Monte Carlo simulation of a YAP:Ce block detector for high resolution positron emission tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pavlopoulos, S.A.; Thireou, T.
Year: 1998
Compartmental modeling in dynamic SPET using projection data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karjalainen, P.A.; Vauhkonen, M.; Kaipio, J.P.
Year: 1998
A fast algorithm for estimating FDG model parameters in dynamic PET with an optimised image sampling schedule and corrections for cerebral blood volume and partial volume
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weidong Cai; Dagan Feng; Fulton, R.
Year: 1998
Statistical parametric analysis of activation foci detection in brain SPECT imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lahorte, P.; Vandenberghe, S.; D'Asseler, Y.; Koole, M.; Audenaert, K.; Dierckx, R.; Lemahieu, I.
Year: 1998
Micromachined capacitive ultrasonic immersion transducer for medical imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin, X.C.; Ehuri-Yakub, B.T.; Degertekin, F.L.; Ladabaum, I.; Calmes, S.
Year: 1998
3D echocardiography using a 3D positioner [ECG R-wave triggering]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oshiro, O.; Nambu, M.; Chihara, K.
Year: 1998
Influence of system setting on the myocardial integrated backscatter measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiang Li; Jing Bai; Guang Shu Hu; Ke Zheng Cheng
Year: 1998
Adaptation of ultrasound image texture characterization parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chan, K.L.
Year: 1998
Use of the Laplacian of Gaussian operator in prostate ultrasound image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fangwei Zhao; deSilva, C.J.S.
Year: 1998
An efficient motion estimation technique for ultrasonic subaperture imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tavh, B.; Karaman, M.
Year: 1998
Measuring size dynamics of embolism in aortic aneurysm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adam, D.R.; Ravhon, R.
Year: 1998
A new calibration method in 3D ultrasonic imaging system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jie Liu; Xiaorong Gao; Zhiguang Zhang; Shangkai Gao; Jinghao Zhou
Year: 1998
Segmentation of ultrasonic ovarian images by texture features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ching-Fen Jiang; Mu-Long Chen
Year: 1998
A combination method for ultrasonic speckle suppression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaohui Hao; Shangkai Gao; Xiaorong Gao
Year: 1998
Peak position estimation algorithms for cross-correlation function in elastography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chu-Xiong Ding; Jing Bai
Year: 1998
Automatic recognition of malignant lesions in ultrasound images by artificial neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruggiero, C.; Bagnoli, F.; Sacile, R.; Calabrese, M.; Rescinito, G.; Sardanelli, F.
Year: 1998
Intestinal abnormality detection from endoscopic images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krishnan, S.M.; Yang, X.; Chan, K.L.; Kumar, S.; Goh, P.M.Y.
Year: 1998
Development of an optical system for the detection of oral cancer using near-infrared spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cooney, K.M.; Gossage, K.W.; McShane, M.J.; van der Breggen, E.W.J.; Motamedi, M.; Cote, G.L.
Year: 1998
Novel microscopy system for imaging brain tissue structure and function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnson, L.; Chung, W.; Hanley, D.; Thakor, N.V.
Year: 1998
The automatic image analysis of red blood cell deformability and blood flow in microchannels with an image-intensified high-speed video camera system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimizu, T.; Sekizuka, E.; Oshio, C.; Tsukada, K.; Nagai, T.; Hokari, R.; Minamitani, H.
Year: 1998
A study on abdominal temperature of dysmenorrhea patients
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyung-Sub Lee; Jung-Hoon Cho
Year: 1998
Infrared imaging in minimally invasive surgery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marcucci, L.; Freeman, J.; Quinn, T.; Hopmeier, M.; Milner, R.; Friedberg, J.; Buyske, J.
Year: 1998
Prerequisites of dynamic area telethermometry (DAT)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anbar, M.; Milescu, L.
Year: 1998
Simulation and experiment on biological tissue for near infra-red (NIR) photon migration in a multi-layered model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ding Haishu; Su Chang; Lin Fang; Wang Feng; Ying Jinpin
Year: 1998
Imaging of skin thermal properties by changing ambient radiation temperature-an electrical control system for stepwise change in ambient radiation temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hassan, M.; Kimura, Y.; Asai, A.; Shimase, A.; Fukuoka, M.; Togawa, T.
Year: 1998
Consistent digital color image acquisition of the skin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vander Haeghen, Y.; Naeyeart, J.M.; Lemahieu, I.
Year: 1998
Development of an image processing software for medical thermogram analysis using a commercially available image processing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujimasa, I.; Nakazawa, H.; Miyasaka, E.
Year: 1998
Autofluorescence spectroscopy to identify normal and cancerous colorectal tissues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Yu Wang; Jen-Kou Lin; Huihua Kenny Chiang
Year: 1998
Shape descriptors computed from photographs of dolphin dorsal fins for use as database indices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hillman, G.R.; Tagare, H.; Elder, K.; Drobyshevski, A.; Weller, D.; Wursig, B.
Year: 1998
Reference database of images and video sequences in gastrointestinal endoscopy: a medical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cauvin, J.M.; Solaiman, B.; Le Guillou, C.; Brunet, G.; Robaszkiewicz, M.; Roux, C.
Year: 1998
Logistic regression in the analysis of image cytometric data of fine-needle aspirated cells of breast cancer patients-a comparison with artificial neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Naguib, R.N.G.; Mat-Sakim, H.A.; Lakshmi, M.S.; Wadehra, V.; Lennard, T.W.J.; Bhatavdekar, J.; Sherbet, G.V.
Year: 1998
Classification of facial expressions using self-organizing maps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katoh, A.; Fukui, Y.
Year: 1998
An improved adaptive B-spline active contour model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haiying Tang; Tiange Zhuang
Year: 1998
Imaged based 3D solid model construction of human arteries for blood flow simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parker, D.; Taylor, C.A.; Wang, K.
Year: 1998
Segmentation of breast tumors in mammograms by fuzzy region growing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guliato, D.; Rangayyan, R.M.; Carnielli, W.A.; Zuffo, J.A.; Desautels, J.E.L.
Year: 1998
A method of image enhancement and fractal dimension for detection of microcalcifications in mammogram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang Hee Nam; Jun Young Choi
Year: 1998
Adaptive CAD modules for mass detection in digital mammography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Qian; Lihua Li; Clarke, L.P.; Fei Mao; Clark, R.A.
Year: 1998
Digital mammographic image analysis and data compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong-Dun Lin; Kang-Ping Lin; Shyh-Liang Lou
Year: 1998
Construction of anatomy-based priors with anisotropic characteristics with application to electrical impedance tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaipio, J.P.; Kolehmainen, V.; Vauhkonen, N.; Somersalo, E.
Year: 1998
Theoretical and numerical comparisons between Laplace's solution and Poisson's solution to the forward problem for a finite right circular cylinder [EIT image reconstruction]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kleinermann, F.; Avis, N.J.; Alhargan, F.A.
Year: 1998
Improving EIT image quality by using multiple meshes combination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tang MengXing; Dong XiuZhen; You FuSheng; Shi XueTao; Qing MingXin; Fu Feng
Year: 1998
Interstitial electrolyte infusion creates a liquid electrode for controlled application of high power radiofrequency energy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoey, M.F.; Paul, S.
Year: 1998
Study on electro-bactericidal effect of the metal coating flat sheet membrane for Pseudomonas aeruginosa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugawara, T.; Kimura, K.; Misawa, K.; Arisawa, J.; Igarashi, O.
Year: 1998
Application of ionisation constant of amino acids for protein signal analysis within the resonant recognition model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cosic, I.; Pirogova, E.
Year: 1998
Automated DNA sequencing on gel images by digital techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhu, S.F.; Zhang, Y.T.
Year: 1998
Computer aided anti-thrombosis traditional Chinese medicine selecting system in-vivo and in-vitro model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zheng Xiaoxiang; Xu Lei; Yuan Hong
Year: 1998
Acoustic wave biosensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lec, R.M.; Lewin, P.A.
Year: 1998
Microwave and ELF electromagnetic field effects on intercellular communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiang, H.
Year: 1998
A novel finite element method for analyzing viscoelastic dynamics in biological tissues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cai Kunbao; Jiang Zejia; Zhou Shouchang; Yang Ruifang; Yu Jihui
Year: 1998
Polaron model for quantum migration of electrons in nucleic acids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Kaixi
Year: 1998
Finite element modeling of the neuron-electrode interface: sealing resistance and stimulus transfer at transitions from complete to defect sealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buitenweg, J.R.; Rutten, W.L.C.; Marani, E.
Year: 1998
A novel cell-positioning technique for extracellular recording and impedance measurement on single cells using planar electrode substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thielecke, H.; Stieglitz, T.; Beutel, H.; Matthies, T.; Meyer, J.-U.
Year: 1998
Optimisation of porous silicon used as a glucose biosensor enzyme carrier matrix
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laurell, T.; Drott, J.; Bengtsson, M.; Rosengren, L.
Year: 1998
Imaging of myocardial metabolic activity by mitochondrial NADH fluorescence in a beating rat heart
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ogasawara, Y.; Nakamoto, H.; Mochizuki, S.; Yamamori, S.; Hosaka, H.; Kajiya, F.
Year: 1998
Design of Ti/HA biomedical implants using ion-beam-assisted deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Changxiang; Chen Zhiqing
Year: 1998
A biodegradable long-term contraceptive implant developed in China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, P.Y.; Song, C.X.; Sun, H.F.; Cui, X.M.; Shi, H.L.; Shi, R.W.; Quan, L.W.
Year: 1998
Microstructure study of porous biphasic calcium phosphate ceramics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Linghong Guo; Shuxin Qu; Xingdong Zhang; Ling Qin; Xia Guo; Cheng, J.
Year: 1998
Cellular characterisation and separation: dielectrophoretically activated cell sorting (DACS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ka Lok Chan; Green, N.G.; Hughes, M.P.; Morgan, H.
Year: 1998
Mechanical manipulation of human osteoblast and chondrocyte cells with 'optical tweezers'
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walker, L.M.; Holm, A.; Oberg, A.; Sundqvist, T.; El Haj, A.J.
Year: 1998
Measurements of absorption coefficients within biological tissue in vitro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nam Jung Kim; Hyun Soo Lim
Year: 1998
Variability of the lengths of the internodal segments of myelinated nerve fibers: influence on electrical stimulus thresholds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Struijk, J.J.
Year: 1998
System identification of a circadian signal source using BP neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cisse, Y.; Kinouchi, Y.; Nagashino, H.; Akutagawa, M.
Year: 1998
Robust identification of time-varying system dynamics with non-white inputs and output noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lortie, M.; Kearney, R.E.
Year: 1998
Identification of time-varying joint dynamics using wavelets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangzhi Wang; Li-Qun Zhang
Year: 1998
Effects of aldose reductase inhibitor in diabetic rats
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagai, T.; Sekizuka, E.; Tsukada, K.; Shimizu, T.; Minamitani, H.; Hokai, R.; Oshio, C.
Year: 1998
An application of wavelet transform and adaptive filters for decomposition of the HRV signals in the case of patients with coronary artery disease
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tkacz, E.; Kostka, P.; Komorowski, D.
Year: 1998
Retinal blood vessel detection and tracking by matched Gaussian and Kalman filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chutatape, O.; Liu Zheng; Krishnan, S.M.
Year: 1998
Dynamical coding structure in mammal auditory system revealed by optical imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fukunishi, K.; Tokioka, R.; Kawaguchi, H.; Murai, N.
Year: 1998
Pitch detection with average magnitude difference function using adaptive threshold algorithm for estimating shimmer and jitter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hae Young Kim; Jae Sung Lee; Myung-Whun Sung; Kwang Hyun Kim; Kwang Suk Park
Year: 1998
Visual evoked potential estimation by eigendecomposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiu, W.; Chan, F.H.Y.; Lam, F.K.
Year: 1998
Pulmonary function measurement using flow time monitor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lim, J.P.-K.; Warwick, W.J.; Hansen, L.G.
Year: 1998
Frequency response of the pleuro-esophageal tissue barrier and esophageal pressure waveform bandwidth in non-human primates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hartford, C.G.; Turner, M.J.
Year: 1998
Power distribution analysis of cutaneous electrogastrography using discrete wavelet transform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han-Chang Wu; Kuang-Ching Wang; Ya-Wen Chang; Full-Young Chang; Shuenn-Tsong Young; Te-Son Kuo
Year: 1998
Analysis of the human perception threshold of an ELF electric field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimizu, H.O.; Shimizu, K.; Matsumoto, G.
Year: 1998
The effects of frequency-window and intensity-window of electromagnetic waves on brain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niu Zhongqi; Kang Gang; Huang Cuiyun; Lu Zhiuan; Guo Guozhen; Liu Yan; Guo Yao; Zhang Shaozhang
Year: 1998
Currents induced in human body exposed to the power line electromagnetic field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Poljak, D.; Roje, V.
Year: 1998
The effects of 50 Hz magnetic fields and/or phorbol ester TPA on proto-oncogene expression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu, R.Y.; Chiang, H.; Fu, Y.D.; Bao, J.L.
Year: 1998
Influence of 50 Hz magnetic fields on circadian rhythm of the suprachiasmatic nucleus activity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiwaki, O.
Year: 1998
High frequency interference effects in amplifiers for biopotential recordings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van der Horst, M.J.; Metting Van Rijn, A.C.; Peper, A.; Grimbergen, C.A.
Year: 1998
Feedthrough EMI filter with ground isolation for cardiac pacemakers and implantable cardioverter defibrillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stevenson, R.A.
Year: 1998
Medical device development practices: empirical survey and legal implications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Holley, L.K.; Hughes, C.F.
Year: 1998
Reengineering management in health organizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Augelis, A.A.; Pavlopoulos, S.A.; Kontsourii, D.
Year: 1998
Development of a communication tool using patterns of blinking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yano, K.; Ishihara, K.; Yamada, K.; Yamashita, K.; Makikawa, M.
Year: 1998
Signal processing and medical signal processing: the teaching differences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lithgow, B.J.
Year: 1998
Chip-microcomputer based safety tester for medical equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hu, Y.; Feng, Y.M.; Wang, M.S.; Lu, W.W.
Year: 1998
The effect of laser etching on the load carrying capacities of the Christensen temporomandibular joint implant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saha, S.; Campbell, C.; Furman, B.; Christensen, R.W.
Year: 1998
Detection sensitivity enhancements for fluorescence imaging with multi-photon excitation microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wokosin, D.L.; Amos, W.B.; White, J.G.
Year: 1998
Nanometer imaging by differential confocal microscopy and its applications in biology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chau-Hwang Lee; Jyhpyng Wang; Chin-Lin Guo
Year: 1998
An improved phonocardiographic method for fetal heart rate monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kovacs, F.; Torok, M.
Year: 1998
Non-invasive blood pressure measurement based on the electronic palpation method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nissila, S.; Sorvisto, M.; Sorvoja, H.; Vieri-Gashi, E.; Myllyla, R.
Year: 1998
Characterization of improved tactile sensors using piezoelectric resonator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maezawa, M.; Kuroda, Y.; Ohta, R.
Year: 1998
Haptic display able to replicate the rheological behaviour of surgical tissues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scilingo, E.P.; Bicchi, A.; de Rossi, D.; Iacconi, P.
Year: 1998
An integrated instrumentation approach to the study of wound healing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wertheim, D.; Melhuish, J.; Llewellyn, M.; Hoppe, A.; Williams, R.; Harding, K.
Year: 1998
A new approach to noninvasive measurement of blood glucose using saliva analyzing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitsumori, M.; Yamaguchi, M.; Kano, Y.
Year: 1998
A numerical analysis of continuous glucose monitoring method using a microdialysis technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koseki, O.; Tamura, T.; Sumino, T.; Ogawa, M.; Togawa, T.; Tsuchiya, K.
Year: 1998
Prototype development of digital spirometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chii-Wann Lin; Di-Ho Wang; Hao-Chien Wang; Huey-Dong Wu
Year: 1998
Development of a miniaturized IV drip rate meter using optical sensors and fuzzy rule based detection algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, Y.S.; Kim, H.C.
Year: 1998
Fluorescence-based implantable biosensors: Monte Carlo modeling for optical probe design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McShane, M.; Rastegar, S.; Cote, G.
Year: 1998
The application of cross-correlation method in blood flow sonography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shangkai Gao; Guofu Xu; Shigao Chen; Lepeng Zeng
Year: 1998
Micro motor based new type of endoscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gao, L.M.; Chen, Y.; Lin, L.M.; Yan, G.Z.
Year: 1998
Development of micromachined electrochemical sensor and portable meter system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chii-Wann Lin; Chien-Yu Jan; Chen, O.T.-C.; Wang, S.; Kao, T.
Year: 1998
Biochemical sensors based on thin-film waveguide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minamitani, H.; Kim, K.; Matsumoto, K.
Year: 1998
A novel hybrid reflectance pulse oximeter sensor with improved linearity and general applicability to various portions of the body
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nogawa, M.; Kaiwa, T.; Takatani, S.
Year: 1998
Influence of adipose tissue on near infrared oxygenation monitoring in muscle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsushita, K.; Okada, E.
Year: 1998
3-D spatial sensitivity profiles of head model in near-infrared spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okada, E.
Year: 1998
Pulse profile registration using self-mixing in a diode laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meigas, K.; Hinrikus, H.; Lass, J.; Kattai, R.
Year: 1998
ECG-triggering of the laser Doppler perfusion imaging signal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wardell, K.; Eriksson, O.
Year: 1998
Optical measurement of glucose levels in scattering media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon, G.; Amerov, A.K.; Kye Jin Jeon; Ju Byung Kim; Yoen-Joo Kim
Year: 1998
A pilot study for video-based dynamic retinoscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ebisawa, Y.
Year: 1998
A PC-based system for long-term monitoring of animal activity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu, B.M.; Chan, F.H.Y.; Lam, F.K.; Lam, M.C.; Poon, P.W.F.; Poon, A.M.S.
Year: 1998
The development of long-term ambulatory pH monitoring system and its clinical application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fanliang Kong; Gui-Tang Pan; Zhiwei Xia; Hongjun Chai; Sanran Lin; Xueming Huang
Year: 1998
A multichannel implantable electronic system with TDM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu Dongqing; Wang Baohua
Year: 1998
Design consideration of a multi-function otoacoustic emission measurement system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minghui Du; Chan, F.H.Y.; Lam, F.K.; Jun Ren
Year: 1998
An implantable telemetry system powered by a capacitor having high capacitance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maki, H.; Yonezawa, Y.; Harada, E.; Ninomiya, I.
Year: 1998
A recording and analyzing system for cutaneous electrogastrography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han-Chang Wu; Shao-Cheng Wang; Shuenn-Tsong Young; Te-Son Kuo
Year: 1998
A study on the integration and synchronization of video image using H.261 in polysomnography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mee-Hye Choi; Hae-Jeong Park; Joo-Man Han; Do-Un Jeong; Kwang-Suk Park
Year: 1998
Digitization of electrocardiogram (ECG) signals using delta-sigma modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leung, S.W.; Zhang, Y.T.
Year: 1998
Automatic body temperature control system for small animal studies using dual mode PI control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyung Il Kim; Hee Chan Kim; Byoung Woo Yoon
Year: 1998
Estimation of evoked potentials using segment latency corrected average
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, Y.H.; Lee, D.H.; Kim, Y.S.; Lee, D.S.; Kim, S.I.
Year: 1998
Identification of finger flexions from continuous EEG as a brain computer interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lisogurski, D.; Birch, G.E.
Year: 1998
Injury detection and signal discrimination of EEG by higher order crossings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xuan Kong; Tianshuang Qiu
Year: 1998
Blind source separation of EEG data using matched filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kohler, B.-U.; Orglmeister, R.; Brehmeier-Flick, B.
Year: 1998
Nonlinear changes in evoked potentials during recovery from hypoxic-ischemic injury
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sherman, D.L.; Hinich, M.J.; Hanley, D.F.; Thakor, N.V.
Year: 1998
A new adaptive time delay estimation algorithm with local variable gain for evoked potential latency change estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xuan Kong; Tianshuang Qiu
Year: 1998
Feature extraction in development of brain-computer interface: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Polak, M.; Kostov, A.
Year: 1998
Prediction of histopathological outcome using averaged multimoidal information in rat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weizhao Zhao; Ginsberg, M.D.; Belayev, L.; Truettner, J.; Schmidt-Kastner, R.
Year: 1998
The localization of energized coils using MEG sensors: theory and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Munck, J.C.; Verbunt, J.P.A.; van Dijk, B.W.
Year: 1998
Enhancement of epileptiform activity in the EEG by 3-D adaptive spatial filtering: simulations and real data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ward, D.-M.; Jones, R.D.; Bones, P.J.; Carroll, G.J.
Year: 1998
High-resolution ERD: cortical imaging of event-related desynchronization during motor imagery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edlinger, G.; Prull, A.; Neuper, C.; Pfurtscheller, G.
Year: 1998
Identifying the neural networks subserving specific neural processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gonzalez Andino, S.L.; Grave de Peralta Menendez, R.; Morand, S.
Year: 1998
Application of 3-D MEG measurement for estimating multiple sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uchikawa, Y.; Kobayashi, K.
Year: 1998
Combination of magnetoencephalography (MEG) and functional magnetic resonance imaging (FMRI) for neurosurgical mapping of the sensory and motor cortices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakasato, N.; Inoue, T.; Takahashi, A.; Kanno, A.; Hatanaka, K.; Shimizu, H.; Kumabe, T.; Yoshimoto, T.
Year: 1998
Odorant perception and active olfaction: a study of olfactory magnetic fields evoked by odorant pulse stimuli synchronized with respiratory cycle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tonoike, M.; Yamaguchi, M.; Hamada, T.; Kaetsu, I.; Koizuka, I.; Seo, R.
Year: 1998
Improvement of S/N in evoked neuromagnetic fields by eliminating a spontaneous field component
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobayashi, T.; Kuriki, S.
Year: 1998
Active electrodes for EEG and evoked potential
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ko, W.H.
Year: 1998
Silicon sieve electrodes for neural implants-in vitro characterisation and in vivo recordings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wallman, L.; Levinsson, A.; Schouenborg, J.; Holmberg, H.; Montelius, L.; Danielsen, N.; Laurell, T.
Year: 1998
Fast measurement of SEP for monitoring spinal cord during scoliosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fung, K.S.M.; Du, M.H.; Liu, W.Q.; Chan, F.H.Y.; Lam, F.K.; Luk, D.K.; Hu, Y.
Year: 1998
Large scale terrain visualization using the restricted quadtree triangulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pajarola, R.
Year: 1998
Contour interpolation and surface reconstruction of smooth terrain models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chai, J.; Miyoshi, T.; Nakamae, E.
Year: 1998
Smooth view-dependent level-of-detail control and its application to terrain rendering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoppe, H.
Year: 1998
Tracking scalar features in unstructured data sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Silver, D.; Wang, X.
Year: 1998
Feature detection in linked derived spaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henze, C.
Year: 1998
Building perceptual textures to visualize multidimensional datasets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Healey, C.G.; Enns, J.T.
Year: 1998
Efficient co-triangulation of large data sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weimer, H.; Warren, J.; Troutner, J.; Wiggins, W.; Shrout, J.
Year: 1998
Image-guided streamline placement on curvilinear grid surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mao, X.; Hatanaka, Y.; Higashida, H.; Imamiya, A.
Year: 1998
Automatic detection of open and closed separation and attachment lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kenwright, D.N.
Year: 1998
Isosurface extraction in time-varying fields using a temporal hierarchical index tree
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shen, H.-W.
Year: 1998
Efficient warping for architectural walkthroughs using layered depth images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Popescu, V.; Lastra, A.; Aliaga, D.; de Oliveira Neto, M.
Year: 1998
Visualizing differences in movies of cortical activity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robbins, K.A.; Senseman, D.M.
Year: 1998
Fast and memory efficient polygonal simplification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lindstrom, P.; Turk, G.
Year: 1998
Simplification of tetrahedral meshes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trotts, I.J.; Hamann, B.; Joy, K.I.; Wiley, D.F.
Year: 1998
Image-based transfer function design for data exploration in volume visualization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiaofen Fang; Biddlecome, T.; Tuceryan, M.
Year: 1998
Hierarchical volume analysis and visualization based on morphological operators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lurig, C.; Ertl, T.
Year: 1998
Pixel masks for screen-door transparency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mulder, J.D.; Groen, F.C.A.; van Wijk, J.J.
Year: 1998
Comparing LIC and spot noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Leeuw, W.; van Liere, R.
Year: 1998
Converting sets of polygons to manifold surfaces by cutting and stitching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gueziec, A.; Taubin, G.; Lazarus, F.; Horn, W.
Year: 1998
Data level comparison of wind tunnel and computational fluid dynamics data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shen, Q.; Pang, A.; Uselton, S.
Year: 1998
Visual presentation of magnetic resonance images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van der Heyden, J.E.; Carpendale, M.S.T.; Inkpen, K.; Atkins, M.S.
Year: 1998
Visualization in corneal topography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vos, F.M.; Spoelder, H.J.W.
Year: 1998
Interactive virtual angioscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gobbetti, E.; Pili, P.; Zorcolo, A.; Tuveri, M.
Year: 1998
Visualizing Hilbert curves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Max, N.
Year: 1998
Rear-projecting virtual data onto physical terrain: an exercise in two senses being better than one
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clark, D.; Marciano, R.; McKeon, R.; Bailey, M.
Year: 1998
Intent, perception, and out-of-core visualization applied to terrain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davis, D.; Jiang, T.Y.; Ribarsky, W.; Faust, N.
Year: 1998
Battlefield visualization on the responsive workbench
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Durbin; J.E. Swan, II.; B. Colbert; J. Crowe; R. King; T. King; C. Scannell; Z. Wartell; T. Welsh
Year: 1998
Acoustic imaging and visualization of plumes discharging from black smoker vents on the deep seafloor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rona, P.; Bemis, K.; Kenchammana-Hosekote, D.; Silver, D.
Year: 1998
Three-dimensional visualization of microstructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lanzagorta; M.V. Kral; J.E. Swan, II.; G. Spanos; R. Rosenberg; E. Kuo
Year: 1998
Why is Real-Time Volume Rendering No Longer a Year Away?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaufman, A.; Brady, M.; Lorensen, B.; Kitson, F.; Pfister, H.
Year: 1998
Thermal conductance of IC interconnects embedded in dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harmon, D.; Gill, J.; Sullivan, T.
Year: 1998
A study of field dependence of TDDB of ultra-thin gate oxide and anomaly in the I-V of MOS devices with active guard ring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yassine, A.; Nariman, H.; Olasupo, K.; Govea, L.
Year: 1998
Practical triggering of early breakdowns in thin oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jackson, J.C.; Dumin, D.J.; Messick, C.; Bendall, R.E.
Year: 1998
A constant gate current technique for obtaining low-frequency C-V characteristics of MOS capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qian, J.G.; Hensley, R.A.; Littefield, E.
Year: 1998
Electric field and temperature acceleration of quasi-breakdown phenomena in ultrathin oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roy, D.; Bruyere, S.; Vincent, E.; Ghibaudo, G.
Year: 1998
Design study of the injection and extraction systems for the RIKEN superconducting ring cyclotron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okuno, H.; Tominaka, T.; Fujishima, S.; Mitsumoto, T.; Kubo, T.; Kawaguchi, T.; Kim, J.-W.; Ikegami, K.; Sakamoto, N.; Yokouchi, S.; Morikawa, T.; Tanaka, T.; Goto, A.; Yano, Y.
Year: 1998
A new mechanism for gate oxide degradation and its applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, C.H.; Fu, K.Y.; DeMassa, T.A.; Sanchez, J.J.
Year: 1998
Electrostatic discharge (ESD) technology benchmarking strategy for evaluating ESD robustness of CMOS technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voldman, S.; Anderson, W.; Ashton, R.; Chaine, M.; Duvvury, C.; Maloney, T.; Worley, E.
Year: 1998
Discussion Group Summary Interconnect Reliability - with A Focus On Copper
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sullivan, T.; Pierce, D.
Year: 1998
Oxides - Ultra Thin Oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.-P. Vollertsen; D.J. Dumin
Year: 1998
C-V Measurements - And Its Implication On Oxide, Transistor And Non-volatile Memory Cell Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schwalke, U.; Gordon, B.
Year: 1998
Equilibrium-controlled static C-V method and its applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schwalke, U.; Gruensfelder, C.; Kerber, M.
Year: 1998
Investigation on the reduction of the dark current for PIN silicon photodiodes using statistical methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aceves, M.; Rosales, P.; Cerdeira, A.; Estrada, M.; Cabal, A.E.; Ramirez, J.
Year: 1998
Characterization of quasi-breakdown in ultra-thin gate oxides in an automated test environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brisbin, D.
Year: 1998
The analysis of oxide reliability data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hunter, W.R.
Year: 1998
Online compensation of heading sensor bias for low cost AUVs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Healey, A.J.; An, E.P.; Marco, D.B.
Year: 1998
An integrated GPS/INS navigation system for small AUVs using an asynchronous Kalman filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yun, X.; Hernandez, G.C.; Bachmann, E.R.; McGhee, R.B.; Healey, A.J.
Year: 1998
Inertial sensor technology trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barbour, N.; Schmidt, G.
Year: 1998
Trends in inertial systems technology for high accuracy AUV navigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huddle, J.R.
Year: 1998
Trends in acoustic velocity log technology at RD Instruments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young, J.; Rowe, F.; Brumley, B.; Bradley, S.
Year: 1998
Concurrent mapping and localization with FLS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carpenter, R.N.
Year: 1998
Precision gravity gradiometer/AUV system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goldstein, M.S.; Brett, J.J.
Year: 1998
GIB buoys: an interface between space and depths of the oceans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas, H.G.
Year: 1998
Demonstration of a vision-based dead-reckoning system for navigation of an underwater vehicle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huster, A.; Fleischer, S.D.; Rock, S.M.
Year: 1998
Executing system on a chip: requirements for a successful SOC implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daeje Chin
Year: 1998
Trends in semiconductor equipment, materials, and processing technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.S. Peercy
Year: 1998
Amorphous silicon TFT X-ray image sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.L. Weisfield
Year: 1998
Monolithic integration of light emitting diodes, detectors and optical fibers on a silicon wafer: a CMOS compatible optical sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Misiakos; E. Tsoi; S. Kakabakos
Year: 1998
640/spl times/480 back-illuminated CCD imager with improved blooming control for night vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.E. Burke; R.K. Reich; J.A. Gregory; W.H. McGonagle; A.M. Waxman; E. Savoye; B.B. Kosicki
Year: 1998
A 2/3" 2-M pixel progressive scan FT-CCD for digital still camera applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.T. Bosiers; A.C. Kleimann; L. Korthout; D.W. Verbugt; H.L. Peek; E. Roks; A. Heringa; F.F. Vledder; P. Opmeer
Year: 1998
Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Tanabe; Y. Kudoh; Y. Kawakami; K. Masubuchi; S. Kawai; T. Yamada; M. Morimoto; K. Arai; K. Hatano; M. Furumiya; Y. Nakashiba; N. Mutoh; K. Orihara; H. Teranishi
Year: 1998
A snap-shot CMOS active pixel imager for low-noise, high-speed imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guang Yang; O. Yadid-Pecht; C. Wrigley; B. Pain
Year: 1998
Wide bandgap semiconductor power electronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Weitzel
Year: 1998
Direct measurement of gate depletion in high breakdown (405 V) AlGaN/GaN heterostructure field effect transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Vetury; Y.-F. Wu; P.T. Fini; G. Parish; S. Keller; S. DenBaars; U.K. Mishra
Year: 1998
Low-distortion GaAs-based field effect transistors with InGaP channel layer for high-voltage operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Hara; Y. Nakasha; T. Kikkawa; H. Takahashi; K. Joshin; Y. Watanabe; H. Tanaka; M. Takikawa
Year: 1998
Depletion-mode GaAs MOSFETs with negligible drain current drift and hysteresis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.C. Wang; M. Hong; J.M. Kuo; J.P. Mannaerts; J. Kwo; H.S. Tsai; J.J. Krajewski; Y.K. Chen; A.Y. Cho
Year: 1998
Improvement of off-state breakdown voltage in power GaAs MESFETs based on an accurate simulation scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Kunihiro; Y. Takahashi; Y. Ohno
Year: 1998
Quasi-3D device simulation for microwave noise characterization of MOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Lin; Lan Wang; R. Obrecht; T. Manku
Year: 1998
Physics-based RF noise modeling of submicron MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Donati; M.A. Alam; K.S. Krisch; S. Martin; M.R. Pinto; H.H. Vuong; F. Bonani; G. Ghione
Year: 1998
A physically based model for low-frequency noise of poly-silicon resistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Brederlow; W. Weber; C. Dahl; D. Schmitt-Landsiedel; R. Thewes
Year: 1998
Ratio based hot-carrier degradation modeling for aged timing simulation of millions of transistors digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yonezawa; Jingjun Fang; Y. Kawakami; N. Iwanishi; Lifeng Wu; A.I.-H. Chen; N. Koike; Chune-Sin Yeh; Zhihong Liu
Year: 1998
ESD circuit synthesis and analysis using TCAD and SPICE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rodriguez; M.C. Smayling; W.L. Wilson
Year: 1998
A compact SOI-MOSFET model for high temperature circuit simulation with emphasis on process and layout data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Peters; P. Seegebrecht
Year: 1998
Status of single-electron memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yano; T. Ishii; T. Sano; T. Mine; F. Murai; T. Kure; K. Seki
Year: 1998
MOS memory using germanium nanocrystals formed by thermal oxidation of Si/sub 1-x/Ge/sub x/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ya-Chin King; Tsu-Jae King; Chenming Hu
Year: 1998
Influence of quantum confinement effects on single electron and single hole transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ishikuro; T. Hiramoto
Year: 1998
A multi-gate single-electron transistor and its application to an exclusive-OR gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Takahashi; A. Fujiwara; K. Yamazaki; H. Namatsu; K. Kurihara; K. Murase
Year: 1998
Shallow trench isolation for advanced ULSI CMOS technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nandakumar; A. Chatterjee; S. Sridhar; K. Joyner; M. Rodder; I.-C. Chen
Year: 1998
Novel corner rounding process for shallow trench isolation utilizing MSTS (Micro-Structure Transformation of Silicon)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Matsuda; T. Sato; H. Yoshimura; Y. Takegawa; A. Sudo; I. Mizushima; Y. Tsunashima; Y. Toyoshima
Year: 1998
Modeling of cumulative thermo-mechanical stress (CTMS) produced by the shallow trench isolation process for 1 Gb DRAM and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tai-Kyung Kim; Do-Hyung Kim; Jae-Kwan Park; Tai-Su Park; Young-Kwan Park; Hoong-Joo Lee; Kang-Yoon Lee; Jeong-Taek Kong; Jong-Woo Park
Year: 1998
Control of trench sidewall stress in bias ECR-CVD oxide-filled STI for enhanced DRAM data retention time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Saino; K. Okonogi; S. Horiba; M. Sakao; M. Komuro; Y. Takaishi; T. Sakoh; K. Yoshida; K. Koyama
Year: 1998
Leakage current observation on irregular local PN junctions forming the tail distribution of DRAM retention characteristics, with new test structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ueno; T. Yamashita; H. Oda; S. Komori; Y. Inoue; T. Nishimura
Year: 1998
Local-field-enhancement model of DRAM retention failure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Hiraiwa; M. Ogasawara; N. Natsuaki; Y. Itoh; H. Iwai
Year: 1998
Ultra-thin gate oxides-performance and reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Iwai; H.S. Momose
Year: 1998
Reliability projection for ultra-thin oxides at low voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.H. Stathis; D.J. DiMaria
Year: 1998
Comparison of E and 1/E TDDB models for SiO/sub 2/ under long-term/low-field test conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. McPherson; V. Reddy; K. Banerjee; Huy Le
Year: 1998
Explanation of stress-induced damage in thin oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.J. Bude; B.E. Weir; P.J. Silverman
Year: 1998
A detailed study of soft- and pre-soft-breakdowns in small geometry MOS structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sakura; H. Utsunomiya; Y. Kamakura; K. Taniguchi
Year: 1998
Structural dependence of dielectric breakdown in ultra-thin gate oxides and its relationship to soft breakdown modes and device failure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Wu; E. Nowak; J. Aitken; W. Abadeer; L.K. Han; S. Lo
Year: 1998
Point contact conduction at the oxide breakdown of MOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sune; E. Miranda; M. Nafria; X. Aymerich
Year: 1998
A high performance 180 nm generation logic technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Yang; S. Ahmed; B. Arcot; R. Arghavani; P. Bai; S. Chambers; P. Charvat; R. Cotner; R. Gasser; T. Ghani; M. Hussein; C. Jan; C. Kardas; J. Maiz; P. McGregor; B. McIntyre; P. Nguyen; P. Packan; I. Post; S. Sivakumar; J. Steigerwald; M. Taylor; B. Tufts; S. Tyagi; M. Bohr
Year: 1998
A novel 6T-SRAM cell technology designed with rectangular patterns scalable beyond 0.18 /spl mu/m generation and desirable for ultra high speed operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ishida; T. Kawakami; A. Tsuji; N. Kawamoto; M. Motoyoshi; N. Ouchi
Year: 1998
A 0.2-/spl mu/m bipolar-CMOS technology on bonded SOI with copper metallization for ultra high-speed processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hashimoto; T. Kikuchi; K. Watanabe; N. Ohashi; T. Saito; H. Yamaguchi; S. Wada; N. Natsuaki; M. Kondo; S. Kondo; Y. Homma; N. Owada; T. Ikeda
Year: 1998
An RF BiCMOS process using high f/sub SR/ spiral inductor with premetal deep trenches and a dual recessed bipolar collector sink
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yoshida; H. Suzuki; Y. Kinoshita; H. Fujii; T. Yamazaki
Year: 1998
1.8 million transistor CMOS ASIC fabricated in a SiGe BiCMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. Johnson; M.J. Zierak; K.B. Outama; T.C. Bahn; A.J. Joseph; C.N. Cordero; J. Malinowski; T.W. Weeks; R.A. Milliken; T.J. Medve; G.A. May; W. Chong; B.B. Chau; M.W. Nelson; D.L. Harame
Year: 1998
30-nm-gate InAlAs/InGaAs HEMTs lattice-matched to InP substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Suemitsu; T. Ishii; H. Yokoyama; Y. Umeda; T. Enoki; Y. Ishii; T. Tamamura
Year: 1998
Improvement of DC, low frequency and reliability properties of InAlAs/InGaAs InP-based HEMTs by means of an InP etch stop layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Meneghesso; D. Buttari; E. Perin; C. Canali; E. Zanoni
Year: 1998
Hydrogen degradation in InP HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.R. Blanchard; J.A. del Alamo; P.C. Chao; S.B. Adams
Year: 1998
Metamorphic In/sub x/Al/sub 1-x/As/In/sub x/Ga/sub 1-x/As HEMTs on GaAs substrate: the influence of In composition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bollaert; Y. Cordier; H. Happy; M. Zaknoune; V. Hoel; S. Lepilliet; A. Cappy
Year: 1998
Integrated a-Si:H/pentacene inorganic/organic complementary circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Bonse; D.B. Thomasson; H. Klauk; D.J. Gundlach; T.N. Jackson
Year: 1998
Tri-layer a-Si:H integrated circuits on polymeric substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.B. Thomasson; M. Bonse; Jiunn-Ru Huang; C.R. Wronski; T.N. Jackson
Year: 1998
Polysilicon thin film transistors fabricated at 100/spl deg/C on a flexible plastic substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.D. Theiss; P.G. Carey; P.M. Smith; P. Wickboldt; T.W. Sigmon; Y.J. Tung; T.-J. King
Year: 1998
Improved stability of polysilicon thin-film transistors under self-heating and high endurance EEPROM cells for systems-on-panel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Woo Lee; Nae-In Lee; Hoon-Ju Chung; Chul-Hi Han
Year: 1998
A conductivity modulated high voltage polycrystalline silicon thin film transistor with improved on state and transient performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.Z. Xu; F.J. Clough; E.M.S. Narayanan; Y. Chen; W.I. Milne
Year: 1998
Modeling of grain size variation effects in polycrystalline thin film transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.W. Wang; K.C. Saraswat
Year: 1998
Within-chip variability analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.R. Nassif
Year: 1998
Real time on-chip characterization of time delay arising from multi-level-metallization: decoupling of pure charging and drift-and-charging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hi-Deok Lee; Myoung-Jun Jang; Dae-Gwan Kang; Young-Jong Lee; Jeong-Mo Hwang; Dae-Mann Kim
Year: 1998
Impact of crosstalk on delay time and a hierarchy of interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Yamashita; S. Odanaka
Year: 1998
Equipotential shells for efficient partial inductance extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Beattie; L. Alatan; L. Pileggi
Year: 1998
Process- and geometry-scalable bipolar transistor and transmission line models for Si and SiGe MMICs in the 5-22 GHz range
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.P. Voinigescu; D. Marchesan; J.L. Showell; M.C. Maliepaard; M. Cudnoch; M.G.M. Schumacher; M. Herod; D.J. Walkey; G.E. Babcock; P. Schvan; R.A. Hadaway
Year: 1998
Deposition and simulation of refractory barriers into high aspect ratio re-entrant features using directional sputtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Smy; R.V. Joshi; S.K. Dew; M.J. Brett
Year: 1998
Foundry technology for the next decade
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.Y.C. Sun; Shang-Yi Chiang; M. Liu
Year: 1998
0.1 /spl mu/m level contact hole pattern formation with KrF lithography by resolution enhancement lithography assisted by chemical shrink (RELACS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Toyoshima; T. Ishibashi; A. Minanide; K. Sugino; K. Katayama; T. Shoya; I. Arimoto; N. Yasuda; H. Adachi; Y. Matsui
Year: 1998
Dry etch sequencing induced gate oxide degradation due to metallic contamination in 0.25 /spl mu/m CMOS manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hughes; A. Perera; I. Hernandez; Sanjay Parihar; K. Karupanna; J. Vasek; J. Hanna; A. Nagy; T. Lii; M. Reese; J. Rose; J. Arnold; J. Cain; S. Mattay; J. Porter; O. Razumovsky; T. Chesnut; A. Kaiser; S. Poon
Year: 1998
Multiple-thickness gate oxide and dual-gate technologies for high-performance logic-embedded DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Togo; K. Noda; T. Tanigawa
Year: 1998
A new DRAM cell technology using merged process with storage node and memory cell contact for 4 Gb DRAM and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon-Soo Chun; Byung-Jun Park; Gi-Tae Jeong; Yoo-Sang Hwang; Kyu-Hyun Lee; Hong-Sik Jeong; Tae-Young Jung; Kinam Kim
Year: 1998
Future directions for DRAM memory cell technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Nitayama; Y. Kohyama; K. Hieda
Year: 1998
Capacitor-on-metal/via-stacked-plug (CMVP) memory cell for 0.25 /spl mu/m CMOS embedded FeRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Amanuma; T. Tatsumi; Y. Maejima; S. Takahashi; H. Hada; H. Okizaki; T. Kunio
Year: 1998
Ultra thin (<20 /spl Aring/) CVD Si/sub 3/N/sub 4/ gate dielectric for deep-sub-micron CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.C. Song; H.F. Luan; Y.Y. Chen; M. Gardner; M. Allen; D.L. Kwong
Year: 1998
High quality ultra-thin TiO/sub 2//Si/sub 3/N/sub 4/ gate dielectric for giga scale MOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Guo; T.P. Ma; T. Tamagawa; B.L. Halpern
Year: 1998
SiON/Ta/sub 2/O/sub 5//TiN gate-stack transistor with 1.8 nm equivalent SiO/sub 2/ thickness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Donggun Park; Qiang Lu; Tsu-Jae King; Chenming Hu; A. Kalnitsky; Sing-Pin Tay; Chia-Cheng Cheng
Year: 1998
Integration technology of polymetal (W/WSiN/Poly-Si) dual gate CMOS for 1 Gbit DRAMs and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Hiura; A. Azuma; K. Nakajima; Y. Akasaka; K. Miyano; H. Nitta; A. Honjo; K. Tsuchida; Y. Toyoshima; K. Suguro; Y. Kohyama
Year: 1998
An ultra-low resistance and thermally stable W/pn-poly-Si gate CMOS technology using Si/TiN buffer layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Wakabayashi; T. Yamamoto; K. Yoshida; E. Soda; K. Tokunaga; T. Mogami; T. Kunio
Year: 1998
Improving gate oxide integrity (GOI) of a W/WNx/dual-poly Si stacked-gate by using wet-hydrogen oxidation in 0.14-/spl mu/m CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ohnishi; N. Yamamoto; T. Uchino; Y. Hanaoka; R. Tsuchiya; Y. Nonaka; Y. Tanabe; T. Umezawa; N. Fukuda; S. Mitani; T. Shiba
Year: 1998
Scalability of SOI technology into 0.13 /spl mu/m 1.2 V CMOS generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Leobandung; M. Sherony; J. Sleight; R. Bolam; F. Assaderaghi; S. Wu; D. Schepis; A. Ajmera; W. Rausch; B. Davari; G. Shahidi
Year: 1998
Device design considerations for double-gate, ground-plane, and single-gated ultra-thin SOI MOSFET's at the 25 nm channel length generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.-S.P. Wong; D.J. Frank; P.M. Solomon
Year: 1998
Pseudo-SOI: P-N-P-channel-doped bulk MOSFET for low-voltage high-performance applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Miyamoto; R. Nagai; T. Nagano
Year: 1998
A new dynamic-threshold SOI device having an embedded resistor and a merged body-bias-control transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Horiuchi
Year: 1998
High performance electrically induced body dynamic threshold SOI MOSFET (EIB-DTMOS) with large body effect and low threshold voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Takamiya; T. Hiramoto
Year: 1998
Transistors and tunnel diodes for analog/mixed-signal circuits and embedded memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Seabaugh; X. Deng; B. Brar; T. Broekaert; R. Lake; F. Morris; G. Frazier
Year: 1998
Arrays of resonant tunnelling diodes defined by in-situ focused ion beam lithography: potential millimetre wave/microwave power sources?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. See; D.P. Steenson; E.H. Linfield; P.D. Rose; C.E. Collins; D.A. Ritchie; G.A.C. Jones
Year: 1998
Tetrahedral shaped recess channel HEMT with a floating quantum dot gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Shima; Y. Sakuma; T. Futatsugi; Y. Awano; N. Yokoyama
Year: 1998
Room temperature operating infrared (8-12 /spl mu/m) photodetector with InAs quantum dots in modulation doped heterostructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taehee Cho; Jong-Wook Kim; Jae-Eung Oh; Songcheol Hong
Year: 1998
A resonant terahertz detector utilizing a high electron mobility transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian-Qiang Lu; M.S. Shur; J.L. Hesler; Liangquan Sun; R. Weikle, II
Year: 1998
High-selectivity single-chip spectrometer for operation at visible wavelengths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.H. Correia; M. Bartek; R.F. Wolffenbuttel
Year: 1998
Micromechanical mixer and filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ark-Chew Wong; Hao Ding; C.T.-C. Nguyen
Year: 1998
Trench oxide isolated single crystal silicon micromachined accelerometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Sridhar; Lau Choon How; Liu Lian Jun; Miao Yu Bo; Tan Khen-Sang; Foo Pang Dow; J. Bergstrom; K. Sooriakumar; Loh Yong Hong; Lee Han San; Tan Chung Kiat
Year: 1998
In-plane sensitive vertical trench-Hall device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Steiner; F. Kroener; T. Olbrich; R. Baresch; H. Baltes
Year: 1998
Defect and dopant diffusion in ion implanted silicon: an atomic scale simulation approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.-J. Caturla; S.K. Theiss; T.J. Lenosky; T. Diaz de la Rubia
Year: 1998
Predictive simulation of transient activation processes in boron-doped silicon structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.D. Lilak; M.E. Law; K.S. Jones; M.D. Giles; E. Andideh; M.-J. Caturla; Jing Zhu; S. Theiss
Year: 1998
Experiments and modeling of boron segregation to {311} defects and initial rapid enhanced boron diffusion induced by self-implantation in Si
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Saito; J. Xia; R. Kim; T. Aoki; H. Kobayashi; Y. Kamakura; K. Taniguchi
Year: 1998
Beyond TED: understanding boron shallow junction formation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.T. Dunham; S. Chakravarthi; A.H. Gencer
Year: 1998
Modeling solid source boron diffusion for advanced transistor applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Packan; S. Thompson; E. Andideh; S. Yu; T. Ghani; M. Giles; J. Sandford; M. Bohr
Year: 1998
A calibrated model for trapping of implanted dopants at material interface during thermal annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Seog Oh; D.E. Ward
Year: 1998
Monte Carlo simulation of ion implantation into topographically complex structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.J. Obradovic; G. Balamurugan; G. Wang; Y. Chen; A.F. Tasch
Year: 1998
New analytic models and efficient parameter extraction for computationally efficient 1-D and 2-D ion implantation modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Balamurugan; B. Obradovic; G. Wang; Y. Chen; A. Tasch
Year: 1998
Progress in RF inductors on silicon-understanding substrate losses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.N. Burghartz
Year: 1998
Application of a new circuit design oriented Q extraction technique to inductors in silicon ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tong Chen; Kihong Kim; K. O
Year: 1998
A novel buried oxide isolation for monolithic RF inductors on silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.B. Erzgraber; T. Grabolla; H.H. Richter; P. Schley; A. Wolff
Year: 1998
On-chip spiral inductors with diffused shields using channel-stop implant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yoshitomi; Y. Sugawara; E. Morifuji; T. Ohguro; H. Kimijima; T. Morimoto; H.S. Momose; Y. Katsumata; H. Iwai
Year: 1998
Novel high-Q bondwire inductor for MMIC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Goo Lee; Sang-Ki Yun; Hai-Young Lee
Year: 1998
Two-dimensional dopant profiling of a 60 nm gate length nMOSFET using scanning capacitance microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Timp; M.L. O'Malley; R.N. Kleiman; J.P. Garno
Year: 1998
Direct measurement of l/sub eff/ and channel profile in MOSFETs using 2-D carrier profiling techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Stephenson; S. Biesemans; Ph. Jansen; K. De Meyer; W. Vandervorst
Year: 1998
Direct detecting of dynamic floating-body effects in SOI circuits by backside electron beam testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Yoshida; T. Koyama; S. Maeda; Y. Yamaguchi; J. Komori; Y. Mashiko
Year: 1998
Remote charge scattering in MOSFETs with ultra-thin gate dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S. Krishnan; Yee Chia Yeo; Qiang Lu; Tsu-Jae King; J. Bokor; Chenming Hu
Year: 1998
Experimental signature and physical mechanisms of substrate enhanced gate current in MOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Esseni; L. Selmi
Year: 1998
Sub-5 nm multiple-thickness gate oxide technology using oxygen implantation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ya-Chin King; C. Kuo; Tsu-Jae King; Chenming Hu
Year: 1998
Multiple gate oxide thickness for 2 GHz system-on-a-chip technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.T. Liu; Y. Ma; M. Oh; P.W. Diodato; K.R. Stiles; J.R. Mcmacken; F. Li; C.P. Chang; K.P. Cheung; J.I. Colonell; W.Y.C. Lai; R. Liu; E.J. Lloyd; J.F. Miner; C.S. Pai; H. Vaidya; J. Frackoviak; A. Timko; F. Klemens; H. Maynard; J.T. Clemens
Year: 1998
Impact of nitridation engineering on microscopic SILC characteristics of sub-10-nm tunnel dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ogata; M. Inoue; T. Nakamura; N. Tsuji; K. Kobayashi; K. Kawase; H. Kurokawa; T. Kaneoka; Y. Ohno; H. Miyoshi
Year: 1998
Antenna device reliability for ULSI processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Krishnan; A. Amerasekera; S. Rangan; S. Aur
Year: 1998
Gate quality doped high K films for CMOS beyond 100 nm: 3-10 nm Al/sub 2/O/sub 3/ with low leakage and low interface states
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Manchanda; W.H. Lee; J.E. Bower; F.H. Baumann; C.J. Case; R.C. Keller; Y.O. Kim; E.J. Laskowski; M.D. Morris; R.L. Opila; P.J. Silverman; T.W. Sorsch; G.R. Weber
Year: 1998
Ultra thin high quality Ta/sub 2/O/sub 5/ gate dielectric prepared by in-situ rapid thermal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.F. Luan; B.Z. Wu; L.G. Kang; B.Y. Kim; R. Vrtis; D. Roberts; D.L. Kwong
Year: 1998
Progress toward 10 nm CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Timp; K.K. Bourdelle; J.E. Bower; F.H. Baumann; T. Boone; R. Cirelli; K. Evans-Lutterodt; J. Garno; A. Ghetti; H. Gossmann; M. Green; D. Jacobson; Y. Kim; R. Kleiman; F. Klemens; C. Lochstampfor; W. Mansfield; S. Moccio; D.A. Muller; I.E. Ocola; M.I. O'Malley; J. Sapjeta; P. Silverman; T. Sorsch; D.M. Tennant; W. Timp; B.E. Weir
Year: 1998
Accurate characterization of electron and hole inversion-layer capacitance and its impact on low voltage operation of scaled MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Takagi; M. Takayanagi-Takagi; A. Toriumi
Year: 1998
A 1.2 V, 0.1 /spl mu/m gate length CMOS technology: design and process issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Rodder; N. Yu; W. Shiau; P. Nicollian; T. Laaksonen; C.P. Chao; M. Mehrotra; C. Lee; S. Murtaza; S. Aur
Year: 1998
High-performance sub-0.08 /spl mu/m CMOS with dual gate oxide and 9.7 ps inverter delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hargrove; S. Crowder; E. Nowak; R. Logan; L.K. Han; H. Ng; A. Ray; D. Sinitsky; P. Smeys; F. Guarin; J. Oberschmidt; E. Crabbe; D. Yee; L. Su
Year: 1998
A study of ultra shallow junction and tilted channel implantation for high performance 0.1 /spl mu/m pMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Goto; M. Kase; Y. Momiyama; H. Kurata; T. Tanaka; M. Deura; Y. Sanbonsugi; T. Sugii
Year: 1998
Channel profile engineering of 0.1 /spl mu/m-Si MOSFETs by through-the-gate implantation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.V. Ponomarev; P.A. Stolk; A.C.M.C. van Brandenburg; R. Roes; A.H. Montree; J. Schmitz; P.H. Woerlee
Year: 1998
High performance pMOSFET with BF/sub 3/ plasma doped gate/source/drain and S/D extension
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Ha; J.W. Park; W.S. Kim; W.S. Song; H.S. Kim; H.J. Song; K. Fujihara; H.K. Kang; M.Y. Lee; S. Felch; U. Jeong; M. Goeckner; K.H. Shim; H.J. Kim; H.T. Cho; Y.K. Kim; D.H. Ko; G.C. Lee
Year: 1998
A 1.9-/spl mu/m/sup 2/ loadless CMOS four-transistor SRAM cell in a 0.18-/spl mu/m logic technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Noda; K. Matsui; K. Imai; K. Inoue; K. Tokashiki; H. Kawamoto; K. Yoshida; K. Takeda; N. Nakamura; T. Kimura; H. Toyoshima; Y. Koishikawa; S. Maruyama; T. Saitoh; T. Tanigawa
Year: 1998
Advanced performance of small-scaled InGaP/GaAs HBT's with f/sub T/ over 150 GHz and f/sub max/ over 250 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Oka; K. Hirata; K. Ouchi; H. Uchiyama; T. Taniguchi; K. Mochizuki; T. Nakamura
Year: 1998
Transferred-substrate HBTs with 250 GHz current-gain cutoff frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Mensa; Q. Lee; J. Guthrie; S. Jaganathan; M.J.W. Rodwell
Year: 1998
High-gain GaInP/GaAs HBT monolithic transimpedance amplifier for high-speed optoelectronic receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mohammadi; J.W. Park; D. Pavlidis; C. Dua; J.L. Guyaux; J.C. Garcia
Year: 1998
Broadly-tunable narrow-linewidth micromachined laser/photodetector and phototransistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Sugihwo; C.-C. Lin; L.A. Eyres; M.M. Fejer; J.S. Harris, Jr.
Year: 1998
Lateral thinking about power devices (LDMOS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.R. Efland; Chin-Yu Tsai; S. Pendharkar
Year: 1998
A new generation of high voltage MOSFETs breaks the limit line of silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Deboy; N. Marz; J.-P. Stengl; H. Strack; J. Tihanyi; H. Weber
Year: 1998
Breakdown and low-temperature anomalous effects in 6H SiC JFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Meneghesso; A. Bartolini; G. Verzellesi; A. Cavallini; A. Castaldini; C. Canali; E. Zanoni
Year: 1998
Si/SiGe:C heterojunction bipolar transistors in an epi-free well, single-polysilicon technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Knoll; B. Heinemann; H.J. Osten; B. Ehwald; P. Schley; R. Barth; M. Matthes; Kwang Soo Park; Young Kim; W. Winkler
Year: 1998
Transconductance enhancement in deep submicron strained Si n-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Rim; J.L. Hoyt; J.F. Gibbons
Year: 1998
Two-dimensional dopant profiling of deep submicron MOS devices by electron holography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.-D. Rau; F.H. Baumann; H.-H. Vuong; W. Hoppner; C.S. Rafferty; H. Rucker; P. Schwander; A. Ourmazd
Year: 1998
Validation of two-dimensional implant and diffusion profiles using novel scanning capacitance microscope sample preparation and deconvolution techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.M. Yu; P.B. Griffin; J.D. Plummer
Year: 1998
Characterization of arsenic dose loss at the Si/SiO/sub 2/ interface using high resolution X-ray photoelectron spectrometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Pianetta; Yun Sun; Renee Mo; P.B. Griffin; J.D. Plummer
Year: 1998
Suppression of reverse short channel effect by a buried carbon layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.-J. Gossmann; C.S. Rafferty; G. Hobler; H.-H. Vuong; D.C. Jacobson; M. Frei
Year: 1998
An integrated approach for accurate simulation and modeling of the silicide-source/drain structure and the silicide-diffusion contact resistance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.P. Apte; S. Potla; D.A. Prinslow; G. Pollack; D. Scott; K. Varahramyan
Year: 1998
Comparison of raised and Schottky source/drain MOSFETs using a novel tunneling contact model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:MeiKei Ieong; P.M. Solomon; S.E. Laux; H.-S.P. Wong; D. Chidambarrao
Year: 1998
Straddle-gate transistor: changing MOSFET channel length between off- and on-state towards achieving tunneling-defined limit of field-effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tiwari; J.J. Welser; P.M. Solomon
Year: 1998
Optimization guidelines for epitaxial collectors of advanced BJT's with improved breakdown voltage and speed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Palestri; C. Fiegna; L. Selmi; G.A.M. Hurkx; J.W. Slotboom; E. Sangiorgi
Year: 1998
Circuit requirement and integration challenges of thin gate dielectrics for ultra small MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.T. Liu
Year: 1998
A versatile 0.25 micron CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Poon; C. Atwell; C. Hart; D. Kolar; C. Lage; B. Yeargain
Year: 1998
1.5 nm equivalent thickness Ta/sub 2/O/sub 5/ high-k dielectric with rugged Si suited for mass production of high density DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Asano; M. Kunitomo; S. Yamamoto; R. Furukawa; Y. Sugawara; T. Uemura; J. Kuroda; M. Kanai; M. Nakata; T. Tamaru; Y. Nakamura; T. Kawagoe; S. Yamada; K. Kawakita; H. Kawamura; M. Nakamura; M. Morino; T. Kisu; S. Iijima; Y. Ohji; T. Sekiguchi; Y. Tadaki
Year: 1998
High levels of IC manufacturability: one of the necessary prerequisites of the 1997 SIA Roadmap vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Maly
Year: 1998
Modeling the effects of manufacturing variation on high-speed microprocessor interconnect performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Mehrotra; S. Nassif; J. Chung
Year: 1998
Explanation and quantitative model for the matching behaviour of poly-silicon resistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Thewes; R. Brederlow; C. Dahl; U. Kollmer; C.G. Linnenbank; B. Holzapfl; J. Becker; J. Kissing; S. Kessel; W. Weber
Year: 1998
CMOS metal replacement gate transistors using tantalum pentoxide gate insulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chatterjee; R.A. Chapman; K. Joyner; M. Otobe; S. Hattangady; M. Bevan; G.A. Brown; H. Yang; Q. He; D. Rogers; S.J. Fang; R. Kraft; A.L.P. Rotondaro; M. Terry; K. Brennan; S.-W. Aur; J.C. Hu; H.-L. Tsai; P. Jones; G. Wilk; M. Aoki; M. Rodder; I.-C. Chen
Year: 1998
PVD TiN metal gate MOSFETs on bulk silicon and fully depleted silicon-on-insulator (FDSOI) substrates for deep sub-quarter micron CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Maiti; P.J. Tobin; C. Hobbs; R.I. Hegde; F. Huang; D.L. O'Meara; D. Jovanovic; M. Mendicino; J. Chen; D. Connelly; O. Adetutu; J. Mogab; J. Candelaria; L.B. La
Year: 1998
High performance metal gate MOSFETs fabricated by CMP for 0.1 /spl mu/m regime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Yagishita; T. Saito; K. Nakajima; S. Inumiya; Y. Akasaka; Y. Ozawa; G. Minamihaba; H. Yano; K. Hieda; K. Suguro; K. Okumura
Year: 1998
25 nm CMOS design considerations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Taur; C.H. Wann; D.J. Frank
Year: 1998
Reduced gate leakage current and boron penetration of 0.18 /spl mu/m 1.5 V MOSFETs using integrated RTCVD oxynitride gate dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsing-Huang Tseng; D.L. O'Meara; P.J. Tobin; V.S. Wang; Xin Guo; R. Hegde; I.Y. Yang; P. Gilbert; R. Cotton; L. Hebert
Year: 1998
Effect of barrier layer on the electrical and reliability characteristics of high-k gate dielectric films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongjoo Jeon; K. Zawadzki; Wen-Jie Qi; A. Lucas; R. Nieh; J.C. Lee
Year: 1998
All perovskite capacitor (APEC) technology for (Ba,Sr)TiO/sub 3/ capacitor scaling toward 0.10 /spl mu/m stacked DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Hieda; K. Eguchi; N. Fukushima; T. Aoyama; K. Natori; M. Kiyotoshi; S. Yamazaki; M. Izuha; S. Niwa; Y. Fukuzumi; Y. Ishibashi; T. Arikado; K. Okumura
Year: 1998
A manufacturable integration technology of sputter-BST capacitor with a newly proposed thick Pt electrode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Tsunemine; T. Okudaira; K. Kashihara; K. Hanafusa; A. Yutani; Y. Fujita; M. Matsushita; H. Itoh; H. Miyoshi
Year: 1998
Integration processes of (Ba,Sr)TiO/sub 3/ capacitor for 1 Gb and beyond [DRAMs]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Byoung Taek Lee; Cha Young Yoo; Han Jin Lim; Chang Seok Kang; Hong Bae Park; Wan Don Kim; Suk Ho Ju; H. Horii; Ki Hoon Lee; Hyun Woo Kim; Sang In Lee; Moon Young Lee
Year: 1998
Sputtering process design of PZT capacitors for stable FeRAM operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Inoue; T. Takeuchi; Y. Hayashi
Year: 1998
The best combination of aluminum and copper interconnects for a high performance 0.18 /spl mu/m CMOS logic device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Igarashi; A. Harada; H. Amishiro; H. Kawashima; Y. Kusumi; T. Saito; A. Ohsaki; T. Mori; T. Fukada; Y. Toyoda; K. Higashitani; H. Arima
Year: 1998
Interconnect design strategy: structures, repeaters and materials toward 0.1 /spl mu/m ULSIs with a giga-hertz clock operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Takahashi; M. Edahiro; Y. Hayashi
Year: 1998
RC delay reduction of 0.18 /spl mu/m CMOS technology using low dielectric constant fluorinated amorphous carbon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Matsubara; K. Kishimoto; K. Endo; M. Iguchi; T. Tatsumi; H. Gomi; T. Horiuchi; E. Tzou; M. Xi; L.Y. Cheng; D. Tribula; F. Moghadam
Year: 1998
Novel co-sputtered fluorinated amorphous carbon films for sub-0.25 /spl mu/m low /spl kappa/ damascene multilevel interconnect applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Zhu; C.S. Pai; H.E. Bair; H.W. Krautter; R.L. Opila; B.S. Dennis; A. Pinczuk; Y.J. Chabal; G. Grundmeier; J.E. Graebner; K.P. Cheung; F.C. Schilling; C.B. Case; R. Liu; S. Jin
Year: 1998
Shared tungsten structures for FEOL/BEOL compatibility in logic-friendly merged DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Drynan; K. Fukui; M. Hamada; K. Inoue; S. Kamiyama; A. Matsumoto; H. Nobusawa; K. Sugai; M. Takenaka; H. Yamaguchi; T. Tanigawa
Year: 1998
Polysilicon VGA active matrix OLED displays-technology and performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Stewart; R.S. Howell; L. Pires; M.K. Hatalis; W. Howard; O. Prache
Year: 1998
Thermal, self-heating and kink effects in a-Si:H thin film transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Iniguez; L. Wang; T.A. Fjeldly; M.S. Shur; H. Slade
Year: 1998
Energy dependent electron and hole impact ionization in Si bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Palestri; L. Selmi; E. Sangiorgi
Year: 1998
The origin of secondary electron gate current: a multiple-stage Monte Carlo study for scaled, low-power flash memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Kencke; X. Wang; H. Wang; Q. Ouyang; S. Jallepalli; M. Rashed; C. Maziar; A. Tasch, Jr.; S.K. Banerjee
Year: 1998
Monte Carlo simulation of hot-carrier degradation in scaled MOS transistors for VLSI technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ghetti; J. Bude; C.T. Liu
Year: 1998
Full-band Monte Carlo simulation of a 0.12 /spl mu/m-Si-PMOSFET with and without a strained SiGe-channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Jungemann; S. Keith; B. Meinerzhagen
Year: 1998
A new model of tunnelling current and SILC in ultra-thin oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Larcher; A. Paccagnella; A. Scarpa; G. Ghidini
Year: 1998
Monte Carlo simulation of stress-induced leakage current by hopping conduction via multi-traps in oxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Okuyama; S. Kamohara; Y. Manabe; K. Okuyama; Y. Kubota; T. Kobayashi; K. Kimura
Year: 1998
Transistor matching in analog CMOS applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J.M. Pelgrom; H.P. Tuinhout; M. Vertregt
Year: 1998
Threshold voltage fluctuation induced by direct tunnel leakage current through 1.2-2.8 nm thick gate oxides for scaled MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Iwamoto; T. Ono; T. Mihara; S. Miyazaki; M.M. Miura; M. Hirose
Year: 1998
A study of flicker noise in n- and p-MOSFETs with ultra-thin gate oxide in the direct-tunneling regime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.S. Momose; H. Kimijima; S. Ishizuka; Y. Miyahara; T. Ohguro; T. Yoshitomi; E. Morifuji; S. Nakamura; T. Morimoto; Y. Katsumata; H. Iwai
Year: 1998
0.12 /spl mu/m raised gate/source/drain epitaxial channel NMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ohguro; H. Naruse; H. Sugaya; H. Kimijima; E. Morifuji; T. Yoshitomi; T. Morimoto; H.S. Momose; Y. Katsumata; H. Iwai
Year: 1998
Hot carrier reliability considerations in the integration of dual gate oxide transistor process on a sub-0.25 /spl mu/m CMOS technology for embedded applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Bhat; P. Chen; P. Tsui; A. Das; M. Foisy; Y. Shiho; J. Higman; J.-Y. Nguyen; S. Gonzales; S. Collins; D. Workman
Year: 1998
Multi-level metal CMOS manufacturing with deuterium for improved hot carrier reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.C. Kizilyalli; G. Weber; Z. Chen; G. Abeln; B. Kotzias; F. Register; E. Harris; S. Sen; S. Chetlur; M. Patel; L. Stirling; R. Huang; A. Massengale; P.K. Roy; G. Higashi; E. Foley; J. Lee; J. Lyding; K. Hess
Year: 1998
Reliability of vertical MOSFETs for gigascale memory applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Goebel; E. Bertagnolli; F. Koch
Year: 1998
A novel high-frequency quasi-SOI power MOSFET for multi-gigahertz applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Matsumoto; T. Ishiyama; Y. Hiraoka; T. Sakai; T. Yachi; H. Kamitsuna; M. Muraguchi
Year: 1998
Device design methodology to optimize low-frequency noise in advanced SOI CMOS technology for RF ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying-Che Tseng; W.M. Huang; D. Ngo; V. Ilderem; J.C.S. Woo
Year: 1998
A 31 GHz f/sub max/ lateral BJT on SOI using self-aligned external base formation technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Shino; K. Inoh; T. Yamada; H. Nii; S. Kawanaka; T. Fuse; M. Yoshimi; Y. Katsumata; S. Watanabe; J. Matsunaga
Year: 1998
Record power added efficiency of bipolar power transistors for low voltage wireless applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. van Rijs; H.A. Visser; P.H.C. Magnee
Year: 1998
An effective gate resistance model for CMOS RF and noise modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaodong Jin; Jia-Jiunn Ou; Chih-Hung Chen; Weidong Liu; M.J. Deen; P.R. Gray; Chenming Hu
Year: 1998
Process induced damage on RFCMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Morifuji; T. Ohguro; T. Yoshitomi; H. Kimijima; T. Morimoto; H.S. Momose; Y. Katsumata; H. Iwai
Year: 1998
Novel 0.44 /spl mu/m/sup 2/ Ti-salicide STI cell technology for high-density NOR flash memories and high performance embedded application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Yamada; M. Tanimoto; M. Matsui; S. Kitamura; K. Amemiya; T. Tanzawa; E. Sakagami; M. Kurata; K. Isobe; M. Takebuchi; M. Kanda; S. Mori; T. Watanabe
Year: 1998
A novel 4.6F/sup 2/ NOR cell technology with lightly doped source (LDS) junction for high density flash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonghan Kim; Jeong-Hyuk Choi; Yong-Ju Choi; Hun-Kyu Lee; Kyeong-Tae Kim; Yun-Seung Shin
Year: 1998
An advanced flash memory technology on SOI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Burnett; D. Shum; K. Baker
Year: 1998
Low voltage, low current, high speed program step split gate cell with ballistic direct injection for EEPROM/flash
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ogura; A. Hori; J. Kato; M. Yamanaka; S. Odanaka; H. Fujimoto; K. Akamatsu; T. Ogura; M. Kojima; H. Kotani
Year: 1998
0.13 /spl mu/m MONOS single transistor memory cell with separated source lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Fujiwara; H. Aozasa; A. Nakamura; Y. Komatsu; Y. Hayashi
Year: 1998
SOI MOSFET on low cost SPIMOX substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S.K. Iyer; Xiang Lu; N.W. Cheung; Chenming Hu
Year: 1998
High thermal stability and low junction leakage current of Ti capped Co salicide and its feasibility for high thermal budget CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Kyun Sohn; Ji-Soo Park; Byung Hak Lee; Jong-Uk Bae; Kyung Soo Oh; Seh Kwang Lee; Jeong Soo Byun; Jae Jeong Kim
Year: 1998
Ultra-shallow junction formation by outdiffusion from implanted oxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Schmitz; M. van Gestel; P.A. Stolk; Y.V. Ponomarev; F. Roozeboom; P.H. Woerlee
Year: 1998
Integration of trench DRAM into a high-performance 0.18 /spl mu/m logic technology with copper BEOL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Crowder; R. Hannon; H. Ho; D. Sinitsky; S. Wu; K. Winstel; B. Khan; S.R. Stiffler; S.S. Iyer
Year: 1998
A novel high-gain CMOS image sensor using floating N-well/gate tied PMOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiquan Zhang; Mansun Chan; P.K. Ko
Year: 1998
A folded-channel MOSFET for deep-sub-tenth micron era
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Hisamoto; Wen-Chin Lee; J. Kedzierski; E. Anderson; H. Takeuchi; K. Asano; Tsu-Jae King; J. Bokor; Chenming Hu
Year: 1998
Si-based interband tunneling devices for high-speed logic and low power memory applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.L. Rommel; T.E. Dillon; P.R. Berger; R. Lake; P.E. Thompson; K.D. Hobart; A.C. Seabaugh; D.S. Simons
Year: 1998
Ultra-thin gate oxides and ultra-shallow junctions for high performance, sub-100 nm pMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Timp; J. Bower; T. Boone; M. Green; J. Gamo; H. Gossmann; D. Jacobson; F. Klemens; S. Moccio; M.L. O'Malley; L. Ocola; J. Sapjeta; P. Silverman; T. Sorsch; W. Timp; D. Tennani
Year: 1998
PMD (preferential metal deposition) aluminum process for 16 giga-bit DRAM and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meeyoung Yoon; Hyun Seek Lim; Sang Bom Kang; Gil-Heyun Choi; Sang In Lee; Moon Young Lee
Year: 1998
Application of MEMS technology in automotive sensors and actuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sparks, D.R.
Year: 1998
Safety relevant microsystems for automotive applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seidel, H.
Year: 1998
Microsensors and microactuators using ferroelectric thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okuyama, M.
Year: 1998
Micro moving robotics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayashi, I.; Iwatuki, N.
Year: 1998
Ultra-fine piercing by SiC fiber punch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mori, T.; Nakashima, K.; Tokumoto, D.
Year: 1998
A study of diffusion in layered thin film [MEMS]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamamoto, T.; Kotera, H.; Hirasam, T.; Sakamoto, Y.; Shima, S.
Year: 1998
Stick and slip actuators: design, control, performances and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Breguet, J.-M.; Clavel, R.
Year: 1998
New microstereolithography (Super-IH process) to create 3D freely movable micromechanism without sacrificial layer technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maruo, S.; Ikuta, K.
Year: 1998
Consideration on alignment of whisker in unidirectional whisker reinforced micropart produced by UV laser photopolymerization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamoto, T.; Yamacuchi, K.; Tsuchiya, T.
Year: 1998
3D micromanipulation system under microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arai, F.; Kawaji, A.; Sugiyama, T.; Onomura, Y.; Ogawa, M.; Fukuda, T.; Iwata, H.; Itoigawa, K.
Year: 1998
2D micro particle assembly using atomic force microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sitti, M.; Hirahara, K.; Hashimoto, H.
Year: 1998
Study on fabrication of high aspect ratio electrostatic microactuators using LIGA process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kondo, R.; Suzuki, K.; Sugiyama, S.
Year: 1998
A new micro SMA thin film actuator prestrained by polyimide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuribayashi, K.; Fujii, T.
Year: 1998
Two-dimensional acoustic micromanipulation using three ultrasonic transducers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kozuka, T.; Tuziuti, T.; Mitome, H.; Fukuda, T.; Arai, F.
Year: 1998
Manipulation of single DNA molecules in globular state: recovery into capillary and direct laser trapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hirano, K.; Yamaguchi, A.; Maeda, Y.; Matsuzawa, Y.; Katsura, S.; Mizuno, A.
Year: 1998
The autonomous micro robot "Alice": a platform for scientific and commercial applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caprari, G.; Balmer, P.; Piguet, R.; Siegwart, R.
Year: 1998
Towards a pattern language for object oriented design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noble, J.
Year: 1998
From interface to persistence: a framework for business oriented applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Della, L.; Clark, D.
Year: 1998
Objects and constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noble, J.
Year: 1998
Macro processing in object-oriented languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiba, S.
Year: 1998
From UML to IDL: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watkins, S.; Dick, M.; Thompson, D.
Year: 1998
Support for object-oriented testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kolling, M.; Rosenberg, J.
Year: 1998
A case for meta-interworking: projecting CORBA meta-data into COM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, G.; Gough, J.; Szyperski, C.
Year: 1998
A simple architecture description model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rakotonirainy, A.; Bond, A.
Year: 1998
Analysis of the effect of shunt traces on the radiation from printed circuit boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Bokhari
Year: 1998
Cross coupling between power and signal traces on printed circuit boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pantic-Tanner, Z.; Salgado, E.; Gisin, F.
Year: 1998
Crosstalk versus interline space in ultra high speed digital PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Lu; Ungvichian, V.
Year: 1998
Radiation from a PCB with coupling between a low frequency and a digital signal traces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oka, N.; Miyazaki, C.; Nitta, S.
Year: 1998
Novel decoupling circuit enabling notable electromagnetic noise suppression and high-density packaging in a digital printed circuit board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, S.; Tohya, H.
Year: 1998
The radio frequency interference monitoring system (RFIMS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raush, P.; Kub, J.; Bedford, B.; Sparkman, T.; Davidson, S.; Gray, E.
Year: 1998
Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Criel, S.; Bonjean, F.; De Smedt, R.; De Moerloose, J.; Martens, L.; Olyslager, F.; De Zutter, D.
Year: 1998
Simulated anechoism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berthon, A.
Year: 1998
Signal detection with EMI receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schaefer, W.
Year: 1998
An investigation on radiated emissions from heatsinks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Das, S.K.; Roy, T.
Year: 1998
Modeling the conducted EMI emission of an electric vehicle (EV) traction drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chingchi Chen; Xingyi Xu
Year: 1998
Considerations for magnetic-field coupling resulting in radiated EMI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hockanson, D.; Drewniak, J.L.; DuBroff, R.E.; Hubing, T.H.; Van Doren, T.P.
Year: 1998
Shielding of backplane interconnection technology systems (EU SOBITS project)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martens, L.; Madou, A.; Vanlandschoot, B.; Kone, L.; Demoulin, B.; Sjoberg, P.; Anton, A.; Van Den Torren, L.; Van Koetsem, J.; Hoffmann, H.; Schricker, U.
Year: 1998
Spectral analysis of common mode currents on fibre channel cable shields due to skew imbalance of differential signals operating at 1.0625 Gb/s
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoeft, L.O.; Knighten, J.L.; DiBene, J.T., II; Fogg, M.W.
Year: 1998
Low impedance shield termination methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lindgren, T.L.
Year: 1998
Differential-line-scheme of clock and signal bus of high-speed digital circuits and systems for minimizing electromagnetic radiated emission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonghoon Kim; Hyungsoo Kim; Woonghwan Ryu; Myunghee Sung; Joungho Kim; Younghwan Yun; Soohyung Kim; Seogheon Ham; Yonghee Lee
Year: 1998
Prediction of noise reduction effect of ferrite beads on electromagnetic emission from a digital PCB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miyashita, T.; Nitta, S.; Mutoh, A.
Year: 1998
Radiated emissions from printed circuit board traces including the effect of vias, as a function of source, termination and board characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaires, R.G.
Year: 1998
Identification of nonlinear interference sources with the use of the discrete technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Loyka, S.; Mordachev, V.
Year: 1998
Obtaining the antenna factor of an optically driven antenna using the reciprocity of a TEM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boerle, D.J.G.; Leferink, F.B.J.; Leistkow, T.D.
Year: 1998
Extrapolations using vectorial planar near-field measurements for EMC applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nadeau, B.; Laurin, J.-J.
Year: 1998
Prediction of voltage induced between wirings on printed wiring board by external fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harada, T.; Shinohara, S.; Sato, R.
Year: 1998
Prediction of differential- and common-mode noise in high-speed interconnects with the partial element equivalent circuit technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pinello, W.P.; Cangellaris, A.C.; Ruehli, A.
Year: 1998
Analysis of coupling between transmission lines in arbitrary directions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kami, Y.; Weikun Liu
Year: 1998
Bandwidth considerations for reduced order modeling of multiconductor transmission lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, W.T.
Year: 1998
Printed circuit boards post-layout analysis: from signal integrity to radiated emissions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caniggia, S.; Costa, V.; Meani, C.; Preatoni, R.
Year: 1998
Spectrum distribution of electromagnetic field radiated by electrostatic discharge on the ground screen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:In-Ho Kang; Fujiwara, O.; Chang-Bok Lee
Year: 1998
Transient voltage suppressor (TVS) and filter combination surface product
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hutchins, D.W.; Matteson, F.; Roberts, R.
Year: 1998
PLL noise reduction circuit to stabilize the disturbed clock pulse due to noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saito, S.; Kato, T.; Nitta, S.
Year: 1998
Time domain modeling of electromagnetic field coupling to transmission lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Poljak, D.; Roje, V.
Year: 1998
Analysis of fault transients and breakdown conditions in laminated printed circuit card structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jorgenson, J.A.; Vakil, S.
Year: 1998
Thin coatings can provide significant shielding against low frequency EMF/magnetic fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dixon, D.S.; Masi, J.
Year: 1998
The effect of corrosion on shielding effectiveness of a zinc-coated steel enclosure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Das, S.K.; Nuebel, J.; Zand, B.; Hockanson, D.; Xie, J.; Pecht, M.
Year: 1998
Comparison of SE measurements between MIL-STD-285 and the ASTM Standard E1851
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, Y.M.
Year: 1998
Probability occurrence of estimated lightning surge current at lightning rod before and after installing dissipation array system (DAS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuwabara, N.; Tominaga, T.; Kanazawa, M.; Kuramoto, S.
Year: 1998
New ANSI ESD standard overcoming the deficiencies of worldwide ESD standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rhoades, W.; Maas, J.
Year: 1998
Multifactor analysis of variance (ANOVA) investigation into GTEM to open area test site correlation for FCC Part 15 radiated emissions tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Elliott, W.M., III; Kukunaris, S.; Rohed, J.; Liu, J.
Year: 1998
A correlation between the results of the radiated emission measurements in GTEM and OATS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soo-Hyung Kim; Jun-Young Nam; Hyun-Goo Jeon; Sung-Kook Lee
Year: 1998
Measuring defined emissions in GTEM-cell 1250
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Geromiller, H.P.; Schrape, J.; Kost, A.; Schwartz, P.U.
Year: 1998
Three-dimensional noise current distribution on power and ground planes in printed circuit boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ueno, O.; Iguchi, D.; Arakaki, H.; Ito, H.; Ozawa, T.
Year: 1998
A novel test article for validation of EMC codes for antenna-to-antenna coupling and antenna isolation: the Transformable Scale Aircraft-Like Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pflug, D.R.
Year: 1998
Effects of microwave oven interference on the performance of ISM-band DS/SS system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Unawong, S.; Miyamoto, S.; Morinaga, N.
Year: 1998
I/O cable EMI suppression in large computing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sooohoo, K.M.; Chang-Yu Wu
Year: 1998
Methods of 100 dB RF performance verification of facility filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Geist, T.D.; Phipps, K.O.
Year: 1998
Characterization to a TEMPEST testing laboratory and methodology for control to compromising emanation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sebastiani, S.
Year: 1998
Fast algorithms for the electromagnetic simulation of planar structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michielssen, E.; Chew, W.C.; Aygun, K.; Chao, H.Y.; Ergin, A.; Jandhyala, V.; Shanker, B.; Song, J.M.; Zhao, J.S.
Year: 1998
Application of the partial element equivalent circuit (PEEC) method to realistic printed circuit board problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruehli, A.E.; Cangellaris, A.C.
Year: 1998
Removing the frequency restriction on Pade Via Lanczos with an error bound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Slone, R.D.
Year: 1998
Application independent evaluation of electromagnetic emissions for integrated circuits by the measurement of conducted signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfaff, W.R.
Year: 1998
Estimation of output current from digital IC by using nonlinear impedance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kazama, S.; Shinohara, S.; Sato, R.
Year: 1998
The influence of heat sink on noise susceptibility of IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nonaka, J.; Nitta, S.; Mutoh, A.; Miyashita, T.
Year: 1998
A description of the implementation of an automated conducted emissions chamber for automotive testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Slattery, K.; Livernois, T.; Neal, J.; Smith, S.V.
Year: 1998
TEM cell mode excitation as a function of DUT harness wire number
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Slattery, K.; Neal, J.
Year: 1998
Current probes, more useful than you think
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, D.C.
Year: 1998
Measured and simulated radiated emissions from a vertical wire over a finite size ground plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doubrava, L.J.; Kaires, R.G.
Year: 1998
Noise sensor flip-flop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsukagoshi, T.; Nitta, S.; Mutoh, A.; Kaneko, S.
Year: 1998
Electromagnetic radiations of small circuits and their effective control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bennett, W.S.
Year: 1998
Analysis of EMC characteristics of DC-DC regulators with different power conversion methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shusterman, B.; Levin, G.
Year: 1998
Designing power bus decoupling for CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Radu, S.; DuBroff, R.E.; Hubing, T.H.; Van Doren, T.P.
Year: 1998
The electromagnetic radiation with phase difference in rectangular loop antenna or rectangular loop circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young-Hwan Yun; Seog-Heon Ham; Yong-Hee Lee
Year: 1998
Prediction of anechoic chamber radiated emissions measurements through use of empirically-derived transfer functions and laboratory common-mode current measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, W.T.; Frazier, R.K.
Year: 1998
Analysis of spurious spectrum due to RF bursting signals in TDMA-based wireless communications systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han, F.; Nuutinen, J.
Year: 1998
Introduction to the EMC education and activities in Taiwan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liau, P.Y.; Chang, Y.C.; Chang-Yu Wu; Dinan Lin
Year: 1998
Statistics of man-made noise at 137 MHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dalke, R.; Achatz, R.; Lo, Y.
Year: 1998
Reducing the cost of compliance for the semiconductor industry: a look at the EU's Machinery Safety Directive and SEMI S2-93A requirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Green, M.; Weatherilt, I.
Year: 1998
HF Lossy Line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mayer, F.; Heather, F.; Rhodes, L.
Year: 1998
Which substrate is best for EMI?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miller, P.
Year: 1998
Analyzing shielded connectors using feature transfer impedance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dunwoody, S.; Nadolny, J.; Kelly, K.
Year: 1998
Analytical model of distributed constant filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mutoh, A.; Nitta, S.; Inomata, T.; Sato, Y.
Year: 1998
Grounding optimization techniques for controlling radiation and crosstalk in mixed signal PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moongilan, D.
Year: 1998
Surface mount capacitor loop inductance calculation and minimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tang, G.
Year: 1998
The restriction on delta-I noise along the power/ground layer in the highspeed digital printed circuit board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kening Ren; Chang-Yu Wu; Lin-Chang Zhang
Year: 1998
Evaluating tools which predict the shielding effectiveness of metal enclosures using a set of proposed standard EMI modeling problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Archambeault, B.; Ramahi, O.
Year: 1998
A study of design for improved EMI in a chip level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seog-Heon Ham; Young-Hwan Yun; Soo-Hyung Kim; Yong-Hee Lee
Year: 1998
Time and frequency domain analysis for right angle corners on printed circuit board traces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Montrose, M.I.
Year: 1998
Microwave filtering of unwanted oscillations on base of hexagonal ferrite composite thick films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koledintseva, M.Yu.; Kitaytsev, A.A.; Shinkov, A.A.
Year: 1998
Low EMI design of microprocessor based PCB-a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deb, G.K.
Year: 1998
An efficient multi-target SAR ATR algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Novak, L.M.; Owirka, G.J.; Brower, W.S.
Year: 1998
Dynamic reconstruction of sea clutter using regularized REP networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haykin, S.; Puthusserypady, S.; Yee, P.
Year: 1998
On the improvements of channel unwrapping for conventional-adaptive MLSD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chugg, K.M.; Janghoon Yang
Year: 1998
Joint source channel coding of images over frequency selective fading channels with feedback using DCT and multicarrier block pulse amplitude modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kafedziski, V.
Year: 1998
Signal processing for multicarrier modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Strait, J.C.
Year: 1998
JPEG-2000: a new still image compression standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Shaykh, O.K.; Moccagatta, I.; Homer Chen
Year: 1998
Rate-control for retransmission-based video transport over wireless channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aramvith, S.; I-Ming Pao; Ming-Ting Sun
Year: 1998
Lossless image coding using embedded zerotree wavelet framework: Part I. EZW coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramaswamy, V.N.; Namuduri, K.R.; Ranganathan, N.
Year: 1998
A DWT-based perceptually lossless color image compression architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marino, F.; Acharya, T.; Karam, L.J.
Year: 1998
New Chinese remainder theorems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuke Wang
Year: 1998
On-line algorithms for complex number arithmetic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McIlhenny, R.; Ercegovac, M.D.
Year: 1998
Application of reconfigurable CORDIC architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mencer, O.; Semeria, L.; Morf, M.; Delosme, J.-M.
Year: 1998
Novel residue arithmetic processors for high speed digital signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Skavantzos, A.; Abdallah, M.
Year: 1998
A recursive fast multiplier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Danysh, A.N.; Swartzlander, E.E., Jr.
Year: 1998
Implementation of a low-power accumulator for filter applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balaram, A.; Jell, F.
Year: 1998
Efficient FPGA implementation of multiplier-adder-quotient-remainder approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobayashi, F.; Tsujino, T.; Saitoh, H.
Year: 1998
Listless zerotree coding for color images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Kuo Lin; Burgess, N.
Year: 1998
Analog digits: bit level redundancy in a binary multiplier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saed, A.; Ahmadi, M.; Jullien, G.A.
Year: 1998
Active browsing with similarity pyramids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jau-Yuen Chen; Bouman, C.A.; Dalton, J.C.
Year: 1998


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