IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise in multi-heterostructure avalanche photodetectors

Author(s): Rakshit, S. ; Chakraborti, N.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1982
Conference Location: San Francisco, CA, USA, USA
Conference Date: 13 December 1982
Page(s): 338 - 341
DOI: 10.1109/IEDM.1982.190289
Regular:

The multiplication noise in multiheterostructure avalanche photodetectors has been calculated for different degrees of carrier feedback. For this purpose, a multiple-feedback network... View More

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