Reactive ranking for cooperative databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ribeiro-Neto, B.A.; Assis, G.T.
Year: 1997
i/sub DD/ pulse response testing applied to complex CMOS ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beasley, J.S.; Righter, A.W.; Apodaca, C.J.; Pour-Mozafari, S.; Huggett, D.
Year: 1997
Identification of defective CMOS devices using correlation and regression analysis of frequency domain transient signal data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Plusquellic, J.F.; Chiarulli, D.M.; Levitan, S.P.
Year: 1997
A low overhead design for testability and test generation technique for core-based systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghosh, I.; Jha, N.K.; Dey, S.
Year: 1997
Modifying user-defined logic for test access to embedded cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pouya, B.; Touba, N.A.
Year: 1997
A simulation-based JTAG ATPG optimized for MCMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Flint, A.
Year: 1997
Testing the 400 MHz IBM generation-4 CMOS chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Foote, T.G.; Hoffman, D.E.; Huott, W.V.; Koprowski, T.J.; Robbins, B.J.; Kusko, M.P.
Year: 1997
Testing the enterprise IBM System/390/sup TM/ multi processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Torreiter, O.A.; Baur, U.; Goecke, G.; Melocco, K.
Year: 1997
Capacitive leadframe testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Turner, T.T.
Year: 1997
I/sub DDQ/ characterization in submicron CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferre, A.; Figueras, J.
Year: 1997
Intrinsic leakage in low power deep submicron CMOS ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keshavarzi, A.; Roy, K.; Hawkins, C.F.
Year: 1997
Current signatures: application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gattiker, A.E.; Maly, W.
Year: 1997
IEEE P1149.4-almost a standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cron, A.
Year: 1997
Analog and mixed-signal benchmark circuits-first release
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaminska, B.; Arabi, K.; Bell, I.; Goteti, P.; Huertas, J.L.; Kim, B.; Rueda, A.; Soma, M.
Year: 1997
Test requirements for embedded core-based systems and IEEE P1500
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zorian, Y.
Year: 1997
A 256 Meg SDRAM BIST for disturb test application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Powell, T.J.; Hii, F.; Cline, D.
Year: 1997
A self-test circuit for evaluating memory sense-amplifier signal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Adams, R.D.; Cooley, E.S.; Hansen, P.R.
Year: 1997
Testability enhancement for behavioral descriptions containing conditional statements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ockunzzi, K.A.; Papachristou, C.A.
Year: 1997
A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singh, H.; Patankar, G.; Beausang, J.
Year: 1997
H-SCAN+: a practical low-overhead RTL design-for-testability technique for industrial designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asaka, T.; Bhattacharya, S.; Dey, S.; Yoshida, M.
Year: 1997
Manufacturing pattern development for the Alpha 21164 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stolicny, C.; Davies, R.; McKernan, P.; Truong, T.
Year: 1997
The application of novel failure analysis techniques for advanced multi-layered CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeoh Eng Hong; We, M.T.T.
Year: 1997
Signature analysis for IC diagnosis and failure analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henderson, C.L.; Soden, J.M.
Year: 1997
Application and analysis of IDDQ diagnostic software
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nigh, P.; Forlenza, D.; Motika, F.
Year: 1997
Test width compression for built-in self testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakrabarty, K.; Murray, B.T.; Jian Liu; Minyao Zhu
Year: 1997
Using BIST control for pattern generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kiefer, G.; Wunderlich, H.-J.
Year: 1997
ASIC manufacturing test cost prediction at early design stage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Voo-Kyoung Kim; Chen, T.; Tegethoff, M.
Year: 1997
Screening for known good die (KGD) based on defect clustering: an experimental study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singh, A.D.; Nigh, P.; Krishna, C.M.
Year: 1997
A simplified polynomial-fitting algorithm for DAC and ADC BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sunter, S.K.; Nagi, N.
Year: 1997
A case study of the test development for the 2nd generation ColdFire/sup R/ microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amason, D.; Crouch, A.L.; Eisele, R.; Giles, G.; Mateja, M.
Year: 1997
Logical diagnosis solutions must drive yield improvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ryan, P.G.
Year: 1997
IC diagnosis: industry issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soden, J.M.; Henderson, C.L.
Year: 1997
Scan latch design for delay test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savir, J.
Year: 1997
Delay testing with clock control: an alternative to enhanced scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tekumalla, R.C.; Menon, P.R.
Year: 1997
An on-line self-testing switched-current integrator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abu-Shahla, O.; Bell, I.M.
Year: 1997
On-line testable logic design for FPGA implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burress, A.L.; Lala, P.K.
Year: 1997
High-performance production test contactors for fine-pitch integrated circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brandes, J.J.
Year: 1997
The search for the universal probe card solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bates, R.D.
Year: 1997
BIST-based diagnostics of FPGA logic blocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stroud, C.; Lee, E.; Abramovici, M.
Year: 1997
Scan encoded test pattern generation for BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kun-Han Tsai; J. Rajski; M. Marek-Sadowska
Year: 1997
Design and realization of an accurate built-in current sensor for on-line power dissipation measurement and I/sub DDQ/ testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arabi, K.; Kaminska, B.
Year: 1997
On-line testing scheme for clock's faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Favalli, M.; Ricco, B.
Year: 1997
Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konuk, H.; Ferguson, F.J.
Year: 1997
Test strategy sensitivity to defect parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Bertrand, Y.
Year: 1997
Optical communication channel test using BIST approaches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaganon, M.; Kaminska, B.
Year: 1997
System level boundary scan in a highly integrated switch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hughes, W.J.
Year: 1997
Analog fault diagnosis for unpowered circuit boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiun-Lang Huang; Kwang-Ting Cheng
Year: 1997
Memory test-debugging test vectors without ATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Westfall, S.
Year: 1997
A DSP-based feedback loop for mixed-signal VLSI testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prabhu, L.S.; Rosenthal, D.A.
Year: 1997
OLDEVDTP: a novel environment for off-line debugging of VLSI device test programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuhai Ma; Wanchun Shi
Year: 1997
Parameterizable testing scheme for FIR filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mukherjee, N.; Rajski, J.; Tyszer, J.
Year: 1997
Scan synthesis for one-hot signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitra, S.; Avra, L.J.; McCluskey, E.J.
Year: 1997
Experimental results for current-based analog scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soma, M.; Bocek, T.M.; Vu, T.D.; Moffatt, J.D.
Year: 1997
On-chip measurement of the jitter transfer function of charge-pump phase-locked loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Veillette, B.R.; Roberts, G.W.
Year: 1997
Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arabi, K.; Kaminska, B.
Year: 1997
Low current and low voltages-the high-end op amp testing challenge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cometta, B.; Witte, J.
Year: 1997
How seriously do you take possible-detect faults?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raina, R.; Njinda, C.; Molyneaux, R.
Year: 1997
BART: a bridging fault test generator for sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cusey, J.P.; Patel, J.H.
Year: 1997
DS-LFSR: a new BIST TPG for low heat dissipation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seongmoon Wang; Gupta, S.K.
Year: 1997
An effective BIST scheme for arithmetic logic units
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gizopoulos, D.; Pachalis, A.; Zorian, Y.; Psarakis, M.
Year: 1997
Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Venkataraman, S.; Fuchs, W.K.
Year: 1997
Fault diagnosis in scan-based BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajski, J.; Tyszer, J.
Year: 1997
Fault macromodeling for analog/mixed-signal circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen-Yang Pan; Kwang-Ting Cheng
Year: 1997
Development of a MEMS testing methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kolpekwar, A.; Blanton, R.D.
Year: 1997
Embedded at-speed test probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aigner, M.
Year: 1997
An IDDQ sensor circuit for low-voltage ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miura, Y.
Year: 1997
A new validation methodology combining test and formal verification for PowerPC/sup TM/ microprocessor arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, L.C.; Abadir, M.S.
Year: 1997
Analyzing a PowerPC/sup TM/ 620 microprocessor silicon failure using model checking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raimi, R.; Lear, J.
Year: 1997
ErrorTracer: a fault simulation-based approach to design error diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shi-Yu Huang; Kwang-Ting Cheng; Kuang-Chien Chen; Cheng, D.I.
Year: 1997
Algorithms for switch level delay fault simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bose, S.; Agrawal, V.D.; Szymanski, T.G.
Year: 1997
Efficient identification of non-robustly untestable path delay faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhongcheng Li; Yinghua Min; Brayton, R.K.
Year: 1997
Effective path selection for delay fault testing of sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakraborty, T.J.; Agrawal, V.D.
Year: 1997
Why would an ASIC foundry accept anything less than full scan?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oakland, S.F.
Year: 1997
Why automate optical inspection?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raymond, D.W.; Haigh, D.F.
Year: 1997
So what is an optimal test mix? A discussion of the SEMATECH methods experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nigh, P.; Needham, W.; Butler, K.; Maxwell, P.; Aitken, R.; Maly, W.
Year: 1997
Thoughts on core integration and test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anderson, T.L.
Year: 1997
Embedded core test plug-n-play: is it achievable?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia, R.
Year: 1997
Test access of TAP'ed and non-TAP'ed cores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Whetsel, L.
Year: 1997
On-line testing for VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolaidis, M.
Year: 1997
Visualizing information on a sphere
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gross, M.H.; Sprenger, T.C.; Finger, J.
Year: 1997
Coordinating declarative queries with a direct manipulation data exploration environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Derthick, M.; Roth, S.F.; Kolojejchick, J.
Year: 1997
Design and evaluation of incremental data structures and algorithms for dynamic query interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanin, E.; Beigel, R.; Shneiderman, B.
Year: 1997
Multidimensional detective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inselberg, A.
Year: 1997
Improvement of lower side speed control characteristics of an induction motor without a speed sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohmori, Y.; Takagi, M.; Kiriya, T.
Year: 1997
High performance sensorless control of induction motor drives for industry applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Griva, G.; Ilas, C.; Eastham, J.F.; Profumo, F.; Vranka, P.
Year: 1997
A new hybrid vector control for induction motor without speed and position sensors-frequency hybrid approach using new indirect scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinnaka, S.
Year: 1997
Novel prediction method of acoustic magnetic noise emitted by inverter-fed induction motor system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaku, B.; Miyashita, I.; Sone, S.
Year: 1997
Stability analysis and design guidelines for a speed-sensorless induction motor drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suwankawin, S.; Sangwongwanich, S.
Year: 1997
Improving the start and restart behavior through state recognition of AC drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pan, H.; Springob, L.; Holtz, J.
Year: 1997
Speed control of ultrasonic motors by discrete time variable structure control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Senjyu, T.; Yokoda, S.; Uezato, K.
Year: 1997
P-I and I-P controllers in a closed loop for DC motor drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmed, F.I.; El-Tobshy, A.M.; Mahfouz, A.A.; Ibrahim, M.M.S.
Year: 1997
A proposition of design method for modified repetitive control system with corrected dead time using sensitivity function shaping and its application to motor control system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugimoto, H.; Washida, K.
Year: 1997
Design tradeoffs and technology outlook of highly compact integrated AC motors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, J.
Year: 1997
Axial type flat PM motor with large air gap
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanada, M.; Morimoto, S.; Takeda, Y.
Year: 1997
Driving method for delta-connected brushless-sensorless motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sakurai, T.; Sakurai, M.; Arimoto, M.; Kaneko, S.
Year: 1997
New current feed back control method for solar energy inverter using digital signal processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takebayashi, T.; Nakata, H.; Eguchi, M.; Kodama, H.
Year: 1997
A new scheme for maximum photovoltaic power tracking control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugimoto, H.; Dong, H.
Year: 1997
A new microcontroller based solar energy conversion modular unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, F.; Zhimin, G.; Forughian, T.; Tien, D.
Year: 1997
Ring-shaped flywheel energy storage systems with superconducting levitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Teshima, H.; Tawara, T.; Kobuchi, J.; Suzuki, T.; Shimada, R.
Year: 1997
Development of uninterruptible secondary battery system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohshima, M.; Miyazaki, S.; Inagaki, K.; Kikuchi, H.; Nirasawa, H.
Year: 1997
A hybrid single-phase power active filter for high order harmonics compensation in converter-fed high speed trains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maeda, T.; Watanabe, T.; Mechi, A.; Shiota, T.; Iida, K.
Year: 1997
A new method for separating AC component of instantaneous real power and imaginary power suitable for active filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakata, A.; Ueda, A.; Torii, A.
Year: 1997
Development of 60 MVA SVC (static VAr compensator) using large capacity 8 kV and 3 kA thyristors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hasegawa, T.; Aoshima, Y.; Sato, T.; Kondo, O.; Matsukawa, T.
Year: 1997
Power system stabilizing control using high speed phase shifter (HSPS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ise, T.; Hayashi, T.; Ishii, J.; Kumagai, S.
Year: 1997
DC power system for superconducting fusion test facility LHD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chikaraishi, H.; Tanahashi, S.; Yamada, S.; Motojima, O.; Satoh, T.; Niwa, H.; Uede, T.; Hiue
Year: 1997
A novel three-phase sinusoidal PWM voltage source inverter and its application for photovoltaic power generation system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nonaka, S.
Year: 1997
Characteristics of a novel PWM inverter circuit with a L-C filter connected with DC link
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amei, K.; Sakui, M.; Fujita, H.
Year: 1997
Effect of parasitic capacitance of power device on output voltage deviation during switching dead-time in voltage-fed PWM inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamamoto, K.; Shinohara, K.; Ohga, H.
Year: 1997
New current-controlled PWM rectifier-voltage source inverter without DC link components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iimori, K.; Shinohara, K.; Tarumi, O.; Zixum Fu; Muroya, M.
Year: 1997
Generalized harmonic loss-factor as a novel important quality index of PWM techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Halasz, S.; Huu, B.T.
Year: 1997
A loss-less passive snubber for soft-switching boost-type converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nomura, H.; Fujiwara, K.
Year: 1997
New switching sequence for three phase converter with ZVS using a transformer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ofuji, S.; Oshikata, T.; Matsuda, Y.
Year: 1997
New DC-DC resonant converter as active filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagy, I.; Korondi, P.; Masada, E.; Puklus, Z.
Year: 1997
Single-switch auxiliary resonant converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimada, M.; Nakamura, M.
Year: 1997
Comparative transient and steady-state performances of three resonant PWM inverter-controlled DC-DC converters using high-voltage transformer and cable parasitic circuit components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun, J.M.; Gamage, N.; Nakaoka, M.; Takano, H.; Hatakeyama, T.
Year: 1997
Performance characteristics of the combined zero-voltage switching inverter with the auxiliary input-current controller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lishan Tu; Kurokawa, F.; Matsuo, H.; Aoike, N.
Year: 1997
Steady-state performance analysis of shaft generator systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishikata, S.; Odaka, A.; Koishikawa, Y.
Year: 1997
Dynamic model of fluorescent lamp implemented in PSpice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tseng, K.J.
Year: 1997
Stability analysis and performance evaluation of AC side current control system of voltage type converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Draou, A.
Year: 1997
The use of a single microprocessor board to control two independent inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:El-Kassas, I.A.; Hulley, L.N.; Shepherd, W.
Year: 1997
Rapid prototyping tool for a fuzzy logic based soft-starter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajendra Prasad, M.; Sastry, V.V.
Year: 1997
Accurate measurement of instantaneous voltage for power electronics circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tung-Hai Chin; Nakano, M.; Hirayama, T.
Year: 1997
Analysis of single phase diode rectifiers with power factor correction circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ueda, A.; Shinohara, T.; Matsubara, M.; To, A.
Year: 1997
Improvement of current waveform for 200 V input single-phase rectifiers using modified voltage-doubler circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujiwara, K.; Nomura, H.
Year: 1997
Improved circuit of AC choppers for single-phase systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abd El-Latif Ahmed, N.; Amei, K.; Sakui, M.
Year: 1997
A new topology for single phase UPS systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gui-Jia Su; Ohno, T.
Year: 1997
A design concept of DC filters for magnet power supplies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyosung Kim; Jaeho Choi
Year: 1997
Electric load controlled by computer simulator having power regeneration ability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ando, I.; Takahashi, I.; Tanaka, Y.; Ikehara, M.
Year: 1997
New NPC multi-level four-quadrant DC-DC converter controlled by the integrated-voltage-control method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okui, H.; Irie, H.
Year: 1997
3300 V 400 A, 600 A and 1200 A high power IGBT modules with high reliability for traction applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, A.; Mori, M.; Inoue, H.; Koike, Y.; Kushima, T.; Shimizu, H.; Nakamura, K.; Saito, R.
Year: 1997
Efficient ozonizer using PDM and PWM controlled resonant inverter and its performance evaluations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konishi, Y.; Wang, S.P.; Ishibashi, M.; Feng, Y.L.; Nakaoka, M.
Year: 1997
Innovative development of electromagnetic induction-based fluid-heating system using resonant PWM inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kajiyama, A.; Guo, B.; Nakaoka, M.; Uchihori, Y.
Year: 1997
Switching modes and short-circuit considerations in very high frequency, very high power resonant inverters for induction heating applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dede, E.J.; Jordan, J.; Esteve, V.; Espi, J.M.; Ferreres, A.
Year: 1997
New type of ballast for HID lamps using distributed constant line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ohsato, N.H.; Ohguchi, H.; Shimizu, T.; Kimura, G.; Takagi, H.
Year: 1997
All digital controlled three-phase UPS without inverter-transformer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanouda, A.; Sakurai, Y.; Kubo, K.; Shimada, K.; Kunisada, H.; Umetsu, K.
Year: 1997
Steady-state characteristics of an overload-protected frequency compensated current-feedback magnetic multivibrator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katsuki, A.; Ouchiyama, M.; Takeshita, T.
Year: 1997
Rare-metal free thin film solar cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katagiri, H.; Nishimura, M.; Onozawa, T.; Maruyama, S.; Fujita, M.; Sega, T.; Watanabe, T.
Year: 1997
A method to measure EMI due to electric field coupling on PCB
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pong, B.M.H.; Lee, A.C.M.
Year: 1997
A control method of an inverter-fed six-phase pole change induction motor for electric vehicles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mori, M.; Mizuno, T.; Ashikaga, T.; Matsuda, I.
Year: 1997
Harmonics control of the 20 MVA PWM inverter fed LSM drive system for the Yamanashi Maglev Test Line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamauchi, Y.; Tanitsu, H.; Kitano, J.; Kaga, S.; Tagami, Y.; Otsuka, Y.; Morishima, N.
Year: 1997
Optimization of readhesion control of Shinkansen trains with wheel-rail adhesion prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, T.; Yamanaka, A.; Hirose, T.; Hosh, K.; Nakamura, S.
Year: 1997
Improvement of re-adhesion for commuter trains with vector control traction inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yasuoka, I.; Henmi, T.; Nakazawa, Y.; Aoyama, I.
Year: 1997
Sensorless speed estimation based on primary and secondary resistance estimation and output voltage compensation of induction motor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akatsu, K.; Kawamura, A.
Year: 1997
A speed-sensorless IM drive with modified decoupling control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sangwongwanich, S.; Suwankawin, S.
Year: 1997
Sensorless speed control of an induction motor with no influence of resistance variation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanmachi, T.; Takahashi, I.
Year: 1997
Multi-star induction motors fed by voltage source inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stemmler, H.; Deplazes, R.
Year: 1997
For practical use position and speed sensorless salient-pole brushless DC motor drives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kasa, N.; Watanabe, H.
Year: 1997
Fully digital implementation of PMSM servo based on a novel current control strategy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jia Wu; Dongsheng Zhang; Yongdong Li
Year: 1997
Initial rotor position estimation of salient-pole brushless DC motors by artificial neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Senjyu, T.; Urasaki, N.; Uezato, K.
Year: 1997
Advantageous use of a dual operation, linear and switching power module in drive control with no deadtime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanagawa, K.; Tohya, T.; Matsuse, K.
Year: 1997
A control method of active power filter in unsymmetrical and distorted voltage system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Komatsu, Y.; Kawabata, T.
Year: 1997
A new control method for active power filters with voltage detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sato, Y.; Chigira, H.; Kataoka, T.
Year: 1997
Novel active filter system composed of inverter bypass circuit for suppression of harmonic resonance at the Yamanashi Maglev test line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawaguchi, I.; Ikeda, H.; Kitano, J.-I.; Ogihara, Y.; Syogaki, M.; Morita, H.
Year: 1997
Design of harmonic current detector and stability analysis of a hybrid parallel active filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khositkasame, S.; Sangwongwanich, S.
Year: 1997
Development of dispersion type active filter [for power system harmonics]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinzen, K.; Nomura, M.; Terashima, M.; Anan, F.; Yamasaki, K.
Year: 1997
An adaptive noise canceling theory based single-phase shunt active power filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Weiji; Chen Wenhong; Ma Xiaojun; Chen Jianye; Wang Zhonghong; Han Yingduo
Year: 1997
Transformerless reactive series compensators with voltage source inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stemmler, H.; Beer, A.
Year: 1997
Series power line compensator using self-commutated inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tokuda, H.; Eguchi, N.; Uemura, S.; Shimada, R.
Year: 1997
Continuous operation control during electric power network faults in an adjustable speed generation system with a flywheel excited by a DC link converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishio, T.; Minoguti, K.; Uno, S.; Futami, M.; Hombu, M.; Ichinose, M.; Maoka, A.
Year: 1997
A state-space modeling and a neutral point voltage control for an NPC power converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Osawa, C.; Matsumoto, Y.; Mizukami, T.; Ozaki, S.
Year: 1997
DC ripple current reduction method on a single phase PWM voltage source converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimizu, T.; Fujioka, Y.; Kimura, G.
Year: 1997
A simple sensorless method for sinusoidal PWM converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ando, I.; Takahashi, I.; Utsunomiya, K.
Year: 1997
Transient oscillation suppression of input filter voltage and current for current-source three-phase PWM AC/DC converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toyama, K.; Takeshita, T.; Matsui, N.
Year: 1997
Harmonic evaluation of carrier-based PWM methods using harmonic distortion determining factor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fukuda, S.; Suzuki, K.
Year: 1997
Unified PWM technique for real time power conversion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dae-Woong Chung; Seung-Ki Sul; Joohn-Sheok Kim
Year: 1997
Walsh function based synthesis method of PWM pattern for full-bridge inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kondo, S.; Choeisai, K.
Year: 1997
Indirect current control scheme in PWM voltage-sourced converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae-Ho Choi; Hyong-Cheol Kim; Joo-Sik Kwak
Year: 1997
A novel control strategy on single-phase PWM current source inverter incorporating pulse area modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hirachi, K.; Tomokuni, Y.
Year: 1997
Design and analysis of a novel soft-switched push-pull boost converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Ming Chang; Jia-You Lee; Kuan-Hui Fang
Year: 1997
Performance of series-resonant AC link inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayashi, M.; Matsuse, K.
Year: 1997
New developments in resonant DC link inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Divan, D.; Wallace, I.
Year: 1997
Improvement of performance of a series resonant DC link PWM inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishikawa, H.; Murai, Y.
Year: 1997
A novel resonant DC link circuit with two level PWM control scheme and its application to three-phase voltage-fed converter operating at new pulse vector modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kambe, A.; Kurokawa, M.; Chibani, A.; Nakaoka, M.
Year: 1997
High-efficiency power supply for resistive loads with sinusoidal input current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rossetto, L.; Malesani, L.; Spiazzi, G.; Pomilio, J.A.; Monacchi, M.
Year: 1997
Distortion-free regulated AC power supply using variable capacitance device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katsuki, A.; Iwata, H.; Matsui, T.
Year: 1997
Improvement of reactance compensator using variable active-passive reactance with output filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Funato, H.; Kawamura, A.; Watanabe, T.; Kamiyama, K.
Year: 1997
The instantaneous power theory based on mapping matrices in three-phase four-wire systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, H.; Akagi, H.
Year: 1997
Periodic steady-state analysis by a modified shooting method for a power electronic circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kato, T.; Tachibana, W.
Year: 1997
Simulation method for phase-shift controlled AC-AC converters based on switching vector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyyra, J.; Valiviita, S.
Year: 1997
State vector equation based computer simulation approach of digitally controlled power conversion circuits and systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ulhaq, S.M.; Nakaoka, M.; Takano, H.
Year: 1997
A study on power factor and efficiency correction of AC-DC boost converter by partial resonant type using a L/sup 2/SC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyun-Woo Lee; Ki-Young Suh; Young-Chul Kim; Jung-Ham Chun; Taniguchi, K.
Year: 1997
Computer-aided simulation technique of digitally controlled switched-mode power conversion circuits and systems using state variable matrices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takano, H.; Ulhaq, S.M.; Nakaoka, M.
Year: 1997
The characteristics analysis of PWM inverter-fed 3-phase induction motor from view point of saturation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kamimoto, K.; Andoh, N.; Murai, Y.
Year: 1997
The IGBT-an optimized device for system integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lorenz, L.
Year: 1997
Dual slope integrator type delta modulator for high performance voltage source inverters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahman, K.M.; Choudhury, M.A.; Rezwan Khan, M.; Rahman, M.A.
Year: 1997
Development of a General Tokamak Circuit Simulation Program and some application results to the JT-60 power supply system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsukawa, M.; Aoyagi, T.; Miura, Y.
Year: 1997
Adaptive signal processing system for accurate zero-crossing detection of cycloconverter phase currents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Valiviita, S.; Ovaska, S.J.; Kyyra, J.
Year: 1997
Isolated three-phase AC-to-DC bidirectional converter with a small number of switches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takeuchi, A.; Endo, H.; Muroyama, S.; Ohtsu, S.
Year: 1997
Parallel redundant operation of UPS with robust current minor loop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ito, Y.; Iyama, O.
Year: 1997
Comparison between BAW and SAW sensor principles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benes, E.; Groschl, M.; Seifert, F.; Pohl, A.
Year: 1997
An acoustic plate mode study of complementary and non-complementary antigen/antibody reactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dahint, R.; Bender, F.; Grunze, M.
Year: 1997
A novel monolithic piezoelectric sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schweyer, M.G.; Hilton, J.A.; Munson, J.E.; Andle, J.C.; Hammond, J.M.; Lec, R.M.
Year: 1997
A temperature insensitive quartz microbalance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pierce, D.E.; Yoonkee Kim; Vig, J.R.
Year: 1997
Mass response of the thickness-shear mode acoustic wave sensor in liquids as a central misleading dogma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thompson, M.; Hayward, G.L.
Year: 1997
SAW and QMB for chemical sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dickert, F.L.; Forth, P.; Tortschanoff, M.; Bulst, W.E.; Fischerauer, G.; Knauer, U.
Year: 1997
SAGAS: gas analyzing sensor systems based on surface acoustic wave devices-an issue of commercialization of SAW sensor technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rapp, M.; Reibel, J.; Stier, S.; Voigt, A.; Bahlo, J.
Year: 1997
A surface acoustic wave mercury vapor sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caron, J.J.; Haskell, R.B.; Libby, D.G.; Freeman, C.J.; Vetelino, J.F.
Year: 1997
Performance optimization of surface acoustic wave chemical sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McGill, R.A.; Chrisey, D.B.; Mlsna, T.E.; Stepnowski, J.L.; Chung, R.; Cotal, H.
Year: 1997
Comparison of surface transverse wave (STW) and shear horizontal acoustic plate mode (SHAPM) devices for biochemical sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schweyer, M.G.; Weaver, J.T.; Andle, J.C.; McAllister, D.J.; French, L.; Vetelino, J.; Height, J.J.
Year: 1997
A surface acoustic wave nitric oxide sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caron, J.J.; Kenny, T.D.; LeGore, L.J.; Libby, D.G.; Freeman, C.J.; Vetelino, J.F.
Year: 1997
Temperature-compensated SH-APM sensors: new theoretical and experimental results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dejous, C.; Esteban, I.; Rebiere, D.; Pistre, J.; Planade, R.
Year: 1997
Phase noise characterization of polymer coated-SAW gas sensors: implications for the performance of an oscillator circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung, R.; McGill, R.A.; Matthews, P.
Year: 1997
Design and fabrication of a dual axial gyroscope with piezoelectric ceramics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyeok Ryoo; Youngjin Lee; Yongrae Roh
Year: 1997
Sweep linearization of a microwave FMCW Doppler sensor by an ultrasonic reference
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruser, H.; Magori, V.
Year: 1997
An all-diode-laser optical frequency reference using laser-trapped calcium
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oates, C.W.; Stephens, M.; Hollberg, L.
Year: 1997
Analysis of frequency biases and noise in sampled digital frequency servos for primary frequency standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, W.D.; Shirley, J.H.; Drullinger, R.E.
Year: 1997
3:1 optical frequency division by difference-frequency mixing in periodically poled lithium niobate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nee, P.; Wong, N.C.
Year: 1997
Generalisation of the Dick effect to continuous beam frequency standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makdissi, A.; de Clercq, E.; Audoin, C.; Clairon, A.
Year: 1997
Environmental sensitivities of cavity-tuned hydrogen masers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parker, T.E.; Gray, J.E.; Peppler, T.K.
Year: 1997
Hydrogen maser improvements and future applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peters, H.E.; Owings, H.B.
Year: 1997
Influence of the various factors on the passive hydrogen maser frequency instability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kozlov, S.A.; Logachev, V.A.
Year: 1997
Analysis of the frequency stability history of GPS Navstar clocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McCaskill, T.B.
Year: 1997
Delay variations in some GPS timing receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiss, M.; Zhang, V.; Nelson, L.; Hanns, V.; Lopez Regalado, M. G.
Year: 1997
Test results and analysis of a low cost core GPS receiver for time transfer applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bullock, J.B.; King, T.M.; Kennedy, H.L.; Berry, E.D.; Zanfino, G.
Year: 1997
Instability of differential time between GPS receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cermak, J.
Year: 1997
On-orbit performance of Milstar rubidium and quartz frequency standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhaskar, N.D.; Matt, A.D.; Russo, N.; McClelland, T.; Bloch, M.; Meirs, M.
Year: 1997
Traceability of frequency control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boulanger, J.-S.; Douglas, R.J.
Year: 1997
Micro-jump screening station for GPS user equipment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vittorini, L.D.
Year: 1997
First year results of the international comparison of UTC (CENAM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lopez-Romero, J.M.; Molina-Lopez, V.; Figueroa-Estrada, J.M.
Year: 1997
A microwave two-way time transfer experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liao, C.S.; Lin, H.T.; Cheng, T.Y.; Lin, S.Y.; Shi, J.L.
Year: 1997
Some new methods for precision time interval measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Zhou; Zongqiang Xuan; Jianguo Yu
Year: 1997
A frequency-drift estimator and its removal from modified Allan variance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Greenhall, C.A.
Year: 1997
Noise model for frequency translators and transposed-gain amplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia-Nava, J.F.; Ferre-Pikal, E.S.; Walls, F.L.
Year: 1997
Improving the short-term stability of laser pumped Rb clocks by reducing the effects of the interrogation oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deng, J.Q.; Mileti, G.; Jennings, D.A.; Drullinger, R.E.; Walls, F.L.
Year: 1997
1/f AM and PM noise in bipolar transistor amplifiers: sources, ways of influence, techniques of reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuleshov, V.N.; Boldyreva, T.I.
Year: 1997
Numerical model of phase bridge method used for measuring the phase modulation noise in quartz crystal resonator pair
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sthal, F.; Mourey, M.
Year: 1997
Incoherence and negative entropy in the quantum 1/f effect of BAW and SAW quartz resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Handel, P.H.
Year: 1997
Comparison of 1/f PM noise in commercial amplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aramburo, M.C.D.; Ferre-Pikal, E.S.; Walls, F.L.; Ascarrunz, H.D.
Year: 1997
Low PM noise regenerative dividers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferre-Pikal, E.S.; Walls, F.L.
Year: 1997
Suppressed carrier based PM and AM noise measurement techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walls, F.L.
Year: 1997
On the problem of oscillator phase-noise reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dvornikov, A.; Korobov, V.
Year: 1997
A phase noise model to improve the frequency stability of ultra stable oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mourey, M.; Galliou, S.; Besson, R.J.
Year: 1997
Advanced phase detection technique for the real time measurement and reduction of noise in components and oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McNeilage, C.; Searls, J.H.; Stockwell, P.R.; Ivanov, E.N.; Tobar, M.E.; Woode, R.A.
Year: 1997
A typical defect in the Bridgman-grown LBO crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shi-Ji Fan; Ren-Ying Sun; Jia-Yue Xu; Guang-Yu Zhang; Ya-Fang Lin
Year: 1997
Super high electromechanical coupling and zero-temperature coefficient surface acoustic wave substrates in KNbO/sub 3/ single crystal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamanouchi, K.; Odagawa, H.; Kojima, T.; Matsumura, T.
Year: 1997
Ultrasonic properties of PZT thin films in UHF-SHF ranges-prepared by sol gel method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamaguchi, M.; Hashimoto, K.; Nanjo, R.; Hanazawa, N.; Ttsutsumi, S.; Yonezawa, T.
Year: 1997
Study of analog type frequency-temperature characteristics measurement method for activity dips based on DLD jump
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koyama, M.; Uchida, T.
Year: 1997
Miniaturized high frequency fundamental MCF for IF filters in mobile radio systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishii, O.; Kanno, H.; Iwata, H.; Fujita, K.
Year: 1997
Sensitivity analysis of a thin film bulk acoustic resonator ladder filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olutade, B.L.; Hunt, W.D.
Year: 1997
Bulk acoustic wave mode shaping using a transversely graded electrode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malocha, D.C.
Year: 1997
A micromachined vibration isolation system for a 1 GHz STW resonator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reid, J.R.; Bright, V.M.; Kosinski, J.A.
Year: 1997
Groove gratings surface transverse wave resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniau, W.; Ballandras, S.; Briot, J.B.
Year: 1997
Further improvements of surface transverse wave resonator performance in the 2.0 to 2.5 GHz range
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avramov, I.D.; Ikata, O.; Matsuda, T.; Nishihara, T.; Satoh, Y.
Year: 1997
Surface acoustic wave characteristics on La/sub 3/Ga/sub 5/SiO/sub 14/ crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fedorets, V.N.; Kondratyev, Yu.P.; Mill, B.V.; Pankov, V.A.; Pisarevsky, Yu.V.; Timashev, V.V.
Year: 1997
Investigation of surface leaky longitudinal waves on lithium niobate substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongchuan Li; De Zhang
Year: 1997
Application of synchronous two port resonators for measurements of SAW parameters in piezoelectric crystals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soluch, W.
Year: 1997
Synthesis algorithm of broadband withdrawal weighted SAW transducers with specified amplitude and phase responses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bausk, E.V.; Yakovkin, I.B.
Year: 1997
SAW oscillator multi-chip module for 300 MHz low power radio
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, H.; Ieki, T.; Hirano, Y.; Ishikawa, Y.
Year: 1997
Precise measurement of SAW velocity using multisectional comb filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kolosovsky, E.A.; Tsarev, A.V.
Year: 1997
The dual harmonic interdigital transducers (DHIDT)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan Zhai; De Zhang
Year: 1997
The experimental and theoretical characterization of SAW modes on ST-X quartz with a zinc oxide film layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hickernell, F.S.; Adler, E.L.
Year: 1997
Design of a selectable performance front-end filter using acoustic surface waves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pastore, R.; Kosinski, J.A.; Porter, W.N.; Cui, H.L.
Year: 1997
Temperature coefficients of first and second orders of elastic stiffness evaluated from the SAW delay-temperature behavior on lithium tantalate plates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taziev, R.M.; Kozlov, A.S.; Vasiliev, I.L.; Yakovkin, I.B.
Year: 1997
A low-profile high-performance crystal oscillator for timekeeping applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karlquist, R.K.; Cutler, L.S.; Ingman, E.M.; Johnson, J.L.; Parisek, T.
Year: 1997
Low phase noise highly power efficient oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Everard, J.K.A.; Bitterling, J.
Year: 1997
A dual mode oscillator based on narrow-band crystal oscillators with resonator filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, Y.; Sekimoto, H.; Goka, S.; Niimi, I.
Year: 1997
An inductorless dual-mode crystal oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balaz, I.; Minarik, M.; Petrek, J.
Year: 1997
Miniature OCXO using DHR technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramzon, I.; Boroditsky, R.; Cocuzzi, D.A.
Year: 1997
A low cost microcontroller compensated crystal oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deno, S.; Hahnlen, C.; Landis, D.; Aurand, R.
Year: 1997
Nonlinear multifrequency model of piezoresonant oscillatory systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rudnev, O.E.
Year: 1997
Low drive level crystal oscillator circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsuzuki, Y.; Adachi, T.; Yokohara, H.
Year: 1997
A digitally temperature compensated compact PLL module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kobayashi, T.; Iwamoto, H.; Hara, T.
Year: 1997
Thermal effects in high performance frequency synthesizers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barillet, R.
Year: 1997
Tunable microwave oscillator for low phase noise applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ivanov, E.N.; Tobar, M.E.; Woode, R.A.
Year: 1997
Microwave oscillators incorporating high performance distributed Bragg reflector microwave resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Flory, C.A.; Ko, H.L.
Year: 1997
Phase locked DRO/CRO for space use
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hitch, B.; Holden, T.
Year: 1997
Temperature compensated high-Q dielectric resonators for long term stable low phase noise oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghosh, I.S.; Schemion, D.; Klein, N.
Year: 1997
Software simulation accurately predicts the microwave oscillator Q factors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Behagi, A.
Year: 1997
Plastic encapsulated integrated circuits application issues for severe environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DiFranza, M.J.
Year: 1997
Possum: an animator for the SUM specification language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hazel, D.; Strooper, P.; Traynor, O.
Year: 1997
A distributed constraint-based search architecture for bus timetabling and duty assignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hon Wai Chun
Year: 1997
Modular reasoning in Object-Z
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Griffiths, A.
Year: 1997
Mapping Ada source code into an abstract program space
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bailes, P.A.; Burnim, P.; Chapman, M.
Year: 1997
A reverse engineering method and experiences for industrial COBOL system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagaoka, I.; Sanou, K.; Ikeo, D.; Nagashima, T.; Akiba, S.; Tsuda, M.
Year: 1997
Legacy systems migration-a method and its tool-kit framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bing Wu; Lawless, D.; Bisbal, J.; Grimson, J.; Wade, V.; O'Sullivan, D.; Richardson, R.
Year: 1997
Cognitive deficiencies in software library design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Atkinson, S.
Year: 1997
Translating Object-Z specifications to object-oriented test oracles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McDonald, J.; Murray, L.; Strooper, P.
Year: 1997
Conceptual issues of an object-centered process model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsushita, M.; Oshita, M.; Iida, H.; Inoue, K.
Year: 1997
Tutorial: organizing, managing and optimizing software testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schaefer, H.
Year: 1997
The evolution of analog/digital interface in submicron IC's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erratico, P.
Year: 1997
LP/LV circuits in the deep submicron area
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Borel, J.
Year: 1997
A 2.5 V 50 MHz IF-sampling /spl Delta//spl Sigma/-modulator for digital cellular telephones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lansirinne, M.; Lindfors, S.; Koli, K.; Halonen, K.
Year: 1997
Quick design of high-performance /spl Sigma//spl Delta/ modulators using CAD tools: a 16.4 b 1.71 mW CMOS /spl Sigma//spl Delta/M for 9.6 ksample/s A/D conversion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Medeiro, F.; Perez-Verdu, B.; de la Rosa, J.M.; Rodriguez-Vazquez, A.
Year: 1997
1.1 V class AB output stage in standard 0.8 /spl mu/m CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fiocchi, C.; Gatti, U.
Year: 1997
IC microsensors-between system and technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haberli, A.; Mayer, F.; Jaeggi, D.; Baltes, H.
Year: 1997
A CMOS readout chip for pixel detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mariani, R.; Terreni, P.; Mazzoni, L.; Bottigli, U.; Romeo, N.
Year: 1997
A tunable perceptual microsystem for stereo depth estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruccoleri, F.; Sabatini, S.P.; Bisio, G.M.; Raffo, L.
Year: 1997
Dynamic translinear circuits-an overview
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mulder, J.; Serdijn, W.A.; van der Woerd, A.C.; van Roermund, A.H.M.
Year: 1997
A family of very low-power analog building blocks based on CMOS translinear loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fried, R.; Enz, C.
Year: 1997
A high-frequency CMOS current feedback op amp
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manetakis, K.; Toumazou, C.; Papavassiliou, C.
Year: 1997
A 21.4 MHz G/sub m/-C bandpass filter in 0.8 /spl mu/m digital CMOS with on-chip frequency and Q-factor tuning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chou, O.H.W.; Franca, J.E.; Vital, J.C.; Leme, C.A.; Martins, R.P.
Year: 1997
A fully-programmable analog log-domain filter circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hematy, A.; Roberts, G.W.
Year: 1997
Charger power switch for mobile phones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pulvirenti, F.; Milazzo, P.; Ursino, R.
Year: 1997
Single-chip system in super smart power technology for a servo-valve application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Natale, V.; Palazzi, M.; Ricotti, G.; Bardyn, J.J.; Chabbert, P.
Year: 1997
Advances in programmable pulse based mixed-signal processing VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Papathanasiou, K.; Hamilton, A.
Year: 1997
A mismatch-insensitive high-accuracy high-speed continuous-time current comparator in low voltage CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:del Rio-Fernandez, R.; Linan-Cembrano, G.; Dominguez-Castro, R.; Rodriguez-Vazquez, A.
Year: 1997
A one-transistor-synapse strategy for electrically-programmable massively-parallel analog array processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dominguez-Castro, R.; Espejo, S.; Rodriguez-Vazquez, A.; Carmona, R.
Year: 1997
Modeling and design of FETs in the temperature range from -50/spl deg/C to +120/spl deg/C oriented to low-power GaAs ICs CAD applying low-frequency design techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giorgio, A.; Perri, A.G.
Year: 1997
Intermittence detection in fretting corrosion studies of electrical contacts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murrell, S.R.; McCarthy, S.L.
Year: 1997
An examination of the metallic bonding of a clad material and two gold plating systems under constant force fretting conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aukland, N.; Hardee, H.; Wehr, A.; Brennan, S.; Lees, P.
Year: 1997
Recovery of severely degraded tin-lead plated connector contacts due to fretting corrosion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antler, M.; Aukland, N.; Hardee, H.; Wehr, A.
Year: 1997
The contact resistance of rolling silver coated copper contacts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rudolphi, A.K.; Jacobson, S.
Year: 1997
Evaluation of a twist-on connector for aluminum wire
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aronstein, J.
Year: 1997
A comparative assessment of different current-cycling procedures for testing power connections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Braunovic, M.; Dang, C.
Year: 1997
Back communication in low voltage interrupters: influence of recovery time, geometry and materials of contacts and walls
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gauster, E.; Rieder, W.
Year: 1997
Gold plated contacts: effect of thermal aging on contact resistance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antler, M.
Year: 1997
Thermal cycling induced wiping wear of connector contacts at 150/spl deg/C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leung, C.H.; Lee, A.
Year: 1997
Tin coating techniques for copper-base alloys-the effects on friction, wear and electric properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hammam, T.
Year: 1997
Self-assembled monolayers of alcanethiols on nickel surfaces for low level electrical contact applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noel, S.; Houze, F.; Boyer, L.; Mekhalif, Z.; Caudano, R.; Delhalle, J.
Year: 1997
Electrical and tribological properties of heat-treated polyacrylonitrile layers for contact application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guessab, S.; Houze, F.; Noel, S.; Boyer, L.; Viel, P.; Lecayon, G.
Year: 1997
Analysis of DC and AC arcs at break with spectrum analyser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davies, T.S.; Nouri, H.; Osman, Z.M.
Year: 1997
Breaking arc in several liquid environments with light-duty application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayakawa, T.; Sawa, K.
Year: 1997
A fault-tolerant embedded microcontroller testbed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rennels, D.A.; Caldwell, D.W.; Hwang, R.; Mesarina, M.
Year: 1997
Adaptive system-level diagnosis and its application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sying-Jyan Wang
Year: 1997
Fault coverage estimation model for partially testable multichip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang-Dauh Tseng; Kuochen Wang
Year: 1997
The use of neurons with higher functionality to enhance the fault tolerance of neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tohma, Y.; Iwata, T.
Year: 1997
Multi-paradigm programming in large control systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Jong, E.
Year: 1997
Specification of hybrid systems in cTLA+
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Herrmann, P.; Krumm, H.
Year: 1997
VERDICT-a tool for model-based verification of real-time logic process controllers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kowalewski, S.; Treseler, H.
Year: 1997
On the design of a dynamic distributed real-time environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Streich, H.; Gergeleit, M.
Year: 1997
Composing multiple-client-multiple-server synchronizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aksit, M.; Bergmans, L.
Year: 1997
Real-time multimedia data processing using VLIW hardware stack processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakamura, K.; Sakai, K.; Ae, T.
Year: 1997
Window theory of local image processing (IP): a framework for mapping local IP algorithms onto local IP systems under real time constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Theis, J.-P.
Year: 1997
Reliability investigation of ultrathin oxides grown by high pressure oxidation and nitrided in N/sub 2/O for ULSI device applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tae Moon Roh; Dae Woo Lee; Jongdae Kim; Kyu Ha Baek; Jin Gun Koo; Duk Dong Lee; Kee-Soo Nam
Year: 1997
Methodology for ULSI LOCOS isolation built-in reliability analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Loiko, K.V.; Peidous, I.V.; Hok-Min Ho; Quek, E.K.B.; Lim, D.H.Y.
Year: 1997
Infrared imaging and backside failure analysis techniques on multilayer CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, S.; Shinseki, B.; Barutha, C.; Ty Kha
Year: 1997
The infrared photoemission microscope as a tool for semiconductor device failure analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trigg, A.D.
Year: 1997
Functional failure analysis of logic LSIs from backside of the chip and its verification by logic simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishii, T.; Inoue, M.; Asatani, N.; Naitoh, K.; Mitsuhashi, J.
Year: 1997
Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao, J.M.; Chim, W.K.; Chan, D.S.H.; Phang, J.C.H.; Liu, Y.Y.
Year: 1997
Finite element analysis for solder ball failures in chip scale package
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taekoo Lee; Jinhyuk Lee; Ilgyu Jung
Year: 1997
Microstructural and compositional failure analysis of Cr-CrCu-Cu thin films for ball grid array (BGA) applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Na Zhang; McNicholas, M.; Colvin, N.
Year: 1997
Plasma cleaning for plastic ball grid array (PBGA): a study on surface cleanliness, wire bondability and adhesion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, C.; Tan Check-Eng, R.; Ong Wai-Lian, J.; Gopalakrishnan, R.; Nyunt, K.; Wong, A.
Year: 1997
Sample preparation for electron beam testing with reactive ion etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Numajiri, T.; Suzuki, S.; Omata, T.; Yoshida, N.; Tsujita, Y.
Year: 1997
Thermomechanical and electromigration studies with a high sensitive and high resolution laser probe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dilhaire, S.; Phan, T.; Schaub, E.; Claeys, W.
Year: 1997
Open fault detection method for CMOS-LSI by supplying pulsed voltage signal to VDD and GND lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sumitomo, H.; Nakamura, T.
Year: 1997
Combination of focused ion beam (FIB) and transmission electron microscopy (TEM) as sub-0.25 /spl mu/m defect characterization tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yih-Yuh Doong; Jui-Mei Fu; Yong-Fen Hsieh
Year: 1997
FIB precision TEM sample preparation using carbon replica
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng, T.T.; Goh, G.P.; Tung, C.H.; Wang, J.L.F.; Jeng Kou Cheng
Year: 1997
Charging identification and compensation in the scanning electron microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, W.K.; Thong, J.T.L.; Phang, J.C.H.
Year: 1997
New layout design for submicron CMOS output transistors to improve driving capability and ESD robustness in per unit layout area
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming-Dou Ker; Tung-Yang Chen; Chung-Yu Wu
Year: 1997
ESD effects on power supply clamps [CMOS ICs]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Teong-San Yeoh
Year: 1997
Channel hot carrier impact on the reliability performance of PMOS submicron transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kitagawa, I.; Baumann, R.; Takigasaki, I.; Maeda, K.; Ohashi, Y.; Kikuchi, Y.; Murata, S.
Year: 1997
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lou, C.L.; Qin, W.H.; Chim, W.K.; Chan, D.S.H.
Year: 1997
Direct BSIM3v3 parameter extraction for hot-carrier reliability simulation of N-channel LDD MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minehane, S.; Healy, S.; O'Sullivan, P.; McCarthy, K.; Mathewson, A.; Mason, B.
Year: 1997
Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lou, C.L.; Tan, C.B.; Chim, W.K.; Chan, D.S.H.
Year: 1997
Low-field time dependent dielectric breakdown characterization of very large area gate oxide [CMOS]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bahrami, M.; Fishbein, B.; Lindo, P.
Year: 1997
Signature analysis based IC diagnostics-a statistician's perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lakshminarayan, C.K.; Pabbisetty, S.; Chien-Pai Han
Year: 1997
Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jie, B.B.; Li, M.F.; Lou, C.L.; Lo, K.F.; Chim, W.K.; Chan, D.S.H.
Year: 1997
Analysis of GaAs HBT failure mechanisms: impact on life test strategy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maneux, C.; Labat, N.; Saysset, N.; Touboul, A.; Danto, Y.; Dumas, J.-M.; Launay, P.; Dangla, J.
Year: 1997
Investigation of failure mechanisms in power VDMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tosic, N.; Pesic, B.; Stojadinovic, N.
Year: 1997
EOS induced transistor shift in submicron DRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tan, W.; Goh Ko Kah; Corum, D.
Year: 1997
Dislocation multiplication inside contact holes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Fen Hsieh; Yang-Chu Hwang; Jui-Mei Fu; Yuan-Ching Peng; Lih-Juann Chen
Year: 1997
A new mechanism of leakage current in ultra-shallow junctions with TiSi/sub 2/ contacts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wai Shing Lau; Peng Wei Qian; Rong Zhao
Year: 1997
Effects of humidity and temperature cycling on 3-D packaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Evans, J.Y.; Evans, J.W.; Li, M.J.
Year: 1997
Identification of process defects using back side emission microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chun-Sheng Liu; Charng-E Peng; Chen-Chung Hsu
Year: 1997
Hot carrier induced emitter junction degradation of AlGaAs/GaAs HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung Kun Song; Duk Young Kim; Do Hyun Kim; Jae Hoon Choi
Year: 1997
Scanning acoustic microscope (SAM)-a measurement tool for plastic IC packages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagalingam, J.; Mohd-Yusoff, S.D.; Ramakrishnan, P.; Jaafar, R.; Francis, C.
Year: 1997
Latch-up at RAM control circuitry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chua Yong Chiang
Year: 1997
Contamination analyses of Al bond pads using FIB/SEM/EDX
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao, S.P.; Hua, Y.N.; Goh, G.P.; Guo, Z.R.; Chau, K.W.
Year: 1997
Failure analysis of noise characteristics in GaAs MESFETs with parametric modeling approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae Kyoung Mun; Haecheon Kim; Chung-Hwan Kim; Min-Gun Kim; Jae Jin Lee; Kwang-Eui Pyun
Year: 1997
A new method for the localisation of metallization defects using cathodoluminescence imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, X.; Phang, J.C.H.; Chan, D.S.H.; Chim, W.K.
Year: 1997
Cathodoluminescence evaluation of electrical stress condition of Si-SiO/sub 2/ structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, X.; Chan, D.S.H.; Phang, J.C.H.; Chim, W.K.
Year: 1997
Applications of atomic force microscopy for semiconductor device and package characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Natarajan, M.; Cui, C.Q.; Poener, D.P.; Radhakrishnan, M.K.
Year: 1997
Fast first-run silicon repair cases by laser chemical vapor deposition of copper from Cu(hfac)tmvs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Remes, J.; Moilanen, H.; Leppavuori, S.
Year: 1997
Transmission electron microscopy of high threshold voltage, high contact resistance, and high sheet resistance of MOS device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tan Tsu Sheng; Chih Hang Tung; Wang, J.L.F.
Year: 1997
Simulation In Research And Research In Simulation: A Telecommunications Perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Whitt, W.
Year: 1997
Inside Discrete-event Simulation Software: How It Works And Why It Matters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schriber, T.J.; Brunner, D.T.
Year: 1997
Modeling Dependencies In Stochastic Simulation Inputs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilson, J.R.
Year: 1997
An Introduction To Object-oriented Simulation In C++
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joines, J.A.; Roberts, S.D.
Year: 1997
The Ides Framework: A Case Study In Development Of A Parallel Discrete-event Simulation System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicol, D.M.; Johnson, M.M.; Yoshimura, A.S.
Year: 1997
Simulation Optimization: Methods And Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carson, Y.; Maria, A.
Year: 1997
An HCFG Model Of A Traffic Intersection Specified Using HiMASS-j
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daum, T.
Year: 1997
Efficient Simulation Of Multiclass Queueing Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henderson, S.G.; Meyn, S.P.
Year: 1997
Sensitivity Of Output Performance Measures To Input Distributions In Queueing Simulation Modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gross, D.; Juttijudata, M.
Year: 1997
Parallel Simulation Of TCP/IP using TeD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Premore, B.J.; Nicol, D.M.
Year: 1997
Modeling With Extend
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rivera, J.
Year: 1997
The Vissim/discrete Event Modeling Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schwetman, H.; Mulpur, A.
Year: 1997
Introduction To The Visual Simulation Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balci, O.; Bertelrud, A.I.; Esterbrook, C.M.; Nance, R.E.
Year: 1997
Experiences With Backward Simulation Based Approach For Lot Release Planning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jain, S.; Chan, S.
Year: 1997
A Simulation-based Controller For Distributed Discrete-event Systems With Application To Flexible Manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gonzalez, F.G.; Davis, W.J.
Year: 1997
Sea Based Logistics: Distribution Problems For Future Global Contingencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keebom Kang; Gue, K.R.
Year: 1997
Applications Of The Universal Joint Task List To Joint Exercise Results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parry, S.H.; McAneny, M.C.; Dromerhauser, R.J.
Year: 1997
Executing The DoD Modeling And Simulation Strategy Making Simulation Systems Of Systems A Reality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hollenbach, J.W.; Alexander, W.L.
Year: 1997
Continuous Simulation Of Air Base Assets (CSAA) "integrating Logistics Support Operations" A Proposed Methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parker, S.R.
Year: 1997
Automating The Metamodeling Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caughlin, D.
Year: 1997
On The Effect And Control Of Self-similar Network Traffic: A Simulation Perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kihong Park
Year: 1997
Fast And Physically-based Generation Of Self-similar Network Traffic With Applications To ATM Performance Evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erramilli, A.; Pruthi, P.; Willinger, W.
Year: 1997
Long-lasting Transient Conditions In Simulations With Heavy-tailed Workloads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crovella, M.E.; Lipsky, L.
Year: 1997
A Hybrid Tool For The Performance Evaluation Of Numa Architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Westall, J.; Geist, R.
Year: 1997
Why We Don't Know How To Simulate The Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paxson, V.; Floyd, S.
Year: 1997
Modeling A 10 Gbit/s/port Shared Memory ATM Switch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lazraq, T.; Andersson, P.; Brundin, J.; Arvidsson, A.
Year: 1997
Time-parallel Generation Of Self-similar ATM Traffic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nikolaidis, I.; Cooper, C.A.; Perumalla, K.S.
Year: 1997
Collision Awareness Multiple Access Networks Performance Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, P.T.R.; Yoon K. Hong
Year: 1997
A General Framework For Large Scale Systems Development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gollu, A.O.; Eskafi, F.H.
Year: 1997
Application Of Simulation Modeling To Emergency Population Evacuation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farahmand, K.
Year: 1997
SmartATMS : A Simulator For Air Traffic Management Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tak-Kuen John Koo; Yi Ma; Pappas, G.J.; Tomlin, C.
Year: 1997
Million Dollar Logistic Decisions Using Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carr, M.
Year: 1997
Using A Simulation Model To Evaluate The Configuration Of A Sortation Facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masel, D.; Goldsmith, D.
Year: 1997
Simulation-based Approach To The Warehouse Location Problem For A Large-scale Real Instance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hidaka, K.; Okano, H.
Year: 1997
Urban Traffic Simulation With Psycho-physical Vehicle-following Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schulze, T.; Fliess, T.
Year: 1997
Development And Application Of An Intermodal Mass Transit Simulation With Detailed Traffic Modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brill, J.C.; Whitney, D.E.
Year: 1997
The Importance Of Simulation Techniques In Its Research And Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clark, J.; Daigle, G.
Year: 1997
Towards A Web Based Simulation Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lorenz, P.; Dorwarth, H.; Ritter, K.-C.; Schriber, T.J.
Year: 1997
Modeling Compressed Full-motion Video
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Melamed, B.
Year: 1997
Activate This Classroom At Time Now
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rossetti, M.D.
Year: 1997
Cooperative Learning In Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Black Nembhard, H.
Year: 1997
Interactive Strategies For Developing Intuitive Knowledge As Basis For Simulation Modeling Education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Atolagbe, T.A.; Hlupic, V.; Taylor, S.J.E.; Paul, R.J.
Year: 1997
High speed, scalable, and accurate implementation of packet fair queueing algorithms in ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bennett, J.C.R.; Stephens, D.C.; Hui Zhang
Year: 1997
On multicasting ABR protocols for wireless ATM networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moh, W.M.
Year: 1997
Optimal feedback control for ABR service in ATM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narvaez, P.; Kai-Yeung Siu
Year: 1997
Group leader election under link-state routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yih Huang; McKinley, P.K.
Year: 1997
On the accuracy of admission control tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Knightly, E.W.
Year: 1997
Admission control and loss management for an application-level statistical service
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xie, G.G.; Lam, S.S.
Year: 1997
QoS based routing algorithm in integrated services packet networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pornavalai, C.; Chakraborty, G.; Shiratori, N.
Year: 1997
TCP behavior with many flows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Morris, R.
Year: 1997
Improved virtual queueing and dynamic EPD techniques for TCP over ATM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Wu; Kai-Yeung Siu; Wenge Ren
Year: 1997
Dynamic host routing for production use of developmental networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Touch, J.; Faber, T.
Year: 1997
Traffic dispersion and its impact on ATM protocol functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gustafsson, E.; Karlsson, G.
Year: 1997
Embedded test and measurement critical for deep submicron technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agarwal, V.K.
Year: 1997
On the adders with minimum tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kajihara, S.; Sasao, T.
Year: 1997
Test generation for stuck-on faults in BDD-based pass-transistor logic SPL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinogi, T.; Hayashi, T.; Taki, K.
Year: 1997
An algorithmic test generation method for crosstalk faults in synchronous sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Itazaki, N.; Matsumoto, Y.; Kinoshita, K.
Year: 1997
Design of C-testable multipliers based on the modified Booth Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boateng, K.O.; Takabashi, H.; Takamatsu, Y.
Year: 1997
Exploiting logic simulation to improve simulation-based sequential ATPG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corno, F.; Prinetto, P.; Rebaudengo, M.; Reorda, M.S.; Violante, M.
Year: 1997
Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pang, J.C.W.; Wong, M.W.T.; Lee, Y.S.
Year: 1997
Code-disjoint circuits for parity codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hartje, H.; Sogomonyan, E.S.; Gossel, M.
Year: 1997
Testability features of R10000 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mori, J.; Mathew, B.; Burns, D.; Mok, Y.-H.
Year: 1997
Application of a design for delay testability approach to high speed logic LSIs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatayama, K.; Ikeda, M.; Takakura, M.; Uchiyama, S.; Sakamoto, Y.
Year: 1997
An effective fault simulation method for core based LSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshida, T.; Shimoda, R.; Mizokawa, T.; Hirayama, K.
Year: 1997
Integrated and automated design-for-testability implementation for cell-based ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ono, T.; Wakui, K.; Hikima, H.; Nakamura, Y.; Yoshida, M.
Year: 1997
On energy efficiency of VLSI testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng-Wen Wu
Year: 1997
Computing stress tests for interconnect defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dabholkar, V.; Chakravarty, S.
Year: 1997
Analysis of the feasibility of dynamic thermal testing in digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Altet, J.; Rubio, A.; Tamamoto, H.
Year: 1997
A test processor chip implementing multiple seed, multiple polynomial linear feedback shift register
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Darus, Z.M.; Ahmed, I.; Ali, L.
Year: 1997
Automatic EB fault tracing system by successive circuit extraction from VLSI CAD layout data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miura, K.; Nakata, K.; Nakamae, K.; Fujioka, H.
Year: 1997
An approach to diagnose logical faults in partially observable sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yamazaki, K.; Yamada, T.
Year: 1997
Guided-probe diagnosis of macro-cell-designed LSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuji, N.
Year: 1997
A perturbation based fault modeling and simulation for mixed-signal circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ben-Hamida, N.; Saab, K.; Marche, D.; Kaminska, B.
Year: 1997
Analog signal metrology for mixed signal ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chauchin Su; Yi-Ren Cheng; Yue-Tsang Chen; Shing Tenchen
Year: 1997
A new auto-focus method in critical dimension measurement SEM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Komatsu, F.; Motaki, H.; Miyoshi, M.
Year: 1997
Novel optical probing system for quarter-/spl mu/m VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ozaki, K.; Sekiguchi, H.; Wakana, S.; Goto, Y.; Umehara, Y.; Matsumoto, J.
Year: 1997
A variable reordering method for fast optimization of binary decision diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moon-Bae Song; Hoon Chang
Year: 1997
Testing for the programming circuit of LUT-based FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michinishi, H.; Yokohira, T.; Okamoto, T.; Inoue, T.; Fujiwara, H.
Year: 1997
A XOR-tree based technique for constant testability of configurable FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, W.K.; Zhang, M.Y.; Meyer, F.J.; Lombardi, F.
Year: 1997
Test pattern and test configuration generation methodology for the logic of RAM-based FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renovell, M.; Portal, J.M.; Figueras, J.; Zorian, Y.
Year: 1997
On the complexity of universal fault diagnosis for look-up table FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inoue, T.; Miyazaki, S.; Fujiwara, H.
Year: 1997
Fault diagnosis for static CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen Xiaoqing; Tamamoto, H.; Saluja, K.K.; Kinoshita, K.
Year: 1997
Fault diagnosis of odd-even sorting networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih Wei Hu; Chung Len Lee; Wen Ching Wu; Chen, J.E.
Year: 1997
On the capability of delay tests to detect bridges and opens
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakravarty, S.
Year: 1997
A method of generating tests for marginal delays and delay faults in combinational circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takahashi, H.; Matsunaga, T.; Boateng, K.O.; Takamatsu, Y.
Year: 1997
Memory efficient ATPG for path delay faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wangning Long; Zhongchen Li; Shiyuan Yang; Yinghua Min
Year: 1997
Design of delay-verifiable combinational logic by adding extra inputs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoming Yu; Yinghua Min
Year: 1997
On chip weighted random patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savir, J.
Year: 1997
Random pattern testable design with partial circuit duplication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yokoyama, H.; Xiaoqing Wen; Tamatoto, H.
Year: 1997
Accelerated test points selection method for scan-based BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nakao, M.; Hatayama, K.; Higashi, I.
Year: 1997
Power supply current monitoring techniques for testing PLLs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dalmia, M.; Ivanov, A.; Tabatabaei, S.
Year: 1997
Supply current test for unit-to-unit variations of electrical characteristics in gates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hashizume, M.; Kuchii, T.; Tamesada, T.
Year: 1997
I/sub DDT/ testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yinghua Min; Zhuxing Zhao; Zhongcheng Li
Year: 1997
Built-in self-test for multi-port RAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuejian Wu; Gupta, S.
Year: 1997
An extended march test algorithm for embedded memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gang-Min Park; Hoon Chang
Year: 1997
Low cost BIST for EDAC circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Badura, D.; Hlawiczka, A.
Year: 1997
The AVIS project: a mixed communication/interactive/broadcast teleconferencing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avaro, O.; Lemordant, J.
Year: 1997
Empirical delay comparisons of push and pull implementation models for local audio video streams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doo-Hyun Kim; Sang-Hwan Kung; Chee-Hang Park
Year: 1997
Routing with QoS constraints in integrated services networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pornavalai, C.; Chakraborty, G.; Shiratori, N.
Year: 1997
Earliest due first scheduling for application-level QoS delivery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antoniou, Z.; Stavrakakis, I.
Year: 1997
Multimedia-multiparty service support in ATM wide area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moreno, J.I.; Azcorra, A.; Larrabeiti, D.; de Miguel, T.; Alvarez-Campana, M.
Year: 1997
Quality of service management for audio and video on demand services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hesselbach, X.; Sallent, S.; Fernandez, C.
Year: 1997
Advanced facilities for remote performance and QoS analysis of communication applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miloucheva, I.; Hetzer, D.; Bonness, O.; Hofmann, U.
Year: 1997
A multimedia group communication protocol for flexible interactions: DooRaeTxP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seok Soo Kim; Gil Chel Park; Dae Joon Hwang; Young Ho Suh
Year: 1997
Real-time queueing network theory
Publisher: IEEE Computer Society
Authors:J.P. Lehoczky
Year: 1997
Scalable hardware earliest-deadline-first scheduler for ATM switching networks
Publisher: IEEE Computer Society
Authors:Byung Kook Kim; K.G. Shin
Year: 1997
Integrated delay analysis of regulated ATM switch
Publisher: IEEE Computer Society
Authors:Joseph Kee-Yin Ng; Shibin Song; Wei Zhao
Year: 1997
Exploiting skips in periodic tasks for enhancing aperiodic responsiveness
Publisher: IEEE Computer Society
Authors:M. Caccamo; G. Buttazzo
Year: 1997
A polynomial time algorithm for reconfiguring the 1 1/2 track-switch model with PE and bus faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horita, T.; Takanami, I.
Year: 1997
Optimal realization of hypercubes by three-dimensional space-invariant optical interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tago, S.; Ueno, S.
Year: 1997
A pipelined TDM optical bus with improved performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zheng, S.Q.; Yueming Li
Year: 1997
A scalable cache coherent architecture for large-scale mesh-connected multiprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunseok Rhee; Joonwon Lee
Year: 1997
An NC parallel algorithm for generalized vertex-rankings of partial k-trees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kashem, M.A.; Xiao Zhou; Nishizeki, T.
Year: 1997
A new shortest path routing algorithm and embedding cycles of crossed cube
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chien-Ping Chang; Ting-Yi Sung; Lih-Hsing Hsu
Year: 1997
Fiber-ribbon pipeline ring network for high-performance distributed computing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonsson, M.; Svensson, B.; Taveniku, M.; Ahlander, A.
Year: 1997
On the shuffle-exchange permutation network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bass, D.W.; Sudborough, I.H.
Year: 1997
On the power of the mesh with hybrid buses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biing-Feng Wang; Olariu, S.
Year: 1997
Parallel approaches for discovering functional dependencies from data for information system design recovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wie Ming Lim; Harrison, J.
Year: 1997
An adaptive processor allocation strategy for mesh-connected systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyung-Hee Seo; Sung-Chun Kim
Year: 1997
Design and evaluation of a submesh allocation scheme for two-dimensional mesh-connected parallel computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, J.M.
Year: 1997
Efficient parallel multiselection on hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Shen
Year: 1997
Effects of chromosome migration on a parallel and distributed genetic algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsumura, T.; Nakamura, M.; Miyazato, D.; Onaga, K.; Okech, J.
Year: 1997
Modular design of a large sorting network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, N.K.
Year: 1997
A fair congestion control scheme for LAN interconnection via ATM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming-Hsing Chiu; Bassiouni, M.
Year: 1997
An efficient class of SEC-DED-AUED codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhattacharryya, D.K.; Nandi, S.
Year: 1997
Fast nearest neighbor algorithms on a linear array with a reconfigurable pipelined bus system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Pan; Keqin Li; Si-Qing Zheng
Year: 1997
A tampering protocol for reducing the coherence transactions in regular computation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takesue, M.
Year: 1997
Reliable broadcasting and secure distributing in channel networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feng Bao; Funyu, Y.; Hamada, Y.; Igarashi, Y.
Year: 1997
Bit-parallel selfrouting optoelectronic switching fabrics for massively parallel wide-format data processing: principle and optical architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fyodorov, V.B.
Year: 1997
Device and technology challenges for 0.1 /spl mu/m CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wong, S.S.
Year: 1997
Plasma doping for ultra-shallow junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung Chan; Shu Qin
Year: 1997
n/sup +//p ultra-shallow junction formation with plasma immersion ion implantation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, B.L.; Jones, E.C.; Cheung, N.W.; Jiqun Shao; Wong, H.; Cheng, Y.C.
Year: 1997
Tilt angle effect on optimizing HALO PMOS and NMOS performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiong-Guang Su; Chi-Tsung Huang; Shyh-Chyi Wong; Chang-Ching Cheng; Chih-Chiang Wang; Shiang Huang-Lu; Bing-Yui Tsui
Year: 1997
Comparison of latchup immunity for silicided source/drain at different n+ implant energy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leong Kam Chew; Liu Po Chen; Gan Chock Hing; Qian Gang; Lee Yong Meng; Lap Chan
Year: 1997
A dynamic substrate bias inverter for low voltage applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lo, C.K.; Chan, C.H.
Year: 1997
PNP bipolar structure design for low voltage 0.6 /spl mu/m complementary BiCMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belaroussi, M.T.; Djezzar, B.; Mekhaldi, S.
Year: 1997


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