Method for producing via-connections in semiconductor wafers using a combination of plasma and chemical etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Guldan; L. Hrubcin; J. Kubek; R. Tykva
Year: 1983
Latchup prevention using an N-well epi-CMOS process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.J. Holly; L.A. Akers
Year: 1983
Gain characteristics of a distributed IMPATT device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Soohoo
Year: 1983
Effect of silicide process on bipolar transistor current gain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.H. Oh; P.T. Panousis
Year: 1983
Transient response of diffused junction capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Shenai; H.C. Lin
Year: 1983
Optimum semiconductors for high-frequency and low-noise MESFET applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M. Golio; R.J. Trew
Year: 1983
Hole injection into nontransparent n-type Si layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.H. Berger
Year: 1983
Characterization of local transfer defects in CCD's using a multireversal transfer mode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lemonier; C. Piaget
Year: 1983
Two-dimensional effects in hot-electron modified MOSFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Lombardi; P. Olivo; B. Ricco; E. Sangiorgi; M. Vanzi
Year: 1983
Erratum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Carter
Year: 1983
Editorial
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Carter
Year: 1983
Changes in the editorial board
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Carter
Year: 1983
Foreword
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.K. Pancholy
Year: 1983
VLSI Process modeling—SUPREM III
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.P. Ho; J.D. Plummer; S.E. Hansen; R.W. Dutton
Year: 1983
Verification of models for fabrication of Arsenic source-drains in VLSI MOSFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Albers; P. Roitman; C.L. Wilson
Year: 1983
Two-dimensional simulation of a 2-µm CMOS process using ROMANS II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.D. Maldonado; F.Z. Custode; S.A. Louie; R. Pancholy
Year: 1983
Topography-dependent electrical parameter simulation for VLSI design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keunmyung Lee; Y. Sakai; A.R. Neureuther
Year: 1983
Contrast studies in high-performance projection optics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.G. Oldham; W. Arden; H. Binder; C. Ting
Year: 1983
Refractory metal silicides: Thin-film properties and processing technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.P. Chow; A.J. Steckl
Year: 1983
Properties of low-pressure CVD tungsten silicide for MOS VLSI interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Saraswat; D.L. Brors; J.A. Fair; K.A. Monnig; R. Beyers
Year: 1983
The sloped-wall SWAMI—A defect-free zero bird's-beak local oxidation process for scaled VLSI technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.Y. Chiu; J.L. Moll; K.M. Cham; Jung Lin; C. Lage; S. Angelos; R.L. Tillman
Year: 1983
Selective low-pressure silicon epitaxy for MOS and bipolar transistor application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kurten; H.-J. Voss; Wonchan Kim; W.L. Engl
Year: 1983
CMOS on buried nitride—A VLSI SOI technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Zimmer; H. Vogt
Year: 1983
A novel self-aligned isolation process for VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.Y.-T. Chen; R.C. Henderson; D.E. Snyder
Year: 1983
Tunneling in base-emitter junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M.C. Stork; R.D. Isaac
Year: 1983
Direct measurements of interfacial contact resistance, end contact resistance, and interfacial contact layer uniformity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.J. Proctor; L.W. Linholm; J.A. Mazer
Year: 1983
The use of refractory metal and electron-beam sintering to reduce contact resistance for VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.Y.-T. Chen; D.B. Rensch
Year: 1983
Rapid electron-beam isothermal processing of arsenic-implanted NMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. McMahon; H. Ahmed; D. Godfrey; K.J. Yallup
Year: 1983
I-2 device performance of high speed III-V semiconductor devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Soloman
Year: 1983
I-3 recent development and future trends in latchup prevention in scaled CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.R. Troutman
Year: 1983
IIA-1 (GaAl)As/GaAs heterojunction dipolar transistors with graded composition in the base
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Miller; P.M. Asbeck; R.J. Anderson; F.H. Eisen
Year: 1983
I-4 gain and loss processes in InGaAsP/InP DH lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.H. Pilkuhn
Year: 1983
IIA-2 double heterojunction Al0.5Ga0.5As/GaAs bipolar transistors with improved interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Fishcer; S.L. Su; D. Arnold; J. Klem; H. Morkoc; W.G. Lyons; O. Tejayadi
Year: 1983
IIA-3 (Al,In)As/(Ga,In)As heterojunction bipolar transistors grown by molecular beam epitaxy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.J. Malik; J.R. Hayes; F. Capasso; K. Alavi; A.Y. Cho
Year: 1983
IIA-4 mobility measurements in submicron-gate modulation-doped AlxGa1-xAs/GaAs heterojunction FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.H. Wallis; P. Delescluse; M. Laviron; D. Delagebeaudeuf
Year: 1983
IIA-5 low frequency noise in AlGaAs-GaAs MODFET and its implication for device performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Peczalski; G.H. Duh; A. van der Ziel; X.C. Zhu
Year: 1983
IIA-6 sensitivity of threshold voltage and sheet carrier concentration to material and electronic parameters in a HEMT device
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tiwari
Year: 1983
IIA-7 ultra high speed integrated circuits using GaAs/GaAlAs high electron mobility transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.P. Lee; D.L. Miller; D. Hou; R.J. Anderson
Year: 1983
IIA-8 device characteristics of short channel high electron mobility transistor (HEMT)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nishiuchi; T. Mimura; S. Kuroda; S. Hiyamizu; H. Nishi; M. Abe
Year: 1983
IIB-1 two components of tunneling current in metal-oxide-semiconductor structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Eitan; A. Kolodny
Year: 1983
IIB-2 direct tunneling in thin gate-oxide MOS structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chi Chang; R.W. Brodersen; Mong-Song Liang; Chenwing Hu
Year: 1983
IIB-3 analysis and modeling of floating-gate E2Prom cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kolodny; S. Nieh; B. Eitan; J. Shappir
Year: 1983
IIB-4 analysis of the channel inversion layer capacitance in the very thin-gate IGFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soo-Young Oh; Suk-Gi Choi; C.G. Sodini; J.L. Moll
Year: 1983
IIB-5 practical limitations of gate-oxide thickness minimization in the MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Pin Han; J.P. Mize; B.T. Moore; J. Pinto; R. Worley
Year: 1983
IIB-7 elimination of radiation-induced interface states by nitridation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.L. Terry, Jr.; R.J. Aucoin; M.L. Naiman; P.W. Wyatt; S.D. Senturia
Year: 1983
IIIA-1 gain and carrier lifetime measurement in AlGaAs quantum well lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.K. Dutta; R.L. Hartman; W.T. Tsang
Year: 1983
IIIA-2 optical properties of GaAs-AlGaAs multi-quantum-well lasers/Waveguides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Tarucha; H. Iwamura; H. Kobayaski; Y. Horikoshi; H. Okamoto
Year: 1983
IIIA-3 stimulated emission in strained-layer quantum-well heterostructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Holonyak, Jr.; M.D. Camras; J.M. Brown; M.J. Ludowise; W.T. Dietze; C.R. Lewis
Year: 1983
IIIA-4 resonant tunneling through quantum wells at 2.5 THz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.C.L.G. Sollner; W.D. Goodhue; P.E. Tannenwald; C.D. Parker; D.D. Peck
Year: 1983
IIIA-6 subpicosecond electrical sampling technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Valdmanis; G. Mourou; K.E. Meyer
Year: 1983
IIIA-5 direct-indirect transitions in GaSb-AlSb superlattices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.I. Wang; E.E. Mendez; C.A. Chang; L.L. Chang; L. Esaki
Year: 1983
IIIA-7 measurement of high electron drift velocity in a submicron heavily doped graded GAP AlxGa1-xAs layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.F. Levine; C.G. Bethea; W.T. Tsang; F. Capasso; K.K. Thornber; R.C. Fulton
Year: 1983
IIIA-8 measurements of the conduction band discontinuity of MBE-grown In0.52Al0.48As/In0.53Ga0.47As, N-n heterojunction by C-V profiling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. People; K.W. Wecht; K. Alavi; A.Y. Cho
Year: 1983
IIIB-1 High accuracy physical modeling of submicron MOSFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.L. Wilson
Year: 1983
IIIB-2 quantification of photon generation in CMOS VLSI structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Gerosa; S. Stern; B. Bastani; R. Chwang
Year: 1983
IIIB-3 scattering analysis of low surface-effective-field mobility degradation in sub-100Å gate oxide MOSFETS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.T. Moore; J.P. Mize; Yu-Pin Han; J. Pinto; R. Worley
Year: 1983
IIIB-5 current characterization of SCR latch-up in CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Dishaw; K. Kokkonen; A. Matthews; A. Henning
Year: 1983
IIIB-4 analysis on selective writing for Taper isolated RAM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kurosawa; T. Ishijima; M. Takada; K. Terada; S. Suzuki
Year: 1983
IIIB-6 "CODMOS" — A depletion MOSFET using fixed oxide charge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kazerounian; W.G. Oldham
Year: 1983
IIIB-8 modeling physical limitations on junction scaling for CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.B. Fair; J.J. Wortman; J. Liu; M. Tischler; N.A. Masnari; K.Y. Duh
Year: 1983
IIIB-7 high speed operation of amorphous-silicon charge-coupled devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Matsumura; S. Kishida; Y. Uchida; Y. Nara
Year: 1983
IVA-1 Dynamic performance studies of GaAs IC's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Lekakis; S.I. Long
Year: 1983
IIIB-9 dopant profile control by rapid thermal annealing in boron and arsenic implanted silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Narayan; D.W. Holland; R. Eby; J.J. Wortman; V. Ozguz; G.A. Rozgonyi
Year: 1983
IVA-2 self-aligned submicron ion-implanted GaAs MESFETs for high-speed logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. Sadler; L.F. Eastman
Year: 1983
IVA-3 selectively doped heterostructure divided-by-two circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. Kiehl; M.D. Feuer; R.H. Hendel; J.C.M. Hwang; V.G. Keramidas; C.L. Allyn; R. Dingle
Year: 1983
IVA-4 an ultra-low power, high speed GaAs 256-bit static RAM with depletion mode MESFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.J. Lee; R.P. Vahrenkamp; G.R. Kaelin; R. Zucca; L.D. Hou; C.P. Lee; C.G. Kirkpatrick
Year: 1983
IVA-5 through-AIN implantation for a high transconductance self-aligned GaAs MESFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Nishi; H. Onodera; H. Kawata; N. Yokoyama; A. Shibatomi
Year: 1983
IVA-6 ultra high intensity argon arc lamp annealing of ion implanted GaAs devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tabatabaie-Alavi; H. Kanbe; A.N.M. Masum Choudhury; C.G. Fonstad; J.C. Gelpy
Year: 1983
IVA-8 GaAlAs/GaAs integrated optoelectronic transmitter using selective MOCVD epitaxy and planar ion implantation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.S. Hong; M.E. Kim; D. Kasemset; R.A. Milano
Year: 1983
IVA-7 a new high purity Si doping source for MBE grown GaAs devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.D. Kirchner; J.M. Woodall; S. Wright
Year: 1983
IVB-1 phase-locked array of CSP-LOC lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Botez; J.C. Connolly
Year: 1983
IVB-2 facet-coated graded-index separate-confinement-heterostructure single-quantum-well lasers having low degradation rates (<1%/kh) at 70°C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.D. Dupuis; R.L. Hartman; F.R. Nash
Year: 1983
IVB-4 1.55µm single-longitudinal-mode multisection ridge lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.E. Bowers; L.A. Coldren; B.R. Hemenway; B.I. Miller
Year: 1983
IVB-3 long-lived GaAlAs laser diodes with multiple quantum wells grown by organometallic vapor phase epitaxy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.L. Paoli; C. Lindstrom; R.D. Burnham; D.R. Scifres; W. Streifer
Year: 1983
IVB-5 amomalous temperature-dependence of the effective bimolecular recombination and the explanation of low T0in 1.3µm InGaAsP light sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.B. Su; R. Olshansky; W. Powazinik; J. Manning
Year: 1983
IVB-6 independent determination of intervalence band absorption and current leakage in GaInAsP/InP - laserstructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Mozer; R. Menner; M.H. Pilkuhn
Year: 1983
IVB-8 high speed pulse generation using a sinusoidally driven Ti:LiNbO3directional coupler traveling-wave optical modulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K. Korotky; R.C. Alferness; L.L. Buhl; C.H. Joyner; E.A.J. Marcatilli
Year: 1983
IVB-7 continuous multi-gigahertz modulation of Q-switched GaInAsP diode lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.Z. Tsang; J.N. Walpole; Z.L. Liau
Year: 1983
VA-1 a new Ni/Ti/Au gate AlGaAs/GaAs FET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Takanashi; T. Ishibashi; T. Sugeta
Year: 1983
VA-2 optimization of ion implanted GaAs low noise FET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Feng; H. Kanber; V.K. Eu; L.H. Hackett; H. Yamasaki; E.T. Watkin; J.M. Schellenberg
Year: 1983
VA-4 design, fabrication, and performance of the opposed gate-source transistor (OGST)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Berenz; K. Nakano; G.C. Dalman; J.P. Krusius; C.A. Lee
Year: 1983
VA-3 state-of-the-art K-band GaAs power field-effect transistors prepared by molecular beam expitaxy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Saunier; H.D. Shih
Year: 1983
VA-5 fabrication of high frequency Ga0.5Al0.5As/GaAs MiSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Mitonneau; J.-P. Andre; A. Briere
Year: 1983
VA-7 High power InP MISFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Armand; D.V. Bui; J. Chevrier; N.T. Linh
Year: 1983
VA-6 low-power high-speed indium phosphide MISFET direct-coupled logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Messick
Year: 1983
VA-8 germanium MISFETs exhibiting low interface state density using Ge3N4gate insulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.J. Rosenberg
Year: 1983
VB-1 characteristics of p-channel MOSFETs in LPCVD polysilicon and effect of grain boundary passivation on device performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.D.S. Malhi; R.R. Shah; P.K. Chatterjee; H.W. Lam; R.F. Pinizzoto; C.E.C. Chen; H. Shichijo; D.W. Bellavance
Year: 1983
VB-2 vertically integrated CMOS devices built on laser recrystallized polysilicon films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Ramono
Year: 1983
VB-3 stacked CMOS sRAM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.-E. Chen; H.W. Lam; S.D.S. Malhi; R.F. Pinizzotto
Year: 1983
VB-4 silicon-on-insulator bipolar transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Rodder; D.A. Antoniadis
Year: 1983
VB-5 fully isolated lateral bipolar/MOS transistors fabricated in zone-melting-recrystallized Si films on SiO2
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.-Y. Tsaur; D.J. Silversmith; J.C.C. Fan; R.W. Mountain
Year: 1983
VB-6 N-channel MOSFETS fabricated in silicon-on-oxide using a scanning E-beam line source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.Y. Chen; D.B. Rensch
Year: 1983
VB-7 performance of buried nitride CMOS devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Zimmer; H. Vogt; E. Neubert; P. Staks
Year: 1983
VIA-1 impact ionization in
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.A. Armiento; S.H. Groves
Year: 1983
VIA-3 high-speed performance of InGaAs photodiodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Diadiuk; S.H. Groves; D.Z. Tsang; J.N. Walpole
Year: 1983
VIA-2 lack of orientation dependence of impact ionization coefficients in InP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Tabatabaie; V.M. Robbins; K.F. Brennan; K. Hess; G.E. Stillman
Year: 1983
VIA-4 reliability of VPE long-wavelength lasers and detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.H. Olsen; N.J. DiGiuseppe; P.P. Webb; T.J. Zamerowski; J.R. Appert; M.G. Harvey
Year: 1983
VIA-6 wavelength discrimination with a dual-wavelength photodetector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.C. Campbell; C.A. Burrus; J.A. Copeland; A.G. Dentai
Year: 1983
VIA-5 a modulation-doped Ga0.47In0.53As photoconductive detector for 1.0-1.6µm applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.Y. Chen; Y.M. Pang; K. Alavi; A.Y. Cho; P.A. Garbinski
Year: 1983
VIA-7 planar monolithic integration of a photodiode and a GaAs MESFET preamplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Kolbas; J. Abrokwah; J.K. Carney
Year: 1983
VIA-8 ultra high speed planar Schottky barrier GaAs photodiode with FWHM <9psec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.Y. Wang; D.M. Bloom; D.M. Collins
Year: 1983
VIB-1 modeling of single particle soft error generation in bipolar random access memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Zoutendyk
Year: 1983
VIB-3 defect structure and electrical property modifications caused by reactive ion etching and ion beam etching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.J. Fonash; R. Singh; A. Climent; A. Rohatgi; P.R. Choudhury; P. Caplan; E. Poindexter
Year: 1983
VIB-2 recent experimental results of Si permeable base transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.D. Rathman; N.P. Economou; D.J. Silversmith; R.W. Mountain; S.M. Cabral
Year: 1983
VIB-4 submicrometer laser-direct-write processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.J. Ehrlich; J.Y. Tsao
Year: 1983
VIC-1 lead-europium-selenide-telluride diode lasers grown by molecular beam epitaxy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Partin
Year: 1983
VIC-2 high performance photodiodes of mercury cadmium telluride (HgCdTe) on sapphire
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.H. Sheng; E.R. Gertner; R.A. Ridel; D.D. Edwall; L.E. Wood; W.E. Tennant
Year: 1983
VIC-3 control of lateral diffusion currents in small area (Hg,Cd)Te photodiodes 1
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.J. Briggs; M.N. Gurnee
Year: 1983
Barrier-limited transport in semiconductor devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Frensley
Year: 1983
An analytic model for the barrier-limited mode of operation of the permeable base transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Frensley
Year: 1983
Semi-empirical equations for electron velocity in silicon: Part I—Bulk
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Schwarz; S.E. Russek
Year: 1983
Semi-empirical equations for electron velocity in silicon: Part II—MOS inversion layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Schwarz; S.E. Russek
Year: 1983
Performance comparison of highly integrated circuits: Silicon NMOS versus gallium arsenide normally-off MESFET technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Gesch; W. Kellner; H. Kniepkamp
Year: 1983
DC holding and dynamic triggering characteristics of bulk CMOS latchup
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.D. Rung; H. Momose
Year: 1983
Theoretical analysis on threshold characteristics of surface-channel MOSFET's fabricated on a buried Oxide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Omura; S. Nakashima; K. Izumi
Year: 1983
Determination of the spatial variation of interface trapped charge using short-channel MOSFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Russell; C.L. Wilson; M. Gaitan
Year: 1983
Behavior of holes generated by impact ionization in n-channel MOSFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Kotani; S. Kawazu; S. Komori
Year: 1983
Shallow p-wells for fine dimension CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.G. Lewis; S.L. Partridge
Year: 1983
The performance of submicrometer gate length GaAs MESFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Curtice
Year: 1983
A low-frequency noise analysis using the two-dimensional numerical analysis method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Sano; T. Tsukahara; T. Kimura
Year: 1983
Some closed-form expressions for relativistic cross-field electron trajectories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.R.M. Vaughan
Year: 1983
On the current-voltage characteristics of n+-p-p+diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.T. Chuang
Year: 1983
The MISIM-FET in thin semiconductor layers: Depletion-approximation model of I-V characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.W. Barth; P.R. Apte; J.B. Angell
Year: 1983
Approximated analytical model for dark and Jsc—Voccharacteristics of p+-i-n+solar cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.L. Araujo; J. Castano; A. Luque; E. Sanchez
Year: 1983
Optimum composition of CaO, SrO dielectric materials in AC plasma display panels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Uchiike; K. Sekiya; T. Hashimoto; T. Shinoda; Y. Fukushima
Year: 1983
New modeling of GaAs MESFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hariu; K. Takahashi; Y. Shibata
Year: 1983
Transient electronic transport in InP under the condition of high-energy electron injection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Brennan; K. Hess; J.Y.-F. Tang; G.J. Iafrate
Year: 1983
Planar Be-implanted GaAs junction formation using swept-line electron beam annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K. Banerjee; R.Y. DeJule; K.J. Soda; B.G. Streetman
Year: 1983
An analytic model for the MIS tunnel junction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.G. Tarr; D.L. Pulfrey; D.S. Camporese
Year: 1983
Effect of illumination wavelength and intensity on minority-carrier diffusion length of EFG silicon ribbon solar cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Shimokawa; Y. Hayashi
Year: 1983
A novel quadrilinear CCD for high resolution line arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sevenhans; J. Bosiers; E. Laes; G.J. Declerck
Year: 1983
Optimization of the composition of a new MRS-type negative resist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Matsuzawa; A. Kishimoto; T. Iwayanagi; H. Yanazawa; H. Obayashi
Year: 1983
An advanced SVG technology for 64K junction-shorting PROM's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fukushima; K. Ueno; K. Tanaka
Year: 1983
Conductivity in polycrystalline silicon—physics and rigorous numerical treatment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Peisl; A.W. Wieder
Year: 1983
Suppression of spurious modes in high-power traveling-wave tubes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Glass
Year: 1983
Bias dependence and light sensitivity of (Al, Ga)As/GaAs MODFET's at 77 K
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Drummond; R.J. Fischer; W.F. Kopp; H. Morkoc; Kwyro Lee; M.S. Shur
Year: 1983
Design optimization study for a 960 × 768 line AC plasma display panel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Lorenzen
Year: 1983
Large-signal modeling of GaAs MESFET operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.M. Snowden; M.J. Howes; D.V. Morgan
Year: 1983
The operation of power MOSFET in reverse mode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-hwa Chi; Chenming Hu
Year: 1983
Profile estimation of high-concentration arsenic or boron diffusion in silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Way-Seen Wang; Yu-Hwa Lo
Year: 1983
Neutron radiation tolerance of field-controlled thyristors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.J. Baliga
Year: 1983
Analysis of the photocurrent decay (PCD) method for measuring minority-carrier lifetime in solar cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.E. Ioannou
Year: 1983
An analytical model for the gate capacitance of small-geometry MOS structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.W. Greeneich
Year: 1983
A stable ytterbium-insulator-semiconductor solar cell based on an interface degradation model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Rajeswaran; V.J. Rao; M.A. Jackson; M. Thayer; W.A. Anderson; B.B. Rao
Year: 1983
Foreword
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.J. Kuno
Year: 1983
Profile studies of ion-implanted MESFET's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.M.M. Golio; R.J. Trew
Year: 1983
Low-noise MESFET's for ion-implanted GaAs MMIC's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.K. Gupta; D.P. Siu; K.T. Ip; W.C. Petersen
Year: 1983
A Ka-band GaAs monolithic phase shifter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sokolov; J.J. Geddes; A. Contolatis; P.E. Bauhahn; Chente Chao
Year: 1983
12-GHz-band low-noise GaAs monolithic amplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sugiura; H. Itoh; T. Tsuji; K. Honjo
Year: 1983
GaAs monolithic MIC's for direct broadcast satellite receivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hori; K. Kamei; K. Shibata; M. Tatematsu; K. Mishima; S. Okano
Year: 1983
Editorial: Innovation processes research implications for public policy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. D. Eveland; William A. Hetzner; Louis G. Tornatzky
Year: 1983
Performance gap theories of innovation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. E. Ettlie
Year: 1983
Technological and other determinants of the international competitiveness of U.S. industries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Gold
Year: 1983
Quantitative case histories of urban innovations: Are there innovating stages?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. C. Pelz
Year: 1983
Implementation of social program innovations in public sector organizations: A test of the modified RD and D model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Roitman; R. Gottschalk; J. Mayer; C. Blakely
Year: 1983
Approaches to the study of implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. A. Scheirer
Year: 1983
Characteristics of sources, channels, and contents for scientific and technical information systems in industrial R and D
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. K. Chakrabarti; S. Feineman; W. Fuentevilla
Year: 1983
Functional management in matrix organizations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Jerkovsky
Year: 1983
Creativity & innovation network: The International review and forum for all those concerned with discovery processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Research management: An International journal dedicated to enhancing the effectiveness of industrial research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About the authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE copyright form
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Advertisements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About this issue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. H. Rubenstein
Year: 1983
Quantitative indicators for evaluation of basic research programs/projects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. D. Frame
Year: 1983
A participative approach to program evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dundar F. Kocaoglu
Year: 1983
The evaluation cycle: In Res evaluation approaches for the eighties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nanette S. Levinson
Year: 1983
A proposed project termination audit model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniel D. Roman
Year: 1983
Pitfalls in the architectural design process and a defensible method for overcoming them
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bernard H. Rudwick
Year: 1983
Priority setting in complex problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas L. Saaty
Year: 1983
The management of federal research programs: Part I — Variations in techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:John Salasin; Howard Bregman
Year: 1983
The management of federal research programs: Part II — Patterns of management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:John Salasin; Howard Bregman
Year: 1983
Ad hoc modeling, expert problem solving, and R&T program evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. G. Silverman; J. Liebowitz; V. S. Moustakis
Year: 1983
Creativity & Innovation network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Contents
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Journal of the society of research administrators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Research management: An International journal dedicated to enhancing the effectiveness of industrial research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
American society for engineering management: Summary of contents of the 1980, 1981, and 1982 annual meeting proceedings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About the authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Advertisements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About this issue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. H. Rubenstein
Year: 1983
Project management and innovation in the scientific instrument industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. A. Bergen; A. W. Pearson
Year: 1983
R&D and quality assurance partnership
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. J. Kohoutek
Year: 1983
Programmatic evaluation and comparison based on standardized citation scores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. R. McAllister; F. Narin; J. G. Corrigan
Year: 1983
R&D management and financial performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. H. Poensgen; H. Hort
Year: 1983
Identifying operative goals by modeling project selection decisions in research and development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. J. Stahl; A. M. Harrell
Year: 1983
Collaborative publication and research in computer science
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Subramanyam
Year: 1983
Managing engineers effectively
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. J. Thamhain
Year: 1983
Preface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. K. Badawy
Year: 1983
Journal of the society of research administrators volume XV, number 1 Summer, 1983
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David W. Canham
Year: 1983
Research management: An International journal dedicated to enhancing the effectiveness of industrial research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About the authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Albert H. Rubenstein
Year: 1983
1983 Index IEEE Transactions on Engineering Management Vol. EM-30
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About this issue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. H. Rubenstein
Year: 1983
A process model for industrial new product development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robert G. Cooper
Year: 1983
The diagnosis of plant failure: A comparison of student and professional engineers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. P. Lewis; G. H. Sier
Year: 1983
Modeling product development decision policies of managers and management students: Differences between subjective and relative weights
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. J. Stahl; T. W. Zimmerer
Year: 1983
Technical and management notes: The roles of expanded awareness and inner awareness in technological creativity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Amoroso
Year: 1983
Flexiplace: An idea whose time has come
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frank W. Schiff
Year: 1983
Journal of management studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karen Legge; Geoff Lockett
Year: 1983
R&D management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. W. Pearson; S. R. Epton
Year: 1983
Research management: An International journal dedicated to enhancing the effectiveness of industrial research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
About the authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Algorithms for sliding block codes - An application of symbolic dynamics to information theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Adler; D. Coppersmith; M. Hassner
Year: 1983
A general approach to minimax robust filtering (M.S. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Verdu
Year: 1983
The largest super-increasing subset of a random set
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Karnin; M. Hellman
Year: 1983
A combinational approach to polygon similarity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Avis; H. Elgindy
Year: 1983
An algorithm for determining all the optimal input probability distributions of the DMC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Watanabe
Year: 1983
The Gaussian test channel with an intelligent jammer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Basar
Year: 1983
The sampling window (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Knab
Year: 1983
A two-dimensional higher order crossings theorem (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Kedem
Year: 1983
On the method of maximum entropy spectrum estimation (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Arcese
Year: 1983
Parameter estimation and linear system identification with randomly interrupted observations (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Tugnait
Year: 1983
Asymptotic receiver operating characteristics for envelope detection of a phase modulated sinusoid (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kenefic; D. Weiner
Year: 1983
Signal sets derived from Steiner systems (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Astola; A. Kananen
Year: 1983
A Golay puzzle (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Solomon; M. Sweet
Year: 1983
Estimation and choice of neighbors in spatial-interaction models of images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kashyap; R. Chellappa
Year: 1983
Theoretical aspects of importance sampling applied to false alarms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Lank
Year: 1983
Sampling designs for the detection of signals in noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Cambanis; E. Masry
Year: 1983
Cycloergodic properties of discrete- parameter nonstationary stochastic processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Boyles; W. Gardner
Year: 1983
Graph theoretic approaches to the code construction for the two-user multiple- access binary adder channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kasami; Shu Lin; V. Wei; S. Yamamura
Year: 1983
Linear block codes for error detection (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kasami; T. Klove; Shu Lin
Year: 1983
A note on maximum distance separable (optimal) codes (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Vermani; S. Jindal
Year: 1983
Monomials of orders 7 and 11 cannot be in the group of a (24, 12, 10) self-dual quaternary code (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Conway; V. Pless
Year: 1983
Compressors for combined source and channel coding with applications to the generalized Gaussian family (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Kuhlmann; J. Bucklew; G. Wise
Year: 1983
A fast algorithm for determining the complexity of a binary sequence with period2^n(Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Games; A. Chan
Year: 1983
Distributed network protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Segall
Year: 1983
On secret sharing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Karnin; J. Greene; M. Hellman
Year: 1983
Uniqueness of locally optimal quantizer for log-concave density and convex error weighting function
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kieffer
Year: 1983
Comparative performance of quantum signals in unimodal and bimodal binary optical communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Helstrom
Year: 1983
Comments on "Inductive proof of an important inequality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eu Yangchi; J. Wang
Year: 1983
Author's reply to Comments on 'Inductive Proof of an Important Inequality'
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Park
Year: 1983
Review of 'Communication Protocol Modelling' (Sunshine, C.; 1981)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ferguson
Year: 1983
Review of 'CISM Courses and Lectures No. 140' (Kailath, T.; 1981)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Dickinson
Year: 1983
Review of 'New Concepts in Multi-User Communication' (Skwirzynski, J.K., Ed.; 1982)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sloane
Year: 1983
Review of 'Analysis and Synthesis of Computer Systems' (Gelenbe, E., and Mitrani, I.; 1980)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kaplan
Year: 1983
On the implementation of the Shannon sampling series for band-limited signals (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Butzer; W. Engels
Year: 1983
Comments and corrections to "New convergence bounds for Bayes estimators" by D. Kazakos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Merakos; D. Kazakos
Year: 1983
Correction to 'Wyner-Ziv theory for a general function of the correlated sources' (Sep 82 803-807)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yamamoto
Year: 1983
Limiting forms of the discrete-time estimator- correlator detector (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Fogel; S. Schwartz
Year: 1983
The pdf and cdf for the sum of N filtered outputs of an analog cross correlator with bandpass inputs (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Andrews; C. Brice
Year: 1983
Optimal point process estimators of Gaussian optical field intensities (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Davidson; Y.-C. Park
Year: 1983
Spectral moment matching in the maximum entropy spectral analysis method (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Holm
Year: 1983
MDS convolutional codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Piret; T. Krol
Year: 1983
Mean sojourn times in Markov queueing networks: Little's formula revisited
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Beutler
Year: 1983
Piecewise linear random paths on a plane and a central limit theorem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kadota
Year: 1983
The design of masking processes by the method of minimal divergence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Fishman; L. Jones; C. Therrien
Year: 1983
Measures of information for continuous observations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Cartledge
Year: 1983
A polynomial approach to the generalized Levinson algorithm based on the Toeplitz distance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Delsarte; Y. Genin; Y. Kamp
Year: 1983
A note on optimal multidimensional companders (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Bucklew
Year: 1983
Low-rate tree coding of autoregressive sources (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sethia; J. Anderson
Year: 1983
A note on the Ziv - Lempel model for compressing individual sequences (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Langdon, Jr.
Year: 1983
Partial feedback for the discrete memoryless multiple access channel (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Willems; E. van der Meulen
Year: 1983
On evaluating polarity-coincidence correlation when the two inputs are statistically dependent (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rajput; M. Kanefsky
Year: 1983
Some NP-hard polygon decomposition problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. O'Rourke; K. Supowit
Year: 1983
Error probabilities for simple substitution ciphers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sgarro
Year: 1983
On the security of public key protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Dolev; A. Yao
Year: 1983
A modular approach to key safeguarding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Asmuth; J. Bloom
Year: 1983
Minimax noiseless universal coding for Markov sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Davisson
Year: 1983
On a class of convolutional codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Seguin
Year: 1983
A note on first passage time problems for Gaussian processes and varying boundaries (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Ricciardi; S. Sato
Year: 1983
Moving window detection for discrete data (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Glaz
Year: 1983
Suboptimum detection of weak signals in non-Gaussian noise (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Lu; B. Eisenstein
Year: 1983
A criterion for selecting information- preserving data reductions for use in the design of multiple- parameter estimators (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bruzzone; M. Kaveh
Year: 1983
New constructions of codes meeting the Griesmer bound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Helleseth
Year: 1983
Writing on dirty paper (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Costa
Year: 1983
The discrete memoryless multiple access channel with partially cooperating encoders (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Willems
Year: 1983
On an extension of an achievable rate region for the binary multiplying channel (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Schalkwijk
Year: 1983
Maximum likelihood decoding of certain Reed - Muller codes (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Seroussi; A. Lempel
Year: 1983
On Robinson's coding problem (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Klove
Year: 1983
On the uniqueness of a certain thin near octagon (or partial 2-geometry, or parallelism) derived from the binary Golay code
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Brouwer
Year: 1983
The construction of fast, high-rate, soft decision block decoders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Berlekamp
Year: 1983
Improving an algorithm for factoring polynomials over a finite field and constructing large irreducible polynomials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Camion
Year: 1983
Upper bounds on|C_2|for a uniquely decodable code pair(C_1, C_2)for a two-access binary adder channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. van Tilborg
Year: 1983
Successive encoding of correlated sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ericson; J. Korner
Year: 1983
On source coding with side information via a multiple-access channel and related problems in multi-user information theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Ahlswede; Te Han
Year: 1983
Estimation of spatial and spectral parameters of multiple sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Porat; B. Friedlander
Year: 1983
On the stability of signal detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gualtierotti
Year: 1983
A new lower bound for the minimum distance of a cyclic code
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Roos
Year: 1983
A square root bound on the minimum weight in quasi-cyclic codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Calderbank
Year: 1983
Divisors of codeword weights
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ward
Year: 1983
On the Preparata and Goethals codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Baker; J. van Lint; R. Wilson
Year: 1983
On the inequivalence of generalized Preparata codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Kantor
Year: 1983
Perfect codes hardly exist
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Best
Year: 1983
A nonconstructive upper bound on covering radius
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Cohen
Year: 1983
The covering radius of the(2^{15}, 16)Reed-Muller code is at least 16276
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Patterson; D. Wiedemann
Year: 1983
Another upper bound on covering radius
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Mattson, Jr.
Year: 1983
On the coveting radius of extremal self-dual codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Assmus; V. Pless
Year: 1983
Cyclic self-dual codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sloane; J. Thompson
Year: 1983
The binary code arising from a 2-design with a nice collection of ovals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Assmus, Jr.
Year: 1983
Papers in honor of F. Jessie MacWilliams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sloane
Year: 1983
Correction to 'Estimation and choice of Neighbors in Spatial-Interaction Models of Images'
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kashyap; R. Chellappa
Year: 1983
Review of 'Introduction to the Theory of Error-Correcting codes' (Pless, V.; 1982)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Blake
Year: 1983
Generalized MSK (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Galko
Year: 1983
A novel approach to noniterative methods in adaptive channel equalization (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Melek
Year: 1983
Frequency-hopped multilevel frequency shift keying spread spectrum for mobile radio communication systems (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Muammar
Year: 1983
'Modelling and Properties of Modulated RF Signals Perturbed by Oscillator Phase Instabilities and Resulting Spectral Dispersion'
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Vannicola
Year: 1983
Multiple access protocols with limited information for a finite number of users (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Marcus
Year: 1983
An algorithm for designing vector quantizers (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Sayood
Year: 1983
Coding for frequency-hopped spread-spectrum channels with partial-band interference (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Stark
Year: 1983
Topics in robust statistical signal processing (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Vastola
Year: 1983
A Monte Carlo study of absolute phase determination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Bucy; J. Moura; A. Mallinckrodt
Year: 1983
An efficient distributed orientation algorithm (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Vishkin
Year: 1983
Outer bounds on the capacity of interference channels (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Carleial
Year: 1983
Trellis coding for a multiple-access channel (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sorace
Year: 1983
The discriminant analysis of multivariate time series (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Krzysko
Year: 1983
Robust Wiener filters for random signals in correlated noise (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Moustakides; S. Kassam
Year: 1983
A simple suboptimum estimator of prior probability in mixtures (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Jalalinasab; J. Bucklew
Year: 1983
Stochastic reliability functions for failure rates derived from Gauss - Markov processes (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hibey
Year: 1983
Multidimensional spherical coordinates quantization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Swaszek; J. Thomas
Year: 1983
Robust noiseless source coding through a game theoretical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Kazakos
Year: 1983
A new structured design method for convolutions over finite fields, Part I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Wagh; S. Morgera
Year: 1983
Group codes for theM-receiver Gaussian broadcast channel (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Downey; J. Karlof
Year: 1983
Ternary sequences with perfect periodic autocorrelation (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hoholdt; J. Justesen
Year: 1983
On the characteristics of PN sequences (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Unjeng Cheng; S. Golomb
Year: 1983
Characterizing the autocorrelations of binary sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Martins de Carvalho; J. Clark
Year: 1983
Hybrid ARQ error control using sequential decoding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Drukarev; D. Costello, Jr.
Year: 1983
On the shape and duration of FM-clicks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Lindgren
Year: 1983
Nonlinear estimation of PSK-modulated carrier phase with application to burst digital transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Viterbi
Year: 1983
On the shape of a set of points in the plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Edelsbrunner; D. Kirkpatrick; R. Seidel
Year: 1983
SECT---A coding technique for black/white graphics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Morita; S. Arimoto
Year: 1983
Discrete utterance speech recognition without time alignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Shore; D. Burton
Year: 1983
Minimax optimal universal codeword sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Elias
Year: 1983
A method for computing the rate and the correlation of phase slips in tuned phase tracking systems of arbitrary order (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Ryter
Year: 1983
On compound state and mutual information in quantum information theory (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ohya
Year: 1983
Capacity of interconnected ring communication systems with unique loop-free routing (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Schlatter; J. Massey
Year: 1983
Correction to 'A simple general binary source code' (Sep 82 800-803)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Langdon; J. Rissanen
Year: 1983
Review of 'Progress in Pattern Recognition' (Kanal, L.N., and Rosenfeld, A., Eds.; 1981)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Toussaint
Year: 1983
On the capacity of computer memory with defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Heegard; A.E. Gamal
Year: 1983
Decoding by local optimization (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Farrell; L. Rudolph; C. Hartmann; L. Nielsen
Year: 1983
Simplified correlation decoding by selecting possible codewords using erasure information (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Tanaka; K. Kakigahara
Year: 1983
A permutation decoding of the (24, 12, 8) Golay code (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Wolfmann
Year: 1983
Some periodic convolutional codes better than any fixed code (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Mooser
Year: 1983
A generalized method for encoding and decoding run-length-limited binary sequences (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Beenker; K. Immink
Year: 1983
On the source matching approach for Markov sources (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Lee
Year: 1983
Probability distributions of randomly moving objects on a plane (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kadota; J. Seery
Year: 1983
Detection in a Rice environment (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Fogel
Year: 1983
Formulas which approximate the distribution of a sinusoid plus noise (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Webster
Year: 1983
A simple class of asymptotically optimal quantizers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Cambanis; N. Gerr
Year: 1983
Robust matched filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Poor
Year: 1983
Statistical inference with partial prior information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Potter; B. Anderson
Year: 1983
Probability density estimation from sampled data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Masry
Year: 1983
Sequential detection of abrupt changes in spectral characteristics of digital signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Basseville; A. Benveniste
Year: 1983
Dynamic Voronoi diagrams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Gowda; D. Kirkpatrick; D. Lee; A. Naamad
Year: 1983
Bounds on distances and error exponents of unit memory codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Thommesen; J. Justesen
Year: 1983
Tree encoding of stationary ergodic sources with a fidelity criterion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hashimoto
Year: 1983
A universal data compression system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rissanen
Year: 1983
A simple proof of the Ahlswede - Csiszár one-bit theorem (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.E. Gamal
Year: 1983
Some results on the existence of binary linear codes (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Elia
Year: 1983
The merit factor of Legendre sequences (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Golay
Year: 1983
New binary codes constructed by an old technique (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Wiseman
Year: 1983
Statistical properties of a nonstationary Neyman - Scott cluster process (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Saleh; M. Teich
Year: 1983
Comments on and correction to "Axiomatic derivation of the principle of maximum entropy and the principle of minimum cross-entropy" (Jan 80 26-37) [Corresp.]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Johnson; J. Shore
Year: 1983
The throughput time delay function of anM/M/1queue (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Lazar
Year: 1983
A trellis code construction and coding theorem for stationary Gaussian sources (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Mazor; W. Pearlman
Year: 1983
An information - theoretic proof of Hadamard's inequality (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Cover; A.E. Gamal
Year: 1983
DES-like functions can generate the alternating group
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Even; O. Goldreich
Year: 1983
Two topics on linear unequal error protection codes: Bounds on their length and cyclic code classes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. van Gils
Year: 1983
Relativized cryptography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Brassard
Year: 1983
Statistical estimates of then-bit Gray codes by restricted random generation of permutations of 1 to2^n
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Silverman; V. Vickers; J. Sampson
Year: 1983
Min- max linear estimation of band-limited sequences from noisy observations---A deterministic approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Rege
Year: 1983
Pretested Random Tree Protocol for Packet Conflict Resolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian-Cheng Huang; Bing-Zheng Xu
Year: 1983
Dominance--A relation between distortion measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-E. Stjernvall
Year: 1983
Minimum breakdown degradation in binary source encoding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Berger; Zhen Zhang
Year: 1983
Optimal causal coding - decoding problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Walrand; P. Varaiya
Year: 1983
A fast encoding method for lattice codes and quantizers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Conway; N. Sloane
Year: 1983
A probabilistic look at networks of quasi-reversible queues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Walrand
Year: 1983
Partitioned linear block codes for computer memory with 'stuck-at' defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Heegard
Year: 1983
The existence of binary linear concatenated codes with Reed - Solomon outer codes which asymptotically meet the Gilbert- Varshamov bound
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Thommesen
Year: 1983
Bounds on the linear span of bent sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Kumar; R. Scholtz
Year: 1983
Source coding for average rate and average distortion: New variable-length coding theorems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hashimoto
Year: 1983
On a type of stochastic stability for a class of encoding schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kieffer; J. Dunham
Year: 1983
Practical estimation of correlation functions of nonstationary Gaussian processes (Corresp.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Marmarelis
Year: 1983
Two-Dimensional Binary Codes with Good Autocorrelation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Al-Quaddoomi
Year: 1983
Pairwise phase-locked loop coupling for tracking improvement in nonrigid retrodirective arrays (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Netch
Year: 1983
Optimal encoding of stationary Gaussian sources with applications in image coding (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Jakatdar
Year: 1983
Optimal tree and trellis codes for stationary Gaussian sources (Ph.D. Thesis abstr.)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Mazor
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Keynote Address: Conference on Precision Electromagnetic Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ernest Ambler
Year: 1983
Editorial
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Progress in the Realization of the Units of Capacitance, Resistance, and Inductance at the National Physical Laboratory, India
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. L. Dahake; R. N. Dhar; A. K. Saxena; V. K. Batra; K. Chandra
Year: 1983
Measurements of High Voltages by Means of Electron Speed Filtering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dieter Hans Kind; W. Lucas; D. Peier; B. Schulz
Year: 1983
Dynamic Testing of Waveform Recorders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruce E. Peetz
Year: 1983
Measuring Properties of Fast Digitizers Employed for Recording HV Impulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ryszard A. Malewski; Terence R. McComb; Malcom M. C. Collins
Year: 1983
High-Accuracy Settling Time Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Howard K. Schoenwetter
Year: 1983
Reference Waveform Flat Pulse Generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:James R. Andrews; Barry A. Bell; Norris S. Nahman; Eugene E. Baldwin
Year: 1983
Recent Improvements to the UK National Microwave Attenuation Standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frank L. Warner; Peter Herman; Paul Cummings
Year: 1983
On the Measurement Accuracy of the Tissue Permittivity in Vivo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrzej Kraszewski; Stanislaw S. Stuchly; Maria A. Stuchly; Stephen A. Symons
Year: 1983
Bridge Sampling Methods for Admittance Measurements from 500 kHz to 5 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robert H. Cole
Year: 1983
Precise Calibration of Ratio Transformers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arthur Melville Thompson
Year: 1983
An Automatic System for AC/DC Calibration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. J. Lentner; Donald R. Flach
Year: 1983
High-Precision Thermal EMF Comparator for Automatic AC-DC Transfer Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franco Cabiati; Umberto Pogliano; Gian Carlo Bosco; Giancarlo Zago
Year: 1983
Components and Systems for AC/DC Transfer at the ppm Level
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Philip Martin; R. B. D. Knight
Year: 1983
Comparison between the 127I2 Stabilized He-Ne Lasers at 633 nm and 612 nm of the BIPM and the IMGC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Bertinetto; P. Cordiale; G. B. Picotto; Jean-Marie Chartier; R. Felder; M. G. Glaser
Year: 1983
International Intercomparison of Laser Power Measurements in the Visible Region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michiyuki Endo; Tatsutoku Honda
Year: 1983
Results of international comparisons using methane-stabilized He-Ne lasers at 3.39 μm and iodine-stabilized He-Ne lasers at 633 nm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jean-Marie Chartier
Year: 1983
The Design of an Automated, High-Accuracy Antenna Test Facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Jud Lyon; A. Ray Howland
Year: 1983
Antenna Gain Measurements by an Extended Version of the NBS Extrapolation Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrew G. Repjar; Allen C. Newell; Ramon C. Baird
Year: 1983
A Near-Field Antenna Measurement System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:John Borowick; Alan E. Holley; W. L. Lange; R. W. Howard; R. L. Cummings
Year: 1983
A Holographic Surface Measurement of the Texas 4.9-m Antenna at 86 GHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Charles E. Mayer; John H. Davis; William L. Peters; Wolfhard J. Vogel
Year: 1983
Precision Measurement of Antenna System Noise Using Radio Stars
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David F. Wait
Year: 1983
Picosecond-Domain Waveform Measurement: Status and Future Directions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Norris S. Nahman
Year: 1983
A Compact Synchroscan Streak Camera Using a Microchannel Plate Incorporated Tube
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mikio Yamashita; Tatsutoku Honda; Takuzo Sato; Katsuo Aizawa
Year: 1983
The Measurement and Deconvolution of Time Jitter in Equivalent-Time Waveform Samplers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William L. Gans
Year: 1983
Wide-Band Device Modeling Using Time-Domain Reflectometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seward T. Salvage; Bidyut Parruck; Sedki M. Riad
Year: 1983
An Optimization Criterion for Iterative Deconvolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bidyut Parruck; Sedki M. Riad
Year: 1983
The NPL Moving-Coil Ampere Determination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bryan P. Kibble; R. C. Smith; I. A. Robinson
Year: 1983
Realizing the ampere by levitating a superconducting mass-a suggested procedure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bryan P. Kibble
Year: 1983
Reduction of Kelvin Ratio Arm Errors in an AC Double Bridge Using Electronic Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Hanke; G. Ramm
Year: 1983
A Current-Comparator-Based System for Calibrating Active/Reactive Power and Energy Meters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. J. M. Moore; Eddy So
Year: 1983
Optically Pumped FIR Lasers Phase-Locked by Stark Effect Applied to Precise Optical Frequency Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brahim Dahmani; Andre Clairon
Year: 1983
Automated NBS 1-/g=W/ Measurement System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kenneth R. Baker; Ronald F. Dziuba
Year: 1983
High-Precision Automatic Digital AC Bridge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolfgang Helbach; Peter Marczinowski; Gerhard Trenkler
Year: 1983
An Automated Six-Port for 2-18-GHz Power and Complex Reflection Coefficient Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Larry W. Tarr
Year: 1983
Microprocessor-Based Automatic Instrument Transformer Comparator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oleh W. Iwanusiw
Year: 1983
Microcomputer-Based Calibration Systems for Variable Voltage Dividers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hoi Tsao
Year: 1983
A Computer Program for Algebraic Error Analysis of Complex Microwave Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birthe Guldbrandsen
Year: 1983
A 50-ppm AC Reference Standard Which Spans 1 Hz to 50 kHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Michael Oldham
Year: 1983
An Automatic Test Set for the Dynamic Characterization of A/D Converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Michael Souders; Donald R. Flach; Thick C. Wong
Year: 1983
A 20-Bit Digital-to-Analog Converter (DAC) Using a Magnetic Modulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Nakazoe; Minoru Abe; Hideaki Mizuno; Zenmon Abe
Year: 1983
Merits and Limitations of Submillimeter Wavelength Frequency Standards Based on an Mg(Ca) Metastable Beam
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrea De Marchi; Elio Bava; Aldo Godone; Giovanni Giusfredi
Year: 1983
A New Heart for Rb Frequency Standards?: The Evacuated, Wall-Coated Sealed Cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hugh G. Robinson; Charles E. Johnson
Year: 1983
Time Comparison Experiments with Small K-Band Antennas and SSRA Equipments via a Domestic Geostationary Satellite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michito Imae; Haruo Okazawa; Tokuo Sato; Makoto Urazuka; Kazuyuki Yoshimura; Yoshiyuki Yasuda
Year: 1983
Characterization of Frequency Stability: Bias Due to the Juxtaposition of Time-Interval Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paul Lesage
Year: 1983
Subharmonic Sampling for the Measurement of Short-Term Stability of Microwave Oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neil D. Faulkner; Enric Vilar I Mestre
Year: 1983
Automated Timekeeping II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kenneth Putkovich
Year: 1983
A Compact Hydrogen Maser with Exceptional Long-Term Stability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David A. Howe; Fred L. Walls
Year: 1983
Performance of the Four NRC Long-Beam Primary Cesium Clocks Cs V, Cs VIA, Cs VIB, and Cs VIC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Allan G. Mungall; Cecil C. Costain
Year: 1983
Automated High-Accuracy Phase Measurement System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Stein; D. Glaze; J. Levine; J. Gray; D. Hilliard; D. Howe; L. A. Erb
Year: 1983
Precision Broad-Band RE-Switched Radiometer for the Megahertz and Lower Gigahertz Range with IF Attenuator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dieter Janik
Year: 1983
International Intercomparison of Electric-Field Strength at 100 MHz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carl F. Stubenrauch; Pier Giorgio Galliano; Tadeusz M. Babij
Year: 1983
Standard Magnetic Field Radiated by Two Loop Antennas in a Coplane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiroshi Nakane; Satoru Obuki; Shunichi Omori; Ichiro Yokoshima
Year: 1983
Distributed Parameter Analysis of Shielded Loops Used for Wide-Band H-Field Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:James E. Lindsay; Klaus Munter
Year: 1983
Laser Frequency Measurements and the Redefinition of the Meter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pierre Giacomo
Year: 1983
The Evolving Problems in Precise Optical Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lucien M. Biberman
Year: 1983
Some New Aspects concerning the X-Band SQUID for the Measurement of RF Attenuation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heikki Seppa
Year: 1983
The Maintenance and Comparison of Standards of Electromotive Force at the BIPM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas J. Witt; Dominique Reymann
Year: 1983
High-Accuracy Josephson Potentiometer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tadashi Endo; Masao Koyanagi; Akira Nakamura
Year: 1983
The Reproduction of the As-Maintained Unit of Voltage at IEN by Means of 2e/h
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Domenico Andreone; Ernesto Arri; Vincenzo Lacquaniti; Giancarlo Marullo
Year: 1983
Point-Contact Josephson Voltage Standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makoto Ibuka; Seiichi Naito; Takashi Furuya
Year: 1983
An Inexpensive Implementation of a Dual Six-Port 0.01 - to 18-GHz Network Analyzer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robert D. Moyer
Year: 1983
The PTB R 100 Primary Thermal-Noise Standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolfgang Kessel; Friedrich-Immanuel Buchholz
Year: 1983
Experimental Test of a New Precision Model for Microwave Rotary Vane Attenuators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tom Guldbrandsen; Birthe Guldbrandsen; Frank L. Warner; Peter Herman; Gordon W. Parkes
Year: 1983
Contributors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Research, Design and Development Engineers: Reduce Your Literature-Searching Time by Upto 80%
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
A High-Speed Digital Divider
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:George R. Davis; Thomas M. King
Year: 1983
Harmonic Analyzer/Generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Juan Carlos Montano Asquerino; Ramon Aparicio Lopez
Year: 1983
An RC Discharge Digital Capacitance Meter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nobumi Hagiwara; Takeo Saegusa
Year: 1983
Frequency Control Loop with Digital Integrator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacques Viennet; Michele Jardino; Roland Barillet; Michel Desaintfuscien
Year: 1983
A Technique for Photoelectric and Photodielectric Effect Measurements at Microwave Frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Shih; L. Ding; S. Jatar; Thomas J. F. Pavlasek; Clifford H. Champness
Year: 1983
The Design of Extremely Low-Noise Camera-Tube Preamplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ernst H. Nordholt; Leo P. De Jong
Year: 1983
Interface Software Development for a Digital Cartridge Tape Drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sri-Jayantha; George E. Miller
Year: 1983
Design of Algorithms to Extract Data from Capacitance Sensors to Measure Fastener Hole Profiles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joseph L. Hammond; Samuel Ray Glidewell
Year: 1983
Interpolation Algorithms for Discrete Fourier Transforms of Weighted Signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas Grandke
Year: 1983
A Battery-Operated Data-Acquisition System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. M. Williams; J. R. Haumann; R. V. White
Year: 1983
Measurement of Small Dielectric Loss by Time-Domain Spectroscopy: Application to Water/Oil Emulsions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Richard Chahine; Tapan K. Bose
Year: 1983
A Structure Function Representation Theorem with Applications to Frequency Stability Estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Charles A. Greenhall
Year: 1983
A High-Precision Phase-Comparison Experiment Using a Geostationary Satellite
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnold Van Ardenne; John D. O'Sullivan; Alain De Dianous
Year: 1983
A Microwave Method for the Determination of the Real Parts of the Magnetic and Dielectric Material Parameters of Premagnetized Microwave Ferrites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wolfhardt Muller-Gronau; Ingo Wolff
Year: 1983
Measurement of the Individual Harmonics Reactive Power in Nonsinusoidal Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leszek S. Czarnecki
Year: 1983
ANA Calibration Method for Measurements of Dielectric Properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrzej Kraszewski; Maria A. Stuchly; Stanislaw S. Stuchly
Year: 1983
A Photosensor-Based Measuring System for Precision Mechanics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giovanni Marola; Marco Schiaffino
Year: 1983
Thevenin Equivalents and the Matrix Inverse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Contributors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
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Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
New Transactions Editor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Design and Construction of an Arbitrary Waveform Generator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniele D. Caviglia; Alessandro De Gloria; Giuliano Donzellini; Giancarlo Parodi; Domenico Ponta
Year: 1983
Estimating Unbiased Average Power of Digital Signal in the Presence of High-Level Impulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William Chien-Yeh Lee
Year: 1983
Experimental Study of the Frequency Stability of a Maser Oscillator Operated with an External Feedback Loop
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michel Tetu; Pierre Tremblay; Paul Lesage; Pierre Petit
Year: 1983
Hall-Plate Measurements of Magnetite Buildup in Pressurized-Water Reactor Steam Generators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shankarnarayan R. Satish; William Lord
Year: 1983
A Combined Transformer Bridge for Precise Comparison of Inductance with Capacitance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrzej Muciek
Year: 1983
Precipitation Instrumentation Package for Improved Spatial and Temporal Sampling of Rainfall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hector Haro; Reuven Kitai; William James
Year: 1983
Millimeter Wave Harmonic Mixing with Hot Carrier Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kazuo Kikuchi; Ainosuke Oshimoto
Year: 1983
Fast Correlation Estimation by a Random Reference Correlator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dorota Landsberg; Arnon Cohen
Year: 1983
Impossibility of Linear Two-Port Noise-Parameter Measurement with a Single Temperature Noise Source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Madhu Sudan Gupta
Year: 1983
Comparison of quantized hall resistance with a 1-Ω standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Greig W. Small
Year: 1983
Individual Characterization of an Oscillator by Means of Cross-Correlation or Cross-Variance Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Denis Fest; Jacques Groslambert; Jean-Jacques Gagnepain
Year: 1983
Large Attenuation Measurement for Laser Beam by Intermediate Frequency Substitution Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomotel Kawakami; Ichiro Yokoshima
Year: 1983
Contributors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
List of Reviewers for 1981-1983
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
Editorial with Thanks and Expectations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 1983
An Automatic System for the Measurement of the Field Distribution in Resonant Cavities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laurent-Guy Bernier; Thomas Sphicopoulos; Fred E. Gardiol
Year: 1983
An Isolated Sensor Determining the Poynting Vector in the near Field of a Radiating Antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Klaus Munter
Year: 1983
On the Output Resistance of Self-Checking Voltage Dividers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hoi Tsao; Ron Fletcher
Year: 1983
An Automated Test System for MNOS Transistor Characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sze-Hon Kwan; Kit M. Cham; H. A. Richard Wegener
Year: 1983
Metal Detector for Tracing Submarine Telecommunication Cables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kenichi Asakawa; Yuichi Shirasaki; Yoshinao Iwamoto
Year: 1983
Tolerance of Spectral Estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fung-I Tseng; Tapan K. Sarkar
Year: 1983
A μp-controlled flying-spot scanner with an intelligent A/D-converter unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marcelo Tapia; Edvard Nordlander; Birger Drugge
Year: 1983
Nonlinear Ramp Generators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Faetti; M. Martinelli; P. A. Rolla; S. Santucci
Year: 1983
Calibration and Use of a Reference Standard Directional Coupler for Measurement of Large Coupling Factors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Richard F. Clark; Algirdas Jurkus; George D. McLaren
Year: 1983
An Equivalent Circuit of an Open-Ended Coaxial Line
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gregory Gajda; Stanislaw S. Stuchly
Year: 1983
Advanced Control Method for Calorimetric Power Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takemi Inoue; Kyohei Yamamura
Year: 1983


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