Cache Hierarchy-Aware Query Mapping on Emerging Multicore Architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ozcan Ozturk; Umut Orhan; Wei Ding; Praveen Yedlapalli; Mahmut Taylan Kandemir
Year: 2017
Fine-Grained Checkpoint Recovery for Application-Specific Instruction-Set Processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tuo Li; Muhammad Shafique; Jude Angelo Ambrose; Jorg Henkel; Sri Parameswaran
Year: 2017
Scalable Networks-on-Chip with Elastic Links Demarcated by Decentralized Routers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ryota Yasudo; Hiroki Matsutani; Michihiro Koibuchi; Hideharu Amano; Tadao Nakamura
Year: 2017
SPACE: Semi-Partitioned CachE for Energy Efficient, Hard Real-Time Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gil Kedar; Avi Mendelson; Israel Cidon
Year: 2017
Thread Progress Equalization: Dynamically Adaptive Power-Constrained Performance Optimization of Multi-Threaded Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yatish Turakhia; Guangshuo Liu; Siddharth Garg; Diana Marculescu
Year: 2017
DEP+BURST: Online DVFS Performance Prediction for Energy-Efficient Managed Language Execution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shoaib Akram; Jennifer B. Sartor; Lieven Eeckhout
Year: 2017
A Synchronization-Based Hybrid-Memory Multi-Core Architecture for Energy-Efficient Biomedical Signal Processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruben Braojos; Daniele Bortolotti; Andrea Bartolini; Giovanni Ansaloni; Luca Benini; David Atienza
Year: 2017
Network Performance Aware Optimizations on IaaS Clouds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yifan Gong; Bingsheng He; Dan Li
Year: 2017
Lightweight Side Channel Resistance: Threshold Implementations of Simon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aria Shahverdi; Mostafa Taha; Thomas Eisenbarth
Year: 2017
Exact Response Time Analysis for Fixed Priority Memory-Processor Co-Scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alessandra Melani; Marko Bertogna; Robert I. Davis; Vincenzo Bonifaci; Alberto Marchetti-Spaccamela; Giorgio Buttazzo
Year: 2017
Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND Flash-Based SSDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaeyong Jeong; Youngsun Song; Sangwook Shane Hahn; Sungjin Lee; Jihong Kim
Year: 2017
Computing Safe Contention Bounds for Multicore Resources with Round-Robin and FIFO Arbitration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gabriel Fernandez; Javier Jalle; Jaume Abella; Eduardo Quinones; Tullio Vardanega; Francisco J. Cazorla
Year: 2017
Application-Guided Power-Efficient Fault Tolerance for H.264 Context Adaptive Variable Length Coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muhammad Shafique; Semeen Rehman; Florian Kriebel; Muhammad Usman Karim Khan; Bruno Zatt; Arun Subramaniyan; Bruno Boessio Vizzotto; Jorg Henkel
Year: 2017
Refresh-Aware Write Recovery Memory Controller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaemin Jang; Wongyu Shin; Jungwhan Choi; Jinwoong Suh; Yongkee Kwon; Yongju Kim; Lee-Sup Kim
Year: 2017
Optimizing Locality-Aware Memory Management of Key-Value Caches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiameng Hu; Xiaolin Wang; Lan Zhou; Yingwei Luo; Chen Ding; Song Jiang; Zhenlin Wang
Year: 2017
Processing Concurrent Graph Analytics with Decoupled Computation Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jilong Xue; Zhi Yang; Shian Hou; Yafei Dai
Year: 2017
Improving Energy Efficiency of GPUs through Data Compression and Compressed Execution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sangpil Lee; Keunsoo Kim; Gunjae Koo; Hyeran Jeon; Murali Annavaram; Won Woo Ro
Year: 2017
Hybrid Method for Minimizing Service Delay in Edge Cloud Computing Through VM Migration and Transmission Power Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tiago Gama Rodrigues; Katsuya Suto; Hiroki Nishiyama; Nei Kato
Year: 2017
Perf&Fair: A Progress-Aware Scheduler to Enhance Performance and Fairness in SMT Multicores
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Josue Feliu; Julio Sahuquillo; Salvador Petit; Jose Duato
Year: 2017
Improving 3D DRAM Fault Tolerance Through Weak Cell Aware Error Correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hao Wang; Kai Zhao; Minjie Lv; Xuebin Zhang; Hongbin Sun; Tong Zhang
Year: 2017
CABA: Continuous Authentication Based on BioAura
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arsalan Mosenia; Susmita Sur-Kolay; Anand Raghunathan; Niraj K. Jha
Year: 2017
SENSIBle: A Highly Scalable SENsor DeSIgn for Path-Based Age Monitoring in FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zana Ghaderi; Mohammad Ebrahimi; Zainalabedin Navabi; Eli Bozorgzadeh; Nader Bagherzadeh
Year: 2017
Elliptic Curve Cryptography with Efficiently Computable Endomorphisms and Its Hardware Implementations for the Internet of Things
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhe Liu; Johann Grossschadl; Zhi Hu; Kimmo Jarvinen; Husen Wang; Ingrid Verbauwhede
Year: 2017
HotGraph: Efficient Asynchronous Processing for Real-World Graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Zhang; Xiaofei Liao; Hai Jin; Lin Gu; Guang Tan; Bing Bing Zhou
Year: 2017
Energy-Aware Adaptive Restore Schemes for MLC STT-RAM Cache
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xunchao Chen; Navid Khoshavi; Ronald F. DeMara; Jun Wang; Dan Huang; Wujie Wen; Yiran Chen
Year: 2017
Retention-Aware Hybrid Main Memory (RAHMM): Big DRAM and Little SCM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weiliang Jing; Kai Yang; Yinyin Lin; Beomseop Lee; Sangkyu Yoon; Yong Ye; Yuan Du; Bomy Chen
Year: 2017
Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gert Schley; Atefe Dalirsani; Marcus Eggenberger; Nadereh Hatami; Hans-Joachim Wunderlich; Martin Radetzki
Year: 2017
Provably Secure Key-Aggregate Cryptosystems with Broadcast Aggregate Keys for Online Data Sharing on the Cloud
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sikhar Patranabis; Yash Shrivastava; Debdeep Mukhopadhyay
Year: 2017
An Unbiased MCMC FPGA-Based Accelerator in the Land of Custom Precision Arithmetic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shuanglong Liu; Grigorios Mingas; Christos-Savvas Bouganis
Year: 2017
After the Workshop: A Case Study of Post-Workshop Implementation of Active Learning in an Electrical Engineering Course
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prateek Shekhar; Maura Borrego
Year: 2017
An Interdisciplinary Practical for Multimedia Engineering Students
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Diego Marcos-Jorquera; Maria Luisa Pertegal-Felices; Antonio Jimeno-Morenilla; Raquel Gilar-Corbi
Year: 2017
Personalizing Sample Databases With Facebook Information to Increase Intrinsic Motivation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asier Marzo; Oscar Ardaiz; Maria Teresa Sanz de Acedo; Maria Luisa Sanz de Acedo
Year: 2017
Development of Procedures to Assess Problem-Solving Competence in Computing Engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jorge Perez; Carmen Vizcarro; Javier Garcia; Aurelio Bermudez; Ruth Cobos
Year: 2017
Virtual-Instrument-Based Online Monitoring System for Hands-On Laboratory Experiment of Partial Discharges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subrata Karmakar
Year: 2017
Training Engineers for the Ambient Intelligence Challenge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fulvio Corno; Luigi De Russis
Year: 2017
An IoT and Wearable Technology Hackathon for Promoting Careers in Computer Science
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jake Rowan Byrne; Katriona O'Sullivan; Kevin Sullivan
Year: 2017
All Roads Lead to Computing: Making, Participatory Simulations, and Social Computing as Pathways to Computer Science
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Corey Brady; Kai Orton; David Weintrop; Gabriella Anton; Sebastian Rodriguez; Uri Wilensky
Year: 2017
Guest Editorial Special Issue on Maker Learning in Computer Science and Engineering Education
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mark J. W. Lee
Year: 2017
2016 IEEE Educational Activities Board Awards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Karen A. Panetta; R. Joe Stanley; Salvatore Campione; David L. Soldan; Shi Bu; David Michael Ritter; Matthew W. Ohland; Nafeesa Mazhar; Walter W. Buchanan; Scottie Austin Wilson; Tushar Sharma; Bozenna Pasik-Duncan; Moshe Kam; George A. Bekey
Year: 2017
IEEE Transactions on Education publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Reviewers 2016
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Introducing IEEE Collabratec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Education information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Open Access Publishing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Imagine a community hopeful for the future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
2016 IEEE Education Society Awards, 2016 Frontiers in Education Conference Awards, and Selected IEEE Awards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edwin C. Jones; Kathleen E. Wage; Sanjit A. Seshia; Susan M. Lord; Michael E. Auer; Lance C. Perez; Katherine Shu-Min Li; S. L. Krishna Priya; Sasha Nikolic; Francisco J. Arcega; Richard A. Layton; Matthew W. Ohland; Kayode P. Ayodele; Isaac A. Inyang; Lawrence O. Kehinde; Jana Reisslein; Amy M. Johnson; Martin Reisslein; James L. Huff; Joachim Walther; Brent Jesiek; Carla B. Zoltowski; William C. Oakes; Natasha Nesiba; Enrico Pontelli; Timothy Staley; Melany M. Ciampi; John Heywood; Diane T. Rover; Raman M. Unnikrishnan; Agnieszka Miguel
Year: 2017
A Novel Unified Model for Copper and MLGNR Interconnects Using Voltage- and Current-Mode Signaling Schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yash Agrawal; Mekala Girish Kumar; Rajeevan Chandel
Year: 2017
New Integral Formulas for the Elements of the Transient Ground Resistance Matrix of Multiconductor Lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fabio Tossani; Fabio Napolitano; Alberto Borghetti
Year: 2017
The Equivalent Th+¬venin-Network Representation of a Pulse-Excited Power-Ground Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Martin Stumpf
Year: 2017
Transient Analysis of Through-Silicon Vias in Floating Silicon Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wen-Sheng Zhao; Jie Zheng; Shichang Chen; Xiang Wang; Gaofeng Wang
Year: 2017
Lightning Surge Propagation on a Single Conductor in Free Space
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaping Du; Yuxuan Ding
Year: 2017
Design of PIFA With Metamaterials for Body-SAR Reduction in Wearable Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang Il Kwak; Dong-Uk Sim; Jong Hwa Kwon; Young Joong Yoon
Year: 2017
Remote Visualization of Screen Images Using a Pseudo-Antenna That Blends Into the Mobile Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-ichi Hayashi; Naofumi Homma; Yohei Toriumi; Kazuhiro Takaya; Takafumi Aoki
Year: 2017
Electromagnetic Susceptibility of Semiconductor Junction Igniter With Different Doping Density
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Wang; Bin Zhou; Zheng-guang Qiao; Hou-he Chen
Year: 2017
Altitude Correction of Radio Interference of HVDC Transmission Lines Part I: Converting Method of Measured Data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Xie; Luxing Zhao; Jiayu Lu; Xiang Cui; Yong Ju
Year: 2017
Eigenmode Prediction of High RF Exposure Frequency Region Inside Vehicles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David Garrido Lopez; Maxim Ignatenko; Dejan S. Filipovic
Year: 2017
Analysis of Multiconductor Transmission Lines Using the CN-FDTD Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Babak Honarbakhsh; Shahrooz Asadi
Year: 2017
Supplements to GÇ£Theoretical and Experimental Study of Effective Coupling Length for Transmission Lines Illuminated by HEMPGÇ¥
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haiyan Xie; Yong Li; Hailiang Qiao; Jianguo Wang
Year: 2017
Altitude Correction of Radio Interference of HVdc Transmission Lines Part II: Measured Data Analysis and Altitude Correction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luxing Zhao; Xiang Cui; Li Xie; Jiayu Lu; Kun He; Yong Ju
Year: 2017
Modeling the Attachment of Lightning Dart and Dart-Stepped Leaders to Grounded Objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mengni Long; Marley Becerra; Rajeev Thottappillil
Year: 2017
Crosstalk-Sensitive Loops and Reconstruction Algorithms to Eavesdrop Digital Signals Transmitted Along Differential Interconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Keliang Yuan; Flavia Grassi; Giordano Spadacini; Sergio A. Pignari
Year: 2017
Comment on GÇ£Formula for the Shielding Effectiveness of a Rectangular Cavity with a Penetrating CableGÇ¥
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:John R. Solin
Year: 2017
A Modular Test-Suite for the Validation and Verification of Electromagnetic Solvers in Electromagnetic Compatibility Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ian D. Flintoft; John F. Dawson; Linda Dawson; Andrew C. Marvin; Jesus Alvarez; Salvador G. Garcia
Year: 2017
Numerical Shielding Analysis of Anisotropic Multilayer Materials by the Method of Moments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fabian Happ; Arne Schroder; Gazmend Mavraj; Heinz-Dietrich Bruns; Frank Gronwald
Year: 2017
Electrical-Thermal Co-Simulation for Analysis of High-Power RF/Microwave Components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tianjian Lu; Jian-Ming Jin
Year: 2017
Characterizing the 2.4 GHz Spectrum in a Hospital Environment: Modeling and Applicability to Coexistence Testing of Medical Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohamad Omar Al Kalaa; Walid Balid; Hazem H. Refai; Nickolas J. LaSorte; Seth J. Seidman; Howard I. Bassen; Jeffrey L. Silberberg; Donald Witters
Year: 2017
Extension of the Rusck Model for Calculating Lightning-Induced Voltages on Overhead Lines Considering the Soil Electrical Parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alexandre Piantini
Year: 2017
Transient Analysis of Dispersive Power-Ground Plate Pairs With Arbitrarily Shaped Antipads by the DGTD Method With Wave Port Excitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ping Li; Li Jun Jiang; Hakan Bagci
Year: 2017
A Method for Finding Frequency-Modulated and Amplitude-Modulated Electromagnetic Emanations in Computer Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milos Prvulovic; Alenka Zajic; Robert L. Callan; Christopher J. Wang
Year: 2017
Evaluation of Power System Lightning Performance, Part I: Model and Numerical Solution Using the PSCAD-EMTDC Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Massimo Brignone; Federico Delfino; Renato Procopio; Mansueto Rossi; Farhad Rachidi
Year: 2017
Shielding Effectiveness and Sheet Conductance of Nonwoven Carbon-Fiber Sheets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:John F. Dawson; Andrew N. Austin; Ian D. Flintoft; Andrew C. Marvin
Year: 2017
The Influence of Microwave Pulse Width on the Thermal Burnout Effect of an LNA Constructed by the SiGe HBT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lun Hou; Zhengwei Du; Jun Fu
Year: 2017
Uncertainty Quantification of Crosstalk Using Stochastic Reduced Order Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhouxiang Fei; Yi Huang; Jiafeng Zhou; Qian Xu
Year: 2017
Evaluation of Power System Lightning PerformanceGÇöPart II: Application to an Overhead Distribution Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Massimo Brignone; Federico Delfino; Renato Procopio; Mansueto Rossi; Farhad Rachidi
Year: 2017
Effect of Electromagnetic Interference on Human Body Communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jung-Hwan Hwang; Tae-Wook Kang; Jong-Hwa Kwon; Seong-Ook Park
Year: 2017
A Novel Coplanar Common-Mode Filter With a Wide Stopband
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian-Bo Zhang; Xing-Chang Wei; Yu-Fei Shu; Xue-Quan Yu; Yi-Li Xu
Year: 2017
Efficient Evaluation of Earth Return Impedances of Arbitrary Conductor Arrangements With a Horizontally Multilayered Soil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaebok Lee; Boyuan Zhang; Jun Zou; Mun-no Ju
Year: 2017
HF Spectral Occupancy Time Series Models Over the Eastern Mediterranean Region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Md G. Mostafa; Eleni Tsolaki; Haris Haralambous
Year: 2017
Prediction of Topside Electromagnetic Compatibility in Concept-Phase Ship Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ajmal Gharib; Hugh D. Griffiths; David J. Andrews
Year: 2017
Comparison of Three-Dimensional Datasets by Using the Generalized n-Dimensional ( n-D) Feature Selective Validation (FSV) Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gang Zhang; Antonio Orlandi; Alistair P. Duffy; Lixin Wang
Year: 2017
Statistical Anisotropy in Imperfect Electromagnetic Reverberation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luk R. Arnaut; Ramiro Serra; Philip D. West
Year: 2017
Application of Different Methods to Quantify Uncertainty in Specific Absorption Rate Calculation Using a CAD-Based Mobile Phone Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xi Cheng; Vikass Monebhurrun
Year: 2017
A Technique for Calculating Voltages Induced on Twisted-Wire Pairs Using the FDTD Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akiyoshi Tatematsu; Farhad Rachidi; Marcos Rubinstein
Year: 2017
IEEE Transactions on Electromagnetic Compatibility publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Access
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Advances in modeling, measurement and design of discontinuities and their emc and si/pi effects on wired communication links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Wireless EMC and Wireless EMC/OTA Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Modeling and Optimization of Multiground TSVs for Signals Shield in 3-D ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chenbing Qu; Ruixue Ding; Xiaoxian Liu; Zhangming Zhu
Year: 2017
Accurate Evaluation of Field Interactions Between Cable Harness and Vehicle Body by a Multiple Scattering Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dazhao Liu; Yansheng Wang; Richard W. Kautz; Nevin Altunyurt; Sandeep Chandra; Jun Fan
Year: 2017
Novel Hybrid Analytical/Numerical Conducted EMI Model of a Flyback Converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weichang Cheng; Zhi Huang; Shen Xu; Weifeng Sun
Year: 2017
KronGÇôBranin Modeling of Y-Y-Tree Interconnects for the PCB Signal Integrity Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blaise Ravelo; Olivier Maurice
Year: 2017
Low-Frequency Theoretical Analysis of a Source-Stirred Reverberation Chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alfredo De Leo; Valter Mariani Primiani; Paola Russo; Graziano Cerri
Year: 2017
An Adaptive Chebyshev Approach for Fast Computation of Grounding System Admittance Matrix
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Valiollah Mashayekhi; Seyed Hossein Hesamedin Sadeghi; Rouzbeh Moini; Keyhan Sheshyekani
Year: 2017
Frequency-Response-Oriented Design and Optimization of N+ Diffusion Guard Ring in Lightly Doped CMOS Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Le Zhang; Er-Ping Li; Xiao-Peng Yu
Year: 2017
Extrapolation of a Truncated Spectrum With Hilbert Transform for Obtaining Causal Impulse Responses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Juan Becerra; Felix Vega; Farhad Rachidi
Year: 2017
Stable Simulation of Multiport Passive Distributed Networks Using Time Marching Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Juan Becerra; Felix Vega; Akiyoshi Tatematsu; Farhad Rachidi
Year: 2017
Shielding Effectiveness Estimation of a Metallic Enclosure With an Aperture Using S-Parameter Analysis: Analytic Validation and Experiment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ali Shourvarzi; Mojtaba Joodaki
Year: 2017
Equivalent Circuit Model of Soft Shield Defects in Coaxial Cables Using Numerical Modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anthony Manet; Abelin Kameni; Florent Loete; Jerome Genoulaz; Lionel Pichon; Odile Picon
Year: 2017
A Modified Enhanced Transmission Line Theory Applied to Multiconductor Transmission Lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sofiane Chabane; Philippe Besnier; Marco Klingler
Year: 2017
Identification Method of EMI Sources Based on Measured Single-Channel Signal and its Application in Aviation Secondary Power Source Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chunyan Xiao; Tingting Zhao
Year: 2017
Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongil Shin; Namsu Kim; Jongjoo Lee; Youngwoo Park; Jingook Kim
Year: 2017
A Software-Based Calibration Technique for Characterizing the Magnetic Signature of EUTs in Measuring Facilities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sarantis-Dimitrios J. Kakarakis; Sotirios T. Spantideas; Nicolas C. Kapsalis; Christos N. Capsalis; Axel Junge
Year: 2017
Evaluation of Different Approximations for Correlation Coefficients in Stochastic FDTD to Estimate SAR Variance in a Human Head Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Khadijeh Masumnia-Bisheh; Mohsen Ghaffari-Miab; Bijan Zakeri
Year: 2017
RF Heating Study of a New Medical Implant Lead for 1.5 T, 3 T, and 7 T MRI Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rupam Das; Hyoungsuk Yoo
Year: 2017
Shielding Effectiveness of a Spacecraft Faraday Cage With Pin 1 Connections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:John Richard Solin
Year: 2017
Use of a Reference Point Method to Calibrate the Field Uniformity When Testing With Transient Electromagnetic Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lijun Yao; Tao Shen; Ning Kang; Jianling Huang; Dong Liu; Feng Zhang; Hongliang Sun
Year: 2017
A Proposal to Improve the Standard on the Shielding Effectiveness Measurements of Materials and Gaskets in a Reverberation Chamber
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angelo Gifuni
Year: 2017
Far-Field Scattering From an Electrically Small Circular Aperture in a Conducting Screen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marios A. Christou; Anastasis C. Polycarpou
Year: 2017
Digital Wave Simulation of Quasi-Static Partial Element Equivalent Circuit Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luigi Lombardi; Piero Belforte; Giulio Antonini
Year: 2017
Modeling of Contact Bounce in a Transient Electromagnetic Compatibility Test for the Analysis and Optimization of Nonlinear Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niels Lambrecht; Hugo Pues; Daniel De Zutter; Dries Vande Ginste
Year: 2017
Karoo Array Telescope Berm Shielding: Efficient Computational Modeling and Multicopter Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hardie Pienaar; Howard C. Reader; David Bruce Davidson
Year: 2017
Efficient Analytical Prediction of the EMI Bandgap Limits of PEC-PMC Metallic Enclosures Hosting RF and Digital Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hilmi M. Nisanci; Francesco de Paulis; Antonio Orlandi
Year: 2017
Energy Localization Effects Within a Reverberation Chamber and Their Reduction in Chaotic Geometries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kamardine Selemani; Elodie Richalot; Olivier Legrand; Odile Picon; Fabrice Mortessagne
Year: 2017
Statistical Prediction and Quantification of Radiated Susceptibility for Electronic Systems PCB in Electromagnetic Polluted Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Milad Mehri; Nasser Masoumi
Year: 2017
An Innovative Virtual Chamber Measurement Method Based on Spatial Domain Cancellation Technique for Radiation Emission In Situ Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong-Hao Lu; Liang Ding; Xiao-Hong Lin; Ming-Tuan Lin
Year: 2017
Trench Structure to Suppress Magnetic Field Leakage From an Aperture in a Metallic Enclosure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shin-ichiro Matsuzawa; Junya Muramatsu; Toshiaki Watanabe; Yoshiyuki Hattori
Year: 2017
Editorial From the Editor-in-Chief
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Antonio Orlandi
Year: 2017
IEEE Transactions on Electromagnetic Compatibility publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Advances in Modeling, Measurement and Design of Discontinuities and Their EMC and SI/PI Effects on Wired Communication Links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Wireless EMC and Wireless EMC/OTA Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Near-Field Shielding Performances of EMI Noise Suppression Absorbers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stefano Piersanti; Francesco de Paulis; Antonio Orlandi; Sam Connor; Qian Liu; Bruce Archambeault; Paul Dixon; Mohammad Khorrami; James L. Drewniak
Year: 2017
Analysis of Near-Field Emissions From Common-Mode Filters Based on EBG Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carlo Olivieri; Francesco de Paulis; Antonio Orlandi; Sam Connor; Bruce Archambeault; Paul Dixon; Mohammad Khorrami
Year: 2017
An Accurate Electromagnetic Model of a Circular Aperture With Analytical Solution for On-Axis Near Field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vladimir Chtcherbakov
Year: 2017
Modeling and Optimization of Substrate Electromagnetic Coupling and Isolation in Modern Lightly Doped CMOS Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Le Zhang; Er-Ping Li; Xiao-Peng Yu; Ran Hao
Year: 2017
Automated Line-Based Sequential Sampling and Modeling Algorithm for EMC Near-Field Scanning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Prashant Singh; Tim Claeys; Guy A. E. Vandenbosch; Davy Pissoort
Year: 2017
Computational Dosimetry of the Human Head Exposed to Near-Field Microwaves Using Measured Blood Flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ilkka Laakso; Ryota Morimoto; Akimasa Hirata; Teruo Onishi
Year: 2017
Assessment of Integrated Circuits Emissions With an Equivalent Dipole-Moment Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gyu-Yeong Cho; Jungho Jin; Hark-Byeong Park; Hyun Ho Park; Chulsoon Hwang
Year: 2017
A Novel IC-Stripline Design for Near-Field Shielding Measurement of On-Board Metallic Cans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiseong Kim; Hyun Ho Park
Year: 2017
Near-Field Edge Extrapolation Using Auxiliary Dipoles to Improve Probe Compensation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tim Claeys; Vladimir Volski; Guy A. E. Vandenbosch; Davy Pissoort
Year: 2017
Improved Hybrid Leapfrog ADI-FDTD Method for Simulating Near-Field Coupling Effects Among Multiple Thin Wire Monopole Antennas on a Complex Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhuo-Xian Liang; Hao Xie; Yang Guo; Jian Wang; Er-Ping Li; Zhenguo Zhao; Haijing Zhou; Hongsheng Chen; Wen-Yan Yin
Year: 2017
Derivation of Coupling Factors for Different Wireless Power Transfer Systems: Inter- and Intralaboratory Comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kanako Wake; Ilkka Laakso; Akimasa Hirata; Jerdvisanop Chakarothai; Teruo Onishi; Soichi Watanabe; Valerio De Santis; Mauro Feliziani; Masao Taki
Year: 2017
Determining Equivalent Dipoles Using a Hybrid Source-Reconstruction Method for Characterizing Emissions From Integrated Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ji Zhang; David Pommerenke; Jun Fan
Year: 2017
A Resonant Reactive Shielding for Planar Wireless Power Transfer System in Smartphone Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaehyoung Park; Dongwook Kim; Karam Hwang; Hyun Ho Park; Sang Il Kwak; Jong Hwa Kwon; Seungyoung Ahn
Year: 2017
Near-Field Radiation Calculation of Irregular Wiring Twisted-Wire Pairs Based on Mode Decomposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junjun Wang; Xinwei Song; Donglin Su; Bing Li
Year: 2017
Source Reconstruction for IC Radiated Emissions Based on Magnitude-Only Near-Field Scanning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ji Zhang; Jun Fan
Year: 2017
An Efficient Method for Modeling the Magnetic Field Emissions of Power Electronic Equipment From Magnetic Near Field Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fethi Benyoubi; Lionel Pichon; Mohamed Bensetti; Yann Le Bihan; Mouloud Feliachi
Year: 2017
Near-Field Reduction in a Wireless Power Transfer System Using LCC Compensation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tommaso Campi; Silvano Cruciani; Francesca Maradei; Mauro Feliziani
Year: 2017
SAR Variation Due to Exposure From a Smartphone Held at Various Positions Near the Torso
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ryota Takei; Tomoaki Nagaoka; Kazuyuki Saito; Soichi Watanabe; Masaharu Takahashi
Year: 2017
Sparse Emission Source Microscopy for Rapid Emission Source Imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ling Zhang; Victor V. Khilkevich; Xiangyang Jiao; Xiao Li; Sukhjinder Toor; Alpesh U. Bhobe; Kyoungchoul Koo; David Pommerenke; James L. Drewniak
Year: 2017
A Low-Profile Broadband Bandpass Frequency Selective Surface With Two Rapid Band Edges for 5G Near-Field Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da Li; Tian-Wu Li; Ran Hao; Hong-Sheng Chen; Wen-Yan Yin; Hui-Chun Yu; Er-Ping Li
Year: 2017
Overview on the Evolution of Near Magnetic Field Coupling Prediction Using Equivalent Multipole Spherical Harmonic Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnaud Breard; Olivier N. Chadebec; Laurent F. Krahenbuhl; Carlos A. F. Sartori; Christian Vollaire; Olivier Fabregue; Zhao Li; Rafael P. B. Muylaert; Francois Tavernier; Damien Voyer
Year: 2017
Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Christopher L. Holloway; Matthew T. Simons; Joshua A. Gordon; Perry F. Wilson; Caitlyn M. Cooke; David A. Anderson; Georg Raithel
Year: 2017
Near-Field Radiated From Carbon Nanotube and Graphene-Based Nanointerconnects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alessandro Giuseppe D'Aloia; Wen-Sheng Zhao; Gaofeng Wang; Wen-Yan Yin
Year: 2017
Characterization of Near-Field Coupling Effects From Complicated Three-Dimensional Structures in Rectangular Cavities Using Fast Integral Equation Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kai Yang; Cheng Ning; Wen-Yan Yin
Year: 2017
Advances in Modeling, Measurement and Design of Discontinuities and Their EMC and SI/PI Effects on Wired Communication Links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Wireless EMC and Wireless EMC/OTA Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Special Issue on EMC in the Near-Field: Theory, Measurements, and Applications Foreword
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marcello D'Amore; Perry F. Wilson; Er-Ping Li; Wen-Yan Yin
Year: 2017
Validity Evaluation of the Uncertain EMC Simulation Results
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jinjun Bai; Lixin Wang; Di Wang; Alistair P. Duffy; Gang Zhang
Year: 2017
Folded Feedthrough Multilayer Ceramic Capacitor EMI Filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao-Chuan Wang; Yang-Yang Sun; Jian-Hua Zhu; Yi-Hui Lou; Wen-Zhong Lu
Year: 2017
An Inversion Method for Evaluating Lightning Current Waveform Based on Time Series Neural Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gun Yang; Kunjin Chen; Zhanqing Yu; Yijun Zhang; Fangrong Zhou; Jinliang He
Year: 2017
Calculation of Lightning Induced Voltages on Overhead Lines Using an Analytical Fitting Representation of Electric Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Guo; Yan-zhao Xie; Ai-ci Qiu
Year: 2017
Evaluation of the Diffusion Equation for Modeling Reverberant Electromagnetic Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ian D. Flintoft; Andy C. Marvin; Foo Inn Funn; Linda Dawson; Xiaotian Zhang; Martin P. Robinson; John F. Dawson
Year: 2017
Singularity Problem With the One-sheet Huygens Subgridding Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayder Al-Tameemi; Jean-Pierre Berenger; Fumie Costen
Year: 2017
Coupling Analysis for Wires in a Cable Tray Using Circuit Extraction Based on Mixed-Potential Integral Equation Formulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dan Zhang; Yinghong Wen; Yansheng Wang; Dong Liu; Xiaodong He; Jun Fan
Year: 2017
A Novel Design of Implantable Esophageal Stent to Reduce the MRI RF-Induced Heating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dawei Li; Xiaohe Ji; Jianfeng Zheng; Changwang Pan; Ji Chen; Wolfgang Kainz
Year: 2017
Whole-Body Specific Absorption Rate Assessment of Lossy Objects Exposed to a Diffuse Field Inside a Reverberant Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Damir Senic; Antonio Sarolic; Christopher L. Holloway; John M. Ladbury
Year: 2017
Investigation on Failure Mechanisms of GaN HEMT Caused by High-Power Microwave (HPM) Pulses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang Zhou; Zheng Wei San; Yu-Jie Hua; Liang Lin; Shuo Zhang; Zheng Guo Zhao; Hai Jing Zhou; Wen-Yan Yin
Year: 2017
Ground Admittance of an Underground Insulated Conductor and its Characteristic in Lightning Induced Disturbance Problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Boyuan Zhang; Jun Zou; Xuelong Du; Jaebok Lee; Mun-No Ju
Year: 2017
A Probabilistic Approach for the Susceptibility Assessment of Twisted-Wire Pairs Excited by Random Plane-Wave Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:George P. Veropoulos; Panagiotis J. Papakanellos
Year: 2017
Time-Domain Shielding Effectiveness of Enclosures Against a Plane Wave Excitation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luis Gines Garcia-Perez; Antonio Jose Lozano-Guerrero; Juan Manuel Blazquez-Ruiz; Juan F. Valenzuela-Valdes; Juan Monzo-Cabrera; Jose Fayos-Fernandez; Alejandro Diaz-Morcillo
Year: 2017
On-Site Radiated Emissions Measurements in Semireverberant Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robert Vogt-Ardatjew; Urban Lundgren; Sergio Fernandez Romero; Frank Leferink
Year: 2017
Effects of Different Combination Wave Generator Design on Surge Protective Devices Characteristics in Cascade Protection Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vladan Radulovic; Sasa Mujovic; Zoran Miljanic
Year: 2017
An Efficient Crosstalk-Included Eye-Diagram Estimation Method for High-Speed Interposer Channel on 2.5-D and 3-D IC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sumin Choi; Heegon Kim; Daniel H. Jung; Jonghoon Jay Kim; Jaemin Lim; Joungho Kim
Year: 2017
A Planar Low-Profile Meander Antenna (PLMA) Design for Wireless Terminal Achieving Between Intrasystem EMC and Isolation in Multiantenna Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ye-Hai Bi; Yihong Qi; Jun Fan; Wei Yu
Year: 2017
Efficient Reciprocity-Based Hybrid Approach for Analyzing Radiated Susceptibility Responses of Multilayer PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xuelian Li; Zhengwei Du; Maokun Li
Year: 2017
Design of Single-Turn Spiral Inductors With Embedding A Strong-Coupling LC Resonator for Interference Suppression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng-Fan Yang; Tzuen-Hsi Huang
Year: 2017
Frequency-Domain Analysis of Sectionalized Shield Wires on PLC Transmission Over High-Voltage Lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rodolfo Araneo; Jose Antonio Marinho Brandao Faria; Salvatore Celozzi
Year: 2017
Thru-Reflect-Line Calibration Technique: Error Analysis for Characteristic Impedance Variations in the Line Standards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lingyun Ye; Caixia Li; Xinglin Sun; Shuai Jin; Bichen Chen; Xiaoning Ye; Jun Fan
Year: 2017
Mitigation Techniques to Reduce the Vulnerability of Railway Signaling to Radiated Intentional EMI Emitted From a Train
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marc Heddebaut; Virginie Deniau; Jean Rioult; Christophe Gransart
Year: 2017
Glass Interposer Electromagnetic Bandgap Structure for Efficient Suppression of Power/Ground Noise Coupling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Youngwoo Kim; Jonghyun Cho; Jonghoon J. Kim; Kyungjun Cho; Subin Kim; Srikrishna Sitaraman; Venky Sundaram; Pulugurtha Markondeya Raj; Rao R. Tummala; Joungho Kim
Year: 2017
Modeling of Transients on IC Supply Rails Caused by ESD During Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thomas Ungru; Wolfgang Wilkening; Renato Negra
Year: 2017
Common- and Differential-Mode Conversion Induced by Asymmetry and Dielectric Coating in a Transmission Line System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bing Li; Donglin Su; Junjun Wang; Xinwei Song
Year: 2017
Time-Domain Analysis of Frequency-Dependent Electrical Parameters of Soil
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rafael Alipio; Silverio Visacro
Year: 2017
Virtual Bulk Current Injection: Modeling EUT for Several Setups and Quantification of CM-to-DM Conversion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hassan Cheaito; Mor-Sokhna Diop; Marwan Ali; Edith Clavel; Christian Vollaire; Leonce Mutel
Year: 2017
Orientation Effect of Field-to-Line Coupling in a TEM Cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenxiao Fang; Yunfei En; Yun Huang; Yuan Liu; Yiqiang Chen; Ping Lai; Haimi Qiu; Chunlei Shi
Year: 2017
From the Editor-in-Chief
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. ORLANDI
Year: 2017
Corrections to “An Efficient Analysis of Power/Ground Planes With Inhomogeneous Substrates Using the Contour Integral Method” [Aug 14 980-989]
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jan Birger Preibisch; Xiaomin Duan; Christian Schuster
Year: 2017
IEEE Transactions on Electromagnetic Compatibility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Advances in Modeling, Measurement and Design of Discontinuities and Their EMC and SI/PI Effects on Wired Communication Links
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Imagine a community hopeful for the future
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Wireless EMC and Wireless EMC/OTA Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Bayesian Inference in Action in EMC—Fundamentals and Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Carlo F. M. Carobbi
Year: 2017
Parallel Plate Mode Suppression in Low-Frequency Microwave Circuit Packages Using Lid of 3-D Cross by a 3-D Printing Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongrong Shi; Ming Zhou; Junzhi Zhang
Year: 2017
Signal Integrity Design and Analysis of a Multilayer Test Interposer for LPDDR4 Memory Test With Silicone Rubber-Based Sheet Contact
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonghoon J. Kim; Heegon Kim; Daniel H. Jung; Sumin Choi; Jaemin Lim; Youngwoo Kim; Junyong Park; Hyesoo Kim; Dongho Ha; Michael Bae; Joungho Kim
Year: 2017
Optimization of IC-Stripline Performance by Response Surface Space-Mapping Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tvrtko Mandic; Renaud Gillon; Adrijan Baric
Year: 2017
A Terminal Capacitance Method for Analyzing Global Capacitive Effects of Magnetic Components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Liu; Lei Qi; Xiang Cui; Xiaoguang Wei
Year: 2017
Transient Heterogeneous Electromagnetic Simulation With DGTD and Behavioral Macromodel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huan Huan Zhang; Li Jun Jiang; He Ming Yao; Yu Zhang
Year: 2017
Metamaterial Structure Integrated With a Dielectric Absorber for Wideband Reduction of Antennas Radar Cross Section
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Himangshu Bhusan Baskey; Esha Johari; Mohammad Jaleel Akhtar
Year: 2017
Adaptive Multipoint Model Order Reduction Scheme for Large-Scale Inductive PEEC Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Trung-Son Nguyen; Tung Le Duc; Thanh-Son Tran; Jean-Michel Guichon; Olivier Chadebec; Gerard Meunier
Year: 2017
On the Bandwidth of a Microparticle-Based Component Responsive to Magnetostatic Fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jacob M. Parrow; Adnan Iftikhar; Sajid M. Asif; Jeffery W. Allen; Monica S. Allen; Brett R. Wenner; Benjamin D. Braaten
Year: 2017
Investigation of the Effects of Receptors on the Lightning Strike Protection of Wind Turbine Blades
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeqing Wang; Weifei Hu
Year: 2017
Helical Stirring for Enhanced Low-Frequency Performance of Reverberation Chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luk R. Arnaut; Franco Moglie; Luca Bastianelli; Valter Mariani Primiani
Year: 2017
System-Level Electric Field Exposure Assessment by the Fault Tree Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lijun Jin; Chenyi Peng; Tao Jiang
Year: 2017
CMOS-Based Chaotic PWM Generator for EMI Reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Ge Li; Si Di Gong; Jian Wei Liu; Dong Lin Su
Year: 2017
A New Method for Fast Evaluation of the Cooray–Rubinstein Formula in Time Domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Liu; Jiawei Yang; Litong Wang; Guishu Liang
Year: 2017
Using the ADI-FDTD Method to Simulate Graphene-Based FSS at Terahertz Frequency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Juan Chen; Guocheng Hao; Qing-Huo Liu
Year: 2017
Compact Parameterized Black-Box Modeling via Fourier-Rational Approximations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stefano Grivet-Talocia; Elisa Fevola
Year: 2017
Lightning Indirect Effects on Helicopter: Numerical Simulation and Experiment Validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liyang Huang; Cheng Gao; Fei Guo; Chenming Sun
Year: 2017
SIVA UAV: A Case Study for the EMC Analysis of Composite Air Vehicles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miguel R. Cabello; Sergio Fernandez; Marc Pous; Enrique Pascual-Gil; Luis D. Angulo; Patricia Lopez; Pere J. Riu; Guadalupe G. Gutierrez; Daniel Mateos; David Poyatos; Mireya Fernandez; Jesus Alvarez; Mario F. Pantoja; Manuel Anon; Ferran Silva; Amelia R. Bretones; Rafael Trallero; Luis Nuno; David Escot; Rafael G. Martin; Salvador G. Garcia
Year: 2017
Adjustment of Shielding Effectiveness, Optical Transmission, and Sheet Resistance of Conducting Films Deposited on Glass Substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yonathan Corredores; Philippe Besnier; Xavier Castel; Jerome Sol; Cyril Dupeyrat; Patrice Foutrel
Year: 2017
Broadband Equivalent-Circuit Model for Uniform Multiconductor Transmission Lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andreas Mantzke; Sebastian Sudekum; Marco Leone
Year: 2017
Automatic EMI Filter Design Through Particle Swarm Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Federico Viani; Fabrizio Robol; Marco Salucci; Renzo Azaro
Year: 2017
Modeling and Analysis of Conducted and Radiated Emissions Due to Common Mode Current of a Buck Converter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohammed Laour; Redouane Tahmi; Christian Vollaire
Year: 2017
Reconfigurable Passive Intermodulation Behavior on Nickel-Coated Cell Array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiong Chen; Yongning He
Year: 2017
Electromagnetic Compatibility (EMC) Antenna Gain and Factor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Valentino Trainotti
Year: 2017
A Hybrid Method Combining the Novel TD-SC Technique and FDTD Method for the EMI Analysis of Transmission Line Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhihong Ye; Cheng Liao; Xiangzheng Xiong; Min Zhang
Year: 2017
Notice of Retraction: Electric Dipole Equations in Very Near Field Conditions for Electromagnetic Shielding Assessment. Part I: Radiation Equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stefano Piersanti; Francesco de Paulis; Antonio Orlandi; Sam Connor; Bruce Archambeault; Paul Dixon; Mohammad Khorrami; James L. Drewniak
Year: 2017
Notice of Retraction: Electric Dipole Equations in Very-Near-Field Conditions for Electromagnetic Shielding Assessment—Part II: Wave Impedance, Reflection, and Transmission
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stefano Piersanti; Francesco de Paulis; Antonio Orlandi; Sam Connor; Bruce Archambeault; Paul Dixon; Mohammad Ali Khorrami; James L. Drewniak
Year: 2017
A Radio Frequency Radiation Exposure System for Rodents Based on Reverberation Chambers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myles H. Capstick; Sven Kuehn; Veronica Berdinas-Torres; Yijian Gong; Perry F. Wilson; John M. Ladbury; Galen Koepke; David L. McCormick; James Gauger; Ronald L. Melnick; Niels Kuster
Year: 2017
Partial Inductance of Conductor Segments With Coulomb Gauge in Quasi-Static Field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chouwei Ni; Zhibin Zhao; Xiang Cui
Year: 2017
Development of One-Dimensional Norm Detector for Nanosecond-Level Transient Electric Field Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Kong; Yan-Zhao Xie; Qi Li; Shao-Yin He; Yin-Bin Jin
Year: 2017
IEEE Transactions on Electromagnetic Compatibility publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Nature-Inspired Algorithms for EMC and Signal & Power Integrity Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Algorithm for Extracting Parameters of the Coupling Capacitance Hysteresis Cycle for TSV Transient Modeling and Robustness Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stefano Piersanti; Enza Pellegrino; Francesco de Paulis; Antonio Orlandi; Daniel H. Jung; Dong-Hyun Kim; Joungho Kim; Jun Fan
Year: 2017
SNEM: Full S-Parameter Synthesis From Near-End Measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunhui Chu; Kai Xiao; Yu Ho; Robert Friar; Gong Ouyang; Beomtaek Lee; Zhichao Zhang; Xiaoning Ye; Charles Phares; Justin Tabatchnick; Akshith Vasanth; Guneet Kaur
Year: 2017
Electromagnetic Shielding Analysis of Spherical Polyhedral Structures Generated by Conducting Wires and Metallic Surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ali Aghabarati; Rouzbeh Moini; Simon Fortin; Farid P. Dawalibi
Year: 2017
Inductance Extraction for PCB Prelayout Power Integrity Using PMSR Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying S. Cao; Tamar Makharashvili; Jonghyun Cho; Siqi Bai; Samuel Connor; Bruce Archambeault; Lijun Jiang; Albert E. Ruehli; Jun Fan; James L. Drewniak
Year: 2017
Fast Method for an Accurate and Efficient Nonlinear Signaling Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dan Jiao; Jianfang Olena Zhu
Year: 2017
Improved “Root-Omega” Method for Transmission-Line-Based Material Property Extraction for Multilayer PCBs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shuai Jin; Bichen Chen; Xiang Fang; Han Gao; Xiaoning Ye; Jun Fan
Year: 2017
A High-PSR EMI-Resistant NMOS-Only Voltage Reference Using Zero- $V_T$ Active Loads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:David Cordova; Pedro Toledo; Hamilton Klimach; Sergio Bampi; Eric Fabris
Year: 2017
Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niklas Briest; David Hamann; Heyno Garbe; Stefan Potthast
Year: 2017
Variability Analysis of Crosstalk Among Differential Vias Using Polynomial-Chaos and Response Surface Methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yansheng Wang; Shuai Jin; Srinath Penugonda; Ji Chen; Jun Fan
Year: 2017
Fuzzy-Based Risk Analysis for IT-Systems and Their Infrastructure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tim Peikert; Heyno Garbe; Stefan Potthast
Year: 2017
Are Standardized Lightning Current Waveforms Suitable for Aircraft and Wind Turbine Blades Made of Composite Materials?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alexander Smorgonskiy; Farhad Rachidi; Marcos Rubinstein; Nikolay V. Korovkin; Anastasios P. Vassilopoulos
Year: 2017
IEEE Transactions on Electromagnetic Compatibility publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Advanced Measurements and Diagnostic Techniques for EMC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electromagnetic Compatibility institutional listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Together, we are advancing technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Introduction to the 2016 IEEE EMC Symposium Special Issue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Syed Bokhari; Xiaoning Ye
Year: 2017
A Charge-Plasma-Based Dielectric-Modulated Junctionless TFET for Biosensor Label-Free Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Deepika Singh; Sunil Pandey; Kaushal Nigam; Dheeraj Sharma; Dharmendra Singh Yadav; Pravin Kondekar
Year: 2017
Sub-lithographic Patterning via Tilted Ion Implantation for Scaling Beyond the 7-nm Technology Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng Zheng; Sang Wan Kim; Daniel Connelly; Kimihiko Kato; Fei Ding; Leonard Rubin; Tsu-Jae King Liu
Year: 2017
Electrolyte-Gated FETs Based on Oxide Semiconductors: Fabrication and Modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gabriel Cadilha Marques; Suresh Kumar Garlapati; Debaditya Chatterjee; Simone Dehm; Subho Dasgupta; Jasmin Aghassi; Mehdi B. Tahoori
Year: 2017
The Charge Plasma n-p-n Impact Ionization MOS on FDSOI Technology: Proposal and Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avinash Lahgere; Mamidala Jagadesh Kumar
Year: 2017
RF Passive Components Based on Aluminum Nitride Cross-Sectional Lamé-Mode MEMS Resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cristian Cassella; Guofeng Chen; Zhenyun Qian; Gwendolyn Hummel; Matteo Rinaldi
Year: 2017
Consideration of the Effect of Barrier Height on the Variation of Specific Contact Resistance With Temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiep N. Tran; Tuan A. Bui; Aaron M. Collins; Anthony S. Holland
Year: 2017
Influence of the Heterojunction Spacer on the Performance of AlGaN/GaN/AlGaN Resonant Tunneling Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Gao; Yao Ma; Yang Liu; Min Gong
Year: 2017
Impedance Spectroscopic Analysis of the InSe/ZnSe/InSe Interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sabah E. Al Garni; Atef F. Qasrawi
Year: 2017
Field-Related Failure of GaN-on-Si HEMTs: Dependence on Device Geometry and Passivation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Rossetto; M. Meneghini; S. Pandey; M. Gajda; G. A. M. Hurkx; J. A. Croon; J. Sonsky; G. Meneghesso; E. Zanoni
Year: 2017
An Improved Ku-band MILO With Tapered Choke Cavity and Enlarged First Interaction Cavity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao Jiang; Juntao He; Jiande Zhang; Zhiqiang Li; Junpu Ling
Year: 2017
Scalable GaSb/InAs Tunnel FETs With Nonuniform Body Thickness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Z. Huang; Pengyu Long; Michael Povolotskyi; Gerhard Klimeck; Mark J. W. Rodwell
Year: 2017
Comparison of SOI Versus Bulk FinFET Technologies for 6T-SRAM Voltage Scaling at the 7-/8-nm Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xi Zhang; Daniel Connelly; Hideki Takeuchi; Marek Hytha; Robert J. Mears; Tsu-Jae King Liu
Year: 2017
Small-Area Si Photovoltaics for Low-Flux Infrared Energy Harvesting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eunseong Moon; David Blaauw; Jamie D. Phillips
Year: 2017
Enhancement of $f_{\mathrm {max}}$ to 910 GHz by Adopting Asymmetric Gate Recess and Double-Side-Doped Structure in 75-nm-Gate InAlAs/InGaAs HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsuyoshi Takahashi; Yoichi Kawano; Kozo Makiyama; Shoichi Shiba; Masaru Sato; Yasuhiro Nakasha; Naoki Hara
Year: 2017
Infrared and Terahertz Modulation Characteristics of n-GeBi/p-Si Photodiodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dainan Zhang; Lichuan Jin; Yulong Liao; Yang Liu; Tianlong Wen
Year: 2017
The Effect of Drain Bias Stress on the Instability of Turned-OFF Amorphous HfInZnO Thin-Film Transistors Under Light Irradiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dae Woong Kwon; Jang Hyun Kim; Byung-Gook Park
Year: 2017
Thermoradiative Energy Conversion With Quasi-Fermi Level Variations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Julio J. Fernandez
Year: 2017
Multichip LED Modules With V-Groove Surfaces for Light Extraction Efficiency Enhancements Considering Roughness Scattering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinrui Ding; Yong Tang; Zongtao Li; Jiasheng Li; Yingxi Xie; Liwei Lin
Year: 2017
A Novel Wire-Wrap Slow-Wave Structure for Terahertz Backward Wave Oscillator Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Changpeng Xu; Yong Yin; Liangjie Bi; Zhang Zhang; Zhiwei Chang; Abdur Rauf; Safi Ullah; Bin Wang; Lin Meng
Year: 2017
Design and Simulation of Low-Power Logic Gates Based on Nanoscale Side-Contacted FED
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Behnam Jafari Touchaei; Negin Manavizadeh
Year: 2017
An AMOLED Panel Test System Using Universal Data Driver ICs for Various Pixel Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyeon-Cheon Seol; Jong-Hyun Ra; Seong-Kwan Hong; Oh-Kyong Kwon
Year: 2017
Iso-Trapping Measurement Technique for Characterization of Self-Heating in a GaN HEMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sayed Ali Albahrani; Anthony Parker; Michael Heimlich; Bryan Schwitter
Year: 2017
Effect of Active Layer Thickness on Device Performance of Tungsten-Doped InZnO Thin-Film Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyun-Woo Park; Kyung Park; Jang-Yeon Kwon; Dukhyun Choi; Kwun-Bum Chung
Year: 2017
Optimization and New Structure of Superjunction With Isolator Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wentong Zhang; Bo Zhang; Ming Qiao; Zehong Li; Xiaorong Luo; Zhaoji Li
Year: 2017
Experimental Studies of the Frequency Dependence of the Low-Barrier Mott Diode Impedance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. V. Vostokov; V. I. Shashkin
Year: 2017
Effects of MgxZn1-xO Thickness on the Bandwidth of Metal–Semiconductor–Metal Bandpass Photodetectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun-Dar Hwang; Guan-Syun Lin; Sheng-Beng Hwang
Year: 2017
Simulations of Sectioned Cavity for High-Harmonic Gyrotron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ilya V. Bandurkin; Yury K. Kalynov; Petr B. Makhalov; Ivan V. Osharin; Andrey V. Savilov; Ilya V. Zheleznov
Year: 2017
An Improved Analytical Model for Carrier Multiplication Near Breakdown in Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raymond J. E. Hueting; Anco Heringa; Boni K. Boksteen; Satadal Dutta; Alessandro Ferrara; Vishal Agarwal; Anne Johan Annema
Year: 2017
3-D Memristor Crossbars for Analog and Neuromorphic Computing Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gina C. Adam; Brian D. Hoskins; Mirko Prezioso; Farnood Merrikh-Bayat; Bhaswar Chakrabarti; Dmitri B. Strukov
Year: 2017
Combining High Hole Concentration in p-GaN and High Mobility in u-GaN for High p-Type Conductivity in a p-GaN/u-GaN Alternating-Layer Nanostructure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hao-Tsung Chen; Chia-Ying Su; Charng-Gan Tu; Yu-Feng Yao; Chun-Han Lin; Yuh-Renn Wu; Yean-Woei Kiang; Chih-Chung C. C. Yang
Year: 2017
ESD Behavior of Tunnel FET Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagothu Karmel Kranthi; Mayank Shrivastava
Year: 2017
The 36 V Bipolar: $\beta \times V_{a} \times \text {fT} \times \text {BV} \times \text {JfT} \times$ Linearity Tradeoff
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edward J. Coyne; Shay Whiston; Breandan Pol O hAnnaidh; Donal P. McAuliffe; Bill Lane
Year: 2017
Effective 3-D Device Electrothermal Simulation Analysis of Influence of Metallization Geometry on Multifinger Power HEMTs Properties
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ales Chvala; Juraj Marek; Patrik Pribytny; Alexander Satka; Martin Donoval; Daniel Donoval
Year: 2017
An Analytical Model of Drain Current in a Nanoscale Circular Gate TFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rupam Goswami; Brinda Bhowmick
Year: 2017
Low-Resistive High-Work-Function Gate Electrode for Transparent a-IGZO TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woo Jae Jang; Myung Keun Lee; Jinhan Yoo; Eungtaek Kim; Dae Young Yang; Junhong Park; Jeong Woo Park; Sang-Hee Ko Park; Kyung Cheol Choi
Year: 2017
Degradation Mechanisms of Amorphous InGaZnO Thin-Film Transistors Used in Foldable Displays by Dynamic Mechanical Stress
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sang Myung Lee; Dongseok Shin; Ilgu Yun
Year: 2017
A Tileable CMOS X-Ray Line Detector Using Time-Delay-Integration With Pseudomultisampling for Large-Sized Dental X-Ray Imaging Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yun-Rae Jo; Seong-Kwan Hong; Oh-Kyong Kwon
Year: 2017
Defect-Related Degradation of AlGaN-Based UV-B LEDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Desiree Monti; Matteo Meneghini; Carlo De Santi; Gaudenzio Meneghesso; Enrico Zanoni; Johannes Glaab; Jens Rass; Sven Einfeldt; Frank Mehnke; Johannes Enslin; Tim Wernicke; Michael Kneissl
Year: 2017
Characterization of AlGaN/GaN HEMTs Using Gate Resistance Thermometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Georges Pavlidis; Spyridon Pavlidis; Eric R. Heller; Elizabeth A. Moore; Ramakrishna Vetury; Samuel Graham
Year: 2017
Consistency of the Two Component Composite Modeling Framework for NBTI in Large and Small Area p-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ankush Chaudhary; Beryl Fernandez; Narendra Parihar; Souvik Mahapatra
Year: 2017
Self-Heating During submicrosecond Current Transients in Pr0.7Ca0.3MnO3-Based RRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Panwar; A. Khanna; P. Kumbhare; I. Chakraborty; U. Ganguly
Year: 2017
Analysis of the Meyer-Neldel Rule Based on a Temperature-Dependent Model for Thin-Film Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiyuan Han; Mingxiang Wang
Year: 2017
Solution Processed Amorphous ZnSnO Thin-Film Phototransistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lisha Feng; Genyuan Yu; Xifeng Li; Jianhua Zhang; Zhizhen Ye; Jianguo Lu
Year: 2017
Impact of Fin Height and Fin Angle Variation on the Performance Matrix of Hybrid FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar Prasannajit Pradhan; Samar K. Saha; Prasanna Kumar Sahu; Priyanka
Year: 2017
Analytical Drain Current Compact Model in the Depletion Operation Region of Short-Channel Triple-Gate Junctionless Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Theodoros A. Oproglidis; Andreas Tsormpatzoglou; Dimitrios H. Tassis; Theano A. Karatsori; Sylvain Barraud; Gerard Ghibaudo; Charalabos A. Dimitriadis
Year: 2017
Tunneling Negative Differential Resistance-Assisted STT-RAM for Efficient Read and Write Operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shaodi Wang; Andrew Pan; Chi On Chui; Puneet Gupta
Year: 2017
Nanoscale FETs Simulation Based on Full-Complex-Band Structure and Self-Consistently Solved Atomic Potential
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoyi Zhang; Kai-Tak Lam; Kain Lu Low; Yee-Chia Yeo; Gengchiau Liang
Year: 2017
Physical Differences in Hot Carrier Degradation of Oxide Interfaces in Complementary (n-p-n+p-n-p) SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Uppili S. Raghunathan; Hanbin Ying; Brian R. Wier; Anup P. Omprakash; Partha S. Chakraborty; Tikurete G. Bantu; Hiroshi Yasuda; Philip Menz; John D. Cressler
Year: 2017
The $R_{\mathrm{\scriptscriptstyle ON},\mathrm {min}}$ of Balanced Symmetric Vertical Super Junction Based on R-Well Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wentong Zhang; Bo Zhang; Ming Qiao; Zehong Li; Xiaorong Luo; Zhaoji Li
Year: 2017
Feasibility of InxGa1–xAs High Mobility Channel for 3-D NAND Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Capogreco; A. Subirats; J. G. Lisoni; A. Arreghini; B. Kunert; W. Guo; C.-L Tan; R. Delhougne; G. Van den bosch; K. De Meyer; A. Furnemont; J. Van Houdt
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Fokker—Planck Study of Parameter Dependence on Write Error Slope in Spin-Torque Switching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunkun Xie; Behtash Behin-Aein; Avik W. Ghosh
Year: 2017
Label-Free Flexible DNA Biosensing System Using Low-Temperature Solution-Processed In-Zn-O Thin-Film Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joohye Jung; Si Joon Kim; Tae Soo Jung; Jaewon Na; Doo Hyun Yoon; Mardhiah Muhamad Sabri; Hyun Jae Kim
Year: 2017
Dynamic and Power Performance of Multiple State Electrostatically Formed Nanowire Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Assif; G. Segev; Y. Rosenwaks
Year: 2017
Direct/Indirect Junction Between Channel Inversion Layer and Doped Source/Drain Region on Metal-Induced Lateral Crystallization Polycrystalline Silicon Bottom Gate TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ki Hwan Seok; Sol Kyu Lee; Hyung Yoon Kim; Hee Jae Chae; Yong Hee Lee; Seung Ki Joo
Year: 2017
Terahertz Broadband-Tunable Minigyrotron With a Pulse Magnet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiang-Bo Qi; Chao-Hai Du; Shi Pan; Xiao Ji; Bin Huang; Pu-Kun Liu
Year: 2017
Pinned Photodiode CMOS Image Sensor TCAD Simulation: In-Depth Analysis of in-Pixel Pinning Voltage Measurement for a Diagnostic Tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olivier Marcelot; Vincent Goiffon; Franck Nallet; Pierre Magnan
Year: 2017
Demonstration of Detecting Small pH Changes Using High-Sensitivity Amorphous InGaZnO4 Thin-Film Transistor pH Sensor System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kazushige Takechi; Shinnosuke Iwamatsu; Shunsuke Konno; Toru Yahagi; Yutaka Abe; Mutsuto Katoh; Hiroshi Tanabe
Year: 2017
Laser Spike Annealing for Shallow Junctions in Ge CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William Hsu; Feng Wen; Xiaoru Wang; Yun Wang; Andrei Dolocan; Anupam Roy; Taegon Kim; Emanuel Tutuc; Sanjay K. Banerjee
Year: 2017
Effects of Contact Placement and Intra/Interlayer Interaction in Current Distribution of Black Phosphorus Sub-10-nm FET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheng Luo; Kai-Tak Lam; Baokai Wang; Chuang-Han Hsu; Wen Huang; Liang-Zi Yao; Arun Bansil; Hsin Lin; Gengchiau Liang
Year: 2017
Enhanced Optical and Thermal Performance of Eutectic Flip-Chip Ultraviolet Light-Emitting Diodes via AlN-Doped-Silicone Encapsulant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renli Liang; Feng Wu; Shuai Wang; Qian Chen; Jiangnan Dai; Changqing Chen
Year: 2017
Design and Analysis of Polarity Controlled Electrically Doped Tunnel FET With Bandgap Engineering for Analog/RF Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pravin N. Kondekar; Kaushal Nigam; Sunil Pandey; Dheeraj Sharma
Year: 2017
A Novel ${{V}}_{\textsf {DSAT}}$ Extraction Method for Tunnel FETs and Its Implication on Analog Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abhishek Acharya; Sudeb Dasgupta; Bulusu Anand
Year: 2017
Graphene Base Transistors With Bilayer Tunnel Barriers: Performance Evaluation and Design Guidelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stefano Venica; Francesco Driussi; Sam Vaziri; Pierpaolo Palestri; Luca Selmi
Year: 2017
Performance and Variations Induced by Single Interface Trap of Nanowire FETs at 7-nm Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun-Sik Yoon; Kihyun Kim; Taiuk Rim; Chang-Ki Baek
Year: 2017
Phosphor Temperature Overestimation in High-Power Light-Emitting Diode by Thermocouple
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qi Chen; Yupu Ma; Xingjian Yu; Run Hu; Xiaobing Luo
Year: 2017
$1\times$ - to $2\times$ -nm perpendicular MTJ Switching at Sub-3-ns Pulses Below $100~\mu$ A for High-Performance Embedded STT-MRAM for Sub-20-nm CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daisuke Saida; Saori Kashiwada; Megumi Yakabe; Tadaomi Daibou; Miyoshi Fukumoto; Shinji Miwa; Yoshishige Suzuki; Keiko Abe; Hiroki Noguchi; Junichi Ito; Shinobu Fujita
Year: 2017
Hot-Carrier-Induced Degradations Investigations for 600 V SOI-LIGBT by an Improved Charge Pumping Solution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siyang Liu; Chunwei Zhang; Kaikai Xu; Weifeng Sun
Year: 2017
Drain Extended Tunnel FET—A Novel Power Transistor for RF and Switching Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mayank Shrivastava
Year: 2017
4H-SiC Trench IGBT With Back-Side n-p-n Collector for Low Turn-OFF Loss
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan-Juan Liu; Ying Wang; Yue Hao; Cheng-Hao Yu; Fei Cao
Year: 2017
Bistable Capacitance Performance-Induced Ambipolar Charge Injected Based on Ba0.6Sr0.4TiO3 by an Inlaid Zr–Hf–O Layer for Novel Nonvolatile Memory Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaobing Yan; Yucheng Li; Jianhui Zhao; Zhenyu Zhou
Year: 2017
Achieving High-Performance Blue GaN-Based Light-Emitting Diodes by Energy Band Modification on AlxInyGa1–xyN Electron Blocking Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiting Lin; Haiyan Wang; Shuqi Chen; Yunhao Lin; Meijuan Yang; Guoqiang Li; Bingshe Xu
Year: 2017
Multimode Steady-State Analysis for a Gyrotron Traveling Wave Amplifier Based on a Distributed Loss-Loaded Metal Cylindrical Waveguide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanna Tang; Jirun Luo; Qianzhong Xue; Yu Fan; Xiaoxia Wang; Shuyuan Peng; Shi Li
Year: 2017
A Predictive Tunnel FET Compact Model With Atomistic Simulation Validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Kai Lin; Sourabh Khandelwal; Juan Pablo Duarte; Huan-Lin Chang; Sayeef Salahuddin; Chenming Hu
Year: 2017
Monolithic Integration of InAs Quantum-Well n-MOSFETs and Ultrathin Body Ge p-MOSFETs on a Si Substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sachin Yadav; Kian Hua Tan; Annie Kumar; Kian Hui Goh; Gengchiau Liang; Soon-Fatt Yoon; Xiao Gong; Yee-Chia Yeo
Year: 2017
Mechanism and Origin of Hysteresis in Oxide Thin-Film Transistor and Its Application on 3-D Nonvolatile Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhi Ye; Yonggang Yuan; Hua Xu; Yang Liu; Jikui Luo; Man Wong
Year: 2017
Systematic Investigation of Self-Heating Effect on CMOS Logic Transistors From 20 to 5 nm Technology Nodes by Experimental Thermoelectric Measurements and Finite Element Modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.-H Liao; C.-P Hsieh; C.-C Lee
Year: 2017
A Precision SiGe Reference Circuit Utilizing Si and SiGe Bandgap Voltage Differences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Huang; Laleh Najafizadeh
Year: 2017
A Comprehensive Study of Reverse Current Degradation Mechanisms in Au/Ni/n-GaN Schottky Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Ren; Wenjie Mou; Linna Zhao; Dawei Yan; Zhiguo Yu; Guofeng Yang; Shaoqing Xiao; Xiaofeng Gu
Year: 2017
Successive Conformal Mapping Technique to Extract Inner Fringe Capacitance of Underlap DG-FinFET and Its Variations With Geometrical Parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savitesh Madhulika Sharma; Sudeb Dasgupta; M. V. Kartikeyan
Year: 2017
Surface Potential and Drain Current Analytical Model of Gate All Around Triple Metal TFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Navjeet Bagga; Sudeb Dasgupta
Year: 2017
Modeling Vacuum Electronic Devices Using Generalized Impedance Matrices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Igor A. Chernyavskiy; Thomas M. Antonsen; John C. Rodgers; Alexander N. Vlasov; David Chernin; Baruch Levush
Year: 2017
Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fabio Acerbi; Stefano Davini; Alessandro Ferri; Cristiano Galbiati; Graham Giovanetti; Alberto Gola; George Korga; Andrea Mandarano; Marco Marcante; Giovanni Paternoster; Claudio Piemonte; Alessandro Razeto; Veronica Regazzoni; Davide Sablone; Claudio Savarese; Gaetano Zappala; Nicola Zorzi
Year: 2017
TiSi(Ge) Contacts Formed at Low Temperature Achieving Around $2 \,\, \times \,\, 10^{-{9}}~\Omega $ cm2 Contact Resistivities to p-SiGe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hao Yu; Marc Schaekers; Jian Zhang; Lin-Lin Wang; Jean-Luc Everaert; Naoto Horiguchi; Yu-Long Jiang; Dan Mocuta; Nadine Collaert; Kristin De Meyer
Year: 2017
ESD Protection Design for Touch Panel Control IC Against Latchup-Like Failure Induced by System-Level ESD Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming-Dou Ker; Po-Yen Chiu; Wuu-Trong Shieh; Chun-Chi Wang
Year: 2017
The Nonlinear Designs and Experiments on a 0.42-THz Second Harmonic Gyrotron With Complex Cavity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qixiang Zhao; Sheng Yu
Year: 2017
The Influence of Processing Conditions on the 3-D Interconnected Structure of Nanosilver Paste
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joshua A. Stuckner; Guo-Quan Lu; Masatoshi Mitsuhara; William T. Reynolds; Mitsuhiro Murayama
Year: 2017
Anomalous Transconductance in Long Channel Halo Implanted MOSFETs: Analysis and Modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harshit Agarwal; Chetan Gupta; Sagnik Dey; Sourabh Khandelwal; Chenming Hu; Yogesh Singh Chauhan
Year: 2017
Corrosion Behavior and Metallization of Cu-Based Electrodes Using MoNi Alloy and Multilayer Structure for Back-Channel-Etched Oxide Thin-Film Transistor Circuit Integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da Eun Kim; Sung Woon Cho; Sung Chan Kim; Won Jun Kang; Hyung Koun Cho
Year: 2017
A Deterministic and Self-Consistent Solver for the Coupled Carrier-Phonon System in SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamed Kamrani; Dominic Jabs; Vincenzo d'Alessandro; Niccolò Rinaldi; Klaus Aufinger; Christoph Jungemann
Year: 2017
Stabilizing Schemes for the Minority Failure Bits in Ta2O5-Based ReRAM Macro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makoto Ueki; Yoshihiro Hayashi; Naoya Furutake; Koji Masuzaki; Akira Tanabe; Mitsuru Narihiro; Hiroshi Sunamura; Kazuya Uejima; Akira Mitsuiki; Koichi Takeda; Takashi Hase
Year: 2017
Semi-analytical Model of Charge Domain Propagation and Its Device Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jonathan P. Sculley; P. Douglas Yoder
Year: 2017
Assessment of 2-D Transition Metal Dichalcogenide FETs at Sub-5-nm Gate Length Scale
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhipeng Dong; Jing Guo
Year: 2017
Theory and Experiment Investigate of a 400-kW Ku-Band Gyro-TWT With Mode Selective Loss Loading Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianxun Wang; Qizhi Tian; Xiaoxiao Li; Guoxiang Shu; Yong Xu; Yong Luo
Year: 2017
An Analytical Model of the Frequency Dependent 3-D Current Spreading in Forward Biased Shallow Rectangular p-n Junctions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubham Jain; Vijaya Kumar Gurugubelli; Shreepad Karmalkar
Year: 2017
3-D Analytical Modeling of Dual-Material Triple-Gate Silicon-on-Nothing MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pritha Banerjee; Subir Kumar Sarkar
Year: 2017
High-Power Multicarrier Generation for RF Breakdown Testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oscar Monerris Belda; Elena Diaz Caballero; Vicente E. Boria; Benito Gimeno
Year: 2017
Compact Model of HfOX-Based Electronic Synaptic Devices for Neuromorphic Computing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng Huang; Dongbin Zhu; Sijie Chen; Zheng Zhou; Zhe Chen; Bin Gao; Lifeng Liu; Xiaoyan Liu; Jinfeng Kang
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Operating Principles, Design Considerations, and Experimental Characteristics of High-Voltage 4H-SiC Bidirectional IGBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sauvik Chowdhury; Collin W. Hitchcock; Zachary Stum; Rajendra P. Dahal; Ishwara B. Bhat; T. Paul Chow
Year: 2017
A Comprehensive Study on the Geometrical Effects in High-Power 4H–SiC BJTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arash Salemi; Hossein Elahipanah; Carl-Mikael Zetterling; Mikael Ostling
Year: 2017
Current-Controlled Negative Resistance in High-Voltage 4H-SiC p-i-n Rectifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sauvik Chowdhury; Collin W. Hitchcock; Rajendra P. Dahal; Ishwara B. Bhat; T. Paul Chow
Year: 2017
Normally OFF Trench CAVET With Active Mg-Doped GaN as Current Blocking Layer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Ji; Matthew A. Laurent; Anchal Agarwal; Wenwen Li; Saptarshi Mandal; Stacia Keller; Srabanti Chowdhury
Year: 2017
Design and Characterization of Sloped-Field-Plate Enhanced Trench Edge Termination
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wentao Yang; Hao Feng; Xiangming Fang; Yong Liu; Yuichi Onozawa; Hiroyuki Tanaka; Johnny K. O. Sin
Year: 2017
Ultrahigh-Voltage SiC MPS Diodes With Hybrid Unipolar/Bipolar Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hiroki Niwa; Jun Suda; Tsunenobu Kimoto
Year: 2017
Design and Characterization of High-Current Optical Darlington Transistor for Pulsed-Power Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alireza Mojab; Sudip K. Mazumder
Year: 2017
High-Voltage Integrated Circuits: History, State of the Art, and Future Prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Don Disney; Ted Letavic; Tanya Trajkovic; Tomohide Terashima; Akio Nakagawa
Year: 2017
Investigation of In Situ SiN as Gate Dielectric and Surface Passivation for GaN MISHEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huaxing Jiang; Chao Liu; Yuying Chen; Xing Lu; Chak Wah Tang; Kei May Lau
Year: 2017
Biased Photoresponse Analysis of Al–ZnO Heterojunctions with n- and p-Type Silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhen Gao; Navid M. S. Jahed; Siva Sivoththaman
Year: 2017
Downscaling Metal—Oxide Thin-Film Transistors to Sub-50 nm in an Exquisite Film-Profile Engineering Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rong-Jhe Lyu; Bo-Shiuan Shie; Horng-Chih Lin; Pei-Wen Li; Tiao-Yuan Huang
Year: 2017
Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Peng; Ruixin Li; Simin Wang; Zhen Chen; Lei Nie; Mingxiang Chen
Year: 2017
The Modeling of Two Phosphors in Conversion White-Light LED
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shang-Ping Ying; Han-Kuei Fu; Hsin-Hsin Hsieh; Hsuan-Wei Kuo
Year: 2017
Fast Switching and Low Operating Vertical Alignment Liquid Crystal Display With 3-D Polymer Network for Flexible Display
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Young Jin Lim; Hyo Joong Kim; Young Cheol Chae; G. Murali; Joong Hee Lee; Byung-June Mun; Dae Young Gwon; Gi-Dong Lee; Seung Hee Lee
Year: 2017
Extraction of BEOL Contributions for Thermal Resistance in SiGe HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Suresh Balanethiram; Rosario D'Esposito; Anjan Chakravorty; Sebastien Fregonese; Thomas Zimmer
Year: 2017
Combination of E-Jet and Inkjet Printing for Additive Fabrication of Multilayer High-Density RDL of Silicon Interposer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mika-Matti Laurila; Behnam Khorramdel; Matti Mantysalo
Year: 2017
Compact Modeling of Transition Metal Dichalcogenide based Thin body Transistors and Circuit Validation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandan Yadav; Amit Agarwal; Yogesh Singh Chauhan
Year: 2017
Steep Switching Hybrid Phase Transition FETs (Hyper-FET) for Low Power Applications: A Device-Circuit Co-design Perspective–Part I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmedullah Aziz; Nikhil Shukla; Suman Datta; Sumeet Kumar Gupta
Year: 2017
Symmetric U-Shaped Gate Tunnel Field-Effect Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shupeng Chen; Shulong Wang; Hongxia Liu; Wei Li; Qianqiong Wang; Xing Wang
Year: 2017
Self-Powered Timekeeping and Synchronization Using Fowler–Nordheim Tunneling-Based Floating-Gate Integrators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liang Zhou; Shantanu Chakrabartty
Year: 2017
Comparative Investigation on the Effects of Organic and Inorganic Interlayers in Au/n-GaAs Schottky Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Serhat Orkun Tan; Huseyin Tecimer; Osman Cicek
Year: 2017
Silicon Thyristors for Ultrahigh Power (GW) Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jan Vobecky; Hans-Joachim Schulze; Peter Streit; Franz-Josef Niedernostheide; Virgiliu Botan; Jens Przybilla; Uwe Kellner-Werdehausen; M. Bellini
Year: 2017
Buffer Layer Engineering for High ( $\geq 10^{\mathrm {13}}$ cm $^{\mathrm {-2}}$ ) 2-DEG Density in ZnO-Based Heterostructures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Md Arif Khan; Rohit Singh; Shaibal Mukherjee; Abhinav Kranti
Year: 2017
Diameter Dependence of Leakage Current in Nanowire Junctionless Field Effect Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubham Sahay; Mamidala Jagadesh Kumar
Year: 2017
IGZO-TFT Biosensors for Epstein–Barr Virus Protein Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsung-Han Yang; Ting-Yang Chen; Nian-Ting Wu; Yung-Tsan Chen; Jian-Jang Huang
Year: 2017
Role of the Insulating Fillers in the Encapsulation Material on the Lateral Charge Spreading in HV-ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ilaria Imperiale; Susanna Reggiani; Giuseppe Pavarese; Elena Gnani; Antonio Gnudi; Giorgio Baccarani; Woojin Ahn; Muhammad A. Alam; Dhanoop Varghese; Alejandro Hernandez-Luna; Luu Nguyen; Srikanth Krishnan
Year: 2017
Lateral Charge Transport in the Carbon-Doped Buffer in AlGaN/GaN-on-Si HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Indranil Chatterjee; Michael J. Uren; Serge Karboyan; Alexander Pooth; Peter Moens; Abhishek Banerjee; Martin Kuball
Year: 2017
Effect of Different Carbon Doping Techniques on the Dynamic Properties of GaN-on-Si Buffers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Yacoub; C. Mauder; S. Leone; M. Eickelkamp; D. Fahle; M. Heuken; H. Kalisch; A. Vescan
Year: 2017
2-D Analytical Threshold Voltage Model for Dielectric Pocket Double-Gate Junctionless FETs by Considering Source/Drain Depletion Effect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balraj Singh; Deepti Gola; Kunal Singh; Ekta Goel; Sanjay Kumar; Satyabrata Jit
Year: 2017
Low-Temperature Ohmic Contact Formation in AlN/GaN HEMT Using Microwave Annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin-Qing Zhang; Zhuo Liu; Sheng-Xun Zhao; Min-Zhi Lin; Peng-Fei Wang
Year: 2017
Unified Physical DC Model of Staggered Amorphous InGaZnO Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matteo Ghittorelli; Fabrizio Torricelli; Carmine Garripoli; Jan-Laurens van der Steen; Gerwin H. Gelinck; Eugenio Cantatore; Luigi Colalongo; Zsolt Miklos Kovacs-Vajna
Year: 2017
Modeling Interconnect Variability at Advanced Technology Nodes and Potential Solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Divya Prasad; Chenyun Pan; Azad Naeemi
Year: 2017
Current Degradation by Carrier Recombination in a Poly-Si TFET With Gate-Drain Underlapping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William Cheng-Yu Ma
Year: 2017
Schottky Diodes on ZnO Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jidong Jin; Jacqueline S. Wrench; James T. Gibbon; David Hesp; Andrew Shaw; Ivona Z. Mitrovic; Naser Sedghi; Laurie J. Phillips; Jianli Zou; Vinod R. Dhanak; Paul R. Chalker; Steve Hall
Year: 2017
Calibration of SiC Detectors for Nitrogen and Neon Plasma Emission Using Gas-Puff Target Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alfio Torrisi; Przemyslaw W. Wachulak; Andrzej Bartnik; Tomasz Fok; Lukasz Wegrzynski; Henryk Fiedorowicz; Massimo Mazzillo; Antonella Sciuto; Lorenzo Torrisi
Year: 2017
Performance of Graded Bandgap HgCdTe Avalanche Photodiode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anand Singh; A. K. Shukla; Ravinder Pal
Year: 2017
Plasmon-Sensitized Optoelectronic Properties of Au Nanoparticle-Assisted Vertically Aligned TiO2 Nanowires by GLAD Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Biraj Shougaijam; Chitralekha Ngangbam; Trupti Ranjan Lenka
Year: 2017
Role of Oxygen Vacancies in Short- and Long-Term Instability of Negative Bias-Temperature Stressed SiC MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Devanarayanan P. Ettisserry; Neil Goldsman; Aivars J. Lelis
Year: 2017
Step JTE, an Edge Termination for UHV SiC Power Devices With Increased Tolerances to JTE Dose and Surface Charges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cai-Neng Zhou; Yan Wang; Rui-Feng Yue; Gang Dai; Jun-Tao Li
Year: 2017
Novel Snapback-Free Reverse-Conducting SOI-LIGBT With Dual Embedded Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long Zhang; Jing Zhu; Weifeng Sun; Meng Chen; Minna Zhao; Xuequan Huang; Jiajun Chen; Yuxiang Qian; Longxing Shi
Year: 2017
Improved Electrical Performance of Multilayer MoS2 Transistor With NH3-Annealed ALD HfTiO Gate Dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Wen; Jingping Xu; Lu Liu; Pui-To Lai; Wing-Man Tang
Year: 2017
Integration of Prism Sheet on Quantum Dot Film With Bridge Patterns to Enhance Luminance of LED Backlight Unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Se-Eun Kim; Jae-Yong Lee; Min-Ho Shin; Hyo-Jun Kim; Young-Joo Kim
Year: 2017
Circuit Model for Double-Energy-Level Trap Centers in GaN HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sayed Ali Albahrani; Anthony Parker; Michael Heimlich
Year: 2017
Fully- and Quasi-Vertical GaN-on-Si p-i-n Diodes: High Performance and Comprehensive Comparison
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xu Zhang; Xinbo Zou; Xing Lu; Chak Wah Tang; Kei May Lau
Year: 2017
A Linear Equivalent Circuit Model for Depletion-Type Silicon Microring Modulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myungjin Shin; Yoojin Ban; Byung-Min Yu; Min-Hyeong Kim; Jinsoo Rhim; Lars Zimmermann; Woo-Young Choi
Year: 2017
Oxidation Resistive, CMOS Compatible Copper-Based Alloy Ultrathin Films as a Superior Passivation Mechanism for Achieving 150 °C Cu–Cu Wafer on Wafer Thermocompression Bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Asisa Kumar Panigrahi; Tamal Ghosh; Siva Rama Krishna Vanjari; Shiv Govind Singh
Year: 2017
ACO-Based Thermal-Aware Thread-to-Core Mapping for Dark-Silicon-Constrained CMPs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jian Wang; Zhe Chen; Jinhong Guo; Yubai Li; Zhonghai Lu
Year: 2017
Novel Ultrathin FD-SOI BiMOS Device With Reconfigurable Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sotirios Athanasiou; Charles-Alexandre Legrand; Sorin Cristoloveanu; Philippe Galy
Year: 2017
Secondary Electroluminescence of GaN-on-Si RF HEMTs: Demonstration and Physical Origin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matteo Meneghini; Alessandro Barbato; Isabella Rossetto; Andrea Favaron; Marco Silvestri; Simone Lavanga; Haifeng Sun; Helmut Brech; Gaudenzio Meneghesso; Enrico Zanoni
Year: 2017
Influence of the Design of Square p+ Islands on the Characteristics of 4H-SiC JBS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kung-Yen Lee; Yuan-Heng Liu; Sheng-Chung Wang; Le-Shan Chan
Year: 2017
Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hamed Kamrani; Dominic Jabs; Vincenzo d'Alessandro; Niccolo Rinaldi; Thomas Jacquet; Cristell Maneux; Thomas Zimmer; Klaus Aufinger; Christoph Jungemann
Year: 2017
Compact Model for Ferroelectric Negative Capacitance Transistor With MFIS Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Girish Pahwa; Tapas Dutta; Amit Agarwal; Yogesh Singh Chauhan
Year: 2017
Influence of Different Gate Biases and Gate Lengths on Parasitic Source Access Resistance in AlGaN/GaN Heterostructure FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Peng Cui; Huan Liu; Wei Lin; Zhaojun Lin; Aijie Cheng; Ming Yang; Yan Liu; Chen Fu; Yuanjie Lv; Chongbiao Luan
Year: 2017
An Analytical Model for Double-Gate Tunnel FETs Considering the Junctions Depletion Regions and the Channel Mobile Charge Carriers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saeed Mohammadi; Hamid Reza Tajik Khaveh
Year: 2017
Study of Interface Traps in AlGaN/GaN MISHEMTs Using LPCVD SiNx as Gate Dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xing Lu; Kun Yu; Huaxing Jiang; Anping Zhang; Kei May Lau
Year: 2017
Steep Switching Hybrid Phase Transition FETs (Hyper-FET) for Low Power Applications: A Device-Circuit Co-design Perspective—Part II
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ahmedullah Aziz; Nikhil Shukla; Suman Datta; Sumeet Kumar Gupta
Year: 2017
Evaluation of Ballistic Transport in III–V-Based p-Channel MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pengying Chang; Xiaoyan Liu; Shaoyan Di; Gang Du
Year: 2017
Analysis and Modeling of Cross-Coupling and Substrate Capacitances in GaN HEMTs for Power-Electronic Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheikh Aamir Ahsan; Sudip Ghosh; Sourabh Khandelwal; Yogesh Singh Chauhan
Year: 2017
Dark Current Blooming in Pinned Photodiode CMOS Image Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jean-Marc Belloir; Jean-Baptiste Lincelles; Alice Pelamatti; Clementine Durnez; Vincent Goiffon; Cedric Virmontois; Philippe Paillet; Pierre Magnan; Olivier Gilardx
Year: 2017
A 32-Stage 15-b Digital Time-Delay Integration Linear CMOS Image Sensor With Data Prediction Switching Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin Yin; Ting Liao; Kuan-Lin Liu; Chen-Che Kao; Chin-Fong Chiu; Chih-Cheng Hsieh
Year: 2017
A Physics-Based (Verilog-A) Compact Model for DC, Quasi-Static Transient, Small-Signal, and Noise Analysis of MOSFET-Based pH Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piyush Dak; Weeseong Seo; Byunghoo Jung; Muhammad A. Alam
Year: 2017
Impact of Silicon Nitride Stoichiometry on the Effectiveness of AlGaN/GaN HEMT Field Plates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:William M. Waller; Mark Gajda; Saurabh Pandey; Johan J. T. M. Donkers; David Calton; Jeroen Croon; Serge Karboyan; Jan Sonsky; Michael J. Uren; Martin Kuball
Year: 2017
Sub-100 mV Computing With Electro-Mechanical Relays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuang Qian; Alexis Peschot; Benjamin Osoba; Zhixin Alice Ye; Tsu-Jae King Liu
Year: 2017
Introducing Optical Cascode GaN HEMT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alireza Mojab; Zahra Hemmat; Hossein Riazmontazer; Arash Rahnamaee
Year: 2017
Considerations for Static Energy Reduction in Digital CMOS ICs Using NEMS Power Gating
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sivaneswaran Sankar; Ulayil Sajesh Kumar; Mayank Goel; Maryam Shojaei Baghini; Valipe Ramgopal Rao
Year: 2017
Impact of Recess Etching on the Temperature-Dependent Characteristics of GaN-Based MIS-HEMTs With Al2O3/AlN Gate-Stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiejie Zhu; Qing Zhu; Lixiang Chen; Bin Hou; Ling Yang; Xiaowei Zhou; Xiaohua Ma; Yue Hao
Year: 2017
Compact Modeling and Evaluation of Magnetic Skyrmion-Based Racetrack Memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang Kang; Chentian Zheng; Yangqi Huang; Xichao Zhang; Weifeng Lv; Yan Zhou; Weisheng Zhao
Year: 2017
Performance Analysis of Nanoscale Single Layer Graphene Pressure Sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Majid Sanaeepour; Abolfazl Abedi; Mohammad Javad Sharifi
Year: 2017
Metal-Free Fully Solution-Processable Flexible Electrolyte-Gated Carbon Nanotube Field Effect Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vijay Deep Bhatt; Saumya Joshi; Paolo Lugli
Year: 2017
Through Recess and Regrowth Gate Technology for Realizing Process Stability of GaN-Based Gate Injection Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hideyuki Okita; Masahiro Hikita; Akihiko Nishio; Takahiro Sato; Keiichi Matsunaga; Hisayoshi Matsuo; Michinobu Tsuda; Masaya Mannoh; Saichiro Kaneko; Masayuki Kuroda; Manabu Yanagihara; Ayanori Ikoshi; Tatsuo Morita; Kenichiro Tanaka; Yasuhiro Uemoto
Year: 2017
Next Generation IGBT and Package Technologies for High Voltage Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnost Kopta; Munaf Rahimo; Chiara Corvasce; Maxi Andenna; Franc Dugal; Fabian Fischer; Samuel Hartmann; Andreas Baschnagel
Year: 2017
A Novel SuperSteep Subthreshold Slope Dual-Channel FET Utilizing a Gate-Controlled Thyristor Mode-Induced Positive Feedback Current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Chen Chen; Hang-Ting Lue; Yi-Hsuan Hsiao; Chih-Yuan Lu
Year: 2017
2-D Analytical Modeling of the Electrical Characteristics of Dual-Material Double-Gate TFETs With a SiO2/HfO2 Stacked Gate-Oxide Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sanjay Kumar; Ekta Goel; Kunal Singh; Balraj Singh; Prince Kumar Singh; Kamalaksha Baral; Satyabrata Jit
Year: 2017
Concurrent Efficient Evaluation of Small-Change Parameters and Green’s Functions for TCAD Device Noise and Variability Analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Simona Donati Guerrieri; Marco Pirola; Fabrizio Bonani
Year: 2017
A Novel TCAD-Based Thermal Extraction Approach for Nanoscale FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Sajesh Kumar; V. Ramgopal Rao
Year: 2017
Study of GaN-Based LEDs With Hybrid SiO2 Microsphere/Nanosphere AntiReflection Coating as a Passivation Layer by a Rapid Convection Deposition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chi-Hsiang Hsu; Yi-Chun Chan; Wei-Cheng Chen; Ching-Hong Chang; Jian-Kai Liou; Shiou-Ying Cheng; Der-Feng Guo; Wen-Chau Liu
Year: 2017
Comprehensive Simulation Study of Direct Source-to-Drain Tunneling in Ultra-Scaled Si, Ge, and III-V DG-FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhengping Jiang; Jing Wang; Hong-Hyun Park; Anh-Tuan Pham; Nuo Xu; Yang Lu; Seonghoon Jin; Woosung Choi; Mohammad Ali Pourghaderi; Jongchol Kim; Keun-Ho Lee
Year: 2017
Modeling Spectra of Low-Power SMD LEDs as a Function of Ambient Temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Muna E. Raypah; Mutharasu Devarajan; Fauziah Sulaiman
Year: 2017
Statistical Dependence of Gate Metal Work Function on Various Electrical Parameters for an n-Channel Si Step-FinFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajesh Saha; Brinda Bhowmick; Srimanta Baishya
Year: 2017
Comparison of Photoresponse of Si-Based BIB THz Detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:He Zhu; Zeping Weng; Jiaqi Zhu; Huizhen Wu; Ning Li; Ning Dai
Year: 2017
Detailed Study on Dynamic Characteristics of a High-Performance SGT-MOSFET With Under-the-Trench Floating P-Pillar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shengling Deng; Zia Hossain; Toshimitsu Taniguchi
Year: 2017
Automatic Hot Test of Gyrotron-Traveling Wave Tubes by Adaptive PID Feedback Control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo Liu; Zhaodong Wang; Guohui Zhao; Ran Yan; Yong Xu; Jianxun Wang; Youlei Pu; Wei Jiang
Year: 2017
Evaluation and Influence of Gyrotron Cathode Emission Inhomogeneity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianghua Zhang; Stefan Illy; Ioannis Gr Pagonakis; Tomasz Rzesnicki; Konstantinos A. Avramidis; Anton Malygin; Sebastian Ruess; Andrey Samartsev; Gunter Dammertz; Bernhard Piosczyk; Gerd Gantenbein; Manfred Thumm; John Jelonnek
Year: 2017
Comparison of Logic Performance of CMOS Circuits Implemented With Junctionless and Inversion-Mode FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shilpi Guin; Monali Sil; Abhijit Mallik
Year: 2017
Impact of Short-Wavelength and Long-Wavelength Line-Edge Roughness on the Variability of Ultrascaled FinFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Michael Wong; Kyle D. Holland; Sam Anderson; Shahriar Rizwan; Zhi Cheng Jason Yuan; Terence B. Hook; Diego Kienle; Prasad S. Gudem; Mani Vaidyanathan
Year: 2017
IGBT History, State-of-the-Art, and Future Prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noriyuki Iwamuro; Thomas Laska
Year: 2017
Smart Power Devices and ICs Using GaAs and Wide and Extreme Bandgap Semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Paul Chow; Ichiro Omura; Masataka Higashiwaki; Hiroshi Kawarada; Vipindas Pala
Year: 2017
Guest Editorial Special Issue on Power Semiconductor Devices and Smart Power IC Technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wai Tung Ng; Florin Udrea; Ichiro Omura; Jan Vobecky; Don Disney
Year: 2017
Characterization of Interface Defects With Distributed Activation Energies in GaN-Based MIS-HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roberta Stradiotto; Gregor Pobegen; Clemens Ostermaier; Michael Waltl; Alexander Grill; Tibor Grasser
Year: 2017
Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junichi Hasegawa; Loris Pace; Luong Viet Phung; Mutsuko Hatano; Dominique Planson
Year: 2017
Investigation on Thermal Characterization of Eutectic Flip-Chip UV-LEDs With Different Bonding Voidage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renli Liang; Jun Zhang; Shuai Wang; Qian Chen; Linlin Xu; Jiangnan Dai; Changqing Chen
Year: 2017
Superjunction Power Devices, History, Development, and Future Prospects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Florin Udrea; Gerald Deboy; Tatsuhiko Fujihira
Year: 2017
An Accurate Analytical Current Model of Double-gate Heterojunction Tunneling FET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yunhe Guan; Zunchao Li; Wenhao Zhang; Yefei Zhang
Year: 2017
Investigation of Self-Heating Effect on Ballistic Transport Characterization for Si FinFETs Featuring Ultrafast Pulsed IV Technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ran Cheng; Xiao Yu; Bing Chen; Junfeng Li; Yiming Qu; Jinghui Han; Rui Zhang; Yi Zhao
Year: 2017
The Trench Power MOSFET—Part II: Application Specific VDMOS, LDMOS, Packaging, and Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Richard K. Williams; Mohamed N. Darwish; Richard A. Blanchard; Ralf Siemieniec; Phil Rutter; Yusuke Kawaguchi
Year: 2017
IEEE Transactions on Electron Devices information for authors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
GaN-on-Si Power Technology: Devices and Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kevin J. Chen; Oliver Haberlen; Alex Lidow; Chun Lin Tsai; Tetsuzo Ueda; Yasuhiro Uemoto; Yifeng Wu
Year: 2017
IEEE Transactions on Electron Devices publication information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2017
Maximum Limits on External Quantum Efficiencies in Bare LEDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siqi Lin; Tien-mo Shih; Wei Yan; Yijun Lu; Yue Lin; Richard Ru-Gin Chang; Zhong Chen
Year: 2017
Quasi-Optical Mode Converter for a 0.42 THz TE17,4 Mode Pulsed Gyrotron Oscillator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Wang; Tao Song; Hao Shen; Shichao Deng; Diwei Liu; Shenggang Liu
Year: 2017
An Advanced 2.5-D Heterogeneous Integration Packaging for High-Density Neural Sensing Microsystem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Chen Hu; Yu-Chieh Huang; Po-Tsang Huang; Shang-Lin Wu; Hsiao-Chun Chang; Yu-Tao Yang; Yan-Huei You; Jr-Ming Chen; Yan-Yu Huang; Yen-Han Lin; Jeng-Ren Duann; Tzai-Wen Chiu; Wei Hwang; Ching-Te Chuang; Jin-Chern Chiou; Kuan-Neng Chen
Year: 2017
Development of Bumpless Stacking With Bottom–Up TSV Fabrication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shih-Wei Lee; Kuan-Neng Chen
Year: 2017
High Performance of Polysilicon/4H-SiC Dual-Heterojunction Trench Diode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Wang; He-Yu Wang; Fei Cao; Hong-Yu Wang
Year: 2017
AlGaInP-Based LEDs With Al-doped ZnO Transparent Conductive Layer Grown by MOCVD
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiayong Lin; Yanli Pei; Yi Zhuo; Xuejin Ma; Gang Wang
Year: 2017
Analysis of Drain-Induced Barrier Rising in Short-Channel Negative-Capacitance FETs and Its Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junbeom Seo; Jaehyun Lee; Mincheol Shin
Year: 2017
Thermal Influence on Multibias Small- and Large-Signal Parameters of GaAs pHEMT Fabricated in Multilayer 3-D MMIC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohammad Abdul Alim; Ali A. Rezazadeh
Year: 2017
Identification of Energy and Spatial Location of Electron Traps in AlGaN/GaN HFET Structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shlomo Mehari; Arkady Gavrilov; Moshe Eizenberg; Dan Ritter
Year: 2017
Numerical Study of a Multibeam Klystron on the Milky Way High-Performance Computing Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dagang Liu; Mengjun Xie; Ying Cheng; Huihui Wang; Chengwei Yuan
Year: 2017
An Output Coupler for a W-Band High Power Wideband Gyroamplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Paul McElhinney; Craig R. Donaldson; Johannes E. McKay; Liang Zhang; Duncan A. Robertson; Robert I. Hunter; Graham M. Smith; Wenlong He; Adrian W. Cross
Year: 2017
Analytical Model for Junctionless Double-Gate FET in Subthreshold Region
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yong Hyeon Shin; Sungwoo Weon; Daesik Hong; Ilgu Yun
Year: 2017
D-Shaped Fiber Magnetic-Field Sensor Based on Fine-Tuning Magnetic Fluid Grating Period
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Ying; Ke Xu; Liang-Liang Sun; Rui Zhang; Xi-Feng Guo; Guang-Yuan Si
Year: 2017
High-Mobility Pentacene Organic Thin-Film Transistor with LaxNb(1–x)Oy Gate Dielectric Fabricated on Vacuum Tape
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuan Yu Han; Wing Man Tang; P. T. Lai
Year: 2017
Thermally Evaporated SiO Serving as Gate Dielectric in Graphene Field-Effect Transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Letao Yang; Hanbin Wang; Xijian Zhang; Yuxiang Li; Xiufang Chen; Xiangang Xu; Xian Zhao; Aimin Song
Year: 2017
Active Region Design and Gain Characteristics of InP-Based Dilute Bismide Type-II Quantum Wells for Mid-IR Lasers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baile Chen
Year: 2017
W-Band 5 MW Pulse Relativistic Gyrotron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Edward B. Abubakirov; Alexey V. Chirkov; Gregory G. Denisov; Yury M. Guznov; Sergey Yu Kornishin; Alexander N. Leontyev; Oleg P. Plankin; Roman M. Rozental; Anton S. Sedov; Eugeny S. Semenov; Vladimir P. Tarakanov; Nikolay A. Zavolsky; Sergey A. Zapevalov; Vladimir E. Zapevalov
Year: 2017
Propagation Characteristics of Confocal Waveguides Based on Spheroidal Functions for a ${W}$ -Band Gyro-TWT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yelei Yao; Jianxun Wang; Hao Li; Qizhi Tian; Kun Dong; Hao Fu; Yong Luo
Year: 2017
High-Performance Split-Gate-Enhanced UMOSFET With Dual Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ying Wang; Cheng-Hao Yu; Meng-Shi Li; Fei Cao; Yan-Juan Liu
Year: 2017
Surface Potential Equation for Low Effective Mass Channel Common Double-Gate MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ananda Sankar Chakraborty; Santanu Mahapatra
Year: 2017
Bulk FinFET With Low- $\kappa $ Spacers for Continued Scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Angada B. Sachid; Min-Cheng Chen; Chenming Hu
Year: 2017
High Temperature Data Converters in Silicon Carbide CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ashfaqur Rahman; Landon Caley; Sajib Roy; Nathan Kuhns; Alan Mantooth; Jia Di; Anthony M. Francis; Jim Holmes
Year: 2017
Quasi-Analytical Model of 3-D Vertical-RRAM Array Architecture for MB-Level Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiwei Li; Pai-Yu Chen; Haijun Liu; Qingjiang Li; Hui Xu; Shimeng Yu
Year: 2017
Theoretical and Experimental Investigation of Cascaded Microwave Power Sensor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhenxiang Yi; Hao Yan; Xiaoping Liao
Year: 2017
Full Wave Analysis of Coaxial Gyrotron Cavity With Triangular Corrugations on the Insert
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sukwinder Singh; M. V. Kartikeyan
Year: 2017
0.2-THz Dual Mode Sheet Beam Traveling Wave Tube
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yuan Zheng; Diana Gamzina; Neville C. Luhmann
Year: 2017
Design and Realization of GaN Trench Junction-Barrier-Schottky-Diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wenshen Li; Kazuki Nomoto; Manyam Pilla; Ming Pan; Xiang Gao; Debdeep Jena; Huili Grace Xing
Year: 2017
Investigation of GaAsBi/GaAsN Type-II Staggered Heterojunction TFETs with the Analytical Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yibo Wang; Genquan Han; Yan Liu; Chunfu Zhang; Qian Feng; Jincheng Zhang; Yue Hao
Year: 2017
A Comparative Study 4500-V Edge Termination Techniques for SiC Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woongje Sung; B. Jayant Baliga
Year: 2017
Retention and Scalability Perspective of Sub-100-nm Double Gate Tunnel FET DRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nupur Navlakha; Jyi-Tsong Lin; Abhinav Kranti
Year: 2017
A 220/247.5/275-GHz, 1.0-MW, Triple Frequency Regime Gyrotron
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaurav Singh Baghel; M. V. Kartikeyan; Manfred K. Thumm
Year: 2017
A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiang Zheng; Shiwei Feng; Yamin Zhang; Xin He; Yu Wang
Year: 2017
Analytical Model of pH sensing Characteristics of Junctionless Silicon on Insulator ISFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rakhi Narang; Manoj Saxena; Mridula Gupta
Year: 2017
Temperature-Dependent Gate Bias Stress Effect in Dioctylbenzothieno[2,3-b]benzothiophene-Based Thin-Film Transistor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiawei Wang; Tianjun Liu; Yiwei Zhang; Chao Jiang
Year: 2017
Physical-Model Guided Design on Transistor Test Structures for Extracting Metal Charging Design Rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wallace Lin
Year: 2017
Interaction Impedance for Space Harmonics of Circular Helix Using Simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kumar M. M. Ajith; Sheel Aditya; Ciersiang Chua
Year: 2017
Nonlinear Electrothermal Model for Investigation of Heat Transfer Process in a 22-nm FD-SOI MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faouzi Nasri; Mohamed Fadhel Ben Aissa; Hafedh Belmabrouk
Year: 2017
An Improved Flicker Noise Model for Circuit Simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ananda S. Roy; Sungwon Kim; Sivakumar P. Mudanai
Year: 2017
A Comprehensive DC and AC PBTI Modeling Framework for HKMG n-MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subhadeep Mukhopadhyay; Narendra Parihar; Nilesh Goel; Souvik Mahapatra
Year: 2017
The Avalanche-Mode Superjunction LED
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Satadal Dutta; Peter G. Steeneken; Vishal Agarwal; Jurriaan Schmitz; Anne-Johan Annema; Raymond J. E. Hueting
Year: 2017
Proposal for a Leaky-Integrate-Fire Spiking Neuron Based on Magnetoelectric Switching of Ferromagnets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Akhilesh Jaiswal; Sourjya Roy; Gopalakrishnan Srinivasan; Kaushik Roy
Year: 2017
Synaptic Characteristics of Ag/AgInSbTe/Ta-Based Memristor for Pattern Recognition Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Zhang; Yi Li; Xiaoping Wang; Eby G. Friedman
Year: 2017
Ultimate Pixel Based on a Single Transistor With Deep Trapping Gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicolas Thierry Fourches
Year: 2017
A New Design Approach of Dopingless Tunnel FET for Enhancement of Device Characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhagwan Ram Raad; Sukeshni Tirkey; Dheeraj Sharma; Pravin Kondekar
Year: 2017
Fluctuation Sensitivity Map: A Novel Technique to Characterise and Predict Device Behaviour Under Metal Grain Work-Function Variability Effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guillermo Indalecio; Natalia Seoane; Karol Kalna; Antonio J. Garcia-Loureiro
Year: 2017
Unified Compact Model for Nanowire Transistors Including Quantum Effects and Quasi-Ballistic Transport
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Avirup Dasgupta; Amit Agarwal; Yogesh Singh Chauhan
Year: 2017
Set/Reset Switching Model of Cu Atom Switch Based on Electrolysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Munehiro Tada; Toshitsugu Sakamoto
Year: 2017
Effects of Low Viscosity Liquid on the Electro-Optical Properties of Inverse Twisted Nematic Liquid Crystal Display
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Te Chiang; Tsu-Ruey Chou; Szu-Hua Chen; Chih-Yu Chao
Year: 2017
Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rui Gao; Azrif B. Manut; Zhigang Ji; Jigang Ma; Meng Duan; Jian Fu Zhang; Jacopo Franco; Sharifah Wan Muhamad Hatta; Wei Dong Zhang; Ben Kaczer; David Vigar; Dimitri Linten; Guido Groeseneken
Year: 2017
Controllable Momentum Filter Based on a Magnetically Confined Semiconductor Heterostructure With a $\delta$ -Doping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mao-Wang Lu; Sai-Yan Chen; Gui-Lian Zhang
Year: 2017
Nanotube Junctionless FET: Proposal, Design, and Investigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shubham Sahay; Mamidala Jagadesh Kumar
Year: 2017
Suppression of Current Collapse in Enhancement Mode GaN-Based HEMTs Using an AlGaN/GaN/AlGaN Double Heterostructure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shin-Yi Ho; Chun-Hsun Lee; An-Jye Tzou; Hao-Chung Kuo; Yuh-Renn Wu; JianJang Huang
Year: 2017
Numerical Simulation of N+ Source Pocket PIN-GAA-Tunnel FET: Impact of Interface Trap Charges and Temperature
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaya Madan; Rishu Chaujar
Year: 2017
Pulsed I-V on TFETs: Modeling and Measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quentin Smets; Anne Verhulst; Ji-Hong Kim; Jason P. Campbell; David Nminibapiel; Dmitry Veksler; Pragya Shrestha; Rahul Pandey; Eddy Simoen; David Gundlach; Curt Richter; Kin P. Cheung; Suman Datta; Anda Mocuta; Nadine Collaert; Aaron V-Y Thean; Marc M. Heyns
Year: 2017
An Analytical Model to Estimate ${V}_{T}$ Distribution of Partially Correlated Fin Edges in FinFETs Due to Fin-Edge Roughness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amita; S. Mittal; U. Ganguly
Year: 2017


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