CS2LiYCl6: Ce Neutron gamma detection system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Glodo; W. Brys; G. Entine; W.M. Higgins; E.V.D. van Loef; M.R. Squillante; K.S. Shah
Year: 2007
Application of LaBr3(Ce3+) scintillators in radio-isotope identification devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Pausch; C.-M. Herbach; R. Hillebrands; A. Kreuels; R. Lentering; F. Lueck; F. Platte; C. Plettner; K. Roemer; F. Scherwinski; J. Stein; N. Teofilov; M. Moszynski; L. Swiderski; T. Szczesniak
Year: 2007
Performance evaluation of multi-pixel photon counters for PET imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qingguo Xie; R.G. Wagner; G. Drake; P. De Lurgio; Yun Dong; Chin-Tu Chen; Chien-Min Kao
Year: 2007
New developments on 3D detectors at IRST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.-F. Dalla Betta; M. Boscardin; L. Bosisio; C. Piemonte; S. Ronchin; A. Zoboli; N. Zorzi
Year: 2007
DEPFET detector-amplifier structure: Properties, achievements and new developments, concepts and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Lutz; S. Herrmann; P. Lechner; M. Porro; R.H. Richter; L. Struder; J. Treis; S. Wolfel
Year: 2007
Beam telescope for medium energy particles based on thin, submicron precision MAPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Dulinski; J. Baudot; A. Besson; G. Claus; C. Dritsa; M. Goffe; K. Jaaskeleinen; M. Winter; A.F. Zarnecki
Year: 2007
Application of controlled-drift detectors to spectroscopic X-ray imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Castoldi; C. Guazzoni; R. Hartmann; C. Ozkan; L. Struder; A. Visconti
Year: 2007
Geometrically optimized, Labr3: Ce scintillation sensor array for enhanced stand-off direction finding of gamma radiation sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.H. Winso; E.S. Ackermann; M. Fennell; R. Perez; J. Rolando; M. Pagey; R. Polichar; J. Martinez; J. Hovgaard; G. Kogut; H.R. Everett; D. Fellars; J. Baumbaugh; G. Mastny
Year: 2007
Muon radiography with the CMS Muon Barrel chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Benettoni; G. Bonomi; P. Calvini; P. Checchia; E. Conti; A. Dainese; D. Fabris; F. Gasparini; U. Gasparini; F. Gonella; M. Lunardon; A.T. Meneguzzo; M. Morando; S. Moretto; G. Nebbia; M. Pegoraro; S. Pesente; P. Ronchese; S. Squarcia; E. Torassa; S. Vanini; G. Viesti; A. Zenoni; G. Zumerle
Year: 2007
Development of an Intense Pulsed Characteristic γ-Ray Source for Active Interrogation of Special Nuclear Material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.W. Schumer; R.J. Commisso; D.D. Hinshelwood; D. Mosher; D.P. Murphy; P.F. Ottinger; D.G. Phipps; S.J. Stephanakis; B.V. Weber; F.C. Young; G. Cooperstein; B.W. Blackburn; J.L. Jones; J. Johnson; N.O. Valles
Year: 2007
A novel monolithic pixel detector implemented in high-voltage CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Peric
Year: 2007
SOI pixel developments in a 0.15μm technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Arai; Y. Ikegami; Y. Unno; T. Tsuboyama; S. Terada; M. Hazumi; T. Kohriki; H. Ikeda; K. Hara; H. Miyake; H. Ishino; G. Varner; E. Martin; H. Tajima; M. Ohno; K. Fukuda; H. Komatsubara; J. Ida; H. Hayashi; Y. Kawai
Year: 2007
Charge collection from proton and alpha particle tracks in silicon pixel detector devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Campbell; V. Havranek; E. Heijne; T. Holy; J. Idarraga; J. Jakubek; C. Lebel; C. Leroy; X. Llopart; J. Novotny; S. Pospisil; L. Tlustos; Z. Vykydal
Year: 2007
Development of a High-Efficiency, Glass Shell-Based, 3He-Filled Neutron Detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. Kisner; D.E. Holcomb; A.C. Stephan; V. Jardret; C.L. Britton
Year: 2007
The impact of multiple-site interactions on the energy resolution of a high-pressure xenon γ-ray spectrometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.D. Kiff; Zhong He
Year: 2007
A low noise, radiation tolerant CCD readout processor for the proposed SNAP satellite.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Karcher; R. Abiad; C.J. Bebek; G.Y. Chao; D. Gnani; B. Krieger; H. von der Lippe; J. Reith; J.-P. Walder
Year: 2007
Solar intensity X-ray spectrometer (SIXS) ASIC for a large dynamic range onboard BepiColombo ESA mission to Mercury
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.F. Khalid; M.L. Prydderch; Q. Morrissey; P. Seller; E. Valtonen; J. Peltonen; M. Anttila; A. Malkki; R. Vainio; J. Huovelin
Year: 2007
Distributed data acquisition and storage architecture for the SuperNova Acceleration Probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Rivera
Year: 2007
Making science in the Grid world: using glideins to maximize scientific output
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Sfiligoi
Year: 2007
Research and development of the humanitarian landmine detection system by a compact fusion neutron source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yoshikawa; Y. Yamamoto; K. Masuda; H. Toku; T. Takamatsu; T. Fujimoto; E. Hotta; K. Yamauchi; M. Ohnishi; H. Osawa; S. Shiroya; T. Misawa; Y. Takahashi; K. Takiyama; Y. Kubo
Year: 2007
Passive neutron detection at borders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.T. Kouzes; E.R. Siciliano; J.H. Ely; P.E. Keller; R.J. McConn
Year: 2007
Network-oriented radiation monitoring system (NORMS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Aryaeinejad; D.F. Spencer
Year: 2007
Detector pulse shape analysis for X-ray scatter based baggage inspection systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Bomsdorf; T. Klostermann; F. Scherwinski; J. Stein
Year: 2007
Interacting with the SWORD package (SoftWare for the Optimization of Radiation Detectors)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.S. Gwon; E.I. Novikova; B.F. Phlips; M.S. Strickman; Z.G. Fewtrell; S. Deng; R.C. Johns; L.S. Waters
Year: 2007
Optimal background attenuation for fielded spectroscopic detection systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M. Robinson; E.D. Ashbaker; J.E. Schweppe; E.R. Siciliano
Year: 2007
Effects of high count rate and gain shift on isotope identification algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M. Robinson; S.D. Kiff; E.D. Ashbaker; S.E. Bender; E. Flumerfelt; M. Salvitti; J. Borgardt; M.L. Woodring
Year: 2007
Performance of a large-area, gamma imager using a point source injection technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Habte; M.F. Cunningham; L. Fabris; K.P. Ziock
Year: 2007
Directional radiation detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Uher; C. Frojdh; J. Jakubek; S. Pospisil; G. Thungstrom; Z. Vykydal
Year: 2007
Electronics and signal processing for prompt radiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.D. Ianakiev; B.S. Alexandrov; B.W. Blackburn; P. Hausladen; A.W. Hunt; J.T. Johnson; J.L. Jones; C.W. McCluskey; J.T. Mihalczo; C.E. Moss; R.B. Williams
Year: 2007
Material discriminated x-ray CT by using conventional microfocus x-ray tube and cdte imager
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Onishi; T. Nakashima; A. Koike; H. Morii; Y. Neo; H. Mimura; T. Aoki
Year: 2007
Fast neutron sensitivity with HPGe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Seifert; W.K. Hensley; E.R. Siciliano; W.K. Pitts
Year: 2007
Evaluation of key detector parameters for isotope identification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.J. Sullivan; S.E. Garner; M. Lombardi; K.B. Butterfield; M.A. Smith-Nelson
Year: 2007
Simulation of nuclear resonance fluorescence in Geant4
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.V. Jordan; G.A. Warren
Year: 2007
New sandwich type detector module and its characteristics for dual x-ray baggage inspection system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwang Hyun Kim; In Sub Jun; Yoon Seong Eun
Year: 2007
A compact scintillator-based coded aperture imager for localizing illicit nuclear materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Vaska; P.E. Vanier; S. Junnarkar; S. Krishnamoorthy; J.-F. Pratte; S. Stoll
Year: 2007
The use of gamma-ray imaging to improve portal monitor performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Ziock; J. Collins; M. Cunningham; L. Fabris; T. Gee; J. Goddard; F. Habte; T. Karnowski
Year: 2007
Spectroscopic portal identification of special nuclear materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Saunders
Year: 2007
Development of a digital gamma imaging system based upon the CMOS imager coupled with a CdTe photoconductor for nondestructive testings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.S. Cho; S.I. Choi; K.Y. Kim; J.E. Oh; S.Y. Lee; B.S. Lee; S. Kim
Year: 2007
Active-mask coded-aperture imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. Cunningham; E. Blakeman; L. Fabris; F. Habte; K. Ziock
Year: 2007
Optimized geometry and limitations of compton cameras with LaBr3
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuxin Feng; R.S. Detwiler; J.E. Baciak; W. Kernan
Year: 2007
A small gamma camera combined with a uniformly redundant array (URA) collimator: the performance evaluation using detective quantum efficiency (DQE)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hosang Jeon; Hyunduk Kim; Chae Hun Lee; Sungho Chang; M.S. Rahman; Gyuseong Cho
Year: 2007
Light amplifier/compressor photodetectors and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.R. Winn; Y. Onel; C. Sanzeni
Year: 2007
Simulation of a scintillator-based Compton telescope with micropattern readout
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.L. Varner; J.R. Beene
Year: 2007
Investigation of the small pixel effect in CdZnTe detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.D. Wilson; P. Seller; M.C. Veale; P.J. Sellin
Year: 2007
Scintillator geometry and surface treatment for readout by a small area silicon photomultiplier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Barton; D. Wehe; C. Stapels; J. Christian
Year: 2007
Thermal and electrical characterization of silicon photomultiplier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Petasecca; B. Alpat; G. Ambrosi; P. Azzarello; R. Battiston; M. Ionica; A. Papi; G.U. Pignatel; S. Haino
Year: 2007
Three-dimensional signal correction on U1traPeRL CZT detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaecheon Kim; B. Donmez; K. Nelson; Zhong He
Year: 2007
Gamma-ray source location by attenuation measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Kaye; N.D. Bennett; C.G. Wahl; Zhong He; Weiyi Wang
Year: 2007
Timing and cross-talk properties of BURLE multi-channel MCP PMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Korpar; P. Krizan; R. Pestotnik
Year: 2007
Determining the absolute photoelectron yield of LSO with APDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Stoll; C. Woody
Year: 2007
Target theory applied in the radiation damage analysis for organic detectors.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.H. deMesquita; J.M.F. Neto; M.M. Hamada
Year: 2007
Position sensitive TCT evaluation of irradiated 3D-stc detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Zavrtanik; V. Cindro; G. Kramberger; J. Langus; I. Mandic; M. Mikuz; M. Boscardin; G.F. Dalla Betta; C. Piemonte; A. Pozza; S. Ronchin; N. Zorzi
Year: 2007
Damage annealing in irradiated Geiger detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Vasile
Year: 2007
Determination of the charge collection efficiency in neutron irradiated silicon detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.K. Petterson; R.F. Hurley; K. Arya; C. Betancourt; M. Bruzzi; B. Colby; M. Gerling; C. Meyer; J. Pixley; T. Rice; H.F.-W. Sadrozinski; J. Bernardini; L. Borrello; F. Fiori; A. Messineo
Year: 2007
Extraction of the effective doping density profile in irradiated strip detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bruzzi; C. Betancourt; M. Gerling; R.F. Hurley; M.K. Petterson; H.F.-W. Sadrozinski
Year: 2007
Radioactive nuclear beams studies using deuterated liquid scintillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ojaruega; F.D. Becchetti; Hao Jiang; H. Amro; M. Golobish; J.J. Kolata
Year: 2007
Evaluation of gamma-ray responses of LuAG(Pr) scintillator coupled with APD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yanagida; M. Sato; K. Kamada; A. Yoshikawa; F. Saito
Year: 2007
Intrinsic resolution of ceramic YAG(Ce), GYAG(Ce), and YAG(Ce,Nd) scintillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yanagida; A. Yoshikawa; M. Kawaharada; T. Itoh; F. Saito
Year: 2007
Study of LaBr3 crystals coupled to photomultipliers and avalanche photodiodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Moszynski; L. Swiderski; T. Szczesniak; A. Nassalski; A. Syntfeld-Kazuch; W. Czarnacki; G. Pausch; J. Stein; P. Lavoute; F. Lherbert; F. Kniest
Year: 2007
Neutron scintillation detectors for environmental, security and geological studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.H. Baker; N.Z. Galunov; O.A. Tarasenko
Year: 2007
Unusual fluorescence emission characteristics from europium-doped lead phosphate glass caused by 3 MeV proton irradiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.A. Hollerman; S.M. Goedeke; R.J. Moore; L.A. Boatner; S.W. Allison; R.S. Fontenot
Year: 2007
Energy resolution of plastic scintillation counters for beta rays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.H. Vo; S. Kanamaru; C. Marquet; H. Nakamura; M. Nomachi; F. Piquemal; J.S. Ricol; Y. Sugaya; K. Yasuda
Year: 2007
Investigation of the self activity and high energy γ-rays response of a 1” × 1” and 3” × 3” LaBr3:Ce scintillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Camera; N. Blasi; S. Brambilla; F.C.L. Crespi; A. Idini; C. Maiolino; R. Nicolini; S. Riboldi; D. Santonocito; M. Sassi; O. Wieland
Year: 2007
Boron-10 loaded BC523A liquid scintillator for neutron detection in the border monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Swiderski; M. Moszynski; D. Wolski; T. Batsch; A. Nassalski; A. Syntfeld-Kazuch; T. Szczesniak; F.A. Kniest; M.R. Kusner; G. Pausch; J. Stein; W. Klamra
Year: 2007
MAPMT H7546B anode current response study for ILC SiD muon system prototype
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Dyshkant; G. Blazey; D. Hedin; V. Zutshi; H. Fisk; C. Milstene; R. Abrams
Year: 2007
Fast neutron detection by storage phosphors with low gamma-ray sensitivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Sakasai; Y. Iwamoto; K. Soyama
Year: 2007
Characterization of one-dimensional fiber-optic scintillating detector for electron beam therapy dosimetry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bongsoo Lee; Dong Hyun Cho; Kyoung Won Jang; Wook Jae Yoo; Sang Hoon Shin; Gye-Rae Tack; Sin Kim; Hyosung Cho
Year: 2007
Impact of Ce concentration on scintillation properties of Lu2xGd2(1-x)SiO5:Ce (LGSO, x=0.2) single crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Usui; H. Yamamoto; Y. Yokoyama; S. Shimizu; N. Shimura; Y. Kurata; H. Ishibashi
Year: 2007
Response function measurement of Gd2Si2O7 scintillator for neutrons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Haruna; J.H. Kaneko; M. Higuchi; S. Kawamura; S. Saeki; Y. Yagi; H. Ishibashi; F. Fujita; A. Homma; M. Furusaka; Y. Kiyanagi
Year: 2007
Dependence of crystal structure and luminescence property of Gd2Si2O7 on cerium concentration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Saeki; J.H. Kaneko; M. Higuchi; S. Kawamura; J. Haruna; F. Fujita; A. Homma; S. Nishiyama; S. Ueda; K. Kurashige; H. Ishibashi; M. Furusaka
Year: 2007
Basic properties of scintillation in helium mixed with xenon and their application to a positionsensitive neutron detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Saito; S. Sasaki; T. Sanami; H. Tawara; E. Shibamura
Year: 2007
Temperature dependency analysis of light output from an NE-213 liquid sintillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Gehman; M. Smith-Nelson; K. Ianakiev; D. Dinwiddie; B. Rooney
Year: 2007
Characterization of the linear scintillator array signal response as a function of x-ray impact parameter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Franco; F. Gomez; A. Badano
Year: 2007
Factors affecting the characterization of very fast scintillators with low light output
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Dolinsky; F. Jansen; J. Nause; B. Nemeth; V. Rengarajan
Year: 2007
Availability of a tool using CCD camera-plastic scintillator system in HDR for quality assurance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hanada; H. Kojima; M. Ishigami; S. Katsuta; A. Yorozu; T. Otsuka; K. Maruyama
Year: 2007
Large area strip edgeless detectors fabricated by plasma etching process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Pellegrini; J. Balbuena; V. Eremin; C. Garcia; C. Lacasta; V. Lacuesta; M. Lozano; S. Marti; M. Minano; G. Ruggiero; M. Ullan
Year: 2007
Optimization of the position resolution in semiconductor detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manhee Jeong; D.A. Lawlor; M.D. Hammig
Year: 2007
Development of binary readout CMOS monolithic sensors for MIP tracking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Degerli; A. Besson; G. Claus; M. Combet; A. Dorokhov; W. Dulinski; M. Goffe; A. Himmi; Y. Li; F. Orsini
Year: 2007
Proposal of a data sparsification unit for a mixed-mode MAPS detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gabrielli; G. Batignani; S. Bettarini; F. Bosi; G. Calderini; R. Cenci; M. Dell'Orso; F. Forti; P. Giannetti; M.A. Giorgi; A. Lusiani; G. Marchiori; F. Morsani; N. Neri; E. Paoloni; G. Rizzo; J. Walsh; M. Massa; A. Cervelli; C. Andreoli; E. Pozzati; L. Ratti; V. Speziali; M. Manghisoni; V. Re; G. Traversi; L. Bosisio; G. Giacomini; L. Lanceri; I. Rachevskaia; L. Vitale; G.F. Dalla Betta; G. Soncini; G. Fontana; L. Pancheri; G. Verzellesi; D. Gamba; G. Giraudo; P. Mereu; M. Bruschi; B. Giacobbe; N. Semprini; R. Spighi; M. Villa; A. Zoccoli
Year: 2007
Small-scale readout system prototype for the STAR PIXEL detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Szelezniak; A. Besson; C. Colledani; A. Dorokhov; W. Dulinski; L.C. Greiner; A. Himmi; C. Hu; H.S. Matis; A.A. Rose; A. Shabetai; T. Stezelberger; Xiangming Sun; J.H. Thomas; I. Valin; C.Q. Vu; H.H. Wieman; M. Winter
Year: 2007
Novel ion detector for fusion plasma diagnostics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kalliopuska; F. Garcia; M. Santala; S. Eranen
Year: 2007
Hole multiplication in a reverse-type avalanche photodiode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sato; T. Yanagida; A. Yoshikawa; Y. Yatsu; J. Kataoka; F. Saito
Year: 2007
Temperature effects in reverse-type avalanche photodiodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sato; T. Yanagida; A. Yoshikawa; Y. Yatsu; J. Kataoka; F. Saito
Year: 2007
Silicon radiation detector development at VTT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Kalliopuska; S. Eranen; T. Virolainen; V. Kamarainen; F. Ji; F. Garcia; R. Orava; N. van Remortel; M. Santala
Year: 2007
The CZT Ring-drift detector: A novel concept for hard X-ray detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. den Hartog; A. Owens; A.G. Kozorezov; J.K. Wigmore; V. Gostilo; A. Loupilov; V. Kondratjev; M.A. Webb; E. Welter
Year: 2007
Characteristics of CVD diamond film detectors for pulsed radiation detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lan Wang; Xiaoping Ouyang; Ruyu Fan; Yongjie Jin; Zhongbing Zhang; Hongbo Pan; Linyue Liu
Year: 2007
Development of Multi-Pixel Photon Counter (MPPC)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamamoto; K. Yamamura; K. Sato; S. Kamakura; T. Ota; H. Suzuki; S. Ohsuka
Year: 2007
High-resolution alpha-particle spectroscopy with an hybrid SiC/GaN detector/front-end detection system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pullia; G. Bertuccio; D. Maiocchi; S. Caccia; F. Zocca
Year: 2007
Thermal annealing of metal-semiconductor contact for CZT detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.H. Park; J.H. Ha; J.H. Lee; H.S. Kim; Y.K. Kim
Year: 2007
Study of the spectral response of CZT multiple-electrode detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Abbene; S. Del Sordo; F. Fauci; G. Gerardi; A. La Manna; G. Raso; A. Cola; E. Perillo; A. Raulo; V. Gostilo; S. Stumbo
Year: 2007
Polycrystalline mercuric iodide films for novel detector applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.E. Hartsough; J.S. Iwanczyk; W.C. Barber; Min Namkung; J.I. Trombka
Year: 2007
Large-area SiPMs for the CMS hadron outer calorimeter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Heering; J. Rohlf; J. Freeman; S. Los; S. Kuleshov; S. Banerjee; I. Schmidt; Y. Musienko; L. Lebolo; J. Diaz
Year: 2007
Exploration of GaTe for gamma detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Conway; C.E. Reinhardt; R.J. Nikolic; A.J. Nelson; T.F. Wang; K.J. Wu; S.A. Payne; A. Mertiri; G. Pabst; R. Roy; K.C. Mandal; P. Bhattacharya; Yunlong Cui; M. Groza; A. Burger
Year: 2007
Application of a biparametric method using a twin shaping filter on CZT detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Auricchio; E. Caroli; A. Donati; A. Roggio; J.B. Stephen; G. Ventura
Year: 2007
Multiple-pulse readout of linear Silicon Drift Detectors for fast imaging applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Castoldi; C. Guazzoni; D. Signorelli
Year: 2007
Sub-pixel position resolution in pixelated semiconductor detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.E. Anderson; B. Donmez; Zhong He
Year: 2007
Fabrication of Pillar-structured thermal neutron detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.J. Nikolic; A.M. Conway; C.E. Reinhardt; R.T. Graff; Tzu Fang Wang; N. Deo; Chin Li Cheung
Year: 2007
Development of InSb cryogenic detector for ultra high-resolution energy spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.H. Park; T.Y. Song; H.S. Kim; J.H. Ha; Y.K. Kim
Year: 2007
Recent improvements on calGPDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Vasile; D. Warner; J. Lipson; J. Rau
Year: 2007
Experimental results of a 7-channel spectroscopy detector module with mega-count rate capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Reckleben; K. Hansen; I. Diehl; H. Klar; E. Welter
Year: 2007
Application of high-energy photon CT system with laser-compton scattering to nondestructive test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Toyokawa; H. Ogawa; R. Kuroda; H. Kanada; T. Uomoto; T. Kaihori; K. Watanabe; G. Wakabayashi; K. Yamada
Year: 2007
A PET prototype for in-beam monitoring of proton therapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Vecchio; F. Attanasi; N. Belcari; M. Camarda; G.A. Pablo Cirrone; G. Cuttone; A. Del Guerra; F. Di Rosa; N. Lanconelli; S. Moehrs; V. Rosso; G. Russo
Year: 2007
Semi-automatic position calibration for a dual-head small animal PET scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhihao Hu; Chien-Min Kao; Wei Liu; Yun Dong; Zhi Zhang; Qingguo Xie; Chin-Tu Chen
Year: 2007
Measurement of two-dimensional photon beam distributions using a fiber-optic radiation sensor for small field radiation therapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoung Won Jang; Dong Hyun Cho; Sang Hoon Shin; Hyung Sik Kim; Bongsoo Lee; Soon-Cheol Chung; Jeong Han Yi; Sin Kim; Hyosung Cho
Year: 2007
Purification and laser isotope separation of 176Yb for Medical Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taek-Soo Kim; Hyunmin Park; Kwang-Hoon Ko; Jaemin Han; Do-Young Jeong
Year: 2007
Response of a SOI microdosimeter to the CERF reference facility for aviation dosimetry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.A. Prokopovich; I.M. Cornelius; M.I. Reinhard; A.B. Rosenfeld
Year: 2007
Cylindrical silicon-on-insulator microdosimeter: Design, fabrication and TCAD modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.H. Lim; A.L. Ziebell; I. Cornelius; M.I. Reinhard; D.A. Prokopovich; A.S. Dzurak; A.B. Rosenfeld
Year: 2007
Preliminary tests and performance estimate of PFMA-1, the first prototype of a plasma focus device for SLR production
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sumini; D. Mostacci; F. Rocchi; S. Mannucci; A. Tartari; E. Angeli
Year: 2007
Residual energy measurements for proton computed tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Randazzo; V. Sipala; D. Lo Presti; G.A. Pablo Cirrone; G. Cottone; F. Di Rosa; V. Bashkirov; R. Schulte
Year: 2007
Study of cadmium zinc telluride (CZT) radiation detector modules under moderate and long-term variations of temperature and humidity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Mashlum; K.I. Dietzel; D. Meier; M. Szawlowski; B. Sundal; T. Vandehei; D. Wagenaar; B.E. Patt
Year: 2007
Comparison of three pulse processing systems for microdosimetry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.M. Spirou; Soo-Hyun Byun; W.V. Prestwich
Year: 2007
A new tool for measuring therapeutic electron beam energies with scintillation light
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ishigami; H. Kojima; Y. Fukushima; M. Uemae; M. Hashimoto; T. Nishio; K. Maruyama
Year: 2007
Performance characteristics of thick silicon double sided strip detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shokouhi; B.S. McDonald; H.L. Durko; M.A. Fritz; L.R. Furenlid; T.E. Peterson
Year: 2007
ULTRA-Fast wiener filter based crystal identification algorithm applied to the LabPETTM phoswich detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.C. Yousefzadeh; N. Viscogliosi; M.-A. Tetrault; C.M. Pepin; P. Berard; M. Bergeron; H. Semmaoui; R. Lecomte; R. Fontaine
Year: 2007
A new wide-band beam current monitor with active-passive circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Zhou; B.G. Sun; X.H. Wang; P. Lu; Y. Wang
Year: 2007
New methods of measuring emittance using beam position monitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Li; B.G. Sun; Q. Luo; X.H. Wang; H.L. Xu; P. Lu
Year: 2007
Accuracy of LHC proton loss rate determination by the BLM system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.B. Holzer; B. Dehning; C.W. Fabjan; D. Kramer; M. Sapinski; M. Stockner
Year: 2007
A new wire position monitor readout system for ILC cryomodules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Bedeschi; G. Bellettini; A. Bosotti; R. Carosi; S. Galeotti; A. Gennai; C. Pagani; F. Paoletti; R. Paparella; D. Passuello; F. Spinella
Year: 2007
LHC cryogenics hardware commissioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Avramidou; K. Anastasopoulos; J. Casas-Cubillos; M. Ciechanowski; X. Fampris; W.M. Gaj; G. Fernandez-Penacoba; C. Fluder; P. Gomes; E. Gousiou; N. Jeanmonod; F. Karagiannis; A. Koumparos; P. Macuda; A. Patsouli; A. Suraci; N. Vauthier; C. Vottis
Year: 2007
Design of a slow pulsed positron beam for positron annihilation lifetime spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.G. Hathaway; J. Moxom; A.I. Hawari; Jun Xu
Year: 2007
Implementation of a diamond-beam-conditions monitor into the LHCb experiment at CERN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.J. Ilgner
Year: 2007
Phase contrast neutron imaging of mixed phase-amplitude objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Mishra; A.I. Hawari
Year: 2007
Microradiographic observation of grainy structure of Al-alloy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Vavrik; T. Holy; J. Jakubek; M. Jakubek; J. Valach
Year: 2007
Epithermal neutron tomography with time-of-flight technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kamiyama; H. Sato; N. Miyamoto; H. Iwasa; Y. Kiyanagi; S. Ikeda
Year: 2007
Progress report on a neutron coded source phase contrast imaging system at the MIT reactor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Damato; P. Binns; R.C. Lanza
Year: 2007
Design and Development of a Static VAR Compensator for Load Compensation Using Real-Time Digital Simulator and Hardware Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Berge; R.K. Varma
Year: 2007
Testing power system controllers by real-time simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Venne; X. Guillaud; F. Sirois
Year: 2007
A Dynamic Technique for Power System Oscillations Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Al-Kandari; K.M. El-Naggar
Year: 2007
Synchronous Machine Modelling and Identification via Network Equivalent Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ghassemi; H. Lesani; S.M. Nabavi
Year: 2007
New Centralized Adaptive Under Frequency Load Shedding Algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S. Pasand; H. Seyedi
Year: 2007
A New Approach For Transformer Overloading Considering Economic Terms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Shahbazi; M. Ashouri; M.R. Shariati; S. Farzalizade; M. Makhdoomi
Year: 2007
Distributed Monitoring and Centralized Forecasting System for DG-Connected Distribution Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Hamlyn; H. Cheung; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
Optimal Design of Type_1 TSK Fuzzy Controller Using GRLA for AVR System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Naderi; A.A. Gharaveisi; M. Rashidinejad
Year: 2007
Optimal Placement of Reactive Power Supports for Transmission Loss Minimization: The Case of Georgian Regional Power Grid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Gavasheli; Le Anh Tuan
Year: 2007
Power System State Estimation: A New Method Based on Current Equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lavorato; M.J. Rider; A.V. Garcia
Year: 2007
Survey on the Transformer Condition Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.E.B. Abu-Elanien; M.M.A. Salama
Year: 2007
Transformer Diagnostics in the Practical Field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.N. Bandyopadhyay
Year: 2007
Transient Stability using Energy Function Method in Power Systems Close to Voltage Collapse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. Bedrinana; V.L. Paucar; C.A. Castro
Year: 2007
Analysis of the Impact of Induction Generators on Distribution Systems Voltage Sags Due to Unbalanced Faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.P. Grilo; D. Salles; C.A.F. Murari
Year: 2007
Mid and Long-Term Voltage Stability Assessment using Neural Networks and Quasi-Steady-State Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M.L. Assis; A.R. Nunes; D.M. Falcao
Year: 2007
A Robust Decision Making Framework for GEP of Grid Connected Micro-Power Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Khodayar; M. Ehsan; A. Rahimikian; S. Kamalinia; E. Abbasi
Year: 2007
Analysis of Flux Control for Wide Speed Range Operation of IPMSM Drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Islam Chy; M.N. Uddin
Year: 2007
Analog Implementation and Real-Time Testing of a DWT-Operated DVR System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Saleh; M.A. Rahman
Year: 2007
Improving the voltage profiles of Distribution Networks using multiple Distribution Generation Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. AlHajri; M.E. El-Hawary
Year: 2007
Dual Mode PCGCs For Advanced Wireless Communications Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.M. Behairy
Year: 2007
Precise Identification of Memory Faults Using Electrical Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Al-Ars; S. Hamdioui; G. Gaydadjiev
Year: 2007
An Investigation on Capacitive Coupling in RAM Address Decoders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hamdioui; Z. Al-Ars; G.N. Gaydadjiev; A.J. van de Goor
Year: 2007
Multi-cycle Fault Injections in Error Detecting Implementations of the Advanced Encryption Standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Maistri; R. Leveugle
Year: 2007
A Novel Method of Test Generation for Asynchronous Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.P. Vasudevan
Year: 2007
Ultra Low Power Narrow Band LNA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M.E. Kholy
Year: 2007
Bandwidth Extension of CMOS Transimpedance Amplifier Using On-Chip Spiral Inductor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-S.A.M. Hasaneen; M.A.A. Wahab; N. Okaley
Year: 2007
Improving Software Based Self - Testing for Cache Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sosnowski
Year: 2007
Using Reconfigurable Computers for DSP Image Processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Taher; T. El-Ghazawi
Year: 2007
Measurement Environment for Reliability Study of High Current First Level Interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Barton; J. Horky; R. Duda; I. Szendiuch; M. Novotny; D. Gevaert
Year: 2007
Generation of Power-Constrained Scan Tests and Its Difficulty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Iwagaki; S. Ohtake
Year: 2007
Transient Current Testing of Gate-Oxide Shorts in CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chehab; A. Kayssi; A. Ghandour
Year: 2007
A power measuring technique for built-in testing of Electrochemical Sensors for Environmental Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Konstantakos; T. Laopoulos
Year: 2007
A Hazard-Free Majority Voter for TMR-Based Fault Tolerance in Asynchronous Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Almukhaizim; O. Sinanoglu
Year: 2007
Analysis of Laser-Based Attack Effects on a Synchronous Circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Maingot; R. Leveugle
Year: 2007
Recovery from Transition Errors in Sequential Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Das; J.P. Hayes
Year: 2007
Modeling Burst Interferences - A Practical Tool for Studying Leak Signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Daneti
Year: 2007
Adopting the Scan Approach for a Fault Tolerant Asynchronous Clock Generation Circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Handl; A. Steininger; G. Kempf
Year: 2007
Low Power Small Area High Performance 2D-DCT architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R.M. Rizk; M. Ammar
Year: 2007
Design of Real Time Multiprocessor System on Chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Loukil; N.B. Amor; Y. Aoudni; M. Abid
Year: 2007
Exploiting RAM for fault-tolerant functions in FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Frigerio; F. Salice
Year: 2007
CNTFET-based CMOS-like Gates and Dispersion of Characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Dang; L. Anghel; V. Pasca; R. Leveugle
Year: 2007
Fast FPGA-Based Delay Estimation for a Novel Hardware/Software Partitioning Scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Abdelhalim; S.E.-D. Habib
Year: 2007
Software-based BIST for Analog to Digital Converters in SoC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Keshk
Year: 2007
A Low-Power Haar-Wavelet Preprocessing Approach for a SNN Olfactory System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.N. Allen; S.B. Hasan; H.S. Abdel-Aty-Zohdy; R.L. Ewing
Year: 2007
A Novel General Graph-Based Simplex Algorithm Applied to IC Layout Compaction and Migration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Said; H.M. Abbas; H.I. Shahein
Year: 2007
Analog, Digital and Mixed-Signal Design Flows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.G. Bakeer; O. Shaheen; H.M. Eissa; M. Dessouky
Year: 2007
Dual Metric OPC for Complex SRAF Implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Yehia
Year: 2007
Schematic-Based Fault Dictionary: A Case Study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. AbdEl-Halim; H.H. Amer
Year: 2007
Compact Circuit Simulation Model for On-Chip Inductor and Transformer for RF Integrated Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-S.A.M. Hasaneen
Year: 2007
Architecture-level thermal behavioral models for quad-core microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duo Li; S.X.-D. Tan; M. Tirumala
Year: 2007
Automatic mixed-signal design verification instrumentation with observation specification language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. David
Year: 2007
High-performance model compilation for complex behavioral models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Platte; C. Knoth; R. Sommer; E. Barke
Year: 2007
Statistical eye analysis implemented in VHDL-AMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Muranyi
Year: 2007
A mixed-mode behavioral model of a Controller-Area-Network bus transceiver: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Prodanov; M. Valle; R. Buzas; H. Pierscinski
Year: 2007
Modeling and analysis of biological cells in DRAM implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Fan; Guofen Yu; Jichang Tan; S.X.-D. Tan
Year: 2007
Macro-modeling of liquid crystal cell with VerilogA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Watanabe; K. Ishihara; T. Tsuruma; Y. Iguchi; Y. Nakajima; Y. Maki
Year: 2007
A unified electrical SPICE model for piezoelectric transducers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-M. Galliere; P. Papet; L. Latorre
Year: 2007
Behavioral simulation of biological neuron systems using VHDL and VHDL-AMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Bailey; P.R. Wilson; A.D. Brown; J. Chad
Year: 2007
On-chip timing uncertainty measurements on IBM microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Franch; P. Restle; N. James; W. Huott; J. Friedrich; R. Dixon; S. Weitzel; K. Van Goor; G. Salem
Year: 2007
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Molyneaux; T. Ziaja; Hong Kim; S. Aryani; Sungbae Hwang; A. Hsieh
Year: 2007
Test cost reduction for the AMD™ Athlon processor using test partitioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sehgal; J. Fitzgerald; J. Rearick
Year: 2007
On ATPG for multiple aggressor crosstalk faults in presence of gate delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Ganeshpure; S. Kundu
Year: 2007
Silicon evaluation of longest path avoidance testing for small delay defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Turakhia; W.R. Daasch; M. Ward; J. Van Slyke
Year: 2007
Which defects are most critical? optimizing test sets to minimize failures due to test escapes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Dworak
Year: 2007
Advancements in at-speed array BIST: multiple improvements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Gorman; M. Roberge; A. Paparelli; G. Pomichter; S. Sliva; W. Corbin
Year: 2007
A concurrent approach for testing address decoder faults in eFlash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Ginez; P. Girard; C. Landrault; S. Pravossoudovitch; A. Virazel; J.-M. Daga
Year: 2007
Diagnosis for MRAM write disturbance fault
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Lung Su; Chih-Wea Tsai; Cheng-Wen Wu; Ji-Jan Chen; Wen-Ching Wu; Chien-Chung Hung; Ming-Jer Kao
Year: 2007
Data jitter measurement using a delta-time-to-voltage converter method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ichiyama; M. Ishida; T.J. Yamaguchi; M. Soma
Year: 2007
New methods for receiver internal jitter measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.P. Li; Jinhua Chen
Year: 2007
A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sunter; A. Roy
Year: 2007
Test-wrapper designs for the detection of signal-integrity faults on core-external interconnects of SoCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang Xu; Yubin Zhang; K. Chakrabarty
Year: 2007
A heuristic for thermal-safe SoC test scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiyuan He; Zebo Peng; P. Eles
Year: 2007
Redefining and testing interconnect faults in Mesh NoCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Cota; F.L. Kastensmidt; M. Cassel; P. Meirelles; A. Amory; M. Lubaszewski
Year: 2007
Fully X-tolerant combinational scan compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Wohl; J.A. Waicukauski; S. Ramnath
Year: 2007
X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Touba
Year: 2007
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Leininger; M. Fischer; M. Richter; M. Goessel
Year: 2007
A complete test set to diagnose scan chain failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruifeng Guo; Yu Huang; Wu-Tung Cheng
Year: 2007
Interconnect open defect diagnosis with minimal physical information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Liu; Wei Zou; S.M. Reddy; Wu-Tung Cheng; M. Sharma; Huaxing Tang
Year: 2007
Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Moreira; H. Barnes; G. Hoersch
Year: 2007
The design-for-testability features of a general purpose microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da Wang; Xiaoxin Fan; Xiang Fu; Hui Liu; Ke Wen; Rui Li; Huawei Li; Yu Hu; Xiaowei Li
Year: 2007
Analyzing the risk of timing modeling based on path delay tests.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bastani; B.N. Lee; Li.-C. Wang; S. Sundareswaran; M.S. Abadir
Year: 2007
Mining-guided state justification with partitioned navigation tracks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Parikh; Weixin Wu; M.S. Hsiao
Year: 2007
An efficient SAT-based path delay fault ATPG with an unified sensitization model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shun-Yen Lu; Ming-Ting Hsieh; Jing-Jia Liou
Year: 2007
Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Abuhamdeh; V. D'Alassandro; R. Pico; D. Montrone; A. Crouch; A. Tracy
Year: 2007
Gate delay ratio model for unified path delay analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Okuda
Year: 2007
Rapid UHF RFID silicon debug and production testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U.S. Natarajan; H. Shanmugasundaram; P. Deshpande; Chin Soon Wah
Year: 2007
A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongquan Fan; Yi Cai; Z. Zilic
Year: 2007
A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.R. Devanathan; C.P. Ravikumar; V. Kamakoti
Year: 2007
Efficient power droop aware delay fault testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Li; Lei Fang; M.S. Hsiao
Year: 2007
PMScan : A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.R. Devanathan; C.P. Ravikumar; R. Mehrotra; V. Kamakoti
Year: 2007
Implementing bead probe technology for in-circuit test: A case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Farrell; G. Leinbach
Year: 2007
A bead probe CAD strategy for in-circuit test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker; D. DeMille
Year: 2007
Impact of Quad Flat No Lead package (QFN) on automated X-ray inspection (AXI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tee Chwee Liong; A. Pascual
Year: 2007
Delay defect diagnosis using segment network faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Poku; R.D. Blanton
Year: 2007
Testing for systematic defects based on DFM guidelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongok Kim; M.E. Amyeen; S. Venkataraman; I. Pomeranz; S. Basumallick; B. Landau
Year: 2007
Real-time signal processing - a new PLL test approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Okawara
Year: 2007
A methodology for systematic built-in self-test of phase-locked loops targeting at parametric failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo Yu; Peng Li
Year: 2007
An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Yamaguchi; H.X. Hou; K. Takayama; D. Armstrong; M. Ishida; M. Soma
Year: 2007
Achieving high transition delay fault coverage with partial DTSFF scan chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gefu Xu; A.D. Singh
Year: 2007
Fundamentals of timing information for test: How simple can we get?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kapur; J. Zejda; T.W. Williams
Year: 2007
Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Uzzaman; Bibo Li; T. Snethen; B. Keller; G. Grise
Year: 2007
Programmable deterministic Built-In Self-Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.-W. Hakmi; H.-J. Wunderlich; C.G. Zoellin; A. Glowatz; F. Hapke; J. Schloeffel; L. Souef
Year: 2007
A low cost test data compression technique for high n-detection fault coverage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seongmoon Wang; Zhanglei Wang; Wenlong Wei; S.T. Chakradhar
Year: 2007
On using lossless compression of debug data in embedded logic analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Anis; N. Nicolici
Year: 2007
Functional testing of digital microfluidic biochips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao Xu; K. Chakrabarty
Year: 2007
Enhancing signal controllability in functional test-benches through automatic constraint extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Guzey; Li.-C. Wang; J. Bhadra
Year: 2007
Measurement ratio testing for improved quality and outlier detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Roehr
Year: 2007
The new ATE: Protocol aware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C. Evans
Year: 2007
A matched expansion MEMS probe card with low CTE LTCC substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seong-Hun Choe; S. Tanaka; M. Esashi
Year: 2007
Management of common-mode currents in semiconductor ATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.J. Bowhers
Year: 2007
SPARTAN: a spectral and information theoretic approach to partial-scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O.I. Khan; M.L. Bushnell; S.K. Devanathan; V.D. Agrawal
Year: 2007
A scanisland based design enabling prebond testability in die-stacked microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Lewis; H.-H.S. Lee
Year: 2007
A generic and reconfigurable test paradigm using Low-cost integrated Poly-Si TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Li; S. Ghosh; K. Roy
Year: 2007
Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Gray; O. Liboiron-Ladouceur; D.C. Keezer; K. Bergman
Year: 2007
IEEE P1581 can solve your board level memory cluster test problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ehrenberg
Year: 2007
Statistical analysis and optimization of parametric delay test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.H. Wu; B.N. Lee; Li.-C. Wang; M.S. Abadir
Year: 2007
Backside E-Beam Probing on Nano scale devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Schlangen; R. Leihkauf; U. Kerst; C. Boit; R. Jain; T. Malik; K. Wilsher; T. Lundquist; B. Kruger
Year: 2007
Verification and debugging of IDDQ test of low power chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Laisne; T. Nguyen; S. Zuo; X. Pan; H. Cui; C. Bai; A. Street; M. Parley; N. Agrawal; K. Sundararaman
Year: 2007
Low cost automatic mixed-signal board test using IEEE 1149.4
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sundar; B.C. Kim; T. Byrd; F. Toledo; S. Wokhlu; E. Beskar; R. Rousselin; D. Cotton; G. Kendall
Year: 2007
Efficient simulation of parametric faults for multi-stage analog circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fang Liu; S. Ozev
Year: 2007
A novel scheme to reduce power supply noise for high-quality at-speed scan testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoqing Wen; K. Miyase; S. Kajihara; T. Suzuki; Y. Yamato; P. Girard; Y. Ohsumi; Laung-Terng Wang
Year: 2007
Pattern-directed circuit virtual partitioning for test power reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang Xu; Dianwei Hu; Dong Xiang
Year: 2007
California scan architecture for high quality and low power testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoung Youn Cho; S. Mitra; E.J. McCluskey
Year: 2007
Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bose; V.D. Agrawal
Year: 2007
Fast and effective fault simulation for path delay faults based on selected testable paths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Xiang; Yang Zhao; Kaiwei Li; H. Fujiwara
Year: 2007
Delay fault simulation with bounded gate delay mode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bose; H. Grimes; V.D. Agrawal
Year: 2007
ERTG: A test generator for error-rate testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shahidi; S.K. Gupta
Year: 2007
ACCE: Automatic correction of control-flow errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Vemu; S. Gurumurthy; J.A. Abraham
Year: 2007
Low cost characterization of RF transceivers through IQ data analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Acar; S. Ozev
Year: 2007
An algorithm to evaluate wide-band quadrature mixers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Asami
Year: 2007
Test yield estimation for analog/RF circuits over multiple correlated measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fang Liu; E. Acar; S. Ozev
Year: 2007
Dependable clock distribution for crosstalk aware design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Miura
Year: 2007
Novel compensation scheme for local clocks of high performance microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Metra; M. Omana; T. Mak; S. Tarn
Year: 2007
A methodology for detecting performance faults in microprocessors via performance monitoring hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hatzimihail; M. Psarakis; D. Gizopoulos; A. Paschalis
Year: 2007
On the saturation of n-detection test sets with increased n
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Pomeranz; S. Reddy
Year: 2007
Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bhargava; D. Meehl; J. Sage
Year: 2007
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Geuzebroek; E.J. Marinissen; A. Majhi; A. Glowatz; F. Hapke
Year: 2007
A comparative study of continuous sampling plans for functional board testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Antila; T. Karhu
Year: 2007
Enhanced testing of clock faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.L. McLaurin; R. Slobodnik; Kun-Han Tsai; A. Keim
Year: 2007
SiP-test: Predicting delivery quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Biewenga; F. de Jong
Year: 2007
A stereo audio Σ∑ ADC architecture with embedded SNDR self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Rolindez; S. Mir; J.-L. Carbonero; D. Goguet; N. Chouba
Year: 2007
Sigma-delta ADC characterization using noise transfer function pole-zero tracking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hochul Kim; Kye-shin Lee
Year: 2007
A fully digital-compatible BIST strategy for ADC linearity testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hanqing Xing; Hanjun Jiang; Degang Chen; R. Geiger
Year: 2007
IJTAG: The path to organized instrument connectivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Crouch
Year: 2007
Protocol requirements in an SJTAG/IJTAG environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Carlsson; J. Holmqvist; E. Larsson
Year: 2007
Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bhunia; K. Roy
Year: 2007
Power-aware test: Challenges and solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ravi
Year: 2007
Case study of a low power MTCMOS based ARM926 SoC : Design, analysis and test challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Idgunji
Year: 2007
Cost effective manufacturing test using mission mode tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Aggarwal
Year: 2007
A practical approach to comprehensive system test & debug using boundary scan based test architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Chakraborty; Chen-Huan Chiang; B.G. Van Treuren
Year: 2007
Design-for-reliability: A soft error case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Zhang
Year: 2007
Circuit failure prediction to overcome scaled CMOS reliability challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mitra; M. Agarwal
Year: 2007
GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nicolaidis
Year: 2007
Where is car IC testing going?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Comen
Year: 2007
How to ensure zero defects from the beginning with semiconductor test methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Gessner
Year: 2007
Car IC test changing but the same quality goal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Wittie
Year: 2007
Automotive IC's: less testing, more prevention
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Appello
Year: 2007
Principles and results of some test cost reduction methods for ASICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Maxwell
Year: 2007
Signature based diagnosis for logic BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu-Tung Cheng; M. Sharma; T. Rinderknecht; Liyang Lai; C. Hill
Year: 2007
Service-Oriented Management Architecture of Optical Virtual Private Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Wu; M. Savoie; S. Campbell; Hanxi Zhang
Year: 2007
Characterization and Synthesis of Markovian Workload Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Casale; E.Z. Zhang; E. Smirni
Year: 2007
Securing fast handover in WLANs: a ticket based proactive authentication scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kassab; J.M. Bonnin; K. Guillouard
Year: 2007
Using Selective Sampling for the Support of Scalable and Efficient Network Anomaly Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Androulidakis; V. Chatzigiannakis; S. Papavassiliou
Year: 2007
Pricing and Measurement-based Optimal Resource Allocation in Next Generation Network Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.G. Kallitsis; G. Michailidis; M. Devetsikiotis
Year: 2007
A Cooperative Method for Prefix Hijack Detection in the Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Liu; Peidong Zhu; Yuxing Peng; Ning Hu
Year: 2007
ADHOCSYS: Robust and Service-Oriented Wireless Mesh Networks to Bridge the Digital Divide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bucciol; F.Y. Li; N. Fragoulis; L. Vandoni
Year: 2007
Dependable Actuation in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Garces-Erice; S. Rooney
Year: 2007
Using Trust in Key Distribution in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Lewis; N. Foukia
Year: 2007
A Simple Multi-point Surveillance Scheme of a Moving Target for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tsukamoto; H. Ueda; H. Tamura; Jidong Wang; K. Kawahara; Y. Oie; T. Suda
Year: 2007
z2z: Discovering Zeroconf Services Beyond Local Link
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae Woo Lee; H. Schulzrinne; W. Kellerer; Z. Despotovic
Year: 2007
PEGASUS: 802.11 connectivity at high speed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Frangiadakis; D. Kuklov; N. Roussopoulos
Year: 2007
Modeling of Cooperative Navigation in Pervasive E-learning Applications Using (max, plus) Algebra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Nait-Sidi-Moh; D. Assossou; A. Roxin; M. Wack
Year: 2007
Survey of Wireless Geolocation Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Roxin; J. Gaber; M. Wack; A. Nait-Sidi-Moh
Year: 2007
Local Positioning for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Ellinger; R. Eickhoff; R. Gierlich; J. Huttner; A. Ziroff; S. Wehrli; T. Ussmuller; J. Carls; V. Subramanian; M. Krcmar; R. Mosshammer; S. Spiegel; D. Doumenis; A. Kounoudes; K. Kurek; Y. Yashchyshyn; C.B. Papadias; P. Tragas; A. Kalis; E. Avatagelou
Year: 2007
Wireless Mesh Network Monitoring: Design, Implementation and Experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Sailhan; L. Fallon; K. Quinn; P. Farrell; S. Collins; D. Parker; S. Ghamri-Doudane; Yangcheng Huang
Year: 2007
Vulnerabilities of Geocast Message Distribution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Schoch; F. Karg; T. Leinmuller; M. Weber
Year: 2007
Synthesizing Realistic Vehicular Mobility for More Precise Simulation of Inter-vehicle Communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nakanishi; T. Umedu; T. Higashino; H. Kitaoka; H. Mori
Year: 2007
Enhanced Perimeter Routing for Geographic Forwarding Protocols in Urban Vehicular Scenarios
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Lee; J. Haerri; Uichin Lee; M. Gerla
Year: 2007
Pricing Design of Power Control Game in WDM Optical Networks via State-space Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quanyan Zhu; L. Pavel
Year: 2007
FTTx: The Rise of Broadband Optical Access
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.S. El-Bawab
Year: 2007
PON as a driver for optical components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.J. Effenberger
Year: 2007
A Study on Video Over IP and the Effects on FTTx Architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.J. Sims
Year: 2007
Long Reach Optical Access Networks using Light-trails
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Dhanuka; A. Lodha; A. Gumaste; Nasir Ghani
Year: 2007
Rapid Growth of FTTH by Use of PON in Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Mukai; T. Yokotani; T. Kida
Year: 2007
Progress Toward a Fiber-Based National Broadband Strategy In the United States
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Bailer
Year: 2007
Concurrent Inference on High Level Context Using Alternative Context Construction Trees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Krause; C. Linnhoff-Popien; M. Strassberger
Year: 2007
Cleaning and Processing RSS Measurements for Location Fingerprinting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Kjaergaard
Year: 2007
Large-Scale Service Deployment--Application to OSGi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Baude; V.L. Contes; V. Lestideau
Year: 2007


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