call-for-papers
Publisher: IEEE Computer Society
Year: 2008
Special Issue on 3D IC Design and Test
Publisher: IEEE Computer Society
Authors:David Kung; Yuan Xie
Year: 2008
Design and test for reliability and efficiency
Publisher: IEEE Computer Society
Authors:Tim Cheng
Year: 2008
Staff listing
Publisher: IEEE Computer Society
Year: 2008
The State of ESL Design [Roundtable]
Publisher: IEEE Computer Society
Authors:Reinaldo Bergamaschi; Luca Benini; Krisztian Flautner; Wido Kruijtzer; Alberto Sangiovanni-Vincentelli; Kazutoshi Wakabayashi
Year: 2008
Advances in ESL Design
Publisher: IEEE Computer Society
Authors:Rajesh Gupta; Arvind; Gerard Berry; Forrest Brewer
Year: 2008
Wafer Test Methods to Improve Semiconductor Die Reliability
Publisher: IEEE Computer Society
Authors:W.R. Mann
Year: 2008
Building an FoC Using Large, Buffered Crossbar Cores
Publisher: IEEE Computer Society
Authors:D. Simos; M.G.H. Katevenis
Year: 2008
Defect Tolerance for Nanoscale Crossbar-Based Devices
Publisher: IEEE Computer Society
Authors:M. Tehranipoor; R.M.P. Rad
Year: 2008
A Systematic Approach to Memory Test Time Reduction
Publisher: IEEE Computer Society
Authors:Jen-Chieh Yeh; Chao-Hsun Chen; Cheng-Wen Wu; Shuo-Fen Kuo
Year: 2008
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 2008
Multisynchronous and Fully Asynchronous NoCs for GALS Architectures
Publisher: IEEE Computer Society
Authors:A. Sheibanyrad; A. Greiner; I. Miro-Panades
Year: 2008
Application Scenarios in Streaming-Oriented Embedded-System Design
Publisher: IEEE Computer Society
Authors:S.V. Gheorghita; T. Basten; H. Corporaal
Year: 2008
Managing Security in FPGA-Based Embedded Systems
Publisher: IEEE Computer Society
Authors:T. Huffmire; B. Brotherton; T. Sherwood; R. Kastner; T. Levin; T.D. Nguyen; C. Irvine
Year: 2008
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2008
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2008
CEDA Currents
Publisher: IEEE Computer Society
Year: 2008
Clarifying the record on testability cost functions
Publisher: IEEE Computer Society
Authors:M.A. Breuer
Year: 2008
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Publisher: IEEE Computer Society
Year: 2008
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Year: 2008
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Year: 2009
Masthead
Publisher: IEEE Computer Society
Year: 2009
Guest Editors' Introduction: The Status of IEEE Std 1500
Publisher: IEEE Computer Society
Authors:Erik Jan Marinissen; Yervant Zorian
Year: 2009
IEEE Std 1500 Enables Modular SoC Testing
Publisher: IEEE Computer Society
Authors:E.J. Marinissen; Y. Zorian
Year: 2009
Improved Core Isolation and Access for Hierarchical Embedded Test
Publisher: IEEE Computer Society
Authors:B. Nadeau-Dostie; S.M.I. Adham; R. Abbott
Year: 2009
Turbo1500: Core-Based Design for Test and Diagnosis
Publisher: IEEE Computer Society
Authors:Laung-Terng Wang; R. Apte; Shianling Wu; Boryau Sheu; Wen-Ben Jone; Jianghao Guo; Kuen-Jong Lee; Wei-Shin Wang; Xiaoqing Wen; Hao-Jan Chao; Jinsong Liu; Yanlong Niu; Yi-Chih Sung; Chi-Chun Wang; Fangfang Li
Year: 2009
CTL and Its Usage in the EDA Industry
Publisher: IEEE Computer Society
Authors:R. Kapur; P. Reuter; S. Bhatia; B. Keller
Year: 2009
The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper
Publisher: IEEE Computer Society
Authors:T. McLaurin; S. Diamantidis; I. Diamantidis
Year: 2009
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor
Publisher: IEEE Computer Society
Authors:K.J. Balakrishnan; G. Giles; J. Wingfield
Year: 2009
Algorithmic Concurrent Error Detection in Complex Digital-Processing Systems
Publisher: IEEE Computer Society
Authors:L. Costas-Perez; J.J. Rodriguez-Andina
Year: 2009
Logic Mapping in Crossbar-Based Nanoarchitectures
Publisher: IEEE Computer Society
Authors:Wenjing Rao; A. Orailoglu; R. Karri
Year: 2009
A CMOS Resizing Methodology for Analog Circuits
Publisher: IEEE Computer Society
Authors:T. Levi; J. Tomas; N. Lewis; P. Fouillat
Year: 2009
call-for-papers
Publisher: IEEE Computer Society
Year: 2008
OCP-IP NoC Benchmarking WG activities
Publisher: IEEE Computer Society
Authors:Ian R. Mackintosh
Year: 2008
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Year: 2008
CEDA Currents
Publisher: IEEE Computer Society
Year: 2008
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Year: 2008
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Year: 2008
Designing Micro- and Nanosystems for a Safer and Healthier Tomorrow
Publisher: IEEE Computer Society
Authors:Giovanni De Micheli
Year: 2008
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Publisher: IEEE Computer Society
Year: 2008
Verification of Pin-Accurate Port Connections
Publisher: IEEE Computer Society
Authors:Geeng-Wei Lee; Juinn-Dar Huang; Jing-Yang Jou; Chun-Yao Wang
Year: 2008
Hardware-Software Approaches to In-Circuit Emulation for Embedded Processors
Publisher: IEEE Computer Society
Authors:Chung-Fu Kao; Ing-Jer Huang; Hsin-Ming Chen
Year: 2008
Signal Integrity Enhancement in Digital Circuits
Publisher: IEEE Computer Society
Authors:Jorge Filipe L C Semiao; Leonardo Bisch Piccoli; Fabian Luis Vargas; Marcial Jesus Rodriguez Irago; Juan J Rodriguez-Andina; Marcelino Bicho dos Santos; Isabel Maria Cacho Teixeira; Joao Paulo Teixeira
Year: 2008
An Interconnect Strategy for a Heterogeneous, Reconfigurable SoC
Publisher: IEEE Computer Society
Authors:Matthias Kühnle; Michael Hübner; Jürgen Becker; Antonio Marcello Coppola; Lorenzo Pieralisi; Riccardo Locatelli; Giuseppe Maruccia; Tommaso DeMarco; Fabio Campi; Antonio Deledda; Claudio Mucci; Florian Ries
Year: 2008
The Challenges of Nanotechnology and Gigacomplexity
Publisher: IEEE Computer Society
Authors:G. Singer; R. Galivanche; S. Patil; M. Tripp
Year: 2009
IEEE Std 1500 enables core-based SoC test development
Publisher: IEEE Computer Society
Year: 2009
CEDA Currents [Includes new IEEE Fellows]
Publisher: IEEE Computer Society
Year: 2009
Test Technology Newsletter
Publisher: IEEE Computer Society
Year: 2009
We need more standards like IEEE 1500
Publisher: IEEE Computer Society
Authors:Miron Abramovici; Al Crouch
Year: 2009
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Year: 2009
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Publisher: IEEE Computer Society
Year: 2009
Call for Papers
Publisher: IEEE Computer Society
Year: 2009
Managing design and test challenges
Publisher: IEEE Computer Society
Year: 2009
[Masthead]
Publisher: IEEE Computer Society
Year: 2009
Guest Editor's Introduction: Examples of Management Decision Criteria
Publisher: IEEE Computer Society
Authors:Yervant Zorian
Year: 2009
The Story behind the Intel Atom Processor Success
Publisher: IEEE Computer Society
Authors:B. Beavers
Year: 2009
Case Study of a 65-nm SoC Design
Publisher: IEEE Computer Society
Authors:A. Chang
Year: 2009
Low-Power Design Solutions for Wireless Multimedia SoCs
Publisher: IEEE Computer Society
Authors:J.-P. Schoellkopf; P. Magarshack
Year: 2009
Incremental Verification with Error Detection, Diagnosis, and Visualization
Publisher: IEEE Computer Society
Authors:Kai-hui Chang; D.A. Papa; I.L. Markov; V. Bertacco
Year: 2009
Computing and Minimizing Cache Vulnerability to Transient Errors
Publisher: IEEE Computer Society
Authors:Wei Zhang
Year: 2009
Test Program Generation for Communication Peripherals in Processor-Based SoC Devices
Publisher: IEEE Computer Society
Authors:A. Apostolakis; D. Gizopoulos; M. Psarakis; D. Ravotto; M.S. Reorda
Year: 2009
Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories
Publisher: IEEE Computer Society
Authors:Li-Ming Denq; Yu-Tsao Hsing; Cheng-Wen Wu
Year: 2009
DATC Newsletter
Publisher: IEEE Computer Society
Year: 2009
CEDA Currents
Publisher: IEEE Computer Society
Year: 2009
Technical management: Best shaken, not stirred [The Last Byte]
Publisher: IEEE Computer Society
Authors:Peggy Aycinena
Year: 2009
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Year: 2009
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Publisher: IEEE Computer Society
Year: 2009
Metamodeling for model- based system design
Publisher: IEEE Computer Society
Authors:Tim Cheng
Year: 2009
Society Information
Publisher: IEEE Computer Society
Year: 2009
Call for Papers
Publisher: IEEE Computer Society
Year: 2009
Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2
Publisher: IEEE Computer Society
Authors:Erik Jan Marinissen; Yervant Zorian
Year: 2009
Automating IEEE 1500 Core Test—An EDA Perspective
Publisher: IEEE Computer Society
Authors:K. Chakravadhanula; V. Chickermane
Year: 2009
Are IEEE-1500-Compliant Cores Really Compliant to the Standard?
Publisher: IEEE Computer Society
Authors:A. Benso; S. Di Carlo; P. Prinetto; A. Bosio
Year: 2009
Test Data Volume Comparison: Monolithic vs. Modular SoC Testing
Publisher: IEEE Computer Society
Authors:O. Sinanoglu; E.J. Marinissen; A. Sehgal; J. Fitzgerald; J. Rearick
Year: 2009
Metamodels in Europe: Languages, Tools, and Applications
Publisher: IEEE Computer Society
Authors:R. Passerone; W. Damm; I. Ben Hafaiedh; S. Graf; A. Ferrari; L. Mangeruca; A. Benveniste; B. Josko; T. Peikenkamp; D. Cancila; A. Cuccuru; S. Gerard; F. Terrier; A. Sangiovanni-Vincentelli
Year: 2009
Metamodeling: An Emerging Representation Paradigm for System-Level Design
Publisher: IEEE Computer Society
Authors:A. Sangiovanni-Vincentelli; Guang Yang; S.K. Shukla; D.A. Mathaikutty; J. Sztipanovits
Year: 2009
Comprehensive Approach to High-Performance Server Chipset Debug
Publisher: IEEE Computer Society
Authors:I. Parulkar; B. Turumella
Year: 2009
Core-Based Testing of Embedded Mixed-Signal Modules in a SoC
Publisher: IEEE Computer Society
Authors:V.A. Zivkovic; J. Schat; F. van der Heyden; G. Seuren
Year: 2009
DATE 2009 Workshop on 3D Integration
Publisher: IEEE Computer Society
Authors:Erik Jan Marinissen; Geert Van Der Plas; Yann Guillou
Year: 2009
CEDA Currents
Publisher: IEEE Computer Society
Year: 2009
DATC Newsletter
Publisher: IEEE Computer Society
Year: 2009
Book Review: A book on system test, and testing systems also
Publisher: IEEE Computer Society
Authors:Scott Davidson
Year: 2009
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2009
Metamodeling: What is it good for?
Publisher: IEEE Computer Society
Authors:V. Tech
Year: 2009
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Year: 2009
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Year: 2009
Call for Papers
Publisher: IEEE Computer Society
Year: 2009
Guest Editors' Introduction: Raising the Abstraction Level of Hardware Design
Publisher: IEEE Computer Society
Authors:Philippe Coussy; Andres Takach
Year: 2009
Society Information
Publisher: IEEE Computer Society
Year: 2009
An Introduction to High-Level Synthesis
Publisher: IEEE Computer Society
Authors:P. Coussy; D.D. Gajski; M. Meredith; A. Takach
Year: 2009
High-Level Synthesis: Past, Present, and Future
Publisher: IEEE Computer Society
Authors:G. Martin; G. Smith
Year: 2009
Virtual Roundtable: User Perspectives
Publisher: IEEE Computer Society
Year: 2009
Lessons and Experiences with High-Level Synthesis
Publisher: IEEE Computer Society
Authors:S. Sarkar; S. Dabral; P.K. Tiwari; R.S. Mitra
Year: 2009
High-Level Dataflow Transformations Using Taylor Expansion Diagrams
Publisher: IEEE Computer Society
Authors:M. Ciesielski; J. Guillot; D. Gomez-Prado; E. Boutillon
Year: 2009
Hardware Coprocessor Synthesis from an ANSI C Specification
Publisher: IEEE Computer Society
Authors:S. Ahuja; S.T. Gurumani; C. Spackman; S.K. Shukla
Year: 2009
Subword Switching Activity Minimization to Optimize Dynamic Power Consumption
Publisher: IEEE Computer Society
Authors:M.C. Molina; R. Ruiz-Sautua; A. Del Barrio; J.M. Mendias
Year: 2009
Statistical High-Level Synthesis under Process Variability
Publisher: IEEE Computer Society
Authors:Yuan Xie; Yibo Chen
Year: 2009
Functional Equivalence Verification Tools in High-Level Synthesis Flows
Publisher: IEEE Computer Society
Authors:A. Mathur; M. Fujita; E. Clarke; P. Urard
Year: 2009
CEDA Currents
Publisher: IEEE Computer Society
Year: 2009
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2009
Book Review: A physical-design picture book
Publisher: IEEE Computer Society
Authors:Igor Markov
Year: 2009
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2009
The Last Byte: The HLS tipping point
Publisher: IEEE Computer Society
Authors:Jason Cong; Wolfgang Rosenstiel
Year: 2009
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Year: 2009
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Publisher: IEEE Computer Society
Year: 2009
Stacking chips in 3D
Publisher: IEEE Computer Society
Year: 2009
[Masthead]
Publisher: IEEE Computer Society
Year: 2009
Guest Editors' Introduction: Opportunities and Challenges of 3D Integration
Publisher: IEEE Computer Society
Authors:David S. Kung; Yuan Xie
Year: 2009
Opportunities and Challenges for 3D Systems and Their Design
Publisher: IEEE Computer Society
Authors:P. Emma; E. Kursun
Year: 2009
Optimizing Decoupling Capacitors in 3D Circuits for Power Grid Integrity
Publisher: IEEE Computer Society
Authors:Pingqiang Zhou; K. Sridharan; S.S. Sapatnekar
Year: 2009
Test Challenges for 3D Integrated Circuits
Publisher: IEEE Computer Society
Authors:H.-H.S. Lee; K. Chakrabarty
Year: 2009
3D DRAM Design and Application to 3D Multicore Systems
Publisher: IEEE Computer Society
Authors:Hongbin Sun; Jibang Liu; R.S. Anigundi; Nanning Zheng; Jian-Qiang Lu; K. Rose; Tong Zhang
Year: 2009
Mixed-Signal Production Test: A Measurement Principle Perspective
Publisher: IEEE Computer Society
Authors:G.W. Roberts; S. Aouini
Year: 2009
Call for Papers
Publisher: IEEE Computer Society
Year: 2009
Statistics in Semiconductor Test: Going beyond Yield
Publisher: IEEE Computer Society
Authors:W.R. Daasch; C.G. Shirley; A. Nahar
Year: 2009
Multidimensional Test Escape Rate Modeling
Publisher: IEEE Computer Society
Authors:K.M. Butler; J.M. Carulli; J. Saxena; A. Nahar; W.R. Daasch
Year: 2009
A Generic Virtual Bus for Hardware Simulator Composition
Publisher: IEEE Computer Society
Authors:M. Ruckert; A. Bottcher; M. Hauser
Year: 2009
Robust On-Chip Signaling by Staggered and Twisted Bundle
Publisher: IEEE Computer Society
Authors:Hao Yu; Lei He; M.-C.F. Chang
Year: 2009
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2009
CEDA Currents
Publisher: IEEE Computer Society
Year: 2009
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2009
The fate of stacking
Publisher: IEEE Computer Society
Authors:David S. Kung
Year: 2009
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Year: 2009
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Year: 2009
Design for reliability and robustness
Publisher: IEEE Computer Society
Year: 2009
Call for Papers
Publisher: IEEE Computer Society
Year: 2009
Masthead
Publisher: IEEE Computer Society
Year: 2009
Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design
Publisher: IEEE Computer Society
Authors:Yu Cao; Jim Tschanz; Pradip Bose
Year: 2009
Reliability Implications of Bias-Temperature Instability in Digital ICs
Publisher: IEEE Computer Society
Authors:S.P. Park; Kunhyuk Kang; K. Roy
Year: 2009
Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements
Publisher: IEEE Computer Society
Authors:M. Bashir; L. Milor
Year: 2009
Overcoming Early-Life Failure and Aging for Robust Systems
Publisher: IEEE Computer Society
Authors:Yanjing Li; Young Moon Kim; E. Mintarno; D.S. Gardner; S. Mitra
Year: 2009
Sensor-Driven Reliability and Wearout Management
Publisher: IEEE Computer Society
Authors:P. Singh; Cheng Zhuo; E. Karl; D. Blaauw; D. Sylvester
Year: 2009
A Novel Simulation Fault Injection Method for Dependability Analysis
Publisher: IEEE Computer Society
Authors:Dongwoo Lee; Jongwhoa Na
Year: 2009
Reliability Challenges and System Performance at the Architecture Level
Publisher: IEEE Computer Society
Authors:J.A. Rivers; P. Kudva
Year: 2009
EOC: Electronic Building Blocks for Embedded Systems
Publisher: IEEE Computer Society
Authors:T. Vallius; J. Roning
Year: 2009
Accelerating Emulation and Providing Full Chip Observability and Controllability
Publisher: IEEE Computer Society
Authors:I. Mavroidis; I. Mavroidis; I. Papaefstathiou
Year: 2009
Conference Reports
Publisher: IEEE Computer Society
Year: 2009
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2009
CEDA Currents
Publisher: IEEE Computer Society
Year: 2009
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2009
The Last Byte: Too many reboots
Publisher: IEEE Computer Society
Authors:Scott Davidson
Year: 2009
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Year: 2009
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Year: 2009
Annual Index
Publisher: IEEE Computer Society
Year: 2009
Call for Papers
Publisher: IEEE Computer Society
Year: 2010
Design & Test in the new decade: Continuity and new directions
Publisher: IEEE Computer Society
Year: 2010
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Year: 2010
[Masthead]
Publisher: IEEE Computer Society
Year: 2010
Guest Editors' Introduction: Confronting the Hardware Trustworthiness Problem
Publisher: IEEE Computer Society
Authors:Mohammad Tehranipoor; Farinaz Koushanfar
Year: 2010
A Survey of Hardware Trojan Taxonomy and Detection
Publisher: IEEE Computer Society
Authors:M. Tehranipoor; F. Koushanfar
Year: 2010
Hardware Trojans in Wireless Cryptographic ICs
Publisher: IEEE Computer Society
Authors:Y. Jin; Y. Makris
Year: 2010
Attacks and Defenses for JTAG
Publisher: IEEE Computer Society
Authors:K. Rosenfeld; R. Karri
Year: 2010
Secure and robust error correction for physical unclonable functions
Publisher: IEEE Computer Society
Authors:Meng-Day Yu; Srinivas Devadas
Year: 2010
Preventing IC Piracy Using Reconfigurable Logic Barriers
Publisher: IEEE Computer Society
Authors:A. Baumgarten; A. Tyagi; J. Zambreno
Year: 2010
Verification-Purpose Operating System for Microprocessor System-Level Functions
Publisher: IEEE Computer Society
Authors:Lingkan Gong; Jingfen Lu
Year: 2010
CEDA Currents
Publisher: IEEE Computer Society
Year: 2010
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2010
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2010
Conference Reports
Publisher: IEEE Computer Society
Year: 2010
Variability: For headache and profit
Publisher: IEEE Computer Society
Authors:M. Potkonjak
Year: 2010
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Year: 2010
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Year: 2010
Call for Papers
Publisher: IEEE Computer Society
Year: 2010
Call for Papers
Publisher: IEEE Computer Society
Year: 2010
Compact variability modeling to the rescue
Publisher: IEEE Computer Society
Year: 2010
[Masthead]
Publisher: IEEE Computer Society
Year: 2010
Guest Editors' Introduction: Compact Variability Modeling in Scaled CMOS Design
Publisher: IEEE Computer Society
Authors:Yu Cao; Frank Liu
Year: 2010
Modeling Process Variability in Scaled CMOS Technology
Publisher: IEEE Computer Society
Authors:S.K. Saha
Year: 2010
Layout Proximity Effects and Modeling Alternatives for IC Designs
Publisher: IEEE Computer Society
Authors:Xi-Wei Lin; V. Moroz
Year: 2010
Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP
Publisher: IEEE Computer Society
Authors:Binjie Cheng; D. Dideban; N. Moezi; C. Millar; G. Roy; Xingsheng Wang; S. Roy; A. Asenov
Year: 2010
Extensions to Backward Propagation of Variance for Statistical Modeling
Publisher: IEEE Computer Society
Authors:C.C. McAndrew; I. Stevanovic; Xin Li; G. Gildenblat
Year: 2010
Compact Modeling of Variation in FinFET SRAM Cells
Publisher: IEEE Computer Society
Authors:D.D. Lu; Chung-Hsun Lin; A.M. Niknejad; Chenming Hu
Year: 2010
Power Supply Noise: A Survey on Effects and Research
Publisher: IEEE Computer Society
Authors:M. Tehranipoor; K.M. Butler
Year: 2010
NSF Workshop on EDA: Past, Present, and Future (Part 1)
Publisher: IEEE Computer Society
Authors:Robert Brayton; Jason Cong
Year: 2010
Conference Reports
Publisher: IEEE Computer Society
Authors:Rohit Kapur
Year: 2010
CEDA Currents
Publisher: IEEE Computer Society
Year: 2010
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2010
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2010
'Tis the gift to be simple
Publisher: IEEE Computer Society
Authors:Sani R. Nassif
Year: 2010
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Year: 2010
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Year: 2010
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis
Publisher: IEEE Computer Society
Authors:Manish Sharma; Chris Schuermyer; Brady Benware
Year: 2010
Economic Analysis of the HOY Wireless Test Methodology
Publisher: IEEE Computer Society
Authors:YuTsao Hsing; LiMing Denq; Chao-Hsun Chen; Cheng-Wen Wu
Year: 2010
Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch
Publisher: IEEE Computer Society
Authors:Pouria Bastani; Nick Callegari; Li-C Wang; Magdy S Abadir
Year: 2010
Microprocessor Software-Based Self-Testing
Publisher: IEEE Computer Society
Authors:Mihalis Psarakis; Dimitris Gizopoulos; Ernesto Sanchez; Matteo Sonza Reorda
Year: 2010
Enabling design and manufacturing through innovations in DFT
Publisher: IEEE Computer Society
Year: 2010
[Masthead]
Publisher: IEEE Computer Society
Year: 2010
Automatic Test Wrapper Synthesis for a Wireless ATE Platform
Publisher: IEEE Computer Society
Authors:Chun-Yu Yang; Ying-Yen Chen; Sung-Yu Chen; Jing-Jia Liou
Year: 2010
NSF Workshop on EDA: Past, Present, and Future (Part 2)
Publisher: IEEE Computer Society
Authors:Robert Brayton; Jason Cong
Year: 2010
Conference Reports
Publisher: IEEE Computer Society
Authors:Rohit Kapur
Year: 2010
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2010
Scaling: More than Moore's law
Publisher: IEEE Computer Society
Authors:Andrew B. Kahng
Year: 2010
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2010
CEDA Currents
Publisher: IEEE Computer Society
Year: 2010
Time to retire our benchmarks
Publisher: IEEE Computer Society
Authors:Rob Aitken
Year: 2010
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Year: 2010
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Year: 2010
Optical Interconnect for High-End Computer Systems
Publisher: IEEE Computer Society
Authors:Ron Ho; Frankie Liu; Dinesh Patil; Xuezhe Zheng; Guoliang Li; Ivan Shubin; Elad Alon; Jon Lexau; Herb Schwetman; John Cunningham; Ashok V Krishnamoorthy
Year: 2010
Short-Range, Wireless Interconnect within a Computing Chassis: Design Challenges
Publisher: IEEE Computer Society
Authors:Patrick Chiang; Sirikarn Woracheewan; Charles Hu; Lei Guo; Rahul Khanna; Jay Nejedlo; Huaping Liu
Year: 2010
Carbon Nanomaterials: The Ideal Interconnect Technology for Next-Generation ICs
Publisher: IEEE Computer Society
Authors:Hong Li; Chuan Xu; Kaustav Banerjee
Year: 2010
Wireless Interconnect and the Potential for Carbon Nanotubes
Publisher: IEEE Computer Society
Authors:Alireza Nojeh; Andre Ivanov
Year: 2010
Global On-Chip Coordination at Light Speed
Publisher: IEEE Computer Society
Authors:Zheng Li; Moustafa Mohamed; Hongyu Zhou; Li Shang; Alan Mickelson; Dejan Filipovic; Manish Vachharajani; Xi Chen; Wounjhang Park; Yihe Sun
Year: 2010
Call for Papers
Publisher: IEEE Computer Society
Year: 2010
Overcoming interconnect bottlenecks in gigascale ICs
Publisher: IEEE Computer Society
Year: 2010
Masthead
Publisher: IEEE Computer Society
Year: 2010
Guest Editors' Introduction: Promises and Challenges of Novel Interconnect Technologies
Publisher: IEEE Computer Society
Authors:Partha Pratim Pande; Sriram Vangal
Year: 2010
Chips in 3D
Publisher: IEEE Computer Society
Authors:Igor Markov
Year: 2010
When is 3D 2B?
Publisher: IEEE Computer Society
Authors:Andrew B. Kahng
Year: 2010
CEDA Currents [including TCAD Best Paper Award]
Publisher: IEEE Computer Society
Year: 2010
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2010
Conference Reports
Publisher: IEEE Computer Society
Authors:Rohit Kapur
Year: 2010
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2010
On-chip networks: Two sides of the same coin
Publisher: IEEE Computer Society
Authors:Radu Marculescu
Year: 2010
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Year: 2010
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Year: 2010
A Common Language Framework for Next-Generation Embedded Testing
Publisher: IEEE Computer Society
Authors:M Portolan; S Goyal; B Van Treuren; C Chiang; T Chakraborty; T Cook
Year: 2010
BIST to Detect and Characterize Transient and Parametric Failures
Publisher: IEEE Computer Society
Authors:A Sanyal; S Alam; S Kundu
Year: 2010
Measurement-Based Ring Oscillator Variation Analysis
Publisher: IEEE Computer Society
Authors:Koh Johguchi; Akihiro Kaya; Hans Jürgen Mattausch; Tetsushi Koide; Shinya Izumi; Norio Sadachika
Year: 2010
Speeding Up Physical Synthesis with Transactional Timing Analysis
Publisher: IEEE Computer Society
Authors:David Papa; Igor L Markov; Michael D Moffitt; Charles J Alpert
Year: 2010
Call for Papers
Publisher: IEEE Computer Society
Year: 2010
Next-generation design and test innovations
Publisher: IEEE Computer Society
Year: 2010
[Masthead]
Publisher: IEEE Computer Society
Year: 2010
Dynamic Task Mapping for MPSoCs
Publisher: IEEE Computer Society
Authors:Ewerson Luiz de Souza Carvalho; Ney Laert Vilar Calazans; Fernando Gehm Moraes
Year: 2010
Spray-painting on the wall of EDA [review of EDAgraffiti (McLellan, P.; 2010)]
Publisher: IEEE Computer Society
Authors:Grant Martin
Year: 2010
CEDA Currents
Publisher: IEEE Computer Society
Year: 2010
Conference Reports
Publisher: IEEE Computer Society
Year: 2010
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 2010
Test Technology TC Newsletter
Publisher: IEEE Computer Society
Year: 2010
The ABCs of ITC
Publisher: IEEE Computer Society
Authors:Ron Press; Erik Volkerink
Year: 2010
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Year: 2010
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Year: 2010
The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane
Publisher: IEEE Computer Society
Authors:Rajiv Joshi; Anthony R Pelella; Arthur Tuminaro; Yuen Chan; Rouwaida Kanj
Year: 2010
Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures
Publisher: IEEE Computer Society
Authors:Mohammad Abdullah Al Faruque; Janmartin Jahn; Thomas Ebi; Jörg Henkel
Year: 2010
Increasing yield and reliability through postsilicon tuning
Publisher: IEEE Computer Society
Year: 2010
Call for Papers
Publisher: IEEE Computer Society
Year: 2010
Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair
Publisher: IEEE Computer Society
Authors:Swarup Bhunia; Rahul Rao
Year: 2010
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems
Publisher: IEEE Computer Society
Authors:V Natarajan; S Sen; A Banerjee; A Chatterjee; G Srinivasan; F Taenzler
Year: 2010
Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies
Publisher: IEEE Computer Society
Authors:Wu-Hsin Chen; Byunghoo Jung
Year: 2010
Postsilicon Adaptation for Low-Power SRAM under Process Variation
Publisher: IEEE Computer Society
Authors:M Cho; J Schlessman; H Mahmoodi; M Wolf; S Mukhopadhyay
Year: 2010
A Built-in Method to Repair SoC RAMs in Parallel
Publisher: IEEE Computer Society
Authors:Tsu-Wei Tseng; Jin-Fu Li; Chih-Sheng Hou
Year: 2010
[Masthead]
Publisher: IEEE Computer Society
Year: 2010
Conference Reports
Publisher: IEEE Computer Society
Year: 2010
CEDA Currents
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Year: 2010
Design Automation Technical Committee Newsletter
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Year: 2010
Test Technology TC Newsletter
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Year: 2010
Are you having fun yet?
Publisher: IEEE Computer Society
Authors:Stephen Kosonocky
Year: 2010
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Year: 2010
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Year: 2010
Annual Index
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Year: 2010
Fast-Write Resistive RAM (RRAM) for Embedded Applications
Publisher: IEEE Computer Society
Authors:Shyh-Shyuan Sheu; Kuo-Hsing Cheng; Meng-Fan Chang; Pei-Chia Chiang; Wen-Pin Lin; Heng-Yuan Lee; Pang-Shiu Chen; Yu-Sheng Chen; Tai-Yuan Wu; Frederick T Chen; Keng-Li Su; Ming-Jer Kao; Ming-Jinn Tsai
Year: 2011
Scalable Spin-Transfer Torque RAM Technology for Normally-Off Computing
Publisher: IEEE Computer Society
Authors:Takayuki Kawahara
Year: 2011
Challenges and Directions for Low-Voltage SRAM
Publisher: IEEE Computer Society
Authors:Masood Qazi; Mahmut E Sinangil; Anantha P Chandrakasan
Year: 2011
Embedded DRAM in 45-nm Technology and Beyond
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Authors:Darren L Anand; Kevin W Gorman; Mark D Jacunski; Adrian J Paparelli
Year: 2011
Call for Papers
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Year: 2011
Embedded memory technologies: Present and future
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Year: 2011
Call for Papers
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Year: 2011
Guest editors' introduction: Nanoscale Memories Pose Unique Challenges
Publisher: IEEE Computer Society
Authors:Chris H. Kim; Leland Chang
Year: 2011
Embedded Memories: Progress and a Look into the Future
Publisher: IEEE Computer Society
Authors:Kiyoo Itoh
Year: 2011
Bit Cell Optimizations and Circuit Techniques for Nanoscale SRAM Design
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Authors:Fatih Hamzaoglu; Yih Wang; Pramod Kolar; Liqiong Wei; Yong-Gee Ng; Uddalak Bhattacharya; Kevin Zhang
Year: 2011
Modeling, Architecture, and Applications for Emerging Memory Technologies
Publisher: IEEE Computer Society
Authors:Yuan Xie
Year: 2011
Evolution of EDA standards worldwide
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Authors:Stan Krolikoski
Year: 2011
Design for manufacturability: Then and now
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Authors:A B Kahng
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Conference Reports
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Year: 2011
CEDA Currents
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Design Automation Technical Committee Newsletter
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Year: 2011
Test Technology TC Newsletter
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Year: 2011
Playing together nicely
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Authors:Scott Davidson
Year: 2011
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Year: 2011
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Year: 2011
Exploring NoC-Based MPSoC Design Space with Power Estimation Models
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Authors:L Ost; G Guindani; F G Moraes; L S Indrusiak; S Määttä
Year: 2011
Customizable Domain-Specific Computing
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Authors:Jason Cong; Glenn Reinman; Alex Bui; Vivek Sarkar
Year: 2011
[Masthead]
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Year: 2011
Targeting Design, Verification, and Test Challenges
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Year: 2011
Low-Power, Resilient Interconnection with Orthogonal Latin Squares
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Authors:Seung Eun Lee; Yoon Seok Yang; G S Choi; Wei Wu; R Iyer
Year: 2011
Hybrid Testbench Acceleration for Reducing Communication Overhead
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Authors:Chin-Lung Chuang; Chien-Nan Liu
Year: 2011
A Metric to Target Small-Delay Defects in Industrial Circuits
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Authors:M Yilmaz; M Tehranipoor; K Chakrabarty
Year: 2011
Synthesizing Multiple Scan Trees to Optimize Test Application Time
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Authors:K Shu-Min Li; Jr-Yang Huang
Year: 2011
Roads not taken
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Authors:Andrew B. Kahng
Year: 2011
Test Technology TC Newsletter
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Year: 2011
CEDA Currents
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Year: 2011
Information marches on
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Year: 2011
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Year: 2011
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Year: 2011
Automatic TLM Generation for Early Validation of Multicore Systems
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Authors:Samar Abdi; Gunar Schirner; Yonghyun Hwang; Daniel D Gajski; Lochi Yu
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On MPSoC Software Execution at the Transaction Level
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Authors:Frederic Petrot; Marius Gligor; Mian-Muhammed Hamayun; Hao Shen; Nicolas Fournel; Patrice Gerin
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Improving Analog and RF Device Yield through Performance Calibration
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Authors:N Kupp; He Huang; Y Makris; P Drineas
Year: 2011
Selective Hardening: Toward Cost-Effective Error Tolerance
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Authors:I Polian; J P Hayes
Year: 2011
Multicore Simulation of Transaction-Level Models Using the SoC Environment
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Authors:Weiwei Chen; Xu Han; R Doemer
Year: 2011
Interactive Debug of SoCs with Multiple Clocks
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Authors:B Vermeulen; K Goossens
Year: 2011
Call for Papers
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Year: 2011
Guest Editors' Introduction: Multicore SoC Validation with Transaction-Level Models
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Authors:Prabhat Mishra; Zeljko Zilic; Sandeep Shukla
Year: 2011
Challenges of Rapidly Emerging Consumer Space Multiprocessors
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Authors:Z Zilic; P Mishra; S Shukla
Year: 2011
Three Misconceptions Regarding Standards
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Authors:S Krolikoski
Year: 2011
Conference Reports
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Year: 2011
Panel Summaries
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Year: 2011
The Future of Signoff
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Authors:A B Kahng
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CEDA Currents
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Year: 2011
Test Technology TC Newsletter
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Year: 2011
Design Automation Technical Committee Newsletter
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A Brief History of Multiprocessors and EDA
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Authors:S Shukla; P Mishra; Z Zilic
Year: 2011
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Year: 2011
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Year: 2011
A Robust Architectural Approach for Cryptographic Algorithms Using GALS Pipelines
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Authors:Rafael Iankowski Soares; Ney Laert Vilar Calazans; Fernando Gehm Moraes; Philippe Maurine; Lionel Torres
Year: 2011
High-Performance Asynchronous Pipelines: An Overview
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Year: 2011
Asynchronous Design: Distant Dream or Reality?
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Year: 2011
[Masthead]
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Year: 2011
Guest Editors' Introduction: Asynchronous Design Is Here to Stay (and Is More Mainstream Than You Thought)
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Year: 2011
Call for Papers
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Year: 2011
Metastability and Synchronizers: A Tutorial
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Proteus: An ASIC Flow for GHz Asynchronous Designs
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Authors:P. A. Beerel; G. D. Dimou; A. M. Lines
Year: 2011
An Evaluation of Asynchronous Stacks
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Authors:J. Ebergen; D. Finchelstein; R. Kao; J. Lexau; D. Hopkins
Year: 2011
Asynchrony in Quantum-Dot Cellular Automata Nanocomputation: Elixir or Poison?
Publisher: IEEE Computer Society
Authors:M. Graziano; M. Vacca; D. Blua; M. Zamboni
Year: 2011
Bringing Robustness and Power Efficiency to Autonomous Energy-Harvesting Microsystems
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Authors:Jean-Frederic Christmann; E. Beigne; C. Condemine; P. Vivet; J. Willemin; N. Leblond; C. Piguet
Year: 2011
Conference Reports
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Year: 2011
Can We Trust the Chips of the Future?
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Year: 2011
Roadmapping Power
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Authors:Andrew B. Kahng
Year: 2011
Explicit and Implicit Contributions to Standards Groups
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Authors:Stan Krolikoski
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Learning and Practice of the Property Specification Language
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CEDA Currents
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Year: 2011
Test Technology TC Newsletter
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Year: 2011
Asynchronous FUD
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Authors:Al Davis
Year: 2011
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Year: 2011
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Year: 2011
Cyberphysical Systems: Workload Modeling and Design Optimization
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Authors:P. Bogdan; Radu Marculescu
Year: 2011
Speeding Up Emulation-Based Diagnosis Techniques for Logic Cores
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Designing Custom Arithmetic Data Paths with FloPoCo
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Authors:F. de Dinechin; B. Pasca
Year: 2011
Numerical Data Representations for FPGA-Based Scientific Computing
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Authors:George A. Constantinides; Nicola Nicolici; Adam B. Kinsman
Year: 2011
Computational Mass Spectrometry in a Reconfigurable Coherent Coprocessing Architecture
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Data Reorganization and Prefetching of Pointer-Based Data Structures
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Authors:Joonseok Park; P. Diniz
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An End-to-End Tool Flow for FPGA-Accelerated Scientific Computing
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Authors:G. Stitt; A. George; H. Lam; Casey Reardon; Melissa Smith; Brian Holland; Vikas Aggarwal; Gongyu Wang; James Coole; Seth Koehler
Year: 2011
Call for Papers
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Year: 2011
Toward FPGA-Enabled Scientific Computing
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Year: 2011
Guest Editors' Introduction: Surveying the Landscape of FPGA Accelerator Research
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Authors:George Constantinides; Nicola Nicolici
Year: 2011
High-Level Languages and Floating-Point Arithmetic for FPGA-Based CFD Simulations
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FPGA-Based Particle Recognition in the HADES Experiment
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Getting Your Bits in Order
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Panel Summaries
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CEDA Currents
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Test Technology TC Newsletter
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Design Automation Technical Committee Newsletter
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FPGAs, Programming Models, and Kit Cars
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Year: 2011
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Year: 2011
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Year: 2011
Replacing Error Vector Magnitude Test with RF and Analog BISTs
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Pulsed-Latch Circuits: A New Dimension in ASIC Design
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Robust Circuit Design for Flexible Electronics
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Placement Optimization of Flexible TFT Digital Circuits
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Powering the Future: Organic Solar Cells with Polymer Energy Storage
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Year: 2011
The Promise of Flexible Electronics
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Masthead
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A Promising Alternative to Conventional Silicon [Guest editors' introducton]
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Call for Papers
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Materials, Processing, and Testing of Flexible Image Sensor Arrays
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Adaptive Testing: Dealing with Process Variability
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Long-Term Thermal Overstressing of Computers
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RF Front-End Test Using Built-in Sensors
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Major Milestones for Two IEEE Standards Groups in 2011
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Product Futures
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CEDA Currents
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Test Technology TC Newsletter
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Conference Reports
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Year: 2011
Getting Close to Your Computer
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Year: 2011
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Year: 2011
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Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures
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Applying the Model-View-Controller Paradigm to Adaptive Test
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Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results
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An Industrial Study of System-Level Test
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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations
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IEEE Xplore Digital Library [advertisement]
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CEDA Currents
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Message From the Steering Committee
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Yield learning perspectives
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IEEE Xplore Digital Library [advertisement]
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IEEE Xplore Digital Library [advertisement]
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Find the latest semiconductor research in IEEE Xplore [advertisement]
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The Quest for High-Yield IC Manufacturing
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Yield of Black Swans
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Guest Editors' Introduction: Yield Learning Processes and Methods
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Patents in the IEEE Standards Process
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Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
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Interoperable Design Constraints for Custom IC Design
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Leakage Power Contributor Modeling
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Low-Power Design Using the Si2 Common Power Format
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Understanding the Accellera SCE-MI Transaction Pipes
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Abstraction and Standardization in Hardware Design
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An Overview of Open SystemC Initiative Standards Development
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OpenAccess: Standard and Practices
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Standards, Interoperability, and Innovation in a Disaggregated IC Industry
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Call for papers
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IEEE Xplore Digital Library [advertisement]
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A world without standards
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Managing complex boundary-scan operations
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IEEE Xplore Digital Library [advertisement]
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Design and Test of Genetic Circuits Using ${\tt iBioSim}$iBioSim
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Digital Signal Processing With Molecular Reactions
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Fast Solvers for Molecular Science and Engineering
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Design Automation for Synthetic Biological Systems
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Hardware IP Protection During Evaluation Using Embedded Sequential Trojan
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Design Space Exploration of Parallel Embedded Architectures for Native Clifford Algebra Operations
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IEEE Xplore Digital Library
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At the beginning
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Intelligent Building Energy Information and Control Systems for Low-Energy Operations and Optimal Demand Response
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A Highly Fault-Efficient SAT-Based ATPG Flow
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Adaptive Alternate Analog Test
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Scan-Based Speed-Path Debug for a Microprocessor
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Guest Editors' Introduction: Green Buildings
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SerDes Interoperability and Optimization
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Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan
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Defect Oriented Testing for Analog/Mixed-Signal Designs
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Biologically Inspired Robust Tera-Device Processors
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Physically-Aware Analysis of Systematic Defects in Integrated Circuits
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Two Approaches to Handling Late Essential/Necessary Patent Claims Against Standards
Publisher: IEEE Computer Society
Authors:S. Krolikoski
Year: 2012
Towards smarter silicon and data-driven design of integrated circuits [From the EIC]
Publisher: IEEE Computer Society
Authors:Krishnendu Chakrabarty
Year: 2012
Advancing Technology
Publisher: IEEE Computer Society
Year: 2012
IEEE Digital Library
Publisher: IEEE Computer Society
Year: 2012
Technology insight on demand on IEEE.tv [advertisement]
Publisher: IEEE Computer Society
Year: 2012
IEEE Was Here [GHN advertisement]
Publisher: IEEE Computer Society
Year: 2012
IEEE Xplore Digital Library
Publisher: IEEE Computer Society
Year: 2012
IEEE Open Access Publishing
Publisher: IEEE Computer Society
Year: 2012
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection
Publisher: IEEE Computer Society
Authors:D. Gil-Tomas; J. Gracia-Moran; J-C Baraza-Calvo; L-J Saiz-Adalid; P-J Gil-Vicente
Year: 2012
Bringing up a chip on the cheap
Publisher: IEEE Computer Society
Authors:M. Wachs; O. Shacham; Z. Asgar; A. Firoozshahian; S. Richardson; M. Horowitz
Year: 2012
Digitally intensive wireless transceivers
Publisher: IEEE Computer Society
Authors:R. B. Staszewski
Year: 2012
OpenDFM Bridging the Gap Between DRC and DFM
Publisher: IEEE Computer Society
Authors:J. Buurma; R. Sayah; F. Valente; C. Rodgers
Year: 2012
Employing the STDF V4-2007 Standard for Scan Test Data Logging
Publisher: IEEE Computer Society
Authors:M. Seuring; M. Braun; A. Ma; G. Eide; K. Yang; Huaxing Tang
Year: 2012
Dual-Control Self-Healing Architecture for High-Performance Radio SoCs
Publisher: IEEE Computer Society
Authors:C. Chien; A. Tang; F. Hsiao; M. F. Chang
Year: 2012
Digitally intensive receiver design: opportunities and challenges
Publisher: IEEE Computer Society
Authors:R. Nanda; D. Markovic
Year: 2012
Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
Publisher: IEEE Computer Society
Authors:Ting Zhu; M. B. Steer; P. D. Franzon
Year: 2012
Mixed-Signal SoCs With In Situ Self-Healing Circuitry
Publisher: IEEE Computer Society
Authors:C. Maxey; G. Creech; Sanjay Raman; Jay Rockway; Kari Groves; Tony Quach; Len Orlando; Aji Mattamana
Year: 2012
IEEE Design & Test of Computers publication information
Publisher: IEEE Computer Society
Year: 2012
CEDA Currents
Publisher: IEEE Computer Society
Year: 2012
IEEE Xplore Digital Library [advertisement]
Publisher: IEEE Computer Society
Year: 2012
[Back inside cover]
Publisher: IEEE Computer Society
Year: 2012
IEEE Was Here [advertisement]
Publisher: IEEE Computer Society
Year: 2012


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