Cathedral-II: A Silicon Compiler for Digital Signal Processing
Publisher: IEEE Computer Society
Authors:H. De Man; J. Rabaey; P. Six; L. Claesen
Year: 1986
Macro Testing: Unifying IC And Board Test
Publisher: IEEE Computer Society
Authors:F.P.M. Beenker; K.J.E. van Eerdewijk; R.B.W. Gerritsen; F.N. Peacock; M. van der Star
Year: 1986
MACSYMA Solves Mathematical Problems Analytically [advertisement]
Publisher: IEEE Computer Society
Year: 1986
The Seventeenth International Symposium on Fault-Tolerant Computing
Publisher: IEEE Computer Society
Year: 1986
Self-Test in a Standard Cell Environment
Publisher: IEEE Computer Society
Authors:J.P. Mucha; W. Daehn; J. Gross
Year: 1986
Second Call for Papers
Publisher: IEEE Computer Society
Year: 1986
Shmoo plotting: the black art of IC testing
Publisher: IEEE Computer Society
Authors:K. Baker; J. Van Beers
Year: 1997
Modeling the unmodelable: algorithmic fault diagnosis
Publisher: IEEE Computer Society
Authors:R.C. Aitken
Year: 1997
Cost-driven ranking of memory elements for partial intrusion
Publisher: IEEE Computer Society
Authors:M. Abadir; R. Kapur
Year: 1997
The economics of system-level testing
Publisher: IEEE Computer Society
Authors:D. Farren; T. Ambler
Year: 1997
IC failure analysis: magic, mystery, and science
Publisher: IEEE Computer Society
Authors:J.M. Soden; R.E. Anderson; C.L. Henderson
Year: 1997
Diagnosing IC failures in a fast environment
Publisher: IEEE Computer Society
Authors:D. Staab; E.R. Hnatek
Year: 1997
IC failure analysis: the importance of test and diagnostics
Publisher: IEEE Computer Society
Authors:D.P. Vallett
Year: 1997
Automated diagnosis in testing and failure analysis
Publisher: IEEE Computer Society
Authors:K.M. Butler; K. Johnson; J. Platt; A. Kinra; J. Saxena
Year: 1997
The future of test and DFT
Publisher: IEEE Computer Society
Authors:G. Singer
Year: 1997
Design And Test Economics - an Extra Dimension
Publisher: IEEE Computer Society
Authors:T. Ambler; M. Abadir
Year: 1997
A BIST and boundary-scan economics framework
Publisher: IEEE Computer Society
Authors:J.M. Miranda
Year: 1997
Incorporating cost modeling in embedded-system design
Publisher: IEEE Computer Society
Authors:J.A. Debardelaben; V.K. Madisetti; A.J. Gadient
Year: 1997
Analyzing manufacturing test costs
Publisher: IEEE Computer Society
Authors:C.T. Pynn
Year: 1997
Test economics in the 2lst Century
Publisher: IEEE Computer Society
Authors:J. Turino
Year: 1997
CAD tools for bridging microsystems and foundries
Publisher: IEEE Computer Society
Authors:J.M. Karam; B. Courtois; H. Boutamine
Year: 1997
Observable time windows: verifying high-level synthesis results
Publisher: IEEE Computer Society
Authors:R.A. Bergamaschi; S. Raje
Year: 1997
The K*BMD: A verification data structure
Publisher: IEEE Computer Society
Authors:R. Drechsler; B. Becker; S. Ruppertz
Year: 1997
Fault-secure parity prediction arithmetic operators
Publisher: IEEE Computer Society
Authors:M. Nicolaidis; R.O. Duarte; S. Manich; J. Figueras
Year: 1997
Using a programming language for digital system design
Publisher: IEEE Computer Society
Authors:R.K. Gupta; S.Y. Liao
Year: 1997
Testing Embedded Cores
Publisher: IEEE Computer Society
Authors:T.L. Anderson; R. Chandramouli; S. Dey; S. Hemmady; C. Mallipeddi; R. Rajsuman; R. Walther; Y. Zorian
Year: 1997
AVS 96 Meets In Taiwan
Publisher: IEEE Computer Society
Authors:Cheng-Wen Wu
Year: 1997
System Test Standards Committee
Publisher: IEEE Computer Society
Authors:J.W. Sheppard
Year: 1997
George Learns Test
Publisher: IEEE Computer Society
Authors:S. Davidson
Year: 1997
Adventures in the mainframe trade [Interview with Gene Amdahl]
Publisher: IEEE Computer Society
Authors:K. Wagner
Year: 1997
Design, Design Automation, And Test In Europe
Publisher: IEEE Computer Society
Authors:P. Marwedel; C.A. Lopez-Barrio
Year: 1997
System-on-a-chip cosimulation and compilation
Publisher: IEEE Computer Society
Authors:C. Liem; F. Nacabal; C. Valderrama; P. Paulin; A. Jerraya
Year: 1997
Testing logic-intensive memory ICs on memory testers
Publisher: IEEE Computer Society
Authors:R. Wu; J. Gerner; R. Weelus; K. Lew
Year: 1997
Collateral ASIC test
Publisher: IEEE Computer Society
Authors:A. Bailey; T. Lada; J. Preston
Year: 1997
Impact of system partitioning on test cost
Publisher: IEEE Computer Society
Authors:G. Al-Hayek; Y. Le Traon; C. Robach
Year: 1997
Hardware-software Codesign
Publisher: IEEE Computer Society
Year: 1997
Asynchronous Design: Nightmare Or Opportunity?
Publisher: IEEE Computer Society
Authors:E. Bruls
Year: 1997
Intranets And EDA: Impact,Technology, Applications
Publisher: IEEE Computer Society
Authors:D. Ku
Year: 1997
Microprocessors Lead The Way In Complex Design
Publisher: IEEE Computer Society
Authors:M.E. Levitt
Year: 1997
Designing UltraSparc for testability
Publisher: IEEE Computer Society
Authors:M.E. Levitt
Year: 1997
Mapping and repairing embedded-memory defects
Publisher: IEEE Computer Society
Authors:L. Youngs; S. Paramanandam
Year: 1997
Alpha 21164 testability strategy
Publisher: IEEE Computer Society
Authors:D.K. Bhavsar; J.H. Edmondson
Year: 1997
Prototyping the M68060 for concurrent verification
Publisher: IEEE Computer Society
Authors:J. Kumar
Year: 1997
NREC: risk assessment and planning of complex designs
Publisher: IEEE Computer Society
Authors:M.F. Jacome; V. Lapinskii
Year: 1997
Transmission coefficient correction for DACs
Publisher: IEEE Computer Society
Authors:J.M. Velixon
Year: 1996
BIST for D/A and A/D converters
Publisher: IEEE Computer Society
Authors:K. Arabi; I. Kaminska; J. Rzeszut
Year: 1996
Circular self-test path for FSMs
Publisher: IEEE Computer Society
Authors:F. Corno; P. Prinetto; M.S. Reorda
Year: 1996
I/sub DDQ/ testing: issues present and future
Publisher: IEEE Computer Society
Authors:J.M. Soden; C.F. Hawkins
Year: 1996
How ATE planning affects LSI manufacturing cost
Publisher: IEEE Computer Society
Authors:K. Nakamae; H. Sakamoto; H. Fujioka
Year: 1996
IEEE Design & Test of Computers - 1996 Annual Index, Volume 13
Publisher: IEEE Computer Society
Year: 1996
Using VHDL for board level simulation
Publisher: IEEE Computer Society
Authors:S. Habinc; P. Sinander
Year: 1996
Design for testability in hardware software systems
Publisher: IEEE Computer Society
Authors:H.P.E. Vranken; M.F. Witteman; R.C. Van Wuijtswinkel
Year: 1996
Computer-aided design of fault-tolerant VLSI systems
Publisher: IEEE Computer Society
Authors:R. Karri; K. Hogstedt; A. Orailoglu
Year: 1996
FPGA architectural research: a survey
Publisher: IEEE Computer Society
Authors:S. Brown
Year: 1996
Minimizing FPGA interconnect delays
Publisher: IEEE Computer Society
Authors:S. Brown; M. Khellah; N. Vranesic
Year: 1996
A fault injection technique for VHDL behavioral-level models
Publisher: IEEE Computer Society
Authors:T.A. Delong; B.W. Johnson; J.A. Profeta, III
Year: 1996
Advances in rapid prototyping of digital systems
Publisher: IEEE Computer Society
Authors:V.K. Madisetti; M.A. Richards
Year: 1996
Rapid digital system prototyping: current practice, future challenges
Publisher: IEEE Computer Society
Authors:V.K. Madisetti
Year: 1996
RASSP: changing the paradigm of electronic system design
Publisher: IEEE Computer Society
Authors:J.H.M. Malley
Year: 1996
Spanning the product life cycle: RASSP DFT
Publisher: IEEE Computer Society
Authors:R.M. Sedmak; J.S. Evans
Year: 1996
Hardware-software codesign using processor synthesis
Publisher: IEEE Computer Society
Authors:C. Kuttner
Year: 1996
Conceptual prototyping of scalable embedded DSP systems
Publisher: IEEE Computer Society
Authors:L.-R. Dung; V.K. Madisetti
Year: 1996
DC built-in self-test for linear analog circuits
Publisher: IEEE Computer Society
Authors:A. Chatterjee; B.C. Kim; N. Nagi
Year: 1996
Real-time current testing for A/D converters
Publisher: IEEE Computer Society
Authors:Y. Miura
Year: 1996
FPGA and CPLD architectures: a tutorial
Publisher: IEEE Computer Society
Authors:S. Brown; J. Rose
Year: 1996
Optimizing power in ASIC behavioral synthesis
Publisher: IEEE Computer Society
Authors:R. San Martin; J.P. Knight
Year: 1996
An integrated CAD environment for low-power design
Publisher: IEEE Computer Society
Authors:P. Landman; R. Mehra; J.M. Rabaey
Year: 1996
Deep Sub-micron Design
Publisher: IEEE Computer Society
Authors:S. Ganguly; T.M. Mak; L. Scheffer; W. Wolf; K. Yeager
Year: 1996
Intel and the myths of test
Publisher: IEEE Computer Society
Authors:K.M. Thompson
Year: 1996
Facets of growth in the EDA market
Publisher: IEEE Computer Society
Authors:A. Prabhu
Year: 1996
Road map to riches
Publisher: IEEE Computer Society
Authors:R.L. Campbell
Year: 1996
Mixed Analog and Digital Systems
Publisher: IEEE Computer Society
Authors:B. Kaminska; B. Courtois
Year: 1996
Desing and self-test for switched-current building blocks
Publisher: IEEE Computer Society
Authors:T. Olbrich; A. Richardson
Year: 1996
Analog testing with time response parameters
Publisher: IEEE Computer Society
Authors:A. Balivada; J. Chen; J. Abraham
Year: 1996
Net scheduling in high-level synthesis
Publisher: IEEE Computer Society
Authors:A. Prihozhy
Year: 1996
Interconnection problems in modern computers
Publisher: IEEE Computer Society
Authors:S. Radu; V. Onofrei; M. Albulet
Year: 1996
Test synthesis with alternative graphs
Publisher: IEEE Computer Society
Authors:R. Ubar
Year: 1996
Sensitivity analysis of critical parameters in board test
Publisher: IEEE Computer Society
Authors:M.M.V. Tegethoff; T.W. Chen
Year: 1996
Frequency domain testing of ADCs
Publisher: IEEE Computer Society
Authors:J.A. Mielke
Year: 1996
Fast power estimation of large circuits
Publisher: IEEE Computer Society
Authors:P.H. Schneider; U. Schlichtmann; B. Wurth
Year: 1996
Embedded systems cards [New Products]
Publisher: IEEE Computer Society
Year: 1995
ADC for wireless LANs [New Products]
Publisher: IEEE Computer Society
Year: 1995
Sbus system interface [New Products]
Publisher: IEEE Computer Society
Year: 1995
LAN/WAN analyzer [New Products]
Publisher: IEEE Computer Society
Year: 1995
Verifying timing consistency in formal specifications
Publisher: IEEE Computer Society
Authors:T. Bartos; N. Fristacky
Year: 1996
Self-checking design in Eastern Europe
Publisher: IEEE Computer Society
Authors:S.J. Piestrak
Year: 1996
Metrics - Jack Woida [Conference Reports]
Publisher: IEEE Computer Society
Year: 1995
Timing verification [New Products]
Publisher: IEEE Computer Society
Year: 1995
i960 support [New Products]
Publisher: IEEE Computer Society
Year: 1995
VxWorks, Version 5.2 [New Products]
Publisher: IEEE Computer Society
Year: 1995
Real-time SPOX operating system [New Products]
Publisher: IEEE Computer Society
Year: 1995
DIMMs for portables, printers [New Products]
Publisher: IEEE Computer Society
Year: 1995
Profile-driven behavioral synthesis for low-power VLSI systems
Publisher: IEEE Computer Society
Authors:N. Kumar; S. Katkoori; L. Rader; R. Vemuri
Year: 1995
Behavioral synthesis
Publisher: IEEE Computer Society
Year: 1995
Industrial BIST of embedded RAMs
Publisher: IEEE Computer Society
Authors:P. Camurati; P. Prinetto; M.S. Reorda; S. Barbagallo; A. Burri; D. Medina
Year: 1995
Derivation of P/sub 3F/
Publisher: IEEE Computer Society
Year: 1995
The practical application of formal verification
Publisher: IEEE Computer Society
Year: 1995
Self-empowered teams - Margarida Jacome [Conference Reports]
Publisher: IEEE Computer Society
Year: 1995
Subcircuit diagnostic process
Publisher: IEEE Computer Society
Year: 1995
Value deduction algorithm
Publisher: IEEE Computer Society
Year: 1995
Plug-and-play I/sub DDQ/ Testing for test fixtures
Publisher: IEEE Computer Society
Authors:K. Baker; A. Hales
Year: 1995
Total observability
Publisher: IEEE Computer Society
Year: 1995
QTAG
Publisher: IEEE Computer Society
Year: 1995
Achieving I/sub DDQ/I/sub SSQ/ production testing with QuiC-
Publisher: IEEE Computer Society
Authors:K.M. Wallquist
Year: 1995
Design and test in India
Publisher: IEEE Computer Society
Year: 1995
Process modeling and management - Naresh Sehgal [Conference Reports]
Publisher: IEEE Computer Society
Year: 1995
Localizing multiple faults in a protocol implementation
Publisher: IEEE Computer Society
Authors:Y. Kakuda; H. Yukitomo; S. Kusumoto; T. Kikuno
Year: 1995
Protocol testing research
Publisher: IEEE Computer Society
Year: 1995
Multiple fault diagnosis by sensitizing input pairs
Publisher: IEEE Computer Society
Authors:N. Yanagida; H. Takahashi; Y. Takamatsu
Year: 1995
Fault diagnosis in Japan
Publisher: IEEE Computer Society
Year: 1995
SCC20 to work with IEC
Publisher: IEEE Computer Society
Authors:J.W. Sheppard
Year: 1995
1995 Workshop on Electronic Design Processes
Publisher: IEEE Computer Society
Authors:C.W. Rosenthal
Year: 1995
Accelerating the pace of R&D in Asia
Publisher: IEEE Computer Society
Authors:T. Yamada
Year: 1995
Identifying untestable faults in sequential circuits
Publisher: IEEE Computer Society
Authors:Hsing-Chung Liang; Chung Len Lee; J.E. Chen
Year: 1995
Identifying faults
Publisher: IEEE Computer Society
Year: 1995
Design and test in Taiwan
Publisher: IEEE Computer Society
Year: 1995
Multifrequency analysis of faults in analog circuits
Publisher: IEEE Computer Society
Authors:M. Slamani; B. Kaminska
Year: 1995
The EDA business model dialogue part 1
Publisher: IEEE Computer Society
Authors:A. Prabhu
Year: 1995
Embedded MPU emulator [New Products]
Publisher: IEEE Computer Society
Year: 1995
SCSI emulation system [New Products]
Publisher: IEEE Computer Society
Year: 1995
Testing embedded memories [New Products]
Publisher: IEEE Computer Society
Year: 1995
VLSI test system [New Products]
Publisher: IEEE Computer Society
Year: 1995
Single clock partial scan
Publisher: IEEE Computer Society
Authors:Kwang-Ting Cheng
Year: 1995
Testability implications of performance driven logic synthesis
Publisher: IEEE Computer Society
Authors:T.E. Marchok; A. El-Maleh; J. Rajski; W. Maly
Year: 1995
I/sub DDQ/ design and test advantages propel industry
Publisher: IEEE Computer Society
Authors:C.F. Hawkins; J.M. Soden
Year: 1995
Microprocessor I/sub DDQ/ testing: a case study
Publisher: IEEE Computer Society
Authors:D. Josephson; M. Storey; D. Dixon
Year: 1995
IEEE Std 1149.1: where are we? where from here?
Publisher: IEEE Computer Society
Authors:M.M.V. Tegethoff; K.P. Parker
Year: 1995
Introduction to the scheduling problem
Publisher: IEEE Computer Society
Authors:R.A. Walker; S. Chaudhuri
Year: 1995
System partitioning of MCMs for low power
Publisher: IEEE Computer Society
Authors:S.A. Khan; V.K. Madisetti
Year: 1995
Specification and design of embedded hardware-software systems
Publisher: IEEE Computer Society
Authors:D.D. Gajski; F. Vahid
Year: 1995
Reducing hardware with fuzzy multiple signature analysis
Publisher: IEEE Computer Society
Authors:Yuejian Wu; A. Ivanov
Year: 1995
A business view of networks
Publisher: IEEE Computer Society
Authors:A. Prabhu
Year: 1995
An overview of test synthesis tools
Publisher: IEEE Computer Society
Authors:R.C. Aitken
Year: 1995
Synthesizing circuits with implicit stability constraints
Publisher: IEEE Computer Society
Authors:H. Cox
Year: 1995
AD&T Roundtable Low-Power Design
Publisher: IEEE Computer Society
Year: 1995
IEEE Design & Test of Competers: Annual Index, Volume 12
Publisher: IEEE Computer Society
Year: 1995
Managing your EDA investments
Publisher: IEEE Computer Society
Authors:A. Prabhu
Year: 1995
Designing self-timed devices using the finite automaton model
Publisher: IEEE Computer Society
Authors:V.I. Varshavsky; V.B. Marakhovsky; V. Smolensky
Year: 1995
Automatic verification of asynchronous circuits
Publisher: IEEE Computer Society
Authors:T.W.S. Lee; M.R. Greenstreet; C.-J. Seger
Year: 1995
High-level modeling and design of asynchronous interface logic
Publisher: IEEE Computer Society
Authors:A.V. Yakovlev; A.M. Koelmans; L. Lavagno
Year: 1995
Testing multimedia transmission systems
Publisher: IEEE Computer Society
Authors:D.K. Fibush
Year: 1995
Testing defects in scan chains
Publisher: IEEE Computer Society
Authors:M. Sachdev
Year: 1995
Timing-driven partial scan
Publisher: IEEE Computer Society
Authors:Jing-Yang Jou; Kwang-Ting Cheng
Year: 1995
I/sub DDQ/ test and diagnosis of CMOS circuits
Publisher: IEEE Computer Society
Authors:E. Isern; J. Figueras
Year: 1995
Testing and diagnosing managed networks
Publisher: IEEE Computer Society
Authors:R. McRee
Year: 1995
Shared-I/O scan test
Publisher: IEEE Computer Society
Authors:B.I. Dervisoglu
Year: 1995
Developing micropipeline wavefront arbiters
Publisher: IEEE Computer Society
Authors:G. Gopalakrishnan
Year: 1994
Management perspectives in EDA
Publisher: IEEE Computer Society
Authors:Prabhu, A.
Year: 1995
Guest Editor's Introduction: Multimedia Drives Changes
Publisher: IEEE Computer Society
Authors:F.L. Kitson
Year: 1995
Transitioning desktops to set tops
Publisher: IEEE Computer Society
Authors:F.L. Kitson; V. Bhaskaran; D. Kalra
Year: 1995
Simulating multimedia systems with MVPSIM
Publisher: IEEE Computer Society
Authors:Jihong Kim; Yongmin Kim
Year: 1995
Automatically assessing MPEG coding fidelity
Publisher: IEEE Computer Society
Authors:C.J. van den Branden Lambrecht; V. Bhaskaran; A. Kovalick; M. Kunt
Year: 1995
Strategies for competing in today's market
Publisher: IEEE Computer Society
Authors:A. Prabhu
Year: 1994
Low-power electronics
Publisher: IEEE Computer Society
Authors:Z.J. Lemnios; K.J. Gabriel
Year: 1994
PowerPC 603, a microprocessor for portable computers
Publisher: IEEE Computer Society
Authors:S. Gary; P. Ippolito; G. Gerosa; C. Dietz; J. Eno; H. Sanchez
Year: 1994
Saving power in the control path of embedded processors
Publisher: IEEE Computer Society
Authors:C.-L. Su; C.-Y. Tsui; A.M. Despain
Year: 1994
Saving power by synthesizing gated clocks for sequential circuits
Publisher: IEEE Computer Society
Authors:L. Benini; P. Siegel; G. De Micheli
Year: 1994
Introduction to high-level synthesis
Publisher: IEEE Computer Society
Authors:D.D. Gajski; L. Ramachandran
Year: 1994
Ten: A concurrent test engineering environment
Publisher: IEEE Computer Society
Authors:E. Trischler; M. Johansson
Year: 1994
Exploring test space with fuzzy decision making
Publisher: IEEE Computer Society
Authors:M. Fares; B. Kaminska
Year: 1994
Simplifying sequential circuit test generation
Publisher: IEEE Computer Society
Authors:Meng-Lieh Sheu; Chung Len Lee
Year: 1994
Technology mapping in circuit design aids
Publisher: IEEE Computer Society
Authors:M. Kahrs; B.N. Locanthi; R.C. Restrick
Year: 1994
The counterflow pipeline processor architecture
Publisher: IEEE Computer Society
Authors:R.F. Sproull; I.E. Sutherland; C.E. Molnar
Year: 1994
An FPGA for implementing asynchronous circuits
Publisher: IEEE Computer Society
Authors:S. Hauck; S. Burns; G. Borriello; C. Ebeling
Year: 1994
Designing an asynchronous communications chip
Publisher: IEEE Computer Society
Authors:A. Marshall; B. Coates; F. Siegel
Year: 1994
Asynchronous circuits for low power: a DCC error corrector
Publisher: IEEE Computer Society
Authors:K. Van Berkel; R. Burgess; J. Kessels; M. Roncken; F. Schalij; A. Peeters
Year: 1994
An asynchronous, high-speed packet switching component
Publisher: IEEE Computer Society
Authors:W.O. Budde; H.-G. Keller; H.-J. Reumerman; P. van de Wiel
Year: 1994
A 100-MIPS GaAs asynchronous microprocessor
Publisher: IEEE Computer Society
Authors:J.A. Tierno; A.J. Martin; D. Borkovic; Tak Kwan Lee
Year: 1994
TITAC: design of a quasi-delay-insensitive microprocessor
Publisher: IEEE Computer Society
Authors:T. Nanya; Y. Ueno; H. Kagotani; M. Kuwako; A. Takamura
Year: 1994
Smart-substrate multichip-module systems
Publisher: IEEE Computer Society
Authors:W. Maly; D.B.I. Feltham; A.E. Gattiker; M.D. Hobaugh; K. Backus; M.E. Thomas
Year: 1994
A fault-tolerant digital artificial neuron
Publisher: IEEE Computer Society
Authors:F.N. Sibai
Year: 1993
ScanBist: a multifrequency scan-based BIST method
Publisher: IEEE Computer Society
Authors:B. Nadeau-Dostie; D. Burek; A.S.M. Hassan
Year: 1994
Design validation: comparing theoretical and empirical results of design error modeling
Publisher: IEEE Computer Society
Authors:Sungho Kang; S.A. Szygenda
Year: 1994
Quantifying design quality through design experiments
Publisher: IEEE Computer Society
Authors:E.J. Aas; T. Steen; K. Klingsheim
Year: 1994
Analyzing multichip module testing strategies
Publisher: IEEE Computer Society
Authors:M.S. Abadir; A.R. Parikh; P.A. Sandborn; K. Drake; L. Bal
Year: 1994
Progress in design for test: a personal view
Publisher: IEEE Computer Society
Authors:R.G. Bennitts
Year: 1994
A method for consistent fault coverage reporting
Publisher: IEEE Computer Society
Authors:W.H. Debany, Jr.; K.A. Kwiat; S.A. Al-Arian
Year: 1993
Trends in silicon-on-silicon multichip modules
Publisher: IEEE Computer Society
Authors:R.C. Frye; K.L. Tai; M.Y. Lau; T.J. Gabara
Year: 1993
High-performance MCM routing
Publisher: IEEE Computer Society
Authors:J.D. Cho; M. Sarrafzadeh; M. Sriram; S.M. Kang
Year: 1993
A new framework for designing: built-in test multichip modules with pipelined test strategy
Publisher: IEEE Computer Society
Authors:T.-T. Lin; H.-Y. Liou
Year: 1993
Design issues in parallel simulation languages
Publisher: IEEE Computer Society
Authors:H. Rajaei; R. Ayani
Year: 1993
Hardware-software cosynthesis for microcontrollers
Publisher: IEEE Computer Society
Authors:R. Ernst; J. Henkel; T. Benner
Year: 1993
Performing effective fault isolation in integrated diagnostics
Publisher: IEEE Computer Society
Authors:J.W. Sheppard; W.R. Simpson
Year: 1993
A model and methodology for hardware-software codesign
Publisher: IEEE Computer Society
Authors:D.E. Thomas; J.K. Adams; H. Schmit
Year: 1993
A hardware-software codesign methodology for DSP applications
Publisher: IEEE Computer Society
Authors:A. Kalavade; E.A. Lee
Year: 1993
Hardware-software cosynthesis for digital systems
Publisher: IEEE Computer Society
Authors:R.K. Gupta; G. De Micheli
Year: 1993
Implementation-independent model of an instruction set architecture in VHDL
Publisher: IEEE Computer Society
Authors:M.H. Salinas; B.W. Johnson; J.H. Aylor
Year: 1993
A case study in embedded-system design: The VuMan 2 wearable computer
Publisher: IEEE Computer Society
Authors:A. Smailagic; D.P. Siewiorek
Year: 1993
Failure analysis of high-density CMOS SRAMs: using realistic defect modeling and I/sub DDQ/ testing
Publisher: IEEE Computer Society
Authors:S. Naik; F. Agricola; W. Maly
Year: 1993
Built-in self-diagnosis for repairable embedded RAMs
Publisher: IEEE Computer Society
Authors:R. Treuer; V.K. Agarwal
Year: 1993
Test algorithms for double-buffered random access and pointer-addressed memories
Publisher: IEEE Computer Society
Authors:J. Van Sas; F. Catthoor; H.J. De Man
Year: 1993
RISE++: a symbolic environment for scan-based testing
Publisher: IEEE Computer Society
Authors:S. Vinoski
Year: 1993
CrossCheck: an innovative testability solution
Publisher: IEEE Computer Society
Authors:S. Chandra; K. Pierce; G. Srinath; H.R. Sucar; V. Kulkarni
Year: 1993
A tutorial on built-in self-test. 2. Applications
Publisher: IEEE Computer Society
Authors:V.D. Agrawal; C.R. Kime; K.K. Saluja
Year: 1993
An automatic netlist-to-schematic generator
Publisher: IEEE Computer Society
Authors:B. Naveen; K.S. Raghunathan
Year: 1993
Test sets and reject rates: all fault coverages are not created equal
Publisher: IEEE Computer Society
Authors:P.C. Maxwell; R.C. Aitken
Year: 1993
Fault isolation in an integrated diagnostic environment
Publisher: IEEE Computer Society
Authors:W.R. Simpson; J.W. Sheppard
Year: 1993
Applications of a laser-induced plasma pathway to testing of electronic modules
Publisher: IEEE Computer Society
Authors:K.R. Umstadter; D.L. Millard; R.C. Block
Year: 1993
A tutorial on built-in self-test. I. Principles
Publisher: IEEE Computer Society
Authors:V.D. Agrawal; C.R. Kime; K.K. Saluja
Year: 1993
Highly reliable testing of ULSI memories with on-chip voltage-down converters
Publisher: IEEE Computer Society
Authors:M. Tsukude; K. Arimoto; H. Hidaka; Y. Konishi; M. Hayashikoshi; K. Suma; K. Fujishima
Year: 1993
An MPGA-like FPGA
Publisher: IEEE Computer Society
Authors:D. Marple
Year: 1992
IEEE P1149.5 Module Test and Maintenance Bus
Publisher: IEEE Computer Society
Authors:P. McHugh
Year: 1992
Using march tests to test SRAMs
Publisher: IEEE Computer Society
Authors:A.J. Van De Goor
Year: 1993
A new testing acceleration chip for low-cost memory tests
Publisher: IEEE Computer Society
Authors:M. Inoue; T. Yamada; A. Fujiwara
Year: 1993
Generating tests for delay faults in nonscan circuits
Publisher: IEEE Computer Society
Authors:P. Agrawal; V.D. Agrawal; S.C. Seth
Year: 1993
Estimating the complexity of synthesized designs from FSM specifications
Publisher: IEEE Computer Society
Authors:B. Mitra; P.R. Panda; P.P. Chaudhuri
Year: 1993
System specification with the SpecCharts language
Publisher: IEEE Computer Society
Authors:S. Narayan; F. Vahid; D.D. Gajski
Year: 1992
A behavioral fault simulator for Ideal
Publisher: IEEE Computer Society
Authors:A. Khoche; S.D. Sherlekar; G. Venkatesh; R. Venkateswaran
Year: 1992
An efficient signature computation method
Publisher: IEEE Computer Society
Authors:K.K. Saluja; C.-F. See
Year: 1992
Delay-fault diagnosis by critical-path tracing
Publisher: IEEE Computer Society
Authors:P. Girard; C. Landrault; S. Pravossoudovitch
Year: 1992
A fast partitioning method for PLA-based FPGAs
Publisher: IEEE Computer Society
Authors:Z. Hasan; D. Harrison; M. Ciesielski
Year: 1992
Shortening the design cycle for programmable logic
Publisher: IEEE Computer Society
Authors:S.H. Kelem; J.P. Seidel
Year: 1992
AnyBoard: an FPGA-based, reconfigurable system
Publisher: IEEE Computer Society
Authors:D.E. Van den Bout; J.N. Morris; D. Thomae; S. Labrozzi; S. Wingo; D. Hallman
Year: 1992
Using VHDL for high-level, mixed-mode system simulation
Publisher: IEEE Computer Society
Authors:M.B. Srivastava; R.W. Brodersen
Year: 1992
Optimizing VHDL compilation for parallel simulation
Publisher: IEEE Computer Society
Authors:J.C. Willis; D.P. Siewiorek
Year: 1992
Three decades of HDLs. II. Conlan through Verilog
Publisher: IEEE Computer Society
Authors:D. Borrione; R. Piloty; D. Hill; K.J. Lieberherr; P. Moorby
Year: 1992
Applying testability analysis for integrated diagnostics
Publisher: IEEE Computer Society
Authors:J.W. Sheppard; W.R. Simpson
Year: 1992
Boundary-scan update-IEEE P1149.2 description and status report
Publisher: IEEE Computer Society
Authors:B. Dervisoglu
Year: 1992
A VHDL fault diagnosis tool using functional fault models
Publisher: IEEE Computer Society
Authors:V. Pitchumani; P. Mayor; N. Radia
Year: 1992
Formal verification of VHDL descriptions in the Prevail environment
Publisher: IEEE Computer Society
Authors:D.D. Borrione; L.V. Pierre; A.M. Salem
Year: 1992
Specification, planning, and synthesis in a VHDL design environment
Publisher: IEEE Computer Society
Authors:V. Nagasamy; N. Berry; C. Dangelo
Year: 1992
Three decades of HDLs. I. CDL through TI-HDL
Publisher: IEEE Computer Society
Authors:Y. Chu; D.L. Dietmeyer; J.R. Duley; F.J. Hill; M.R. Barbacci; C.W. Rose; G. Ordy; B. Johnson; M. Roberts
Year: 1992
A D&T special report-boundary scan: and end-of-term report-IEEE Std 1149.1 survey results
Publisher: IEEE Computer Society
Authors:C. Maunder
Year: 1992
DAG-Map: graph-based FPGA technology mapping for delay optimization
Publisher: IEEE Computer Society
Authors:K.-C. Chen; J. Cong; Y. Ding; A.B. Kahng; P. Trajmar
Year: 1992
System testability assessment for integrated diagnostics
Publisher: IEEE Computer Society
Authors:W.R. Simpson; J.W. Sheppard
Year: 1992
Noncontact testing of circuits via a laser-induced plasma electrical pathway
Publisher: IEEE Computer Society
Authors:D.L. Millard; K.R. Umstadter; R.C. Block
Year: 1992
Advanced fault collapsing (logic circuits testing)
Publisher: IEEE Computer Society
Authors:A. Lloy
Year: 1992
Empirical failure analysis and validation of fault models in CMOS VLSI circuits
Publisher: IEEE Computer Society
Authors:A. Pancholy; J. Rajski; L.J. McNaughton
Year: 1992
VHDL: toward a unified view of design
Publisher: IEEE Computer Society
Authors:A. Dewey; A.J. de Geus
Year: 1992
DSS: a distributed high-level synthesis system
Publisher: IEEE Computer Society
Authors:J. Roy; N. Kumar; R. Dutta; R. Vemuri
Year: 1992
Electrical characterization of megabit DRAMs. 11. Internal testing
Publisher: IEEE Computer Society
Authors:J. Kolzer; J. Otto
Year: 1991
Test engineering education is rational, feasible, and relevant
Publisher: IEEE Computer Society
Authors:R. Absher
Year: 1991
Economic effects in design and test
Publisher: IEEE Computer Society
Authors:I.D. Dear; C. Dislis; A.P. Ambler; J. Dick
Year: 1991
Techniques for synthesis of analog integrated circuits
Publisher: IEEE Computer Society
Authors:B.A.A. Antao; A.J. Brodersen
Year: 1992
Fault diagnosis in analog circuits using element modulation
Publisher: IEEE Computer Society
Authors:A. Walker; W.E. Alexander; P.K. Lala
Year: 1992
Analog circuit fault diagnosis based on sensitivity computation and functional testing
Publisher: IEEE Computer Society
Authors:M. Slamani; B. Kaminska
Year: 1992
Increasing test accuracy by varying driver slew rate
Publisher: IEEE Computer Society
Authors:B. Dahlberg
Year: 1991
Reorganizing circuits to aid testability
Publisher: IEEE Computer Society
Authors:R. Gupta; R. Srinivasan; M.A. Breuer
Year: 1991
Pseudorandom testing for boundary-scan design with built-in self-test
Publisher: IEEE Computer Society
Authors:P. Nagvajara; M.G. Karpovsky; L.B. Levitin
Year: 1991
Design and test of an integrated cryptochip
Publisher: IEEE Computer Society
Authors:K. Hafner; H.C. Ritter; T.M. Schwair; S. Wallstab; M. Deppermann; J. Gessner; S. Koesters; W.-D. Moeller; G. Sandweg
Year: 1991
A methodology for debugging ASIC prototypes in the field
Publisher: IEEE Computer Society
Authors:D.A. Fechser
Year: 1991
A mathematical model for integrated diagnostics
Publisher: IEEE Computer Society
Authors:J.W. Sheppard; W.R. Simpson
Year: 1991
Rapid prototyping for DSP systems with multiprocessors
Publisher: IEEE Computer Society
Authors:M. Engels; R. Lauwereins; J.A. Peperstraete
Year: 1991
Testing interconnections to static RAMs
Publisher: IEEE Computer Society
Authors:D.K. Bhavsar
Year: 1991
A test-pattern-generation algorithm for sequential circuits
Publisher: IEEE Computer Society
Authors:E. Auth; M.H. Schulz
Year: 1991
System complexity and integrated diagnostics
Publisher: IEEE Computer Society
Authors:W.R. Simpson; J.W. Sheppard
Year: 1991
Designing in power-down test circuits
Publisher: IEEE Computer Society
Authors:P.S. Levy
Year: 1991
Electrical characterization of megabit DRAMs. 1. External testing
Publisher: IEEE Computer Society
Authors:G. Antonin; H.-D. Oberle; J. Kolzer
Year: 1991
A fail-safe interlocking system for railways
Publisher: IEEE Computer Society
Authors:V. Chandra; M.R. Verma
Year: 1991
Designing a real-time coprocessor for Ada tasking
Publisher: IEEE Computer Society
Authors:J. Roos
Year: 1991
Computer-aided prototyping for ASIC-based systems
Publisher: IEEE Computer Society
Authors:S. Walters
Year: 1991
A rapid-prototyping environment for digital-signal processors
Publisher: IEEE Computer Society
Authors:R. Hartley; K. Welles, II; M. Hartman; A. Chatterjee; P. Delano; B. Molnar; C. Rafferty
Year: 1991
Rapid prototyping of high-speed communications chips
Publisher: IEEE Computer Society
Authors:D.G. Boyer; R.R. Cordell
Year: 1991
Fast prototyping of datapath-intensive architectures
Publisher: IEEE Computer Society
Authors:J.M. Rabaey; C. Chu; P. Hoang; M. Potkonjak
Year: 1991
Concurrent engineering in product development
Publisher: IEEE Computer Society
Authors:R.A. Sprague; K.J. Singh; R.T. Wood
Year: 1991
Simulation-based verification for high-level synthesis
Publisher: IEEE Computer Society
Authors:R. Ernst; J. Bhasker
Year: 1991
The compiled logic simulator
Publisher: IEEE Computer Society
Authors:B.L. Keller; D.P. Carlson; W.B. Maloney
Year: 1991
Object programming for CAD
Publisher: IEEE Computer Society
Authors:W. Wolf
Year: 1991
VHDL as input for high-level synthesis
Publisher: IEEE Computer Society
Authors:R. Camposano; L.F. Saunders; R.M. Tabet
Year: 1991
A rule-based design-for-testability rule checker
Publisher: IEEE Computer Society
Authors:M. Bidjan-Irani
Year: 1991
An optimizer for hardware synthesis
Publisher: IEEE Computer Society
Authors:J. Bhasker; H.-C. Lee
Year: 1990
The Olympus synthesis system
Publisher: IEEE Computer Society
Authors:G. De Micheli; D. Ku; F. Mailhot; T. Truong
Year: 1990
Neural net and Boolean satisfiability models of logic circuits
Publisher: IEEE Computer Society
Authors:S. Chakradhar; V. Agrawal; M. Bushnell
Year: 1990
Design synthesis and silicon compilation
Publisher: IEEE Computer Society
Authors:N.D. Dutt; D.D. Gajski
Year: 1990
A model-based expert system for digital system design
Publisher: IEEE Computer Society
Authors:Jung-Gen Wu; Yu Hen Hu; W.P.-C. Ho; D.Y.Y. Yun
Year: 1990
Dynamic functional testing for VLSI circuits
Publisher: IEEE Computer Society
Authors:P.M. Maurer
Year: 1990
Improved test generation for high-activity circuits
Publisher: IEEE Computer Society
Authors:K. Saluja; K. Kim
Year: 1990
Fault sampling revisited
Publisher: IEEE Computer Society
Authors:V.D. Agrawal
Year: 1990
Are primitive polynomials always best in signature analysis?
Publisher: IEEE Computer Society
Authors:A. Ahmad; N.K. Nanda; K. Garg
Year: 1990
Dynamic statistical control of manufacturing test
Publisher: IEEE Computer Society
Authors:S.P. Ghosh; E.G. Grochowski
Year: 1990
An efficient VLSI switch-box router
Publisher: IEEE Computer Society
Authors:Jer Min Jou; Jau Yien Lee; Yachyang Sun; Jhing Fa Wang
Year: 1990
From behavior to structure: high-level synthesis
Publisher: IEEE Computer Society
Authors:R. Camposano
Year: 1990
A VHDL standard package for logic modeling
Publisher: IEEE Computer Society
Authors:D.R. Coelho
Year: 1990
A value system for switch-level modeling
Publisher: IEEE Computer Society
Authors:S.P. Smith; R.D. Acosta
Year: 1990
Transparent logic modeling in VHDL
Publisher: IEEE Computer Society
Authors:J.E. DeGroat
Year: 1990
Logic modeling in WAVES
Publisher: IEEE Computer Society
Authors:A.S. Gilman
Year: 1990
Verifying a multiprocessor cache controller using random test generation
Publisher: IEEE Computer Society
Authors:D.A. Wood; G.A. Gibson; R.H. Katz
Year: 1990
Embedded totally self-checking checkers: a practical design
Publisher: IEEE Computer Society
Authors:S. Kundu; S.M. Reddy
Year: 1990
Integrating tester pin electronics
Publisher: IEEE Computer Society
Authors:C.W. Branson
Year: 1990
Low-cost testing of high-density logic components
Publisher: IEEE Computer Society
Authors:R.W. Bassett; B.J. Butkus; S.R. Dingle; M.R. Faucher; P.S. Gillis; J.H. Panner; J.G. Petrovick, Jr.; D.L. Wheater
Year: 1990
Built-in self-test of the Macrolan chip
Publisher: IEEE Computer Society
Authors:R. Illman; S. Clarke
Year: 1990
Implementing macro test in silicon compiler design
Publisher: IEEE Computer Society
Authors:F. Beenker; R. Dekker; R. Stans; M. Van der Star
Year: 1990
Serial interfacing for embedded-memory testing
Publisher: IEEE Computer Society
Authors:B. Nadeau-Dostie; A. Silburt; V.K. Agarwal
Year: 1990
A minimalist approach to VHDL logic modeling
Publisher: IEEE Computer Society
Authors:P.J. Menchini
Year: 1990
A statistical model for delay-fault testing
Publisher: IEEE Computer Society
Authors:E.S. Park; M.R. Mercer; T.W. Williams
Year: 1989
Post-layout verification of the WE DSP32 digital signal processor
Publisher: IEEE Computer Society
Authors:L.E. Bays; Chin-Fu Chen; E.M. Fields; R.N. Gadenz; W.P. Hays; H.S. Moscovitz; T.G. Szymanski
Year: 1989
Designing and implementing an architecture with boundary scan
Publisher: IEEE Computer Society
Authors:R.P. van Riessen; H.G. Kerkhoff; A. Kloppenburg
Year: 1990
Contactless, high-speed waveform measurements on gallium arsenide ICs
Publisher: IEEE Computer Society
Authors:H.K. Seitz; A. Blacha; R. Clauberg; H. Beha; J. Feder
Year: 1990
Test generation for current testing (CMOS ICs)
Publisher: IEEE Computer Society
Authors:P. Nigh; W. Maly
Year: 1990
Using a test-specification format in automatic test-program generation
Publisher: IEEE Computer Society
Authors:B. Verhelst
Year: 1990
A testability strategy for microprocessor architecture
Publisher: IEEE Computer Society
Authors:F. Catthoor; J. van Sas; L. Inze; H. De Man
Year: 1989
A synthesis environment for designing DSP systems
Publisher: IEEE Computer Society
Authors:A.E. Casavant; M.A. d'Abreu; M. Dragomirecky; D.A. Duff; J.R. Jasica; M.J. Hartman; K.S. Hwang; W.D. Smith
Year: 1989
Wafer-level testing with a membrane probe
Publisher: IEEE Computer Society
Authors:B. Leslie; F. Matta
Year: 1989
An ultra high speed test system
Publisher: IEEE Computer Society
Authors:F.J. Henley
Year: 1989
Realistic built-in self-test for static RAMs
Publisher: IEEE Computer Society
Authors:R. Dekker; F. Beenker; L. Thijssen
Year: 1989
Boundary scan with built-in self-test
Publisher: IEEE Computer Society
Authors:C.S. Gloster, Jr.; F. Brglez
Year: 1989
A data structure for fast region searches
Publisher: IEEE Computer Society
Authors:Y.S. Kuo; S.-Y. Hwang; H.F. Hu
Year: 1989
VLSI design and CAD technology in Korea
Publisher: IEEE Computer Society
Authors:Young-Uk Yu
Year: 1989
Logic simulation engines in Japan
Publisher: IEEE Computer Society
Authors:S. Takasaki; F. Hirose; A. Yamada
Year: 1989
Ideas: a tool for VLSI CAD
Publisher: IEEE Computer Society
Authors:Alok Kumar; Vijeta Kashyap; S.D. Sherlekar; G. Venkatesh; S. Biwas; Anshul Kumar; P.C.P. Bhatt; Sashi Kumar
Year: 1989
Test counting: a tool for VLSI testing
Publisher: IEEE Computer Society
Authors:S.B. Akers; B. Krishnamurthy
Year: 1989
The V compiler: automatic hardware design
Publisher: IEEE Computer Society
Authors:V. Berstis
Year: 1989
Scan-path architecture for pseudorandom testing
Publisher: IEEE Computer Society
Authors:B.I. Dervisoglu
Year: 1989
Failure diagnosis of structured VLSI
Publisher: IEEE Computer Society
Authors:J.A. Waicukauski; E. Lindbloom
Year: 1989
Wire ordering for detailed routing
Publisher: IEEE Computer Society
Authors:P. Groeneveld
Year: 1989
Algorithms for high-level synthesis
Publisher: IEEE Computer Society
Authors:P.G. Paulin; J.P. Knight
Year: 1989
Parallel distributed-time logic simulation
Publisher: IEEE Computer Society
Authors:L. Soule; A. Gupta
Year: 1989
DFT Expert: designing testable VLSI circuits
Publisher: IEEE Computer Society
Authors:S. Bhawmik; P. Palchaudhuri
Year: 1989
PROUD: a sea-of-gates placement algorithm
Publisher: IEEE Computer Society
Authors:Ren-Song Tsay; E.S. Kuh; Chi-Ping Hsu
Year: 1988
The reliability of approximate testability measures
Publisher: IEEE Computer Society
Authors:L.M. Huisman
Year: 1988
Engineering a device for electron-beam probing
Publisher: IEEE Computer Society
Authors:W.T. Lee
Year: 1989
Scan design at NEC
Publisher: IEEE Computer Society
Authors:S. Funatsu; M. Kawai; A. Yamada
Year: 1989
A built-in test module for fault isolation
Publisher: IEEE Computer Society
Authors:N. Vasanthavada; N. Kanopoulos
Year: 1989
The impact of boundary scan on board test
Publisher: IEEE Computer Society
Authors:K.P. Parker
Year: 1989
A workbench for computer architects
Publisher: IEEE Computer Society
Authors:C.L. Mitchell; M.J. Flynn
Year: 1988
Using Ada as an HDL
Publisher: IEEE Computer Society
Authors:S. Ghosh
Year: 1988
A single-row transformation technique
Publisher: IEEE Computer Society
Authors:J.S.L. Wong; D.W.Y. Kwok
Year: 1988
Evolution of the electronic design automation industry
Publisher: IEEE Computer Society
Authors:R.A. Rohrer
Year: 1988
Automated BIST for sequential logic synthesis
Publisher: IEEE Computer Society
Authors:C.E. Stroud
Year: 1988
Incremental switch-level analysis
Publisher: IEEE Computer Society
Authors:D.L. Beatty; R.E. Bryant
Year: 1988
Built-in self-test of a CMOS ALU
Publisher: IEEE Computer Society
Authors:E. Cerny; E.M. Aboulhamid; G. Bois; J. Cloutier
Year: 1988
Clock system design
Publisher: IEEE Computer Society
Authors:K.D. Wagner
Year: 1988
An expert system to automate timing design
Publisher: IEEE Computer Society
Authors:A. Kara; R. Rastogi; K. Kawamura
Year: 1988
A knowledge-based system for selecting test methodologies
Publisher: IEEE Computer Society
Authors:X.-A. Zhu; M.A. Breuer
Year: 1988
Test research in Japan
Publisher: IEEE Computer Society
Authors:H. Fujiwara; Y. Takamatsu; T. Nanya; T. Yamada; H. Tamamoto; K. Furuya
Year: 1988
Chip-level modeling with HDLs
Publisher: IEEE Computer Society
Authors:J.R. Armstrong
Year: 1988
Behavioral model synthesis with Cones
Publisher: IEEE Computer Society
Authors:C.E. Stroud; R.R. Munoz; D.A. Pierce
Year: 1988
Behavioral-level fault simulation
Publisher: IEEE Computer Society
Authors:S. Ghosh
Year: 1988
Algorithms for automatic test-pattern generation
Publisher: IEEE Computer Society
Authors:T. Kirkland; M.R. Mercer
Year: 1988
Throughput advantages of asynchronous prober control
Publisher: IEEE Computer Society
Authors:R.J. Powers
Year: 1988
Analysis of testable PLA designs
Publisher: IEEE Computer Society
Authors:X.-A. Zhu; M.A. Breuer
Year: 1988
Built-in test for RAMs
Publisher: IEEE Computer Society
Authors:P.H. Bardell, Jr.; W.H. McAnney
Year: 1988
Call for Papers
Publisher: IEEE Computer Society
Year: 1987
Designing circuits with partial scan
Publisher: IEEE Computer Society
Authors:V.D. Agrawal; Kwang-Ting Cheng; D.D. Johnson; T. Sheng Lin
Year: 1988
Real-world board test effectiveness
Publisher: IEEE Computer Society
Authors:E.O. Schlotzhauer
Year: 1988
250-MHz advanced test systems
Publisher: IEEE Computer Society
Authors:A.J. Gruodis; D.E. Hoffman
Year: 1988
A workstation approach to IC process and device design
Publisher: IEEE Computer Society
Authors:D.S. Boning; D.A. Antoniadis
Year: 1988
Design verification of the WE 32106 math accelerator unit
Publisher: IEEE Computer Society
Authors:P.M. Maurer
Year: 1988
ICCD 87 Best Paper Awards
Publisher: IEEE Computer Society
Year: 1987
1987 D&T Referees
Publisher: IEEE Computer Society
Year: 1987
Annual Index
Publisher: IEEE Computer Society
Year: 1987
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 1987
IEEE Design & Test of Computers
Publisher: IEEE Computer Society
Year: 1987
The Computer Society
Publisher: IEEE Computer Society
Year: 1987
D&T Calendar
Publisher: IEEE Computer Society
Year: 1987
D&T Scene
Publisher: IEEE Computer Society
Year: 1987
Industry Briefs
Publisher: IEEE Computer Society
Year: 1987
New Products Design
Publisher: IEEE Computer Society
Year: 1987
New Products Test
Publisher: IEEE Computer Society
Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1987
Correction
Publisher: IEEE Computer Society
Year: 1987
Metastable Behavior in Digital Systems
Publisher: IEEE Computer Society
Authors:Lindsay Kleeman; Antonio Cantoni
Year: 1987
How to Write EDIF for Tutorials
Publisher: IEEE Computer Society
Year: 1987
Top-Down Layout for Hierarchical Custom Design
Publisher: IEEE Computer Society
Authors:K. Ueda; H. Kitazawa; T. Adachi; I. Harada
Year: 1987
Testing And Applications of Inverter-Free PLAs
Publisher: IEEE Computer Society
Authors:Janusz Rajski; Vinod K. Agarwal
Year: 1987
Parallel Discrete-Event Simulation
Publisher: IEEE Computer Society
Authors:Walid Najjar; Jean-Luc Jezouin; Jean-Luc Gaudiot
Year: 1987
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 1987
IEEE Design & Test of Computers
Publisher: IEEE Computer Society
Year: 1987
The Computer Society
Publisher: IEEE Computer Society
Year: 1987
Teaching Network Design
Publisher: IEEE Computer Society
Year: 1987
Editorial Board
Publisher: IEEE Computer Society
Year: 1987
D&T Letters
Publisher: IEEE Computer Society
Year: 1987
Erratum
Publisher: IEEE Computer Society
Year: 1987
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 1987
New Products Design
Publisher: IEEE Computer Society
Year: 1987
New Products Test
Publisher: IEEE Computer Society
Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1987
Attention Readers! Save the Reputation of Your Colleagues!
Publisher: IEEE Computer Society
Year: 1987
Multipurpose Parallelism for VLSI Cad on the RP3
Publisher: IEEE Computer Society
Authors:Frederica Darema; Gregory F. Pfister
Year: 1987
Enter the Annual Gordon Bell Awards for Parallel Processing Speedup
Publisher: IEEE Computer Society
Year: 1987
MARS: A Multiprocessor-Based Programmable Accelerator
Publisher: IEEE Computer Society
Authors:P. Agrawal; W.J. Dally; W.C. Fischer; H.V. Jagadish; A.S. Krishnakumar; R. Tutundjian
Year: 1987
D&T Calendar
Publisher: IEEE Computer Society
Year: 1987
An Isma Lee Router Accelerator
Publisher: IEEE Computer Society
Authors:Thomas Ryan; Edwin Rogers
Year: 1987
D&T Scene
Publisher: IEEE Computer Society
Year: 1987
Mixed Signal I.C. Test with a New Twist
Publisher: IEEE Computer Society
Year: 1987
Editorial board
Publisher: IEEE Computer Society
Year: 1987
First Call for Papers
Publisher: IEEE Computer Society
Year: 1987
Industry Briefs
Publisher: IEEE Computer Society
Year: 1987
Parallel Processing for CAD Applications
Publisher: IEEE Computer Society
Year: 1987
New Products Design
Publisher: IEEE Computer Society
Year: 1987
New Products Test
Publisher: IEEE Computer Society
Year: 1987
The Computer Society
Publisher: IEEE Computer Society
Year: 1987
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 1987
There's More to Board Test Than Just Testing Boards
Publisher: IEEE Computer Society
Year: 1987
There's More to Board Test Than Just Testing Boards
Publisher: IEEE Computer Society
Year: 1987
D&T Calendar
Publisher: IEEE Computer Society
Year: 1987
D&T Scene
Publisher: IEEE Computer Society
Year: 1987
Industry Briefs
Publisher: IEEE Computer Society
Year: 1987
D&T Standards
Publisher: IEEE Computer Society
Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1987
Call for Papers
Publisher: IEEE Computer Society
Year: 1987
An Introduction to Switch-Level Modeling
Publisher: IEEE Computer Society
Authors:John P. Hayes
Year: 1987
A Survey of Switch-Level Algorithms
Publisher: IEEE Computer Society
Authors:Randal E. Bryant
Year: 1987
ITC. The Only Serious Place for Test [advertisement]
Publisher: IEEE Computer Society
Year: 1987
Designing CMOS Circuits for Switch-Level Testability
Publisher: IEEE Computer Society
Authors:Dick L. Liu; Edward J. McCluskey
Year: 1987
TTTC 10th Anniversary
Publisher: IEEE Computer Society
Authors:Paul Bardell
Year: 1987
Test Technology TC Membership
Publisher: IEEE Computer Society
Year: 1987
Real-Time' Solution to ASIC Verification [advertisement]
Publisher: IEEE Computer Society
Year: 1987
Editorial Board
Publisher: IEEE Computer Society
Year: 1987
International Test Conference 1987
Publisher: IEEE Computer Society
Year: 1987
Switch-Level Techniques
Publisher: IEEE Computer Society
Year: 1987
New for Network Designers
Publisher: IEEE Computer Society
Year: 1987
IEEE International Conference on Computer Design: VLSI in Computers
Publisher: IEEE Computer Society
Year: 1987
Book Reviews
Publisher: IEEE Computer Society
Year: 1987
Call for Papers
Publisher: IEEE Computer Society
Year: 1987
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 1987
IEEE Design & Test of Computers
Publisher: IEEE Computer Society
Year: 1987
The Intel Influence [advertisement]
Publisher: IEEE Computer Society
Year: 1987
ITC. The Only Serious Place for Test [advertisement]
Publisher: IEEE Computer Society
Year: 1987
The Design of Dedicated 32-Bit Processors
Publisher: IEEE Computer Society
Authors:Shoji Horiguchi; Hiroshi Yoshimura; Mitsuyoshi Nagatani; Kennosuke Fukami
Year: 1987
New Products Design
Publisher: IEEE Computer Society
Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1987
ACM/IEEE 24th Design Automation Conference
Publisher: IEEE Computer Society
Year: 1987
Design Automation Technical Committee News Letter
Publisher: IEEE Computer Society
Year: 1987
1987 Design Automation Conference
Publisher: IEEE Computer Society
Year: 1987
Using CAD Tools in the Design of CRISP
Publisher: IEEE Computer Society
Authors:David R. Ditzel; Alan D. Berenbaum
Year: 1987
Designing the Micro/370
Publisher: IEEE Computer Society
Authors:H.H. Chao; S. Ong; M. Tsai; F.W. Shih; K.W. Lewis; J. Y. F. Tang; C. A. Trempel; H. N. Yu; P.E. McCormick; C. V. Davis; A. L. Diamond; T. J. Medve; J. C. L. Hou
Year: 1987
For Design/Test Engineering Digital Has It Now
Publisher: IEEE Computer Society
Year: 1987
Design And Test of the 80386
Publisher: IEEE Computer Society
Authors:Patrick P. Gelsinger
Year: 1987
D&T Calendar
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Year: 1987
The Computer Society
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Year: 1987
Editorial Board
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Year: 1987
Editorial Board
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Year: 1987
D&T Scene
Publisher: IEEE Computer Society
Year: 1987
Industry Briefs
Publisher: IEEE Computer Society
Year: 1987
Physical Design of Microprocessors
Publisher: IEEE Computer Society
Year: 1987
D&T Calendar
Publisher: IEEE Computer Society
Year: 1987
Real-Time' Solution to ASIC Verification [advertisement]
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Year: 1987
New for Network Designers
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Year: 1987
Editor-In-Chief's Message
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Year: 1987
New Products Test
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Year: 1987
Industry Briefs
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Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1987
Erratum
Publisher: IEEE Computer Society
Year: 1987
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 1987
IEEE Design & Test of Computers
Publisher: IEEE Computer Society
Year: 1987
Transition Fault Simulation
Publisher: IEEE Computer Society
Authors:John A. Waicukauski; Eric Lindbloom; Barry K. Rosen; Vijay S. Iyengar
Year: 1987
Aliasing Errors in Signature in Analysis Registers
Publisher: IEEE Computer Society
Authors:T.W. Williams; W. Daehn; M. Gruetzner; C.W. Starke
Year: 1987
The Effects of Modeling on Simulator Performance
Publisher: IEEE Computer Society
Authors:Alexander Miczo; Dipti Mohapatra; Scott Perkins; Katie Kaufman; Ken Huang
Year: 1987
New Products Design
Publisher: IEEE Computer Society
Year: 1987
You May Already Be a Winner
Publisher: IEEE Computer Society
Year: 1987
D&T Scene
Publisher: IEEE Computer Society
Year: 1987
D&T Standards
Publisher: IEEE Computer Society
Year: 1987
Testing Mixed-Signal Devices
Publisher: IEEE Computer Society
Authors:Randall Kramer
Year: 1987
The Seventeenth International Symposium on Fault-Tolerant Computing
Publisher: IEEE Computer Society
Year: 1987
Timing Accuracy in Modern ATE
Publisher: IEEE Computer Society
Authors:Mark R. Barber; Walter I. Satre
Year: 1987
The Computer Society of the IEEE
Publisher: IEEE Computer Society
Year: 1987
Editorial Board
Publisher: IEEE Computer Society
Year: 1987
Editorial Board
Publisher: IEEE Computer Society
Year: 1987
D&T Letters
Publisher: IEEE Computer Society
Year: 1987
Test Technology: Testing's Impact on Design And Manufacturing
Publisher: IEEE Computer Society
Year: 1987
Call for Papers
Publisher: IEEE Computer Society
Year: 1987
Book Reviews
Publisher: IEEE Computer Society
Year: 1987
D&T Call for Books And Reviewers
Publisher: IEEE Computer Society
Year: 1987
Advertiser/Product Index
Publisher: IEEE Computer Society
Year: 1987
IEEE Design & Test of Computers
Publisher: IEEE Computer Society
Year: 1987
IEEE Design & Test of Computers
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Year: 1987
Scan Design Using Standard Flip-Flops
Publisher: IEEE Computer Society
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Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1987
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Year: 1987
New Products Design
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Year: 1987
New Products Test
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Year: 1987
Design Automation Technical Committee Newsletter
Publisher: IEEE Computer Society
Year: 1987
Design Version Management
Publisher: IEEE Computer Society
Authors:Randy H Katz; Rajiv Bhateja; Ellis E-Li Chang; David Gedye; Vony Trijanto
Year: 1987
Call for Papers
Publisher: IEEE Computer Society
Year: 1987
Efficient Spare Allocation for Reconfigurable Arrays
Publisher: IEEE Computer Society
Authors:Sy-Yen Kuo; W. Kent Fuchs
Year: 1987
Flute an Expert Floor Planner for Full-Custom VLSI Design
Publisher: IEEE Computer Society
Authors:Hiroyuki Watanabe
Year: 1987
Built-In Self-Testing RAM: A Practical Alternative
Publisher: IEEE Computer Society
Authors:Kewal K. Saluja; Siew H. Sng; Kozo Kinoshita
Year: 1987
Hey You!
Publisher: IEEE Computer Society
Year: 1987
The Computer Society of the IEEE
Publisher: IEEE Computer Society
Year: 1987
Editorial Board
Publisher: IEEE Computer Society
Year: 1987
D&T Letters
Publisher: IEEE Computer Society
Year: 1987
D&T Forum
Publisher: IEEE Computer Society
Year: 1987
D&T Scene
Publisher: IEEE Computer Society
Year: 1987
Design Automation
Publisher: IEEE Computer Society
Year: 1987
In the next D&T...
Publisher: IEEE Computer Society
Year: 1986
Advertiser Index - December 1986
Publisher: IEEE Computer Society
Year: 1986
IEEE Design & Test of Computers
Publisher: IEEE Computer Society
Year: 1986
The Single Board Computer That Doesn't Lock You In [advertisement]
Publisher: IEEE Computer Society
Year: 1986
We Want You for the ISDN Revolution
Publisher: IEEE Computer Society
Year: 1987
A conference preview - 1987 Design Automation Conference
Publisher: IEEE Computer Society
Year: 1987
D&T Conferences
Publisher: IEEE Computer Society
Year: 1986
D&T Calendar
Publisher: IEEE Computer Society
Year: 1986
Now, Your Computer And Communications Network Analysis Simplified
Publisher: IEEE Computer Society
Year: 1986
Annual index
Publisher: IEEE Computer Society
Year: 1986
Test Technology Newsletter
Publisher: IEEE Computer Society
Year: 1986
Book Reviews
Publisher: IEEE Computer Society
Year: 1986
A D&T Tutorial
Publisher: IEEE Computer Society
Year: 1986
ATE Seminars
Publisher: IEEE Computer Society
Year: 1986
D&T Referees
Publisher: IEEE Computer Society
Year: 1986
New Products Design
Publisher: IEEE Computer Society
Year: 1986
New Products Test
Publisher: IEEE Computer Society
Year: 1986
D&T Standards
Publisher: IEEE Computer Society
Year: 1986


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