A Microscopic Understanding of Nanometer Scale DENMOS Failure Mechanism under ESD Conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chatterjee; S. Pendharkar; Yen-Yi Lin; C. Duwury; K. Banerjee
Year: 2007
Solid-State and Nanoelectronic Devices - Non- Classical Devices And Interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Guo; Chi On Chui
Year: 2007
Bended Gate-All-Around Nanowire MOSFET: a device with enhanced carrier mobility due to oxidation-induced tensile stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.E. Moselund; P. Dobrosz; S. Olsen; V. Pott; L. De Michielis; D. Tsamados; D. Bouvet; A. O'Neill; A.M. Ionescu
Year: 2007
Impact Ionization Nanowire Transistor with Multiple-Gates, Silicon-Germanium Impact Ionization Region, and Sub-5 mV/decade Subtheshold Swing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eng-Huat Toh; G.H. Wang; Ming Zhu; Chen Shen; Lap Chan; Guo-Qiang Lo; Chih-Hung Tung; D. Sylvester; Chun-Huat Heng; G. Samudra; Yee-Chia Yeo
Year: 2007
Pionics: the Emerging Science and Technology of Graphene-based Nanoelectronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.A. de Heer; C. Berger; E. Conrad; P. First; R. Murali; J. MeindI
Year: 2007
Carbon Nanotube Vias: A Reality Check
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Li; N. Srivastava; Jun-Fa Mao; Wen-Yan Yin; K. Banerjee
Year: 2007
Displays, Sensors, and MEMS - Flexible And Organic Electronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hagen Klauk; Takao Someya
Year: 2007
An Approach to Cost-Effective, Robust, Large-Area Electronics using Monolithic Silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kevin Huang; R. Dinyari; G. Lanzara; Jong Yon Kim; Jianmin Feng; C. Vancura; Fu-Kuo Chang; P. Peumans
Year: 2007
F-TES ADT Organic Integrated Circuits on Glass and Plastic Substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung Kyu Park; Devin A. Mourey; Insoo Kim; Dalong Zhao; Sankar Subramanian; John E. Anthony; Thomas N. Jackson
Year: 2007
Label-free low-cost disposable DNA hybridization detection systems using organic TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qintao Zhang; V. Subramanian
Year: 2007
Integrated Circuits & Manufacturing - Advanced CMOS Logic and SoC Platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jon Cheek; John Pellerin
Year: 2007
A highly scaled, high performance 45 nm bulk logic CMOS technology with 0.242 μm2 SRAM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuan-Lun Cheng; C.C. Wu; Y.P. Wang; D.W. Lin; C.M. Chu; Y.Y. Tarng; S.Y. Lu; S.J. Yang; M.H. Hsieh; C.M. Liu; S.P. Fu; J.H. Chen; C.T. Lin; W.Y. Lien; H.Y. Huang; P.W. Wang; H.H. Lin; D.Y. Lee; M.J. Huang; C.F. Nieh; L.T. Lin; C.C. Chen; W. Chang; Y.H. Chiu; M.Y. Wang; C.H. Yeh; F.C. Chen; Y.H. Chang; S.C. Wang; H.C. Hsieh; M.D. Lei; K. Goto; H.J. Tao; M. Cao; H.C. Tuan; C.H. Diaz; Y.J. Mii; C.M. Wu
Year: 2007
A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Mistry; C. Allen; C. Auth; B. Beattie; D. Bergstrom; M. Bost; M. Brazier; M. Buehler; A. Cappellani; R. Chau; C.-H. Choi; G. Ding; K. Fischer; T. Ghani; R. Grover; W. Han; D. Hanken; M. Hattendorf; J. He; J. Hicks; R. Huessner; D. Ingerly; P. Jain; R. James; L. Jong; S. Joshi; C. Kenyon; K. Kuhn; K. Lee; H. Liu; J. Maiz; B. Mclntyre; P. Moon; J. Neirynck; S. Pae; C. Parker; D. Parsons; C. Prasad; L. Pipes; M. Prince; P. Ranade; T. Reynolds; J. Sandford; L. Shifren; J. Sebastian; J. Seiple; D. Simon; S. Sivakumar; P. Smith; C. Thomas; T. Troeger; P. Vandervoorn; S. Williams; K. Zawadzki
Year: 2007
High-Performance and Low-Power Bulk Logic Platform Utilizing FET Specific Multiple-Stressors with Highly Enhanced Strain and Full-Porous Low-k Interconnects for 45-nm CMOS Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Miyashita; K. Ikeda; Y.S. Kim; T. Yamamoto; Y. Sambonsugi; H. Ochimizu; T. Sakoda; M. Okuno; H. Minakata; H. Ohta; Y. Hayami; K. Ookoshi; Y. Shimamune; M. Fukuda; A. Hatada; K. Okabe; M. Tajima; E. Motoh; T. Owada; M. Nakamura; H. Kudo; T. Sawada; J. Nagayama; A. Satoh; T. Mori; A. Hasegawa; H. Kurata; K. Sukegawa; A. Tsukune; S. Yamaguchi; M. Kase; T. Futatsugi; S. Satoh; T. Sugii
Year: 2007
Record RF performance of 45-nm SOI CMOS Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sungjae Lee; B. Jagannathan; S. Narasimha; A. Chou; N. Zamdmer; J. Johnson; R. Williams; L. Wagner; Jonghae Kim; J.-O. Plouchart; J. Pekarik; S. Springer; G. Freeman
Year: 2007
Technology Elements of a Common Platform Bulk Foundry Offering (Invited)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Gilbert; A. Steegen; D. Coolbaugh; V. Ramachandran; A. Mocuta; T. Hook; M. Angyal; D. Moy
Year: 2007
A 32nm CMOS Low Power SoC Platform Technology for Foundry Applications with Functional High Density SRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shien-Yang Wu; C.W. Chou; C.Y. Lin; M.C. Chiang; C.K. Yang; M.Y. Liu; L.C. Hu; C.H. Chang; P.H. Wu; H.F. Chen; S.Y. Chang; S.H. Wang; P.Y. Tong; Y.L. Hsieh; J.J. Liaw; K.H. Pan; C.H. Hsieh; C.H. Chen; J.Y. Cheng; C.H. Yao; W.K. Wan; T.L. Lee; K.T. Huang; K.C. Lin; L.Y. Yeh; K.C. Ku; S.C. Chen; H.J. Lin; S.M. Jang; Y.C. Lu; J.H. Shieh; M.H. Tsai; J.Y. Song; K.S. Chen; V. Chang; S.M. Cheng; S.H. Yang; C.H. Diaz; Y.C. See; M.S. Liang
Year: 2007
Fully-depleted SOI technology using high-k and single-metal gate for 32 nm node LSTP applications featuring 0.179 μm2 6T-SRAM bitcell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Fenouillet-Beranger; S. Denorme; B. Icard; F. Boeuf; J. Coignus; O. Faynot; L. Brevard; C. Buj; C. Soonekindt; J. Todeschini; J.C. Le-Denmat; N. Loubet; C. Gallon; P. Perreau; S. Manakli; B. Mmghetti; L. Pain; V. Arnal; A. Vandooren; D. Aime; L. Tosti; C. Savardi; F. Martin; T. Salvetat; S. Lhostis; C. Laviron; N. Auriac; T. Kormann; G. Chabanne; S. Gaillard; O. Belmont; E. Laffosse; D. Barge; A. Zauner; A. Tarnowka; K. Romanjec; H. Brut; A. Lagha; S. Bonnetier; F. Joly; N. Mayet; A. Cathignol; D. Galpin; D. Pop; R. Delsol; R. Pantel; F. Pionnier; G. Thomas; D. Bensahel; S. Deleombus; T. Skotnicki; H. Mmgam
Year: 2007
CMOS Devices - High-Performance Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanjay Natarajan; An Steegen
Year: 2007
Novel Diffusion Topography Engineering (DTE) for High Performance CMOS Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.H. Ko; C.H. Ge; C.C. Chen; W.Y. Teo; H.N. Lin; H.W. Chen; C.W. Kuo; M.T. Yang; D.Y. Chen; C.Y. Fu; W.C. Lee
Year: 2007
Study on High Performance (110) PFETs with Embedded SiGe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Okamoto; K. Miyashita; N. Yasutake; T. Okada; H. Itokawa; I. Mizushima; A. Azuma; H. Yoshimura; T. Nakayama
Year: 2007
High-Performance 45nm node CMOS Transistors Featuring Flash Lamp Annealing (FLA)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sanuki; T. Iwamoto; K. Ota; T. Komoda; H. Yamazaki; A. Eiho; K. Miyagi; K. Nakayama; O. Fuji; M. Togo; K. Ohno; H. Yoshimura; K. Yoshida; T. Ito; A. Minej; K. Yoshino; T. Itani; K. Matsuo; T. Sato; S. Mori; K. Nakazawa; M. Nakazawa; T. Shinyama; K. Suguro; I. Mizushima; S. Iwasa; S. Muramatsu; K. Nagaoka; M. Ikeda; M. Saito; H. Naruse; Y. Enomoto; T. Kitano; M. Iwai; K. Imai; N. Nagashima; T. Kuwata; F. Matsuoka
Year: 2007
45nm High-k/Metal-Gate CMOS Technology for GPU/NPU Applications with Highest PFET Performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.T. Huang; Y.C. Liu; Y.T. Hou; R.C.-J. Chen; C.H. Lee; Y.S. Chao; P.F. Hsu; C.L. Chen; W.H. Guo; W.C. Yang; T.H. Perng; J.J. Shen; Y. Yasuda; K. Goto; C.C. Chen; K.T. Huang; H. Chuang; C.H. Diaz; M.S. Liang
Year: 2007
High Performance Sub-40 nm Bulk CMOS with Dopant Confinement Layer (DCL) technique as a Strain Booster
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ohta; N. Tamura; H. Fukutome; M. Tajima; K. Okabe; A. Hatada; K. Ikeda; K. Ohkoshi; T. Mori; K. Sukegawa; S. Satoh; T. Sugii
Year: 2007
Extreme High-Performance n- and p-MOSFETs Boosted by Dual-Metal/High-k Gate Damascene Process using Top-Cut Dual Stress Liners on (100) Substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mayuzumi; J. Wang; S. Yamakawa; Y. Tateshita; T. Hirano; M. Nakata; S. Yamaguchi; Y. Yamamoto; Y. Miyanami; I. Oshiyama; K. Tanaka; K. Tai; K. Ogawa; K. Kugimiya; Y. Nagahama; Y. Hagimoto; R. Yamamoto; S. Kanda; K. Nagano; H. Wakabayashi; Y. Tagawa; M. Tsukamoto; H. Iwamoto; M. Saito; S. Kadomura; N. Nagashima
Year: 2007
(110) channel, SiON gate-dielectric PMOS with record high Ion=1 mA/μm through channel stress and source drain external resistance (Rext) engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Yang; A. Waite; H. Yin; J. Yu; L. Black; D. Chidambarrao; A. Domenicucci; X. Wang; S.H. Ku; Y. Wang; H.V. Meer; B. Kim; H. Nayfeh; S.D. Kim; K. Tabakman; R. Pal; K. Nummy; B. Greene; P. Fisher; J. Liu; Q. Liang; J. Holt; S. Narasimha; Z. Luo; H. Utomo; X. Chen; D. Park; C. Sung; R. Wachnik; G. Freeman; D. Schepis; E. Maciejewski; M. Khare; E. Leobandung; S. Luning; P. Agnello
Year: 2007
45nm SOI CMOS Technology with 3X hole mobility enhancement and Asymmetric transistor for high performance CPU application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K.H. Fung; H.C. Lo; C.F. Cheng; W.Y. Lu; K.C. Wu; K.H. Chen; D.H. Lee; Y.H. Liu; I.L. Wu; C.T. Li; C.H. Wu; F.L. Hsiao; T.L. Chen; W.Y. Lien; C.H. Huang; P.W. Wang; Y.H. Chiu; L.T. Lin; K.Y. Chen; H.J. Tao; H.C. Tuan; Y.J. Mii; Y.C. Sun
Year: 2007
Solid-State and Nanoelectronic Devices - Phase Change Memory and New Approaches for Nanoelectronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Norikatsu Takaura; Dirk Wouters
Year: 2007
Design Considerations for Complementary Nanoelectromechanical Logic Gates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Akarvardar; D. Elata; R. Parsa; G.C. Wan; K. Yoo; J. Provine; P. Peumans; R.T. Howe; H.-S.P. Wong
Year: 2007
Process Technology - Gate Stack Process I - Fundamental Aspects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Albert Chin; Stefan De Gendt
Year: 2007
Tuning PMOS Mo(O,N) metal gates to NMOS by addition of DyO capping layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Petry; R. Singanamalla; K. Xiong; C. Ravit; E. Simoen; R. O'Connor; A. Veloso; C. Adelmann; S. Van Elshocht; V. Paraschiv; S. Brus; J. Van Berkum; S. Kubicek; K. De Meyer; S. Biesemans; J.C. Hooker
Year: 2007
Very Low Vt [Ir-Hf]/HfLaO CMOS Using Novel Self-Aligned Low Temperature Shallow Junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.F. Cheng; C.H. Wu; N.C. Su; S.J. Wang; S.P. McAlister; A. Chin
Year: 2007
Mechanism of Vfb roll-off with High Work function Metal Gate and Low Temperature Oxygen Incorporation to Achieve PMOS Band Edge Work function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.C. Song; C.S. Park; J. Price; C. Burham; R. Choi; H.C. Wen; K. Choi; H.H. Tseng; B.H. Lee; R. Jammy
Year: 2007
Modeling and Analysis of Self-Heating in FinFET Devices for Improved Circuit and EOS/ESD Performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kolluri; K. Endo; E. Suzuki; K. Banerjee
Year: 2007
Characterization and Monte Carlo Analysis of Secondary Electrons Induced Program Disturb in a Buried Diffusion Bit-line SONOS Flash Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chun-Jung Tang; C.W. Li; Tahui Wang; S.H. Gu; P.C. Chen; Y.W. Chang; T.C. Lu; W.P. Lu; K.C. Chen; Chih-Yuan Lu
Year: 2007
Random telegraph noise in flash memories - model and technology scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Fukuda; Y. Shimizu; K. Amemiya; M. Kamoshida; Chenming Hu
Year: 2007
Study of Local Trapping and STI Edge Effects on Charge-Trapping NAND Flash
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hang-Ting Lue; Tzu-Hsuan Hsu; Szu-Yu Wang; Yi-Hsuan Hsiao; Erh-Kun Lai; Ling-Wu Yang; Tahone Yang; Kuang-Chao Chen; Kuang-Yeu Hsieh; Rich Liu; Chih-Yuan Lu
Year: 2007
Reliability issues and scaling projections for phase change non volatile memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Lacaita; D. Ielmini
Year: 2007
CMOS & Interconnect Reliability - Reliability Issues in Non-Volatile Memories and ESD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gilles Reimbold; Harald Gossner
Year: 2007
Extendibility of NiPt Silicide Contacts for CMOS Technology Demonstrated to the 22-nm Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ohuchi; C. Lavoie; C. Murray; C. D'Emic; J.O. Chu; Bin Yang; P. Besser; L. Gignac; J. Bruley; G.U. Singco; F. Pagette; A.W. Topol; M.J. Rooks; J.J. Bucchignano; V. Narayanan; M. Khare; M. Takayanagi; K. Ishimaru; Dae-Gyu Park; G. Shahidi; P. Solomon
Year: 2007
Pushing Planar Bulk CMOSFET Scaling to its Limit by Ultimately Shallow Diffusion-Less Junction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Uejima; K. Yako; N. Ikarashi; M. Narihiro; M. Tanaka; T. Nagumo; A. Mineji; S. Shishiguchi; M. Hane
Year: 2007
Low Temperature Implementation of Dopant-Segregated Band-edge Metallic S/D junctions in Thin-Body SOI p-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Larrieu; E. Dubois; R. Valentin; N. Breil; F. Danneville; G. Dambrine; J.P. Raskin; J.C. Pesant
Year: 2007
Junction Profile Engineering with a Novel Multiple Laser Spike Annealing Scheme for 45-nm Node High Performance and Low Leakage CMOS Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamamoto; T. Kubo; T. Sukegawa; E. Takii; Y. Shimamune; N. Tamura; T. Sakoda; M. Nakamura; H. Ohta; T. Miyashita; H. Kurata; S. Satoh; M. Kase; T. Sugii
Year: 2007
A Novel Low Leakage-Current Ni SALICIDE Process in nMOSFETs on Si(110) Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamaguchi; K. Kashihara; S. Kudo; K. Hayashi; N. Hashikawa; T. Okudaira; T. Tsutsumi; K. Maekawa; H. Oda; K. Asai; M. Kojima
Year: 2007
Interfacial Segregation of Metal at NiSi/Si Junction for Novel Dual Silicide Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Nishi; Y. Tsuchiya; A. Kinoshita; T. Yamauchi; J. Koga
Year: 2007
Silicon-Germanium-Tin (SiGeSn) Source and Drain Stressors formed by Sn Implant and Laser Annealing for Strained Silicon-Germanium Channel P-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.H. Wang; Eng-Huat Toh; Xincai Wang; D.H.L. Seng; S. Tripathy; T. Osipowicz; Tau Kuei Chan; Keat Mun Hoe; S. Balakumar; Chih Hang Tung; Guo-Qiang Lo; G. Samudra; Yee-Chia Yeo
Year: 2007
Clarification of Additional Mobility Components associated with TaC and TiN Metal Gates in scaled HfSiON MOSFETs down to sub-1.0nm EOT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tatsumura; M. Goto; S. Kawanaka; K. Nakajima
Year: 2007
Impact of flash annealing on performance and reliability of high-κ/metal-gate MOSFETs for sub-45 nm CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Kalra; P. Majhi; D. Heh; G. Bersuker; C. Young; N. Vora; R. Harris; P. Kirsch; Rino Choi; Man Chang; Joonmyoung Lee; Hyunsang Hwang; Hsing-Huang Tseng; R. Jammy; Tsu-Jae King Liu
Year: 2007
Energy Harvesting for Electronics with Thermoelectric Devices using Nanoscale Materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Venkatasubramanian; C. Watkins; D. Stokes; J. Posthill; C. Caylor
Year: 2007
Nanogenerators and Nanopiezotronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong Lin Wang
Year: 2007
Quantum, Power, and Compound Semiconductors - Reliability and Characterization Of Power HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Isik C. Kizilyalli; Kevin J. Chen
Year: 2007
A review of failure modes and mechanisms of GaN-based HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Zanoni; G. Meneghesso; G. Verzellesi; F. Danesin; M. Meneghini; F. Rampazzo; A. Tazzoli; F. Zanon
Year: 2007
Gate Current Degradation Mechanisms of GaN High Electron Mobility Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jungwoo Joh; Ling Xia; J.A. del Alamo
Year: 2007
Reliability of Enhancement-mode AlGaN/GaN HEMTs Fabricated by Fluorine Plasma Treatment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Congwen Yi; Ruonan Wang; Wei Huang; W.C.-W. Tang; K.M. Lau; K.J. Chen
Year: 2007
Remarkable Breakdown Voltage Enhancement in AlGaN Channel HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Nanjo; M. Takeuchi; M. Suita; Y. Abe; T. Oishi; Y. Tokuda; Y. Aoyagi
Year: 2007
Characterisation of AlGaN/GaN HEMT epitaxy and devices on composite substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Meneghesso; C. Ongaro; E. Zanoni; C. Brylinski; M.A. di Forte-Poisson; V. Hoel; J.C. de Jaeger; R. Langer; H. Lahreche; P. Bove; J. Thorpe
Year: 2007
High-voltage Millimeter-Wave GaN HEMTs with 13.7 W/mm Power Density
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.-F. Wu; M. Moore; A. Abrahamsen; M. Jacob-Mitos; P. Parikh; S. Heikman; A. Burk
Year: 2007
Displays, Sensors, and MEMS - RF MEMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Werner Weber; Thomas A. Friedman
Year: 2007
Integrated MEMS LC Resonator with Sealed Air-Suspended Structure for Single-Chip RF LSIs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Kuwabara; N. Sato; H. Morimura; J. Kodate; M. Nakamura; M. Ugajin; T. Kamei; K. Kudou; K. Machida; H. Ishii
Year: 2007
High Reproducibility and Reliability of Piezoelectric MEMS Tunable Capacitors for Reconfigurable RF Front-end
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kawakubo; T. Nagano; M. Nishigaki; K. Itaya
Year: 2007
Integrated Circuits & Manufacturing - Nonvolatile Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kirk Prall; Michael Specth
Year: 2007
Optimal Integration and Characteristics of Vertical Array Devices for Ultra-High Density, Bit-Cost Scalable Flash Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Fukuzumi; Y. Matsuoka; M. Kito; M. Kido; M. Sato; H. Tanaka; Y. Nagata; Y. Matsuoka; Y. Iwata; H. Aochi; A. Nitayama
Year: 2007
Thorough investigation of Si-nanocrystal memories with high-k interpoly dielectrics for sub-45nm node Flash NAND applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Molas; M. Bocquet; J. Buckley; J.P. Colonna; L. Masarotto; H. Grampeix; F. Martin; V. Vidal; A. Toffoli; P. Brianceau; L. Vermande; P. Scheiblin; M. Gely; A.M. Papon; G. Auvert; L. Perniola; C. Licitra; T. Veyron; N. Rochat; C. Bongiorno; S. Lombardo; B. De Salvo; S. Deleonibus
Year: 2007
Novel Ultra-Low Voltage and High-Speed Programming/Erasing Schemes for SONOS Flash Memory with Excellent Data Retention
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Chung; Y.H. Tseng; C.S. Lai; Y.Y. Hsu; E. Ho; C. Chen; L.C. Peng; C.H. Chu
Year: 2007
Write Strategies for 2 and 4-bit Multi-Level Phase-Change Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Nirschl; J.B. Phipp; T.D. Happ; G.W. Burr; B. Rajendran; M.-H. Lee; A. Schrott; M. Yang; M. Breitwisch; C.-F. Chen; E. Joseph; M. Lamorey; R. Cheek; S.-H. Chen; S. Zaidi; S. Raoux; Y.C. Chen; Y. Zhu; R. Bergmann; H.-L. Lung; C. Lam
Year: 2007
CMOS Devices - Device/Design Interaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manfred Horstmann; Reinhard Mahnkopf
Year: 2007
Reducing Variation in Advanced Logic Technologies: Approaches to Process and Design for Manufacturability of Nanoscale CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.J. Kuhn
Year: 2007
Controllable Inverter Delay and Suppressing Vth Fluctuation Technology in Silicon on Thin BOX Featuring Dual Back-Gate Bias Architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Tsuchiya; T. Ishigaki; Y. Morita; M. Yamaoka; T. Iwamatsu; T. Ipposhi; H. Oda; N. Sugii; S. Kimura; K. Itoh; Y. Inoue
Year: 2007
Measurements of Inter-and-Intra Device Transient Thermal Transport on SOI FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.M. Solomon; M. Shamsa; K.A. Jenkins; C.P. D'Emic; A.A. Balandin; W. Haensch
Year: 2007
An Effective Switching Current Methodology to Predict the Performance of Complex Digital Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. von Arnim; C. Pacha; K. Hofmann; T. Schulz; K. Schriifer; J. Berthold
Year: 2007
Direct evaluation of DC characteristic variability in FinFET SRAM Cell for 32 nm node and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Inaba; H. Kawasaki; K. Okano; T. Izumida; A. Yagishita; A. Kaneko; K. Ishimaru; N. Aoki; Y. Toyoshima
Year: 2007
CMOS & Interconnect Reliability - Advanced Dielectric Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kin Leong Pey; Takeshi Furusawa
Year: 2007
On the progressive breakdown statistical distribution and its voltage acceleration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Wu; S. Tous; J. Sue
Year: 2007
Multiple Digital Breakdowns and Its Consequence on Ultrathin Gate Dielectrics Reliability Prediction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.L. Lo; K.L. Pey; C.H. Tung; X. Li
Year: 2007
Multi-probe Two-Dimensional Mapping of Off-State Degradation in DeNMOS Transistors: How and Why Interface Damage Predicts Gate Dielectric Breakdown
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Varghese; H. Kufluoglu; V. Reddy; D. Mosher; S. Krishnan; M.A. Alam
Year: 2007
Designing Reliable Systems with Unreliable Devices Challenges and Opportunities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Benini
Year: 2007
Copper Wiring Encapsulation with Ultra-thin Barriers to Enhance Wiring and Dielectric Reliabilities for 32-nm Nodes and Beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kudo; M. Haneda; H. Ochimizu; A. Tsukune; S. Okano; N. Ohtsuka; M. Sunayama; H. Sakai; T. Suzuki; H. Kitada; S. Amari; T. Tabira; H. Matsuyama; N. Shimizu; T. Futatsugi; T. Sugii
Year: 2007
Process Technology - Gate Stack Process II - Metal Gate / High K Integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kazuhiro Eguchi; Luigi Colombo
Year: 2007
Feasible Integration Scheme for Dual Work Function FUSI/HfSiON Gate Stacks with Selective Metal Pile-up to nMOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Tsuchiya; M. Yoshiki; A. Kaneko; S. Inumiya; T. Saito; K. Nakajima; T. Aoyama; A. Nishiyama; M. Koyama
Year: 2007
Gate-First Processed FUSI/HfO2/HfSiOx/Si MOSFETs with EOT=0.5 nm - Interfacial Layer Formation by Cycle-by-Cycle Deposition and Annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Takahashi; A. Ogawa; A. Hirano; Y. Kamimuta; Y. Watanabe; K. Iwamoto; S. Migita; N. Yasuda; H. Ota; T. Nabatame; A. Toriumi
Year: 2007
Single Metal/Dual High-k Gate Stack with Low Vth and Precise Gate Profile Control for Highly Manufacturable Aggressively Scaled CMISFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Mise; T. Morooka; T. Eimori; S. Kamiyama; K. Murayama; M. Sato; T. Ono; Y. Nara; Y. Ohji
Year: 2007
Practical dual-metal-gate dual-high-k CMOS integration technology for hp 32 nm LSTP utilizing process-friendly TiAlN metal gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kadoshima; T. Matsuki; M. Sato; T. Aminaka; E. Kurosawa; A. Ohta; H. Yoshinaga; S. Miyazaki; K. Shiraishi; K. Yamabe; K. Yamada; T. Aoyama; Y. Nara; Y. Ohji
Year: 2007
A Dy2O3-capped HfO2 Dielectric and TaCx-based Metals Enabling Low-Vt Single-Metal-Single-Dielectric Gate Stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.S. Chang; L.-A. Ragnarsson; G. Pourtois; R. O'Connor; C. Adelmann; S. Van Elshocht; A. Delabie; J. Swerts; N. Van der Heyden; T. Conard; H.-J. Cho; A. Akheyar; R. Mitsuhashi; T. Witters; B.J. O'Sullivan; L. Pantisano; E. Rohr; P. Lehnen; S. Kubicek; T. Schram; S. De Gendt; P.P. Absil; S. Biesemans
Year: 2007
Band Edge Gate First HfSiON/Metal Gate n-MOSFETs using ALD-La2O3 Cap Layers Scalable to EOT=0.68 nm for hp 32 nm Bulk Devices with High Performance and Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kamiyama; T. Miura; E. Kurosawa; M. Kitajima; M. Ootuka; T. Aoyama; Y. Nara
Year: 2007
Aggressively Scaled High-k Gate Dielectric with Excellent Performance and High Temperature Stability for 32nm and Beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Sivasubramani; P.D. Kirsch; J. Huang; C. Park; Y.N. Tan; D.C. Gilmer; C. Young; K. Freeman; M.M. Hussain; R. Harris; S.C. Song; D. Hen; R. Choi; P. Majhi; G. Bersuker; P. Lysaght; B.H. Lee; H.-H. Tseng; J.S. Jur; D.J. Lichtenwalner; A.I. Kingon; R. Jammy
Year: 2007
A predictive analytical model of 3D MIM capacitors for RC IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Segura; S. Cremer; D. Gloria; L. Ciampolini; E. Picollet; M. Minondo
Year: 2007
Physically-based unified compact model for low-field carrier mobility in MOSFETs with different gate stacks and biaxial/uniaxial stress conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Reggiani; L. Silvestri; A. Cacciatori; E. Gnani; A. Gnudi; G. Baccarani
Year: 2007
A new model for 1/f noise in high-κ MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Morshed; S.P. Devireddy; M.S. Rahman; Z. Celik-Butler; Hsing-Huang Tseng; A. Zlotnicka; A. Shanware; K. Green; J.J. Chambers; M.R. Visokay; M.A. Quevedo-Lopez; L. Colombo
Year: 2007
A Multi-Gate MOSFET Compact Model Featuring Independent-Gate Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.D. Lu; M.V. Dunga; Chung-Hsun Lin; A.M. Niknejad; Chenming Hu
Year: 2007
High Performance CMOS Variability in the 65nm Regime and Beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Nassif; K. Bernstein; D.J. Frank; A. Gattiker; W. Haensch; B.L. Ji; E. Nowak; D. Pearson; N.J. Rohrer
Year: 2007
Rapid Circuit-based Optimization of Low Operational Power CMOS Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Christie; A. Nackaerts; T. Hoffmann; A. Kumar
Year: 2007
Displays, Sensors, and MEMS - TFTs, Displays and Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mutsuko Hatano; William Milne
Year: 2007
ZnO Thin Film Transistor Ring Oscillators with sub 75 nsec Propagation Delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jie Sun; D.A. Mourey; Dalong Zhao; Sung Kyu Park; S.F. Nelson; D.H. Levy; D. Freeman; P. Cowdery-Corvan; L. Tutt; T.N. Jackson
Year: 2007
New Approach for Passivation of Ga2O3-In2O3-ZnO Thin Film Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun Il Kim; Chang Jung Kim; Jae Chul Park; Ihun Song; Dong Hun Kang; Hyuck Lim; Sang Wook Kim; Eunha Lee; Jae Chul Lee; Youngsoo Park
Year: 2007
High performance transparent thin film transistors based on indium gallium zinc oxide as the channel material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Suresh; P. Wellenius; J.F. Muth
Year: 2007
Sub-Micron CMOS / MOS-Bipolar Hybrid TFTs for System Displays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Kawachi; T. Okada; S. Tsuboi; M. Mitani
Year: 2007
New In-Situ Process of Top Gate Nanocrystalline Silicon Thin Film Transistors Fabricated at 180 °C for the Suppression of Leakage Current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joong-Hyun Park; Sang-Myeon Han; Young-Hwan Choi; Sun-Jae Kim; Min-Koo Han
Year: 2007
Uniform High Current Field Emission of Electrons from Si and CNF FEAs Individually Controlled by Si Pillar Ungated FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.F. Velasquez-Garcia; B. Adeoti; Y. Niu; A.I. Akinwande
Year: 2007
Quantum, Power, and Compound Semiconductors - III-V FETs for Microwave, Millimiter Wave and Digital Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miroslav Micovic; Patrick Fay
Year: 2007
Sub 50 nm InP HEMT Device with Fmax Greater than 1 THz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Lai; X.B. Mei; W.R. Deal; W. Yoshida; Y.M. Kim; P.H. Liu; J. Lee; J. Uyeda; V. Radisic; M. Lange; T. Gaier; L. Samoska; A. Fung
Year: 2007
610 GHz InAlAs/In0.75GaAs Metamorphic HEMTs with an Ultra-Short 15-nm-Gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seong-Jin Yeon; Myonghwan Park; JeHyuk Choi; Kwangseok Seo
Year: 2007
0.1 μm In02Al08Sb-InAs HEMT low-noise amplifiers for ultralow-power applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Chou; M.D. Lange; B.R. Bennett; J.B. Boos; J.M. Yang; N.A. Papanicolaou; C.H. Lin; L.J. Lee; P.S. Nam; A.L. Gutierrez; D.S. Farkas; R.S. Tsai; M. Wojtowicz; T.P. Chin; A.K. Oki
Year: 2007
High Mobility III-V MOSFETs For RF and Digital Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Passlack; P. Zurcher; K. Rajagopalan; R. Droopad; J. Abrokwah; M. Tutt; Y.-B. Park; E. Johnson; O. Hartin; A. Zlotnicka; P. Fejes; R.J.W. Hill; D.A.J. Moran; X. Li; H. Zhou; D. Macintyre; S. Thorns; A. Asenov; K. Kalna; I.G. Thayne
Year: 2007
Heterogeneous integration of enhancement mode in0.7ga0.3as quantum well transistor on silicon substrate using thin (les 2 μm) composite buffer architecture for high-speed and low-voltage ( 0.5 v) logic applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.K. Hudait; G. Dewey; S. Datta; J.M. Fastenau; J. Kavalieros; W.K. Liu; D. Lubyshev; R. Pillarisetty; W. Rachmady; M. Radosavljevic; T. Rakshit; R. Chau
Year: 2007
Logic Performance of 40 nm InAs HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dae-Hyun Kim; J.A. del Alamo
Year: 2007
90 nm Self-aligned Enhancement-mode InGaAs HEMT for Logic Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Waldron; Dae-Hyun Kim; J.A. del Alamo
Year: 2007
High performance submicron inversion-type enhancement-mode InGaAs MOSFETs with ALD Al2O3, HfO2 and HfAlO as gate dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Xuan; Y.Q. Wu; T. Shen; T. Yang; P.D. Ye
Year: 2007
Device/Circuit Interactions in Highly-Scaled CMOS: Challenges and Potential Solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ralf Brederlow
Year: 2007
Technology Circuit Co-Design for High Performance Logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Bernstein; N.J. Rohrer
Year: 2007
Variability Mitigation in Highly Scaled CMOS: Challenges for EDA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.B. Kahng
Year: 2007
Leakage Reduction in Sub-100nm CMOS Technologies: Bridging the Gap Between Technology, Circuit Design and Low Power Product Requirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Pacha; J. Berthold
Year: 2007
An Adaptive Design of SRAM Memory Cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ishibashi
Year: 2007
Looking Beyond Silicon - A Pipe Dream or the Inevitable Next Step?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dimitri Antoniadis
Year: 2007
Quantum, Power, & Compound Semiconductors - Ultra High Speed SiGe and InP-based HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giovanni Ghione; Minoru Ida
Year: 2007
SiGe BiCMOS Technology with 3.0 ps Gate Delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Riicker; B. Heinemann; R. Barth; J. Bauer; D.B.K. Blum; D. Bolze; J. Drews; G.G. Fischer; A. Fox; O. Fursenko; T. Grabolla; U. Haak; W. Hoppner; D. Knoll; K. Kopke; B. Kuck; A. Mai; S. Marschmeyer; T. Morgenstern; H.H. Richter; P. Schley; D. Schmidt; K. Schulz; B. Tillack; G. Weidner; W. Winkler; D. Wolansky; H.-E. Wulf; Y. Yamamototo
Year: 2007
A Novel Fully Self-Aligned SiGe:C HBT Architecture Featuring a Single-Step Epitaxial Collector-Base Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J.T.M. Donkers; M.C.J.C.M. Kramer; S. Van Huylenbroeck; L.J. Choi; P. Meunier-Beillard; A. Sibaja-Hernandez; G. Boccardi; W. van Noort; G.A.M. Hurkx; T. Vanhoucke; F. Vleugels; G. Wmderickx; E. Kunnen; S. Peeters; D. Baute; B. De Vos; T. Vandeweyer; R. Loo; R. Venegas; R. Pijper; F.C. Voogt; S. Decoutere; E.A. Hijzen
Year: 2007
Type-II GaAsSb/InP DHBTs with Record fT = 670 GHz and Simultaneous fT, fMAX ≫ 400 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Snodgrass; Bing-Ruey Wu; K.Y. Cheng; M. Feng
Year: 2007
High-Speed InP HBT Technology for Advanced Mixed-signal and Digital Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Monier; D. Scott; M. D'Amore; B. Chan; L. Dang; A. Cavus; E. Kaneshiro; P. Nam; K. Sato; N. Cohen; S. Lin; K. Luo; J. Wang; B. Oyama; A. Gutierrez
Year: 2007
Ferrite-Partially-Filled on-Chip RF Inductor Fabricated Using Low-Temperature Nano-Powder-Mixed-Photoresist Filling Technique for Standard CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Yang; Feng Liu; Tian-Ling Ren; Li-Tian Liu; Guang Chen; Xiao-Kang Guan; A. Wang; Zhen-Xing Yue
Year: 2007
Process Technology - Advanced Process & Integration Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barbara De Salvo; Tze-Liang Lee
Year: 2007
Embedded Flash on 90nm Logic Technology & Beyond for FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kojima; T. Ema; T. Anezaki; J. Ariyoshi; H. Ogawa; K. Yoshizawa; S. Mehta; S. Fong; S. Logie; R. Smoak; D. Rutledge
Year: 2007
Gatestacks for scalable high-performance FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Vellianitis; M.J.H. van Dal; L. Witters; G. Curatola; G. Doornbos; N. Collaert; C. Jonville; C. Torregiani; L.-S. Lai; J. Petty; B.J. Pawlak; R. Duffy; M. Demand; S. Beckx; S. Mertens; A. Delabie; T. Vandeweyer; C. Delvaux; F. Leys; A. Hikavyy; R. Rooyackers; M. Kaiser; R.G. Weemaes; F. Voogt; H. Roberts; D. Donnet; S. Biesemans; M. Jurczak; R.J.R. Lander
Year: 2007
Route to Low Parasitic Resistance in MuGFETs with Silicon-Carbon Source/Drain: Integration of Novel Low Barrier Ni(M)Si:C Metal Silicides and Pulsed Laser Annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.T.-P. Lee; A.T.-Y. Koh; Fang-Yue Liu; Wei-Wei Fang; Tsung-Yang Liow; Kian-Ming Tan; Poh-Chong Lim; A.E.-J. Lim; Ming Zhu; Keat-Mun Hoe; Chin-Hang Tung; Guo-Qiang Lo; Xincai Wang; D.K.-Y. Low; G.S. Samudra; Dong-Zhi Chi; Yee-Chia Yeo
Year: 2007
Localized SOI technology: an innovative Low Cost self-aligned process for Ultra Thin Si-film on thin BOX integration for Low Power applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Monfray; M.P. Samson; D. Dutartre; T. Ernst; E. Rouchouze; D. Renaud; B. Guillaumot; D. Chanemougame; G. Rabille; S. Borel; J.P. Colonna; C. Arvet; N. Loubet; Y. Campidelli; J.M. Hartmann; L. Vandroux; D. Bensahel; A. Toffoli; F. Allain; A. Margin; L. Clement; A. Quiroga; S. Deleonibus; T. Skotnicki
Year: 2007
Proof of Ge-interfacing Concepts for Metal/High-k/Ge CMOS - Ge-intimate Material Selection and Interface Conscious Process Flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Takahashi; T. Nishimura; L. Chen; S. Sakata; K. Kita; A. Toriumi
Year: 2007
CMOS Devices - Physics and Technologies of Mobility Enhancement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shinichi Takagi; Raphael Clerc
Year: 2007
Extension of Universal Mobility Curve to Multi-Gate MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yoshimoto; N. Sugii; D. Hisamoto; S.-i. Saito; R. Tsuchiya; S. Kimura
Year: 2007
More-than-Universal Mobility in Double-Gate SOI p-FETs with Sub-10-nm Body Thickness -Role of Light-Hole Band and Compatibility with Uniaxial Stress Engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kobayashi; M. Saitoh; K. Uchida
Year: 2007
Physical Understanding of Fundamental Properties of Si (110) pMOSFETs Inversion-Layer Capacitance, Mobility Universality, and Uniaxial Stress Effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Saitoh; S. Kobayashi; K. Uchida
Year: 2007
Mobility Enhancement in Uniaxially Strained (110) Oriented Ultra-Thin Body Single- and Double-Gate MOSFETs with SOI Thickness of Less Than 4 nm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Shimizu; T. Hiramoto
Year: 2007
Examination of Additive Mobility Enhancements for Uniaxial Stress Combined with Biaxially Strained Si, Biaxially Strained SiGe and Ge Channel MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Weber; T. Irisawa; T. Numata; M. Harada; N. Taoka; Y. Yamashita; T. Yamamoto; N. Sugiyama; M. Takenaka; S. Takagi
Year: 2007
Interface-Engineered Ge (100) and (111), N- and P-FETs with High Mobility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Kuzum; A.J. Pethe; T. Krishnamohan; Y. Oshima; Yun Sun; J.P. McVittie; P.A. Pianetta; P.C. Mclntyre; K.C. Saraswat
Year: 2007
High Performance pMOSFETs Using Si/Si1-xGex/Si Quantum Wells with High-k/Metal Gate Stacks and Additive Uniaxial Strain for 22 nm Technology Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Suthram; P. Majhi; G. Sun; P. Kalra; H.R. Harris; K.J. Choi; D. Heh; J. Oh; D. Kelly; R. Choi; B.J. Cho; M.M. Hussain; C. Smith; S. Banerjee; W. Tsai; S.E. Thompson; H.H. Tseng; R. Jammy
Year: 2007
Modeling & Simulation - Nanotubes, Nanowires, and Nanoribbons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giuseppe Iannaccone; Nobuyuki Sano
Year: 2007
Three-dimensional Modeling of Gate Leakage in Si Nanowire Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Luisier; A. Schenk; W. Fichtner
Year: 2007
Band Structure Effects on the Current-Voltage Characteristics of SNW-FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Gnani; A. Gnudi; S. Reggiani; M. Rudan; G. Baccarani
Year: 2007
1-D and 2-D Devices Performance Comparison Including Parasitic Gate Capacitance and Screening Effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lan Wei; Jie Deng; H.-S.P. Wong
Year: 2007
A Comprehensive Atomic Study of Carbon Nanotube Schottky Diode Using First Principles Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ping Bai; Kai Tak Lam; Erping Li; K.K.-f. Chang
Year: 2007
Performance Comparison of Graphene Nanoribbon Schottky Barrier and MOS FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Fiori; Youngki Yoon; Seokmin Hong; G. Iannaccone; Jing Guo
Year: 2007
Simulation Investigation of Double-Gate CNR-MOSFETs with a Fully Self-Consistent NEGF and TB Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ximeng Guan; Ming Zhang; Qiang Liu; Zhiping Yu
Year: 2007
Solid-State and Nanoelectronic Devices - Emerging Resistive RAM and New Function On Silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sunae Seo; Jacques Gautier
Year: 2007
Low Power and High Speed Switching of Ti-doped NiO ReRAM under the Unipolar Voltage Source of less than 3 V
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tsunoda; K. Kinoshita; H. Noshiro; Y. Yamazaki; T. Iizuka; Y. Ito; A. Takahashi; A. Okano; Y. Sato; T. Fukano; M. Aoki; Y. Sugiyama
Year: 2007
2-stack 1D-1R Cross-point Structure with Oxide Diodes as Switch Elements for High Density Resistance RAM Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myoung-Jae Lee; Youngsoo Park; Bo-Soo Kang; Seung-Eon Ahn; Changbum Lee; Kihwan Kim; Wenxu Xianyu; G. Stefanovich; Jung-Hyun Lee; Seok-Jae Chung; Yeon-Hee Kim; Chang-Soo Lee; Jong-Bong Park; In-Kyeong Yoo
Year: 2007
A Novel Resistance Memory with High Scalability and Nanosecond Switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Aratani; K. Ohba; T. Mizuguchi; S. Yasuda; T. Shiimoto; T. Tsushima; T. Sone; K. Endo; A. Kouchiyama; S. Sasaki; A. Maesaka; N. Yamada; H. Narisawa
Year: 2007
Single-electron circuit for stochastic data processing using nano-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nishiguchi; A. Fujiwara
Year: 2007
Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature Instability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Grasser; B. Kaczer; P. Hehenberger; W. Gos; R. O'Connor; H. Reisinger; W. Gustin; C. Schunder
Year: 2007
Theory and Practice of On-the-fly and Ultra-fast VT Measurements for NBTI Degradation: Challenges and Opportunities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.E. Islam; E.N. Kumar; H. Das; S. Purawat; V. Maheta; H. Aono; E. Murakami; S. Mahapatra; M.A. Alam
Year: 2007
Material Dependence of NBTI Physical Mechanism in Silicon Oxynitride (SiON) p-MOSFETs: A Comprehensive Study by Ultra-Fast On-The-Fly (UF-OTF) IDLIN Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.N. Kumar; V.D. Maheta; S. Purawat; A.E. Islam; C. Olsen; K. Ahmed; M.A. Alam; S. Mahapatra
Year: 2007
On-The-Fly Interface Trap Measurement and Its Impact on the Understanding of NBTI Mechanism for p-MOSFETs with SiON Gate Dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.J. Liu; Z.Y. Liu; Darning Huang; C.C. Liao; L.F. Zhang; Z.H. Gan; Waisum Wong; C. Shen; Ming-Fu Li
Year: 2007
Real Vth instability of pMOSFETs under practical operation conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.F. Zhang; Z. Ji; M.H. Chang; B. Kaczer; G. Groeseneken
Year: 2007
New Observations on the Hot Carrier and NBTI Reliability of Silicon Nanowire Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Runsheng Wang; Ru Huang; Dong-Won Kim; Yandong He; Zhenhua Wang; Gaosheng Jia; Park Donggun; Yangyuan Wang
Year: 2007
Displays, Sensors, and MEMS - Chemical and Biological Sensors, and Microsystems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Julian Gardner; Joost van Beek
Year: 2007
Three technologies for a smart miniaturized gas-sensor: SOI CMOS, micromachining, and CNTs - challenges and performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Udrea; S. Maeng; J.W. Gardner; J. Park; M.S. Haque; S.Z. Ali; Y. Choi; P.K. Guha; S.M.C. Vieira; H.Y. Kim; S.H. Kim; K.C. Kim; S.E. Moon; K.H. Park; W.I. Milne; S.Y. Oh
Year: 2007
AlGaN/GaN Heterostructure Field Effect Transistors for High Temperature Hydrogen Sensing with Enhanced Sensitivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junghui Song; Wu Lu
Year: 2007
Improved Liquid Phase Chromatography Separation using Sub-micron Micromachining Technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.S. Tezcan; A. Verbist; W. De Malsche; J. Vangelooven; H. Eghbali; D. Clicq; G. Desmet; P. De Moor
Year: 2007
Optoelectronic Tweezers for Manipulation of Cells and Nanowires
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.C. Wu
Year: 2007
Integrated ZnO Surface Acoustic Wave Microfluidic and Biosensor System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.S. Lee; Y.Q. Fu; S. Maeng; X.Y. Du; S.C. Tan; J.K. Luo; A.J. Flewitt; S.H. Kim; N.M. Park; Y.J. Choi; H.C. Yoon; S.Y. Oh; W.I. Milne
Year: 2007
Electrical measurement of adhesion and viability of living cells with a silicon chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Bandiera; M. Borgo; G. Cellere; A. De Toni; L. Santoni; M. Dal Maschio; S. Girardi; L. Lorenzelli; A. Paccagnella
Year: 2007
8300V Blocking Voltage AlGaN/GaN Power HFET with Thick Poly-AlN Passivation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Uemoto; D. Shibata; M. Yanagihara; H. Ishida; H. Matsuo; S. Nagai; N. Batta; Ming Li; T. Ueda; T. Tanaka; D. Ueda
Year: 2007
650 V 3.1 mΩcm2 GaN-based monolithic bidirectional switch using normally-off gate injection transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Morita; M. Yanagihara; H. Ishida; M. Hikita; K. Kaibara; H. Matsuo; Y. Uemoto; T. Ueda; T. Tanaka; D. Ueda
Year: 2007
High-performance p-channel diamond MOSFETs with alumina gate insulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Hirama; H. Takayanagi; S. Yamauchi; Y. Jingu; H. Umezawa; H. Kawarada
Year: 2007
Stress-Induced Mobility Enhancement for Integrated Power Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Moens; J. Roig; F. Clemente; I. De Wolf; B. Desoete; F. Bauwens; M. Tack
Year: 2007
Impact of Self-Heating Effect on Hot Carrier Degradation in High-Voltage LDMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Chang Cheng; J.F. Lin; Tahui Wang
Year: 2007
CMOS Devices - Advanced Device Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Sheng Chang; Akira Hokazono
Year: 2007
Observation of Mobility Enhancement in Strained Si and SiGe Tri-Gate MOSFETs with Multi-Nanowire Channels Trimmed by Hydrogen Thermal Etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Tezuka; E. Toyoda; S. Nakaharai; N. Hirashita; N. Sugiyama; N. Taoka; Y. Yamashita; O. Kiso; M. Harada; T. Yamamoto; S. Takagi
Year: 2007
Investigation of nanowire size dependency on TSNWFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung Dae Suk; Ming Li; Yun Young Yeoh; Kyoung Hwan Yeo; Keun Hwi Cho; In Kyung Ku; Hong Cho; WonJun Jang; Dong-Won Kim; Donggun Park; Won-Seong Lee
Year: 2007
New Self-Aligned Silicon Nanowire Transistors on Bulk Substrate Fabricated by Epi-Free Compatible CMOS Technology: Process Integration, Experimental Characterization of Carrier Transport and Low Frequency noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Tian; Ru Huang; Yiqun Wang; Jing Zhuge; Runsheng Wang; Jia Liu; Xing Zhang; Yangyuan Wang
Year: 2007
Experimental Investigation on Superior PMOS Performance of Uniaxial Strained ≪110≫ Silicon Nanowire Channel By Embedded SiGe Source/Drain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Li; Kyoung Hwan Yeo; Yun Young Yeoh; Sung Dae Suk; Keun Hwi Cho; Dong-Won Kim; Donggun Park; Won-Seong Lee
Year: 2007
A Novel Body Effect Reduction Technique to Recessed Channel Transistor Featuring Partially Insulating Layer Under Source and Drain : Application to Sub-50nm DRAM Cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong-Man Park; Si-Ok Sohn; Jung-Soo Park; Sang-Yeon Han; Jun-Bum Lee; Wookje Kim; Chang-Hoon Jeon; Shin-Deuk Kim; Young-Pil Kim; Yong-Seok Lee; S. Yamada; Wouns Yang; Donggun Park; Won-Seong Lee
Year: 2007
Ultra-Low Leakage Silicon-on-Insulator Technology for 65 nm Node and Beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Cai; A. Majumdar; D. Dobuzinsky; T.H. Ning; S.J. Koester; W.E. Haensch
Year: 2007
High Performance 60 nm Gate Length Germanium p-MOSFETs with Ni Germanide Metal Source/Drain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamamoto; Y. Yamashita; M. Harada; N. Taoka; K. Ikeda; K. Suzuki; O. Kiso; N. Sugiyama; S. Takagi
Year: 2007
Solid-State and Nanoelectronic Devices - Nanoscale Flash and DRAM Technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tejas Krishnamohan; Samuel Fung
Year: 2007
A High-Speed BE-SONOS NAND Flash Utilizing the Field-Enhancement Effect of FinFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tzu-Hsuan Hsu; Hang-Ting Lue; Erh-Kun Lai; Jung-Yu Hsieh; Szu-Yu Wang; Ling-Wu Yang; Ya-Chin King; T. Yang; Kuang-Chao Chen; Kuang-Yeu Hsieh; Rich Liu; Chih-Yuan Lu
Year: 2007
Highly Scalable Vertical Double Gate NOR Flash Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoon Cho; P. Kapur; P. Kalavade; K.C. Saraswat
Year: 2007
Advantages of the FinFET architecture in SONOS and Nanocrystal memory devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Lombardo; C. Gerardi; L. Breuil; C. Jahan; L. Perniola; G. Cina; D. Corso; E. Tripiciano; V. Ancarani; G. Iannaccone; G. Iacono; C. Bongiorno; J. Razafindramora; C. Garozzo; P. Barbera; E. Nowak; R. Puglisi; G.A. Costa; C. Coccorese; M. Vecchio; E. Rimini; J. Van Houdt; B. De Salvo; M. Melanotte
Year: 2007
New Generation of Z-RAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Okhonin; M. Nagoga; E. Carman; R. Beffa; E. Faraoni
Year: 2007
A Unified-RAM (URAM) Cell for Multi-Functioning Capacitorless DRAM and NVM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Woo Han; Seong-Wan Ryu; Chungjin Kim; Sungho Kim; Maesoon Im; Sung Jin Choi; Jin Soo Kim; Kwang Hee Kim; Gi Sung Lee; Jae Sub Oh; Myeong Ho Song; Yun Chang Park; Jeoung Woo Kim; Yang-Kyu Choi
Year: 2007
Extremely Low-voltage and High-speed Operation Bulk Thyristor-SRAM/DRAM (BT-RAM) Cell with Triple Selective Epitaxy Layers (TEL)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sugizaki; M. Nakamura; M. Yanagita; M. Shinohara; T. Ikuta; T. Ohchi; K. Kugimiya; S. Kanda; K. Yagami; T. Oda
Year: 2007
Modeling and Simulation - Simulation of Processes and Advanced Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masami Hane; Andrea Ghetti
Year: 2007
Current Capabilities and Future Prospects of Atomistic Process Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Jaraiz; P. Castrillo; R. Pinacho; J.E. Rubio
Year: 2007
Experimental and Theoretical Analysis of Dopant Diffusion and C Evolution in High-C Si:C Epi Layers: Optimization of Si:C Source and Drain Formed by Post-Epi Implant and Activation Anneal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Cho; N. Zographos; S. Thirupapuliyur; V. Moroz
Year: 2007
Novel doping technology for a 1nm NiSi/Si junction with dipoles comforting Schottky (DCS) barrier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Yamauchi; Y. Nishi; Y. Tsuchiya; A. Kinoshita; J. Koga; K. Kato
Year: 2007
Bulk and interface band diagrams of advanced intermetal dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Guedj; E. Martinez; C. Licitra; G. Imbert; J.P. Barnes; D. Lafond; A. Toffoli; V. Arnal; L. Anaud
Year: 2007
FR-4 and CMOS: Enabling Technologies for Consumer Volume Millimeterwave Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Laskar; S. Pinel; D. Dawn; S. Sarkar; P. Sen; B. Perunama; D. Yeh
Year: 2007
New Three-Dimensional Integration Technology Based on Reconfigured Wafer-on-Wafer Bonding Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fukushima; H. Kikuchi; Y. Yamada; T. Konno; Jun Liang; K. Sasaki; K. Inamura; T. Tanaka; M. Koyanagi
Year: 2007
Toward next high performances MIM generation: up to 30fF/μm2 with 3D architecture and high-κ materials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Jeannot; A. Bajolet; J.-P. Manceau; S. Cremer; E. Deloffre; J.-P. Oddou; C. Perrot; D. Benoit; C. Richard; P. Bouillon; S. Bruyere
Year: 2007
Displays, Sensors, and MEMS - Imagers and Optical Detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bedabrata Pain; Jan Bosiers
Year: 2007
A 0.5 μm pixel frame-transfer CCD image sensor in 110 nm CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Fife; A. El Gamal; H.-S.P. Wong
Year: 2007
Development of a Production-Ready, Back-Illuminated CMOS Image Sensor with Small Pixels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Joy; Sunggyu Pyo; Sunghyung Park; Changhoon Choi; C. Palsule; Hyungjun Han; Chen Feng; Sangjoo Lee; J. McKee; P. Altice; C. Hong; C. Boemler; J. Hynecek; M. Louie; Juil Lee; Daebyung Kim; H. Haddad; B. Pain
Year: 2007
Two-Transistor Active Pixel Sensor for High Resolution Large Area Digital X-ray Imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Taghibakhsh; K.S. Karim
Year: 2007
3 D real-time CCD imager based on Background-Level-Subtraction scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Hashimoto; F. Kurihara; F. Tsunesada; K. Imai; Y. Takada; K. Taniguchi
Year: 2007
Potentiality of Silicon Optical Modulator Based on Free-Carrier Absorption
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Tabei; T. Hirata; K. Kajikawa; H. Sunami
Year: 2007
Applying SVM to build supplier evaluation model - comparing likert scale and fuzzy scale
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.F. Hsu; B. Chang; H.F. Hung
Year: 2007
ERP sandtable simulation evaluation based on ANP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ran Bi; Jinyu Wei; Rui Chen
Year: 2007
An integrated Theory-Of-Constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ray; B. Sarkar; S. Sanyal
Year: 2007
Research on FTOPSIS Model of Threat Synthetic Evaluation in Multi-target Tracing System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.H. Wang; J.G. Huang; X.S. Qin; Z.H. Yan; J. Bai
Year: 2007
Modeling software integration scenarios for telecommunications operations software vendors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Mazhelis; P. Tyrvainen; E. Viitala
Year: 2007
The Analysis and the solving of local protectionism in passenger transportation between adjacent cities based on game theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yun Chen; Wei Tang
Year: 2007
A new method for huge group decision-making
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rong Liu; Xiaohong Chen
Year: 2007
Investigating customers’ decision to accept e-banking services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Mashhadi; M. Tofighi; V. Salamat
Year: 2007
Stochastic management for randomly broken multi-channel servers for e-commerce applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Song-Kyoo Kim
Year: 2007
An empirical study on influencing factors of enterprise recruiter’s conditional brand choice of E-recruiting provider
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Sun; Hsin-Chuan Chou; Xinmin Peng; Guilin Guo; Fangwen Zhu; Kai Wang; Ying Zhang
Year: 2007
A new financial engineering model for analyzing the royalty of BOT projects: The Taiwan case
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chao-Chung Kang; Cheng-Min Feng; Szu-Chi Huang
Year: 2007
Study on Effects, Limits and Current Situation of E-learning System —an Example on Small-median Enterprises
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.H. Fang; G.L. Chen; Y.M. Chiang
Year: 2007
Urban road interchange type selection based on Multiple Attributes Decision Making
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kejun Long; Xiaoguang Yang; Jianlong Zheng
Year: 2007
Inventory-location models for remote and direct retailing with time-sensitive demand
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Berman; D. Krass; M.B.C. Menezes
Year: 2007
A conceptual model for knowledge flow in supply chain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Khadivar; A.R. Zadeh; M. Khani; S.M.J. Jalali
Year: 2007
Strategy evolution and market leaderships: new evidences from semiconductor memory industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Ma; J. Yu
Year: 2007
Quantifying world-class using AHP for manufacturing industries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kodali; M. Sharma
Year: 2007
Management control system on international outsourcing manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Koenig; F. Geiskopf; E. Caillaud; M. Sonntag
Year: 2007
Construction of online game addiction based on player experience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Qin; P.P. Rau; H.Q. Zhong
Year: 2007
Influence of control modes and complexity on performance of manual-control spacecraft rendezvous and docking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.J. Zhang; Y.Z. Xu; J. Li; Z.Z. Li; S. Wu
Year: 2007
A comparative study of musical navigation methods for visually impaired users of GUI systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Q.Y. Zhao; S. Xu; Z.Z. Li; L. Wang
Year: 2007
Characteristics of Speeders on Freeway Ramps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.S. Liu; C.H. Lo
Year: 2007
A pilot measurement of head-related transfer function blur in spatial localization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Xu; L. Zeng; Z.Z. Li; C.D. Tian; G. Salvendy
Year: 2007
A study of morphological influence on head-related transfer functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Xu; Z.Z. Li; L. Zeng; G. Salvendy
Year: 2007
Road hazard reaction testing using driving simulation: the novice vs. the experienced drivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Wang; P. Peng; Lijun Liang; W. Zhang; S. Wu
Year: 2007
Incorporating user acceptance into usability evaluation scheme for the user interface of mobile services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bahn; C. Lee; J.H. Jo; W.Y. Suh; J. Song; M.H. Yun
Year: 2007
The effects of different breath alcohol concentration and post alcohol upon driver’s driving performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.C. Liu; C.H. Ho
Year: 2007
Incremental mining and re-mining of frequent patterns without storage of intermediate patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fan-Chen Tseng
Year: 2007
Spatial credibilistic clustering algorithm in noise image segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Wen; L. Zheng; J. Zhou
Year: 2007
Recognition of semiconductor defect patterns using spectral clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hsuan Wang
Year: 2007
Modeling the valuation process of silicon intellectual property in the semiconductor industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.L. Hung; Y.H. Su; A.L.-P. Cheng
Year: 2007
Optimal age-replacement model with minimal repair based on cumulative repair cost limit and random lead time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Chien; J.A. Chen
Year: 2007
An investigation on the multiple attribute decision making (MADM) methods for solving the cell formation problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ahi; B. Ashtiani; M.-B. Aryanezhad; A. Makui
Year: 2007
Surface profile tolerance measuring method using kriging method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.S. Kim; H.G. Choi
Year: 2007
Modeling of energy efficiency indicator for semiconductor industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li-Ming Wu; Bai-Sheng Chen
Year: 2007
360 Degree personnel performance appraisal using the MADM Models and
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Anisseh; J. Dodangeh; F. Piri; M.A. Dashti
Year: 2007
Product development performance measures in manufacturing firm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:ZhongHang Bai; Peng Zhang; Fang Liu; RunHua Tan
Year: 2007
Development of a new model for the flowshop problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Mashhadi; E.F. Stafford; F.T. Tseng
Year: 2007
Real-time dynamic multilevel optimization for Demand-side Load management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duy Long Ha; F.F. de Lamotte; Quoc Hung Huynh
Year: 2007
Differing roles of axiomatic design and design structure matrix in reducing system complexity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yee Soon Lim
Year: 2007
Developing a New Structure for Determining Time Risk Priority using Risk Breakdown matrix in EPC Projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Iranmanesh; M. Jalili; Zh. Pirmoradi
Year: 2007
Estimating project completion times - simulation and analytic approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gonen
Year: 2007
A new approach for buffer sizing in critical chain scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Ashtiani; G.-R. Jalali; M.-B. Aryanezhad; A. Makui
Year: 2007
R&D project management standardization: an empirical research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guilin Guo; Yidong Chen; Yuan Sun; Xiaohong Zhou
Year: 2007
A study on software reliability prediction based on support vector machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Yang; Xiang Li
Year: 2007
Software release optimization for a non-kalman filter SRGM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X. Jiang; D. Du; T.G. Ray; S.N. Ghazavi
Year: 2007
A Neural Network ensemble for classifying source(s) in multivariate manufacturing processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian-Bo Yu; Li-Feng Xi
Year: 2007
Speeding-up experiences return during new productions industrialization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bassetto; A. Mili; A. Siadat
Year: 2007
Middleware platform for customizable vehicle reconfiguration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.C. Lim; Y.C. Wang; N. Kulathuramaiyer
Year: 2007
Business model innovation through collaborative product development: a case study of design services in Taiwan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hsing Chu; Cheng Han-Chung
Year: 2007
Supplier selection using rough set theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Chang; H.F. Hung; C.C. Lo
Year: 2007
Supply chain grounded on information theory: criterion weighting and its explication of a hierarchical economic information filtering model of supplier selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Shu; S. Chen; B.L. MacCarthy; L. Muyldermans; K.K. Lai; S.Y. Wang
Year: 2007
A simulation and prediction model to enhance e-service sharing and SCM market competition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.K. Chiang; Kiekang Chao
Year: 2007
Alignment strategies of AMT with E-commerce setting to improve business strategy in the supply chain operations environment -an empirical study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.Y. Sha; P.K. Chen; Yung-Hsin Chen
Year: 2007
Selection of potential 3PL services providers using TOPSIS with interval data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.N. Qureshi; D. Kumar; P. Kumar
Year: 2007
Implementing design for six sigma to supply chain design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Amer; Lee Luong; Sang-Heon Lee; W.Y.C. Wang; M.A. Ashraf; Z. Qureshi
Year: 2007
Capacity sourcing using a reservation contract
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hazra; B. Mahadevan
Year: 2007
A Two-phase algorithm for the manufacturer’s pallet loading problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Wu; C.J. Ting
Year: 2007
Motives, trends and effects in cross-border acquisitions in the finish technical engineering industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Ojanen; P. Salmi; M. Torkkeli
Year: 2007
Eliminating emergency department wait by BPR implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kumar; S.J. Shim
Year: 2007
E-government reform and shared services in Taiwan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.K. Chiang; K. Huang; E. Yen
Year: 2007
Reconstruction for energy efficiency, incentive mechanism strategic logistics, a way to evolve towards a lean organization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Carrasqueira; V.C. Machado
Year: 2007
Researches on the relationship between mechanism of service innovation and knowledge creation in the alliance network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Licheng Ren; Cuihua Wu; Chunfeng Chai; Yongyun Zhang; Kanliang Wang
Year: 2007
A case study of applying spectral clustering technique in the value analysis of an outfitter’s customer database
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:En-Chi Chang; Shian-Chang Huang; Hsin-Hung Wu; Chiao-Fang Lo
Year: 2007
Advanced Look-ahead Based Approach (ALBA) for distributed simulation of supply chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tammineni; J. Venkateswaran
Year: 2007
Finite Element Method modeling and analysis for aeronautic synchronous generator with damper windings on unloading and short-circuit conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaohe Ma; Songhua Shen; Luyan Bi; Jianfeng Li
Year: 2007
Development of surface roughness prediction model using response surface methodology in high speed end milling of AISI H13 tool steel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M.K. Hafiz; A.K.M.N. Amin; A.N.M. Karim; M.A. Lajis
Year: 2007
Risk assessment of ship navigation using Bayesian learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hu Shenping; Cai Cunqiang; Fang Quangen
Year: 2007
Determinants of job satisfaction in the it industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Calisir; C.A. Gumussoy
Year: 2007
An empirical investigation of the knowledge management strategic alignment model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yue-Yang Chen; Hui-Ling Huang; Tsai-Pei Liu
Year: 2007
Knowledge management system architecture for the industry cluster
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Sureephong; N. Chakpitak; Y. Ouzrout; G. Neubert; A. Bouras
Year: 2007
Research on rapid design process model of large-scale valve for product innovation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X.D. Li; R.H. Tan; L.X. Geng; B.J. Yang
Year: 2007
Application-oriented technology valuation: examples from the semiconductor industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chun-Teh Lee; Ching-Torng Lin
Year: 2007
Market scope of vendors in the OSS software market
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Frank; E. Luoma; P. Tyrvainen
Year: 2007
Knowledge management approach in mobile software system testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ong Kein Wei; Tang Mei Ying
Year: 2007
Knowledge sharing and KM effectiveness in technology R&D teams: transactive memory system and team-based outcome expectations perspectives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.C. Huang; T.J. Huang
Year: 2007
Disruptive Process Innovation in Semiconductor Industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Srikanth; C.C. Hang; K.H. Chai
Year: 2007
Statistical analysis of simulation output data: The practical state of the art
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Law
Year: 2007
Inside discrete-event simulation software: How it works and why it matters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Schriber; D.T. Brunner
Year: 2007
Extendsim 7
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Krahl
Year: 2007
Determining efficient simulation run lengths for real time decision making
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Cheng
Year: 2007
Kriging metamodeling in constrained simulation optimization: an explorative study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.E. Biles; J.P.C. Kleijnen; W.C.M. van Beers; I. van Nieuwenhuyse
Year: 2007
Estimating the probability of a rare event over a finite time horizon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.-T. de Boer; P. L'Ecuyer; G. Rubino; B. Tuffin
Year: 2007
Non-linear control variates for regenerative steady-state simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sujin Kim; S.G. Henderson
Year: 2007
Implications of heavy tails on simulation-based ordinal optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Broadie; M. Han; A. Zeevi
Year: 2007
A method for fast generation of bivariate poisson random vectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaeyoung Shin; R. Pasupathy
Year: 2007
Automating des output analysis: How many replications to run
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Hoad; S. Robinson; R. Davies
Year: 2007
A Bayesian Approach to Analysis of Limit Standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.R. Creasey; K.P. White
Year: 2007
Optimizing time warp simulation with reinforcement learning techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Wang; C. Tropper
Year: 2007
An efficient algorithm in the HLA time management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Buquan Liu; Yiping Yao; Huaimin Wang
Year: 2007
User-friendly scheduling tools for large-scale simulation experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.A. James; K.A. Hawick; C.J. Scogings
Year: 2007
Semantics of Petri Nets: A Comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Juhas; F. Lehocki; R. Lorenz
Year: 2007
Duality in high level petri-nets - a basis to do diagnoses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.R. Muller; E. Schnieder
Year: 2007
How to synthesize nets from languages - a survey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Lorenz; S. Mauser; G. Juhas
Year: 2007
Optimistic parallel discrete event simulation of the event-based transmission line matrix method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.W. Bauer; E.H. Page
Year: 2007
Composability and component-based discrete event simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Buss; C. Blais
Year: 2007
Organising insights into simulation practice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Pidd; S. Robinson
Year: 2007
System and simulation modeling using SYSML
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Huang; R. Ramamurthy; L.F. McGinnis
Year: 2007
Composing simulation models using interface definitions based on web service descriptions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Rohl; S. Morgenstern
Year: 2007
Simulation metamodels for modeling output distribution parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.R. Santos; P.R. Santos
Year: 2007
An empirical comparison between nonlinear programming optimization and simulated annealing (SA) algorithm under a higher moments bayesian portfolio selection framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingjing Lu; M. Liechty
Year: 2007
Panel: distributed simulation in industry - a real-world necessity or ivory tower fancy?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Lendermann; M.U. Heinicke; L.F. McGinnis; C. McLean; S. Strassburger; S.J.E. Taylor
Year: 2007
Simulation-based, ontology driven resource plan development 1|Michael ^Graul
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Graul; P. Benjamin; A. Keen; F. Boydstun
Year: 2007
System implementation issues of dynamic discrete disaster decision simulation system (D4S2) - phase I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shengnan Wu; L.J. Shuman; B. Bidanda; M. Kelley; B. Lawson; K. Sochats; C.D. Balaban
Year: 2007
Allocation of resources for hospital evacuations via simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Tayfur; K. Taaffe
Year: 2007
Modeling bioterrorism preparedness with simulation in rural healthcare system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lisa Patvivatsiri; Elliot J. Montes; Ouyang Xi
Year: 2007
Comparision of potential paths selected by a malicious entity with hazardous materials : Minimization of time vs. minimization of distance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Nune; P. Murray-Tuite
Year: 2007
Cyber attack modeling and simulation for network security analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Kuhl; J. Kistner; K. Costantini; M. Sudit
Year: 2007
Upgraded cellular automata based group-work interaction simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Shengping; Hu Bin
Year: 2007
Agent-model validation based on historical data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.E. Champagne; R.R. Hill
Year: 2007
An Exploration-Based Taxonomy for Emergent Behavior Analysis in Simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Gore; P.F. Reynolds
Year: 2007
Simulation of passenger check-in at a medium-sized us airport
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Appelt; R. Batta; Li Lin; C. Drury
Year: 2007
Advanced national airspace traffic flow management simulation experiments and vlidation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Hunter; B. Boisvert; K. Ramamoorthy
Year: 2007
IRS post-filing processes simulation modeling: A comparison of des with econometric microsimulation in tax administration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Greenland; E.L. Morrison; D. Connors; J.L. Guyton; M. Sebastiani
Year: 2007
Modeling and simulation of group behavior in E-Government implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiang Wu; Bin Hu
Year: 2007
Application of BML to inter-agent communication in the ITSIMBW simulation environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Hugelmeyer; U. Schade; T. Zoller
Year: 2007
Integration of underwater sonar simulation with a Geografical Information System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanshen Zhu; S. Sala-Diakanda; L. Rabelo; J. Sepulveda; M. Bull
Year: 2007
A knowledge-based method for the validation of military simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feiyan Min; Ping Ma; Ming Yang
Year: 2007
Bi-criteria evaluation of an outpatient procedure center via simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.R. Huschka
Year: 2007
Modeling of patient flows in a large-scale outpatient hospital ward by making use of electronic medical records
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Takakuwa; D. Katagiri
Year: 2007
A stochastic equation-based model of the value Of international air-travel restrictions for controlling pandemic flu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M. Goedecke; G.V. Bobashev; Feng Yu
Year: 2007
A flexible, large-scale, distributed agent based epidemic model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Parker
Year: 2007
“Pull” replenishment performance as a function of demand rates and setup times under optimal settings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.T. Enns
Year: 2007
Measuring manufacturing throughput using takt time analysis and simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Duanmu; K. Taaffe
Year: 2007
Modeling and simulation of hard disk dive final assembly usign a HDD template
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Ali; R. de Souza
Year: 2007
Using quantiles in ranking and selection procedures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Bekki; J.W. Fowler; G.T. Mackulak; B.L. Nelson
Year: 2007
An analysis of tool capabilities in the photolithography area of an asic fab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.J. Byrne; C. Heavey; K.E. Kabak
Year: 2007
Hierarchical distributed simulation for 300mm wafer fab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng Xu; L.F. McGinnis
Year: 2007
Reusable tool for 300mm intrabay AMHS modeling and simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. El-Nashar; K.S. El-Kilany
Year: 2007
Assessing tram schedules using a library of simulation components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.M. Kanacilo; A. Verbraeck
Year: 2007
Simulating air traffic blockage due to convective weather conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liling Ren; Dawei Chang; S. Solak; J.-P.B. Clarke; E. Barnes; E. Johnson
Year: 2007
Towards a user-centred road safety management method based on road traffic simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gregoriades
Year: 2007
Appraisal of airport alternatives in greenland by the use of risk analysis and monte carlo simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim Bang Sailing; S. Leleur
Year: 2007
Construction noise prediction and barrier optimization using special purpose simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gannoruwa; J.Y. Ruwanpura
Year: 2007
Modeling and representation of non-value adding activities due to errors and changes in design and construction projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sangwon Han; SangHyun Lee; M.G. Fard; F. Pena-Mora
Year: 2007
Special purpose simulation template for workflow analysis in construction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Palaniappan; A. Sawhney; H.H. Bashford; K.D. Walsh
Year: 2007
Simulation tool for manpower forecast loading and resource leveling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hanna; J.Y. Ruwanpura
Year: 2007
Optimal scheduling of probabilistic repetitive projects using completed unit and genetic algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Srisuwanrat; P.G. Ioannou
Year: 2007
Enabling smooth and scalable dynamic 3D visualization of discrete-event construction simulations in outdoor augmented reality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.H. Behzadan; V.R. Kamat
Year: 2007
Validation of simulated real world TCP stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Jansen; A. McGregor
Year: 2007
Effective workforce lifecycle management via system dynamics modeling and simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lianjun An; Jun-Jang Jeng; Y.M. Lee; Changrui Ren
Year: 2007
IFAO-Simo: A spatial-simulation based facility network optimization framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Xie; Wei Wang; Wenjun Yin; Jin Dong
Year: 2007
Agent-based simulations of service policy decisions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.B. Lam
Year: 2007
Modeling the performance of low latency queueing for emergency telecommunications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M. Bevilacqua Masi; M.J. Fischer; D.A. Garbin
Year: 2007
Using event simulation to evaluate Internet Protocol enhancements for special services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.A. Garbin; P. McGregor; D.M. Bevilacqua Masi
Year: 2007
Overmolded flip chip packaging solution for large die FPGA with 65nm low-k dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laurene Yip; Raghunandan Chaware
Year: 2007
Designer heat spreading materials and composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Allen J. Amaro; K.R.S. Murthy
Year: 2007
Performance-cost optimization of a diamond heat spreader
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anita Rogacs; Jinny Rhee
Year: 2007
iNEMI’s gap analysis based on the 2007 electronics roadmap
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alan Rae; Robert C. Pfahl; Charles Richardson
Year: 2007
On the study of parylene-N for millimeter-wave integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosa R. Lahiji; Hasan Sharifi; Saeed Mohammadi; Linda P.B. Katehi
Year: 2007
Effect of silica on the non-linear electrical property of polymer composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guseul Yun; Yangyang Sun; Fei Xiao; Kyoung-sik Moon; C. P. Wong
Year: 2007
A novel Ag-Cu lamination process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pin J. Wang; Jong S. Kim; Chin C. Lee
Year: 2007
Characterization of a thick copper pillar bump process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Warren W. Flack; Ha-Ai Nguyen; Elliott Capsuto; Craig McEwen
Year: 2007
Fine-pitch carbon nanotube bundles assembly using CNT transfer for electrical interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lingbo Zhu; Kyoung-Sik Moon; Dennis W. Hess; C. P. Wong
Year: 2007
First-principles simulation study on the effects of dopants on the cohesion of gold grain boundary
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.H. Chew; C.C. Wong; Z. Bakar; J. Ling
Year: 2007
In-situ thermal deformation measurement of low-k layer using nano-pattern recognition and correlation technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongbo Bi; Bongtae Han
Year: 2007
Measurement of the pre-arcing time and the fulgurite length in hbc fuse in the case of tests performed with an A.C. 100 KVA station
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Bussiere; D. Rochette; S. Memiaghe; G. Velleaud; T. Latchimy; P. Andre
Year: 2007
Dependence of current interruption performance on the element patterns of etched fuses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Ishikawa; K. Hirose; M. Asayama; Yasushi
Year: 2007
Comparison of electrical behaviour beetween the liquid metal current limiter and the low voltage melting fuse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Koprivsek
Year: 2007
Radiarion of system of linear wires in magnetoplasma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.M. Yatsenko; E.A. Yatsenko
Year: 2007
Ultra-low power biopotential interfaces and their application in wearable and implantable systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chris Van Hoof; Refet Firat Yazicioglu; Tom Torfs; Patrick Merken
Year: 2007
CMOS chips for bio molecule sensing purposes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Thewes
Year: 2007
Molecular electronic circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.D. Franzon
Year: 2007
Smart sensors for fast biological analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lanzoni; C. Stagni; B. Ricco
Year: 2007
Chemical design, synthesis and thin film supramolecular architecture for advanced performance chemo- and bio-sensing organic field effect transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.M. Farinola; L. Torsi; F. Naso; P.G. Zambonin; L. Valli; M.C. Tanese; O.H. Omar; G. Giancane; F. Babudri; F. Palmisano
Year: 2007
A two electrode C - NiO Nafion® amperometric sensor for NO2 detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Fort; C. Lotti; M. Mugnaini; C.A. Palmerini; R. Palombari; S. Rocchi; L. Tondi; V. Vignoli
Year: 2007
Chromatographic System Based on Amorphous Silicon Photodiodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Caputo; G. de Cesare; C. Manetti; A. Nascetti; R. Scipinotti
Year: 2007
A readout circuit in 0.35μm CMOS technology for Lab-on-a-Chip applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Delizia; S. D'Amico; A. Baschirotto
Year: 2007
Modeling and design of a microdisk photonic sensor for biological applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.M.N. Passaro; B. Casamassima; F. De Leonardis; F. Dell'Olio; F. Magno
Year: 2007
A configurable architecture for the detection of DNA sequences based on a E2PROM device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Abbati; P. Placidi; A. Scorzoni; M. Lanzoni
Year: 2007
A CMOS Integrated DNA-chip for hybridization detection with digital output
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Barbara; A. Caboni; D. Loi
Year: 2007
Design of an integrated low-noise read-out system for DNA capacitive sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. De Venuto; G. Indiveri; A. Valentini
Year: 2007
Sensor networks for industrial applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Flammini; P. Ferrari; D. Marioli; E. Sisinni; A. Taroni
Year: 2007
Postprocessing Technologies, Interface Circuits and Packaging Strategies for CMOS Compatible Gas Flow Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bruschi; M. Piotto; N. Bacci
Year: 2007
Multiplexing of Fiber Bragg Grating Sensors: Time windowed improved C-PFM reading technique. An experimental validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Rossi; G. Breglio; A. Cusano; A. Irace; V. Pascazio; A. Cutolo
Year: 2007
Electronic system trends and challenges in present day particle experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Snoeys
Year: 2007
Highly integrated system-on-chip circuits for the readout of high-energy physics detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Musa
Year: 2007
Current-mode front-end electronics for silicon photo-multiplier detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Corsi; M. Foresta; C. Marzocca; G. Matarrese; A. Del Guerra
Year: 2007
A CMOS high-speed front-end for cluster counting techniques in ionization detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Baschirotto; S. D'Amico; M. De Matteis; F. Grancagnolo; M. Panareo; R. Perrino; G. Chiodini; G. Tassielli
Year: 2007
Nanobiosensors Based on Individual Olfactory Receptors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Pajot-Augy
Year: 2007
Do olfactory receptors respond to explosives?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Lopalco; S. Lobasso; A. Corcelli; M. Dibattista; R. Araneda; Z. Peterlin; S. Firestein
Year: 2007
An Integrated Analog Lock-In Amplifier for Low-Voltage Low-Frequency Sensor Interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. De Marcellis; G. Ferri; M. Patrizi; V. Stornelli; A. D'Amico; C. Di Natale; E. Martinelli; A. Alimelli; R. Paolesse
Year: 2007
Sensitivity Analysis of Rib Waveguides for Integrated Optical Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Dell'Olio; V.M.N. Passaro; F. De Leonardis
Year: 2007
Realization of a physical mask by laser micro-cutting process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Bonserio; M. Giannini; A.M. Losacco; G. Pappalettera
Year: 2007
Oligothiophenes bearing polar groups for organic thin film transistors: synthesis, characterisation and preliminary gas sensing results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Dell'Aquila; P. Mastrorilli; C.F. Nobile; G. Romanazzi; G.P. Suranna; L. Torsi; M.C. Tanese; F. Marinelli; D. Acierno; E. Amendola; P. Morales; S. Mhaisalkar
Year: 2007
A Binocular Sensor Interface for Moving Objects Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Costantini; D. Casali; R. Perfetti; M. Carota
Year: 2007
Superconducting tunnel junction x-ray detectors with ultra-low subgap current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Maggi; N. De Leo; M. Fretto; V. Lacquaniti; A. Agostino; P. Verhoeve
Year: 2007
Hollow core waveguides for optical chemical sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Loiacono; F. Dell'Olio; V.M.N. Passaro
Year: 2007
A carbon nanotube-based quartz crystal nanobalance for NH3 detection : Toward the assembling of a sensing platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lucci; V. Sessa; S. Orlanducci; E. Tamburri; F. Toschi; M.L. Terranova; A. Reale; A. Fiorello; C. Falessi
Year: 2007
Email Categorization Using Multi-stage Classification Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Islam; Wanlei Zhou
Year: 2007
Realistic Evaluation of Interconnection Network Performance at High Loads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.J. Ridruejo; J. Navaridas; J. Miguel-Alonso; C. Izu
Year: 2007
A FPGA Implementation of Variable Kernel Convolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sriram; D. Kearney
Year: 2007
Implementing a Phase Screen Generator in Hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sriram; D. Kearney
Year: 2007
Checking Integrity Constraints with Various Types of Integrity Tests for Distributed Databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ibrahim; A.A. Alwan; N.I. Udzir
Year: 2007
An Object Driven Partitioning Approach for Distributed Virtual Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Bouras; E. Giannaka; T. Tsiatsos
Year: 2007
High Throughput Multi-port MT19937 Uniform Random Number Generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sriram; D. Kearney
Year: 2007
A System for Robust Peer-to-Peer Communication with Dynamic Protocol Selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Wallis; F. Henskens; M. Hannaford
Year: 2007
MHGrid: Towards an Ideal Optimization Environment for Global Optimization Problems Using Grid Computing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Wahib; M. Munetomo; A. Munawar; K. Akama
Year: 2007
Robust Placement of Mobile Relational Operators for Large Scale Distributed Query Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Ergenc; F. Morvan; A. Hameurlain
Year: 2007
Randomized Initialization on the 1-Dimensional Reconfigurable Mesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nakano
Year: 2007
Grid Unit: A Self-Managing Building Block for Grid System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianfeng Zhan; Lei Wang; Ming Zou; Hui Wang; Shuang Gao; Yulei Ding
Year: 2007
Incorporating Fault Tolerance with Replication on Very Large Scale Grids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Sundararajan; A. Harwood; R. Kotagiri
Year: 2007
A Visualized Parallel Network Simulator for Modeling Large-Scale Distributed Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siming Lin; Xueqi Cheng; Jianming Lv
Year: 2007
CBX-1 Switch: An Effective Load Balanced Switch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoliang Wang; Xiaohong Jiang; S. Horiguchi
Year: 2007
Permutation Capability of Optical Cantor Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ren Kaixin; Gu Naijie
Year: 2007
A Fault Tolerant Topology Control Algorithm for Large-Scale Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lili Wang; Huihua Jin; Jianxun Dang; Yi Jin
Year: 2007
Design and Analysis of a Backpressure Congestion Control Algorithm in Wireless Sensor Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Ouyang; Chuang Lin; Fengyuan Ren; Hongkun Yang; Xiaomeng Huang; Ting Liu
Year: 2007
OTC: An Optimized Topology Control Algorithm for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Ababneh; S. Selvakennedy
Year: 2007
Trust Management and Negotiation for Attestation in Trusted Platforms Using Web Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Nagarajan; V. Varadharajan; M. Hitchens
Year: 2007
A 3D Graphics to SVG Adaptation Framework for Progressive Remote Line Rendering on Mobile Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minh Tuan Le; Congdu Nguyen; Dae-Il Yoon; Eun Ku Jung; Hae-Kwang Kim
Year: 2007
A Business Model Feasibility Analysis Framework in Ubiquitous Technology Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Byoung Gun Kim; Nam Joo Jeon; Choon Seong Leem; Byeong Wan Kim; Seung Hyun Lee
Year: 2007
A Calibration of Coefficient in the Multi-bandwidth Images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyung Moo Kim; Dong Min Seo; Jae Soo Yoo; Kang Soo You; Hoon Sung Kwak
Year: 2007
A Client Framework for Massively Multiplayer Online Games on Mobile Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yung-Wei Kao; Pin-Yin Peng; Sheau-Ling Hsieh; Shyan-Ming Yuan
Year: 2007
A Collaborative Conference Key Agreement Scheme by Using an Intermediary Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Chen Chang; Hao-Chuan Tsai; Pen-Yi Chang
Year: 2007
A Competition Model Based on Natural Tree Growth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaiwen Guo; Kama Huang
Year: 2007
A Conceptual Framework for Impact of Information Technology on Supply Chain Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Fasanghari; S. Mohammadi; M. Khodaei; A. Abdollahi; F. Habibipour
Year: 2007
A Context-Aware Smart Tourist Guide Application for an Old Palace
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da-Jung Park; Sang-Hee Hwang; Ah-Reum Kim; Byeong-Mo Chang
Year: 2007
A Context-Aware Workflow System for a Smart Home
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongyun Cho; Jongsun Choi; Jaeyoung Choi
Year: 2007
A Cost-Based Information Model for an Interior Design in a Large-Scale Housing Project
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoon-ku Lee; Yoon-sun Lee; Kyong-hoon Kim; Jae-jun Kim
Year: 2007
A Design of Location Information Management System in Positioning Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O-Hoon Choi; Jaewon Kim; Jung-Eun Lim; Doo-Kwon Baik
Year: 2007
A Design of New Face/Non-face Classifier Based on Face Boundary Training
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Kil Lim; Sung-Hoon Kim; Hyon-Soo Lee
Year: 2007
A Divide-and-Conquer Approach to Detecting Latent Community of Practice from Virtual Organizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Jung; Chul-Mo Koo; Geun-Sik Jo
Year: 2007
A Fire Detection and Rescue Support Framework with Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeon-sup Lim; Sangsoon Lim; Jaehyuk Choi; Seongho Cho; Chong-kwon Kim; Yong-Woo Lee
Year: 2007
A Hierarchical Architecture of N-Port Memory Based on FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Zuo; Gu Yijun
Year: 2007
A Holistic Approach on Deep Web Schema Matching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Zhong; Yuchen Fu; Quan Liu; Xinghong Lin; Zhiming Cui
Year: 2007
A Hybrid Cache Cohrency Scheme for Ubiquitous Mobile Clients
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miseon Choi; Wonik Park; Young-Kuk Kim
Year: 2007
A Hybrid Model for Web Image Annotation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng Huang; Jiajun Bu; Chun Chen; Kangmiao Liu; Wei Chen
Year: 2007
A Hybrid Object Matching Method for Deep Web Information Integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pengpeng Zhao; Chao Lin; Wei Fang; Zhiming Cui
Year: 2007
A Hybrid-Based RFID Authentication Protocol Supporting Distributed Database
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sangjin Kim; Jihwan Lim; Heekuck Oh
Year: 2007
A Integrated Corporate Merger Decision-Making System for the Taiwanese Cable Television Industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsung-Nan Chou
Year: 2007
A Knowledge-Acquisition Strategy Based on Genetic Programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chan-Sheng Kuo; Tzung-Pei Hong; Chuen-Lung Chena
Year: 2007
A LBS System for Cellular Phones
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyounggyu Lee; Yongwoo Lee
Year: 2007
A Method for Constructing An Efficient Basis for Trace Calculation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nasu; Y. Nogami; R. Namba; Y. Morikawa
Year: 2007
A Method of Performance Evaluation by Using the Analytic Network Process and Balanced Score Car
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming-Chang Lee
Year: 2007
A Multiple User Class Dynamic Stochastic Assignment in Travel Information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongtaek Lim
Year: 2007
A Multistrategy Semantic Web Service Matching Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuchen Fu; Tao Jin; Xinghong Ling; Quan Liu; Zhiming Cui
Year: 2007
A New Algorithm for Computing Infarct Volume in a Rat Stroke Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaetak Lee; S. Le Saint; Ja-Kyeong Lee; Kyungsook Han
Year: 2007
A New Algorithm for Wavelet Watermarking Based on Linear Bit Expansion and Its Similarity Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongri Piao; Seoktae Kim
Year: 2007
A New Authentication Protocol for IEEE 802.11 Using a Group Key Supporting Fast Handover
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Changyong Lee; Heekuck Oh; Sangjin Kim
Year: 2007
A New Snake for Hand Tracking Using Textural Information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyung Hyun Jang; Do Kyung Shin; Young Shik Moon
Year: 2007
A New Type of Collusion Attacks against Threshold Proxy Signature Schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhuojun Liu; Zuowen Tan
Year: 2007
A New Version of Bayesian Rough Set Based on Bayesian Confirmation Measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.R. Abbas; Liu Juan; S.O. Mahdi
Year: 2007
A Novel Adaptively Dynamic Tuning of the Contention Window (CW)for Distributed Coordination Function in IEEE 802.11 Ad hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Lv; Xinming Zhang; Xiaojun Han; Yanyan Fu
Year: 2007
A Novel Approach to Manage Trust in Ad Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qian Zhou; Lemin Li; Sheng Wang; Shizhong Xu; Wei Tan
Year: 2007
A Novel Design Technique Using Extended PMCP(Program and Metadata Communication Protocol) for ACAP(Advanced Common Application Platform)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Inhwa Choi; M.J. Cho; Jun Hwang; Taikyeong Jeong; Gyung-Lean Park
Year: 2007
A Novel Fuzzy Filtering Method to Faint Harmonic Signals in UWB System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Ya-tao; Jiang Hua; Fan Xiao-hong
Year: 2007
A Novel Public Key Watermarking Scheme Based on Shuffling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yonggang Fu
Year: 2007
A Novel Vehicle Safety Traffic Pre-warning Decision on Multi-sensor Information Fusion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong Chen; Changhua Zhang; Xiyue Huang
Year: 2007
A Novel Way of Issuing Multiple Private Keys in ID-based Cryptosystems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Donghyun Kim; Sangjin Kim; Heekuck Oh
Year: 2007
A Quadtree Based Data Accuracy Scheme for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Tariq; Kyung-suk Lhee; Man-Pyo Hong
Year: 2007
A Scheduling Algorithm on Heterogeneous Star and Tree Grid Computing Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kun Huang; Zhi Yan Wang; Xiao Xiong Weng; Wei Wei Lin
Year: 2007
A Secure Deployment Framework of NEMO (Network Mobility)with Firewall Traversal and AAA Server
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seong Yee Phang; Hoon Jae Lee; Hyotaek Lim
Year: 2007
A Selective Anchor Node Localization Algorithm for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shuang Tian; Xinming Zhang; Xinguo Wang; Peng Sun; Haiyang Zhang
Year: 2007
A Separation of Concerns Proposal for the Modeling of Collaborative Learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Caeiro-Rodriguez; M. Llamas-Nistal; L. Anido-Rifon
Year: 2007
A Service Oriented Model for Role Based Global Cooperative Software Development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Xu
Year: 2007
A Services Selection Policy for ServiceBSP Model with QoS-aware in Grids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan Jiang; Weiqin Tong; Wentao Zhao
Year: 2007
A Strategic Proposal for U-construction as a Blue Ocean Industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang-kyu Yoo; Byeoung-Su Kim; Whoi-Yul Kim; Byung-Ju Ahn; Yoon-Sun Lee; Jae-Jun Kim
Year: 2007
A Study on Sensor Node Capture Defense Protocol for Ubiquitous Sensor Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Sik Choi; Seoung Ho Shin
Year: 2007
A Study on the 128 bits SEED Algorithm to Apply in RFID Tag
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hoon Ko; Jiyeon Kim; Jongjin Jung; Yongjun Lee; S. Joe; Yunseok Chang
Year: 2007
A Study on the Document Similarity Judgment Method Using Similar Block Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong-Geun Jeong; Jung-Yeoun Lee; Jin-Ho Joung
Year: 2007
A Survey on Application of Situation Calculus in Business Information Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bing Li; J. Iijima
Year: 2007
A Temporary Binding Update in Fast Handover for Mobile IPv6
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hanh Van Nguyen; Soonghwan Ro; Jungkwan Ryu; Yong-Geun Hong
Year: 2007
A Trust Type Based Model for Managing QoS in Web Services Composition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yukyong Kim; Kyung-Goo Doh
Year: 2007
A Type System for Checking Consistencies of a Policy Specification Used in Ubiquitous Programming Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ki-Hwan Choi; Hye-Ryeong Jeong; Kyung-Goo Doh; Joonseon Ahn; Byeong-Mo Chang
Year: 2007
A Unified Formal Model for Supporting Aspect-Oriented Dynamic Software Architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yiming Lau; Wenyun Zhao; Xin Peng; Yewang Chen; Zhixiong Jiang
Year: 2007
A Web Service Discovery Mechanism Based on Immune Communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Changyou; Zhu Dongfeng; Zhang Yu; Yang Minghua
Year: 2007
Active Contour Model Based on Force Field Tracking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinyong Cheng; Yihui Liu; Ruixiang Jia; Weiyu Guo
Year: 2007
Ad-hoc and Query-Based Indoor Air-Conditioning System Using Low Power Wireless Sensor Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seung-Chul Lee; Wan-Young Chung
Year: 2007
Advanced White List Approach for Preventing Access to Phishing Sites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:JungMin Kang; DoHoon Lee
Year: 2007
Advances in Concept, Framework and Methodology for Measuring the Business Competitiveness through IT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Choon Seong Leem; Eun Jung Yu; Byeong Wan Kim; Seon Do Shin; Jong Hwa Choi
Year: 2007
An Adaptive and Distributed Clustering Scheme for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinguo Wang; Xinming Zhang; Guoliang Chen; Shuang Tian
Year: 2007
An Adaptive Intrusion Detection and Prevention (ID/IP) Framework for Web Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chan Gaik Yee; Wong Hui Shin; G.S.V.R.K. Rao
Year: 2007
An Agent System for B2B EC in Ubiquitous Environment: AgentU
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gyoo Gun Lim; Weon Sang Yoo; Jungwoo Lee
Year: 2007
An Algorithm for Forest Stem Volume Retrieval Under the Condition of Limited Auxiliary Information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Kononov; Min-Ho Ka
Year: 2007
An Analysis of Reliable MAC Layer Multicast in Wireless Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoodoc Song; Junho Chung; Wookyung Sung; Bosung Kim; Dowon Hyun; Juwook Jang
Year: 2007
An Architecture for On-Demand Desktop Computing in a Network Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangbin Xu; Yaoxue Zhang; Yuezhi Zhou; Wenyuan Kuang
Year: 2007
An Area and Feature-Based Matching Method for 3D Reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chun-Hua Zhuang; Zhen-Yu Li; Pu Wang; Chong-Zheng Sun
Year: 2007
An Easy-To-Use Feed Middleware for Application Development with RSS/Atom Feeds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chia-Feng Lin; Chi-Io Tut; Shyan-Ming Yuan
Year: 2007
An ECA-based Mechanism of Non-blocking Device Coordination for a Ubiquitous Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingyu Nam; Dongmin Shin; Sun Hur; Changhee Han; Wonsuk Lee
Year: 2007
An Efficient Policy Establishment Scheme for Web Services Migration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeon-Seok Kim; Kyong-Ho Lee
Year: 2007
An Effort-Minimized DFT Scheme for Microcontroller Aimed at In-System Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fang Bao; Yuanfu Zhao; Jun Du
Year: 2007
An Empirical Study for the Detection of Corporate Financial Anomaly Using Outlier Mining Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mei-Chih Chen; Ren-Jay Wang; An-Pin Chen
Year: 2007
An Energy-Aware On-Demand Clustering Routing Algorithm for Ad Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiren Shi; Chao Huang; Jiuyin Yuan
Year: 2007
An Event-Based Middleware for Agile Resource Management in Hemodialysis Center
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Wu; R. George
Year: 2007
An Improve Algorithm for the Longest Common Subsequence Problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Yuxiang; Dafang Zhang; Jiaohua Qin
Year: 2007
Analysis of EDCA MAC throughput for the IEEE 802.11e WLANs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoon-Sik Yoo; Jung-Rae Kim; You-Jin Kim; Jae-Doo Huh
Year: 2007
Analysis of Internet Voting Protocols with Jonker-Vink Receipt-Freeness Formal Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Meng
Year: 2007
Anonymous and Traceable Communication Using Tamper-Proof Device for Vehicular Ad Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bum Han Kim; Kyu Young Choi; Jun Ho Lee; Dong Hoon Lee
Year: 2007
Anonymous PKI Framework for Privacy-Guaranteed e-Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Byeongcheol Choi; Sohee Park; Jungnyeo Kim; Jeacheol Ryou
Year: 2007
Ant System for a Multi-vehicle Routing Problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Hun Kim
Year: 2007
Applying Extensible Classifier System to Inter-market Arbitrage with High-Frequency Financial Data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:An-Pin Chen; Yu-Chia Hsu; Jia-Haur Chang
Year: 2007
Applying Semantic Knowledge for Event Correlation in Network Fault Managemen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jixilin; Wang jianxin
Year: 2007
Arabic Script Web Documents Language Identification Using Decision Tree-ARTMAP Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Selamat; Ng Choon Ching; Y. Mikami
Year: 2007
Architecture and Implementation of a Semantic Network Model-Based Information Integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:JeongMi Kim; Ju HumKwon; DooKwon Baik
Year: 2007
Architecture Exploration for Performance Improvement of SoC Chip Based on AMBA System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kookpyo Lee; Yungsup Yoon
Year: 2007
Are English Prepositions Simply Degenerate Verbs?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.C. Meurant
Year: 2007
Are Shocks to Inflation Rates Permanent or Temporary? New Evidence from a Panel SURADF Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi-Chung Hsu; Chi-Chuan Lee
Year: 2007
A Transparent Contents Sharing Service with Virtual Media Server
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiyun Park; Sangwook Kim
Year: 2007
Attractor-Based Incursive Observers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Crisan
Year: 2007
Bidirectional 2D-OFD for Face Recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Un-Dong Chang; Kwan-Dong Kim; Young-Gil Kim; Young-Jun Song; Jae-Hyeong Ahn
Year: 2007
BM-CVI: A Backup Method Based on a Cross-Version Integration Mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Wei; Wang Min; He Xiang; Liu Zhenjun
Year: 2007
Broadcast Encryption with Sender Authentication and its Duality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Kanazawa; N. Ohkawa; H. Doi; T. Okamoto; E. Okamoto
Year: 2007
Building Scenario Graph Using Clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.O. Al-Mamory; Hong Li Zhang
Year: 2007
Camera-Based Mobile Indoor Guidance System in Mixed Reality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eunsoo Jung; Sujin Oh; Yanghee Nam; S.E. Kim
Year: 2007
CFD Researches on the e-AIRS : Korean e-Science Aerospace Research System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soon-Heum Ko; Jin-ho Kim; Jae Wan Ahn; Jun Sok Yi; Chongam Kim
Year: 2007
Changes of Pulse Wave Velocity in Arm According to Characteristic Points of Pulse Wave
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-keun Jung; Gi-ryon Kim; Kwang-nyeon Kim; Byeong-cheol Choi; Duk-joon Suh; Gye-rok Jeon; Soo-young Ye
Year: 2007
Channel De-allocation for Packets in Integrated Voice/Data Wireless Communication Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tigang Jiang; Yuming Mao
Year: 2007


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