Corrosion Behavior and Metallization of Cu-Based Electrodes Using MoNi Alloy and Multilayer Structure for Back-Channel-Etched Oxide Thin-Film Transistor Circuit Integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da Eun Kim; Sung Woon Cho; Sung Chan Kim; Won Jun Kang; Hyung Koun Cho
Year: 2017
A Deterministic and Self-Consistent Solver for the Coupled Carrier-Phonon System in SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamed Kamrani; Dominic Jabs; Vincenzo d'Alessandro; Niccolò Rinaldi; Klaus Aufinger; Christoph Jungemann
Year: 2017
Stabilizing Schemes for the Minority Failure Bits in Ta2O5-Based ReRAM Macro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makoto Ueki; Yoshihiro Hayashi; Naoya Furutake; Koji Masuzaki; Akira Tanabe; Mitsuru Narihiro; Hiroshi Sunamura; Kazuya Uejima; Akira Mitsuiki; Koichi Takeda; Takashi Hase
Year: 2017
Semi-analytical Model of Charge Domain Propagation and Its Device Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonathan P. Sculley; P. Douglas Yoder
Year: 2017
Assessment of 2-D Transition Metal Dichalcogenide FETs at Sub-5-nm Gate Length Scale
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhipeng Dong; Jing Guo
Year: 2017
Theory and Experiment Investigate of a 400-kW Ku-Band Gyro-TWT With Mode Selective Loss Loading Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianxun Wang; Qizhi Tian; Xiaoxiao Li; Guoxiang Shu; Yong Xu; Yong Luo
Year: 2017
An Analytical Model of the Frequency Dependent 3-D Current Spreading in Forward Biased Shallow Rectangular p-n Junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubham Jain; Vijaya Kumar Gurugubelli; Shreepad Karmalkar
Year: 2017
3-D Analytical Modeling of Dual-Material Triple-Gate Silicon-on-Nothing MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pritha Banerjee; Subir Kumar Sarkar
Year: 2017
High-Power Multicarrier Generation for RF Breakdown Testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oscar Monerris Belda; Elena Diaz Caballero; Vicente E. Boria; Benito Gimeno
Year: 2017
Compact Model of HfOX-Based Electronic Synaptic Devices for Neuromorphic Computing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng Huang; Dongbin Zhu; Sijie Chen; Zheng Zhou; Zhe Chen; Bin Gao; Lifeng Liu; Xiaoyan Liu; Jinfeng Kang
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Operating Principles, Design Considerations, and Experimental Characteristics of High-Voltage 4H-SiC Bidirectional IGBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sauvik Chowdhury; Collin W. Hitchcock; Zachary Stum; Rajendra P. Dahal; Ishwara B. Bhat; T. Paul Chow
Year: 2017
A Comprehensive Study on the Geometrical Effects in High-Power 4H–SiC BJTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arash Salemi; Hossein Elahipanah; Carl-Mikael Zetterling; Mikael Ostling
Year: 2017
Current-Controlled Negative Resistance in High-Voltage 4H-SiC p-i-n Rectifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sauvik Chowdhury; Collin W. Hitchcock; Rajendra P. Dahal; Ishwara B. Bhat; T. Paul Chow
Year: 2017
Normally OFF Trench CAVET With Active Mg-Doped GaN as Current Blocking Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Ji; Matthew A. Laurent; Anchal Agarwal; Wenwen Li; Saptarshi Mandal; Stacia Keller; Srabanti Chowdhury
Year: 2017
Design and Characterization of Sloped-Field-Plate Enhanced Trench Edge Termination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wentao Yang; Hao Feng; Xiangming Fang; Yong Liu; Yuichi Onozawa; Hiroyuki Tanaka; Johnny K. O. Sin
Year: 2017
Ultrahigh-Voltage SiC MPS Diodes With Hybrid Unipolar/Bipolar Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiroki Niwa; Jun Suda; Tsunenobu Kimoto
Year: 2017
Design and Characterization of High-Current Optical Darlington Transistor for Pulsed-Power Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alireza Mojab; Sudip K. Mazumder
Year: 2017
High-Voltage Integrated Circuits: History, State of the Art, and Future Prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Don Disney; Ted Letavic; Tanya Trajkovic; Tomohide Terashima; Akio Nakagawa
Year: 2017
Investigation of In Situ SiN as Gate Dielectric and Surface Passivation for GaN MISHEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huaxing Jiang; Chao Liu; Yuying Chen; Xing Lu; Chak Wah Tang; Kei May Lau
Year: 2017
Biased Photoresponse Analysis of Al–ZnO Heterojunctions with n- and p-Type Silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhen Gao; Navid M. S. Jahed; Siva Sivoththaman
Year: 2017
Downscaling Metal—Oxide Thin-Film Transistors to Sub-50 nm in an Exquisite Film-Profile Engineering Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rong-Jhe Lyu; Bo-Shiuan Shie; Horng-Chih Lin; Pei-Wen Li; Tiao-Yuan Huang
Year: 2017
Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Peng; Ruixin Li; Simin Wang; Zhen Chen; Lei Nie; Mingxiang Chen
Year: 2017
The Modeling of Two Phosphors in Conversion White-Light LED
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shang-Ping Ying; Han-Kuei Fu; Hsin-Hsin Hsieh; Hsuan-Wei Kuo
Year: 2017
Fast Switching and Low Operating Vertical Alignment Liquid Crystal Display With 3-D Polymer Network for Flexible Display
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young Jin Lim; Hyo Joong Kim; Young Cheol Chae; G. Murali; Joong Hee Lee; Byung-June Mun; Dae Young Gwon; Gi-Dong Lee; Seung Hee Lee
Year: 2017
Extraction of BEOL Contributions for Thermal Resistance in SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suresh Balanethiram; Rosario D'Esposito; Anjan Chakravorty; Sebastien Fregonese; Thomas Zimmer
Year: 2017
Combination of E-Jet and Inkjet Printing for Additive Fabrication of Multilayer High-Density RDL of Silicon Interposer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mika-Matti Laurila; Behnam Khorramdel; Matti Mantysalo
Year: 2017
Compact Modeling of Transition Metal Dichalcogenide based Thin body Transistors and Circuit Validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandan Yadav; Amit Agarwal; Yogesh Singh Chauhan
Year: 2017
Steep Switching Hybrid Phase Transition FETs (Hyper-FET) for Low Power Applications: A Device-Circuit Co-design Perspective–Part I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmedullah Aziz; Nikhil Shukla; Suman Datta; Sumeet Kumar Gupta
Year: 2017
Symmetric U-Shaped Gate Tunnel Field-Effect Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shupeng Chen; Shulong Wang; Hongxia Liu; Wei Li; Qianqiong Wang; Xing Wang
Year: 2017
Self-Powered Timekeeping and Synchronization Using Fowler–Nordheim Tunneling-Based Floating-Gate Integrators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang Zhou; Shantanu Chakrabartty
Year: 2017
Comparative Investigation on the Effects of Organic and Inorganic Interlayers in Au/n-GaAs Schottky Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Serhat Orkun Tan; Huseyin Tecimer; Osman Cicek
Year: 2017
Silicon Thyristors for Ultrahigh Power (GW) Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jan Vobecky; Hans-Joachim Schulze; Peter Streit; Franz-Josef Niedernostheide; Virgiliu Botan; Jens Przybilla; Uwe Kellner-Werdehausen; M. Bellini
Year: 2017
Buffer Layer Engineering for High ( $\geq 10^{\mathrm {13}}$ cm $^{\mathrm {-2}}$ ) 2-DEG Density in ZnO-Based Heterostructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Md Arif Khan; Rohit Singh; Shaibal Mukherjee; Abhinav Kranti
Year: 2017
Diameter Dependence of Leakage Current in Nanowire Junctionless Field Effect Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubham Sahay; Mamidala Jagadesh Kumar
Year: 2017
IGZO-TFT Biosensors for Epstein–Barr Virus Protein Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsung-Han Yang; Ting-Yang Chen; Nian-Ting Wu; Yung-Tsan Chen; Jian-Jang Huang
Year: 2017
Role of the Insulating Fillers in the Encapsulation Material on the Lateral Charge Spreading in HV-ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ilaria Imperiale; Susanna Reggiani; Giuseppe Pavarese; Elena Gnani; Antonio Gnudi; Giorgio Baccarani; Woojin Ahn; Muhammad A. Alam; Dhanoop Varghese; Alejandro Hernandez-Luna; Luu Nguyen; Srikanth Krishnan
Year: 2017
Lateral Charge Transport in the Carbon-Doped Buffer in AlGaN/GaN-on-Si HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Indranil Chatterjee; Michael J. Uren; Serge Karboyan; Alexander Pooth; Peter Moens; Abhishek Banerjee; Martin Kuball
Year: 2017
Effect of Different Carbon Doping Techniques on the Dynamic Properties of GaN-on-Si Buffers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yacoub; C. Mauder; S. Leone; M. Eickelkamp; D. Fahle; M. Heuken; H. Kalisch; A. Vescan
Year: 2017
2-D Analytical Threshold Voltage Model for Dielectric Pocket Double-Gate Junctionless FETs by Considering Source/Drain Depletion Effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balraj Singh; Deepti Gola; Kunal Singh; Ekta Goel; Sanjay Kumar; Satyabrata Jit
Year: 2017
Low-Temperature Ohmic Contact Formation in AlN/GaN HEMT Using Microwave Annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin-Qing Zhang; Zhuo Liu; Sheng-Xun Zhao; Min-Zhi Lin; Peng-Fei Wang
Year: 2017
Unified Physical DC Model of Staggered Amorphous InGaZnO Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matteo Ghittorelli; Fabrizio Torricelli; Carmine Garripoli; Jan-Laurens van der Steen; Gerwin H. Gelinck; Eugenio Cantatore; Luigi Colalongo; Zsolt Miklos Kovacs-Vajna
Year: 2017
Modeling Interconnect Variability at Advanced Technology Nodes and Potential Solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Divya Prasad; Chenyun Pan; Azad Naeemi
Year: 2017
Current Degradation by Carrier Recombination in a Poly-Si TFET With Gate-Drain Underlapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William Cheng-Yu Ma
Year: 2017
Schottky Diodes on ZnO Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jidong Jin; Jacqueline S. Wrench; James T. Gibbon; David Hesp; Andrew Shaw; Ivona Z. Mitrovic; Naser Sedghi; Laurie J. Phillips; Jianli Zou; Vinod R. Dhanak; Paul R. Chalker; Steve Hall
Year: 2017
Calibration of SiC Detectors for Nitrogen and Neon Plasma Emission Using Gas-Puff Target Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alfio Torrisi; Przemyslaw W. Wachulak; Andrzej Bartnik; Tomasz Fok; Lukasz Wegrzynski; Henryk Fiedorowicz; Massimo Mazzillo; Antonella Sciuto; Lorenzo Torrisi
Year: 2017
Performance of Graded Bandgap HgCdTe Avalanche Photodiode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anand Singh; A. K. Shukla; Ravinder Pal
Year: 2017
Plasmon-Sensitized Optoelectronic Properties of Au Nanoparticle-Assisted Vertically Aligned TiO2 Nanowires by GLAD Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biraj Shougaijam; Chitralekha Ngangbam; Trupti Ranjan Lenka
Year: 2017
Role of Oxygen Vacancies in Short- and Long-Term Instability of Negative Bias-Temperature Stressed SiC MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Devanarayanan P. Ettisserry; Neil Goldsman; Aivars J. Lelis
Year: 2017
Step JTE, an Edge Termination for UHV SiC Power Devices With Increased Tolerances to JTE Dose and Surface Charges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cai-Neng Zhou; Yan Wang; Rui-Feng Yue; Gang Dai; Jun-Tao Li
Year: 2017
Novel Snapback-Free Reverse-Conducting SOI-LIGBT With Dual Embedded Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long Zhang; Jing Zhu; Weifeng Sun; Meng Chen; Minna Zhao; Xuequan Huang; Jiajun Chen; Yuxiang Qian; Longxing Shi
Year: 2017
Improved Electrical Performance of Multilayer MoS2 Transistor With NH3-Annealed ALD HfTiO Gate Dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Wen; Jingping Xu; Lu Liu; Pui-To Lai; Wing-Man Tang
Year: 2017
Integration of Prism Sheet on Quantum Dot Film With Bridge Patterns to Enhance Luminance of LED Backlight Unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Se-Eun Kim; Jae-Yong Lee; Min-Ho Shin; Hyo-Jun Kim; Young-Joo Kim
Year: 2017
Circuit Model for Double-Energy-Level Trap Centers in GaN HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sayed Ali Albahrani; Anthony Parker; Michael Heimlich
Year: 2017
Fully- and Quasi-Vertical GaN-on-Si p-i-n Diodes: High Performance and Comprehensive Comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Zhang; Xinbo Zou; Xing Lu; Chak Wah Tang; Kei May Lau
Year: 2017
A Linear Equivalent Circuit Model for Depletion-Type Silicon Microring Modulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myungjin Shin; Yoojin Ban; Byung-Min Yu; Min-Hyeong Kim; Jinsoo Rhim; Lars Zimmermann; Woo-Young Choi
Year: 2017
Oxidation Resistive, CMOS Compatible Copper-Based Alloy Ultrathin Films as a Superior Passivation Mechanism for Achieving 150 °C Cu–Cu Wafer on Wafer Thermocompression Bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asisa Kumar Panigrahi; Tamal Ghosh; Siva Rama Krishna Vanjari; Shiv Govind Singh
Year: 2017
ACO-Based Thermal-Aware Thread-to-Core Mapping for Dark-Silicon-Constrained CMPs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Wang; Zhe Chen; Jinhong Guo; Yubai Li; Zhonghai Lu
Year: 2017
Novel Ultrathin FD-SOI BiMOS Device With Reconfigurable Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sotirios Athanasiou; Charles-Alexandre Legrand; Sorin Cristoloveanu; Philippe Galy
Year: 2017
Secondary Electroluminescence of GaN-on-Si RF HEMTs: Demonstration and Physical Origin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matteo Meneghini; Alessandro Barbato; Isabella Rossetto; Andrea Favaron; Marco Silvestri; Simone Lavanga; Haifeng Sun; Helmut Brech; Gaudenzio Meneghesso; Enrico Zanoni
Year: 2017
Influence of the Design of Square p+ Islands on the Characteristics of 4H-SiC JBS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kung-Yen Lee; Yuan-Heng Liu; Sheng-Chung Wang; Le-Shan Chan
Year: 2017
Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamed Kamrani; Dominic Jabs; Vincenzo d'Alessandro; Niccolo Rinaldi; Thomas Jacquet; Cristell Maneux; Thomas Zimmer; Klaus Aufinger; Christoph Jungemann
Year: 2017
Compact Model for Ferroelectric Negative Capacitance Transistor With MFIS Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Girish Pahwa; Tapas Dutta; Amit Agarwal; Yogesh Singh Chauhan
Year: 2017
Influence of Different Gate Biases and Gate Lengths on Parasitic Source Access Resistance in AlGaN/GaN Heterostructure FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng Cui; Huan Liu; Wei Lin; Zhaojun Lin; Aijie Cheng; Ming Yang; Yan Liu; Chen Fu; Yuanjie Lv; Chongbiao Luan
Year: 2017
An Analytical Model for Double-Gate Tunnel FETs Considering the Junctions Depletion Regions and the Channel Mobile Charge Carriers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saeed Mohammadi; Hamid Reza Tajik Khaveh
Year: 2017
Study of Interface Traps in AlGaN/GaN MISHEMTs Using LPCVD SiNx as Gate Dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xing Lu; Kun Yu; Huaxing Jiang; Anping Zhang; Kei May Lau
Year: 2017
Steep Switching Hybrid Phase Transition FETs (Hyper-FET) for Low Power Applications: A Device-Circuit Co-design Perspective—Part II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmedullah Aziz; Nikhil Shukla; Suman Datta; Sumeet Kumar Gupta
Year: 2017
Evaluation of Ballistic Transport in III–V-Based p-Channel MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pengying Chang; Xiaoyan Liu; Shaoyan Di; Gang Du
Year: 2017
Analysis and Modeling of Cross-Coupling and Substrate Capacitances in GaN HEMTs for Power-Electronic Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheikh Aamir Ahsan; Sudip Ghosh; Sourabh Khandelwal; Yogesh Singh Chauhan
Year: 2017
Dark Current Blooming in Pinned Photodiode CMOS Image Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jean-Marc Belloir; Jean-Baptiste Lincelles; Alice Pelamatti; Clementine Durnez; Vincent Goiffon; Cedric Virmontois; Philippe Paillet; Pierre Magnan; Olivier Gilardx
Year: 2017
A 32-Stage 15-b Digital Time-Delay Integration Linear CMOS Image Sensor With Data Prediction Switching Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin Yin; Ting Liao; Kuan-Lin Liu; Chen-Che Kao; Chin-Fong Chiu; Chih-Cheng Hsieh
Year: 2017
A Physics-Based (Verilog-A) Compact Model for DC, Quasi-Static Transient, Small-Signal, and Noise Analysis of MOSFET-Based pH Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piyush Dak; Weeseong Seo; Byunghoo Jung; Muhammad A. Alam
Year: 2017
Impact of Silicon Nitride Stoichiometry on the Effectiveness of AlGaN/GaN HEMT Field Plates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William M. Waller; Mark Gajda; Saurabh Pandey; Johan J. T. M. Donkers; David Calton; Jeroen Croon; Serge Karboyan; Jan Sonsky; Michael J. Uren; Martin Kuball
Year: 2017
Sub-100 mV Computing With Electro-Mechanical Relays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuang Qian; Alexis Peschot; Benjamin Osoba; Zhixin Alice Ye; Tsu-Jae King Liu
Year: 2017
Introducing Optical Cascode GaN HEMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alireza Mojab; Zahra Hemmat; Hossein Riazmontazer; Arash Rahnamaee
Year: 2017
Considerations for Static Energy Reduction in Digital CMOS ICs Using NEMS Power Gating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sivaneswaran Sankar; Ulayil Sajesh Kumar; Mayank Goel; Maryam Shojaei Baghini; Valipe Ramgopal Rao
Year: 2017
Impact of Recess Etching on the Temperature-Dependent Characteristics of GaN-Based MIS-HEMTs With Al2O3/AlN Gate-Stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiejie Zhu; Qing Zhu; Lixiang Chen; Bin Hou; Ling Yang; Xiaowei Zhou; Xiaohua Ma; Yue Hao
Year: 2017
Compact Modeling and Evaluation of Magnetic Skyrmion-Based Racetrack Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Kang; Chentian Zheng; Yangqi Huang; Xichao Zhang; Weifeng Lv; Yan Zhou; Weisheng Zhao
Year: 2017
Performance Analysis of Nanoscale Single Layer Graphene Pressure Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Majid Sanaeepour; Abolfazl Abedi; Mohammad Javad Sharifi
Year: 2017
Metal-Free Fully Solution-Processable Flexible Electrolyte-Gated Carbon Nanotube Field Effect Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vijay Deep Bhatt; Saumya Joshi; Paolo Lugli
Year: 2017
Through Recess and Regrowth Gate Technology for Realizing Process Stability of GaN-Based Gate Injection Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hideyuki Okita; Masahiro Hikita; Akihiko Nishio; Takahiro Sato; Keiichi Matsunaga; Hisayoshi Matsuo; Michinobu Tsuda; Masaya Mannoh; Saichiro Kaneko; Masayuki Kuroda; Manabu Yanagihara; Ayanori Ikoshi; Tatsuo Morita; Kenichiro Tanaka; Yasuhiro Uemoto
Year: 2017
Next Generation IGBT and Package Technologies for High Voltage Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnost Kopta; Munaf Rahimo; Chiara Corvasce; Maxi Andenna; Franc Dugal; Fabian Fischer; Samuel Hartmann; Andreas Baschnagel
Year: 2017
A Novel SuperSteep Subthreshold Slope Dual-Channel FET Utilizing a Gate-Controlled Thyristor Mode-Induced Positive Feedback Current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Chen Chen; Hang-Ting Lue; Yi-Hsuan Hsiao; Chih-Yuan Lu
Year: 2017
2-D Analytical Modeling of the Electrical Characteristics of Dual-Material Double-Gate TFETs With a SiO2/HfO2 Stacked Gate-Oxide Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanjay Kumar; Ekta Goel; Kunal Singh; Balraj Singh; Prince Kumar Singh; Kamalaksha Baral; Satyabrata Jit
Year: 2017
Concurrent Efficient Evaluation of Small-Change Parameters and Green’s Functions for TCAD Device Noise and Variability Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simona Donati Guerrieri; Marco Pirola; Fabrizio Bonani
Year: 2017
A Novel TCAD-Based Thermal Extraction Approach for Nanoscale FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Sajesh Kumar; V. Ramgopal Rao
Year: 2017
Study of GaN-Based LEDs With Hybrid SiO2 Microsphere/Nanosphere AntiReflection Coating as a Passivation Layer by a Rapid Convection Deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chi-Hsiang Hsu; Yi-Chun Chan; Wei-Cheng Chen; Ching-Hong Chang; Jian-Kai Liou; Shiou-Ying Cheng; Der-Feng Guo; Wen-Chau Liu
Year: 2017
Comprehensive Simulation Study of Direct Source-to-Drain Tunneling in Ultra-Scaled Si, Ge, and III-V DG-FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhengping Jiang; Jing Wang; Hong-Hyun Park; Anh-Tuan Pham; Nuo Xu; Yang Lu; Seonghoon Jin; Woosung Choi; Mohammad Ali Pourghaderi; Jongchol Kim; Keun-Ho Lee
Year: 2017
Modeling Spectra of Low-Power SMD LEDs as a Function of Ambient Temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muna E. Raypah; Mutharasu Devarajan; Fauziah Sulaiman
Year: 2017
Statistical Dependence of Gate Metal Work Function on Various Electrical Parameters for an n-Channel Si Step-FinFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajesh Saha; Brinda Bhowmick; Srimanta Baishya
Year: 2017
Comparison of Photoresponse of Si-Based BIB THz Detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:He Zhu; Zeping Weng; Jiaqi Zhu; Huizhen Wu; Ning Li; Ning Dai
Year: 2017
Detailed Study on Dynamic Characteristics of a High-Performance SGT-MOSFET With Under-the-Trench Floating P-Pillar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shengling Deng; Zia Hossain; Toshimitsu Taniguchi
Year: 2017
Automatic Hot Test of Gyrotron-Traveling Wave Tubes by Adaptive PID Feedback Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo Liu; Zhaodong Wang; Guohui Zhao; Ran Yan; Yong Xu; Jianxun Wang; Youlei Pu; Wei Jiang
Year: 2017
Evaluation and Influence of Gyrotron Cathode Emission Inhomogeneity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianghua Zhang; Stefan Illy; Ioannis Gr Pagonakis; Tomasz Rzesnicki; Konstantinos A. Avramidis; Anton Malygin; Sebastian Ruess; Andrey Samartsev; Gunter Dammertz; Bernhard Piosczyk; Gerd Gantenbein; Manfred Thumm; John Jelonnek
Year: 2017
Comparison of Logic Performance of CMOS Circuits Implemented With Junctionless and Inversion-Mode FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shilpi Guin; Monali Sil; Abhijit Mallik
Year: 2017
Impact of Short-Wavelength and Long-Wavelength Line-Edge Roughness on the Variability of Ultrascaled FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michael Wong; Kyle D. Holland; Sam Anderson; Shahriar Rizwan; Zhi Cheng Jason Yuan; Terence B. Hook; Diego Kienle; Prasad S. Gudem; Mani Vaidyanathan
Year: 2017
IGBT History, State-of-the-Art, and Future Prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noriyuki Iwamuro; Thomas Laska
Year: 2017
Smart Power Devices and ICs Using GaAs and Wide and Extreme Bandgap Semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Paul Chow; Ichiro Omura; Masataka Higashiwaki; Hiroshi Kawarada; Vipindas Pala
Year: 2017
Guest Editorial Special Issue on Power Semiconductor Devices and Smart Power IC Technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wai Tung Ng; Florin Udrea; Ichiro Omura; Jan Vobecky; Don Disney
Year: 2017
Characterization of Interface Defects With Distributed Activation Energies in GaN-Based MIS-HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roberta Stradiotto; Gregor Pobegen; Clemens Ostermaier; Michael Waltl; Alexander Grill; Tibor Grasser
Year: 2017
Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junichi Hasegawa; Loris Pace; Luong Viet Phung; Mutsuko Hatano; Dominique Planson
Year: 2017
Investigation on Thermal Characterization of Eutectic Flip-Chip UV-LEDs With Different Bonding Voidage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renli Liang; Jun Zhang; Shuai Wang; Qian Chen; Linlin Xu; Jiangnan Dai; Changqing Chen
Year: 2017
Superjunction Power Devices, History, Development, and Future Prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Florin Udrea; Gerald Deboy; Tatsuhiko Fujihira
Year: 2017
An Accurate Analytical Current Model of Double-gate Heterojunction Tunneling FET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunhe Guan; Zunchao Li; Wenhao Zhang; Yefei Zhang
Year: 2017
Investigation of Self-Heating Effect on Ballistic Transport Characterization for Si FinFETs Featuring Ultrafast Pulsed IV Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ran Cheng; Xiao Yu; Bing Chen; Junfeng Li; Yiming Qu; Jinghui Han; Rui Zhang; Yi Zhao
Year: 2017
The Trench Power MOSFET—Part II: Application Specific VDMOS, LDMOS, Packaging, and Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Richard K. Williams; Mohamed N. Darwish; Richard A. Blanchard; Ralf Siemieniec; Phil Rutter; Yusuke Kawaguchi
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
GaN-on-Si Power Technology: Devices and Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kevin J. Chen; Oliver Haberlen; Alex Lidow; Chun Lin Tsai; Tetsuzo Ueda; Yasuhiro Uemoto; Yifeng Wu
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Maximum Limits on External Quantum Efficiencies in Bare LEDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siqi Lin; Tien-mo Shih; Wei Yan; Yijun Lu; Yue Lin; Richard Ru-Gin Chang; Zhong Chen
Year: 2017
Quasi-Optical Mode Converter for a 0.42 THz TE17,4 Mode Pulsed Gyrotron Oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Wang; Tao Song; Hao Shen; Shichao Deng; Diwei Liu; Shenggang Liu
Year: 2017
An Advanced 2.5-D Heterogeneous Integration Packaging for High-Density Neural Sensing Microsystem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Chen Hu; Yu-Chieh Huang; Po-Tsang Huang; Shang-Lin Wu; Hsiao-Chun Chang; Yu-Tao Yang; Yan-Huei You; Jr-Ming Chen; Yan-Yu Huang; Yen-Han Lin; Jeng-Ren Duann; Tzai-Wen Chiu; Wei Hwang; Ching-Te Chuang; Jin-Chern Chiou; Kuan-Neng Chen
Year: 2017
Development of Bumpless Stacking With Bottom–Up TSV Fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shih-Wei Lee; Kuan-Neng Chen
Year: 2017
High Performance of Polysilicon/4H-SiC Dual-Heterojunction Trench Diode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Wang; He-Yu Wang; Fei Cao; Hong-Yu Wang
Year: 2017
AlGaInP-Based LEDs With Al-doped ZnO Transparent Conductive Layer Grown by MOCVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiayong Lin; Yanli Pei; Yi Zhuo; Xuejin Ma; Gang Wang
Year: 2017
Analysis of Drain-Induced Barrier Rising in Short-Channel Negative-Capacitance FETs and Its Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junbeom Seo; Jaehyun Lee; Mincheol Shin
Year: 2017
Thermal Influence on Multibias Small- and Large-Signal Parameters of GaAs pHEMT Fabricated in Multilayer 3-D MMIC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohammad Abdul Alim; Ali A. Rezazadeh
Year: 2017
Identification of Energy and Spatial Location of Electron Traps in AlGaN/GaN HFET Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shlomo Mehari; Arkady Gavrilov; Moshe Eizenberg; Dan Ritter
Year: 2017
Numerical Study of a Multibeam Klystron on the Milky Way High-Performance Computing Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dagang Liu; Mengjun Xie; Ying Cheng; Huihui Wang; Chengwei Yuan
Year: 2017
An Output Coupler for a W-Band High Power Wideband Gyroamplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paul McElhinney; Craig R. Donaldson; Johannes E. McKay; Liang Zhang; Duncan A. Robertson; Robert I. Hunter; Graham M. Smith; Wenlong He; Adrian W. Cross
Year: 2017
Analytical Model for Junctionless Double-Gate FET in Subthreshold Region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong Hyeon Shin; Sungwoo Weon; Daesik Hong; Ilgu Yun
Year: 2017
D-Shaped Fiber Magnetic-Field Sensor Based on Fine-Tuning Magnetic Fluid Grating Period
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Ying; Ke Xu; Liang-Liang Sun; Rui Zhang; Xi-Feng Guo; Guang-Yuan Si
Year: 2017
High-Mobility Pentacene Organic Thin-Film Transistor with LaxNb(1–x)Oy Gate Dielectric Fabricated on Vacuum Tape
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuan Yu Han; Wing Man Tang; P. T. Lai
Year: 2017
Thermally Evaporated SiO Serving as Gate Dielectric in Graphene Field-Effect Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Letao Yang; Hanbin Wang; Xijian Zhang; Yuxiang Li; Xiufang Chen; Xiangang Xu; Xian Zhao; Aimin Song
Year: 2017
Active Region Design and Gain Characteristics of InP-Based Dilute Bismide Type-II Quantum Wells for Mid-IR Lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baile Chen
Year: 2017
W-Band 5 MW Pulse Relativistic Gyrotron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edward B. Abubakirov; Alexey V. Chirkov; Gregory G. Denisov; Yury M. Guznov; Sergey Yu Kornishin; Alexander N. Leontyev; Oleg P. Plankin; Roman M. Rozental; Anton S. Sedov; Eugeny S. Semenov; Vladimir P. Tarakanov; Nikolay A. Zavolsky; Sergey A. Zapevalov; Vladimir E. Zapevalov
Year: 2017
Propagation Characteristics of Confocal Waveguides Based on Spheroidal Functions for a ${W}$ -Band Gyro-TWT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yelei Yao; Jianxun Wang; Hao Li; Qizhi Tian; Kun Dong; Hao Fu; Yong Luo
Year: 2017
High-Performance Split-Gate-Enhanced UMOSFET With Dual Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Wang; Cheng-Hao Yu; Meng-Shi Li; Fei Cao; Yan-Juan Liu
Year: 2017
Surface Potential Equation for Low Effective Mass Channel Common Double-Gate MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ananda Sankar Chakraborty; Santanu Mahapatra
Year: 2017
Bulk FinFET With Low- $\kappa $ Spacers for Continued Scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angada B. Sachid; Min-Cheng Chen; Chenming Hu
Year: 2017
High Temperature Data Converters in Silicon Carbide CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ashfaqur Rahman; Landon Caley; Sajib Roy; Nathan Kuhns; Alan Mantooth; Jia Di; Anthony M. Francis; Jim Holmes
Year: 2017
Quasi-Analytical Model of 3-D Vertical-RRAM Array Architecture for MB-Level Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiwei Li; Pai-Yu Chen; Haijun Liu; Qingjiang Li; Hui Xu; Shimeng Yu
Year: 2017
Theoretical and Experimental Investigation of Cascaded Microwave Power Sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhenxiang Yi; Hao Yan; Xiaoping Liao
Year: 2017
Full Wave Analysis of Coaxial Gyrotron Cavity With Triangular Corrugations on the Insert
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sukwinder Singh; M. V. Kartikeyan
Year: 2017
0.2-THz Dual Mode Sheet Beam Traveling Wave Tube
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Zheng; Diana Gamzina; Neville C. Luhmann
Year: 2017
Design and Realization of GaN Trench Junction-Barrier-Schottky-Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenshen Li; Kazuki Nomoto; Manyam Pilla; Ming Pan; Xiang Gao; Debdeep Jena; Huili Grace Xing
Year: 2017
Investigation of GaAsBi/GaAsN Type-II Staggered Heterojunction TFETs with the Analytical Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yibo Wang; Genquan Han; Yan Liu; Chunfu Zhang; Qian Feng; Jincheng Zhang; Yue Hao
Year: 2017
A Comparative Study 4500-V Edge Termination Techniques for SiC Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woongje Sung; B. Jayant Baliga
Year: 2017
Retention and Scalability Perspective of Sub-100-nm Double Gate Tunnel FET DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nupur Navlakha; Jyi-Tsong Lin; Abhinav Kranti
Year: 2017
A 220/247.5/275-GHz, 1.0-MW, Triple Frequency Regime Gyrotron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaurav Singh Baghel; M. V. Kartikeyan; Manfred K. Thumm
Year: 2017
A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiang Zheng; Shiwei Feng; Yamin Zhang; Xin He; Yu Wang
Year: 2017
Analytical Model of pH sensing Characteristics of Junctionless Silicon on Insulator ISFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rakhi Narang; Manoj Saxena; Mridula Gupta
Year: 2017
Temperature-Dependent Gate Bias Stress Effect in Dioctylbenzothieno[2,3-b]benzothiophene-Based Thin-Film Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiawei Wang; Tianjun Liu; Yiwei Zhang; Chao Jiang
Year: 2017
Physical-Model Guided Design on Transistor Test Structures for Extracting Metal Charging Design Rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wallace Lin
Year: 2017
Interaction Impedance for Space Harmonics of Circular Helix Using Simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ajith Kumar M.M.; Sheel Aditya; Ciersiang Chua
Year: 2017
Nonlinear Electrothermal Model for Investigation of Heat Transfer Process in a 22-nm FD-SOI MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faouzi Nasri; Mohamed Fadhel Ben Aissa; Hafedh Belmabrouk
Year: 2017
An Improved Flicker Noise Model for Circuit Simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ananda S. Roy; Sungwon Kim; Sivakumar P. Mudanai
Year: 2017
A Comprehensive DC and AC PBTI Modeling Framework for HKMG n-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subhadeep Mukhopadhyay; Narendra Parihar; Nilesh Goel; Souvik Mahapatra
Year: 2017
The Avalanche-Mode Superjunction LED
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Satadal Dutta; Peter G. Steeneken; Vishal Agarwal; Jurriaan Schmitz; Anne-Johan Annema; Raymond J. E. Hueting
Year: 2017
Proposal for a Leaky-Integrate-Fire Spiking Neuron Based on Magnetoelectric Switching of Ferromagnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akhilesh Jaiswal; Sourjya Roy; Gopalakrishnan Srinivasan; Kaushik Roy
Year: 2017
Synaptic Characteristics of Ag/AgInSbTe/Ta-Based Memristor for Pattern Recognition Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Zhang; Yi Li; Xiaoping Wang; Eby G. Friedman
Year: 2017
Ultimate Pixel Based on a Single Transistor With Deep Trapping Gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolas Thierry Fourches
Year: 2017
A New Design Approach of Dopingless Tunnel FET for Enhancement of Device Characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhagwan Ram Raad; Sukeshni Tirkey; Dheeraj Sharma; Pravin Kondekar
Year: 2017
Fluctuation Sensitivity Map: A Novel Technique to Characterise and Predict Device Behaviour Under Metal Grain Work-Function Variability Effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guillermo Indalecio; Natalia Seoane; Karol Kalna; Antonio J. Garcia-Loureiro
Year: 2017
Unified Compact Model for Nanowire Transistors Including Quantum Effects and Quasi-Ballistic Transport
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avirup Dasgupta; Amit Agarwal; Yogesh Singh Chauhan
Year: 2017
Set/Reset Switching Model of Cu Atom Switch Based on Electrolysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Munehiro Tada; Toshitsugu Sakamoto
Year: 2017
Effects of Low Viscosity Liquid on the Electro-Optical Properties of Inverse Twisted Nematic Liquid Crystal Display
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Te Chiang; Tsu-Ruey Chou; Szu-Hua Chen; Chih-Yu Chao
Year: 2017
Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rui Gao; Azrif B. Manut; Zhigang Ji; Jigang Ma; Meng Duan; Jian Fu Zhang; Jacopo Franco; Sharifah Wan Muhamad Hatta; Wei Dong Zhang; Ben Kaczer; David Vigar; Dimitri Linten; Guido Groeseneken
Year: 2017
Controllable Momentum Filter Based on a Magnetically Confined Semiconductor Heterostructure With a $\delta$ -Doping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mao-Wang Lu; Sai-Yan Chen; Gui-Lian Zhang
Year: 2017
Nanotube Junctionless FET: Proposal, Design, and Investigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubham Sahay; Mamidala Jagadesh Kumar
Year: 2017
Suppression of Current Collapse in Enhancement Mode GaN-Based HEMTs Using an AlGaN/GaN/AlGaN Double Heterostructure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shin-Yi Ho; Chun-Hsun Lee; An-Jye Tzou; Hao-Chung Kuo; Yuh-Renn Wu; JianJang Huang
Year: 2017
Numerical Simulation of N+ Source Pocket PIN-GAA-Tunnel FET: Impact of Interface Trap Charges and Temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaya Madan; Rishu Chaujar
Year: 2017
Pulsed I-V on TFETs: Modeling and Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quentin Smets; Anne Verhulst; Ji-Hong Kim; Jason P. Campbell; David Nminibapiel; Dmitry Veksler; Pragya Shrestha; Rahul Pandey; Eddy Simoen; David Gundlach; Curt Richter; Kin P. Cheung; Suman Datta; Anda Mocuta; Nadine Collaert; Aaron V-Y Thean; Marc M. Heyns
Year: 2017
An Analytical Model to Estimate ${V}_{T}$ Distribution of Partially Correlated Fin Edges in FinFETs Due to Fin-Edge Roughness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amita; S. Mittal; U. Ganguly
Year: 2017
Comparison of Two DC Extraction Methods for Mobility and Parasitic Resistances in a HEMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Pradeep; D. S. Rawal; Shreepad Karmalkar
Year: 2017
Electrical Runaway in AlGaN/GaN HEMTs: Physical Mechanisms and Impact on Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Brunel; B. Lambert; D. Carisetti; Nathalie Malbert; A. Curutchet; N. Labat
Year: 2017
Accurate Defect Density-of-State Extraction Based on Back-Channel Surface Potential Measurement for Solution-Processed Metal-Oxide Thin-Film Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hwarim Im; Hyunsoo Song; Jongjang Park; Yewon Hong; Jewook Ha; Seon-Beom Ji; Jaewook Jeong; Yongtaek Hong
Year: 2017
Improved Interfacial and Electrical Properties of GaAs MOS Capacitor With LaON/TiON Multilayer Composite Gate Dielectric and LaON as Interfacial Passivation Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han-Han Lu; Lu Liu; Jing-Ping Xu; Pui-To Lai; Wing-Man Tang
Year: 2017
High Threshold Voltage Uniformity and Low Hysteresis Recessed-Gate Al2O3/AlN/GaN MISFET by Selective Area Growth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang He; Fan Yang; Liuan Li; Zijun Chen; Zhen Shen; Yue Zheng; Yao Yao; Yiqiang Ni; Deqiu Zhou; Xiaorong Zhang; Lei He; Zhisheng Wu; Baijun Zhang; Yang Liu
Year: 2017
Effects of Localized Body Doping on Switching Characteristics of Tunnel FET Inverters With Vertical Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dae Woong Kwon; Hyun Woo Kim; Jang Hyun Kim; Euyhwan Park; Junil Lee; Wandong Kim; Sangwan Kim; Jong-Ho Lee; Byung-Gook Park
Year: 2017
Quasi-Schottky-Barrier UTBB SOI MOSFET for Low-Power Robust SRAMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamdam Ghanatian; Seyed Ebrahim Hosseini; Behzad Zeinali; Farshad Moradi
Year: 2017
Evaluation of Mobility Degradation Factors and Performance Improvement of Ultrathin-Body Germanium-on-Insulator MOSFETs by GOI Thinning Using Plasma Oxidation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao Yu; Jian Kang; Mitsuru Takenaka; Shinichi Takagi
Year: 2017
Impact of Subthreshold Carrier Statistics on the Low-Frequency Noise in MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arjun Ajaykumar; Xing Zhou; Siau Ben Chiah; Binit Syamal
Year: 2017
Physics-Based Generalized Threshold Voltage Model of Multiple Material Gate Tunneling FET Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Samia Safa; Samantha Lubaba Noor; Ziaur Rahman Khan
Year: 2017
a-Si:H TFT-Silicon Hybrid Low-Energy X-Ray Detector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyung-Wook Shin; Karim S. Karim
Year: 2017
TWT Model on a Metamagnetic Plate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuriy N. Pchelnikov; Andrey A. Yelizarov
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Wrinkled Single-Crystalline Germanium Nanomembranes for Stretchable Photodetectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qinglei Guo; Yangfu Fang; Miao Zhang; Gaoshan Huang; Paul K. Chu; Yongfeng Mei; Zengfeng Di; Xi Wang
Year: 2017
Printed Organic Circuits for Reading Ferroelectric Rewritable Memory Capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tse Nga Ng; David E. Schwartz; Ping Mei; Sivkheng Kor; Janos Veres; Per Broms; Christer Karlsson
Year: 2017
Semiconductor-Free Nonvolatile Resistive Switching Memory Devices Based on Metal Nanogaps Fabricated on Flexible Substrates via Adhesion Lithography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:James Semple; Gwenhivir Wyatt-Moon; Dimitra G. Georgiadou; Martyn A. McLachlan; Thomas D. Anthopoulos
Year: 2017
A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Jing Wu; Li-Rong Zhang; Zhi-Ping Xu; Lei Zhou; Hao Tao; Jian-Hua Zou; Miao Xu; Lei Wang; Jun-Biao Peng
Year: 2017
Flexible Optoelectric Neural Interface Integrated Wire-Bonding $\mu$ LEDs and Microelectrocorticography for Optogenetics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bowen Ji; Minghao Wang; Xiaoyang Kang; Xiaowei Gu; Chengyu Li; Bin Yang; Xiaolin Wang; Jingquan Liu
Year: 2017
Effects of Ni in Strontium Titanate Nickelate Thin Films for Flexible Nonvolatile Memory Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ke-Jing Lee; Yu-Chi Chang; Cheng-Jung Lee; Li-Wen Wang; Dei-Wei Chou; Te-Kung Chiang; Yeong-Her Wang
Year: 2017
Freeform Compliant CMOS Electronic Systems for Internet of Everything Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sohail F. Shaikh; Mohamed T. Ghoneim; Galo A. Torres Sevilla; Joanna M. Nassar; Aftab M. Hussain; Muhammad M. Hussain
Year: 2017
Flexible and Stretchable Microwave Microelectronic Devices and Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yei Hwan Jung; Huilong Zhang; Sang June Cho; Zhenqiang Ma
Year: 2017
A Review of Flexible OLEDs Toward Highly Durable Unusual Displays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Min Lee; Jeong Hyun Kwon; Seonil Kwon; Kyung Cheol Choi
Year: 2017
Impact of Physical Deformation on Electrical Performance of Paper-Based Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joanna M. Nassar; Muhammad M. Hussain
Year: 2017
Schottky Barrier in Organic Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong Xu; Huabin Sun; Yong-Young Noh
Year: 2017
All Polymer FETs Direct-Written on Flexible Substrates Achieving MHz Operation Regime
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sadir Gabriele Bucella; Andrea Perinot; Mario Caironi
Year: 2017
Universal Compact Model for Thin-Film Transistors and Circuit Simulation for Low-Cost Flexible Large Area Electronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiaqing Zhao; Pengfei Yu; Shi Qiu; Qinghang Zhao; Linrun Feng; Simon Ogier; Wei Tang; Jiali Fan; Wenjiang Liu; Yongpan Liu; Xiaojun Guo
Year: 2017
Low-Temperature, Solution-Processed, 3-D Complementary Organic FETs on Flexible Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sujeong Kyung; Jimin Kwon; Yun-Hi Kim; Sungjune Jung
Year: 2017
Effects of Channel Layer Thickness on Characteristics of Flexible Nickel-Doped Zinc Oxide Thin-Film Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dedong Han; Lingling Huang; Wen Yu; Yingying Cong; Junchen Dong; Xing Zhang; Yi Wang
Year: 2017
Modeling of CMOS Devices and Circuits on Flexible Ultrathin Chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anastasios Vilouras; Hadi Heidari; Shoubhik Gupta; Ravinder Dahiya
Year: 2017
Flexible Organic Amplifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huabin Sun; Yong Xu; Yong-Young Noh
Year: 2017
An Energy-Efficient Tensile-Strained Ge/InGaAs TFET 7T SRAM Cell Architecture for Ultralow-Voltage Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jheng-Sin Liu; Michael B. Clavel; Mantu K. Hudait
Year: 2017
Full Wave Analysis of Plasma Loaded Coaxial Gyrotron Cavity With Triangular Corrugations on the Insert
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sukwinder Singh; M. V. Kartikeyan
Year: 2017
Self-Heating Phase-Change Memory-Array Demonstrator for True Random Number Generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Enrico Piccinini; Rossella Brunetti; Massimo Rudan
Year: 2017
A Distributed Extended Ebers–Moll Model Topology for SiGe Heterojunction Bipolar Phototransistors Based on Drift–Diffusion Hydrodynamic Behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alae Bennour; Frederic Moutier; Jean-Luc Polleux; Catherine Algani; Said Mazer
Year: 2017
Si CMOS Image-Sensors Designed With Hydrogen-Ion Implantation Induced Nanocavities for Enhancing Output Voltage Sensing Margin via Proximity Gettering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Il-Hwan Kim; Jun-Seong Park; Tae-Hun Shim; Jea-Gun Park
Year: 2017
The Effect of Pinned Photodiode Shape on Time-of-Flight Demodulation Contrast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Terrence Cole Millar; Navid Sarhangnejad; Nikola Katic; Kyros Kutulakos; Roman Genov
Year: 2017
Impact of Equivalent Oxide Thickness on Threshold Voltage Variation Induced by Work-Function Variation in Multigate Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Youngtaek Lee; Changhwan Shin
Year: 2017
AZO Thin Film Transistor Performance Enhancement by Capping an Aluminum Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen Yu; Dedong Han; Junchen Dong; Yingying Cong; Guodong Cui; Yi Wang; Shengdong Zhang
Year: 2017
Improvement in Sensing Responses to Ammonia Gas for Gas Sensors With Separately Designed Sensing Element Using ALD-Grown ZnO Nanoparticles and Read-Out Element of Top-Gate In-Ga-Zn-O Thin-Film Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da-Jeong Yun; Gi-Ho Seo; Won-Ho Lee; Sung-Min Yoon
Year: 2017
GaN Nanowire Schottky Barrier Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gourab Sabui; Vitaly Z. Zubialevich; Mary White; Pietro Pampili; Peter J. Parbrook; Mathew McLaren; Miryam Arredondo-Arechavala; Z. John Shen
Year: 2017
An Investigation of Electrical and Dielectric Parameters of SolGÇôGel Process Enabled $\beta $ -Ga2O3 as a Gate Dielectric Material
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmet Kaya; Howard Mao; Jianyi Gao; Rajesh V. Chopdekar; Yayoi Takamura; Srabanti Chowdhury; M. Saif Islam
Year: 2017
Flicker Noise Performance on Thick and Thin Oxide FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Ming Ding; Durgamadhab Durga Misra; Purushothaman Srinivasan
Year: 2017
Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yao Xiao; Ting-Zhu Wu; Si-Jia Dang; Yu-Lin Gao; Yue Lin; Li-Hong Zhu; Zi-Quan Guo; Yi-Jun Lu; Zhong Chen
Year: 2017
Variation of Threshold Voltage With Temperature in Impact Ionization-Induced Steep Switching Si and Ge Junctionless MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manish Gupta; Abhinav Kranti
Year: 2017
Assessment of the Electrical Performance of Short Channel InAs and Strained Si Nanowire FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corentin Grillet; Demetrio Logoteta; Alessandro Cresti; Marco G. Pala
Year: 2017
Dual Band Metamaterial Cherenkov Oscillator With a Waveguide Coupler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xianfeng Tang; Zhaoyun Duan; Xinwu Ma; Shifeng Li; Fei Wang; Yuanyuan Wang; Yubin Gong; Jinjun Feng
Year: 2017
High-Performance Uniaxial Tensile Strained n-Channel JL SOI FETs and Triangular JL Bulk FinFETs for Nanoscaled Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Po-Jung Sung; Ta-Chun Cho; Fu-Ju Hou; Fu-Kuo Hsueh; Sheng-Ti Chung; Yao-Jen Lee; Michael I. Current; Tien-Sheng Chao
Year: 2017
A Physics-Based Compact Model for Symmetrical Double-Gate Polysilicon Thin-Film Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fei Yu; Wanling Deng; Junkai Huang; Xiaoyu Ma; Juin J. Liou
Year: 2017
Suppression of Efficiency Roll-Off in Fluorescent Organic Light-Emitting Devices Through Charge Carriers and Excitons Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Soofi; S. Saeidi
Year: 2017
Image Processing With Dipole-Coupled Nanomagnets: Noise Suppression and Edge Enhancement Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Md Ahsanul Abeed; Ayan Kumar Biswas; Md Mamun Al-Rashid; Jayasimha Atulasimha; Supriyo Bandyopadhyay
Year: 2017
Experimental Realization of Thermal Stability Enhancement of Nickel Germanide Alloy by Using TiN Metal Capping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen-Han Chou; Yi-He Tsai; Chung-Chun Hsu; Yu-Hau Jau; Yu-Hsien Lin; Wen-Kuan Yeh; Chao-Hsin Chien
Year: 2017
Effect of In and Zn Content on Structural and Electrical Properties of InZnSnO Thin-Film Transistors Using an Yb2TiO5 Gate Dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tung-Ming Pan; Bo-Jung Peng; Jim-Long Her; Bih-Show Lou
Year: 2017
First-Principles-Based Quantum Transport Simulations of Monolayer Indium Selenide FETs in the Ballistic Limit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongsoo Ahn; Mincheol Shin
Year: 2017
Design Criterion for SiC BJTs to Avoid ON-Characteristics Degradation Due to Base Spreading Resistance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Satoshi Asada; Tsunenobu Kimoto; Jun Suda
Year: 2017
Asymmetric Junctions in Metallic–Semiconducting–Metallic Heterophase MoS2
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dipankar Saha; Santanu Mahapatra
Year: 2017
Simulations of Junction Termination Extensions in Vertical GaN Power Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonathan J. Wierer; Jeramy R. Dickerson; Andrew A. Allerman; Andrew M. Armstrong; Mary H. Crawford; Robert J. Kaplar
Year: 2017
Subcutaneous Photovoltaic Infrared Energy Harvesting for Bio-implantable Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eunseong Moon; David Blaauw; Jamie D. Phillips
Year: 2017
Flexible Capacitive Hydrogel Tactile Sensor With Adjustable Measurement Range Using Liquid Crystal and Carbon Nanotubes Composites
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lixin Chen; Jingquan Liu; Xiaolin Wang; Bowen Ji; Xiang Chen; Bin Yang
Year: 2017
Performance of a Nano-CNC Machined 220-GHz Traveling Wave Tube Amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anisullah Baig; Diana Gamzina; Takuji Kimura; John Atkinson; Calvin Domier; Branko Popovic; Logan Himes; Robert Barchfeld; Mark Field; Neville C. Luhmann
Year: 2017
Time-Resolving Characteristics of Pixel- and Charge-Division-Type Position-Sensitive SiPMs With Epitaxial Quenching Resistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baicheng Li; Shenyuan Wang; Chenhui Li; Tianqi Zhao; Quanlong Miao; Ruiheng Wang; Jianquan Jia; Kun Liang; Ru Yang; Dejun Han
Year: 2017
Insights Into Interface Treatments in p-Channel Organic Thin-Film Transistors Based on a Novel Molecular Semiconductor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosalba Liguori; Hakan Usta; Sandra Fusco; Antonio Facchetti; Gian Domenico Licciardo; Luigi Di Benedetto; Alfredo Rubino
Year: 2017
Foreword
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong-Young Noh; Xiaojun Guo; Muhammad Mustafa Hussain; Zhenqiang Jack Ma; Deji Akinwande; Mario Caironi; Thomas D. Anthopoulos; Tse Nga Tina Ng; Ryoichi Ishihara
Year: 2017
Hot-Electron Electroluminescence Under RF Operation in GaN-HEMTs: A Comparison Among Operational Classes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tommaso Brazzini; Michael A. Casbon; Michael J. Uren; Paul J. Tasker; Helmut Jung; Herve Blanck; Martin Kuball
Year: 2017
Electrical and Interfacial Properties of GaAs MOS Capacitors With La-Doped ZrON as Interfacial Passivation Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Han-Han Lu; Jing-Ping Xu; Lu Liu; Pui-To Lai; Wing-Man Tang
Year: 2017
Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
2017 Symposia on VLSI Technology and Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Introducing IEEE Collabratec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Measuring Modularity: Engineering and Management Effects of Different Approaches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anna Cabigiosu; Arnaldo Camuffo
Year: 2017
Information Sharing in the Supply Chains of Products With Seasonal Demand
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeu-Shiang Huang; Chia-Hsien Ho; Chih-Chiang Fang
Year: 2017
Stochastic Single-Machine Scheduling With Learning Effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haitao Li
Year: 2017
Analyzing Degree of Parallelism for Concurrent Timed Workflow Processes With Shared Resources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanhua Du; Li Wang; Xitong Li
Year: 2017
A Systematic Literature Review of Constraint-Based Innovations: State of the Art and Future Perspectives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nivedita Agarwal; Michael Grottke; Shefali Mishra; Alexander Brem
Year: 2017
Engineering Management Models for Urban Security
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohammed Muaafa; Jose Emmanuel Ramirez-Marquez
Year: 2017
Technological Uncertainty and Firm Boundaries: The Moderating Effect of Knowledge Modularity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sebastian K. Fixson; Davit Khachatryan; Wonhee Lee
Year: 2017
Green Supply Chain Formation Through By-Product Synergies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiong Sun; Navid Sabbaghi; Weslynne Ashton
Year: 2017
Bot-In-Time Delivery for Robotic Mobile Fulfillment Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhe Yuan; Yeming Yale Gong
Year: 2017
Innovation and technology management in the entrepreneurial era
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
TEMS: Developing Leaders for Managing Technology, Engineering, and Innovation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Technology and Engineering Management Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Editorial for February 2017 Issue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajiv Sabherwal
Year: 2017
Guidelines for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Technology and Engineering Management Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Heterogeneous Networked Cooperative Scheduling With Anarchic Particle Swarm Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Javad Behnamian
Year: 2017
Multiobjective Discrete Artificial Bee Colony Algorithm for Multiobjective Permutation Flow Shop Scheduling Problem With Sequence Dependent Setup Times
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiangtao Li; Shijing Ma
Year: 2017
Novel Two-Phase Approach for Process Optimization of Customer Collaborative Design Based on Fuzzy-QFD and DSM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aijun Liu; Hesuan Hu; Xiao Zhang; Deming Lei
Year: 2017
Supply Chain Security: A Classification of Practices and an Empirical Study of Differential Effects and Complementarity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guanyi Lu; Xenophon Koufteros; Lorenzo Lucianetti
Year: 2017
How Do Informal Ties Drive Open Innovation? The Contingency Role of Market Dynamism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoxuan Zhu; Maggie Chuoyan Dong; Jibao Gu; Wenyu Dou
Year: 2017
A Method for Improving Overlapping of Testing and Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khadija Tahera; Chris Earl; Claudia Eckert
Year: 2017
Interlocking Patent Rights and Value Appropriation: Insights From the Razor Industry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Christian Sternitzke
Year: 2017
Design Structure Matrix Modeling of a Supply Chain Management System Using Biperspective Group Decision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Samuel Son; Junhong Kim; Jaemyung Ahn
Year: 2017
Managing New Technology Using Malleable Profit Functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Richard Arend; Moren Levesque; Maria Minniti
Year: 2017
The Bullwhip Effect in an Online Retail Supply Chain: A Perspective of Price-Sensitive Demand Based on the Price Discount in E-Commerce
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dandan Gao; Nengmin Wang; Zhengwen He; Tao Jia
Year: 2017
Editorial for May 2017 Issue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:RAJIV SABHERWAL
Year: 2017
IEEE Technology and Engineering Management Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Guidelines for Authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Forthcoming Engineering Management Related Conferences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Technology and Engineering Management Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Introducing IEEE Collabratec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Technology and Engineering Management Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Distributed Structure: Joint Expurgation for the Multiple-Access Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eli Haim; Yuval Kochman; Uri Erez
Year: 2017
Polynomial Time Attack on Wild McEliece Over Quadratic Extensions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alain Couvreur; Ayoub Otmani; Jean-Pierre Tillich
Year: 2017
Limits on Support Recovery With Probabilistic Models: An Information-Theoretic Framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonathan Scarlett; Volkan Cevher
Year: 2017
A Unifying Order-Theoretic Framework for Superposition Coding: Polymatroidal Structure and Optimality in the Multiple-Access Channel With General Message Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henry P. Romero; Mahesh K. Varanasi
Year: 2017
Cyclic Statistic Estimators With Uncertain Cycle Frequencies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonio Napolitano
Year: 2017
A Clustering Approach to Learning Sparsely Used Overcomplete Dictionaries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alekh Agarwal; Animashree Anandkumar; Praneeth Netrapalli
Year: 2017
An Efficient Framework for Unconditionally Secure Multiparty Computation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ashish Choudhury; Arpita Patra
Year: 2017
On the Role of Transmit Correlation Diversity in Multiuser MIMO Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junyoung Nam; Giuseppe Caire; Jeongseok Ha
Year: 2017
Strong Converse Rates for Quantum Communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marco Tomamichel; Mark M. Wilde; Andreas Winter
Year: 2017
A Class of Non-Linearly Solvable Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joseph Connelly; Kenneth Zeger
Year: 2017
Layered Constructions for Low-Delay Streaming Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmed Badr; Pratik Patil; Ashish Khisti; Wai-Tian Tan; John Apostolopoulos
Year: 2017
Exact Solutions to Super Resolution on Semi-Algebraic Domains in Higher Dimensions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yohann De Castro; F. Gamboa; Didier Henrion; J.-B Lasserre
Year: 2017
Inference for Generalized Linear Models via Alternating Directions and Bethe Free Energy Minimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sundeep Rangan; Alyson K. Fletcher; Philip Schniter; Ulugbek S. Kamilov
Year: 2017
Sending Perishable Information: Coding Improves Delay-Constrained Throughput Even for Single Unicast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Chun Wang; Minghua Chen
Year: 2017
The Dispersion of Nearest-Neighbor Decoding for Additive Non-Gaussian Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonathan Scarlett; Vincent Y. F. Tan; Giuseppe Durisi
Year: 2017
Linear Degrees of Freedom of the MIMO X-Channel With Delayed CSIT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David T. H. Kao; A. Salman
Year: 2017
Perfect Snake-in-the-Box Codes for Rank Modulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alexander E. Holroyd
Year: 2017
Estimating Renyi Entropy of Discrete Distributions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jayadev Acharya; Alon Orlitsky; Ananda Theertha Suresh; Himanshu Tyagi
Year: 2017
An Improved Bound on the Fraction of Correctable Deletions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boris Bukh; Venkatesan Guruswami; Johan Hastad
Year: 2017
Two-Stage Sampling, Prediction and Adaptive Regression via Correlation Screening
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamed Firouzi; Alfred O. Hero; Bala Rajaratnam
Year: 2017
Strong Secrecy for Cooperative Broadcast Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ziv Goldfeld; Gerhard Kramer; Haim H. Permuter; Paul Cuff
Year: 2017
Gaussian States Minimize the Output Entropy of the One-Mode Quantum Attenuator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giacomo De Palma; Dario Trevisan; Vittorio Giovannetti
Year: 2017
List Decoding of Crisscross Errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonia Wachter-Zeh
Year: 2017
Additive Rank Metric Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kamil Otal; Ferruh Özbudak
Year: 2017
Distributed Multicast Tree Construction in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongyu Gong; Luoyi Fu; Xinzhe Fu; Lutian Zhao; Kainan Wang; Xinbing Wang
Year: 2017
Secure Degrees of Freedom of the Gaussian Diamond-Wiretap Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Si-Hyeon Lee; Wanyao Zhao; Ashish Khisti
Year: 2017
Dynamic Spectrum Management: A Complete Complexity Characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ya-Feng Liu
Year: 2017
On the Non-Existence of Certain Classes of Generalized Bent Functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang Lv; Jianing Li
Year: 2017
Linear Degrees of Freedom of MIMO Broadcast Channels With Reconfigurable Antennas in the Absence of CSIT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minho Yang; Sang-Woon Jeon; Dong Ku Kim
Year: 2017
Success Probability of the Babai Estimators for Box-Constrained Integer Linear Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinming Wen; Xiao-Wen Chang
Year: 2017
Long Cyclic Codes Over GF(4) and GF(8) Better Than BCH Codes in the High-Rate Region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ron M. Roth; Alexander Zeh
Year: 2017
On Ingleton-Violating Finite Groups
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Mao; Matthew Thill; Babak Hassibi
Year: 2017
Exact Random Coding Secrecy Exponents for the Wiretap Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mani Bastani Parizi; Emre Telatar; Neri Merhav
Year: 2017
A Note on One Weight and Two Weight Projective $\mathbb {Z}_{4}$ -Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minjia Shi; Liangliang Xu; Gang Yang
Year: 2017
Expanded GDoF-optimality Regime of Treating Interference as Noise in the $M\times 2$ X-Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soheil Gherekhloo; Anas Chaaban; Aydin Sezgin
Year: 2017
List Decodability of Random Subcodes of Gabidulin Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shu Liu; Chaoping Xing; Chen Yuan
Year: 2017
Multilevel Diversity Coding Systems: Rate Regions, Codes, Computation, & Forbidden Minors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Congduan Li; Steven Weber; John MacLaren Walsh
Year: 2017
The Capacity of a Class of Channels With Coded Side Information at the Decoder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nan Liu; Wei Kang
Year: 2017
The Three-Terminal Interactive Lossy Source Coding Problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leonardo Rey Vega; Pablo Piantanida; Alfred O. Hero
Year: 2017
Sampling Rate Distortion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vinay Praneeth Boda; Prakash Narayan
Year: 2017
Semiparametric Estimation of Mutual Information and Related Criteria: Optimal Test of Independence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amor Keziou; Philippe Regnault
Year: 2017
IEEE Transactions on Information Theory publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Information Theory information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
2016 IEEE Communications Society and Information Theory Society Joint Paper Award
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
2016 IEEE Information Theory Society Paper Award
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Sparse Signal Processing With Linear and Nonlinear Observations: A Unified Shannon-Theoretic Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cem Aksoylar; George K. Atia; Venkatesh Saligrama
Year: 2017
Lossless Coding of Correlated Sources With Actions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oron Sabag; Haim H. Permuter; Asaf Cohen
Year: 2017
An Ergodic Theory of Binary Operations—Part II: Applications to Polarization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajai Nasser
Year: 2017
Bayesian Group Testing Under Sum Observations: A Parallelizable Two-Approximation for Entropy Loss
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weidong Han; Purnima Rajan; Peter I. Frazier; Bruno M. Jedynak
Year: 2017
Compressive Sampling Using Annihilating Filter-Based Low-Rank Interpolation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jong Chul Ye; Jong Min Kim; Kyong Hwan Jin; Kiryung Lee
Year: 2017
Integer-Forcing Source Coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Or Ordentlich; Uri Erez
Year: 2017
Wireless Network Signals With Moderately Correlated Shadowing Still Appear Poisson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nathan Ross; Dominic Schuhmacher
Year: 2017
Random Coding Error Exponents for the Two-User Interference Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wasim Huleihel; Neri Merhav
Year: 2017
When is Noisy State Information at the Encoder as Useless as No Information or as Good as Noise-Free State?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rui Xu; Jun Chen; Tsachy Weissman; Jian-Kang Zhang
Year: 2017
Achieving Secrecy Capacity of the Wiretap Channel and Broadcast Channel With a Confidential Component
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Talha Cihad Gulcu; Alexander Barg
Year: 2017
FIFO Queues Are Bad for Rumor Spreading
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marcos Kiwi; Christopher Thraves Caro
Year: 2017
Complete Dictionary Recovery Over the Sphere II: Recovery by Riemannian Trust-Region Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ju Sun; Qing Qu; John Wright
Year: 2017
Complete Dictionary Recovery Over the Sphere I: Overview and the Geometric Picture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ju Sun; Qing Qu; John Wright
Year: 2017
The Approximate Capacity of the MIMO Relay Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xianglan Jin; Young-Han Kim
Year: 2017
Optimal Rebuilding of Multiple Erasures in MDS Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiying Wang; Itzhak Tamo; Jehoshua Bruck
Year: 2017
Generalized Integrated Interleaved Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yingquan Wu
Year: 2017
Conferencing in Wyner’s Asymmetric Interference Network: Effect of Number of Rounds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michele Wigger; Roy Timo; Shlomo Shamai Shitz
Year: 2017
Ordered Orthogonal Array Construction Using LFSR Sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andre Guerino Castoldi; Lucia Moura; Daniel Panario; Brett Stevens
Year: 2017
Stochastically Transitive Models for Pairwise Comparisons: Statistical and Computational Issues
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nihar B. Shah; Sivaraman Balakrishnan; Adityanand Guntuboyina; Martin J. Wainwright
Year: 2017
Energy-Distortion Exponents in Lossy Transmission of Gaussian Sources Over Gaussian Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erman Koken; Deniz Gunduz; Ertem Tuncel
Year: 2017
Sensing Tensors With Gaussian Filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stephane Chretien; Tianwen Wei
Year: 2017
The Adjacency Graphs of LFSRs With Primitive-Like Characteristic Polynomials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Li; Dongdai Lin
Year: 2017
Equivocations, Exponents, and Second-Order Coding Rates Under Various Rényi Information Measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Masahito Hayashi; Vincent Y. F. Tan
Year: 2017
Blind Recovery of Sparse Signals From Subsampled Convolution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kiryung Lee; Yanjun Li; Marius Junge; Yoram Bresler
Year: 2017
Reliable Communications Across Parallel Asynchronous Channels With Arbitrary Skews
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shlomo Engelberg; Osnat Keren
Year: 2017
On the Search Algorithm for the Output Distribution That Achieves the Channel Capacity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kenji Nakagawa; Kohei Watabe; Takuto Sabu
Year: 2017
Identifiability in Bilinear Inverse Problems With Applications to Subspace or Sparsity-Constrained Blind Gain and Phase Calibration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanjun Li; Kiryung Lee; Yoram Bresler
Year: 2017
Coded Caching With Nonuniform Demands
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Urs Niesen; Mohammad Ali Maddah-Ali
Year: 2017
Pretty Good Measures in Quantum Information Theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raban Iten; Joseph M. Renes; David Sutter
Year: 2017
Bounds on the Distance Between a Unital Quantum Channel and the Convex Hull of Unitary Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nengkun Yu; Runyao Duan; Quanhua Xu
Year: 2017
Markovianizing Cost of Tripartite Quantum States
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eyuri Wakakuwa; Akihito Soeda; Mio Murao
Year: 2017
Second-Order Region for Gray–Wyner Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shun Watanabe
Year: 2017
IEEE Transactions on Information Theory information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Information Theory publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Secure Degrees of Freedom of One-Hop Wireless Networks With No Eavesdropper CSIT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pritam Mukherjee; Jianwei Xie; Sennur Ulukus
Year: 2017
Nonadaptive Group Testing Based on Sparse Pooling Graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tadashi Wadayama
Year: 2017
Quantitative Recovery Conditions for Tree-Based Compressed Sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coralia Cartis; Andrew Thompson
Year: 2017
Delay on Broadcast Erasure Channels Under Random Linear Combinations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nan Xie; Steven Weber
Year: 2017
Nonparametric Regression Based on Hierarchical Interaction Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michael Kohler; Adam Krzyzak
Year: 2017
$k$ -Connectivity in Random $K$ -Out Graphs Intersecting Erd+æs-R+¬nyi Graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faruk Yavuz; Jun Zhao; Osman Yagan; Virgil Gligor
Year: 2017
On the Limitation of Spectral Methods: From the Gaussian Hidden Clique Problem to Rank One Perturbations of Gaussian Tensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrea Montanari; Daniel Reichman; Ofer Zeitouni
Year: 2017
Additive Bounds of Minimum Output Entropies for Unital Channels and an Exact Qubit Formula
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Motohisa Fukuda; Gilad Gour
Year: 2017
High-Dimensional Estimation of Structured Signals From Non-Linear Observations With General Convex Loss Functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martin Genzel
Year: 2017
Discrete Lossy Gray–Wyner Revisited: Second-Order Asymptotics, Large and Moderate Deviations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Zhou; Vincent Y. F. Tan; Mehul Motani
Year: 2017
A Single-Letter Upper Bound on the Feedback Capacity of Unifilar Finite-State Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oron Sabag; Haim H. Permuter; Henry D. Pfister
Year: 2017
Secrecy Capacity Scaling in Large Cooperative Wireless Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mahtab Mirmohseni; Panagiotis Panos Papadimitratos
Year: 2017
Coding Schemes for Achieving Strong Secrecy at Negligible Cost
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Remi A. Chou; Badri N. Vellambi; Matthieu R. Bloch; Jorg Kliewer
Year: 2017
New MDS Self-Dual Codes From Generalized Reed—Solomon Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lingfei Jin; Chaoping Xing
Year: 2017
Second-Order Asymptotics of Conversions of Distributions and Entangled States Based on Rayleigh-Normal Probability Distributions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wataru Kumagai; Masahito Hayashi
Year: 2017
Information-Theoretic Lower Bounds on Bayes Risk in Decentralized Estimation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aolin Xu; Maxim Raginsky
Year: 2017
Asymptotic Analysis of Rayleigh Product Channels: A Free Probability Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong Zheng; Lu Wei; Roland Speicher; Ralf R. Muller; Jyri Hamalainen; Jukka Corander
Year: 2017
On Secrecy Capacity of Minimum Storage Regenerating Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kun Huang; Udaya Parampalli; Ming Xian
Year: 2017
Weight Distributions of Non-Binary Multi-Edge Type LDPC Code Ensembles: Analysis and Efficient Evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giuliano Garrammone; David Declercq; Marc P. C. Fossorier
Year: 2017
Information Without Rolling Dice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taehyung J. Lim; Massimo Franceschetti
Year: 2017
The Secrecy Capacity of Gaussian MIMO Channels With Finite Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nir Shlezinger; Daniel Zahavi; Yonathan Murin; Ron Dabora
Year: 2017
Converse Bounds for Private Communication Over Quantum Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mark M. Wilde; Marco Tomamichel; Mario Berta
Year: 2017
On Gaussian Channels With Feedback Under Expected Power Constraints and With Non-Vanishing Error Probabilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lan V. Truong; Silas L. Fong; Vincent Y. F. Tan
Year: 2017
Capacity-Achieving Sparse Superposition Codes via Approximate Message Passing Decoding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cynthia Rush; Adam Greig; Ramji Venkataramanan
Year: 2017
On the Construction of Polar Codes for Channels With Moderate Input Alphabet Sizes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ido Tal
Year: 2017
The Structure of Dual Schubert Union Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fernando L. Pinero
Year: 2017
Channel Upgradation for Non-Binary Input Alphabets and MACs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uzi Pereg; Ido Tal
Year: 2017
Edge Coloring and Stopping Sets Analysis in Product Codes With MDS Components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fanny Jardel; Joseph Jean Boutros
Year: 2017
Adaptive Compressed Sensing for Support Recovery of Structured Sparse Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rui M. Castro; Ervin Tanczos
Year: 2017
Wireless Multihop Device-to-Device Caching Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang-Woon Jeon; Song-Nam Hong; Mingyue Ji; Giuseppe Caire; Andreas F. Molisch
Year: 2017
Diversity-Multiplexing Trade-Off of Half-Duplex Single Relay Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farzad Parvaresh; Hediyeh Soltanizadeh
Year: 2017
A New Framework for the Performance Analysis of Wireless Communications Under Hoyt (Nakagami- $q$ ) Fading
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Juan M. Romero-Jerez; F. Javier Lopez-Martinez
Year: 2017
Retrospective Interference Alignment: Degrees of Freedom Scaling With Distributed Transmitters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniel Castanheira; Adao Silva; Atilio Gameiro
Year: 2017
IEEE Transactions on Information Theory publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Information Theory information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Quantum-Proof Randomness Extractors via Operator Space Theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mario Berta; Omar Fawzi; Volkher B. Scholz
Year: 2017
New Lower Bounds for Secure Codes and Related Hash Families: A Hypergraph Theoretical Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yiting Yang; Yiwei Zhang; Gennian Ge
Year: 2017
Blind Index Coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David T. H. Kao; Mohammad Ali Maddah-Ali; A. Salman Avestimehr
Year: 2017
On the Capacity of Generalized Ising Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Artyom Sharov; Ron M. Roth
Year: 2017
The Log-Volume of Optimal Codes for Memoryless Channels, Asymptotically Within a Few Nats
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pierre Moulin
Year: 2017
A Large Deviations Approach to Secure Lossy Compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nir Weinberger; Neri Merhav
Year: 2017
Interactive Schemes for the AWGN Channel with Noisy Feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Assaf Ben-Yishai; Ofer Shayevitz
Year: 2017
Exact Reconstruction From Insertions in Synchronization Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Frederic Sala; Ryan Gabrys; Clayton Schoeny; Lara Dolecek
Year: 2017
On Bandlimited Field Estimation from Samples Recorded by a Location-Unaware Mobile Sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Animesh Kumar
Year: 2017
On the Multiplexing Gain of Discrete-Time MIMO Phase Noise Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng Yang; Shlomo Shamai Shitz
Year: 2017
Wiretapped Oblivious Transfer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Manoj Mishra; Bikash Kumar Dey; Vinod M. Prabhakaran; Suhas N. Diggavi
Year: 2017
Riemannian Gaussian Distributions on the Space of Symmetric Positive Definite Matrices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salem Said; Lionel Bombrun; Yannick Berthoumieu; Jonathan H. Manton
Year: 2017
Optimal Shrinkage of Singular Values
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matan Gavish; David L. Donoho
Year: 2017
Generalized Hamming Weights for Almost Affine Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trygve Johnsen; Hugues Verdure
Year: 2017
Construction and Encoding of QC-LDPC Codes Using Group Rings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hassan Khodaiemehr; Dariush Kiani
Year: 2017
Lattice Index Codes From Algebraic Number Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Chih Huang
Year: 2017
Random Number Conversion and LOCC Conversion via Restricted Storage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wataru Kumagai; Masahito Hayashi
Year: 2017
Constructions of High-Rate Minimum Storage Regenerating Codes Over Small Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Netanel Raviv; Natalia Silberstein; Tuvi Etzion
Year: 2017
Relaxed Polar Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mostafa El-Khamy; Hessam Mahdavifar; Gennady Feygin; Jungwon Lee; Inyup Kang
Year: 2017
Efficient Algorithms for Noisy Group Testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng Cai; Mohammad Jahangoshahi; Mayank Bakshi; Sidharth Jaggi
Year: 2017
Deletion Codes in the High-Noise and High-Rate Regimes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Venkatesan Guruswami; Carol Wang
Year: 2017
Adversarial Top- $K$ Ranking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Changho Suh; Vincent Y. F. Tan; Renbo Zhao
Year: 2017
Explicit Constructions of High-Rate MDS Array Codes With Optimal Repair Bandwidth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min Ye; Alexander Barg
Year: 2017
On the Dual of the Coulter-Matthews Bent Functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Honggang Hu; Qingsheng Zhang; Shuai Shao
Year: 2017
Codes Correcting a Burst of Deletions or Insertions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clayton Schoeny; Antonia Wachter-Zeh; Ryan Gabrys; Eitan Yaakobi
Year: 2017
Models and Information Rates for Wiener Phase Noise Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hassan Ghozlan; Gerhard Kramer
Year: 2017
Sparse Quantum Codes From Quantum Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dave Bacon; Steven T. Flammia; Aram W. Harrow; Jonathan Shi
Year: 2017
Meta-Fibonacci Codes:Efficient Universal Coding of Natural Numbers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruno T. Avila; Ricardo M. Campello de Souza
Year: 2017
Information-Theoretic Lower Bounds for Distributed Function Computation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aolin Xu; Maxim Raginsky
Year: 2017
Improving on the Cut-Set Bound via Geometric Analysis of Typical Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiugang Wu; Ayfer Ozgiur; Liang-Liang Xie
Year: 2017
Recipes for Stable Linear Embeddings From Hilbert Spaces to $ {\mathbb {R}}^{m}$
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gilles Puy; Mike E. Davies; Remi Gribonval
Year: 2017
Switch Codes: Codes for Fully Parallel Reconstruction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiying Wang; Han Mao Kiah; Yuval Cassuto; Jehoshua Bruck
Year: 2017
The $\rho $ -Capacity of a Graph
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sihuang Hu; Ofer Shayevitz
Year: 2017
Source-Channel Secrecy for Shannon Cipher System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lei Yu; Houqiang Li; Weiping Li
Year: 2017
Efficiently Decoding Reed–Muller Codes From Random Errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramprasad Saptharishi; Amir Shpilka; Ben Lee Volk
Year: 2017
A Class of Weiss–Weinstein Bounds and Its Relationship With the Bobrovsky–Mayer-Wolf–Zakaï Bounds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eric Chaumette; Alexandre Renaux; Mohammed Nabil El Korso
Year: 2017
Corrections to “Second-Order Asymptotics for Source Coding, Dense Coding, and Pure-State Entanglement Conversions”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nilanjana Datta; Felix Leditzky
Year: 2017
IEEE Transactions on Information Theory information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
A Correction to “Some Gabidulin Codes Cannot be List Decoded Efficiently at any Radius”
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Netanel Raviv; Antonia Wachter-Zeh
Year: 2017
IEEE Transactions on Information Theory publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Gaussian Multiple Access via Compute-and-Forward
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingge Zhu; Michael Gastpar
Year: 2017
Simulation of a Channel With Another Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farzin Haddadpour; Mohammad Hossein Yassaee; Salman Beigi; Amin Gohari; Mohammad Reza Aref
Year: 2017
$E_{ {\gamma }}$ -Resolvability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingbo Liu; Paul Cuff; Sergio Verdu
Year: 2017
Construction of MDS Codes With Complementary Duals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lingfei Jin
Year: 2017
Learning Immune-Defectives Graph Through Group Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abhinav Ganesan; Sidharth Jaggi; Venkatesh Saligrama
Year: 2017
Degrees of Freedom Region of the MIMO $2 \times 2$ Interference Network With General Message Sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yao Wang; Mahesh K. Varanasi
Year: 2017
The Discrete Dantzig Selector: Estimating Sparse Linear Models via Mixed Integer Linear Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rahul Mazumder; Peter Radchenko
Year: 2017
Minimax Compression and Large Alphabet Approximation Through Poissonization and Tilting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao Yang; Andrew R. Barron
Year: 2017
Burst-Erasure Correcting Codes With Optimal Average Delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nitzan Adler; Yuval Cassuto
Year: 2017
Broadcast Erasure Channel With Feedback and Message Side Information, and Related Index Coding Result
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Athanasios Papadopoulos; Leonidas Georgiadis
Year: 2017
On the Broadcast Capacity Scaling of Large Wireless Networks at Low SNR
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Serj Haddad; Olivier Leveque
Year: 2017
Fundamental Limits of Cache-Aided Interference Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Navid Naderializadeh; Mohammad Ali Maddah-Ali; Amir Salman Avestimehr
Year: 2017
Preconditioned Data Sparsification for Big Data With Applications to PCA and K-Means
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Farhad Pourkamali-Anaraki; Stephen Becker
Year: 2017
Universal Compressed Sensing for Almost Lossless Recovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shirin Jalali; H. Vincent Poor
Year: 2017
Phase Retrieval for Wavelet Transforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Irene Waldspurger
Year: 2017
Spherically Punctured Reed–Muller Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ilya Dumer; Olga Kapralova
Year: 2017
Variable-Length Prefix Codes With Multiple Delimiters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anatoly V. Anisimov; Igor O. Zavadskyi
Year: 2017
Fundamental Limits of Cache-Aided Wireless BC: Interplay of Coded-Caching and CSIT Feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingjing Zhang; Petros Elia
Year: 2017
An Adaptive Fusion Strategy for Distributed Information Estimation Over Cooperative Multi-Agent Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daxin Tian; Jianshan Zhou; Zhengguo Sheng
Year: 2017
The MDS Queue: Analysing the Latency Performance of Erasure Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kangwook Lee; Nihar B. Shah; Longbo Huang; Kannan Ramchandran
Year: 2017
Entanglement-Assisted Capacities of Compound Quantum Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mario Berta; Hrant Gharibyan; Michael Walter
Year: 2017
Coded Caching for Multi-level Popularity and Access
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jad Hachem; Nikhil Karamchandani; Suhas N. Diggavi
Year: 2017
Second-Order and Moderate Deviations Asymptotics for Successive Refinement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Zhou; Vincent Y. F. Tan; Mehul Motani
Year: 2017
On the Asymptotic Equivalence of Circulant and Toeplitz Matrices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhihui Zhu; Michael B. Wakin
Year: 2017
Reliability of Universal Decoding Based on Vector-Quantized Codewords
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Neri Merhav
Year: 2017
The Discrete Memoryless Interference Channel With One-Sided Generalized Feedback and Secrecy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shraga I. Bross
Year: 2017
Coding for Classical-Quantum Channels With Rate Limited Side Information at the Encoder: Information-Spectrum Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Naqueeb Ahmad Warsi; Justin P. Coon
Year: 2017
Finite-Length Linear Schemes for Joint Source-Channel Coding Over Gaussian Broadcast Channels With Feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yonathan Murin; Yonatan Kaspi; Ron Dabora; Deniz Gunduz
Year: 2017
Detecting a Suddenly Arriving Dynamic Profile of Finite Duration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blaise Kevin Guepie; Lionel Fillatre; Igor Nikiforov
Year: 2017
Exact Moderate Deviation Asymptotics in Streaming Data Transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Si-Hyeon Lee; Vincent Y. F. Tan; Ashish Khisti
Year: 2017
From Random Matrix Theory to Coding Theory: Volume of a Metric Ball in Unitary Group
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lu Wei; Renaud-Alexandre Pitaval; Jukka Corander; Olav Tirkkonen
Year: 2017
Ideal Codes Over Separable Ring Extensions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jose Gomez-Torrecillas; F. J. Lobillo; Gabriel Navarro
Year: 2017
Almost Universal Codes Achieving Ergodic MIMO Capacity Within a Constant Gap
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laura Luzzi; Roope Vehkalahti
Year: 2017
Partial Hard Thresholding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prateek Jain; Ambuj Tewari; Inderjit S. Dhillon
Year: 2017
IEEE Transactions on Information Theory information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Information Theory publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Corrections to “Information Without Rolling Dice” [Mar 17 1349-1363]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taehyung J. Lim; Massimo Franceschetti
Year: 2017
Segmented Kalman Filter Based Antistrong Transient Impact Method for Vortex Flowmeter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chun-Li Shao; Ke-Jun Xu; Zhang-Ping Shu
Year: 2017
An Adaptive Bitrate Clock and Data Recovery Circuit for Communication Signal Analyzers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Guerrero; C. Sanchez-Azqueta; C. Gimeno; J. Aguirre; S. Celma
Year: 2017
Performance Verification of a 4-Axis Focus Variation Co-Ordinate Measuring System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giovanni Moroni; Wahyudin P. Syam; Stefano Petro
Year: 2017
KKCV-GA-Based Method for Optimal Analog Test Point Selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaofeng Tang; Aiqiang Xu; Shuangcheng Niu
Year: 2017
Recognition and Calibration of Rail Profile Under Affine-Distortion-Based Point Set Mapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongli Liu; Yanfu Li; Ziji Ma; Chao Wang
Year: 2017
A High-speed In Situ Measuring Method for Inner Dimension Inspection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xingqiang Li; Zhong Wang; Luhua Fu
Year: 2017
Inverse Scattering for Monochromatic Phaseless Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuri Alvarez; Maria Garcia-Fernandez; Lorenzo Poli; Cebrian Garcia-Gonzalez; Paolo Rocca; Andrea Massa; Fernando Las-Heras
Year: 2017
Temperature-Insensitive Optical Fiber Curvature Sensor Based on SMF-MMF-TCSMF-MMF-SMF Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong Zhao; Lu Cai; Xue-Gang Li
Year: 2017
A Sensitivity Enhanced Microdisplacement Sensing Method Improved Using Slow Light in Fiber Bragg Grating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qi Wang; Mengjuan Guo; Yong Zhao
Year: 2017
Motion Detection and Compensation of Affine Deformations in Infrared Retinal Videos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lucas Royes Schardosim; Jacob Scharcanski
Year: 2017
Robotic Room-Level Localization Using Multiple Sets of Sonar Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huaping Liu; Fuchun Sun; Bin Fang; Xinyu Zhang
Year: 2017
Design of a Wideband System for Measuring Dielectric Properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiangzhen Wang; Wen Geyi
Year: 2017
Window-Varying Particle Filter for Parameter Identification of Space Thermal Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dingyi Cheng; Wen Zhang; Jingyu Liu
Year: 2017
Vehicle Collision Reconstruction With 3-D Inertial Navigation and GNSS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srdjan Tadic; Rade Stancic; Lazar V. Saranovac; Predrag N. Ivanis
Year: 2017
Optimization of Near-Field Image Capture With Millimeter-Wave Bow-Tie Probes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Laurent Chusseau; Pierre Payet; Jeremy Raoult
Year: 2017
Wideband Nondestructive Measurement of Complex Permittivity and Permeability Using Coupled Coaxial Probes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohammad Hossein Hosseini; Hamid Heidar; Mohammad Hossein Shams
Year: 2017
Time-Variant Frequency Response Function Measurement of Multivariate Time-Variant Systems Operating in Feedback
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rik Pintelon; Ebrahim Louarroudi; John Lataire
Year: 2017
Millimeter Wave Reflectometry and Imaging for Noninvasive Diagnosis of Skin Burn Injuries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Gao; Reza Zoughi
Year: 2017
Analysis of Knee Strength Measurements Performed by a Hand-Held Multicomponent Dynamometer and Optoelectronic System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andrea Ancillao; Stefano Rossi; Paolo Cappa
Year: 2017
A New Optical Voltage Sensor Based on Radial Polarization Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiao Tan; Qifeng Xu; Nan Xie; Chao Li
Year: 2017
Introducing IEEE Collabratec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Instrumentation and Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Instrumentation and Measurement publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Together, we are advancing technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Instrumentation and Measurement information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Instrumentation and Measurement Society Information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Particle Learning Framework for Estimating the Remaining Useful Life of Lithium-Ion Batteries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhenbao Liu; Gaoyuan Sun; Shuhui Bu; Junwei Han; Xiaojun Tang; Michael Pecht
Year: 2017
Inductive Integrated Biosensor With Extended Operative Range for Detection of Magnetic Beads for Magnetic Immunoassay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angela Beninato; Valentina Sinatra; Giuseppe Tosto; Maria Eloisa Castagna; Salvatore Petralia; Sabrina Conoci; Salvatore Baglio
Year: 2017
Practical Issues in the Synthesis of Ternary Sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alessio De Angelis; Johan Schoukens; Keith R. Godfrey; Paolo Carbone
Year: 2017
Adaptive Cancellation of Parasitic Vibrations Affecting a Self-Mixing Interferometric Laser Sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zohaib Ahmad Khan; Usman Zabit; Olivier D. Bernal; Muhammad Obaid Ullah; Thierry Bosch
Year: 2017
A Distributed FMCW Radar System Based on Fiber-Optic Links for Small Drone Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong-Hun Shin; Dae-Hwan Jung; Dong-Chan Kim; Jong-Wook Ham; Seong-Ook Park
Year: 2017
A Self-Calibration Method for Accelerometer Nonlinearity Errors in Triaxis Rotational Inertial Navigation System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pengyu Gao; Kui Li; Lei Wang; Zengjun Liu
Year: 2017
Matching Synchrosqueezing Wavelet Transform and Application to Aeroengine Vibration Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shibin Wang; Xuefeng Chen; Chaowei Tong; Zhibin Zhao
Year: 2017
Measurement of Soot Temperature and Volume Fraction of Axisymmetric Ethylene Laminar Flames Using Hyperspectral Tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huawei Liu; Shu Zheng; Huaichun Zhou
Year: 2017
Dynamic Signal Measurements Based on Quantized Data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paolo Carbone; Johan Schoukens; Antonio Moschitta
Year: 2017
Evolutionary Cost-Sensitive Discriminative Learning With Application to Vision and Olfaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lei Zhang; David Zhang
Year: 2017
Fast Thermal Characterization of Thermoelectric Modules Using Infrared Camera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Filippo Attivissimo; Attilio Di Nisio; Carlo Guarnieri Calo Carducci; Maurizio Spadavecchia
Year: 2017
An Accurate Point-Based Rigid Registration Method for Laser Tracker Relocation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:An Wan; Jing Xu; Dongjing Miao; Ken Chen
Year: 2017
A Subspace Projection-Based Joint Sparse Recovery Method for Structured Biomedical Signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Priya Ranjan Muduli; Anirban Mukherjee
Year: 2017
Research and Application of Ice Thickness and Snow Depth Automatic Monitoring System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chao Du; Qi Wang; Xu Liu; Yong Zhao; Xiao Deng; Liqin Cui
Year: 2017
A Finger Vein Image-Based Personal Identification System With Self-Adaptive Illuminance Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liukui Chen; Jing Wang; Shiyu Yang; Haibo He
Year: 2017


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