IEEE - Institute of Electrical and Electronics Engineers, Inc. - Overview of device characterization software for VLSI bipolar devices

Author(s): Akcasu, O.E. ; Bouknight, J.L. ; Nicolay, H.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1982
Conference Location: San Francisco, CA, USA, USA
Conference Date: 13 December 1982
Page(s): 692 - 695
DOI: 10.1109/IEDM.1982.190388
Regular:

In this paper we present a software package for calculating the SPICE II Gummel-Poon modeling parameters for BJT device structures encountered in VLSl IC's directly from mask geometry and... View More

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