Loss separation analysis in ferromagnetic sheets under PWM inverter supply
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boglietti, A.; Bottauscio, O.; Chiampi, M.; Chiarabaglio, D.; Repetto, M.
Year: 1998
Sparse approximation of boundary element system for eddy current problems using wavelet transforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shao, K.R.; Yang, J.C.; Lavers, J.D.
Year: 1998
Influence of atomic structures on electronic structures and magnetic ordrering of Fe-Al alloy films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, K.W.; Kudryavtsev, Y.V.; Lee, Y.P.
Year: 1998
Observation of a half-metallic ferromagnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Park, J.H.; Vescovo, E.; Kim, H.J.; Kwon, C.; Ramesh, R.; Venkatesan, T.
Year: 1998
Exchange interactions in CMR manganites: effect of doping and lattice distortions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mryasov, O.N.; Sabiryanov, R.F.; Freeman, A.J.; Jaswal, S.S.
Year: 1998
Magnetocrystalline anisotrophy of 3d transition metal ions in oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alders, D.; de Jonge, W.J.; Coehoorn, R.
Year: 1998
Magnetorestriction in transition metal alloy: CoNi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruqian Wu; Lujun Chen
Year: 1998
Study of Anisotropic magnetism in US
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Collins, E.; Kioussis, N.; Say Peng Lim; Cooper, B.R.
Year: 1998
Ground state properties og high spin Mn/sub 12/O/sub 12/ molecule in organic compound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, S.Y.; Zou, L.J.; Zheng, Q.Q.; Gong, X.G.
Year: 1998
An analytical method of a planar parametric transformer based on the magnetic circuit model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sakamoto, Y.; Ohta, M.; Natsusaka, M.; Murakami, K.
Year: 1998
Design and simulation of film transformer in the very high frequency range of flexible polyamide film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsujimoto, H.
Year: 1998
2D and 3D simulation of toroidal type thin film inductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ryu, H.J.; Kim, J.; Kim, H.J.; Lee, J.J.
Year: 1998
The characteristics of low temperature cofired multilayer chip LC filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung Hsiao-Miin; Sung, H.M.; Wang, L.J.; Chen, C.J.; Ko, W.S.
Year: 1998
Packaging-Compatible microinductors and microtransformers with screen-printed soft ferrite using low temperature processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae Y. Park; Allen, M.G.
Year: 1998
A microfabricated transformer for high-frequency power and signal conversion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Xu; Liakopoulos, T.M.; Chong H. Ahn; Suk Hee Han; Hi Jung Kim
Year: 1998
Thin film magnetic inductors for integrated circuit applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Korenivski, V.; van Dover, R.B.
Year: 1998
A comparative analysis of permanent magnet-type synchronous motors for fullymagnetically levitated rotors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Le Magueresse, T.; Lemarquand, G.
Year: 1998
Magnetic and Structural Properties of Commercial Sm/sub 2/(Co,Fe,Cu,Zr)/sub 17/-Based Magnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinhe Chen; Chaoying Ni; Hadjipanayis, G.
Year: 1998
Influence of the Top and Bottom Interface on Perpendicular Magnetic Anisotropy in Tb-Fe-Ag Multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marks, O.; Ruckert, T.; Tappert, J.; Keune, W.; Kim, W.-S.; Kleemann, W.; Voiron, J.
Year: 1998
NiO//spl alpha/-Fe/sub 2/O/sub 3/ Multilayers Prepared by PLD: A Model System for Magnetic Study of Interdiffusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keller, N.; Guyot, M.; Das, A.; Porte, M.; Krishnan, R.
Year: 1998
Structural Transition in Ferromagnetic/Non-Magnetic Multilayered Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kudryavtsev, Y.V.; Lee, G.M.; Kim, K.W.; Lee, Y.P.; Smardz, L.
Year: 1998
Spin Valve Structures on NIO Pinning Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cowache, C.; Dieny, B.; Auffret, S.; Cartier, M.
Year: 1998
Growth and Properties of Epitaxial Fe/sub 3/O/sub 4/SrTiO/sub 3/La/sub 0.7/Sr/sub 0.3/MnO/sub 3/ and Fe/sub 3/O/sub 4/SrTiO/sub 3/ Fe/sub 3/O/sub 4/ Heterostructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ogale, S.B.; Pai, S.P.; Ghosh, K.; Robson, M.C.; Jin, I.; Downess, M.; Sharma, R.P.; Greene, R.L.; Ramesh, R.; Venkatesan, T.; Johnson, M.
Year: 1998
FMR and Magnetization Study of NiFe/Ag/CoNi Trilayer Film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koymen, A.R.; Tagirov, L.R.; Gilmutdinov, R.T.; Topacli, C.; Durusoy, H.Z.; Aktas, B.
Year: 1998
Role of Magnetoeleastic Anisotropy in Ni/Pt Multilayer Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young-Seok Kim; Sung-Chul Shin
Year: 1998
Magnetic coupling of permalloy accross Fee Fe[001]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ankner, J.F.; Kaiser, H.; Kuch, W.; Parkin, S.S.P.
Year: 1998
Strong Anti-Ferromagnetic Coupling in Perpendicular /spl tau/MnA1/Co Magnetic Superlattices on GaAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruynseraee, C.; Lauhoff, G.; Bland, J.A.C.; Strijkers, G.; De Boeck, J.; Borghs, G.
Year: 1998
Competition Between Direct (V-V_ and Indirect (FE-FE) Exchange Coupling in FE/V
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harp, G.R.; Schwickert, M.M.; Tomaz, M.A.; O'Brien, W.L.; Lederman, D.
Year: 1998
Temperature Dependence of the Magnetization of <110>-Oriented Fe/sub 3/O/sub 4/NiO Superlattices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stoyanov, P.; Lind, D.M.
Year: 1998
FS-07 Preferred Crystal Orientation and its Effect on Magnetostriction of Co and Co/Cu/Co Thin Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeh, T.; Lin, C.-L.; Sivertsen, J.M.
Year: 1998
Magnetic Anisotropies of FenVm[001] Superlattices Determined by Ferromagnetic Resonance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anisimov, A.N.; Platow, W.; Poulopoulos, P.; Farle, M.; Baberschke, K.; Isberg, P.; Hjoervarsson, B.; Waeppling, R.
Year: 1998
Magnetic Anisotropy and Reorientation in CO/RH Superlattices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao Ying; Rao, K.V.; Jensen, P.J.; Xu, J.J.
Year: 1998
Magnetic and Transport Properties of Ni/Co Multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Polland, R.J.; McCartney, S.E.; Atkinson, R.
Year: 1998
Anomalous Microwave Absorption Peaks in a Lightly Doped Colossal Magnetoresistance Manganite - Single Crystal La/sub 0.9/Sr/sub 0.1/MnO/sub 3/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lofland, S.E.; Bhagat, S.M.; Kim, P.H.; Dahiroc, P.; Ghosh, K.; Greene, R.L.; Karabashev, S.G.; Shulyatev, D.A.; Arsenov, A.A.; Mukovskii, Y.; Tyagi, S.D.
Year: 1998
Effect of Low Fe Doping in La/sub
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ajan, A.; Venkataramani, N.; Prasad, S.; Nigam, A.K.; Pinto, R.; Shringi, S.N.
Year: 1998
Thickness Dependence of Magnetic and Magnetotransport Properties in Thin Films of Perovskite Manganites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shreekala, R.; Goyal, A.; Ghosh, K.; Rajeswari, M.; Ramesh, R.; Venkatesan, T.; Lofland, S.E.; Bhagat, S.M.; Gomez, R.D.
Year: 1998
90 MeV /sup 16/O Ion Irradiation Effects on Transport and Magnetization in Epitaxial Thin Films of La/sub 0.75/Ca/sub 0.25/MnO/sub 3/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bathe, R.; Date, S.K.; Ogale, S.B.; Patil, S.I.; Kumar, R.; Mehta, G.K.
Year: 1998
Unusual Substitutional Effect of Ruthenium in Bulk and Thin Films of La/sub 0.7/Sr/sub 0.3/Mn/sub 1-x/Ru/sub x/O/sub 3/ (O/spl les/ x /spl les/ 0.15)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manoharan, S.S.; Ju, H.L.; Krishnan, K.M.
Year: 1998
Measurement of Ultra-Fast Magnetic Rotation in Fexn Films Intended for High Speed Recording Heads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Silva, T.J.
Year: 1998
Influence of Impurity Gas Element in the Sputtering Atmosphere on the Microstructure and the Gmr in Co/cu Multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miura, S.; Takahashi, D.; Tsunoda, M.; Takahashi, M.
Year: 1998
End Domain States and Magnetization Reversal in Submicron Magnetic Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Shi; Zhu, T.; Durlam, M.; Chen, E.; Tehrani, S.
Year: 1998
Dynamics of Ultrafast Magnetization Processes in Permalloy Microstructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stankiewicz, A.; Hiebert, W.K.; Marsh, K.W.; Ballentine, G.M.; Freeman, M.R.
Year: 1998
Shape Dependence of the Switching Behavior of Ultrathin Magnetic Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chui, S.T.
Year: 1998
Magnetic Properties of 60 Nm Dots Prepared with Laser Interference Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haast, M.A.M.; Schuurhuis, J.R.; Abelmann, L.; Lodder, J.C.; Popma, T.A.J.
Year: 1998
The Relationship Between Structure and Magnetic Properties in Nanostructured FePd Ferromagnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okumura, H.; Klemmer, T.J.; Barnard, J.A.; Soffa, W.A.
Year: 1998
Spin-Flop Tendencies in Exchange-Biased Co/ CoO Thin Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Borchers, J.A.; Ijiri, Y.; Lee, S.-H.; Majkrzak, C.J.; Felcher, G.P.; Takano, K.; Kodama, R.; Berkowitz, A.E.
Year: 1998
Gd/fe Multilayers with Anisotropy Changing from In-Plane to Perpendicular for Msr Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stavrou, E.; Rohrmann, H.; Roll, K.
Year: 1998
Sequential Thermomagnetic Phase Transitions in Exchange Coupled Trilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sbiaa, R.; Le Gall, H.; Pogossian, S.
Year: 1998
Magnetic and Magneto-Optic Study of Co/pt Multilayers on Bismuth and Aluminum-Doped Dysprosium Iron Garnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meldrim, J.M.; Kirby, R.D.; Woollam, J.A.; Sellmyer, D.
Year: 1998
New Msr Method for High Density Read Only Disks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birukawa, M.; Suzuki, T.; Miyatake, N.
Year: 1998
Probable Capacity of 3.5-Inch Mo Disk Using Trilaver Double-Mask Msr Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, T.; Mihara, M.; Tarnanoi, K.; Sugimoto, T.; Shono, K.
Year: 1998
Signal Enhancement of 0.2/spl mu/m Packed Domain Using Magnetic Domain Expansion Readout Disk with a Gating Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Awano, H.; Shirai, H.; Watanabe, H.; Shimazaki, K.; Ying, X.; Ohta, N.
Year: 1998
Surface Anisotropy for the Case of Ultrathin Magnetic Films with Incomplete Coverage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shvets, I.V.; Seoighe, C.
Year: 1998
Temperature Dependence of the Interface Interactions on Fe/cr Studied by Ferromagnetic Resonance and Squid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pflaum, J.; Bodeker, P.; Frait, Z.; Maryskol, M.; Zabel, H.; Pelzl, J.
Year: 1998
Modifications of the Effective Surface and Crystalline Anisotropies of Ag/Fe/Ag-[001]-Layers by Ion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kurowski, D.; Pflaum, J.; Brand, K.; Pelzl, J.; Grunberg, P.
Year: 1998
Evidence for Domain Condensation Near the Ferromagnetic to Paramagnetic Transition in Perpendicularl
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnold, C.S.; Venus, D.
Year: 1998
Electric Field Effects on Magnetic and Optical Properties of Mnas/gaas [001] Thin Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shin, T.; Park, M.C.; Park, Y.; Rothberg, G.M.; Tanaka, M.; Harbison, J.P.
Year: 1998
Direct Evidence for a Magnetic Surface Layer on Fcc Fe/co
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salvietti, M.; Xingyu Gao; Kuch, W.; Schneider, C.M.; Kirschner, J.
Year: 1998
Nmr Studies of Sputtered Cofe Alloy Thin Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomson, T.; Riedi, P.C.; Platt, C.L.; Berkowitz, A.E.
Year: 1998
Towards a Selective Surface Nonlinear Magneto-Optical Diagnostic Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brudny, V.L.; Mochan, W.L.; Mendoza, B.S.; Petukhov, A.V.; Rasing, T.
Year: 1998
A Nuclear Magnetic Resonance Study of SmFe/sub 2/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kapusta, C.; Kocemba, W.; Figiel, H.; Riedi, P.C.; Tomka, G.J.; Wiesinger, G.
Year: 1998
The /spl Delta/e Effect and Magnetomechanical Coupling in Epoxy-Bonded Terfenol Composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hudson, J.; Busbridge, S.C.; Piercy, A.R.
Year: 1998
Processing Effects on the Magnetostrictive and Physical Properties of SmFe/sub 2/Metal Composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pinkerton, F.E.; Capehart, T.W.; Herbst, J.F.; Brewer, E.G.; Murphy, C.B.
Year: 1998
Magnetic Properties and Microstructure of Giant Magnetostrictive Tbfe/feco Multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quandt, E.; Ludwig, A.; Lord, D.G.; Faunce, C.A.
Year: 1998
Effects of Heteroepitaxial Strain on the Laves Phases Dyfe/sub 2/ and Tbfe/sub 2/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huth, M.; Wierneyer, B.
Year: 1998
Magnetic Properties of Amorphous Sin-fe and Sm-fe-b Thin Films Fabricated By Rf Magnetron Sputtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choi, Y.S.; Lee, S.R.; Han, S.H.
Year: 1998
Magnetostriction and Susceptibility Evolution in Twinned Terfenol-D
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao, X.; Lord, D.G.
Year: 1998
Magnetization Studies on Dy/sub 0.73/Tb/sub 0.27/Fe/sub 2-x/Co/sub x/H/sub n/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kishore, S.; Markandeyulu, G.; Rao, K.V.S.R.
Year: 1998
Magnetization and Magnetostriction of Dendritic [112] Tb/sub x/Dy/sub y/Ho/sub z/Fe/sub 1.95/(x+y+z=1) Rods Under Compressive Stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wun-Fogle, M.; Restorff, J.B.; Clark, A.E.
Year: 1998
Magnetic Phase Transition Evidence in Fe/sub 72/Pt/sub 28/ Invar Alloy: High Pressure Diffraction and X-Ray Magnetic Circular Dichroism Results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Odin, S.; Baudelet, F.; Itie, J.P.; Polian, A.; Pizzini, S.; Fontaine, A.; Giorgetti, C.; Dartyge, E.; Kappler, J.P.
Year: 1998
Trial On-Silicon Micro Magnetoelastic Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takezawa, M.; Ishiyama, K.; Yamaguchi, M.; Arai, K.I.
Year: 1998
Structure and Properties of Magnetic Inhomogeneities of the 'Static Soliton' Type in [001] Plates with a Combined Anisotropy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vakhitov, R.M.; Kucherov, V.Y.
Year: 1998
Nonlinear Self-Localized Magnetoelastic Surface Waves in Antiferromagnetic Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dikshtein, I.; Salk, S.S.
Year: 1998
Nonlinear Surface Magneto-Elastic Waves in Hematite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kavalerov, V.; Fujii, T.
Year: 1998
Granular and Homogeneous Alloyed Reco Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blythe, H.I.; Fedosyuk, V.M.
Year: 1998
Inas/(al,ga)sb Quantum Well Structures for Magnetic Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Behet, M.; De Boeck, J.; Borghs, G.
Year: 1998
Increased Field Sensitivity in Co/cu Multilayers with Soft Adjacent Layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jardine, D.B.; Mathur, N.D.; Kwang-Youn Kim; Wou-Young Lee; Blamire, M.G.; Evetts, J.E.
Year: 1998
Dependence Of Length Of A Vicalloy Fine Wire With Torsion Stress On Large Barkhausen Jump
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abe, S.; Matsushita, A.; Naoe, M.
Year: 1998
High Frequency Carrier Type Bridge-connected Magnetic Field Sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takezawa, M.; Kikuchi, H.; Suezawa, K.; Ishiyama, K.; Yamaguchi, M.; Arai, K.I.
Year: 1998
A 1MHz-3.5GHz thin-film permeance meter using the parallel plate/pickup coil combination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, M.; Yabukami, S.; Arai, K.I.
Year: 1998
Preparation And Properties Of Elastically Coupled Electro-magnetic Elements With A Bonding Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shin, K.H.; Inoue, M.; Arai, K.I.
Year: 1998
Geometry Effects On Low Frequency Noise In Giant Magnetoresistance (GMR) Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nor, A.F.M.; Hill, E.W.; Parker, M.R.
Year: 1998
Thermal Activation Of Spin Wave Modes In Co based multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wongsam, M.; Chantrell, R.W.
Year: 1998
Multiple Re-entrant Fe-Si-B Amorphous Wires With Simultaneous Switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ito, T.; Honda, T.; Yamasaki, J.; Ho, W.K.
Year: 1998
Hard-soft GMR Sensors With Co-rh Based Artificial Antiferromagnetic Rigid Subsystems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van den Berg, A.M.; Rupp, G.; Gieres, G.; Vieth, M.; Wecker, J.; Zoll, S.
Year: 1998
Spin-valves Combined With Soft Magnetic insulating Granular Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitani, S.; Yanagida, Y.; Saito, K.; Itoh, H.
Year: 1998
A New Giant Magneto-impedance Head Using Magnetic Microstrip Lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nianhua Jiang; Yamakawa, K.; Honda, N.; Ouchi, K.
Year: 1998
H-T-phase Diagram For The Giant Magnetic Flux Jumps In LTSC And HTSC, The Role Of Remagnetization Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chabanenko, V.V.; D'yachenko, A.I.; Chabanenko, A.V.; Szymczak, H.; Piechota, S.; Nabialek, A.; Dung, N.D.
Year: 1998
Read Write Characteristics Of Hexagonal Barium Ferrite Sputtered Films Prepared By Post Annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morisako, A.; Mtsumoto, M.; Naoe, M.
Year: 1998
Preparation Of Co-Cr Films Using Inductively-Coupled-plasma Assisted Magnetron Sputtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamamoto, S.; Hayashil, T.; Kurisu, H.
Year: 1998
Microscopic Magnetization Structures And Noise In Single-layer Perpendicular Thin Film Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Honda, Y.; Hirayama, Y.; Ito, K.; Futamoto, M.
Year: 1998
Effect Of Medium Thickness On The Signal-to-Noise Ratio Of Perpendicular Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ikeda, Y.; Sonobe, Y.; Uchida, H.
Year: 1998
Preparation And Characteristics Of Co-Zn Ferrite Rigid Disks Without Protective Layers For High Density Recording
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsushita, N.; Ichinose, M.; Nakagawa, S.; Naoe, M.
Year: 1998
Improvement Of Read/write Characteristics By Excellent C-axis Orientation In Ba Ferrite Disks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsushita, N.; Siosawa, T.; Watanabe, K.; Ichinose, M.; Nakagawa, S.; Naoe, M.
Year: 1998
Nano-size Magnetic Crystallites Formation Co-Cr Thin Films For Perpendicular Recording Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kadokura, S.; Naoe, M.; Maeda, Y.
Year: 1998
Thermal Relaxation In Perpendicular Double-layered Media
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiang, W.H.; Muracka, H.; Sugita, Y.; Nakamura, Y.
Year: 1998
Barium Ferrite Thin Films Without The Dead-Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yingjian Chen; Kryder, M.H.
Year: 1998
Preparation Of Co-ferrite Thin Films By MO-CVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mentser, A.N.; Lyakhovich, T.
Year: 1998
Finite Element Modeling Of Creep Damage Effects On A Magnetic Detector Signal For A Seam Weld/HAZ-region In A Steel Pipe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sablik, M.J.; Jiles, D.C.; Govindaraju, M.R.
Year: 1998
Resonance Interaction Of Grains As A Mechanism Of Thermal Stability Of Longitudinal Magnetic Medium
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saforov, V.L.; Suzuki, T.
Year: 1998
Long Wavelength Spin Dynamics In La/sub 0.53/Ca/sub 0.47/MnO/sub 3/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rhyne, J.J.; Kaiser, H.; Gang Xiao; Gardel, M.L.
Year: 1998
Spin Dynamics Of Strongly-doped La/sub 1-x/Sr/sub x/MnO/sub 3/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vasiliu-Doloc, L.; Lynn, J.W.; Mukovskii, Y.M.; Arsenov, A.A.; Shulyatev, D.A.
Year: 1998
Canted Antiferromagnetic Ordering Of Mn (Nd0.7Ca0.3)MnO3
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu, S.Y.; Li, W.-H.; Lee, K.C.; Lynn, J.W.; Liu, R.S.; Huang, C.Y.
Year: 1998
Magnetic Correlations In The Bilayer Manganite La/sub 1.2/Sr/sub 1.8/Mn/sub 2/O/sub 7/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosenkranz, S.; Osborn, R.; Sinha, S.K.; Gray, K.E.; Mitchell, J.F.; Vasiliu-Doloc, L.; Lynn, J.W.
Year: 1998
The Complex Magnetic Behavior And The Role Of Dynamic Structural Fluctuations In La/sub 1.2/Sr/sub 1.8/Mn/sub 2/O/sub 7/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, R.P.; Fournier, P.; Greene, R.L.; Venkatesan, T.; Mitchell, J.F.; Miller, D.
Year: 1998
Jahn-Teller Dynamics And Properties Of The Manganates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kresin, V.Z.; Wolf, S.A.
Year: 1998
A New Mean Field Theory Of The Manganates With Competing Double Exchange And Direct Antiferromagnetic Exchange Interactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Golosov, D.I.; Norman, M.R.; Levin, K.
Year: 1998
Tunneling Evidence Of Half-metallic Ferromagnetism In The Colossal Magnetoresistive La/sub 0.7/Ca/0.3/MnO/sub 3/ and La//sub 0.7/Sr/0.3/MnO/sub 3/ films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei, J.Y.T.; Nai-Chang Yeh; Vasquez, R.P.; Gupta, A.
Year: 1998
Far-Infrared Studies of a La2/3Ca1/3Mn03 Single Crystal: Magnetoconductivity at Optical Frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boris, A.V.; Kovaleva, N.N.; Bazhenov, A.V.; van Bentm, P.J.M.; Cheong, S.-W.; Samoilov, A.V.; Yeh, N.-C.
Year: 1998
Parametric Frequency Conversion with Amplification of a Weak Spin Wave in a Ferrite Film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kalinikos, B.A.; Kovshikov, N.G.; Kostylev, M.P.; Benner, H.
Year: 1998
Amplification of Microwave Magnetic Envelope Solitons in Yttrium Iron Garnet Thin Films by Parallel Pumping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kolodin, P.A.; Kabos, P.; Patton, C.E.; Kalinikos, B.A.; Kovshikov, N.G.; Kostylev, M.P.
Year: 1998
Theory of MSFVW Excitation in a Yig Film using a Finite-Length Microstrip Transducer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng, L.P.; Parekh, J.P.; Tuan, H.S.
Year: 1998
Experimental Investigation of Optical Guided Wave and Magnetostatic Forward Volume Wave Interaction in a Bi-YIG Film
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kurumida, J.; Nion Sock Chang
Year: 1998
Magnetostatic Waves Propagation in Ferrite-High-Temperature Superconductor Structure with Transport Electrical Current in Superconductor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lock, E.H.; Vashkovsky, A.V.; Zubkov, V.I.
Year: 1998
Bias Susceptibility Studies on Patterned Thin Permalloy Films with Switchable Magnetic Properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grimes, C.A.; Grimes, D.M.; Chun, L.; Ghee, O.K.
Year: 1998
Optical Propagation Loss of Cd/sub 1-x/Mn/sub x/Te Magnetooptical Waveguide Grown on GaAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zaets, W.; Watanabe, K.; Ando, K.
Year: 1998
Spin-Wave Emitting Diodes and Spin Diffusion in Magnetic Multilayers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berger, L.
Year: 1998
Spin-Density-Wave and Proximity Magnetism in Itinerent Antiferromagnetic Cr/Cr-Mn Superlattices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fullerton, E.E.; Sowers, C.H.; Bader, S.D.; Robertson, J.L.
Year: 1998
Element-Specific Magnetic Anisotropy Determined by Transverse Magnetic Circular X-Ray Dichroism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Durr, H.A.; Guo, G.Y.; van der Laan, G.; Lee, J.; Lauhoff, G.; Bland, J.A.C.
Year: 1998
Oscillatory Perpendicular Magnetic Anisotropy in Fe/Au Superlattices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takanashi, K.; Mitani, S.; Himi, K.; Fujimori, H.
Year: 1998
Superlattices of II-V Semiconductor and Heterogeneous Magnetic Layers for CPP Magnetotransport
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Boeck, J.; Akinaga, H.; Bruynseraede, C.; Bender, H.; Borghs, G.
Year: 1998
Magnetic Susceptibility of Fe/Cu Mulitlayers Ferromagnetic, Antiferromagnetic and Spin-Glass Phases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Oliveira, A.J.A.; Ortiz, W.A.; Mosca, D.H.; Mattoso, N.; Schreiner, W.H.; Teixeira, S.R.
Year: 1998
From Spin Glass to Ferromagnet in Amorphous Tb-Fe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shapiro, A.L.; Abarra, E.N.; Watson, S.K.; Hellman, F.
Year: 1998
Origin of Magnetic Anomalies in the Spin Glass System, La/sub .85/Sr/sub .15/CoO/sub 3./
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, A.P.; Alias, J.P.; Date, S.K.
Year: 1998
The Influence of Configurational Degeneracy on the Hysteretic Behavior of a System of Magnetostatically Coupled Magnetic Moments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gonzalez, J.M.; Chubykalo, O.A.; Hernando, A.; Vazquez, M.
Year: 1998
Broadband wireless data access over microcellular infrastructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoxin Qiu; Ariyavisitakul, S.
Year: 1998
Some design issues in local multipoint distribution systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sari, H.
Year: 1998
Service availability of broadband wireless networks for indoor multimedia at millimeter waves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiani, M.; Dardari, D.; Zanella, A.; Andrisano, O.
Year: 1998
GaInP/GaAs HBTs: state of the art and future trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wadsworth, S.D.; Davies, R.A.; Davies, I.; Marsh, S.P.; Peniket, N.A.; Phillips, W.A.; Wallis, R.H.
Year: 1998
VLSI integration of SiGe epitaxial base bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mouis, M.; Chantre, A.
Year: 1998
InAs channel HFETs: current status and future trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bolognesi, C.R.
Year: 1998
InP HBTs: state of the art and future trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jackel, H.
Year: 1998
Nano-technology-device prospects: quantum dots and transistors for ultracompact integration and terahertz analogue applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hartnagel, H.L.
Year: 1998
The development of a 0.25 /spl mu/m CMOS receiver for GSM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piazza, F.; Qiuting Huang
Year: 1998
Design and implementation of a single bias FET source mixer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Woo Lee; Hwoa-Yuol Kim; Hong-Goo Cho
Year: 1998
A BICMOS micropower 1 GHz super regenerative receiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joehl, N.; Favre, P.; Deval, P.; Vouilloz, A.; Dehollain, C.; Declercq, M.
Year: 1998
Fully integrated RF VCO for wireless transceivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mernyei, F.; Pardoen, M.; Hoss, W.; Darrer, F.
Year: 1998
SIMMWIC: the impact of SiGe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luy, J.-F.
Year: 1998
Silicon technologies and circuits for analogue and digital applications up to 50 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Treitinger, L.
Year: 1998
A multichip module integration technology for high-speed analog and digital applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mangold, T.; Wolf, J.; Topper, M.; Reichl, H.; Russer, P.
Year: 1998
Diversity achieved by multiple tone FSK over fading channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghareeb, I.; Yongacoglu, A.
Year: 1998
Advanced SOI CMOS technology for RF applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Demeus, L.; Chen, J.; Eggermont, J.-P.; Gillon, R.; Raskin, J.-P.; Vanhoenacker, D.; Flandre, D.
Year: 1998
Towards optimal multiple-accessing with multi-antenna receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knopp, R.
Year: 1998
Joint estimation of the number and the frequencies of multiple sinusoids from very noisy data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lo Presti, L.; Olmo, G.; Magli, E.
Year: 1998
On the hyperbolic positioning of GSM mobile stations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spirito, M.A.; Mattioli, A.G.
Year: 1998
Integrated CMOS chipset for ADSL systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Macq, D.; Rottiers, L.; Ariaensen, K.; Cornil, J.-P.; Hanssens, E.; Vanzieleghem, E.
Year: 1998
Broad-band low-noise preamplifier design with GaAs MESFETs for optical communication systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bende, A.B.; Kaminska, B.
Year: 1998
Towards the global modeling of high frequency electronic circuits by using the lumped-element extension of FDTD method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alimenti, F.; Ciampolini, P.; Mezzanotte, P.; Roselli, L.; Sorrentino, R.; Stopponi, G.
Year: 1998
Adaptive fractionally spaced MMSE receiver for asynchronous DS-CDMA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biglieri, E.; Caire, G.; Taricco, G.
Year: 1998
Capacity sensitivity of filter bank based MC VDSL transmission to timing errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Louveaux, J.; Vandendorpe, L.; Cuvelier, L.; Pollet, T.
Year: 1998
Effect of frequency offset on carrier phase and symbol timing recovery in digital receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamila, R.; Vesma, J.; Vuolle, H.; Renfors, M.
Year: 1998
Design of a 100 Mbps wireless local area network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Engels, M.; Eberle, W.; Gyselinckx, B.
Year: 1998
Highly integrated chips for commercial CDMA-based satcom applications: some case studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Philips, L.
Year: 1998
A novel co-decoding scheme to reduce memory in MPEG-2 MP@ML decoder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chimienti, A.; Lucenteforte, M.; Pau, D.; Sannino, R.
Year: 1998
A low-cost VLIW DSP architecture for communication equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Petit, L.; Legat, J.-D.
Year: 1998
A VLSI architecture for real time processing of one-bit coded SAR signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franceschetti, G.; Tesauro, M.; Strollo, A.G.M.; Napoli, E.; Cimino, C.; Spirito, P.; Mazzeo, A.; Mazzocca, N.
Year: 1998
Development of millimeter-waves in 1960s and 70s-its background and limitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akaike, M.
Year: 1998
Millimeter wave imaging technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mizuno, K.
Year: 1998
Millimeter-wave MMIC and module technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Itoh, Y.
Year: 1998
V-BLAST: an architecture for realizing very high data rates over the rich-scattering wireless channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolniansky, P.W.; Foschini, G.J.; Golden, G.D.; Valenzuela, R.A.
Year: 1998
A low-cost two-way radio transceiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Evans, J.G.; Shober, R.A.; Vannucci, G.; Wilkus, S.A.; Wright, G.A.
Year: 1998
Improved search algorithm for fast acquisition in a DSP-based GPS receiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daffara, F.; Vinson, P.
Year: 1998
System-on-a-chip methodology for telecom applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voros, N.S.; Tsasakou, S.; Mariatos, V.; Birbas, M.; Birbas, A.; Andritsou, A.
Year: 1998
The receiver engine chip-set for digital audio broadcasting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bolle, M.; Clawin, D.; Gieske, K.; Hofmann, F.; Mlasko, T.; Ruf, M.J.; Spreitz, G.
Year: 1998
State of the art in analog fiber-optic link technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ackerman, E.I.; Cox, C.H., III
Year: 1998
Spatio-temporal array processing for matched filter bound optimization in SDMA downlink transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Montalbano, G.; Slock, D.T.M.
Year: 1998
System-level design tools for RF communication ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gielen, G.G.E.
Year: 1998
Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Curras-Francos, M.C.; Tasker, P.J.; Fernandez-Barciela, M.; O'Keefe, S.S.; Sanchez, E.; Campos-Roca, Y.; Edwards, G.D.; Phillips, W.A.
Year: 1998
Computer-aided analysis of surface-state effects on gate-lag phenomena in GaAs MESFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horio, K.; Yamada, T.
Year: 1998
Comprehensive approach to the nonlinear design and modelling of microwave circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prigent, M.; Nallatamby, J.C.; Camiade, M.; Nebus, J.M.; Ngoya, E.; Quere, R.; Obregon, J.
Year: 1998
An integrated 2 GHz 20 dBm 3 V wide band differential power amplifier with microstrip antenna interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cartalade, D.; Senn, P.; Pache, D.; Perea, E.; Ghali, H.; Fournier, J.-M.
Year: 1998
A high efficiency channel estimation and equalisation strategy for a broadband COFDM system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ormondroyd, R.F.; Al-Susa, E.A.
Year: 1998
Analysis of corrugated waveguides with a set of edge-conditioned vector basis functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amari, S.; Vahldieck, R.; Bornemann, J.
Year: 1998
Time monitoring for students
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carrington, D.
Year: 1998
Incorporating student peer review and feedback into the assessment process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McGourty, J.; Dominick, P.; Reilly, R.R.
Year: 1998
The coupling of performance and assessment in multidisciplinary teamwork
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.S. Thompson
Year: 1998
Understanding what "success" means in assessment [of engineering education]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piket-May, M.J.; Chang, J.L.; Avery, J.P.
Year: 1998
Practical evolution of IT in the college classroom
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Siegmann
Year: 1998
Where's the proof? A review of literature on effectiveness of information technology in education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kadiyala, M.; Crynes, B.L.
Year: 1998
A project oriented approach to teaching software-hardware integration of microcontroller-based systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cruz-Rivera, J.L.
Year: 1998
Macroelectronics: building the perfect beast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dyer, S.A.; Schmalzel, J.L.
Year: 1998
Problems with salary equity models for engineering faculty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Swisher, G.M.
Year: 1998
Using the assessment center approach for faculty assessment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Richardson
Year: 1998
Development of a school wide assessment plan-questions answered and questions raised
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yokomoto, C.F.; Goodwin, C.; Williamson, D.
Year: 1998
A low-interaction C programming course on the WWW
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Louis, S.J.; Varol, Y.L.
Year: 1998
The mobile classroom project
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cook, R.P.
Year: 1998
Web-based learning of engineering mechanics for undergraduate students
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Van Petegem; G. Van der Perre
Year: 1998
An interactive CD ROM to sensitize engineering students to diversity issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blaisdell, S.; Jones, R.; Andreyev, C.
Year: 1998
A holistic assessment of writing in design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Larson, D.; Gruber, S.; Scott, D.; Neville, M.
Year: 1998
Using writing to enhance collaborative learning in engineering courses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wheeler, E.; McDonald, R.L.
Year: 1998
Practical problems in organizing student into groups
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schultz, T.W.
Year: 1998
Capturing student's teamwork and open-ended design performance in an undergraduate multimedia engineering design class
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McKenna, A.; Mongia, L.; Agogino, A.
Year: 1998
The evolution of an introductory computer engineering course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hudson, W.B.; Gruenbacher, D.M.
Year: 1998
New degree program for Information Engineering Technology at the University of Cincinnati with distance education component
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uskov, V.; Saad, A.; Uskova, M.
Year: 1998
The laboratory environment of the URI Integrated Computer Engineering Design (ICED) curriculum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uht, A.K.; Ying Sun
Year: 1998
A model for a computer engineering program
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varanasi, M.; Ranganathan, N.; Maurer, P.
Year: 1998
An adaptive system identification Java simulation for Internet based courseware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xavier, A.; Spanias, A.
Year: 1998
Learning through inquiry: a creative pilot program for teaching communications in a learner-centered environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crowley, L.A.
Year: 1998
Computer science accreditation: the status of criteria modernization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Price; D.T. Bonnette; L. Jones; K.E. Martin
Year: 1998
Using self-directed work group concepts for successful classroom group experiences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith David, J.; Wellington, C.A.
Year: 1998
BROCA: a computer-mediated learning tool for teaching scientific reasoning and writing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carlson, P.A.
Year: 1998
The Stanford University Electronic Learning Portfolios project
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reis, R.
Year: 1998
Using hypermedia for complex technologies education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Valdes, M.D.; Moure, M.J.; Valdes, M.A.; Rodriguez, L.; Mandado, E.
Year: 1998
A capstone experience-development of a flexible manufacturing system (FMS) using smart distributed sensing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramkumar, S.M.
Year: 1998
Quantum structure of materials: a multi-faceted approach in teaching introductory solid state materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DiNardo, N.J.; Vallieres, M.; Vohs, J.M.; Graham, W.R.; Composto, R.J.; Fontaine, F.; Cumberbatch, T.
Year: 1998
Using the Web to support distance learning of computer science
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carrasquel, J.; Dann, W.P.; Doube, W.; Frailey, D.; Gurwitz, C.; Sachs, D.
Year: 1998
A browser-based system to support and deliver DE [distance education]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doube, W.
Year: 1998
Learning styles and technical communication: improving communication and teamwork skills
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharp, J.E.
Year: 1998
Assessing the effectiveness of integrated freshmen curricula in engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.G. Haag; T. Reed Rhoads
Year: 1998
A new approach for continuing engineering education on information and communication technology in Flanders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Van Petegem; G. Van Der Perre
Year: 1998
On-line team project communication tool set
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nystrom, H.E.; Risco, D.R.
Year: 1998
COMNET III: a network simulation laboratory environment for a course in communications networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahuja, S.P.
Year: 1998
The Sloan Career Cornerstone Project: multimedia career education for undergraduates in engineering, math, and science
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Green, D.; Laker, K.; Wiesner, P.
Year: 1998
Active learning using inexpensive sound cards for circuits and communications experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mehrl, D.; Hagler, M.
Year: 1998
A contemporary science and engineering education program for 8th and 9th grade students
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anwar, S.
Year: 1998
Microelectronics-an introduction to formal cooperative learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.C. Flores; C.K. Della-Piana
Year: 1998
Group discussion techniques in a technical course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blackwell, G.R.
Year: 1998
Student selected microcontroller and digital design projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. Aburdene
Year: 1998
CPLD-oriented design projects for the first course in digital systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahlgren, D.J.
Year: 1998
Information engineering across the professions, a new course for students outside EE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Orr, J.A.; Cyganski, D.
Year: 1998
MATLAB based image processing lab experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zuria, C.S.; Ramirez, J.M.; Baez-Lopez, D.; Flores-Verdad, G.E.
Year: 1998
Analog and digital filter design using Matlab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Baez-Lopez; T. Escalante
Year: 1998
Simulating corporate project engineering for freshmen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, E.; Wirtz, R.; Greiner, M.
Year: 1998
Towards a global improvement of engineering maths teaching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leon De La Barra, M.B.; Leon De La Barra, G.E.; Urbina, A.M.; Leon De La Barra, B.A.
Year: 1998
An overview of curriculum module development in semiconductor manufacturing technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mowafy, L.
Year: 1998
Vacuum systems laboratory development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hata, D.M.
Year: 1998
A laboratory approach to semiconductor process technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Willis, M.J.
Year: 1998
Digital signal processing in electrical engineering technology programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moussavi, M.
Year: 1998
Multimedia tutorial on operational amplifiers, fundamentals, and applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baez-Lopez, D.; Sanchez, F.S.; Verdad, G.E.F.
Year: 1998
Teaching software design and testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carrington, D.
Year: 1998
A method for teaching software engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srinivas, N.; Smith, G.
Year: 1998
The design, development and evolution of Web-based materials featuring computer-animated simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Villareal, S.; Wynn, C.; Eastwood, D.; Zoghi, B.
Year: 1998
Using active student feedback in the learning environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, J.L.; Piket-May, M.J.; Avery, J.P.
Year: 1998
The Wave Concepts Inventory-an assessment tool for courses in electromagnetic engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roedel, R.J.; El-Ghazaly, S.; Rhoads, T.R.; El-Sharawy, E.
Year: 1998
Tough assessor or Santa Claus: rationalizing the assessment process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brown, R.W.
Year: 1998
Using the ADSP-21061 SHARC EZ-KIT in undergraduate DSP oriented courses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wick, C.E.; Piper, G.E.
Year: 1998
Towards the international engineer manager
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.M. Guendner; M. Allan; B.K. Temple
Year: 1998
Detailed assessment of engineering curricula
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnson, R.A.; Wheeler, E.
Year: 1998
Design and development of a peer evaluation instrument for "student learning teams"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martinazzi, R.
Year: 1998
Ten myths of cooperative learning in engineering education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacobson, D.; Davis, J.; Licklider, B.
Year: 1998
An applications-oriented freshman-level electrical circuits course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scott, D.R.; Hatfield, J.M.
Year: 1998
Multimedia collaborative content creation (mc3)-the MSU LectureOnline system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kortemeyer, G.; Bauer, W.
Year: 1998
Do we have to come to class? Experiences teaching a Web-assisted microprocessor system interfacing course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meier, R.D.
Year: 1998
Using learning contracts for improved teaching and student involvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goodnight, R.; Randolph, G.; Ziekel, T.
Year: 1998
Improving learning as a EC 2000 process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Froyd, J.E.
Year: 1998
Information-based engineering design and the ABET 2000
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, G.
Year: 1998
Guidelines proposal for undergraduate software engineering education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mengel, S.A.
Year: 1998
Communications track for systems engineering majors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avramov-Zamurovic, S.; Wick, C.; Dwan, T.
Year: 1998
A Design Based Introduction to Electrical Engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paskusz, G.F.
Year: 1998
Block diagram in undergraduate engineering courses other than control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hideg, L.M.
Year: 1998
Interdisciplinary curriculum development in electronics packaging using course segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Becker, M.; Holmes, J.F.; Meekisho, L.
Year: 1998
An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carey, R.E.; DeChiaro, L.F.
Year: 1998
ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anderson, W.R.; Krakauer, D.B.
Year: 1998
A substrate triggered lateral bipolar circuit for high voltage tolerant ESD protection applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, J.C.
Year: 1998
How to safely apply the LVTSCR for CMOS whole-chip ESD protection without being accidentally triggered on
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ker, M.-D.; Chang, H.-H.
Year: 1998
Cross-referenced ESD protection for power supplies [microprocessors]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anderson, W.R.; Montanaro, J.J.; Howorth, N.J.
Year: 1998
A simulation study of HBM failure in an internal clock buffer and the design issues for efficient power pin protection strategy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Puvvada, V.; Duvvury, C.
Year: 1998
Electrostatic discharges from charged particles approaching a grounded surface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dascalescu, L.; Ribardiere, P.; Duvanaud, C.; Paillot, J.-M.
Year: 1998
Semiconductor process and structural optimization of shallow trench isolation-defined and polysilicon-bound source/drain diodes for ESD networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voldman, S.; Geissler, S.; Nakos, J.; Pekarik, J.; Gauthier, R.
Year: 1998
ESD-related process effects in mixed-voltage sub-0.5 /spl mu/m technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gupta, V.; Amerasekera, A.; Ramaswamy, S.; Tsao, A.
Year: 1998
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Russ, C.; Bock, K.; Rasras, M.; De Wolf, I.; Groeseneken, G.; Maes, H.E.
Year: 1998
Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salome, P.; Leroux, C.; Crevel, P.; Chante, J.P.
Year: 1998
ESD and latch-up characteristics of semiconductor device with thin epitaxial substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suzuki, T.; Sekino, S.; Ito, S.; Monma, H.
Year: 1998
An automated tool for detecting ESD design errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siha, S.; Swaminathan, H.; Kadamati, G.; Duvvury, C.
Year: 1998
Measures against electrostatic destruction of electronic devices at electronic equipment assembly shops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saotome, K.; Matsuhashi, K.
Year: 1998
Magneto optical static event detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacksen, N.; Tan, W.; Boehm, D.
Year: 1998
Wrist strap designs and comparison of test results according to MIL-PRF-87893 and ANSI EOS/ESD association S1.1
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Namaguchi, T.; Uchida, H.
Year: 1998
Charge trap phenomena on EPROM device-methodology to identify the cause of the problem in IC manufacturing process to improve the electrical test yield
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Omar, I.
Year: 1998
Simulation of complete CMOS I/O circuit response to CDM stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beebe, S.G.
Year: 1998
Bipolar model extension for MOS transistors considering gate coupling effects in the HBM ESD domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolf, H.; Gieser, H.; Stadler, W.
Year: 1998
Characterization and optimization of a bipolar ESD-device by measurements and simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stricker, A.D.; Mergens, M.; Mettler, S.; Wilkening, W.; Fichtner, W.; Wolf, H.; Gieser, H.
Year: 1998
Influence of the device package on the results of CDM tests-consequences for tester characterization and test procedure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brodbeck, T.; Kagerer, A.
Year: 1998
Integrated voice-data communications over narrowband PMR channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Madungwe, G.; Takawira, I.
Year: 1998
Fast start-up equalizer for radio ATM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sellars, M.P.; Porter, J.; Greaves, S.D.; Hopper, A.; Fitzgerald, W.J.
Year: 1998
Multi-carrier direct sequence CDMA in fading situations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saban, D.; Braun, R.M.
Year: 1998
A traffic model for a power-controlled CDMA system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narrainen, R.P.; Takawira, F.
Year: 1998
Closed loop optimization of features for neural classifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van der Merwe, N.T.; Hoffman, A.J.
Year: 1998
Design of a test target generation and calibration system for a height finding surveillance radar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kotze, J.H.
Year: 1998
Approaches to RF interference suppression for VHF/UHF synthetic aperture radar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lord, R.T.; Inggs, M.R.
Year: 1998
An investigation into the use of wavelets and scaling for the extraction of buildings in aerial images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Levitt, S.; Aghdasi, F.
Year: 1998
Parallel implementation of fractal image compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uys, R.F.
Year: 1998
Effects of power control error on the performance of spread ALOHA protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mpako, V.; Takawira, F.
Year: 1998
A MAC protocol for wireless ATM over CDMA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Majoor, R.; Takawira, F.
Year: 1998
Quadratic complexity of binary sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Penzhorn, W.T.
Year: 1998
The application of optimum quasi bi-orthogonal wavelets to the simulation of room acoustics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Wyk, B.J.; Virolleau, F.
Year: 1998
Classification of two ship targets using radar backscatter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Purnell, D.W.; Botha, E.C.; Nieuwoudt, C.
Year: 1998
High-order hidden Markov modelling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Du Preez, J.A.; Weber, D.M.
Year: 1998
Autocorrelation properties of single neurons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tapson, J.
Year: 1998
A statistical test for stream ciphers based on the maximum order complexity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kasselman, P.R.
Year: 1998
A scanning tunneling microscope control system based on fast microcontrollers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bredekamp, A.H.; Tapson, J.
Year: 1998
System level simulation of digital designs: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carter, G.R.; Inggs, R.
Year: 1998
An example of rapid prototyping on the TMS320C80 Multimedia Video Processor (MVP)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tremeac, Y.G.; Inggs, M.R.
Year: 1998
Negative sequence current cancellation with DSP and space vector controlled PWM modulated inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malengret, M.; Farquharson, A.; Enslin, J.H.R.
Year: 1998
4/spl times/4 broadband optoelectronic switch for telecommunications and signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hnatiw, A.J.P.; Boertjes, D.W.; DeCorby, R.G.; McMullin, J.N.; MacDonald, R.I.; Corazza, D.J.; Johnson, E.
Year: 1998
A perspective on EMC in South Africa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reader, H.C.; Cloete, J.H.
Year: 1998
EMC and RFI problems and solutions on the SUNSAT micro-satellite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milne, G.W.; Jansen, E.; Roux, J.J.; Koekemoer, J.-A.; Kotze, P.P.A.
Year: 1998
Experience in measuring disconnector-generated interference currents in a high voltage substation using Rogowski coils
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pretorius, P.H.; Britten, A.C.; Van Coller, J.M.; Reynders, J.P.
Year: 1998
A three octave bandwidth printed circuit log-periodic dipole array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Wyk, M.J.; Cloete, J.H.
Year: 1998
Evaluation of the coupling mechanisms of electromagnetic disturbances resulting from disconnector switching in substations: experimental design and initial results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pretorius, P.H.; Britten, A.C.; Van Coller, J.M.; Reynders, J.P.
Year: 1998
Measurement of EMI in PLC circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Botha, M.
Year: 1998
Dual-frequency multi-polarimetric SAR as a tool for palaeo-drainage mapping in the Northern Cape Province
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doyle, G.S.; Inggs, M.R.
Year: 1998
Development of a 94 GHz imaging radar for use as a navigation sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brooker, G.M.
Year: 1998
Thermal remote sensing for earth science applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franzsen, A.J.
Year: 1998
Error-feedback for amplifier linearization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meier, I.; De Swardt, J.B.
Year: 1998
High-speed high-voltage PIN diode driver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Niekerk, C.; Van der Walt, P.
Year: 1998
Accuracy and convergence of mode-matching formulations for microstrip circuits, using the method-of-lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meyer, P.
Year: 1998
Complementary output switching logic: a superconducting voltage-state logic family operating at microwave frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perold, W.J.
Year: 1998
A spreadsheet intermodulation chart for narrowband and wideband systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van der Walt, P.W.
Year: 1998
Techniques for investigating higher-order mode interaction inside microstrip circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meyer, P.
Year: 1998
A 50-800 MHz stepped frequency continuous wave ground penetrating radar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farquharson, G.; Langman, A.; Inngs, M.R.
Year: 1998
Comparison of remote sensing techniques for alien vegetation mapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rowlinson, L.; Summerton, M.; Ahmed, F.
Year: 1998
Radiometry for landmine detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilkinson, A.J.; Inggs, M.R.
Year: 1998
A study on the ferroelectric properties of PZT heterolayered thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, S.G.; Park, I.G.; Bae, S.G.; Lee, Y.H.
Year: 1998
Thermoluminescence properties of SrAl/sub 2/O/sub 4/:Eu sputtered films with long phosphorescence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsutai, I.; Kamimura, T.; Kato, K.; Kaneko, F.; Shinbo, K.; Ohta, M.; Kawakami, T.
Year: 1998
Reduction of dielectric loss of sputtered tantalum oxide films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maki, K.; Itoh, E.; Miyairi, K.
Year: 1998
UHF partial discharge monitoring in GIS and signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, Z.M.; Feng, Y.P.; Chen, J.Q.; Zhang, X.Z.
Year: 1998
Temperature dependence of return voltage characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kozlovskis, A.; Rozenkrons, J.
Year: 1998
Temperature dependence of mobility in e-beam irradiated PMMA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kodaka, M.; Ueda, S.; Takada, T.; Tanaka, Y.
Year: 1998
An investigation on DC conduction in ceramic capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhou Yuanxiang; Yoshimura, N.
Year: 1998
Effects of ion implantation and thermal annealing on the photoluminescence in amorphous silicon nitride films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seol, K.S.; Futami, T.; Watanabe, T.; Ohki, Y.; Takiyama, M.
Year: 1998
Effect of ozone annealing on the charge trapping property of Ta/sub 2/O/sub 5/-Si/sub 3/N/sub 4/-p-Si capacitor grown by low pressure chemical vapor deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kato, H.; Seol, S.; Toyoda, T.; Ohki, Y.
Year: 1998
CF/sub 4/-RIE development characteristics of columnar-SeGe ion resists with focused-ion-beam lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyun-Yong Lee; Seung-Woo Paek; Young-Jong Lee; Hong-Bay Chung
Year: 1998
Study of non-linear electrical conductivity and anti-corona property of /spl beta/-SiC made from gangue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Xiaogang; Chen Wei; Shang Wenyu; Chen Shoutian
Year: 1998
Self-healing breakdown and electrical conduction of polyimide thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muramoto, Y.; Nagao, M.; Mizuno, F.; Kosaki, M.
Year: 1998
The influence of O/sub 2/, N/sub 2/ and H/sub 2/O on space-charge accumulation in XLPE under DC fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lim, P.N.; Fleming, R.J.
Year: 1998
Evaluation of electroluminescence in polyethylene
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan Zong-Huai; Miyata, H.; Takahashi, T.; Itou, T.; Nakiri, T.
Year: 1998
Comparison between the PEA method and the PWP method for measuring space charge distributions in solid insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adachi, N.; Xiaokui Qin; Tanaka, Y.; Takada, T.
Year: 1998
A simulation on anomalous transient currents in charge-injections with thin-film tunnel emitter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamura, I.; Ishii, S.; Yamada, H.
Year: 1998
The environmental influence on the product of arc-over SF/sub 6/ gas and human health protection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wan Jiazhen
Year: 1998
Observation of AC surface discharge dynamic behavior under various atmosphere pressure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ikeda, T.; Wake, H.; Takada, T.; Murooka, Y.
Year: 1998
Improvement of the heat resistance of epoxy casting resin for insulating spacers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ichikawa, I.; Goto, K.; Takei, M.; Nakano, T.; Kanazashi, Y.
Year: 1998
Thermal decomposition characteristics of DGEBA/MDA/GN system for insulating materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Song, Y.W.; An, H.S.; Shim, M.J.; Kim, S.W.
Year: 1998
Degradation characteristics of the outdoor insulation material by salt fog
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nam Ho Choi; Jae Hoon Kim; Knag Sik Park; Kyung Wan Koo; Sang Ok Han
Year: 1998
Dielectric response measurements in time and frequency domain on high voltage insulation with different response
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helgeson, A.; Gafvert, U.
Year: 1998
Frequency spectrum of various partial discharges in GIS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doi, M.; Muto, H.; Fujii, H.; Kamei, M.
Year: 1998
Effect of surface charges on impulse flashover voltages of spacer in SF/sub 6/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiaogen Zhang; Zhongfang Wang; Wenguo Gu; Yuchang Qiu
Year: 1998
Long term DC characteristics in insulating material for HVDC cable
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakatsuka, T.; Miyata, H.; Takahashi, T.; Ishibashi, A.; Tanaka, T.; Itaya, T.
Year: 1998
Study of the voltage behavior of water tree deteriorated XLPE cables by signal current detection mode for insulation diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kakuta, M.
Year: 1998
Study of the time evolution of partial discharge characteristics and interfacial phenomena of simulated XLPE cable joint
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, H.; Tian, Z.; Hikita, M.; Miyata, H.
Year: 1998
Research on on-line PD monitoring system for large power transformer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ma Weiping; Hao Dezhi; Zheng Lianghua; Wang Shuo
Year: 1998
Photodarkening and photoinduced anisotropy in amorphous chalcogenide thin films induced with He-Ne laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soo-Ho Park; Jin-Young Chun; Hyun-Yong Lee; Hong-Bay Chung
Year: 1998
Local area characterization of organic ultra-thin films by scanning tunneling spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuniyoshi, S.; Aoki, K.; Iizuka, M.; Kudo, K.; Tanaka, K.
Year: 1998
A portable partial discharge measuring system for insulation condition monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhou, Y.; Gardiner, A.I.; Mathieson, G.A.; Qin, Y.
Year: 1998
Noise reduction and PD measurements using digital filter and signal processing technique in HV substations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kozako, M.; Tian, Z.; Okubo, H.; Shibata, N.; Hikita, M.
Year: 1998
Partial discharge behaviour of power electronic packaging insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berth, M.
Year: 1998
Classification of partial discharge transient patterns using texture analysis algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahman, M.K.A.; Arora, R.; Srivastava, S.C.
Year: 1998
Deposition of polymeric thin films by ionization-assisted method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Usui, H.
Year: 1998
Optical and electrical detection of single pulse of partial discharge on electrical treeing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ehara, Y.; Tsuno, M.; Kishida, H.; Ito, T.
Year: 1998
Simulation on propagation of partial discharge pulses in transformer windings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, Z.D.; Zhu, D.H.
Year: 1998
Preliminary study on the methods for suppressing background interference in ultra-wideband partial discharge detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yonghong Cheng; Hengkun Xie; Xiang Zhen
Year: 1998
Study on characteristics of ultra-wideband partial discharge of typical insulation samples
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yonghong Cheng; Hengkun Xie; Wei Li
Year: 1998
Diagnosis of tree initiation by analysis of discharge magnitude and discharge luminescence at each phase angle area
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osawa, K.; Urano, K.; Ehara, Y.; Kishida, H.; Hayami, T.; Ito, T.
Year: 1998
The use and evaluation of rapid screening method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Yingsuo; Han Ye
Year: 1998
Diagnostic methods for transformers on-site
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gockenbach, E.; Borsi, H.
Year: 1998
Study on trend analysis method for on-line insulation diagnosing of capacitive-type equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang Xinhong; Yan Zhang
Year: 1998
Stress relieving with resistive materials based on silicon carbide (SiC)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gartner, J.; Gockenbach, E.; Borsi, H.
Year: 1998
On-line detection of gases dissolved in transformer oil and the faults diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liao Ruijin; Sun Caixin; Chen Weigen; Wang Caisheng
Year: 1998
Study on the mechanism of static electrification in transformer oil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qinxue Yu; Hengkun Xie; Ningjuan Hao
Year: 1998
Static electrification as an evaluation method of thermal aging in transformer oil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qinxue Yu; Hengkun Xie; Wei Yao; Benqiao Zhang
Year: 1998
Analytical computation of the transfer functions of transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenzel, D.; Borsi, H.; Gockenbach, E.
Year: 1998
Determination of dielectric relaxation time of Langmuir-films using Maxwell displacement current measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen-Xu Wu; Sato, Y.; Majima, Y.; Iwamoto, M.
Year: 1998
Effect of magnetic field on morphology of vapor-deposited low-molecular thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mori, T.; Mori, K.; Mizutani, T.
Year: 1998
Electronic devices using polymer donor-acceptor systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tada, K.; Sonoda, T.; Onoda, M.; Harada, H.; Yoshino, K.
Year: 1998
Digest Report on the Investigating Committee on Interfacial Electronic Phenomena and Intellectual Properties of Organic Thin Films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iwamoto, M.; Usui, H.; Onoda, M.
Year: 1998
Digest Report on the Investigating Committee on Structure and Functions of Molecular Ultra Thin Films, Organic Thin Films and Interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaneko, F.; Suzuoki, Y.; Kato, K.; Shinbo, K.
Year: 1998
Digest Report on the Investigation Committee of Inverter Surge Insulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kimura, K.
Year: 1998
Investigation committee on standardization of space charge measurement in dielectrics and insulating materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Takada; Y. Tanaka; Y. Ebinuma; K. Fukunaga
Year: 1998
Defect-oriented test quality assessment using fault sampling and simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goncalves, F.M.; Santos, M.B.; Teixeira, I.C.; Teixeira, J.P.
Year: 1998
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nigh, P.; Vallett, D.; Patel, P.; Wright, J.; Motika, F.; Forlenza, D.; Kurtulik, R.; Chong, W.
Year: 1998
Detection of CMOS address decoder open faults with March and pseudo random memory tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Otterstedt, J.; Niggemeyer, D.; Williams, T.W.
Year: 1998
Consequences of port restrictions on testing two-port memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamdioui, S.; van de Goor, A.J.
Year: 1998
A new framework for generating optimal March tests for memory arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zarrineh, K.; Upadhyaya, S.J.; Chakravarty, S.
Year: 1998
Delay test of chip I/Os using LSSD boundary scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gillis, P.; Woytowich, F.; McCauley, K.; Baur, U.
Year: 1998
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arabi, K.; Ihs, H.; Dufaza, C.; Kaminska, B.
Year: 1998
Designing for scan test of high performance embedded memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vida-Torku, E.K.; Joos, G.
Year: 1998
Testing embedded-core based system chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zorian, Y.; Marinissen, E.J.; Dey, S.
Year: 1998
BETSY: synthesizing circuits for a specified BIST environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhe Zhao; Pouya, B.; Touba, N.A.
Year: 1998
Test session oriented built-in self-testable data path synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han Bin Kim; Takahashi, T.; Dong Sam Ha
Year: 1998
An algorithmic approach to optimizing fault coverage for BIST logic synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Devadas, S.; Keutzer, K.
Year: 1998
Toward understanding "Iddq-only" fails
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gattiker, A.E.; Maly, W.
Year: 1998
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, J.T.-Y.; Chao-Wen Tseng; Li, C.-M.J.; Purtell, M.; McCluskey, E.J.
Year: 1998
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sachdev, M.; Janssen, P.; Zieren, V.
Year: 1998
A distributed BIST technique for diagnosis of MCM interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pendurkar, R.; Chatterjee, A.; Zorian, Y.
Year: 1998
Testing a multichip package for a consumer communications application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biewenga, A.; Muris, M.; Schuttert, P.; Fawer, U.
Year: 1998
Improved sensitivity for parallel test of substrate interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keezer, D.C.; Newman, K.E.; Davis, J.S.
Year: 1998
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dufort, B.; Roberts, G.W.
Year: 1998
Multi-output one-digitizer measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sasho, S.; Shibata, M.
Year: 1998
Cost of test reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deshayes, H.
Year: 1998
Fine pitch (45 micron) P4 probing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishii, T.; Yoshida, H.
Year: 1998
Integrated probe card/interface solutions for specific test applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anderson, J.
Year: 1998
A structured test re-use methodology for core-based system chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varma, P.; Bhatia, B.
Year: 1998
Core test connectivity, communication, and control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Whetsel, L.
Year: 1998
Modular logic built-in self-test for IP cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajski, J.; Tyszer, J.
Year: 1998
A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jone, W.B.; Rau, J.C.; Chang, S.C.; Wu, Y.L.
Year: 1998
TAO: regular expression based high-level testability analysis and optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ravi, S.; Lakshminarayana, G.; Jha, N.K.
Year: 1998
A layout-based approach for ordering scan chain flip-flops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makar, S.
Year: 1998
A new approach to scan chain reordering using physical design information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hirech, M.; Beausang, J.; Xinli Gu
Year: 1998
Quad DCVS dynamic logic fault modeling and testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adams, R.D.; Cooley, E.S.; Hansen, P.R.
Year: 1998
Digital bus faults measuring techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schrift, R.
Year: 1998
Limited access testing: IEEE 1149.4-instrumentation and methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McDermid, J.
Year: 1998
Built-in self-test of FPGA interconnect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stroud, C.; Wijesuriya, S.; Hamilton, C.; Abramovici, M.
Year: 1998
Microelectromechanical systems (MEMS) tutorial
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gabriel, K.J.
Year: 1998
A performance analysis system for MEMS using automated imaging methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:LaVigne, G.F.; Miller, S.L.
Year: 1998
Scan chain design for test time reduction in core-based ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aerts, J.; Marinissen, E.J.
Year: 1998
A novel test methodology for core-based system LSIs and a testing time minimization problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugihara, M.; Date, H.; Yasuura, H.
Year: 1998
Design and implementation of the "G2" PowerPC/sup TM/ 603e-embedded microprocessor core
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hunter, C.; Gaither, J.
Year: 1998
Diagnostic techniques for the UltraSPARC/sup TM/ microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kinra, A.; Mehta, A.; Smith, N.; Mitchell, J.; Valente, F.
Year: 1998
Testability access of the high speed test features in the Alpha 21264 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhavsar, D.K.; Akeson, D.R.; Gowan, M.K.; Jackson, D.B.
Year: 1998
Triggering and clocking architecture for mixed signal test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zaman, N.; Spilman, A.
Year: 1998
A scalable architecture for VLSI test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, E.; Cheung, D.; Huston, R.; Seaton, J.; Smith, G.
Year: 1998
The CAT-exact data transfer to DDS-generated clock domains in a single-chip modular solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gage, R.; Brown, B.
Year: 1998
Embedded self-testing checkers for low-cost arithmetic codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tarnick, S.; Stroele, A.P.
Year: 1998
On-line detection of logic errors due to crosstalk, delay, and transient faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Favalli, M.; Ricco, B.
Year: 1998
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Castillejo, A.; Veychard, D.; Mir, S.; Karam, J.M.; Courtois, B.
Year: 1998
Failure modes for stiction in surface-micromachined MEMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kolpekwar, A.; Blanton, R.D.; Woodilla, D.
Year: 1998
Maximization of power dissipation under random excitation for burn-in testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuo Chan Huang; Chung Len Lee; Chen, J.E.
Year: 1998
High-coverage ATPG for datapath circuits with unimplemented blocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyungwon Kim; Hayes, J.P.
Year: 1998
Implicit test generation for behavioral VHDL models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrandi, F.; Fummi, F.; Sciuto, D.
Year: 1998
Extracting gate-level networks from simulation tables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wohl, P.; Waicukanski, J.
Year: 1998
ATPG in practical and non-traditional applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keller, B.; McCauley, K.; Swenton, J.; Youngs, J.
Year: 1998
Test generation in VLSI circuits for crosstalk noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiyu Chen; Gupta, S.K.; Breuer, M.A.
Year: 1998
A comprehensive approach to the partial scan problem using implicit state enumeration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kalla, P.; Ciesielski, M.J.
Year: 1998
A novel combinational testability analysis by considering signal correlation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shih-Chieh Chang; Shi-Sen Chang; Wen-Ben Jone; Chien-Chung Tsai
Year: 1998
DFT guidance through RTL test justification and propagation analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makris, Y.; Orailoglu, A.
Year: 1998
Defect-oriented testing of mixed-signal ICs: some industrial experience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xing, Y.
Year: 1998
A high speed and area efficient on-chip analog waveform extractor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hajjar, A.; Roberts, G.W.
Year: 1998
Stimulus generation for built-in self-test of charge-pump phase-locked loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Veillette, B.R.; Roberts, G.W.
Year: 1998
Test methodology for a microprocessor with partial scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Day, L.L.; Ganfield, P.A.; Rickert, D.M.; Ziegler, F.J.
Year: 1998
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kusko, M.P.; Robbins, B.J.; Snethen, T.J.; Peilin Song; Foote, T.G.; Huott, W.V.
Year: 1998
Diagnosis and characterization of timing-related defects by time-dependent light emission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knebel, D.; Sanda, P.; McManus, M.; Kash, J.A.; Tsang, J.C.; Vallett, D.; Huisman, L.; Nigh, P.; Rizzolo, R.; Peilin Song; Motika, F.
Year: 1998
Novel optical probing technique for flip chip packaged microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paniccia, M.; Eiles, T.; Rao, V.R.M.; Wai Mun Yee
Year: 1998
A new path-oriented effect-cause methodology to diagnose delay failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan-Chieh Hsu; Gupta, S.K.
Year: 1998
A fault injection environment for microprocessor-based boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benso, A.; Prinetto, P.; Rebaudengo, M.; Reorda, M.S.
Year: 1998
Boundary scan BIST methodology for reconfigurable systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chauchin Su; Shung-Won Jeng; Yue-Tsang Chen
Year: 1998
Correlations between path delays and the accuracy of performance prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huisman, L.M.
Year: 1998
High speed testing-have the laws of physics finally caught up with us?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katz, J.
Year: 1998
Measuring jitter of high speed data channels using undersampling techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dalal, W.; Rosenthal, D.
Year: 1998
Alternative interface methods for testing high speed bidirectional signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keezer, D.C.; Zhou, Q.
Year: 1998
A highly testable and diagnosable fabrication process test chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhavsar, D.K.; Echeruo, U.; Akeson, D.R.; Bowhill, W.J.
Year: 1998
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schanstra, I.; Lukita, D.; van de Goor, A.J.; Veelenturf, K.; van Wijnen, P.J.
Year: 1998
Estimation of defect-free IDDQ in submicron circuits using switch level simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maxwell, P.C.; Rearick, J.R.
Year: 1998
Detecting resistive shorts for CMOS domino circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, J.T.-Y.; McCluskey, E.J.
Year: 1998
Versatile BIST: an integrated approach to on-line/off-line BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karri, R.; Mukherjee, N.
Year: 1998
On-line testing of scalable signal processing architectures using a software test method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aktouf, C.; Al-Hayek, G.; Robach, C.
Year: 1998
A non-enumerative path delay fault simulator for sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parodi, C.G.; Agrawal, V.D.; Bushnell, M.L.; Shianling Wu
Year: 1998
Compact two-pattern test set generation for combinational and full scan circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamzaoglu, I.; Patel, J.H.
Year: 1998
Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dervisoglu, B.; Ricchetti, M.; Eldow, B.
Year: 1998
A goal tree based high-level test planning system for DSP real number models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, M.; Armstrong, J.R.; Gray, F.G.
Year: 1998
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thibeault, C.; Boisvert, L.
Year: 1998
Detection of bridging faults in logic resources of configurable FPGAs using I/sub DDQ/
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao, L.; Walker, D.M.H.; Lombardi, F.
Year: 1998
Automated synthesis of large phase shifters for built-in self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajski, J.; Tamarapalli, N.; Tyszer, J.
Year: 1998
An almost full-scan BIST solution-higher fault coverage and shorter test application time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huan-Chih Tsai; Bhawmik, S.; Kwane-Ting Cheng
Year: 1998
Probabilistic mixed-model fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lavo, D.B.; Chess, B.; Larrabee, T.; Hartanto, I.
Year: 1998
SRAM-based FPGA's: testing the LUT/RAM modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Portal, J.M.; Figueras, J.; Zorian, Y.
Year: 1998
How we test Siemens Embedded DRAM Cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McConnell, R.; Moller, U.; Richter, D.
Year: 1998
How much testing is enough
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stoica, S.
Year: 1998
Spice up your life: simulate mixed-signal ICs!
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baker, K.
Year: 1998
Testing mixed signal SOCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burns, M.
Year: 1998
ASIC jeopardy-diagnosing without a FAB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davidson, S.
Year: 1998
Design for diagnostics views and experiences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rao, V.R.
Year: 1998
Scaling deeper to submicron: on-line testing to the rescue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolaidis, M.
Year: 1998
Design for soft-error robustness to rescue deep submicron scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolaidis, M.
Year: 1998
Learning to knit SOCs profitably
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rockoff, T.
Year: 1998
SOC test: the devil is in the details of integration/implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruparel, K.
Year: 1998
System chip test: are we there yet?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Varma, P.
Year: 1998
On-chip versus off-chip test: an artificial dichotomy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aitken, R.C.
Year: 1998
BIST vs. ATE for testing system-on-a-chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kelly, N.
Year: 1998
BIST vs. ATE: need a different vehicle?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sunter, S.
Year: 1998
BIST: required for embedded DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanoi, S.
Year: 1998
Just how real is the SIA roadmap
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Needham, W.
Year: 1998
How real is the new SIA roadmap for mixed-signal test equipment?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ortner, W.R.
Year: 1998
The rise and fall of the ATE industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rockoff, T.
Year: 1998
The stuck-at fault: it ain't over 'til it's over
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Butler, K.M.
Year: 1998
Stuck-at fault: a fault model for the next millennium
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Patel, J.H.
Year: 1998
Buying time for the stuck-at fault model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rearick, J.
Year: 1998
Current signatures: application [to CMOS]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gattiker, A.E.; Maly, W.
Year: 1998
The role of optics in communication satellites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coello-Vera, A.; Maignan, M.
Year: 1998
Optical storage: challenges for high density recording
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamura, M.
Year: 1998
Ultrafast TDM transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moores, J.D.
Year: 1998
Propagation of a 10 Gbps RZ bit stream in a circulating loop using TrueWave/sup TM/ and DCF with 100 km EDFA spacing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Korn, J.
Year: 1998
Saturation effects in a terahertz asymmetric optical demultiplexer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deyu Zhou; Koo Il Kang; Glesk, I.; Prucnal, P.R.
Year: 1998
Control of guided spontaneous emission by one and two-dimensional photonic bandgap structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Labilloy, D.; Benisty, H.; Weisbuch, C.; Smith, C.J.M.; Krauss, T.F.; De La Rue, R.M.; OEsterle, U.; Houdre, R.
Year: 1998
Microcavity phase-ring resonator filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong Sool Jeong; Byueng-Su Yoo; Ho Hyung Suh
Year: 1998
Ways to cost effective packaging: waveguide tapers and passive self-alignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hunziker, W.
Year: 1998
Techniques for monolithic integration of silica-based waveguide devices with optoelectronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bazylenko, M.; Gross, M.; Gauja, E.; Pak Lim Chu
Year: 1998
Fiber-chip-coupling based on in InP V-groove technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alder, T.; Heinzelmann, R.; Leonhard, S.; Stohr, A.; Jager, D.
Year: 1998
X-ray microscopy and biomedical specimens
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajyaguru, J.M.; Richardson, M.C.
Year: 1998
A new theoretical approach to high order harmonic generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gao, J.; Shen, F.; Eden, J.G.
Year: 1998
High-power continuous-wave cascade-oscillation at 3 /spl mu/m and 2 /spl mu/m with a holmium-doped fiber laser pumped by a fiber Raman laser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sumiyoshi, T.; Sekita, H.
Year: 1998
The merging of liquid crystal electrooptics with silicon CMOS technology to enable high information content, large screen displays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Melcher, R.L.
Year: 1998
High-resolution, multicolor organic LED displays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jordan, R.H.; Armstrong, N.; Savage, D.; Ching Tang
Year: 1998
Adaptive control of lasers and their interactions with matter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reitze, D.H.; Efimov, A.; Beach, N.M.; Moores, M.D.; Krauss, J.L.
Year: 1998
Coherent control of excitons in quantum wells using pulse-shaping techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Komori, K.; Asahara, T.; Sugaya, T.; Watanabe, M.; Hidaka, T.
Year: 1998
The space-time coupling of Fourier synthesized femtosecond pulses and their applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanabe, H.; Takasago, K.; Kannari, F.
Year: 1998
Nonlinear refraction and etalon effects in cw solid-state lasers mode-locked by semiconductor saturable absorber mirrors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Poloyko, I.G.; Kalashnikov, V.L.; Mikhailov, V.P.
Year: 1998
Fast optical signal processing in high bit rate OTDM systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Poulsen, H.N.; Jepsen, K.S.; Clausen, A.T.; Buxens, A.; Stubkjaer, K.E.; Hess, R.; Dulk, M.; Melchior, G.
Year: 1998
Investigation of cascade limits of optoelectronic wavelength converters in a recirculating loop experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raybon, G.; Mikkelsen, B.; Koren, U.; Miller, B.I.; Dreyer, K.; Tennant, D.M.; Feder, K.
Year: 1998
Highly performing wavelength converter based on dual pump wave mixing in semiconductor optical amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Tomkos; I. Zacharopoulos; E. Roditi; D. Syvridis; F. Girardin; L. Occhi; A. Uskov
Year: 1998
Novel WDM-TDM semiconductor sources for optical communications and signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Delfyett, P.J.; Shi, H.; Mathason, B.; Connolly, J.; Alphonse, G.
Year: 1998
Very high-speed ultraviolet photodetectors fabricated on GaN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carrano, J.C.; Li, T.; Brown, D.; Grudowski, P.A.; Eiting, C.J.; Dupuis, R.D.; Campbell, J.C.
Year: 1998


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