X-ray active matrix pixel sensors based on J-FET technology developed for the Linac Coherent Light Source
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.A. Carini; W. Chen; Z. Li; P. Rehak; D.P. Siddons
Year: 2007
A PET prototype for in-beam monitoring of proton therapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Vecchio; F. Attanasi; N. Belcari; M. Camarda; G.A. Pablo Cirrone; G. Cuttone; A. Del Guerra; F. Di Rosa; N. Lanconelli; S. Moehrs; V. Rosso; G. Russo
Year: 2007
Development of a HpXe hybrid gamma detector aiming scintigraphy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.D.R. Azevedo; C.A.B. Oliveira; H. Natal da Luz; A.L. Ferreira; J.M.F. dos Santos; J.F.C. Veloso
Year: 2007
Semi-automatic position calibration for a dual-head small animal PET scanner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhihao Hu; Chien-Min Kao; Wei Liu; Yun Dong; Zhi Zhang; Qingguo Xie; Chin-Tu Chen
Year: 2007
Measurement of two-dimensional photon beam distributions using a fiber-optic radiation sensor for small field radiation therapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoung Won Jang; Dong Hyun Cho; Sang Hoon Shin; Hyung Sik Kim; Bongsoo Lee; Soon-Cheol Chung; Jeong Han Yi; Sin Kim; Hyosung Cho
Year: 2007
Purification and laser isotope separation of 176Yb for Medical Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Taek-Soo Kim; Hyunmin Park; Kwang-Hoon Ko; Jaemin Han; Do-Young Jeong
Year: 2007
Response of a SOI microdosimeter to the CERF reference facility for aviation dosimetry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.A. Prokopovich; I.M. Cornelius; M.I. Reinhard; A.B. Rosenfeld
Year: 2007
Cylindrical silicon-on-insulator microdosimeter: Design, fabrication and TCAD modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.H. Lim; A.L. Ziebell; I. Cornelius; M.I. Reinhard; D.A. Prokopovich; A.S. Dzurak; A.B. Rosenfeld
Year: 2007
Preliminary tests and performance estimate of PFMA-1, the first prototype of a plasma focus device for SLR production
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sumini; D. Mostacci; F. Rocchi; S. Mannucci; A. Tartari; E. Angeli
Year: 2007
Residual energy measurements for proton computed tomography
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Randazzo; V. Sipala; D. Lo Presti; G.A. Pablo Cirrone; G. Cottone; F. Di Rosa; V. Bashkirov; R. Schulte
Year: 2007
Study of cadmium zinc telluride (CZT) radiation detector modules under moderate and long-term variations of temperature and humidity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Mashlum; K.I. Dietzel; D. Meier; M. Szawlowski; B. Sundal; T. Vandehei; D. Wagenaar; B.E. Patt
Year: 2007
Comparison of three pulse processing systems for microdosimetry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.M. Spirou; Soo-Hyun Byun; W.V. Prestwich
Year: 2007
A new tool for measuring therapeutic electron beam energies with scintillation light
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ishigami; H. Kojima; Y. Fukushima; M. Uemae; M. Hashimoto; T. Nishio; K. Maruyama
Year: 2007
Performance characteristics of thick silicon double sided strip detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shokouhi; B.S. McDonald; H.L. Durko; M.A. Fritz; L.R. Furenlid; T.E. Peterson
Year: 2007
Single photon counting x-ray imaging system using a micro hole and strip plate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.N. da Luz; C.A.B. Oliveira; C.D.R. Azevedo; J.A. Mir; J.M.F. dos Santos; J.F.C. Veloso
Year: 2007
ULTRA-Fast wiener filter based crystal identification algorithm applied to the LabPETTM phoswich detectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.C. Yousefzadeh; N. Viscogliosi; M.-A. Tetrault; C.M. Pepin; P. Berard; M. Bergeron; H. Semmaoui; R. Lecomte; R. Fontaine
Year: 2007
A new wide-band beam current monitor with active-passive circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Zhou; B.G. Sun; X.H. Wang; P. Lu; Y. Wang
Year: 2007
New methods of measuring emittance using beam position monitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Li; B.G. Sun; Q. Luo; X.H. Wang; H.L. Xu; P. Lu
Year: 2007
Accuracy of LHC proton loss rate determination by the BLM system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.B. Holzer; B. Dehning; C.W. Fabjan; D. Kramer; M. Sapinski; M. Stockner
Year: 2007
A new wire position monitor readout system for ILC cryomodules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Bedeschi; G. Bellettini; A. Bosotti; R. Carosi; S. Galeotti; A. Gennai; C. Pagani; F. Paoletti; R. Paparella; D. Passuello; F. Spinella
Year: 2007
Spin flip in high energy electron rings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Stres
Year: 2007
LHC cryogenics hardware commissioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Avramidou; K. Anastasopoulos; J. Casas-Cubillos; M. Ciechanowski; X. Fampris; W.M. Gaj; G. Fernandez-Penacoba; C. Fluder; P. Gomes; E. Gousiou; N. Jeanmonod; F. Karagiannis; A. Koumparos; P. Macuda; A. Patsouli; A. Suraci; N. Vauthier; C. Vottis
Year: 2007
Design of a slow pulsed positron beam for positron annihilation lifetime spectroscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.G. Hathaway; J. Moxom; A.I. Hawari; Jun Xu
Year: 2007
Implementation of a diamond-beam-conditions monitor into the LHCb experiment at CERN
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.J. Ilgner
Year: 2007
Phase contrast neutron imaging of mixed phase-amplitude objects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Mishra; A.I. Hawari
Year: 2007
Microradiographic observation of grainy structure of Al-alloy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Vavrik; T. Holy; J. Jakubek; M. Jakubek; J. Valach
Year: 2007
Texture analysis using Bragg-edge neutron transmission method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Iwase; T. Nagata; K. Sakuma; O. Takada; T. Kamiyama; Y. Kiyanagi
Year: 2007
Epithermal neutron tomography with time-of-flight technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kamiyama; H. Sato; N. Miyamoto; H. Iwasa; Y. Kiyanagi; S. Ikeda
Year: 2007
Progress report on a neutron coded source phase contrast imaging system at the MIT reactor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Damato; P. Binns; R.C. Lanza
Year: 2007
Author index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Conference organization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
A message from the Conference Chair
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Web-based Integrated Stability Enhancement Strategy for Distribution and Transmission Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Wang; Helen Cheung; A. Hamlyn; R. Cheung
Year: 2007
Design and Development of a Static VAR Compensator for Load Compensation Using Real-Time Digital Simulator and Hardware Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Berge; R.K. Varma
Year: 2007
Testing power system controllers by real-time simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Venne; X. Guillaud; F. Sirois
Year: 2007
A Dynamic Technique for Power System Oscillations Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Al-Kandari; K.M. El-Naggar
Year: 2007
Synchronous Machine Modelling and Identification via Network Equivalent Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ghassemi; H. Lesani; S.M. Nabavi
Year: 2007
Application of Support Vector Machine Classification to Enhanced Protection Relay Logic in Electric Power Grids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Zhang; M.D. Ilic; O. Tonguz
Year: 2007
Network-Integrated Protection and Control Strategy for Power Distribution Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Wang; Helen Cheung; A. Hamlyn; Cungang Yang; R. Cheung
Year: 2007
New Centralized Adaptive Under Frequency Load Shedding Algorithms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S. Pasand; H. Seyedi
Year: 2007
DSP-based Adaptive Protection for Feeders with Distributed Generations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Cheung; A. Hamlyn; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
A New Approach For Transformer Overloading Considering Economic Terms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Shahbazi; M. Ashouri; M.R. Shariati; S. Farzalizade; M. Makhdoomi
Year: 2007
Distributed Monitoring and Centralized Forecasting System for DG-Connected Distribution Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Hamlyn; H. Cheung; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
Optimal Distribution Generation Sizing via Fast Sequential Quadratic Programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. AlHajri; M.E. El-Hawary
Year: 2007
Model Adaptive Stability Control of DG-Connected Distribution Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Wang; R. Cheung
Year: 2007
Probabilistic Unit Commitment with Wind Farms Considerations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.H. Hosseini; E. Abbasi
Year: 2007
Adaptive Interfacing Control Strategy for Electricity Generations from Wind Power to Distribution Grids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Hamlyn; H. Cheung; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
Transmission Expansion Planning using Goal Attainment & GA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Forghani; M. Seyed-Esfahani; M. Rashidinejad; H. Farahmand
Year: 2007
An Approach to Distribution System Planning by Implementing Distributed Generation in a Deregulated Electricity Market
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Porkar; A. Abbaspour-Tehrani Fard; S. Saadate
Year: 2007
Long Term Hydrothermal Scheduling Linear Programming Model for Large Scale Power Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.W. Jimenez; V.L. Paucar
Year: 2007
Power Losses Minimization and Voltage Profile Enhancement for Distribution Feeders using PSO
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M. Khalil; G.M. Omar; A.A. Sallam
Year: 2007
Optimal Design of Type_1 TSK Fuzzy Controller Using GRLA for AVR System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Naderi; A.A. Gharaveisi; M. Rashidinejad
Year: 2007
Optimal Placement of FACTS in Northern Power Transmission System of Vietnam Using an OPF Formulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Phuong Hoang Kim; Tran Bach; Le Anh Tuan
Year: 2007
CO2, SOx and NOx Emissions Constrained Multi-Criteria-Best Generation Mix Using Fuzzy Set Theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jaeseok Choi; Sangheon Jeong; Shi Bo; Jeongje Park; A. El-Keib; J. Watada
Year: 2007
Optimal Placement of Reactive Power Supports for Transmission Loss Minimization: The Case of Georgian Regional Power Grid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Gavasheli; Le Anh Tuan
Year: 2007
Inclusion of Ancillary Services in a Cost-Based Centralized Economic Dispatch Solution for Hydrothermal Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.F. Bermudez; M. Alvarez
Year: 2007
Self Scheduling using Lagrangian Relaxation and Particle Swarm Optimizer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.Y. Yamin
Year: 2007
Contingency Ranking Based on a Voltage Stability Criteria Index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Fatehi; M. Rashidinejad; A.A. Gharaveisi
Year: 2007
Identifying Critical Limits for the Maximum Loadability of Electric Power Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.V. Barboza; L.A. Hecktheuer
Year: 2007
A Simple and Reliable Algorithm for Frequency Estimation with Application to Power Systems Frequency Relaying
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Soliman
Year: 2007
Kalman Filtering Algorithm for Electric Power Quality Analysis: Harmonics and Voltage Sags Problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Mostafa
Year: 2007
Power System State Estimation: A New Method Based on Current Equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lavorato; M.J. Rider; A.V. Garcia
Year: 2007
Continuation Newton-GMRES Power Flow with Linear and Nonlinear Predictors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Mori; K. Seki
Year: 2007
Optimal Location of UPFC for ATC Enhancement in Restructured Power Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Farahmand; M. Rashidinejad; A. Gharaveis; G.A. Shahriary
Year: 2007
Experiences on GIS On-Site Evaluation Using High Sensitivity PD Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.G. Azcarraga; V.R. Garcia-Colon
Year: 2007
Survey on the Transformer Condition Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.E.B. Abu-Elanien; M.M.A. Salama
Year: 2007
Transformer Diagnostics in the Practical Field
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.N. Bandyopadhyay
Year: 2007
Transient Stability using Energy Function Method in Power Systems Close to Voltage Collapse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. Bedrinana; V.L. Paucar; C.A. Castro
Year: 2007
Analysis of the Impact of Induction Generators on Distribution Systems Voltage Sags Due to Unbalanced Faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.P. Grilo; D. Salles; C.A.F. Murari
Year: 2007
Analysis of Single Pole Reclosing on EHV Line in Thailand
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ngamsanroaj; S. Premrudeepreechacharn
Year: 2007
Mid and Long-Term Voltage Stability Assessment using Neural Networks and Quasi-Steady-State Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.M.L. Assis; A.R. Nunes; D.M. Falcao
Year: 2007
Reactive Power Rescheduling With Generator Ranking For Improving Voltage Stability Margin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Raoufi; M. Kalantar
Year: 2007
Area Annual Outage Cost Assessment of KEPCO System by TRELSS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bo Shi; Sangheon Jeong; Jeongje Park; Jaeseok Choi; Byeonghun Jang; Yongbum Yun; Gyeongnam Han; A.R. El-keib; R. Billinton
Year: 2007
Pricing and Allocation of Spinning Reserve and Energy in Restructured Power Systems via Memetic Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Hazrati; M. Rashidi-Nejad; A.-A. Gharaveisi
Year: 2007
A Robust Decision Making Framework for GEP of Grid Connected Micro-Power Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Khodayar; M. Ehsan; A. Rahimikian; S. Kamalinia; E. Abbasi
Year: 2007
An Optimal Fractional Order Controller for an AVR System Using Particle Swarm Optimization Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Karimi-Ghartemani; M. Zamani; N. Sadati; M. Parniani
Year: 2007
Generation Pattern Search for Different Kinds of Economic Load Dispatch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.S. Dhillon; J.S. Dhillon; D.P. Kothari
Year: 2007
Analysis of Flux Control for Wide Speed Range Operation of IPMSM Drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Islam Chy; M.N. Uddin
Year: 2007
A New LCL- Resonant Push-Pull DC-DC Converter for Inverter Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yisheng Yuan; Liuchen Chang; Pinggang Song
Year: 2007
Advanced Speed-sensorless Induction-motor Drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Chen; R. Cheung
Year: 2007
Analog Implementation and Real-Time Testing of a DWT-Operated DVR System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Saleh; M.A. Rahman
Year: 2007
A New Front-End Converter with Extended Hold-Up Time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yisheng Yuan; Liuchen Chang; Pinggang Song
Year: 2007
Computer Network Security Strategy for Coordinated Distribution System Operations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helen Cheung; A. Hamlyn; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
Radial Distribution System Analysis using Data Structure in MATLAB Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Dukpa; B. Venkatesh; L. Chang
Year: 2007
Web-based Real-Time States Monitoring of Utility Distribution Systems with Alternate Energy Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Hamlyn; H. Cheung; T. Mander; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
Improving the voltage profiles of Distribution Networks using multiple Distribution Generation Sources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.F. AlHajri; M.E. El-Hawary
Year: 2007
Integrated Two-Level Computer Network Architecture For Open-Access Distribution Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Helen Cheung; A. Hamlyn; T. Mander; Lin Wang; Cungang Yang; R. Cheung
Year: 2007
Uncertainty Consideration in Power System Reliability Indices Assessment Using Fuzzy Logic Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Fotuhi; A. Ghafouri
Year: 2007
Modeling of Series Static Voltage Restorer (SSVR) in Distribution Systems Load Flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Fotuhi-Firuzabad; H.A. Shayanfar; M. Hosseini
Year: 2007
Ancillary Service Markets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Motamedi; M. Fotuhi-Firuzabad
Year: 2007
Author's index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Commentary
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Contributor listings
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Commentary
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Organized Panel Discussion
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Panel Session: 2 - Developing Standard Automotive eSW Drivers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Panel Session: 3 - Teaching VLSI in MEA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Planning for Functional Verification Closure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mohamed Salem; Harry Foster
Year: 2007
Dual Mode PCGCs For Advanced Wireless Communications Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.M. Behairy
Year: 2007
Precise Identification of Memory Faults Using Electrical Simulation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Al-Ars; S. Hamdioui; G. Gaydadjiev
Year: 2007
An Investigation on Capacitive Coupling in RAM Address Decoders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hamdioui; Z. Al-Ars; G.N. Gaydadjiev; A.J. van de Goor
Year: 2007
Multi-cycle Fault Injections in Error Detecting Implementations of the Advanced Encryption Standard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Maistri; R. Leveugle
Year: 2007
A Novel Method of Test Generation for Asynchronous Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.P. Vasudevan
Year: 2007
A Reconfigurable and Programmable Filter for Software Defined Radio Based on a Transconductor-Capacitor Analog Array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Rus; L. Festila; G. Csipkes; S. Hintea; D. Csipkes
Year: 2007
Narrowband Interference Suppression for Direct Conversion Software Radios
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Hickling; T. Turgeon
Year: 2007
Ultra Low Power Narrow Band LNA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M.E. Kholy
Year: 2007
Bandwidth Extension of CMOS Transimpedance Amplifier Using On-Chip Spiral Inductor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-S.A.M. Hasaneen; M.A.A. Wahab; N. Okaley
Year: 2007
Improving Software Based Self - Testing for Cache Memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sosnowski
Year: 2007
Using Reconfigurable Computers for DSP Image Processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Taher; T. El-Ghazawi
Year: 2007
A Topology-based Design Methodology for Networks-on-Chip Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Elmiligi; A.A. Morgan; M.W. El-Kharashi; F. Gebali
Year: 2007
Measurement Environment for Reliability Study of High Current First Level Interconnections
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Barton; J. Horky; R. Duda; I. Szendiuch; M. Novotny; D. Gevaert
Year: 2007
Generation of Power-Constrained Scan Tests and Its Difficulty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Iwagaki; S. Ohtake
Year: 2007
Transient Current Testing of Gate-Oxide Shorts in CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Chehab; A. Kayssi; A. Ghandour
Year: 2007
A power measuring technique for built-in testing of Electrochemical Sensors for Environmental Monitoring
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Konstantakos; T. Laopoulos
Year: 2007
Proxels for Reliability Assessment of Future Nano-Architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Lazarova-Molnar; V. Beiu; W. Ibrahim
Year: 2007
A Hazard-Free Majority Voter for TMR-Based Fault Tolerance in Asynchronous Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Almukhaizim; O. Sinanoglu
Year: 2007
Analysis of Laser-Based Attack Effects on a Synchronous Circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Maingot; R. Leveugle
Year: 2007
Recovery from Transition Errors in Sequential Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Das; J.P. Hayes
Year: 2007
Modeling Burst Interferences - A Practical Tool for Studying Leak Signals
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Daneti
Year: 2007
Adopting the Scan Approach for a Fault Tolerant Asynchronous Clock Generation Circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Handl; A. Steininger; G. Kempf
Year: 2007
Low Power Small Area High Performance 2D-DCT architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R.M. Rizk; M. Ammar
Year: 2007
Design of Real Time Multiprocessor System on Chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Loukil; N.B. Amor; Y. Aoudni; M. Abid
Year: 2007
Reliability Analysis and Distributed Voting for NMR Nanoscale Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Namazi; M. Nourani
Year: 2007
Accurate Nano-Circuits Reliability Evaluations Based on Combining Numerical Simulations with Monte Carlo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Ibrahim; V. Beiu; S. Lazarova-Molnar
Year: 2007
Exploiting RAM for fault-tolerant functions in FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Frigerio; F. Salice
Year: 2007
CNTFET-based CMOS-like Gates and Dispersion of Characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Dang; L. Anghel; V. Pasca; R. Leveugle
Year: 2007
Power Grid Automatic Metal Filling Algorithm Forming Maximum on-chip Decoupling Capacitance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Tork; M. AbulMakarem; M. Dessouky
Year: 2007
Verification of the Properties of Asynchronous Real-Time Distributed Systems using the B-Formalism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Wahba; I.A. El-Maddah
Year: 2007
Optimization of Interacting Controllers Using K-wise Tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Goren
Year: 2007
Fast FPGA-Based Delay Estimation for a Novel Hardware/Software Partitioning Scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Abdelhalim; S.E.-D. Habib
Year: 2007
A High Performance ASIC Based Elliptic Curve Cryptographic Processor over GF(p)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaopeng Zhang; Shuguo Li
Year: 2007
Software-based BIST for Analog to Digital Converters in SoC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Keshk
Year: 2007
An auto-Sensitivity Control Circuit Using Analog Topology for Wired CDMA Bus Interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A.R. Eltokhy
Year: 2007
Switched-Capacitor Analog Correlator using Balanced Charge Pump Circuit for CDMA Bus Interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Refay Eltokhy
Year: 2007
Accelerating Matrix Multiplication on FPGAs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. El-Atfy; M.A. Dessouky; H. El-Ghitani
Year: 2007
Optimized Area and Optimized Speed Hardware Implementations of AES on FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R.M. Rizk; M. Morsy
Year: 2007
System Level Power and Energy Modeling for Signal Processing Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Ktari; M. Abid
Year: 2007
A Low-Power Haar-Wavelet Preprocessing Approach for a SNN Olfactory System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.N. Allen; S.B. Hasan; H.S. Abdel-Aty-Zohdy; R.L. Ewing
Year: 2007
A High-Speed, Low-Area Processor Array Architecture for Multiplication and Squaring over GF(2m)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Fayed; M.W. El-Kharashi; F. Gebali
Year: 2007
Performance Analysis of Networks-on-Chip Routers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Elmiligi; A.A. Morgan; M.W. El-Kharashi; F. Gebali
Year: 2007
An FPGA-Based Architecture for ECC Point Multiplication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Nassar; M. Watheq El-Kharashi; A.E.-H. Mahmoud Shousha
Year: 2007
A Novel General Graph-Based Simplex Algorithm Applied to IC Layout Compaction and Migration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Said; H.M. Abbas; H.I. Shahein
Year: 2007
Analog, Digital and Mixed-Signal Design Flows
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.G. Bakeer; O. Shaheen; H.M. Eissa; M. Dessouky
Year: 2007
Dual Metric OPC for Complex SRAF Implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Yehia
Year: 2007
Schematic-Based Fault Dictionary: A Case Study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. AbdEl-Halim; H.H. Amer
Year: 2007
MOSFET Scaling to Nanometer Regimes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-S.A.M. Hasaneen; M.A.A. Wahab; O.N.A. Esmail
Year: 2007
Compact Circuit Simulation Model for On-Chip Inductor and Transformer for RF Integrated Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-S.A.M. Hasaneen
Year: 2007
Author index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
System design oriented RF block modeling : When top-down reaches bottom-up
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Tatinian; B. Nicolle; G. Jacquemod
Year: 2007
Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.M. Huang; Wei Dong; Yenpo Ho; Peng Li
Year: 2007
Modeling heterogeneous systems using SystemC-AMS case study: A Wireless Sensor Network Node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Vasilevski; F. Pecheux; H. Aboushady; L. de Lamarre
Year: 2007
An efficient bottom-up extraction approach to build the behavioral model of switched-capacitor ΔΣ modulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei-Hsiang Cheng; Chin-Cheng Kuo; Po-Jen Chen; Yi-Min Wang; C.-N.J. Liu
Year: 2007
Architecture-level thermal behavioral models for quad-core microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duo Li; S.X.-D. Tan; M. Tirumala
Year: 2007
Automatic mixed-signal design verification instrumentation with observation specification language
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. David
Year: 2007
High-performance model compilation for complex behavioral models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Platte; C. Knoth; R. Sommer; E. Barke
Year: 2007
Certify— A characterization and validation tool for behavioral models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Weifeng Li; O. Abbasi; N.S. Hingora; Yongfeng Feng; H.A. Mantooth
Year: 2007
Event driven analog modeling of RF frontends
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Joeres; H.-W. Groh; S. Heinen
Year: 2007
RF library based on block diagram and behavioral descriptions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Nicolle; W. Tatinian; G. Jacquemod; J.-J. Mayol; J. Oudinot
Year: 2007
Circuit reliability simulation based on Verilog-A
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kole
Year: 2007
Statistical eye analysis implemented in VHDL-AMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Muranyi
Year: 2007
A mixed-mode behavioral model of a Controller-Area-Network bus transceiver: a case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Prodanov; M. Valle; R. Buzas; H. Pierscinski
Year: 2007
Efficient modeling of single event transients directly in compact device models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Francis; M. Turowski; J.A. Holmes; H.A. Mantooth
Year: 2007
A mathematica-based approach to designing receiver and transmitter gain tables
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.E. Chen
Year: 2007
Behavioral modeling of a charge pump voltage converter for SoC functional verification purposes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.H. El-Ebiary; M.A. Dessouky; H. El-Ghitani
Year: 2007
Modeling and analysis of biological cells in DRAM implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Fan; Guofen Yu; Jichang Tan; S.X.-D. Tan
Year: 2007
Simul’Elec, a Delphi written simulator for power Electrical Engineering, using VHDL-AMS modeling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Legrand; M. Azurmendi; F. Martin; L. Fontan; J.-J. Chariot; N. Couture
Year: 2007
Behavioral models of frequency pulling in oscillators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Heidari; A.A. Abidi
Year: 2007
A generic VHDL-AMS behavioral model physically accounting for typical analog non-linear output behavior
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Sabet; T. Riad
Year: 2007
An accurate PLL behavioral model for fast Monte Carlo analysis under process variation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Cheng Kuo; Meng-Jung Lee; I-Ching Tsai; C.-N.J. Liu; Ching-Ji Huang
Year: 2007
AMS modeling of controlled switch for design optimization of capacitive vibration energy harvester
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Galayko; R. Pizarro; P. Basset; A.M. Paracha
Year: 2007
An integrated approach to energy harvester modeling and performance optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Leran Wang; T.J. Kazmierski; B.M. Al-Hashimi; S.P. Beeby; R.N. Torah
Year: 2007
Multilevel modeling of integrated power harvesting system using VHDL-AMS and SPICE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Boussetta; M. Marzencki; Y. Ammar; S. Basrour
Year: 2007
Macro-modeling of liquid crystal cell with VerilogA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Watanabe; K. Ishihara; T. Tsuruma; Y. Iguchi; Y. Nakajima; Y. Maki
Year: 2007
A unified electrical SPICE model for piezoelectric transducers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-M. Galliere; P. Papet; L. Latorre
Year: 2007
An efficient and accurate MEMS accelerometer model with sense finger dynamics for applications in mixed-technology control loops
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chenxu Zhao; Leran Wang; T.J. Kazmierski
Year: 2007
Worst-case modeling and simulation of an automotive throttle in VHDL-AMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pirker-Fruhauf; K. Schonherr; A. Laroche
Year: 2007
Behavioral simulation of biological neuron systems using VHDL and VHDL-AMS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Bailey; P.R. Wilson; A.D. Brown; J. Chad
Year: 2007
Phase change memory modeling using Verilog-A
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi-Bo Liao; Yan-Kai Chen; Meng-Hsueh Chiang
Year: 2007
Welcome message
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Steering Committee and Subcommittees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
ITC 2006 paper awards
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Technical Program Committee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
ITC technical paper evaluation and selection process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Call for papers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Keynote address
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
TTTC: test technology technical council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
2007 Technical paper reviewers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Author index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
On-chip timing uncertainty measurements on IBM microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Franch; P. Restle; N. James; W. Huott; J. Friedrich; R. Dixon; S. Weitzel; K. Van Goor; G. Salem
Year: 2007
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Molyneaux; T. Ziaja; Hong Kim; S. Aryani; Sungbae Hwang; A. Hsieh
Year: 2007
Test cost reduction for the AMD™ Athlon processor using test partitioning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sehgal; J. Fitzgerald; J. Rearick
Year: 2007
On ATPG for multiple aggressor crosstalk faults in presence of gate delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Ganeshpure; S. Kundu
Year: 2007
Silicon evaluation of longest path avoidance testing for small delay defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Turakhia; W.R. Daasch; M. Ward; J. Van Slyke
Year: 2007
Which defects are most critical? optimizing test sets to minimize failures due to test escapes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Dworak
Year: 2007
Advancements in at-speed array BIST: multiple improvements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Gorman; M. Roberge; A. Paparelli; G. Pomichter; S. Sliva; W. Corbin
Year: 2007
A concurrent approach for testing address decoder faults in eFlash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Ginez; P. Girard; C. Landrault; S. Pravossoudovitch; A. Virazel; J.-M. Daga
Year: 2007
Diagnosis for MRAM write disturbance fault
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Lung Su; Chih-Wea Tsai; Cheng-Wen Wu; Ji-Jan Chen; Wen-Ching Wu; Chien-Chung Hung; Ming-Jer Kao
Year: 2007
Data jitter measurement using a delta-time-to-voltage converter method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ichiyama; M. Ishida; T.J. Yamaguchi; M. Soma
Year: 2007
New methods for receiver internal jitter measurement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.P. Li; Jinhua Chen
Year: 2007
A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sunter; A. Roy
Year: 2007
Test-wrapper designs for the detection of signal-integrity faults on core-external interconnects of SoCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang Xu; Yubin Zhang; K. Chakrabarty
Year: 2007
A heuristic for thermal-safe SoC test scheduling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhiyuan He; Zebo Peng; P. Eles
Year: 2007
Redefining and testing interconnect faults in Mesh NoCs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Cota; F.L. Kastensmidt; M. Cassel; P. Meirelles; A. Amory; M. Lubaszewski
Year: 2007
Fully X-tolerant combinational scan compression
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Wohl; J.A. Waicukauski; S. Ramnath
Year: 2007
X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.A. Touba
Year: 2007
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Leininger; M. Fischer; M. Richter; M. Goessel
Year: 2007
Diagnose compound scan chain and system logic defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Huang; Wu-Tung Cheng; Ruifeng Guo; Will Hsu; Yuan-Shih Chen; A. Man
Year: 2007
A complete test set to diagnose scan chain failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruifeng Guo; Yu Huang; Wu-Tung Cheng
Year: 2007
Interconnect open defect diagnosis with minimal physical information
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chen Liu; Wei Zou; S.M. Reddy; Wu-Tung Cheng; M. Sharma; Huaxing Tang
Year: 2007
Multi-GHz loopback testing using MEMs switches and SiGe logic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.C. Keezer; D. Minier; P. Ducharme; D. Viens; G. Flynn; J.S. McKillop
Year: 2007
Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Moreira; H. Barnes; G. Hoersch
Year: 2007
Critical roles of RF and microwave electromagnetic field solver simulators in multi-gigabit high-speed digital applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Minh Quach; M. Hinton; R. Petaja
Year: 2007
Testing of Vega2, a chip multi-processor with spare processors.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Makar; T. Altinis; N. Patkar; J. Wu
Year: 2007
The design-for-testability features of a general purpose microprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Da Wang; Xiaoxin Fan; Xiang Fu; Hui Liu; Ke Wen; Rui Li; Huawei Li; Yu Hu; Xiaowei Li
Year: 2007
Design for test features of the ARM clock control macro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Frederick; T. McLaurin
Year: 2007
Analyzing the risk of timing modeling based on path delay tests.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bastani; B.N. Lee; Li.-C. Wang; S. Sundareswaran; M.S. Abadir
Year: 2007
Mining-guided state justification with partitioned navigation tracks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Parikh; Weixin Wu; M.S. Hsiao
Year: 2007
An efficient SAT-based path delay fault ATPG with an unified sensitization model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shun-Yen Lu; Ming-Ting Hsieh; Jing-Jia Liou
Year: 2007
Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kunhyuk Kang; M.A. Alam; K. Roy
Year: 2007
Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Abuhamdeh; V. D'Alassandro; R. Pico; D. Montrone; A. Crouch; A. Tracy
Year: 2007
Gate delay ratio model for unified path delay analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Okuda
Year: 2007
Rapid UHF RFID silicon debug and production testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U.S. Natarajan; H. Shanmugasundaram; P. Deshpande; Chin Soon Wah
Year: 2007
A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongquan Fan; Yi Cai; Z. Zilic
Year: 2007
High throughput non-contact SiP testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Moore; C. Sellathamby; P. Cauvet; H. Fleury; M. Paulson; M. Reja; L. Fu; B. Bai; E. Reid; I. Filanovsky; S. Slupsky
Year: 2007
A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.R. Devanathan; C.P. Ravikumar; V. Kamakoti
Year: 2007
Efficient power droop aware delay fault testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Li; Lei Fang; M.S. Hsiao
Year: 2007
PMScan : A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.R. Devanathan; C.P. Ravikumar; R. Mehrotra; V. Kamakoti
Year: 2007
Implementing bead probe technology for in-circuit test: A case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Farrell; G. Leinbach
Year: 2007
A bead probe CAD strategy for in-circuit test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker; D. DeMille
Year: 2007
Impact of Quad Flat No Lead package (QFN) on automated X-ray inspection (AXI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tee Chwee Liong; A. Pascual
Year: 2007
Delay defect diagnosis using segment network faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Poku; R.D. Blanton
Year: 2007
Testing for systematic defects based on DFM guidelines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongok Kim; M.E. Amyeen; S. Venkataraman; I. Pomeranz; S. Basumallick; B. Landau
Year: 2007
Faster defect localization in nanometer technology based on defective cell diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sharma; Wu-Tung Cheng; Ting-Pu Tai; Y.S. Cheng; Will Hsu; Chen Liu; S.M. Reddy; A. Mann
Year: 2007
Real-time signal processing - a new PLL test approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Okawara
Year: 2007
A methodology for systematic built-in self-test of phase-locked loops targeting at parametric failures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guo Yu; Peng Li
Year: 2007
An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Yamaguchi; H.X. Hou; K. Takayama; D. Armstrong; M. Ishida; M. Soma
Year: 2007
Achieving high transition delay fault coverage with partial DTSFF scan chains
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gefu Xu; A.D. Singh
Year: 2007
Fundamentals of timing information for test: How simple can we get?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Kapur; J. Zejda; T.W. Williams
Year: 2007
Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Uzzaman; Bibo Li; T. Snethen; B. Keller; G. Grise
Year: 2007
Programmable deterministic Built-In Self-Test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.-W. Hakmi; H.-J. Wunderlich; C.G. Zoellin; A. Glowatz; F. Hapke; J. Schloeffel; L. Souef
Year: 2007
A low cost test data compression technique for high n-detection fault coverage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seongmoon Wang; Zhanglei Wang; Wenlong Wei; S.T. Chakradhar
Year: 2007
On using lossless compression of debug data in embedded logic analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Anis; N. Nicolici
Year: 2007
Functional testing of digital microfluidic biochips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tao Xu; K. Chakrabarty
Year: 2007
Enhancing signal controllability in functional test-benches through automatic constraint extraction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Guzey; Li.-C. Wang; J. Bhadra
Year: 2007
Measurement ratio testing for improved quality and outlier detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.L. Roehr
Year: 2007
The new ATE: Protocol aware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C. Evans
Year: 2007
A matched expansion MEMS probe card with low CTE LTCC substrate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seong-Hun Choe; S. Tanaka; M. Esashi
Year: 2007
Management of common-mode currents in semiconductor ATE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.J. Bowhers
Year: 2007
SPARTAN: a spectral and information theoretic approach to partial-scan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O.I. Khan; M.L. Bushnell; S.K. Devanathan; V.D. Agrawal
Year: 2007
A scanisland based design enabling prebond testability in die-stacked microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.L. Lewis; H.-H.S. Lee
Year: 2007
A generic and reconfigurable test paradigm using Low-cost integrated Poly-Si TFTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Li; S. Ghosh; K. Roy
Year: 2007
Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.E. Gray; O. Liboiron-Ladouceur; D.C. Keezer; K. Bergman
Year: 2007
Finding power/ground defects on connectors — a new approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker; S. Hird
Year: 2007
IEEE P1581 can solve your board level memory cluster test problems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ehrenberg
Year: 2007
Statistical analysis and optimization of parametric delay test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.H. Wu; B.N. Lee; Li.-C. Wang; M.S. Abadir
Year: 2007
Backside E-Beam Probing on Nano scale devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Schlangen; R. Leihkauf; U. Kerst; C. Boit; R. Jain; T. Malik; K. Wilsher; T. Lundquist; B. Kruger
Year: 2007
Verification and debugging of IDDQ test of low power chips
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Laisne; T. Nguyen; S. Zuo; X. Pan; H. Cui; C. Bai; A. Street; M. Parley; N. Agrawal; K. Sundararaman
Year: 2007
Low cost automatic mixed-signal board test using IEEE 1149.4
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sundar; B.C. Kim; T. Byrd; F. Toledo; S. Wokhlu; E. Beskar; R. Rousselin; D. Cotton; G. Kendall
Year: 2007
Efficient simulation of parametric faults for multi-stage analog circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fang Liu; S. Ozev
Year: 2007
Using built-in sensors to cope with long duration transient faults in future technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.A. Lisboa; F.L. Kastensmidt; E.H. Neto; G. Wirth; L. Carro
Year: 2007
A novel scheme to reduce power supply noise for high-quality at-speed scan testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaoqing Wen; K. Miyase; S. Kajihara; T. Suzuki; Y. Yamato; P. Girard; Y. Ohsumi; Laung-Terng Wang
Year: 2007
Pattern-directed circuit virtual partitioning for test power reduction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiang Xu; Dianwei Hu; Dong Xiang
Year: 2007
California scan architecture for high quality and low power testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kyoung Youn Cho; S. Mitra; E.J. McCluskey
Year: 2007
Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bose; V.D. Agrawal
Year: 2007
Fast and effective fault simulation for path delay faults based on selected testable paths
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dong Xiang; Yang Zhao; Kaiwei Li; H. Fujiwara
Year: 2007
Delay fault simulation with bounded gate delay mode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bose; H. Grimes; V.D. Agrawal
Year: 2007
ERTG: A test generator for error-rate testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Shahidi; S.K. Gupta
Year: 2007
ACCE: Automatic correction of control-flow errors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Vemu; S. Gurumurthy; J.A. Abraham
Year: 2007
Modeling facet roughening errors in self-assembly by snake tile sets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:X. Ma; J. Huang; F. Lombardi
Year: 2007
Low cost characterization of RF transceivers through IQ data analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Acar; S. Ozev
Year: 2007
An algorithm to evaluate wide-band quadrature mixers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Asami
Year: 2007
Test yield estimation for analog/RF circuits over multiple correlated measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Fang Liu; E. Acar; S. Ozev
Year: 2007
Dependable clock distribution for crosstalk aware design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Miura
Year: 2007
Novel compensation scheme for local clocks of high performance microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Metra; M. Omana; T. Mak; S. Tarn
Year: 2007
A methodology for detecting performance faults in microprocessors via performance monitoring hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hatzimihail; M. Psarakis; D. Gizopoulos; A. Paschalis
Year: 2007
On the saturation of n-detection test sets with increased n
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Pomeranz; S. Reddy
Year: 2007
Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Bhargava; D. Meehl; J. Sage
Year: 2007
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Geuzebroek; E.J. Marinissen; A. Majhi; A. Glowatz; F. Hapke
Year: 2007
A comparative study of continuous sampling plans for functional board testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Antila; T. Karhu
Year: 2007
Enhanced testing of clock faults
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.L. McLaurin; R. Slobodnik; Kun-Han Tsai; A. Keim
Year: 2007
SiP-test: Predicting delivery quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Biewenga; F. de Jong
Year: 2007
A stereo audio Σ∑ ADC architecture with embedded SNDR self-test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Rolindez; S. Mir; J.-L. Carbonero; D. Goguet; N. Chouba
Year: 2007
Sigma-delta ADC characterization using noise transfer function pole-zero tracking
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hochul Kim; Kye-shin Lee
Year: 2007
A fully digital-compatible BIST strategy for ADC linearity testing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hanqing Xing; Hanjun Jiang; Degang Chen; R. Geiger
Year: 2007
IJTAG: The path to organized instrument connectivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Crouch
Year: 2007
JTAG system test in a MicroTCA world
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.G. Van Treuren; A. Ley
Year: 2007
Protocol requirements in an SJTAG/IJTAG environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Carlsson; J. Holmqvist; E. Larsson
Year: 2007
Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bhunia; K. Roy
Year: 2007
Power-aware test: Challenges and solutions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ravi
Year: 2007
Case study of a low power MTCMOS based ARM926 SoC : Design, analysis and test challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Idgunji
Year: 2007
Cost effective manufacturing test using mission mode tests
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Aggarwal
Year: 2007
A practical approach to comprehensive system test & debug using boundary scan based test architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Chakraborty; Chen-Huan Chiang; B.G. Van Treuren
Year: 2007
Design-for-reliability: A soft error case study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ming Zhang
Year: 2007
Circuit failure prediction to overcome scaled CMOS reliability challenges
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mitra; M. Agarwal
Year: 2007
GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nicolaidis
Year: 2007
At-speed scan tests: Reality or fantasy?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Patil
Year: 2007
At-speed structural test: Getting more real every day
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.M. Butler
Year: 2007
At-speed scan tests are a reality (and a necessity)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Giles
Year: 2007
At-speed scan tests: A reality at LSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Krishnamurthy
Year: 2007
At-speed scan tests: Reality or fantasy?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Srinivas Patil
Year: 2007
At-speed scan tests: Reality or fantasy?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Rajesh Raina
Year: 2007
Boundary-scan: Built to last? Panel synopsis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Eklow
Year: 2007
JTAG: Is it still up to snuff?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.L. Crouch
Year: 2007
Boundary-scan: Built to last? panel position
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Nejedlo
Year: 2007
Is IEEE Std 1149.1 running out of gas? No way!
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.P. Parker
Year: 2007
Position paper: boundary-scan: built to last?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Whetsel
Year: 2007
How can the results of silicon debug justify the investment in design-for- debug infrastructure?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Gottlieb
Year: 2007
A silicon validation and debug solution with great benefits and low costs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Abramovici
Year: 2007
COT flow imposes added requirements for debug
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Abuhamdeh
Year: 2007
How much insurance can you afford?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Cory
Year: 2007
How can the results of silicon debug justify the investment in design-for- debug infrastructure?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bob Gottlieb
Year: 2007
Design-for-debug to address next-generation soc debug concerns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Vermeulen
Year: 2007
Does test have a greater role to play in the DFM process?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Venkataraman
Year: 2007
Well-targeted design-for-manufacturability[DFM] through test
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Gattiker
Year: 2007
Does test have a greater role to play in the DFM process?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sandip Kundu
Year: 2007
The essential role of test in DFM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M.H. Walker
Year: 2007
Position statement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Madge
Year: 2007
ITC 2007 panel session the new ATE: Protocol aware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C. Evans
Year: 2007
Protocol-aware ATE: Complement or competitor for structural testing?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sunter
Year: 2007
Protocol aware test .. It has a role, but where? And how?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Burlison; Crouch; Ritchie
Year: 2007
Is a Protocol Aware test system feasible?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Conner
Year: 2007
Protocol-Aware ATE enables cooperative test between DUT and ATE for improved TTM and test quality
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Rivoir
Year: 2007
Panel synopsis: Where is car IC testing going?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Okuda
Year: 2007
SiP testing strategy for automobile LSI
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Aoki
Year: 2007
Where is car IC testing going?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Comen
Year: 2007
How to ensure zero defects from the beginning with semiconductor test methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Gessner
Year: 2007
Car IC test changing but the same quality goal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Wittie
Year: 2007
Automotive IC's: less testing, more prevention
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Appello
Year: 2007
Statistical test: A new paradigm to improve test effectiveness & efficiency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.M. O'Neill
Year: 2007
A universal DC to logic performance correlation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Marshall
Year: 2007
Principles and results of some test cost reduction methods for ASICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Maxwell
Year: 2007
Signature based diagnosis for logic BIST
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu-Tung Cheng; M. Sharma; T. Rinderknecht; Liyang Lai; C. Hill
Year: 2007
Service-Oriented Management Architecture of Optical Virtual Private Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Wu; M. Savoie; S. Campbell; Hanxi Zhang
Year: 2007
3-Tier Service Level Agreement with automatic class upgrades
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Haddad; Y. Viniotis
Year: 2007
Characterization and Synthesis of Markovian Workload Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Casale; E.Z. Zhang; E. Smirni
Year: 2007
A Brief Survey on Resource Allocation in Service Oriented Grids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M. Batista; N.L.S. da Fonseca
Year: 2007
AAA architectures applied in multi-domain IMS (IP Multimedia Subsystem)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.S. Ooms; G. Karagiannis; M.O. van Deventer; J. Veldhuizen
Year: 2007
A Pseudonym Assignment for the Last Mile Wireless Access to 4G Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Min-Ho Park; Seung-Woo Seo
Year: 2007
Securing fast handover in WLANs: a ticket based proactive authentication scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Kassab; J.M. Bonnin; K. Guillouard
Year: 2007
An Adaptable Service Overlay for Wide Area Network Service Discovery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Brown; M. Kolberg; J. Buford
Year: 2007
Using Selective Sampling for the Support of Scalable and Efficient Network Anomaly Detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Androulidakis; V. Chatzigiannakis; S. Papavassiliou
Year: 2007
QoSMap: QoS aware Mapping of Virtual Networks for Resiliency and Efficiency
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Shamsi; M. Brockmeyer
Year: 2007
Threats and Vulnerabilities of Next Generation Satellite Personal Communications Systems: A Defence Perspective
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-F. Beaumont; G. Doucet
Year: 2007
Pricing and Measurement-based Optimal Resource Allocation in Next Generation Network Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.G. Kallitsis; G. Michailidis; M. Devetsikiotis
Year: 2007
Introducing Smart Cards for WiMAX-based Networking Architecture
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Urien
Year: 2007
A Cooperative Method for Prefix Hijack Detection in the Internet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Liu; Peidong Zhu; Yuxing Peng; Ning Hu
Year: 2007
Empowerment: Enabler for Personalized Security and Privacy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Heikkinen; N. Prasad
Year: 2007
ADHOCSYS: Robust and Service-Oriented Wireless Mesh Networks to Bridge the Digital Divide
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Bucciol; F.Y. Li; N. Fragoulis; L. Vandoni
Year: 2007
The European Network of Excellence CRUISE Application Framework and Network Architecture for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Murray; A. Timm-Giel; M. Becker; Cheng Guo; R. Sokullu; D. Marandin
Year: 2007
On Energy-efficient Self-organizing Routing for Wireless Mobile Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Moh; R. Kukanur; Xuquan Lin; S. Dhar
Year: 2007
A Distributed Autonomous Intrusion Detection Framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Cai
Year: 2007
Using the Policy Control system as an auxiliary tool to improve the Service Assurance Process in Telecommunication Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lidstrom; T. Larsson; T. Kvernvik
Year: 2007
Dependable Actuation in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Garces-Erice; S. Rooney
Year: 2007
Packet aggregation at access points for concurrent real-time interactions over wireless relay networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Itaya; J. Hasegawa; P. Davis; R. Suzuki; S. Obana
Year: 2007
RTRG: Reschedule Trigger to optimize rescheduling frequency for schedule based MAC schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.K. Rana; S. Jha
Year: 2007
Using Trust in Key Distribution in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Lewis; N. Foukia
Year: 2007
Routing with Minimum Frame Length Schedules in Wireless Mesh Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Friderikos; K. Papadaki
Year: 2007
A Simple Multi-point Surveillance Scheme of a Moving Target for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tsukamoto; H. Ueda; H. Tamura; Jidong Wang; K. Kawahara; Y. Oie; T. Suda
Year: 2007
Performance of Three Routing Protocols in UWB Ad Hoc Network Deployed in an Industrial Application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Bali; J. Steuer; K. Jobmann
Year: 2007
Self-powering wireless sensors in typical building environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Miaoudakis; V. Zacharopoulos; D. Stratakis; E. Antonidakis
Year: 2007
z2z: Discovering Zeroconf Services Beyond Local Link
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae Woo Lee; H. Schulzrinne; W. Kellerer; Z. Despotovic
Year: 2007
PEGASUS: 802.11 connectivity at high speed
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Frangiadakis; D. Kuklov; N. Roussopoulos
Year: 2007
Spontaneous Emergence Model for Pervasive Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Gaber
Year: 2007
Modeling of Cooperative Navigation in Pervasive E-learning Applications Using (max, plus) Algebra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Nait-Sidi-Moh; D. Assossou; A. Roxin; M. Wack
Year: 2007
Survey of Wireless Geolocation Techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Roxin; J. Gaber; M. Wack; A. Nait-Sidi-Moh
Year: 2007
Opportunistic Large Array Concentric Routing Algorithm (OLACRA) over Wireless Fading Channels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.V. Thanayankizil; M.A. Ingram
Year: 2007
Discovery and Composition of Communication Services in Peer-to-Peer Overlays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Zhou; J.F. Buford; K. Dhara; M. Kolberg; V. Krishnaswamy; X. Wu
Year: 2007
End-to-End Performance Aware Association in Wireless Municipal Mesh Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lin Luo; D. Raychaudhuri; Hang Liu; Mingquan Wu; Dekai Li
Year: 2007
A Survey of Security Threats on 4G Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yongsuk Park; Taejoon Park
Year: 2007
UMTS-AKA and EAP-AKA Inter-working for Fast Handovers in All-IP Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S. Bargh; R.J. Hulsebosch; E.H. Eertink; J. Laganier; A. Zugenmaier; A.R. Prasad
Year: 2007
Local Positioning for Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Ellinger; R. Eickhoff; R. Gierlich; J. Huttner; A. Ziroff; S. Wehrli; T. Ussmuller; J. Carls; V. Subramanian; M. Krcmar; R. Mosshammer; S. Spiegel; D. Doumenis; A. Kounoudes; K. Kurek; Y. Yashchyshyn; C.B. Papadias; P. Tragas; A. Kalis; E. Avatagelou
Year: 2007
Wireless Mesh Network Monitoring: Design, Implementation and Experiments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Sailhan; L. Fallon; K. Quinn; P. Farrell; S. Collins; D. Parker; S. Ghamri-Doudane; Yangcheng Huang
Year: 2007
Service Utility Optimization Model Based on User Preferences in Multiservice IP Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Derbel; N. Agoulmine; M. Salaun
Year: 2007
The Feasibility of a Search Engine for Metropolitan Vehicular Ad-Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Wewetzer; M. Caliskan; A. Luebke
Year: 2007
Vulnerabilities of Geocast Message Distribution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Schoch; F. Karg; T. Leinmuller; M. Weber
Year: 2007
Border Node Based Routing Protocol for VANETs in Sparse and Rural Areas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mingliu Zhang; R.S. Wolff
Year: 2007
Location-Based Message Aggregation in Vehicular Ad Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Saleet; O. Basir
Year: 2007
An Entropy Based Model for System-Level Downlink Capacity Requirements in V2R Telematic Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Belanovic; T. Zemen
Year: 2007
Illusion Attack on VANET Applications - A Message Plausibility Problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nai-Wei Lo; Hsiao-Chien Tsai
Year: 2007
Wireless Traffic Service Communication Platform for Cars
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sukuvaara; D. Stepanova; P. Nurmi; P. Eloranta; E. Suutari; K. Ylisiurunen
Year: 2007
A Certificate Validation Protocol for VANETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Papapanagiotou; G.F. Marias; P. Georgiadis
Year: 2007
Local Peer Groups and Vehicle-to-Infrastructure Communications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Chennikara-Varghese; Wai Chen; T. Hikita; R. Onishi
Year: 2007
Intra-vehicular Wireless Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ahmed; C.U. Saraydar; T. ElBatt; Jijun Yin; T. Talty; M. Ames
Year: 2007
An Automobile Control Method for Alleviation of Traffic Congestions Using Inter-Vehicle Ad Hoc Communication in Lattice-Like Roads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Inoue; K. Shozaki; Y. Kakuda
Year: 2007
Turbo Equalization and Iterative Decoding for the Storage Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.E. Ryan; Yang Han
Year: 2007
Self-Healing Wireless Sensor Networks: Results That May Surprise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Vlajic; N. Moniz
Year: 2007
Synthesizing Realistic Vehicular Mobility for More Precise Simulation of Inter-vehicle Communication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Nakanishi; T. Umedu; T. Higashino; H. Kitaoka; H. Mori
Year: 2007
Enhanced Perimeter Routing for Geographic Forwarding Protocols in Urban Vehicular Scenarios
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.C. Lee; J. Haerri; Uichin Lee; M. Gerla
Year: 2007
On the Information-Theoretic Capacity of the Magnetic Recording Channel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.H. Siegel
Year: 2007
Pricing Design of Power Control Game in WDM Optical Networks via State-space Approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quanyan Zhu; L. Pavel
Year: 2007
On the concatenation of LDPC and RS codes in magnetic recording systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Sankaranarayanan; A. Kuznetsov; D. Sridhara
Year: 2007
Magnetic recording system - an overview
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Thapar; M. Marrow
Year: 2007
Increasing QoS and Security in 4G Networks Using Cognitive Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Muraleedharan; L.A. Osadciw
Year: 2007
FTTx: The Rise of Broadband Optical Access
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.S. El-Bawab
Year: 2007
PON as a driver for optical components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.J. Effenberger
Year: 2007
A Study on Video Over IP and the Effects on FTTx Architectures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.J. Sims
Year: 2007
Long Reach Optical Access Networks using Light-trails
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Dhanuka; A. Lodha; A. Gumaste; Nasir Ghani
Year: 2007
Rapid Growth of FTTH by Use of PON in Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Mukai; T. Yokotani; T. Kida
Year: 2007
Solutions to Challenges of FTTH Deployment in China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anpeng Huang; Liang Shan; Wei Li; Anshi Xu; Linzhen Xie
Year: 2007
Progress Toward a Fiber-Based National Broadband Strategy In the United States
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Bailer
Year: 2007
Preface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Committees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
MOF-EMF Alignment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Mohamed; M. Romdhani; K. Ghedira
Year: 2007
Context-Based Multimedia Ontology Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Ishaya; E. Eze
Year: 2007
Design and Analyze the Communication in the Multi-Core Soc Driven by Petri Net
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu Yonggang; Chen Tianzhou; Dai Hongjun
Year: 2007
Automatic Synthesis of Robust Numerical Controllers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Intrigila; I. Melatti; E. Tronci
Year: 2007
Improving Performance of Chemical Autonomic Information Diffusion Protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Ghazisaidi; A. Ghazisaeidi
Year: 2007
Optimization for QoS on Web-Service-Based Systems with Tasks Deadlines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.F. Orleans; P.N. Furtado
Year: 2007
Concurrent Inference on High Level Context Using Alternative Context Construction Trees
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Krause; C. Linnhoff-Popien; M. Strassberger
Year: 2007
Adaptive Monitoring for Virtual Machine Based Reconfigurable Enterprise Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Machida; M. Kawato; Y. Maeno
Year: 2007
Agent Design of SmArt License Management System Using Gaia Methodology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qian Zhao; Yu Zhou; M. Perry
Year: 2007
Autonomously Reconstructable Semi-Structured P2P Networks for File Sharing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ohnishi; S. Nagamatsu; T. Okamura; Y. Oie
Year: 2007
A Dynamic QoS Management for Next Generation of Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Huynh; E. Lavinal; N. Simoni
Year: 2007
Cleaning and Processing RSS Measurements for Location Fingerprinting
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.B. Kjaergaard
Year: 2007
Adaptive Context-Aware Access Control Policy in Ad-Hoc Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Saidane
Year: 2007
A Methodology & Tool for Determining Inter-component Dependencies Dynamically in J2EE Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Bellur
Year: 2007
An Approach to Comprehending Networked Applications through Analogy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Shevertalov; E. Stehle; C. Rorres; S. Mancoridis; M. Kam
Year: 2007
Adaptation Strategies in Policy-Driven Autonomic Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.M. Bahati; M.A. Bauer; E.M. Vieira
Year: 2007
Context Aware Orchestration Meta-Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Seyler; C. Taconet; G. Bernard
Year: 2007
Performance Diagnosis for Changing Workloads
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.G. Benoit
Year: 2007
Large-Scale Service Deployment--Application to OSGi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Baude; V.L. Contes; V. Lestideau
Year: 2007
Task-Based Composition of the Context-Sensitive UIs of Physical Environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Palviainen
Year: 2007
Fighting Information Overflow with Personalized Comprehensive Information Access: A Proactive Job Recommender
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.H. Lee; P. Brusilovsky
Year: 2007
Worst Case Response Time Analysis of Sporadic Task Graphs with EDF Non-preemptive Scheduling on a Uniprocessor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huixue Zhao; L. George; S. Midonnet
Year: 2007
Constraint Verification for Concurrent System Management Workflows Sharing Resources
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kikuchi; S. Tsuchiya; M. Adachi; T. Katsuyama
Year: 2007
Load Redistribution in Heterogeneous Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Koutny; J. Safarik
Year: 2007
Exogeneous Management in Autonomic Service Compositions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Colman
Year: 2007
A Survey of Autonomic Computing Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Nami; K. Bertels
Year: 2007
The Bio-inspired Service Life-Cycle: An Overview
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Pfeffer; D. Linner; I. Radusch; S. Steglich
Year: 2007
A Fuzzy Constraint-Directed Autonomous Learning to Support Agent Negotiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ting-Jung Yu; K.R. Lai; Menq-Wen Lin; Bo-Rue Kao
Year: 2007
Multi-robot Exploration Based on Market Approach and Immune Optimizing Strategy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guangming Xiong; Jianwei Gong; Huiyan Chen; Zhibao Su
Year: 2007
Modeling Distributed Scheduling via Fuzzy Constraint-Based Agent Negotiation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.R. Lai; Menq-Wen Lin; Bo-Rue Kao
Year: 2007
Digital Stock Control Mechanism in Electronic Retail Companies in UK
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Ariwa; K. Lukani
Year: 2007
Teach and Playback of Realistic Target Reaching Movement of Virtual Human Upper Limb
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meng Na; Li Ding; Peifa Jia
Year: 2007
A New Hardware Module for Stereo Matching Using Zernike Moments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Gonidis; L. Kotoulas; I. Andreadis
Year: 2007
Towards Robust Layered Learning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Richert; B. Kleinjohann
Year: 2007
Algorithms and Design for an Autonomous Biological System
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Roy; A.K. Thakur; A. Pande; M. Rahman
Year: 2007
Towards Collective Spatial Awareness Using Binary Relations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Holzmann; A. Ferscha
Year: 2007
Server Autonomic Grouping Process for the Wireless Network Environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Tsiligaridis; R. Acharya
Year: 2007
Feedback Control Theoretic Technique for Data Centers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.H.F. Aly; H. Lutfiyya
Year: 2007
Mobile Agent for Efficient Routing among Source Nodes in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Shakshuki; Xinyu Xing; H. Malik
Year: 2007
Dynamic Provisioning of Resources in Data Centers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Simmons; A. McCloskey; H. Lutfiyya
Year: 2007
Comparison and Performance Evaluation of Mobile Agent Platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Trillo; S. Ilarri; E. Mena
Year: 2007
Ontology-Based Digital Ecosystem Conceptual Representation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hai Dong; F.K. Hussain; E. Chang
Year: 2007
Autonomic Goal-Oriented Business Process Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Greenwood; G. Rimassa
Year: 2007
Separating Pistachio Varieties Using Automatic Trainable Classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Omid; A. Mahmoudi; A. Aghagolzadeh; A.M. Borghaee
Year: 2007
An Investigation of Sharing Seller Reputation among Buyers in Agent-Based Markets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Beldona; C. Tsatsoulis
Year: 2007
The Adapta Framework for Building Self-Adaptive Distributed Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A.S. Sallem; F.J. da Silva e Silva
Year: 2007
Sensor Network Grids: Agent Environments Combined with QoS in Wireless Sensor Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Stathis; S. Kafetzoglou; S. Papavassiliou; S. Bromuri
Year: 2007
Non-linear Optimization of Performance Functions for Autonomic Database Performance Tuning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Rabinovitch; D. Wiese
Year: 2007
Autonomic Systems, Coping Strategies adn Dream Functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Adams
Year: 2007
Use Case Driven Approach to Self-Monitoring in Autonomic Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.R. Haydarlou; M.A. Oey; B.J. Overeinder; F.M.T. Brazier
Year: 2007
A Mobile Phone-Enhanced Remote Surveillance System with Electric Power Appliance Control and Network Camera Homing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Imai; Y. Hori; S. Masuda
Year: 2007
On Modeling Adaptation in Context-Aware Mobile Grid Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Otebolaku; M.O. Adigun; J.S. Iyilade; O.O. Ekabua
Year: 2007
Self-Inspection Mechanisms for the Support of Autonomic Decisions in Internet-Based Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Andreolini; S. Casolari; M. Colajanni
Year: 2007
GRID Resource Consumption Estimates and Planning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Grabarnik; L. Kozakov; V. Lemberg; I. Rish; L. Shwartz
Year: 2007
System Health in Locally Autonomic Radio-Telescopes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. van Veelen
Year: 2007
SVC-Based Multivariate Control Charts for Automatic Anomaly Detection in Computer Networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhisheng Zhang; Xuejun Zhu
Year: 2007
Autonomic Behaviour in QoS Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Anane
Year: 2007
A Multi-Agent-Based Architecture for Enterprise Customer and Supplier Cooperation Context-Aware Information Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liu Xiang
Year: 2007
A Cyberforaging Infrastructure Based on Web Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Haofan Liang; H. Lutfiyya
Year: 2007
Architecting Principles for Self-Managing Enterprise IT Systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.A. Delic; J.A. Riley; Y. Faihe
Year: 2007
Towards a DL-Based Semantic User Model for Web Personalization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanwu Yang; C. Claramunt; M.-A. Aufaure
Year: 2007
Natural Search Queries for Consumer-Oriented Databases.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Lipczak; E. Milios
Year: 2007
A Context Sensitive Public Display for Adaptive Multi-User Information Visualization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.H. Morales-Aranda; O. Mayora-Ibarra
Year: 2007
Using Annotated Policy Documents as a User Interface for Process Management
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.S. Abrahams; D.M. Eyers
Year: 2007
AMI-SME: An Exploratory Approach to Knowledge Retrieval for SME's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Gawrysiak; H. Rybinski; L. Skonieczny; P. Wiech
Year: 2007
Generating Adaptable User Interfaces for Browsing XML Documents User Interfaces Adaptation Using User Profiles of Applications Policies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Encelle; N. Baptiste-Jessel
Year: 2007
Knowledge Map: Toward a New Approach Supporting the Knowledge Management in Distributed Data Mining
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.-A. Le-Khac; L.M. Aouad; M.-T. Kechadi
Year: 2007
Transpiring Interfaces: Turning Transparency on Its Head
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.R. Ekbia
Year: 2007
NewsMe: A Case Study for Adaptive News Systems with Open User Model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Wongchokprasitti; P. Brusilovsky
Year: 2007
Author index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Editors Preface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
Abstract authors index
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2007
A Computational Study of Detonation of Propagation in PBX-9404 Using CTH and LASmerf Codes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Lawrence
Year: 2007
Breaching of Triple-Brick Walls: Numerical Simulations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Akers; D. Rickman; J. Ehrgott
Year: 2007
Statistical Fatigue and Residual Strength Analysis of New/Aging Aircraft Structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Fawaz; B. Andersson
Year: 2007
Applied Computational Fluid Dynamics in Support of Aircraft/Store Compatibility and Weapons Integration-2007 Edition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Babcock
Year: 2007
Characterization of High Altitude Turbulence for Air Force Platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.H. Ruggiero; B. Nichols; J. Werne; D.E. Wroblewski
Year: 2007
Computations of a Maneuvering Unmanned Combat Air Vehicle Using a High-Order Overset Grid Method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.E. Gordnier; S.E. Sherer; M.R. Visbal
Year: 2007
High Resolution Simulation of Full Aircraft Control at Flight Reynolds Numbers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Morton; J.R. Forsythe; D.R. McDaniel; K. Bergeron; R.M. Cummings; S. Goertz; J. Seidel; K.D. Squires
Year: 2007
HPC Enhancement of Plume Modeling for Use by Military Simulators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Obenschain; A. Moses
Year: 2007
Lattice Boltzmann Algorithms for Fluid Turbulence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Vahala; Min Soe; S. Ziegeler; J. Yepez; L. Vahala
Year: 2007
Multi-Scale Predictability of High-Impact Stratospheric Clear Air Turbulence Events for Air Force Platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Mahalov; M. Moustaoui; B. Nichols
Year: 2007
Time-Accurate Calculations of Free-Flight Aerodynamics of Maneuvering Projectiles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Sahu
Year: 2007
Active Flow Control of Low-Pressure Turbine Separation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Balzer; A. Gross; H.F. Fasel
Year: 2007
Combustion Chamber Fluid Dynamics and Hypergolic Gel Propellant Chemistry Simulations for Selectable Thrust Rocket Engines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.J. Nusca; Chiung-Chu Chen; M.J. McQuaid
Year: 2007
Computational Investigations of Air Entrainment, Hysteresis, and Loading for Large-Scale, Buoyant Cavities
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.P. Kinzel; J.W. Lindau; J. Peltier; F. Zajaczkowski; T. Mallison; R.F. Kunz; R. Arndt; M. Wosnik
Year: 2007
Computational Modeling of the CH-47 Helicopter in Hover
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.C.B. Dimanlig; E.T. Meadowcroft; R. Strawn; M. Potsdam
Year: 2007
Direct Quantum Mechanical Simulations of Shocked Energetic Materials Supporting Future Force Insensitive Munitions Requirements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Mattson; N.A. Romero; B.M. Rice
Year: 2007
Effect of Curved Radial Vane Cavity Arrangements on Predicted Inter-Turbine Burner (ITB) Performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Thornburg; B. Sekar; J. Zelina; R. Greenwood
Year: 2007
Fast and Accurate CBR Defense for Homeland Security: Bringing HPC to the First Responder and Warfighter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Patnaik; J.P. Boris
Year: 2007
Integrated Analysis of Scramjet Flowpath with Innovative Inlets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.V. Gaitonde; H.B. Ebrahimi
Year: 2007
Large Eddy Simulations of Bluff-Body Stabilized Turbulent Flames and Gas Turbine Combustors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. James; J. Zhu; M.S. Anand; B. Sekar
Year: 2007
Simulation of Enhance-Explosive Devices in Chambers and Tunnels
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Bell; V. Beckner; A.L. Kuhl
Year: 2007
ab Initio Molecular Dynamics Simulations of Molten Ni-Based Superalloys
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Asta; D. Trinkle; C. Woodward
Year: 2007
Calculations for Gas-Flow Driven Molecular Rotor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Vacek; J. Chocholousova; J. Michl
Year: 2007
Chemical Oxygen-Iodine Layer Device Simulation Using the 3D, unsteady Navier-Stokes Equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.J. Madden
Year: 2007
Computational Chemistry Modeling of the Atmospheric Fate of Toxic Industrial Compounds (TICs)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.W. Bunte; M.M. Hurley; D.E. Taylor; D. Curran; K. Runge; D. Burns; M. Cory; J. Vasey
Year: 2007
Design of Energetic Ionic Liquids
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Boatz; G.A. Voth; M.S. Gordon; S. Hammes-Schiffer
Year: 2007


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