Disjunctive strictness analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jensen, T.P.
Year: 1992
Horn programming in linear logic is NP-complete
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanovich, M.I.
Year: 1992
New foundations for the geometry of interaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramsky, S.; Jagadeesan, R.
Year: 1992
Graphical user interface system for automatic 3-D medical image analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sundaramoorthy, G.; Higgins, W.E.; Hoford, J.; Hoffman, E.A.
Year: 1992
Texture classification and segmentation using simultaneous autoregressive random model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mengyang Liao; Jiamei Qin; Yanni Tan
Year: 1992
An image computing system for the estimation and reconstruction of diffuse volume of an anti-cancer drug in liver tumours
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ip, H.H.S.; Lam, S.W.C.; Arnold, M.M.; Kreel, L.
Year: 1992
Integrated computerized database and radiographic image analysis system for total knee and hip replacement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lodha, S.; Reuben, J.
Year: 1992
A three dimensional guidance system for frameless stereotactic neurosurgery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hemler, P.F.; Koumrian, T.; Adler, J.; Guthrie, B.
Year: 1992
Disparity analysis and its application to three-dimensional reconstruction of medical images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao, W.; Chang, J.Y.; Smith, D.M.; Ginsberg, M.D.
Year: 1992
Extracting 3-D structure and focused images using an optical microscope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shah, U.B.; Nayar, S.K.
Year: 1992
Statistically optimal interslice value interpolation in 3D medical imaging: theory and implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Parrott, R.W.; Stytz, M.R.; Amburn, P.; Robinson, D.
Year: 1992
Simulated annealing and iterated conditional modes with selective and confidence enhanced update schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hu, Y.; Dennis, T.J.
Year: 1992
Motion estimation using mean field annealing applied to MRI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajala, S.A.; Abdelqader, I.M.; Bilbro, G.L.; Snyder, W.E.
Year: 1992
Medical image sequence interpolation via hierarchical pel-recursive motion estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pearlman, W.A.; Abdel-Malek, A.
Year: 1992
Analyzing information content of MR images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tavakoli, N.
Year: 1992
Morphological skeletonization for medical image compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pai, T.-W.; Hansen, J.H.L.
Year: 1992
Medical workstation for the management of the transplantation unit of a hospital
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blanco, C.; Cuervas-Mons, V.; Munoz, A.; Duenas, A.; Gonzalez, M.A.; Salvador, C.H.
Year: 1992
Rectification of distortion in MRI for stereotaxy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong, S.; Fitzpatrick, J.M.; Maciunas, R.J.
Year: 1992
Pixel based reconstruction (PBR) techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peddanarappagari, K.V.; Fager, R.S.
Year: 1992
Multimedia perspectives for next generation PAC systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franchi, S.; Imperato, M.; Prampolini, F.
Year: 1992
Design and implementation of a clinical MSI workstation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanders, J.A.; Orrison, W.W.
Year: 1992
A comparison of swallowing in three subjects using an interactive image processing system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Potratz, J.R.; Dengel, G.; Robbins, J.
Year: 1992
The extraction of the best SGLD texture features in the ultrasound B-scan images of cancered stomach coats
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mengyang Liao; Xinliang Li; Jiamei Qin; Sixian Wang
Year: 1992
A temporal evolutionary object-oriented data model for medical image management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chu, W.W.; Ieong, I.T.; Taira, R.K.; Breant, C.M.
Year: 1992
An approach to verifying concurrent systems-a medical information bus (MIB) case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Curran, P.; Norrie, K.
Year: 1992
A comprehensive abstraction tool for the out-patient setting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rozewski, C.M.; Yahnke, D.; Hart, A.
Year: 1992
Data modeling and design of a patient data management system in an intensive care unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saab, E.; Fumai, N.; Petroni, M.; Roger, K.; Collet, C.; Malowany, A.S.; Carnevale, F.A.; Gottesman, R.D.
Year: 1992
Design and realization of high speed single exposure dual energy image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bentum, M.J.; Arendsen, R.G.J.; Slump, C.H.; Mistretta, C.A.; Peppler, W.W.; Zink, F.E.
Year: 1992
A methodology for the validation of image segmentation methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Graaf, C.N.; Koster, A.S.E.; Vincken, K.L.; Viergever, M.A.
Year: 1992
Physiologic factor analysis (PFA) and parametric imaging of dynamic PET images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Geckle, W.J.; Szabo, Z.
Year: 1992
Extracting spinal cord contours from transaxial MR images using computer vision techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stockett, M.H.; Soroka, B.I.
Year: 1992
Knowledge-based system for medical image compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nooman, M.; Mohamed, A.S.A.; Rasmy, M.E.
Year: 1992
Automated corneal endothelial cell analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nadachi, R.; Nunokawa, K.
Year: 1992
Digital signal processor-based feature extraction vocoder for the deaf
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miskiel, E.; Ozdamar, O.; Oller, D.K.; Eilers, R.
Year: 1992
Local motion identification and correction schemes for ultrafast CT flow studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolfkiel, C.J.
Year: 1992
Quantitative assessment of mitral regurgitation by automated contrast 2D echocardiography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang, S.; Marques de Sa, J.P.; Guerreiro, M.; Abreu-Lima, C.
Year: 1992
Unique determination of shape and area of coronary arterial cross-section from biplane angiograms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kayikcioglu, T.; Mitra, S.
Year: 1992
Adaptive pulse rate scheduling for reduced dose X-ray cardiac interventional fluoroscopic procedures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abdel-Malek, A.; Bloomer, J.; Yassa, F.
Year: 1992
Development of fuzzy neural tool for medical signal processing and imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gan, W.S.
Year: 1992
Feature extraction from ECG for classification by artificial neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pretorius, L.C.; Nel, C.
Year: 1992
Application of artificial neural networks (ANNs) to complex oscillations in the human pupil light reflex
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas, M.M.
Year: 1992
Sequential test generation based on real-valued logic simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatayama, K.; Hikone, K.; Ikeda, M.; Hayashi, T.
Year: 1992
An instruction sequence assembling methodology for testing microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.; Patel, J.H.
Year: 1992
High-performance CMOS-based VLSI testers: timing control and compensation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chapman, J.
Year: 1992
Design verification of a high density computer using IEEE 1149.1
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniel, W.T.
Year: 1992
IEEE: 1141.1 applied to mixed TTL-ECL and differentlal logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrews, J.
Year: 1992
Impact Of Boundary-Scan Design On Delay Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vida-Torku, E.K.
Year: 1992
IS IEEE 1149.1 BOUNDARY SCAN COST EFFECTIVE: A SIMPLE CASE STUDY
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caldwell, B.; Langford, T.
Year: 1992
Self-test scheduling with bounded test execution time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stroele, A.P.
Year: 1992
Can concurrent checkers help BIST?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gupta, S.K.; Pradhan, D.K.
Year: 1992
I/sub DDQ/ TESTING IN CMOS DIGITAL ASIC'S - PUTTING IT ALL TOGETHER
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Perry, R.
Year: 1992
An Evaluation of I/sub DDQ/ Versus Conventional Testing for CMOS Sea-of-Gate IC's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sawada, K.; Kayano, S.
Year: 1992
Sequential circuit diagnosis based on formal verification techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cabodi, G.; Camurati, P.; Corno, F.; Prinetto, P.; Reorda, M.S.
Year: 1992
A boundary scan test controller for hierarchical BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matos, J.S.; Pinto, F.S.; Ferreira, J.M.M.
Year: 1992
Boundary scan testing for multichip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hilla, S.C.
Year: 1992
Macro Testability; The Results of Production Device Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bouwman, F.; Oostdijk, S.; Stans, R.; Bennetts, B.; Beenker, F.
Year: 1992
CCD IMAGE SENSOR TEST USING CELLULAR AUTOMATON-TYPE PATTERN RECOGNITION SYSTEM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kato, H.
Year: 1992
MCM TEST USING AVAILABLE TECHNOLOGY
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keezer, D.C.
Year: 1992
DOES OBJECT-ORIENTED PROGRAMMING FIT IN THE REAL WORLD OF ATE?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Levy, R.S.
Year: 1992
Parity-Scan Design to Reduce the Cost of Test Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujiwara, H.; Yamamoto, A.
Year: 1992
Optimal Seguencing of Scan Registers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narayanan, S.; Njinda, C.; Breuer, M.
Year: 1992
A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sungju Park; Akers, S.B.
Year: 1992
TEST GENERATION AND CONCURIPENT ERROR DETECTION IN CURRENT-MODE A/D CONVERTERS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krishnan, S.; Sahli, S.; Chin-Long Wey
Year: 1992
AC Dynamic Testing of 20bit Sigma-Delta Over-Sampling D/A Converter On a Mixed Signal Test System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugai, M.; Nakatani, T.
Year: 1992
Memory interconnection test at board level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:deJong, F.; deLindvanWijngaarden, A.J.
Year: 1992
Interconnect and delay testing with a 4800-pin board tester
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kameyama, S.; Ohara, H.; Endo, C.; Takayama, N.
Year: 1992
VECTOR (virtual edge connector test): A stratecy to increase TPS fault coverage without adding test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pantano, G.; Rolince, D.
Year: 1992
On the design of self-checking boundary scannable boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lubaszewski, M.; Courtois, B.
Year: 1992
An ATPG driver selection algorithm for interconnect test with boundary scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Cheng Her; Lin-Ming Jin; El-Ziq, Y.
Year: 1992
Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Melton, M.; Brglez, F.
Year: 1992
A STEADY-STATE RESPONSE TEST GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alani, A.F.; Musgrave, G.; Ambler, A.P.
Year: 1992
HIGH PERFORMANCE MONOLITHIC VERNIERS FOR VLSI AUTOMATIC TEST EQUIPMENT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Necoechea, R.W.
Year: 1992
Timing-Per-Pin Flexibility At Shared-Resource Cost
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fehr, G.
Year: 1992
TGEN: Flexible Timing Generator Architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alton, T.
Year: 1992
EDIF TEST - THE UPGOMING STANDARD FOR TEST DATA TRANSFERS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pyron, C.; Wahl, M.G.
Year: 1992
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Favalli, M.; Dalpasso, M.; Olivo, P.; Ricco, B.
Year: 1992
Parametric Bridging Fault Characterieation for the Fault Simulation of Library-Based ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dalpasso, M.; Favalli, M.; Olivo, P.; Ricco, B.
Year: 1992
BIST Techniques for ASIC Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McLeod, G.R.
Year: 1992
ScanBist A Multi-frequency Scan-Based BIST Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nadeau-Dostie, B.; Burek, D.; Hassan, A.S.M.
Year: 1992
A fast testing method for sequential circuits at the state transition level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Lun Wang; Jhing-Fa Wang; Lee, K.
Year: 1992
A SUITE OF NOVEL DIGITAL ATE TIMING CALIBRATION METHODS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thaler, H.; Holt, L.
Year: 1992
Calibration techniques for a gigahertz test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keezer, D.C.; Wenzel, R.J.
Year: 1992
HIGH PERFORMANCE PIN ELECTRONICS WITH GaAs, A CONTRADICTION IN TERMS?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schoettmer, U.; Engelhard, H.
Year: 1992
SYSTEM PERSPECTWE ON DIAGNOSTIC TESTING
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simpson, W.R.; Sheppard, J.W.
Year: 1992
Is burn-in burned-out - Part 2
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Donlin, N.E.
Year: 1992
SOFTMTARE TESTING: OPPORTUNITY AND NIGHTMARE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mayrhauser, A.V.
Year: 1992
A mixed signal analog test bus framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hulse, R.
Year: 1992
A STRUCTURE FOR BOARD-LEVEL MIXED-SIGNAL TESTABILITY
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilkins, B.R.
Year: 1992
Amdahl Corporation Board Delay Test System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oomman, B.G.; Kongara, P.; Mallipeddi, C.
Year: 1992
Delay Test: The Next Frontier for LSSD Test Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konemann, B.; Barlow, J.; Chang, P.; Iyengar, V.; Rosen, B.; Williams, T.; Gabrielson, R.; Goertz, C.; Keller, B.; McCauley, K.; Tischer, J.
Year: 1992
Robustsless Enhancement And Detection Threshold Reduction In ATPG For Gate Delay Faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiwei Mao; Giletti, M.D.
Year: 1992
LSSD COMPATIBLE AND CONCURRENTLY TESTABLE RAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maeno, H.; Nii, K.; Sakayanagi, S.; Kato, S.
Year: 1992
A Self-Testing and Self-Repairing Structure for Ultra-Large Capacity Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, T.; Sunada, G.
Year: 1992
Testable Designs of Sequential Circuits under Highly Observable Condition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen Xiaoqing; Kinoshita, K.
Year: 1992
High Quality Testing of Embedded RAMs Using Circular Self-Test Path
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krasniewski, A.; Pilarski, S.
Year: 1992
Testing a DSP-Based Mixed-Signal Telecommunicatians Chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Astrachan, P.; Brooks, T.; Everett, J.; Wai-on Law; McIntyre, K.; Nguyen, C.; Weng, C.
Year: 1992
Functional Testing of Current Microprocessors (applied to the Intel i860)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:vandeGoor, A.J.; Verhallen, T.J.W.
Year: 1992
Skewed-Load Transition Test: Part I, Calculus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savir, J.
Year: 1992
Skewed-Load Transition Test: Part II, Coverage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Patil, S.; Savir, J.
Year: 1992
Transition fault simulation for sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwang-Ting Cheng
Year: 1992
HIST: A METHODOLOGY FOR THE AUTOMATIC INSERTION OF A HIERARCHICAL SELF TEST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haberl, O.F.; Kropf, T.
Year: 1992
ACCORD : Automatic Catching and Correction of Logic Design Errors in Combinational Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pi-Yu Chung; Hajj, I.N.
Year: 1992
Design for Testability Using Architectural Descriptions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chickermane, V.; Lee, J.; Patel, J.H.
Year: 1992
All Tests for a Fault are Not Eyually Valuable for Defect Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kapur, R.; Jaehong Park; Mercer, M.R.
Year: 1992
Detection of undetectable faults using IDDQ testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gulati, R.K.; Weiwei Mao; Goel, D.K.
Year: 1992
A method of jitter measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosenfeld, E.
Year: 1992
IN-PROCESS INSPECTION TECHNIQUE FOR ACTIVE-MATRIX LCD PANELS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kido, T.
Year: 1992
Testing Video Processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kelley, P.
Year: 1992
One-pass redundancy identification and removal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramovici, M.; Iyer, M.A.
Year: 1992
Recursive Learning: An attractive alternative to the decision tree for test generation in digital ci
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kunz, W.; Pradhan, D.K.
Year: 1992
A Test Generation Methodology for High-Performance Computer Chips and Modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Konemann, B.; Noto, P.
Year: 1992
An automated optical on-wafer probing system for ultra-high-speed ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinagawa, M.; Nagatsuma, T.
Year: 1992
DRC-BASED SELECTION OF OPTIMAL PROBING POINTS FOR CMIP-INTERNAL MEASUREMENTS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scharf, R.; Kuntzsch, C.; Helmreich, K.; Wolz, W.; Muller-Glaser, K.D.
Year: 1992
Improving Total IC Design Quality using Application Mode Testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mehtani, R.; deJonghe, M.; Morren, R.; Baker, K.
Year: 1992
CIRCUIT DESIGN FOR BUILT-IN CURRENT TESTING
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miura, Y.; Kinoshita, K.
Year: 1992
Non-conventional faults in BiCMOS digital circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siyad C. Ma; McCluskey, E.J.
Year: 1992
Bridging defects resistance measurements in a CMOS process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rodriguez-Montanes, R.; Bruis, E.M.J.G.; Figueras, J.
Year: 1992
GMOS Checkers with Testable Bridging and Transistor Stuck-on Faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Metra, C.; Favalli, M.; Olivo, P.; Ricco, B.
Year: 1992
An integrated built-in self-testing and self-repair of VLSI/WSI hexagonal arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mazumder, P.
Year: 1992
An Architecture for a Reconfigurable IEEE 1149.n Master Controller Board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kornegay, K.T.; Brodersen, R.W.
Year: 1992
IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruce, W.C.; Gallup, M.G.; Giles, G.; Munns, T.
Year: 1992
Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glaser, U.; Hubner, U.; Vierhaus, H.T.
Year: 1992
A system response time model for local area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schneidewind, N.F.
Year: 1992
Two classes of effective heuristics for time value functions based scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muhlethaler, P.; Chen, K.
Year: 1992
Delay analysis of a slotted ring medium access protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sintonen, L.
Year: 1992
An architecture for multimedia data stream handling and its implication for multimedia transport service interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Herrtwich, R.G.
Year: 1992
A framework for software development for distributed parallel computing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yau, S.S.; Bae, D.-H.; Chidambaram, M.
Year: 1992
IN and TMN-key concepts for future telecom networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Magedanz, T.
Year: 1992
A demand driven access protocol for high speed networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schaffa, F.; Willebeek-LeMair, M.; Patel, B.; Gerla, M.
Year: 1992
Group orientation: a paradigm for distributed systems of the nineties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Verissimo, P.; Rodrigues, L.
Year: 1992
Distributed system specification using CO-OPN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buchs, D.; Guelfi, N.
Year: 1992
Memory bank conflict on some vector supercomputers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujino, S.
Year: 1992
Parallel-form adaptive state-space filtering and its implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Steenaart, W.; Zhang, J.Y.
Year: 1992
Parallel architecture for a pel-recursive motion estimation algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frimout, E.D.; Driessen, J.N.; Deprettere, E.F.
Year: 1992
The quotient SVD and directional aspects of 2 transfer matrices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David, J.; De Moor, B.
Year: 1992
High-performance MCMs for mainframe computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seinecke, S.
Year: 1992
Simulation of IC- and MCM-interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grabinski, H.
Year: 1992
Micro electronic packaging technologies: status and trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:zur Nieden, T.
Year: 1992
Simulation methods and technologies for multichip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reichl, H.; Fotheringham, G.
Year: 1992
Test quality improvement by physical testability enhancement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Casimiro, A.P.; Sousa, J.J.T.; Goncalves, F.M.; Teixeira, J.P.
Year: 1992
Neural clustering algorithms for classification and pre-placement of VLSI cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raffo, L.; Caviglia, D.D.; Bisio, G.M.
Year: 1992
The CADEC VLSI design support methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kwee-Christoph, E.; Eschermann, B.; Haberl, O.; Kumar, R.; Kunzmann, A.
Year: 1992
The specification of synchronised actions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Bunje, A.; Bril, R.J.
Year: 1992
Security in mobile and cordless telecommunications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walker, M.
Year: 1992
Models, implementations and design options for inter-domain policy routing protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, B.
Year: 1992
Evaluation of fuzzy and neural vehicle control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nijhuis, J.; Neusser, S.; Spaanenburg, L.; Heller, J.; Sponnemann, J.
Year: 1992
Learning by observation and active experimentation in a knowledge based CAD-environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milzner, K.; Leifhelm, B.
Year: 1992
A model for polygon similarity estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cakmakov, D.; Arnautovski, V.; Davcev, D.
Year: 1992
A systolic neural network image processing architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cavaiuolo, M.; Yakovleff, A.J.S.; Watson, C.R.; Kershaw, J.A.
Year: 1992
Location dependency in the token ring of an integrated services/multi-LANs environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, V.; Chan, E.; Ng, J.M.
Year: 1992
IC cards for payment system applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heyns, G.
Year: 1992
TOMSPIN-a tool for modeling with stochastic Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Klas, G.; Lepold, R.
Year: 1992
Flow control in packet-switched multistage interconnection networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pombortsis, A.; Vlahavas, I.
Year: 1992
Optical bridges for fiber optic local area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamdi, M.
Year: 1992
A method for hardware software partitioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barros, E.; Rosenstiel, W.
Year: 1992
Partitioning and scheduling of asynchronous pipelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yau-Hwang Kuo; Shaw-Pyng Lo
Year: 1992
A frontal computation scheme for the Schur algorithm to efficiently solve large boundary-element problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Genderen, A.J.; van der Meijs, N.P.
Year: 1992
On using Eureka properties for transforming generate and test logic programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bsaies, K.
Year: 1992
A unifying approach to the modelling of object association based on a common property
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bakker, J.A.
Year: 1992
A taskgraph clustering algorithm based on an attraction metric between tasks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Opsommer, J.
Year: 1992
Verification strategy of the CATHEDRAL-I silicon compiler based on the SFG-tracing methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Proesmans, F.; Claesen, L.; Genoe, M.; Verlind, E.
Year: 1992
Correctness preserving transformations on the Hough algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Samsom, J.G.; Claesen, L.J.M.; De Man, H.J.
Year: 1992
Built-in current testing versus delay fault testing-a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hubner, U.; Vierhaus, H.T.
Year: 1992
Time-optimal sorting and applications on n*n enhanced meshes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olariu, S.; Schwing, J.L.; Zhang, J.
Year: 1992
Design and proof of multipliers by correctness-preserving transformation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kloos, C.D.; Dosch, W.; Moller, B.
Year: 1992
Hierarchical concepts in the design of processor arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arzt, U.; Teich, J.; Schumacher, M.; Thiele, L.
Year: 1992
Cluster partitioning in image analysis classification: a genetic algorithm approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alippi, C.; Cucchiara, R.
Year: 1992
Modeling time-constrained multiple-access message transmission by generalized stochastic Petri nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan, C.; Hommel, G.
Year: 1992
Temporal analysis of lambda sigma activity systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kortright, E.V.
Year: 1992
A linear approximation method for optimum calculation in image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao Chen; Hong Chen
Year: 1992
The Automatic Element Routine Generator: an automatic programming tool for functional simulator design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuang, C.-I.; Szygenda, S.A.; Baker, J.D.
Year: 1992
Potential performance of parallel conservative simulation of VLSI circuits and systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rawling, M.; Francis, R.; Abramson, D.
Year: 1992
En route to more efficient conservative parallel event simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meng-Lin Yu
Year: 1992
Scripting highly autonomous simulation behavior using case-based reasoning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Catsimpoolas, N.; Marti, J.
Year: 1992
ANNIE: a simulated neural network for empirical studies and application prototyping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huxhold, W.L.; Henson, T.F.; Bowman, J.D.
Year: 1992
Routing algorithms on a mesh-connected computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gu, Q.P.; Gu, J.
Year: 1992
Combining switches for the NYU Ultracomputer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dickey, S.R.; Kenner, R.
Year: 1992
An asymptotically optimal parallel bin-packing algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coleman, N.S.; Wang, P.Y.
Year: 1992
Massively parallel solution of quantum transport problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balasingam, P.; Roychowdhury, V.P.
Year: 1992
Out of core dense solvers on Intel parallel supercomputers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scott, D.S.
Year: 1992
An overview of the nCUBE 3 supercomputer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duzett, B.; Buck, R.
Year: 1992
Reconfigurable mesh algorithms for summing up binary values and its applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, Y.-C.; Cheng, W.-T.
Year: 1992
A large scale comparison of option pricing models with historical market data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mills, K.; Vinson, M.; Cheng, G.
Year: 1992
A modulo merge sorting network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liszka, K.J.; Batcher, K.E.
Year: 1992
Improving massively data parallel system performance with heterogeneity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noh, S.H.; Dussa-Zieger, K.
Year: 1992
A CPU utilization limit for massively parallel MIMD computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bridges, T.; Kitchel, S.W.; Wehrmeister, R.M.
Year: 1992
The concurrent execution of non-communicating programs on SIMD processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilsey, P.A.; Hensgen, D.A.; Abu-Ghazaleh, N.B.; Slusher, C.E.; Hollinden, D.Y.
Year: 1992
Embedding multilevel structures into massively parallel hypercubes-connection machine results for computer vision algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ziavras, S.G.
Year: 1992
Performance studies of packet switched augmented shuffle exchange networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramachandran, V.; Raines, R.A.; Park, J.S.; Davis, N.J., IV
Year: 1992
The MetaMP approach to parallel programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Otto, S.W.; Wolfe, M.
Year: 1992
Quantitative studies of processing element granularity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marek, T.C.; Davis, E.W.
Year: 1992
Input/output for fine grain multiprocessor systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, S.-Y.
Year: 1992
Architecture independent analysis of sorting and list ranking on the hierarchical PRAM model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heywood, T.; Ranka, S.
Year: 1992
A parallel software package for solving linear systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Scarbnick, C.D.; Chang, M.C.; Schultz, M.H.; Sherman, A.B.
Year: 1992
Hues in control? (massively parallel computers)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schaefer, D.H.; Portee, R.
Year: 1992
Information hiding in parallel programs: model and experimental evaluation on the Connection Machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen, I.-L.; Bastani, F.B.; Al-Marzooq, T.
Year: 1992
ALFA: a static data flow architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Verdoscia, L.; Vaccaro, R.
Year: 1992
Traffic analysis of hypercubes and banyan-hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bellaachia, A.; Youssef, A.
Year: 1992
A fast algorithm for computing histograms on a reconfigurable mesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jang, J.; Park, H.; Prasanna, V.K.
Year: 1992
Data-parallel visualisation using multi-dimensional transformations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vezina, G.; Robertson, P.K.
Year: 1992
A hyper-pyramid network topology for image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dujardin, E.; Akil, M.
Year: 1992
Distance between images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gualtieri, J.A.; Le Moigne, J.; Packer, C.V.
Year: 1992
Complete exchange on a circuit switched mesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bokhari, S.H.; Berryman, H.
Year: 1992
Preliminary experience in developing a parallel thin-layer Navier Stokes code and implications for parallel language design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olander, D.; Schnabel, R.B.
Year: 1992
Programming an astrophysics application in an object-oriented parallel language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, S.X.; Lee, J.K.; Narayana, S.P.; Gannon, D.
Year: 1992
A global synchronization algorithm for the Intel iPSC/860
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seidel, S.R.; Davis, M.A.
Year: 1992
A runtime data mapping scheme for irregular problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ponnusamy, R.; Saltz, J.; Das, R.
Year: 1992
An expressive annotation model for generating SPMD programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paalvast, E.M.; Breebaart, L.C.; Sips, H.J.
Year: 1992
Applications of FORALL-formed computations in large scale stochastic dynamic programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hanson, F.B.; Jarvis, D.J.; Xu, H.H.
Year: 1992
Visual-aural representations of performance for a scalable application program
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Francioni, J.M.; Rover, D.T.
Year: 1992
A methodology for visualizing performance of loosely synchronous programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarukkai, S.R.; Kimelman, D.; Rudolph, L.
Year: 1992
Unsteady flow simulation using an MIMD computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palaniswamy, S.; Chakravarthy, S.R.
Year: 1992
The Multicomputer Toolbox approach to concurrent BLAS and LACS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Falgout, R.D.; Skjellum, A.; Smith, S.G.; Still, C.H.
Year: 1992
Abstractions for parallel N-body simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhatt, S.; Chen, M.; Lin, C.-Y.; Liu, P.
Year: 1992
Image algebra: an object oriented approach to transparently concurrent image processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angus, I.G.
Year: 1992
Scalability of data transport
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jordan, H.F.
Year: 1992
Synthesis of VHDL arrays on RAM cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berthet, C.; Rampon, J.; Sponga, L.
Year: 1992
VHDL analog extensions: process, issues, and status
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cottrell, R.; Nolan, K.; Brown, M.
Year: 1992
Temporal verification of behavioral descriptions in VHDL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boussebha, D.; Giambiasi, N.; Magnier, J.
Year: 1992
Synchronous design in VHDL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Debreil, A.; Oddo, P.
Year: 1992
Design of complex systems with a VHDL based methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amadori, S.; Coerezza, P.
Year: 1992
Random current testing for CMOS logic circuits by monitoring a dynamic power supply current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tamamoto, H.; Yokoyama, H.; Narita, Y.
Year: 1992
Locating logic design errors via test generation and don't-care propagation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuo, S.-Y.
Year: 1992
On modeling integrated design environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hubel, C.; Ruland, D.; Siepmann, E.
Year: 1992
Linear time fault simulation algorithm using a content addressable memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishiura, N.; Yajima, S.
Year: 1992
Fast fault simulation in combinational circuits: an efficient data structure, dynamic dominators and refined check-up
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Becker, B.; Hahn, R.; Krieger, R.
Year: 1992
SPADES: a simulator for path delay faults in sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pomeranz, I.; Reddy, L.N.; Reddy, S.M.
Year: 1992
A dynamic scheduling algorithm for the simulation of MOS and bipolar circuits using waveform relaxation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rissiek, W.; John, W.
Year: 1992
An exact analytic technique for simulating uniform RC lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roychowdhury, J.S.; Newton, A.R.; Pederson, D.O.
Year: 1992
SYNTEST: an environment for system-level design for test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harmanani, H.; Papachristou, C.; Chiu, S.; Nourani, M.
Year: 1992
Harmonic scheduling of linear recurrences for digital filter design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, H.; Dutt, N.; Nicolau, A.
Year: 1992
A time optimal robust path-delay-fault self-testable adder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Becker, B.; Drechsler, R.
Year: 1992
A performance driven generator for efficient testable conditional-sum-adders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Becker, B.; Molitor, P.
Year: 1992
Topology optimization techniques for power/ground networks in VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erhard, K.-H.; Johannes, F.M.; Dachauer, R.
Year: 1992
Crossing distribution (circuit layout CAD)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, D.C.; Shung, C.B.
Year: 1992
An optimal channel pin assignment with multiple intervals for building block layout
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Koide, T.; Wakabayashi, S.; Yoshida, N.
Year: 1992
Automatic module allocation in high level synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gutberlet, P.; Muller, J.; Kramer, H.; Rosenstiel, W.
Year: 1992
Automatic partitioning for deterministic test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crestani, D.; Aguila, A.; Gentil, M.K.; Chardon, P.; Durante, C.
Year: 1992
MILEF: an efficient approach to mixed level automatic test pattern generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glaser, U.; Vierhaus, H.T.
Year: 1992
Cross-fertilizing FSM verification techniques and sequential diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cabodi, G.; Camurati, P.; Corno, F.; Prinetto, P.; Sonza Reorda, M.
Year: 1992
A distributed routing system for multilayer SOG
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shimamoto, T.; Hane, H.; Shirakawa, I.; Tsukiyama, S.; Shinoda, S.; Yui, N.; Nishiguchi, N.
Year: 1992
A fast multilayer general area router for MCM designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khoo, K.-Y.; Cong, J.
Year: 1992
Routing algorithms for multi-chip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lienig, J.; Thulasiraman, K.; Swamy, M.N.S.
Year: 1992
Minimal area merger of finite state machine controllers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mukherjee, D.; Pedram, M.; Breuer, M.
Year: 1992
ROM-based finite state machines with PLA address modifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luba, T.; Gorski, K.; Wronski, L.B.
Year: 1992
Efficient constrained encoding for VLSI sequential logic synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shi, C.-J.; Brzozowski, J.A.
Year: 1992
A multilevel testability assistant for VLSI design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bombana, M.; Buonanno, G.; Cavalloro, P.; Sciuto, D.; Zaza, G.
Year: 1992
Tackling cost optimization in testable design by forward inferencing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kraak, M.; Otten, R.H.J.M.
Year: 1992
Towards a requirements definition, specification and system design environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muller-Glaser, K.D.; Bortolazzi, J.; Tanurhan, Y.
Year: 1992
A new approach to the decomposition of incompletely specified multi-output functions based on graph coloring and local transformations and its application to FPGA mapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wan, W.; Perkowski, M.A.
Year: 1992
Maximal reduction of lookup-table based FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, K.C.; Cong, J.
Year: 1992
Chip assembly in the PLAYOUT VLSI design system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glasmacher, K.; Zimmermann, G.
Year: 1992
Embedded pin assignment for top down system design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pfortner, T.; Kiefl, S.; Dachauer, R.
Year: 1992
Application-specific microelectronics for mechatronic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Windirsch, P.; Herpel, H.-J.; Laudenbach, A.; Glesner, M.
Year: 1992
High-level synthesis in a rapid-prototype environment for mechatronic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wehn, N.; Herpel, H.-J.; Hollstein, T.; Poechmueller, P.; Glesner, M.
Year: 1992
Calculation of the Rademacher-Walsh spectrum from a reduced representation of Boolean functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Falkowski, B.J.; Schafer, I.; Perkowski, M.A.
Year: 1992
Boolean matching in logic synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savoj, H.; Silva, M.J.; Brayton, R.K.; Sangiovanni-Vincentelli, A.
Year: 1992
P.Size: a sizing aid for optimized designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Azemard, N.; Bonzom, V.; Auvergne, D.
Year: 1992
PERFLEX: a performance driven module generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, S.; Owens, R.M.; Irwin, M.J.
Year: 1992
An efficient methodology for symbolic compaction of analog ICs with multiple symmetry constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Felt, E.; Charbon, E.; Malavasi, E.; Sangiovanni-Vincentelli, A.
Year: 1992
Delay macromodels for the timing analysis of GaAs DCFL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kayssi, A.I.; Sakallah, K.A.
Year: 1992
DynaTAPP: dynamic timing analysis with partial path activation in sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, P.; Agrawal, V.D.; Seth, S.C.
Year: 1992
The exact solution of timing verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bolender, E.; Lipp, H.M.
Year: 1992
Performance-driven interconnection optimization for microarchitecture synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiang, Y.-M.; Lee, T.-F.; Kwang, T.-T.; Lin, Y.-L.
Year: 1992
An integer programming approach to instruction implementation method selection problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Imai, M.; Alomary, A.; Sato, J.; Hikichi, N.
Year: 1992
Verification of digital circuits based on formal semantics of a hardware description language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mutz, M.
Year: 1992
State machine abstraction from circuit layouts using BDDs: applications in verification and synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kam, T.; Subrahmanyam, P.A.
Year: 1992
Combined topological and functionality based delay estimation using at layout-driven approach for high level applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramachandran, C.; Kurdahi, F.J.
Year: 1992
System clock estimation based on clock slack minimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Narayan, S.; Gajski, D.D.
Year: 1992
A genetic algorithm for macro cell placement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Esbensen, H.
Year: 1992
Communication based logic partitioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beardslee, M.; Lin, B.; Sangiovanni-Vincentilli, A.
Year: 1992
Automatic import of custom designs into a cell-based environment using switch-level analysis and circuit simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stewart, R.; Anjubault, V.
Year: 1992
DESB, a functional abstractor for CMOS VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laurentin, M.; Greiner, A.; Marbot, R.
Year: 1992
Design of delay insensitive circuits using multi-ring structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sparso, J.; Staunstrup, J.; Dantzer-Sorensen, M.
Year: 1992
Asynchronous state machine synthesis using data driven clocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aghdasi, F.
Year: 1992
Design assistance for CAD frameworks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lopez, J.C.; Jacome, M.F.; Director, S.W.
Year: 1992
Unifying tool, data and process flow management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rumsey, M.; Farquhar, C.
Year: 1992
Finite state machine verification on MIMD machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar, N.; Vemuri, R.
Year: 1992
Cellular scan test generation for sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gloster, C., Jr.; Brglez, F.
Year: 1992
A quantitative measure of robustness for delay fault testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mao, W.; Ciletti, M.D.
Year: 1992
JESSI common framework design management-the means to configuration and execution of the design process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liebisch, D.C.; Jain, A.
Year: 1992
GOSSIP-a generic system for statistical circuit design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Opalski, L.J.; Styblinski, M.A.
Year: 1992
A generic software system for drift reliability optimization of VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, M.; Styblinski, M.A.
Year: 1992
Design technology research for the nineties: more of the same?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:De Man, H.
Year: 1992
Challenges for CAD in computer development in the 1990s
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dedie, G.
Year: 1992
Electronic systems design-tools and methodology to meet the productivity change
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Davies, R.
Year: 1992
Compiling VHDL into a high-level synthesis design representation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eles, P.; Kuchcinski, K.; Peng, Z.; Minea, M.
Year: 1992
Experiences and issues in VHDL-based synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lim, S.E.; Hendry, D.C.; Yeung, P.F.
Year: 1992
VHDL for high speed desktop video ICs-experience with replacement of other simulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacobsen, M.; Nebel, W.
Year: 1992
A distributed algorithm for parameterized semaphore operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nelakonda, M.; Mizuno, M.; Neilsen, M.L.
Year: 1992
A distributed kernel for virtual time driven applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ingels, P.; Maziero, C.; Raynal, M.
Year: 1992
On the complexity of maintaining fault-tolerant distributed systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heinz, A.P.
Year: 1992
A switching architecture for congestion control in high-speed networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hac, A.
Year: 1992
A heterogeneous distributed database system based on extended relational model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung, S.M.; Elghayesh, K.A.
Year: 1992
A self-guided theorem proving system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shie-Jue Lee
Year: 1992
The relevance density method in information retrieval
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kane-Esrig, Y.; Streeter, L.; Casella, G.; Keese, W.
Year: 1992
A client-server based architecture for communication between expert systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Djossou, C.
Year: 1992
Construct an object-oriented constraint logic for explanation based learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoyou Zhou
Year: 1992
Application of expert system to the evaluation of project alternatives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wawrzynkiewicz, B.M.
Year: 1992
Performance evaluation of multicast wormhole routing in 2D-torus multicomputers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, C.S.; Tsai, Y.M.; Liu, C.Y.
Year: 1992
K-selection in hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berthome, P.
Year: 1992
Conflict-free routing on hypercubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiyong Liu; Jia-Huai You; Xiaobo Li
Year: 1992
Sub-logarithmic algorithms for the largest empty rectangle problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olariu, S.; Shen, W.; Wilson, L.
Year: 1992
Efficient construction of catastrophic patterns for VLSI reconfigurable arrays with bidirectional links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nayak, A.; Pagli, L.; Santoro, N.
Year: 1992
Generating all maximal independent sets on trees in lexicographic order
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, Y.H.; Wang, J.S.; Lee, R.C.T.
Year: 1992
Domain compression of incompletely specified Boolean functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Griffin, D.D.; Schmitt, E.
Year: 1992
Certified timing verification and the transition delay of a logic circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Devadas, S.; Keutzer, K.; Malik, S.; Wang, A.
Year: 1992
The role of long and short paths in circuit performance optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng, S.W.; Chen, H.-C.; Du, D.H.C.; Lim, A.
Year: 1992
Iterative and adaptive slack allocation for performance-driven layout and FPGA routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frankle, J.
Year: 1992
Power and ground network topology optimization for cell based VLSIs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mitsuhashi, T.; Kuh, E.S.
Year: 1992
Zero skew clock net routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chao, T.-H.; Hsu, Y.-C.; Ho, J.-M.
Year: 1992
Application-driven design automation for microprocessor design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pyo, I.; Su, C.-L.; Huang, I.-J.; Pan, K.-R.; Koh, Y.; Tsui, C.-Y.; Chen, H.-T.; Cheng, G.; Liu, S.; Wu, S.; Despain, A.M.
Year: 1992
Design process management for CAD frameworks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacome, M.F.; Director, S.W.
Year: 1992
A near optimal algorithm for technology mapping minimizing area under delay constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chaudhary, K.; Pedram, M.
Year: 1992
LATTIS: an iterative speedup heuristic for mapped logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fishburn, J.P.
Year: 1992
BDDMAP: a technology mapper based on a new covering algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kung, D.S.; Damiano, R.F.; Nix, T.A.; Geiger, D.J.
Year: 1992
On the circuit implementation problem (combinatorial logic circuits)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, W.; Lim, A.; Agrawal, P.; Sahni, S.
Year: 1992
IPDA: interconnect performance design assistant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Change, N.H.; Chang, K.-J.; Leo, J.; Lee, K.; Oh, S.-Y.
Year: 1992
Tools to aid in wiring rule generation for high speed interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franzon, P.; Simovich, S.; Steer, M.; Basel, M.; Mehrotra, S.; Mills, T.
Year: 1992
Challenges and advances in electrical interconnect analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruehli, A.E.; Heeb, H.
Year: 1992
Test-set preserving logic transformations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Batek, M.J.; Hayes, J.P.
Year: 1992
Coalgebraic division for multilevel logic synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Jun Hsu; Wen-Zen Shen
Year: 1992
HLSIM-a new hierarchical logic simulator and netlist converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zein, D.A.; Engel, O.P.; Ditlow, G.
Year: 1992
Performance evaluation of an event-driven logic simulation machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hirose, F.
Year: 1992
Zero delay versus positive delay in an incremental switch-level simulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jones, L.G.
Year: 1992
Two new techniques for compiled multi-delay logic simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, Y.S.; Maurer, P.M.
Year: 1992
Validating discrete event simulations using event pattern mappings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gennart, B.A.; Luckham, D.C.
Year: 1992
An approach to symbolic timing verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amon, T.; Boriello, G.
Year: 1992
On the temporal equivalence of sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shenoy, N.V.; Singh, K.J.; Brayton, R.K.; Sangiovanni-Vincentelli, A.L.
Year: 1992
Computing optimal clock schedules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Szymanski, T.G.
Year: 1992
Analyzing cycle stealing on synchronous circuits with level-sensitive latches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, I.; Ludwig, J.A.; Eng, K.
Year: 1992
An improved synthesis algorithm for multiplexor-based PGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murgai, R.; Brayton, R.K.; Sangiovanni-Vincentelli, A.
Year: 1992
Characterization of Boolean functions for rapid matching in EPGA technology mapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schlichtmann, U.; Brglez, F.; Hermann, M.
Year: 1992
Area and delay mapping for table-look-up based field programmable gate arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sawkar, P.; Thomas, D.
Year: 1992
TEMPT: technology mapping for the exploration of FPGA architectures with hard-wired connections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chung, K.; Rose, J.
Year: 1992
On the distribution of fault coverage and test length in random testing of combinational circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Majumdar, A.; Sastry, S.
Year: 1992
A new hierarchical layout compactor using simplified graph models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wonjong Kim; Joohack Lee; Hyunchul Shin
Year: 1992
Process independent constraint graph compaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boyer, D.G.
Year: 1992
An interpreter for general netlist design rule checking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pelz, G.
Year: 1992
Hcompare: a hierarchical netlist comparison program
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Batra, P.; Cooke, D.
Year: 1992
ISIS: a system for performance driven resource sharing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gregory, B.; MacMillen, D.; Fogg, D.
Year: 1992
Automatic test knowledge extraction from VHDL (ATKET)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vishakantaiah, P.; Abraham, J.; Abadir, M.
Year: 1992
Multipole-accelerated 3-D capacitance extraction algorithms for structures with conformal dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nabors, K.; White, J.
Year: 1992
An integrated approach to realistic worst-case design optimization of MOS analog circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dharchoudhury, A.; Kang, S.M.
Year: 1992
A mixed-integer nonlinear programming approach to analog circuit synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maulik, P.C.; Carley, L.R.; Rutenbar, R.A.
Year: 1992
Plane parallel A* maze router and its application to FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palczewski, M.
Year: 1992
An efficient routing algorithm for SOG cell generation on a dense gate-isolated layout style
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okuda, R.; Oguri, S.
Year: 1992
Transformation-based high-level synthesis of fault-tolerant ASICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karri, R.; Orailoglu, A.
Year: 1992
The automatic generation of bus-interface models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leong, Y.-H.; Birmingham, W.P.
Year: 1992
Functional approaches to generating orderings for efficient symbolic representations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mercer, M.R.; Kapur, R.; Ross, D.E.
Year: 1992
Exact calculation of synchronization sequences based on binary decision diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pixley, C.; Jeong, S.-W.; Hachtel, G.D.
Year: 1992
A new model for improving symbolic product machine traversal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cabodi, G.; Camurati, P.; Corno, F.; Gai, S.; Prinetto, P.; Sonza Reorda, M.
Year: 1992
Edge-valued binary decision for multi-level hierarchical verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lai, Y.-T.; Sastry, S.
Year: 1992
A pin permutation algorithm for improving over-the-cell channel routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hou, C.Y.; Chen, C.Y.R.
Year: 1992
A new efficient approach to multilayer channel routing problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Chuan Fang; Wu-Shiung Feng; Shian-Lang Lee
Year: 1992
State assignment using input/output functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pomeranz, I.; Cheng, K.-T.
Year: 1992
Finite state machine synthesis with fault tolerant test function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakradhar, S.T.; Kanjilal, S.; Agrawal, V.D.
Year: 1992
Recurrence equations and the optimization of synchronous logic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Damiani, M.; De Micheli, G.
Year: 1992
A methodology to reduce the computational cost of behavioral test pattern generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Santucci, J.-F.; Dray, G.; Giambiasi, N.; Boumedine, M.
Year: 1992
Hierarchical test generation under intensive global functional constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.; Patel, J.H.
Year: 1992
Estimation of average switching activity in combinational and sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghosh, A.; Devadas, S.; Keutzer, K.; White, J.
Year: 1992
Partitioning by regularity extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rao, D.S.; Kurdahi, F.J.
Year: 1992
Specification partitioning for system design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vahid, F.; Gajski, D.D.
Year: 1992
AWEsymbolic: compiled analysis of linear(ized) circuits using asymptotic waveform evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.Y.; Rohrer, R.A.
Year: 1992
On the stability of moment-matching approximations in asymptotic waveform evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anastasakis, D.F.; Gopal, N.; Kim, S.Y.; Pillage, L.T.
Year: 1992
Generalized moment-matching methods for transient analysis of interconnect networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chiprout, E.; Nakhla, M.
Year: 1992
At-speed delay testing of synchronous sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pomeranz, I.; Reddy, S.M.
Year: 1992
Equivalence of robust delay-fault and single stuck-fault test generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saldanha, A.; Brayton, R.K.; Sangiovanni-Vincentelli, A.L.
Year: 1992
Delay fault models and test generation for random logic sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakraborty, T.J.; Agrawal, V.D.; Bushnell, M.L.
Year: 1992
Delay fault test generation for scan/hold circuits using Boolean expressions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhattacharya, D.; Agrawal, P.; Agrawal, V.D.
Year: 1992
Fuzzy logic approach to placement problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, R.-B.; Shragowitz, E.
Year: 1992
A performance driven macro-cell placement algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gao, T.; Vaidya, P.M.; Liu, C.L.
Year: 1992
APT: an area-performance-testability driven placement algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, S.; Banerjee, P.; Chickermane, V.; Patel, J.H.
Year: 1992
An engineering environment for hardware/software co-simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Becker, D.; Singh, R.K.; Tell, S.G.
Year: 1992
Optimal scheduling and allocation of embedded VLSI chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gebotys, C.H.
Year: 1992
A boundary-element approach to transient simulation of three-dimensional integrated circuit interconnect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ling, D.D.; Kim, S.; White, J.
Year: 1992
AWESpice: a general tool for the accurate and efficient simulation of interconnect problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raghavan, V.; Bracken, J.E.; Rohrer, R.A.
Year: 1992
Transient simulation of lossy interconnect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, S.; Kuh, E.S.
Year: 1992
Simulating lossy interconnect with high frequency nonidealities in linear time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roychowdhury, J.S.; Newton, A.R.; Pederson, D.O.
Year: 1992
Canonical embedding of rectangular duals with applications to VLSI floorplanning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sur-Kolay, S.; Bhattacharya, B.B.
Year: 1992
A wire length estimation technique utilizing neighborhood density equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamada, T.; Cheng, C.-K.; Chau, P.M.
Year: 1992
Performance-driven system partitioning on multi-chip modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shih, M.; Kuh, E.S.; Tsay, R.-S.
Year: 1992
Net partitions yield better module partitions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cong, J.; Hagen, L.; Kahng, A.
Year: 1992
FPGA design principles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hill, D.D.; Detjens, E.
Year: 1992
Symbolic prime generation for multiple-valued functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, B.; Coudert, O.; Madre, J.C.
Year: 1992
Fast exact and quasi-minimal minimization of highly testable fixed-polarity AND/XOR canonical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarabi, A.; Perkowski, M.A.
Year: 1992
SWiTEST: a switch level test generation system for CMOS combinational circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, K.J.; Njinda, C.A.; Breuer, M.A.
Year: 1992
FREEZE: a new approach for testing sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abramovici, M.; Rajan, K.B.; Miller, D.T.
Year: 1992
On the over-specification problem in sequential ATPG algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng, K.-T.; Ma, H.-K.T.
Year: 1992
Parallel waveform relaxation of circuits with global feedback loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Johnson, T.A.; Ruehli, A.E.
Year: 1992
Incremental circuit simulation using waveform relaxation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ju, Y.-C.; Saleh, R.A.
Year: 1992
Production Worthiness of a GaAs Wafer FAB as Demonstrated Through Automated RF Probe Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anthony Lum
Year: 1992
Measurement Set-Up for High-Frequency Characterization of Planar Contact Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Degraeuwe, Peter; Martens, Luc; de Zutter, Daniel
Year: 1992
MMIC Reflection Coefficient Synthesizer For On-Wafer Noise Parameter Extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dydyk, Michael
Year: 1992
Measurement Accuracies for Various Techniques for Measuring Amplifier Noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wait, D. F.
Year: 1992
S-Parameter, I-V Curve and Noise Figure Measurements of III-V Devices at Cryogenic Temperatures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilker, Charles; Pang, Philip S.W.; Carter, Charles F.; Shen, Zhi-Yuan
Year: 1992
Local Oscillator Noise Affects Noise Figure Measurement Accuracy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yates, S.
Year: 1992
VNA S11 Uncertainty Measurement a Comparison of Three Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oldfield, Bill
Year: 1992
GaAs MMIC Probe Measurements and Calibration Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Penn, John; Moore, Craig
Year: 1992
ARFTG Membership List as of September 1992
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1992
Planar Resistors for Probe Station Calibration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walker, D.K.; Williams, D.F.; Morgan, J. M.
Year: 1992
Modeling Simulation and Design of Dissipative Dispersive Uniform and Nonuniform Multiconductor Interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tripathi, Vijai K.; Orhanovic, Neven
Year: 1992
Accurate Modelling of MHMIC Passive Elements Yields a Successful Design and Packaging of a 20 GHz to 5 GHZ MHMIC Low-Noise Downconverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fikart, J.L.; Fairbum, M.; Minkus, E.; Kwan, Francis
Year: 1992
T/R Modules for Automated Assembly and Test Using Flip Chip and LTCC Packaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David K. Sakamoto
Year: 1992
A Frequency Domain Analysis of Multi-Conductor Transmission Line Interconnect Topologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahal-Arabi, Tawfik; Suarez-Gartner, Ricardo; Lape, Kristine M.
Year: 1992
Using Microwave Coupled Resonator Filters to Characterize Thick Film Interconnects for Highfrequency Signal Propagation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grzybowski, Richard R.; Jensen, Donald B.; Gilden, Meyer; Bacher, Rudolph J.
Year: 1992
Time Domain Measurements, Characterization and Modeling of Interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong, J. M.; Hayden, L. A.; Tripathi, V.K.
Year: 1992
Frequency and Time Domain Characterization of High-Speed Digital Circuit Interconnects in a Multilayer Printed Circuit Board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, Amit P.
Year: 1992
Save The "Thru" in the A.N.A. Calibration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ferrero, A.; Pisani, U.; Sanpietro, F.
Year: 1992
Characterizing Blind Mate Connectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oldfield, Bill
Year: 1992
An Efficient Temperature-Dependent S-Parameter Calibration Routine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martin, Julian R.; Dunleavy, Lawrence P.; Fernandez, Allen S.
Year: 1992
"Extracting the Required Reflection to Compensate the Sealed Connector of a Microstrip Fixture"
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stinehelfer, Harold E.
Year: 1992
ARFT Mailing and Membership List as of 02/12/93
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1992
Security for object-oriented database systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Millen, J.K.; Lunt, T.F.
Year: 1992
A logical approach to multilevel security of probabilistic systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gray, J.W., III; Syverson, P.F.
Year: 1992
The influence of delay upon an idealized channel's bandwidth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moskowitz, I.S.; Miller, A.R.
Year: 1992
A process model for software process management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hazeyama, A.; Komiya, S.
Year: 1992
A software engineering environment for modeling and developing knowledge-intensive systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruno, G.; Macario, G.; Grammatica, A.
Year: 1992
Operational construction of integrity constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berztiss, A.T.
Year: 1992
ProTest: a knowledge analysis tool for the development of expert systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watson, I.; Norman, M.
Year: 1992
Supporting multiple domains in a single reuse repository
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eichmann, D.
Year: 1992
Modularity for logical knowledge bases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antoniou, G.
Year: 1992
Microwave Heating for VLSI Processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buchta, R.; Boling, G.; Sellberg, F.; Sigurd, D.
Year: 1992
22 GHZ Band Downconverters for DBS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Howson, C.D.; Guo, C.; Haquet, G.; Fujimoto, M.
Year: 1992
Pseudomorphic HJ-FET Applications for the 38GHz-Band Transmitter and Receiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaneko, Tomoya; Furuyama, Eiki; Sei, Hisasuke; Wada, Kenzo; Mizumura, Motoo; Shiga, Naomi; Mizoe, Jun; Kokubun, Shuuichi; Nemoto, Kouji
Year: 1992
A 2 GHz Quadrature Mixer Realized as One-Sided MIC on FR-4 Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dekker, A P; Pollanen, 0 K A
Year: 1992
RF Investigations on HEMT's at Cryogenic Temperatures Down to 20 K using an On-Wafer Microwave Measurement Setup
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meschede, H.; Albers, J.; Reuter, R.; Kraus, J.; Peters, D.; Brockerhoff, W.; Tegude, F. J.
Year: 1992
Direct Extraction of All Four Transistor Noise Parameters from a Single Noise Figure Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P J. Tasker; W. Reinert; J. Braunstein; M. Schlechtweg
Year: 1992
Electron Beam Test System for GHz-Waveform Measurements on Transmission Lines within MMIC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Fehr; E. Kubalek
Year: 1992
Power Detector with GaAs Field Effect Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krekels, H.-G.; Schiek, B.; Menzel, E.
Year: 1992
Frequency Conversion in High-Tc Superconductor Microwave Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chaloupka, H.; Jeck, M.; Kolesov, S.; Vendik, O.
Year: 1992
High Performance Octave Bandwidth MMIC Analogue Phase Shifter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S Lucyszyn; I D Robertson
Year: 1992
Digitally Controlled, 6 Bit, MMIC Phase Shifter for SAR Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:LM Devlin
Year: 1992
Digitally Controlled GaAs MMIC Attenuator for Active Phase Arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clifton, J.C.; Arnold, J.
Year: 1992
A 30 GHz, HEMT, Active Antenna Structure in MMIC Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roy, L.; Stubbs, M. G.; Wight, J. S.
Year: 1992
A Very Low Power Dissipation Front-End MMIC for L-Band Receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tokumitsu, Masami; Muraguchi, Masahiro
Year: 1992
On the Definition of Quasi Lumped Elements in Planar Microwave Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Janhsen, Andreas; Schiek, Burkhard; Hansen, Volkert
Year: 1992
Techniques for Noninvasive Reconstruction of Inhomogeneous Lossy Dielectric Targets using Interrogating Microwaves
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caorsi, S.; Gragnani, G. L.; Pastorino, M.
Year: 1992
Processing Techniques to Improve Microwave Images for Biomedical Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bolomey, J. Ch.; Joisel, A.; Pichot, Ch.; Gaboriaud, G.
Year: 1992
Space Qualification of the Radioastron 22 GHz Receiver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piironen, P.; Mallat, J.; Rasanen, A.; Siivola, E.; Takala, J.; Jukkala, P.; Sailamaki, P.; Somerma, H.; Ylinen, J.
Year: 1992
Above 8GHz Static T-Flip-Flop Operation using FT=22.9GHz GaAs MESFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Riishoj, J.; Danielsen, P.
Year: 1992
Digital Fiber Optic Links using Novel Led Transmitter and Receiver/Clock Recovery Circuits above 1.25 GB/S
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, J.Y.; Daniel, T.; Daryoush, A.S.; Gershman, V.; Rosen, W.
Year: 1992
A 2-18 GHz Monolithic 400 mW Power Amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watrin, E.; Chaumas, P.; Telliez, I.; Wroblewski, B.
Year: 1992
A Comparison between Three GaAs Monolithic Transimpedance Amplifiers for Optical Communication Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Casao; P. Dorta; J.L. Caceres; M. Salazar-Palma; J. Perez; G. Orengo; C. Paoloni; F. Giannini
Year: 1992
A 1.5 GBaud/sec Serial Link Monolithic Chip Set
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lai, Benny; Walker, Richard C.; Stout, Cheryl; Wu, Jieh Tsorng
Year: 1992
Library of Parasitic Elements Models for MMICs and MHMICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hassaine, N.; Mezui-Mintsa, R.; Boudiaf, A.; Konczykowska, A.; Wang, H.
Year: 1992
A CW GaAs TUNNETT Diode Source for 100 GHz and Above
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Eisele; C. Kidner; G. I. Haddad
Year: 1992
Low Conversion Loss Ka-Band GaAs Monolithic Diode Mixers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lang, RJ.; Bhumbra, SS.; Nightingale, SJ.; McDermott, MG.
Year: 1992
High-level synthesis applied to an ASIC emulation board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wehn, N.; Herpel, H.-J.; Hollstein, T.; Glesner, M.
Year: 1992
Computing stereo correspondences in the presence of narrow occluding objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dhond, U.R.; Aggarwal, J.K.
Year: 1992
Accuracy assessment on camera calibration method not considering lens distortion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng-Wen Shih; Yi-Ping Hung; Wei-Song Lin
Year: 1992
Single plane model extension using projective transformations and data fusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Collins, R.T.
Year: 1992
Autonomous fixation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taalebinezhaad, M.A.
Year: 1992
The geometry of visual interception
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, L.; Aloimonos, Y.
Year: 1992
Low resolution cues for guiding saccadic eye movements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Swain, M.J.; Kahn, R.E.; Ballard, D.H.
Year: 1992
A measure of symmetry based on shape similarity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zabrodsky, H.; Peleg, S.; Avnir, D.
Year: 1992
Recovery of hierarchical part structure of 3-D shape from range image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sato, Y.; Ohya, J.; Ishii, K.
Year: 1992
Right straight homogeneous generalized cylinders with symmetrical cross-sections: recovery of pose and shape from image contours
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu, G.; Tanaka, H.T.; Tsuji, S.
Year: 1992
Correcting chromatic aberrations using image warping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boult, T.E.; Wolberg, G.
Year: 1992
Neural network models for illusory contour perception
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Skrzypek, J.; Ringer, B.
Year: 1992
On texture in document images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jain, A.K.; Bhattacharjee, S.K.; Chen, Y.
Year: 1992
A geometric approach to machine-printed character recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, L.; Pavlidis, T.
Year: 1992
Multifractals, texture, and image analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Levy Vehel, J.; Mignot, P.; Berroir, J.-P.
Year: 1992
Range image segmentation and fitting by residual consensus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu, X.; Bui, T.D.; Krzyzak, A.
Year: 1992
Comparing images using the Hausdorff distance under translation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huttenlocher, D.P.; Rucklidge, W.J.; Klanderman, G.A.
Year: 1992
Robust consensus based edge detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mintz, D.
Year: 1992
Recovery of temporal information from static images of handwriting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Doermann, D.S.; Rosenfeld, A.
Year: 1992
Visual motion analysis under interceptive behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, R.; Aloimonos, Y.
Year: 1992
Task-specific utility in a general Bayes net vision system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rimey, R.D.; Brown, C.M.
Year: 1992
Parametrizing and fitting bounded algebraic curves and surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taubin, G.; Cukierman, F.; Sullivan, S.; Ponce, J.; Kriegman, D.J.
Year: 1992
Accurate calibration of CCD-cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beyer, H.A.
Year: 1992
CCD camera calibration and noise estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Healey, G.; Kondepudy, R.
Year: 1992
From accurate range imaging sensor calibration to accurate model-based 3D object localization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Champleboux, G.; Lavallee, S.; Szeliski, R.; Brunie, L.
Year: 1992
Absolute orientation from uncertain point data: a unified approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hel-Or, Y.; Werman, M.
Year: 1992
Smoothed local generalized cones: an axial representation of 3D shapes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sato, Y.; Ohya, J.; Ishii, K.
Year: 1992
Recovering the scaling function of a SHGC from a single perspective view
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dhome, M.; Glachet, R.; Lapreste, J.T.
Year: 1992
Active photometric stereo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clark, J.J.
Year: 1992
Recovering shape by purposive viewpoint adjustment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kutulakos, K.N.; Dyer, C.R.
Year: 1992
Exploratory active vision: theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Herve, J.-Y.; Aloimonos, Y.
Year: 1992
Towards a general framework for feature extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moons, T.; Pauwels, E.J.; Van Gool, L.; Osterlinck, A.
Year: 1992
A sequential detection framework for feature tracking within computational constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Richardson, H.S.; Blostein, S.D.
Year: 1992
On Poisson solvers and semi-direct methods for computing area based optical flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chhabra, A.K.; Grogan, T.A.
Year: 1992
A MRF approach to optical flow estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vlontzos, J.A.; Geiger, D.
Year: 1992
An heterogeneous M-SIMD architecture for Kalman filter controlled processing of image sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nudd, G.R.; Atherton, T.J.; Kerbyson, D.J.
Year: 1992
Motion trajectories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shah, M.; Rangarajan, K.; Tsai, P.-S.
Year: 1992
Adaptive-size physically-based models for nonrigid motion analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, W.-C.; Goldgof, D.B.
Year: 1992
Adaptive meshes and shells: irregular triangulation, discontinuities, and hierarchical subdivision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vasilescu, M.; Terzopoulos, D.
Year: 1992
Towards object-based heuristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gross, A.D.
Year: 1992
Model indexing: the graph-hashing approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sossa, H.; Horaud, R.
Year: 1992
Saliencies and symmetries: toward 3D object recognition from large model databases
Publisher: IEEE Computer Society
Authors:P.J. Flynn
Year: 1992
Recognizing 3D objects from 2D images: an error analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grimson, W.E.L.; Huttenlocher, D.P.; Alter, T.D.
Year: 1992
Robust focus ranging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nair, H.N.; Stewart, C.V.
Year: 1992
Shape from focus system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nayar, S.K.
Year: 1992
Shape-from-texture by wavelet-based measurement of local spectral moments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Super, B.J.; Bovik, A.C.
Year: 1992
Shape from periodic texture using the spectrogram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Krumm, J.; Shafer, S.A.
Year: 1992
Local reproducible smoothing without shrinkage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oliensis, J.
Year: 1992
Multi-resolution shape description by corners
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fermuller, C.; Kropatsch, W.
Year: 1992
Perceptual organization using Bayesian networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarkar, S.; Boyer, K.L.
Year: 1992
Simple direct computation of the FOE with confidence measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Negahdaripour, S.; Ganesan, V.
Year: 1992
Point correspondence recovery in non-rigid motion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kambhamettu, C.; Goldgof, D.B.
Year: 1992


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