IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of a free-fall velocity and CTD profiler, TOPS

1982 IEEE Second Working Conference on Current Measurement

Author(s): Hayes, S. ; Milburn, H. ; Ford, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1982
Conference Location: Hilton Head, SC, USA
Conference Date: 1 January 1982
Volume: 2
Page(s): 165 - 172
DOI: 10.1109/CCM.1982.1158438
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