Hierarchical test generation using precomputed testsd for modules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Murray, B.T.; Hayes, J.P.
Year: 1988
The KARL/KARATE system-automatic test pattern generation based on RT level descriptions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alfs, G.; Hartenstein, R.W.; Wodtko, A.
Year: 1988
Multiple distributions for biased random test patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wunderlich, H.-J.
Year: 1988
Fault detection effectiveness of weighted random patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Waicukauski, J.A.; Lindbloom, E.
Year: 1988
RTRAM: reconfigurable and testable multi-bit RAM design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pradhan, D.K.; Kamath, N.R.
Year: 1988
An on-chip double-bit error-correcting code for three-dimensional dynamic random-access memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mazumder, P.
Year: 1988
Application of a commercial data base management system to memory device test program generation and debugging
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grennan, S.
Year: 1988
IC qualityd and test transparency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McCluskey, E.J.; Buelow, F.
Year: 1988
Design for test and the cost of quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Salzmann, C.; Funcell, M.; Taylor, R.
Year: 1988
Elimination of incoming test based upon in-process failure and repair costs
Publisher: IEEE Computer Society
Authors:W.D. Ballew; L.M. Streb
Year: 1988
On multiple fault coverage and aliasing probability measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cox, H.; Ivanov, A.; Agarwal, V.K.; Rajski, J.
Year: 1988
Identification of failing tests with cycling registers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Savir, J.; McAnney, W.H.
Year: 1988
A new framework for designing and analyzing BIST techniques: computation of exact aliasing probability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gupta, S.K.; Pradhan, D.K.
Year: 1988
Fault modeling and test algorithm development for static random access memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dekker, R.; Beenker, F.; Thijssen, L.
Year: 1988
A realistic self-test machine for static random access memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dekker, R.; Beenker, F.; Thijssen, L.
Year: 1988
Dual port static RAM testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Raposa, M.J.
Year: 1988
Reliability testing by precise electrical measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dorey, A.P.; Jones, B.K.; Richardson, A.M.; Russell, P.C.; Xu, Y.Z.
Year: 1988
Fault detection of combinational circuits based on supply current
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hashizume, M.; Yamada, K.; Tamesada, T.; Kawakami, M.
Year: 1988
An advanced data compaction approach for test-during burn-in
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schneider, B.; Oestergaard, P.
Year: 1988
In-circuit test fixture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hechtman, C.D.
Year: 1988
New testing equipment for SMT PC boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balme, L.; Mignotte, A.; Monari, J.-Y.; Pondaven, P.; Vaucher, C.
Year: 1988
Evaluating the limitations of high-speed board testers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arena, J.
Year: 1988
Test scheduling for high performance VLSI system implementations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sayah, J.; Kime, C.R.
Year: 1988
A test and maintenance controller for a module containing testable chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Breuer, M.A.; Lien, J.-C.
Year: 1988
A BIST design of structured arrays with fault-tolerant layout
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Katoozi, M.; Soma, M.
Year: 1988
Reconfigurable hardware for pseudoexhaustive test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Udell, J.G., Jr.
Year: 1988
Evaluation of system BIST using computational performance measures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Landis, D.L.; Muha, D.C.
Year: 1988
Some new techniques in waveshape capture and analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Downey, A.E.; Matsuda, K.
Year: 1988
A high-resolution waveform analysis tool
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Powers, P.M.
Year: 1988
Functional test program generation through interactive graphics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tinaztepe, C.; Ozguc, B.
Year: 1988
PGTOOL: an automatic interactive program generation tool for testing new-generation memory devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawabata, Y.; Maruyama, M.; Tejeda, A.
Year: 1988
Fault bundling: reducing machine evaluation activity in hierarchical concurrent fault simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicholls, W.H.; Soma, M.
Year: 1988
Switch-level concurrent fault simulation based on a general purpose list traversal mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Machlin, D.; Gross, D.; Kadkade, S.; Ulrich, E.
Year: 1988
D/sup 3/FS: a demand driven deductive fault simulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, S.P.; Mercer, M.R.; Underwood, B.
Year: 1988
On behavior fault modeling for combinational digital designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chakraborty, T.; Ghosh, S.
Year: 1988
Membrane probe card technology (the future for higher performance wafer test)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leslie, B.; Matta, F.
Year: 1988
Very high density probing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Barsotti, C.; Tremaine, S.; Bonham, M.
Year: 1988
Synthesis and optimization procedures for fully and easily testable sequential machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Devadas, S.; Ma, H.-K.T.; Newton, A.R.; Sangiovanni-Vincentelli, A.
Year: 1988
A knowledge representation scheme for DFT
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D'Souza, D.F.
Year: 1988
Enhancing random-pattern coverage of programmable logic arrays via masking technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fujiwara, H.; Fujisawa, O.; Hikone, K.
Year: 1988
Managing the ASIC design to test process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Culbertson, G.D.
Year: 1988
Built-in test compiler in an ASIC environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Archambeau, E.; Van Egmond, K.
Year: 1988
An expert test program generation system for per-pin testers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Walter, A.; Kleinman, Y.; Edelshteyn, L.; Gartner, J.
Year: 1988
On the testing of multiplexers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Makar, S.R.; McCluskey, E.J.
Year: 1988
Robust tests for parity trees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kundu, S.; Reddy, S.M.
Year: 1988
Stuck-open and transition fault testing in CMOS complex gates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cox, H.; Rajski, J.
Year: 1988
Optical testing of printed circuit boards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tremblay, G.; Meyrueix, P.; Peuzin, J.C.
Year: 1988
Test head design using electrooptic receivers and GaAs pin electronics for a gigahertz production test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Henley, F.J.; Choi, H.-J.
Year: 1988
High-speed pattern generator and GaAs pin electronics for a gigahertz production test system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kratzer, D.J.; Barton, S.; Benley, F.J.; Plomgrem, D.A.
Year: 1988
Circular BIST with partial scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pradhan, M.M.; O'Brien, E.J.; Lam, S.L.; Beausang, J.
Year: 1988
Threading a multiple scan paths in a VLSI circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhawmick, S.; Khaira, M.S.; Mishra, P.P.; Das, A.; Dasgupta, A.; Palchaudhury, P.
Year: 1988
Integrated test logic for video IC's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Beck, J.; Rose, R.; Pappas, J.; Seiler, L.
Year: 1988
Flexible deep memory architecture aids program development
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Russo, J.L.
Year: 1988
Timing generation for DSP testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rosenfeld, E.
Year: 1988
Detecting bridging faults with stuck-at test sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Millman, S.D.; McCluskey, E.J.
Year: 1988
An algorithmic branch and bound method for PLA test pattern generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Robinson, M.; Rajski, J.
Year: 1988
Trouble-shooting: a key to process improvement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yau, C.W.; Chang, S.-L.; Jordan, B.F.; Schwermann, J.J.; Wellman, J.A.
Year: 1988
Predicting and obtaining high final test yields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Balzer, R.J.; Larsen, G.A.
Year: 1988
CIM, electronics manufacturing . . .and ATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hutchinson, N.
Year: 1988
Design for testability of mixed signal integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wagner, K.D.; Williams, T.W.
Year: 1988
TASTE: a tool for analog system testability evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hemink, G.J.; Meijer, B.W.; Kerkhoff, H.G.
Year: 1988
DCIATP-an iterative analog circuit test generation program for generating DC single pattern tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marlett, M.J.; Abraham, J.A.
Year: 1988
On the detection of delay faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pramanick, A.K.; Reddy, S.M.
Year: 1988
Delay test generation. I. Concepts and coverage metrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iyengar, V.S.; Rosen, B.K.; Spillinger, I.
Year: 1988
Delay test generation. II. Algebra and algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iyengar, V.S.; Rosen, B.K.; Spillinger, I.
Year: 1988
Experiences with concurrent fault simulation of diagnostic programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Demba, S.; Ulrich, E.; Panetta, K.; Giramma, D.
Year: 1988
System level fault dictionary generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanaka, H.; Kawai, M.; Sugasaki, I.; Hakuba, T.
Year: 1988
Designs for diagnosability and reliability in VLSI systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Su, S.Y.H.; Ma, H.
Year: 1988
Automatic location of IC design errors using an E-beam system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Melgara, M.; Battu, M.; Garino, P.; Dowe, J.; Vernay, Y.J.; Marzouki, M.; Boland, F.
Year: 1988
Electron beam tester integrated into a VLSI tester
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niijima, H.; Tokunaga, Y.; Koshizuka, S.; Yakuwa, K.; Fazekas, P.; Sturm, M.; Feuerbaum, H.-P.
Year: 1988
Continuous signature monitoring: efficient concurrent-detection of processor control errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilken, K.; Shen, J.P.
Year: 1988
Error detection with latency in sequential circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Holmquist, L.P.; Kinney, L.L.
Year: 1988
Concurrent off-phase built-in self-test of dormant logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sigal, L.J.; Kime, C.R.
Year: 1988
Techniques for user testing of the 68882
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marshall, M.
Year: 1988
Simultaneous switching noise evaluation of advanced CMOS logic (ACL)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stuchlik, K.R.
Year: 1988
Emulative testing at the bus speed limit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Arnett, D.B.; Bhaskar, K.S.
Year: 1988
Built-in test strategy for next generation military avionic hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Merlino, D.H.; Hadjilogiou, J.
Year: 1988
Using scan technology for debug and diagnostics in a workstation environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dervisoglu, B.I.
Year: 1988
Scan diagnostic strategy for the series 10000 PRISM workstation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ricchetti, M.; Hoglund, J.
Year: 1988
CAD tools for supporting system design for testability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hallenbeck, J.J.; Kanopoulos, N.; Vasanthavada, N.; Watterson, J.W.
Year: 1988
Testability using random access test register
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bui, C.
Year: 1988
Designing state machines for testability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Treseler, M.
Year: 1988
On benchmarking digital testing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mourad, S.; McCluskey, E.J.
Year: 1988
The non-linear feedback shift-register as a built-in self-test (BIST) resource
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marinos, P.N.
Year: 1988
Detection of hard faults in a combinational circuit using budget constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stannard, D.; Kaminska, B.
Year: 1988
Partial hardware partitioning: a new pseudo-exhaustive test implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Udell, J.G., Jr.; McCluskey, E.J.
Year: 1988
Defining a standard for fault simulator evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Al-Arian, S.A.; Kwiat, K.A.
Year: 1988
Determination of safe back-driving currents in bond wires and dice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hill, G.J.; Roberts, B.C.; Strudwick, C.P.
Year: 1988
A parallel simulated annealing algorithm for channel routing on a hypercube multiprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brouwer, R.J.; Banerjee, P.
Year: 1988
Object relocation in OX
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kukula, J.H.
Year: 1988
Test generation in a parallel processing environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandra, S.J.; Patel, J.H.
Year: 1988
Super computer technology at Convex
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dozier, H.; Gruger, J.
Year: 1988
The Cray Y-MP-a VLSI supercomputer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bowen, S.
Year: 1988
The design of a reduced ambient temperature, air cooled supercomputer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mullen, D.R.; Fernald, G.
Year: 1988
Comparative analysis of approaches to hardware acceleration for sparse-matrix factorization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sadayappan, P.; Visvanathan, V.
Year: 1988
Sorting on an array of processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jagadish, H.V.
Year: 1988
Floating point CORDIC for matrix computations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cavallaro, J.R.; Luk, F.T.
Year: 1988
Analog circuit synthesis and exploration in OASYS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harjani, R.; Rutenbar, R.A.; Carley, L.R.
Year: 1988
Knowledge-based analog circuit synthesis with flexible architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fung, A.H.; Chen, D.J.; Li, Y.-N.; Sheu, B.J.
Year: 1988
Interconnection delay in very high-speed VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhou, D.; Preparata, F.P.; Kang, S.M.
Year: 1988
Test generation by fault sampling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, V.D.; Farhat, H.; Seth, S.
Year: 1988
The BACK algorithm for sequential test generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng, W.-T.
Year: 1988
Random testability analysis: comparing and evaluating existing approaches
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Camurati, P.; Prinetto, P.; Reorda, M.S.
Year: 1988
Multi-chip packaging for high performance systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chao, C.C.; Chen, K.H.; Kaw, R.; Leibovitz, J.; Nagesh, V.K.; Scholz, K.D.
Year: 1988
Modeling and simulation of coupled lossy lines for VLSI interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Palusinski, O.A.; Cangellaris, A.C.; Prince, J.L.; Liao, J.C.; Vakanis, L.
Year: 1988
Computer-aided simulation of optical interconnects for high-speed digital systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang, A.T.; Gao, D.S.; Kang, S.M.
Year: 1988
Free-space optical crossover interconnects for parallel computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jahns, J.
Year: 1988
Instruction reorganization for a variable-length pipelined microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Abraham, S.; Padmanabhan, K.
Year: 1988
Cache-based pipeline architecture in the Hitachi H32/200 32-bit microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nishimukai, T.; Inayoshi, H.; Takagi, K.; Iwasaki, K.; Kawasaki, I.; Hanawa, M.; Okada, T.
Year: 1988
The capability mechanism of a VLSI processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ghose, K.; Stewart, R.M.
Year: 1988
Design tradeoffs for a 40 MIPS (peak) CMOS 32-bit microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lewis, D.K.; Costello, J.P.; O'Connor, D.M.
Year: 1988
Extension of a transistor level digital timing simulator to include first order analog behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chadha, R.; Chen, C.-F.
Year: 1988
MILES: a mixed level simulator for analog/digital design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stroucken, A.C.J.; van de Ven, G.J.J.M.
Year: 1988
Variable reduction in MOS timing models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zukowski, C.; Chen, D.-P.
Year: 1988
Parallel LU factorization for circuit simulation on an MIMD computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, C.-C.; Hu, Y.-H.
Year: 1988
A class of fault-tolerant cellular permutation networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eleuldj, M.; Aboulhamid, E.M.; Cerny, E.
Year: 1988
Test generation of C-testable array dividers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wey, C.-L.; Chang, S.-M.
Year: 1988
Testing of VLSI regular arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marnane, W.P.; Moore, W.R.
Year: 1988
VLSI programming and silicon compilation-a novel approach from Philips research
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Niessen, C.; van Berkel, C.H.; Rem, M.; Saeijs, R.W.J.J.
Year: 1988
VLSI programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Berkel, C.H.; Rem, M.; Saeijs, R.W.J.J.
Year: 1988
Compilations of communicating processes into delay-insensitive circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van Berkel, C.H.; Saeijs, R.W.J.J.
Year: 1988
The design of the VLSI image-generator ZaP
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Saeijs, R.W.J.J.; van Berkel, C.H.
Year: 1988
Tera-Hertz study of normal and superconducting transmission lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chi, C.C.; Grischkowsky, D.
Year: 1988
Potential applications of high-T/sub c/ superconducting transmission lines in integrated systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatamian, M.; Hornak, L.A.; Tewksbury Stu K
Year: 1988
Automatic layout and optimization of static CMOS cells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mailhot, F.; DeMicheli, G.
Year: 1988
Optimization for automatic cell assembly
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dutt, D.P.; Lakhani, G.
Year: 1988
An octagonal geometry compactor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun, P.K.
Year: 1988
Processor design using path programmable logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Flanagan, J.K.; Nelson, B.E.
Year: 1988
Direct synthesis of mapping circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Diaz-Olavarrieta, L.; Zaky, S.G.
Year: 1988
SID: synthesis of integral design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hooper, D.F., Jr.
Year: 1988
The KARL/KARATE system-integrating functional test development into a CAD environment for VLSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alfs, G.; Hartenstein, R.W.; Wodtko, A.
Year: 1988
Design of a high-speed arithmetic datapath
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Birman, M.; Chu, G.; Hu, L.; McLeod, J.; Bedard, N.; Ware, F.; Torban, L.; Lim, C.M.
Year: 1988
Generation of high speed CMOS multiplier-accumulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pang, K.F.; Soong, H.-W.; Sexton, R.; Ang, P.-H.
Year: 1988
Approaching a nanosecond: a 32 bit adder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bewick, G.; Song, P.; De Micheli, G.; Flynn, M.J.
Year: 1988
A comparison of two digit serial VLSI adders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Irwin, M.J.; Owens, R.M.
Year: 1988
System interface of the NS32532 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sidi, Y.; Maytal, B.; Bikovsky, Z.; Biran, D.; Levy, J.; Milstain, Y.; Ostrer, A.
Year: 1988
Limits of backplane bus design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Borrill, P.L.
Year: 1988
VLSI support for copyback caching protocols on Futurebus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sweazey, P.
Year: 1988
CTP-A family of optimizing compilers for the NS32532 microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bendelac, C.; Erlich, G.
Year: 1988
McMAP: a fast technology mapping procedure for multi-level logic synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lisanke, R.; Brglez, F.; Kedem, G.
Year: 1988
Mapping properties of multi-level logic synthesis operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lega, M.C.
Year: 1988
A rule based logic reorganization system LORES/EX
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ishikawa, J.; Sato, H.; Hiramine, M.; Ishida, K.; Oguri, S.; Kazuma, Y.; Murai, S.
Year: 1988
PLA based finite state machines using Johnson counters as state memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amann, R.; Eschermann, B.; Baitinger, U.G.
Year: 1988
Transient fault behavior in a microprocessor-A case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duba, P.; Lyer, R.K.
Year: 1988
Classical fault analysis for MOS VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shing, B.L.; Franklin, M.A.
Year: 1988
A new class of symmetric error correcting/unidirectional error detecting codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jha, N.K.
Year: 1988
Large memory embedded ASICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Iizuka, T.; Sakurai, T.; Matsunaga, J.; Maeguchi, K.; Kawagai, K.; Kobayashi, T.; Shiotari, Y.; Kobayashi, K.; Miyoshi, T.
Year: 1988
Gate array technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dell'Oca, C.J.
Year: 1988
The Cydra 5 computer system architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schlansker, M.; McNamara, M.
Year: 1988
The Astronautics ZS-1 processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, J.E.; Dermer, G.E.; Vanderwarn, B.D.; Klinger, S.D.; Rozewski, C.M.; Fowler, D.L.; Scidmore, K.R.; Laudon, J.P.
Year: 1988
EXIST: an interactive VLSI architectural environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:van der Meulen, P.S.; Huang, M.-D.; Bar-Gadda, U.; Lee, E.; Baltus, P.
Year: 1988
PARET; an integrated visual tool for the study of parallel systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nichols, K.M.; Edmark, J.T.
Year: 1988
Critic: a knowledge-based program for critiquing circuit designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Spickelmier, R.L.; Newton, A.R.
Year: 1988
A proposed standard test bus and boundary scan architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Whetsel, L.
Year: 1988
IEEE P1149 Proposed Standard Testability Bus-An update with case histories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Turino, J.
Year: 1988
HIT: a standard constructional system for testability and maintainability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilkins, B.R.
Year: 1988
High speed, low power CMOS transmitter-receiver system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gabara, T.J.; Thompson, D.W.
Year: 1988
A high speed static CMOS PLA architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Engeler, W.E.; Lowy, M.; Pedicone, J.; Bloomer, J.; Richotte, J.; Chan, D.
Year: 1988
A matched-delay CMOS TDM multiplexer cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zukowski, C.; Shum, K.
Year: 1988
CREATE-LIFE: a design system for high performances VLSI circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Labrousse, J.; Slavenburg, G.A.
Year: 1988
Microarchitecture of the 80960 high-integration processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hinton, G.; Lai, K.; Steck, R.
Year: 1988
The MIPS M2000 system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Riordan, T.; Grewal, G.P.; Hsu, S.; Kinsel, J.; Libby, J.; March, R.; Mills, M.; Ries, P.; Scofield, R.
Year: 1988
RISC architecture of the M88000
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Melear, C.
Year: 1988
First 32-bit SPARC-based processors implemented in high-speed CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Namjoo, M.
Year: 1988
Synthesis from VHDL
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lis, J.S.; Gajski, D.D.
Year: 1988
Representation of control and timing behavior with applications to interface synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hayati, S.A.; Parker, A.C.; Granacki, J.J.
Year: 1988
A novel approach to the synthesis of practical datapath architectures using artificial intelligence techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brooks, N.S.H.; Mack, R.J.
Year: 1988
UBIST version of the SYCO's control section compiler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Torki, K.; Nicolaidis, M.; Jerraya, A.A.; Courtois, B.
Year: 1988
Integrated design and test synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gebotys, C.H.; Elmasry, M.I.
Year: 1988
Estimation of area and performance overheads for testable VLSI circuits
Publisher: IEEE Computer Society
Authors:J.R. Miles; A.P. Ambler; K.A.E. Totton
Year: 1988
A modular scan-based testability system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brglez, F.; Bryan, D.; Calhoun, J.; Lisanke, R.
Year: 1988
CESAR-A programmable high performance systolic array processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toverud, M.; Anderson, V.
Year: 1988
Reconfiguration strategies in VLSI processor arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Belkhale, K.P.; Banerjee, P.
Year: 1988
Parallel calculation of shortest paths in sparse graphs on a systolic array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bauer, S.; Schwiegelshohn, U.
Year: 1988
Area evaluation metrics for transistor placement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiple, T.; Kollaritsch, P.; Smith, D.; Allen, J.
Year: 1988
VITAL: fully automatic placement strategies for very large semicustom designs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Putatunda, R.; Smith, D.; Stebnisky, M.; Puschak, C.; Patent, P.
Year: 1988
Alternative strategies for applying min-cut to VLSI placement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hill, D.
Year: 1988
A global chip test implementation including built-in self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Erdal, A.C.; Uszynski, P.A.
Year: 1988
A testable PLA design with low overhead and ease of test generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jou, J.-Y.
Year: 1988
Current sensing for built-in testing of CMOS circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Feltham, D.B.I.; Nigh, P.J.; Carley, L.R.; Maly, W.
Year: 1988
Aliasing errors in signature analysis testing of integrated circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Damiani, M.; Olivo, P.; Favalli, M.; Ricco, B.
Year: 1988
A modular VLSI architecture for coincidence detection in positron emission tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Newport, D.F.; Dent, H.M.; Casey, M.E.; Bouldin, D.W.
Year: 1988
A coprocessor with supercomputer capabilities for personal computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Marwood, W.; Clarke, A.P.
Year: 1988
A methodology for the control and custom VLSI implementation of large-scale Clos networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Heath, J.R.; Disch, E.A.
Year: 1988
Set-associative dynamic random access memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ward, S.A.; Zak, R.C.
Year: 1988
Implementation of fast radix-4 division with operands scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ercegovac, M.D.; Lang, T.; Modiri, R.
Year: 1988
A serial-input serial-output bit-sliced convolver
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dadda, L.; Breveglieri, L.
Year: 1988
Use of redundant binary representation for fault-tolerant arithmetic array processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Piuri, V.; Stefanelli, R.
Year: 1988
Parallel decomposition of multipliers modulo (2/sup n/+or-1)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Skavantzos, A.; Taylor, F.J.
Year: 1988
The POTATO chip architecture: a study in tradeoffs for signal processing chip design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sharma, B.; Jain, R.; Breuer, M.A.; Parker, A.C.; Raghavendra, C.; Tseng, C.Y.
Year: 1988
Fault tolerance and testing aspects of an architecture for a generalized sidelobe cancellor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Breuer, M.A.; Majumdar, A.; Raghavendra, C.S.
Year: 1988
VLSI implementation of GSC architecture with a new ripple carry adder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Reed, I.S.; Sharma, B.; Shih, M.T.; Bailey, J.; Truong, T.K.
Year: 1988
Design of a 64-processor by 128-memory crossbar switching network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Miracky, R.F.; Hartmann, A.; Smith, L.N.; Redfield, S.; Ghoshal, U.; Weigler, B.
Year: 1988
Trace driven modelling and performance evaluation of tightly coupled multiprocessor systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luc, K.-Q.; Ong, S.; Hu, E.C.
Year: 1988
A highly parallel processor with an instruction set including relational algebra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faudemay, P.; Etiemble, D.; Bechennec, J.-L.
Year: 1988
Simulated annealing on a multiprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chamberlain, R.D.; Edelman, M.N.; Franklin, M.A.; Witte, E.E.
Year: 1988
Error tolerance in parallel simulated annealing techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jayaraman, R.; Darema, F.
Year: 1988
Stop criteria in simulated annealing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Otten, R.H.J.M.; van Ginneken, L.P.P.P.
Year: 1988
On fault tolerant structure, distributed fault-diagnosis, reconfiguration, and recovery of the array processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hosseini, S.H.
Year: 1988
A self-reconfiguration scheme for fault-tolerant VLSI processor arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pateras, S.; Rajski, J.
Year: 1988
Array partitioning: a methodology for reconfigurability and reconfiguration problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Distante, F.; Lombardi, F.; Sciuto, D.
Year: 1988
APES: an integrated system for behavioral design, simulation and evaluation of array processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Distante, F.; Pieuri, V.
Year: 1988
Design of a 20 MHz 64-tap transversal filter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stearns, C.C.; Luthi, D.A.; Ruetz, P.A.; Ang, P.H.
Year: 1988
A high performance CMOS chipset for FFT processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shen, S.; Magar, S.; Aguilar, R.; Luikuo, G.; Fleming, M.; Rishavy, K.; Murphy, K.; Furman, C.
Year: 1988
A novel VLSI architecture for the real-time implementation of 2-D signal processing systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Park, S.-M.; Alexander, W.E.; Kim, J.H.; Batchelor, W.E.; Krakow, W.T.
Year: 1988
A GaAs vector memory system for signal processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Misko, T.A.
Year: 1988
A functional approach to formal hardware verification: the MTI experience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Borritone, D.; Camurati, P.; Paillet, J.L.; Prinetto, P.
Year: 1988
A higher level hardware design verification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Takahara, A.; Nanya, T.
Year: 1988
Proof and synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fourman, M.P.; Palmer, W.J.; Zimmer, R.M.
Year: 1988
Verifiable and executable theories of design for synthesizing correct hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin, S.-K.; Greene, K.J.
Year: 1988
ES/3090: a realization of ESA/370 system architecture in IBM's most powerful mainframe computer through a balance of technology and system innovations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nohilly, W.J.
Year: 1988
The software process model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gustafson, D.A.; Melton, A.C.; Chen, Y.-C.; Baker, A.L.; Bieman, J.M.
Year: 1988
A case study in cleanroom software engineering: the IBM COBOL Structuring Facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Linger, R.C.; Mills, H.D.
Year: 1988
Computer aided software configuration management with KMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Faltenbacher, W.
Year: 1988
Experimental analysis of SIMD recursive digital filtering on the PASM system prototype
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McPheters, M.J., Jr.; Casavant, T.L.
Year: 1988
Technology transfer of software engineering to developing countries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pau, A.
Year: 1988
A rule-based compactor for VLSI/CAD mask layout
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsiao, P.-Y.; Syau, C.Y.; Feng, W.-S.; Parng, T.M.; Hsu, C.C.
Year: 1988
A hierarchical coding of reduced picture information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bourbakis, N.G.; Klinger, A.
Year: 1988
STATEMATE and cruise control: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, S.L.; Gerhart, S.L.
Year: 1988
Applications of software reliability measurement to instruments and calculators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kruger, G.; O'Donnell, B.
Year: 1988
Verifiable program construction in a user-friendly style
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Naftalin, M.
Year: 1988
Editing model based on the object-oriented approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Watanabe, T.; Yoshida, Y.; Fukumura, T.
Year: 1988
Another approach to system decomposition: requirements clustering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsia, P.; Yaung, A.T.
Year: 1988
An approach to software requirement specification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yau, S.S.; Liu, C.-S.
Year: 1988
Software engineering-retrospect and prospect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mills, H.D.
Year: 1988
Design and implementation of the high performance integrated voice/data (IVD) token ring protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lee, J.Y.; Jacobson, D.W.
Year: 1988
A simulation approach for network operations performance studies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, A.L.P.; Cameron, E.J.; Shuttleworth, G.F.; Anderson, E.C.
Year: 1988
A technique to derive the detailed time costs of parallel computations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ammar, R.A.; Qin, B.
Year: 1988
Incorporating transactions in a requirement engineering method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hallmann, M.
Year: 1988
Early and not-so-early prototyping-rationale and tool support
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ratcliff, B.
Year: 1988
Designing software for maintenance and performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mikkilineni, R.P.; Utter, D.F.
Year: 1988
Models of programmer behaviour: a comparative study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Siddiqi, J.; Khazaei, B.
Year: 1988
A comprehensive and aggressive quality assurance program as a foundation for improving software productivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, M.M.; Hall, W.R.
Year: 1988
A generic technique for developing a software sizing and effort estimation model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kulkarni, A.; Greenspan, J.B.; Kriegman, D.A.; Logan, J.J.; Roth, T.D.
Year: 1988
An efficient method for incremental attribute evaluation by using multi-dependency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lu, Q.; Qian, J.
Year: 1988
Type management system in the Nexus distributed programming environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tripathi, A.; Ong, S.
Year: 1988
A data model supporting system engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Batz, T.; Baumann, P.; Kohler, D.
Year: 1988
Vishnu: an object-oriented database management system supporting software engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moore, D.J.; Drew, P.A.; Ganti, M.S.; Nassif, R.J.; Podar, S.; Taenzer, D.H.
Year: 1988
CASE perspectives
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weber, H.
Year: 1988
Process control within a software production environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Schafer, W.
Year: 1988
Integrating three tool-based approaches to software engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nicholl, R.A.
Year: 1988
Automated testcase generation for data abstraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jalote, P.; Caballero, M.G.
Year: 1988
Scheduler 1-2-3: an interactive schedulability analyzer for real-time systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tokuda, H.; Kotera, M.
Year: 1988
Finding program slices for recursive procedures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hwang, J.C.; Du, M.W.; Chou, C.R.
Year: 1988
Building and managing software libraries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jones, G.; Prieto-Diaz, R.
Year: 1988
A model for development of customizable applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Atchan, H.M.; Bell, R.
Year: 1988
Local concurrent error detection and correction in data structures using virtual backpointers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, C.C.; Chen, P.P.; Fuchs, W.K.
Year: 1988
Automatic test case generation from relational algebra queries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, W.T.; Volovik, D.; Keefe, T.F.; Fayad, M.E.
Year: 1988
Preserving autonomy in a heterogeneous multidatabase system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Holtkamp, B.
Year: 1988
SIMD and MIMD processing in the Texas Reconfigurable Array Computer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lipovski, G.J.
Year: 1988
Experimentally based parallel architecture evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fineberg, S.A.
Year: 1988
A user's perspective on the state of parallel processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuhl, J.G.
Year: 1988
Low-level programming of parallel supercomputers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Casavant, T.L.
Year: 1988
Reliability-oriented task allocation in redundant distributed systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wang, J.-P.; Shatz, S.M.
Year: 1988
Executable assertion development for the distributed parallel environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McMillin, B.M.; Ni, L.M.
Year: 1988
Designing parallel algorithms from forests and multistage graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, G.H.; Chern, M.-S.
Year: 1988
Software issues facing parallel architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cavano, J.P.
Year: 1988
Issues in software development for concurrent computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fox, G.C.
Year: 1988
Software development issues for parallel processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Russell, L.; Lightfoot, R.N.C.
Year: 1988
Optimal number of processors for finding the maximum value on multiprocessor systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Horiguchi, S.; Shigei, Y.
Year: 1988
A quadtree communication structure for fast data searching and distribution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin, W.; Sheu, T.-L.; Das, C.R.
Year: 1988
Reliable garbage collection in distributed object oriented systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gupta, A.; Fuchs, W.K.
Year: 1988
An algebraic technique for deductive database system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiang, Y.J.
Year: 1988
A probabilistic study on the transaction's waits and deadlocks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huang, Y.F.; Chin, Y.H.
Year: 1988
A logic for handling time in temporal databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bassiouni, M.A.
Year: 1988
A fully-distributed approach to concurrency control in replicated database systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Singhal, M.
Year: 1988
Database design tool generation via software reusability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong, S.; Maryanski, F.
Year: 1988
An evaluation of software structure metrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kitchenham, B.A.
Year: 1988
A database query language for visual interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kawagoe, K.
Year: 1988
A knowledge-based system approach to the development of a system functional requirement specification processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bruno, W.F.; Narayanaswami, G.; Aoyama, M.; Chang, C.K.
Year: 1988
Knowledge-aided engineering environment for design and manufacturing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shin, D.G.; Maryanski, F.
Year: 1988
Liaison: an intelligent rule driven interface for software engineering environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Law, I.S.
Year: 1988
Rapid prototyping using FRORL language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, J.J.P.; Aoyama, M.; Chang, Y.L.
Year: 1988
The requirement model in a knowledge-based rapid prototyping system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, P.-M.; Chou, C.-R.
Year: 1988
A knowledge-based system for multi-layer channel routing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vakil, D.; Zargham, M.R.; Danhof, K.J.
Year: 1988
Object-oriented paradigm and software engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, W.T.; Zualkernan, I.
Year: 1988
Object-oriented requirements analysis (OORA)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coad, P., Jr.
Year: 1988
Object-oriented techniques based on specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berzins, V.
Year: 1988
Potential use of the object paradigm for software engineering environments in the 1990s
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mikkilineni, R.V.
Year: 1988
Semantic and object-oriented database support for software environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:King, R.
Year: 1988
Learning heuristic functions for numeric optimization problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lowrie, M.; Wah, B.
Year: 1988
Heuristic solutions for the general maximum independent set problem with applications to expert system design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, I.F.; Shao, W.-Z.; Teh, H.-H.
Year: 1988
Seismic event interpretation using scripts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kandt, K.; Yuenger, P.
Year: 1988
Modularity in the METAL system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu, J.S.
Year: 1988
A preliminary study of appositive constructions in Japanese and English
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alam, Y.S.
Year: 1988
Coherent analysis of argumentative discourse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cohen, R.
Year: 1988
Contextual knowledge for summarizing Japanese texts and generating English sentences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sato, T.; Aoe, J.-I.; Yasutome, S.
Year: 1988
An efficient digital search algorithm by using a double-array structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aoe, J.-I.; Yasutome, S.; Sato, T.
Year: 1988
Extensions on performance evaluation techniques for concurrent systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yaw, Y.; Wei, B.W.Y.; Ramamoorthy, C.V.; Tsai, W.T.
Year: 1988
Weighted fuzzy logic and its applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:He, X.
Year: 1988
Nonrecursive algorithms for reconstructing a binary tree from its traversals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, G.H.; Yu, M.S.; Liu, L.T.
Year: 1988
Expert systems and software engineering
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, J.J.P.; Yun, D.Y.; Harandi, M.T.; Tanik, M.M.; Tsai, W.-T.; Scacchi, W.
Year: 1988
Knowledge-based software development: issues and strategies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harandi, M.T.
Year: 1988
In search of silver bullet (software engineering)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tanik, M.M.
Year: 1988
Expert systems for software engineering?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, W.T.; Zualkernan, I.
Year: 1988
Synthesis rules for cyclic interactions among processes in concurrent systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramamoorthy, C.V.; Yaw, Y.; Tsai, W.T.
Year: 1988
Protocol synthesis in a state-transition model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chu, P.-Y.M.; Liu, M.T.
Year: 1988
Asynchronous recovery protocols for distributed systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hwang, K.W.; Tsai, W.T.
Year: 1988
An intentional language as the basis of a 3-D spreadsheet design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Du, W.; Wadge, W.W.
Year: 1988
Programming through pictorial transformations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Teh Hsia; Ambler, A.L.
Year: 1988
A unifying model for lookahead LR parsing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bermudez, M.E.
Year: 1988
Efficient retargetable compiler code generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hatcher, P.J.; Tuller, J.W.
Year: 1988
A language for high-level programming of mathematical applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Grossman, F.; Klerer, R.J.; Klerer, M.
Year: 1988
PNSOFT: a menu-driven software package for Petri-net modeling and analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hura, G.S.; Costarella, M.A.; Buell, C.G.; Cvetanovic, M.M.
Year: 1988
Programming the Connection Machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bagrodia, R.; Chandy, K.M.
Year: 1988
Structure and generation of computer languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mally, C.
Year: 1988
The FX-87 Interpreter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jouvelot, P.; Gifford, D.K.
Year: 1988
Symbolic dimension bound checking in a matrix language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:de Jong, V.J.
Year: 1988
Distributed programming with shared data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bal, H.E.; Tanenbaum, A.S.
Year: 1988
High level communication primitives for concurrent systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garg, V.K.; Ramamoorthy, C.V.
Year: 1988
Describing data control in programming languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Oudshoorn, M.; Marlin, C.
Year: 1988
Language specification by multi-axiom grammars
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rus, T.; Le Peau, J.P.
Year: 1988
The influence of language semantics on program slices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hwang, J.C.; Du, M.W.; Chou, C.R.
Year: 1988
Generalized logical operators for temporal languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bassiouni, M.A.; Llewellyn, M.
Year: 1988
The elimination of intermediate containers in the evaluation of first-class array expressions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McCrosky, C.
Year: 1988
Experience with Rendezvous (tasking and communication model)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kamel, R.; Gammage, N.
Year: 1988
Languages in electrotechnical laboratory's dataflow machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Herath, H.
Year: 1988
Specification languages-assessment and trends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, C.K.; Brackett, J.W.; Davis, A.M.; Grabon, P.C.; Haizuka, T.; Hsia, P.
Year: 1988
On the representation of problems in artificial intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Amarel, S.
Year: 1988
Future directions in programming languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DiNitto, S.A., Jr.
Year: 1988
Report on a business definition language system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeh, R.T.
Year: 1988
KSL: a reflective object-oriented programming language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ibrahim, M.H.; Cummins, F.A.
Year: 1988
The precise control of inheritance and the inheritance of theory in the ADABTPL language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sheard, T.; Stemple, D.
Year: 1988
Integrating abstract data types with object-oriented programming by specification-based approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhong, Y.; Ishizuka, S.; Enari, R.
Year: 1988
Language aspects of ENVISAGER: an object-oriented environment for the specification of real-time systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Diaz-Gonzales, J.P.; Urban, J.E.
Year: 1988
Object-oriented conceptual programming based on PROT nets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baldassari, M.; Berti, V.; Bruno, G.
Year: 1988
Data security in an object-oriented environment such as Smalltalk-80
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tosten, R.S.
Year: 1988
Object oriented programming (OOP) and its relevance to designing intelligent software systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wechsler, H.; Rine, D.
Year: 1988
A naming specification language for syntax-directed editors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vorthmann, S.; LeBlanc, R.J.
Year: 1988
A specification language for real-time distributed systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, C.K.; Jiang, T.M.; Aoyama, M.
Year: 1988
The design of software interfaces in Spec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Berzins, V.
Year: 1988
FLEX: towards flexible real-time programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Natarajan, S.; Lin, K.-J.
Year: 1988
TXL: a rapid prototyping system for programming language dialects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cordy, J.R.; Halpern, C.D.; Promislow, E.
Year: 1988
Execution of structured analysis specifications with an object oriented Petri net approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pulli, P.J.
Year: 1988
Array theory, logic and the Nial language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Glasgow, J.I.; Jenkins, M.A.
Year: 1988
Languages for intelligent specification systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Golshani, F.; Scott, W.T.; White, P.D.
Year: 1988
Programming parallel computers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chandy K., M.
Year: 1988
Visual languages and software specifications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yau, S.S.; Jia, Xiaoping
Year: 1988
Common Lisp relations: an extension of Lisp for logic programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thrift, P.
Year: 1988
Using obviously synchronizable series expressions instead of loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Waters, R.C.
Year: 1988
Type inference by program transformation and partial evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fruwirth, T.W.
Year: 1988
Architectural design methodology for supporting high level programming languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aletan, S.; Lively, W.
Year: 1988
Adapting modules to an integrated programming environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Madhavji, N.H.; Desharnais, J.; Pinsonneault, L.; Toubache, K.
Year: 1988
Specifications for the development of a software environment for evaluation and translation of assembly languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bourbakis, N.G.
Year: 1988
APAS: the Ada Programming Assistant System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, M.H.; Shim, Y.C.; Ramamoorthy, C.V.
Year: 1988
The use of aFP to design regular array algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yen-Chun LIn; Ferng-Ching Lin
Year: 1988
Using higher order logic and functional languages to synthesize correct hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shiu-Kai Chin; Stabler, E.P.; Greene, K.J.
Year: 1988
TOBOL-a new methodology for the top-to-bottom level hardware description in VLSI design-automation systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen, C.Y.R.
Year: 1988
A declarative approach to software requirement specification languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tsai, J.J.P.; Weigert, T.; Aoyama, M.
Year: 1988
Software requirements specification from a cognitive psychology perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Snodgrass, J.G.; Yun, D.Y.Y.
Year: 1988
Software design representation: design object descriptive attribute notation (DODAN)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yin, W.P.; Tanik, M.M.; Yun, D.Y.Y.
Year: 1988
Are knowledge representations the answer to requirement analysis?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zualkernan, I.A.; Tsai, W.T.
Year: 1988
Independent checkpointing and concurrent rollback for recovery in distributed systems-an optimistic approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhargava, B.; Shu-Renn Lian
Year: 1988
Checkpointing and rollback recovery in a distributed system using common time base
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramanathan, P.; Shin, K.G.
Year: 1988
A commit protocol for checkpointing transactions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pui Ng
Year: 1988
Pessimistic protocols for quasi-partitioned distributed database systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lilien, L.; Chung, T.M.
Year: 1988
Quorum consensus algorithms for secure and reliable data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Agrawal, D.; El Abbadi, A.
Year: 1988
A robust, distributed election protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, J.L.; Belford, G.G.
Year: 1988
An experimental investigation of software diversity in a fault-tolerant avionics application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Caglayan, A.K.; Lorczak, P.R.; Eckhardt, D.E.
Year: 1988
An analysis of the performance impacts of lookahead execution in the conversation scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kim, K.H.; Yang, S.M.
Year: 1988
Task allocation for optimized system reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jia-Ping Wang; Shatz, S.M.
Year: 1988
Interactive consistency with multiple failure modes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thambidurai, P.; You-keun Park
Year: 1988
An implementation of reliable broadcast using an unreliable multicast facility
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Garcia-Molina, H.; Kogan, B.
Year: 1988
A fault-tolerant protocol for atomic broadcast
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shyh-Wei Luan; Gligor, V.D.
Year: 1988
A realistic evaluation of optimistic dynamic voting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Long, D.D.E.; Paris, J.-F.
Year: 1988
Vote assignments in weighted voting mechanisms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhijun Tong; Kain, R.Y.
Year: 1988
On the diagnosis of Byzantine faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramarao, K.V.S.; Adams, J.C.
Year: 1988
Implementation of RAID
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhargava, B.; Riedl, J.
Year: 1988
Recovery in the Clouds kernel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pitts, D.V.
Year: 1988
Transaction management in a distributed database system for local area networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rusinkiewicz, M.; Georgakopoulos, D.
Year: 1988
Recovering imprecise transactions with real-time constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vrbsky, S.V.; Kwei-Jay Lin
Year: 1988
Distributed locking: a mechanism for constructing highly available objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wilkes, C.T.; LeBlanc, R.J., Jr.
Year: 1988
The commit/abort problem in type-specific locking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Noe, J.D.; Kaiser, J.; Kroeger, R.; Nett, E.
Year: 1988
CONCEPT D: a graphical language for conceptual modelling and data base use
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kangassalo, H.
Year: 1988
Design and implementation of an interactive graphical query interface for a relational database management system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Czejdo, B.; Reddy, V.; Rusinkiewicz, M.
Year: 1988
Graphical user languages for querying information: where to look for criteria?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rohr, G.
Year: 1988
Visual programming with objects and relations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rogers, G.
Year: 1988
Elements of visual language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Selker, T.; Koved, L.
Year: 1988
Miro semantics for security
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maimone, M.W.; Tygar, J.D.; Wing, J.M.
Year: 1988
A model for the specification and interpretation of visual languages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tortora, G.; Leoncini, P.
Year: 1988
A tree systems inference algorithm for an iconic environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guercio, A.; Chang, S.-K.
Year: 1988
A framework for construction of icon systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hirakawa, M.; Iwata, S.; Tahara, Y.; Tanaka, M.; Ichikawa, T.
Year: 1988
Construction and manipulation of dynamic icons
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hsia, Y.-T.; Ambler, A.L.
Year: 1988
The design of a visual language compiler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang, S.-K.
Year: 1988
Some remarks on developing application programs in Visual
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cheng, K.Y.; Hwu, M.S.; Hsu, S.Y.
Year: 1988
The VIP interface design system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Droms, R.E.; Huang, K.-T.; Swart, C.B.
Year: 1988
Visual programming in the interface construction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Smith, D.N.
Year: 1988
A visual interface for generic message translation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blattner, M.M.; Kou, L.T.; Carlson, J.W.; Daniel, D.W.
Year: 1988
Editable graphical histories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kurlander, D.; Feiner, S.
Year: 1988
MPL-a graphical programming environment for matrix processing based on logic and constraints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yeung, R.
Year: 1988
An interface description language for graph editors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Newbery, F.J.
Year: 1988
Using the expert's diagrams as a specification of expertise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Casner, S.; Bonar, J.
Year: 1988
A visual environment for system design and prototyping
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ikemoto, H.; Kusui, Y.; Tsuda, J.; Furuwaka, T.
Year: 1988
Expressing high-level visual concurrency structures in the PFG kernel language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Stotts, P.D.
Year: 1988
Visualization of experimental systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haarslev, V.; Moller, R.
Year: 1988
Graphical and iconic programming languages for distributed process control: an object oriented approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Coote, S.; Gallagher, J.; Mariani, J.; Rodden, T.; Scott, A.; Shepherd, D.
Year: 1988
Automatic data visualization for novice Pascal programmers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Myers, B.A.; Chandhok, R.; Sareen, A.
Year: 1988
The DSP system-a visual system to support teaching of programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olsen, K.A.; Harnes, P.; Pedersen, B.; Tosse, O.-J.
Year: 1988
Designing training scenarios by rehearsal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mears, J.E.; Hughes, C.E.; Moshell, J.M.
Year: 1988
The design view: a design oriented, high-level visual programming environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roberts, J.; Pane, J.; Stehlik, M.; Carrasquel, J.
Year: 1988
The Fabrik programming environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ludolph, F.; Chow, Y.-Y.; Ingalls, D.; Wallace, S.; Doyle, K.
Year: 1988
C/sup 2/: a mixed textual/graphical environment for C
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kopache, M.E.; Glinert, E.P.
Year: 1988
IGIP: a framework towards open-ended visual programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Van Reeth, F.; Flerackers, E.; D'Hondt, T.
Year: 1988
A knowledge-based approach to the shortest path problem in a digitized map
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jungert, E.; Holmes, P.D.
Year: 1988
Hardness vs. randomness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nisan, N.; Wigderson, A.
Year: 1988
On the existence of pseudorandom generators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goldreich, O.; Krawczyk, H.; Luby, M.
Year: 1988
Zero-knowledge with log-space verifiers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kilian, J.
Year: 1988
Homogeneous measures and polynomial time invariants
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Levin, L.A.
Year: 1988
Achieving oblivious transfer using weakened security assumptions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Crepeau, C.; Kilian, J.
Year: 1988
Lower bounds for integer greatest common divisor computations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mansour, Y.; Schieber, B.; Tiwari, P.
Year: 1988
A lower bound for matrix multiplication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bshouty, N.H.
Year: 1988
The influence of variables on Boolean functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kahn, J.; Kalai, G.; Linial, N.
Year: 1988
Lattices, mobius functions and communications complexity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lovasz, L.; Saks, M.
Year: 1988
Near-optimal time-space tradeoff for element distinctness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yao, A.C.-C.
Year: 1988
Predicting (0, 1)-functions on randomly drawn points
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haussler, D.; Littlestone, N.; Warmuth, M.K.
Year: 1988
Learning probabilistic prediction functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:DeSantis, A.; Markowsky, G.; Wegman, M.N.
Year: 1988
Results on learnability and the Vapnik-Chervonenkis dimension
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Linial, N.; Mansour, Y.; Rivest, R.L.
Year: 1988
Learning via queries
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gasarch, W.I.
Year: 1988
Effect of connectivity in associative memory models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Komlos, J.; Paturi, R.
Year: 1988
Efficient parallel algorithms for chordal graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Klein, P.N.
Year: 1988
Removing randomness in parallel computation without a processor penalty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luby, M.
Year: 1988
Sublinear-time parallel algorithms for matching and related problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goldberg, A.V.; Plotkin, S.A.; Vaidya, P.M.
Year: 1988
Optimal parallel algorithm for the Hamiltonian cycle problem on dense graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dahlhaus, E.; Hajnal, P.; Karpinski, M.
Year: 1988
Parallel comparison algorithms for approximation problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alon, N.; Azar, Y.
Year: 1988
Dynamic networks are as fast as static networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Awerbuch, B.; Sipser, M.
Year: 1988
Increasing the size of a network by a constant factor can increase performance by more than a constant factor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kock, R.R.
Year: 1988
On the effects of feedback in dynamic network protocols
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Awerbuch, B.
Year: 1988
Coordinated traversal: (t+1)-round Byzantine agreement in polynomial time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Moses, Y.; Waarts, O.
Year: 1988
Universal packet routing algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leighton, T.; Maggs, B.; Rao, S.
Year: 1988
Fast management of permutation groups
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Babai, L.; Luks, E.M.; Seress, A.
Year: 1988
New algorithms for finding irreducible polynomials over finite fields
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shoup, V.
Year: 1988
A faster PSPACE algorithm for deciding the existential theory of the reals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Renegar, J.
Year: 1988
Computing with polynomials given by black boxes for their evaluations: greatest common divisors, factorization, separation of numerators and denominators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kaltofen, E.; Trager, B.
Year: 1988
On the complexity of kinodynamic planning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Canny; B. Donald; J. Reif; P. Xavier
Year: 1988
On the complexity of omega -automata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Safra, S.
Year: 1988
The complexity of tree automata and logics of programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Emerson, E.A.; Jutla, C.S.
Year: 1988
Verifying temporal properties of finite-state probabilistic programs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Courcoubetis, C.; Yannakakis, M.
Year: 1988
The complexity of the pigeonhole principle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ajtai, M.
Year: 1988
Reachability is harder for directed than for undirected finite graphs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ajtai, M.; Fagin, R.
Year: 1988
Fully abstract models of the lazy lambda calculus
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ong, C.-H.L.
Year: 1988
Nonexpressibility of fairness and signaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:McAllester, D.; Panangaden, P.; Shanbhogue, V.
Year: 1988
On a theory of computation over the real numbers; NP completeness, recursive functions and universal machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Blum, L.; Shub, M.; Smale, S.
Year: 1988
Constructive results from graph minors: linkless embeddings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Motwani, R.; Raghunathan, A.; Saran, H.
Year: 1988
Polytopes, permanents and graphs with large factors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dagum, P.; Luby, M.; Mihail, M.; Vazirani, U.
Year: 1988
An approximate max-flow min-cut theorem for uniform multicommodity flow problems with applications to approximation algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leighton, T.; Rao, S.
Year: 1988
Combinatorial algorithms for the generalized circulation problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goldberg, A.V.; Plotkin, S.A.; Tardos, E.
Year: 1988
Polynomial algorithm for the k-cut problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Goldschmidt, O.; Hochbaum, D.S.
Year: 1988
A Las Vegas algorithm for linear programming when the dimension is small
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clarkson, K.L.
Year: 1988
Genus g graphs have pagenumber O( square root g)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Malitz, S.M.
Year: 1988
Take a walk, grow a tree
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bhatt, S.; Jin-Yi Cai
Year: 1988
Bounds on the cover time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Broder, A.Z.; Karlin, A.R.
Year: 1988
Speeding up dynamic programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Eppstein, D.; Galil, Z.; Giancarlo, R.
Year: 1988
Notes on searching in multidimensional monotone arrays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aggarwal, A.; Park, J.
Year: 1988
Three stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fredman, M.L.; Goldsmith, D.L.
Year: 1988
Dynamic perfect hashing: upper and lower bounds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dietzfelbinger, M.; Karlin, A.; Mehlhorn, K.; auf der Heide, F.M.; Rohnert, H.; Tarjan, R.E.
Year: 1988
On pointers versus addresses
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ben-Amram, A.M.; Galil, Z.
Year: 1988
A deterministic view of random sampling and its use in geometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chazelle, B.; Friedman, J.
Year: 1988
New upper bounds in Klee's measure problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Overmars, M.H.; Yap, Chee-Keng
Year: 1988
Fully dynamic techniques for point location and transitive closure in planar structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Preparata, F.P.; Tamassia, R.
Year: 1988
Combinatorial complexity bounds for arrangements of curves and surfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Clarkson, K.L.; Edelsbrunner, H.; Guibas, L.J.; Sharir, M.; Welzl, E.
Year: 1988
A fast planar partition algorithm. I
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mulmuley, K.
Year: 1988
An optimal algorithm for intersecting line segments in the plane
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chazelle, B.; Edelsbrunner, H.
Year: 1988
Covering polygons is hard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Culberson, J.C.; Reckhow, R.A.
Year: 1988
A hybrid to range image detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yokoya, N.; Levine, M.
Year: 1988
ERRORS-2: a 3D object recognition system using aspect graphs
Publisher: IEEE Computer Society
Authors:K. Bowyer; J. Stewman; L. Stark; D. Eggert
Year: 1988
Rectification of images for binocular and trinocular stereovision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ayache, N.; Hansen, C.
Year: 1988
Occlusion-free 3D recovery using mirror images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Okazaki, K.; Kajimi, N.; Fukui, Y.; Tamura, S.; Mitsumoto, H.
Year: 1988
Description of 3D object in range image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangyou Xu; Xiang Wan
Year: 1988
Description of signature images and its application to their classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ammar, M.; Yoshida, Y.; Fukumura, T.
Year: 1988
Pre-processing of envelope images for optical character recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Downton, A.C.; Leedham, C.G.
Year: 1988
Structural analysis of handwritten mathematical expressions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zi-Xiong Wang; Faure, C.
Year: 1988
Writer identification based on the arc pattern transformation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yoshimura, I.; Yoshimura, M.
Year: 1988
An intelligent character recognition system with high accuracy and high speed by integrating image-type and logical-type information processings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kimura, M.; Ejima, T.; Aso, H.; Yashiro, H.; Son, N.; Suzuki, M.
Year: 1988
A unified structural-stochastic model for texture analysis and synthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Francos, J.M.; Meiri, A.Z.
Year: 1988
Blind texture segmentation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gagalowicz, A.; Graffigne, C.
Year: 1988
Texture segmentation using iterative estimate of energy states
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiao Gong; Nai-Kuan Huang
Year: 1988
Texture inspection with self-adaptive convolution filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dewaele, P.; Van Gool, L.; Wambacq, A.; Oosterlinck, A.
Year: 1988
Detecting defects in texture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chetverikov, D.
Year: 1988
Partial matching of two dimensional shapes using random coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-hwa Lee; Gim Pew Quek
Year: 1988
Longest k-distance substrings of two strings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Csirik, J.; Bunke, H.
Year: 1988
An improved model-based matching method using footprints
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiawei Hong; Wolfson, H.
Year: 1988
Elastic matching versus rigid matching by use of dynamic programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maitre, H.; Wu, Y.F.
Year: 1988
A new approach to point pattern matching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiawei Hong; Xiaonan Tan
Year: 1988
Recent progress in the recognition of objects from range data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Brady, J.P.; Nandhakumar, N.; Aggarwal, J.K.
Year: 1988
CSG-based object recognition using range images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Chung Lin; Tsu-Wang Chen
Year: 1988
Recognizing and locating polyhedral objects from sparse range data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang, S.; Mohr, R.; Tombre, K.
Year: 1988
Application of a knowledge-based system to the interpretation of ultrasound images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Towers, S.; Baldock, R.
Year: 1988
A blackboard-based approach to handwritten ZIP code recognition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hull, J.J.; Srihari, S.N.; Cohen, E.; Kuan, L.; Cullen, P.; Palumbo, P.
Year: 1988
An expert system for the automatic classification and description of zooplanktons from monocular images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Thonnat, M.; Gandelin, M.
Year: 1988
The use of high-level knowledge for enhanced entry of engineering drawings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Benjamin, D.; Forgues, P.; Gulko, E.; Massicotte, J.; Meubus, C.
Year: 1988
Expert systems for image processing-knowledge-based composition of image analysis processes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Matsuyama, T.
Year: 1988
Nonlinear transformations of digitized patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li, Z.C.; Bui, T.D.; Suen, C.Y.; Tang, Y.Y.
Year: 1988
Improved metrics in image processing applied to the Hilditch skeleton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Verwer, B.J.H.
Year: 1988
New efficient representation of photographic images with restricted number of gray levels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Linnainmaa, S.
Year: 1988
A new dynamic programming method for stereo vision ignoring epipolar geometry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu, Y.F.; Maitre, H.
Year: 1988
A stereo vision technique using curve-segments and relaxation matching
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nasrabadi, N.M.; Chiang, J.L.
Year: 1988
Dynamic scene analysis and the 8-point algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Su-Shing Chen
Year: 1988
Scene interpretation based on boundary representations of stereo images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sugimoto, K.; Takahashi, H.; Tomita, F.
Year: 1988
Solving the stiff problem in computer vision by trade-off optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chengzhi Huang; Yanda Li; Tong Chang
Year: 1988
Chinese character recognition: a twenty-five-year retrospective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nagy, G.
Year: 1988


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