IEEE - Institute of Electrical and Electronics Engineers, Inc. - Infrared sensing charge imaging matrix

Author(s): Morris, H.B. ; Borrello, S.R. ; Simmons, A. ; Schiebel, R.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1982
Conference Location: San Francisco, CA, USA, USA
Conference Date: 13 December 1982
Page(s): 153 - 156
DOI: 10.1109/IEDM.1982.190238
Regular:

Two-dimensional arrays of a new and novel infrared detector, the Charge Imaging Matrix, (CIM), based on HgCdTe charge transfer devices have been demonstrated on p-type HgCdTe of 0.13 eV and 0.25... View More

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