IEEE - Institute of Electrical and Electronics Engineers, Inc. - Induced Electromagnetic Noise from Contact Discharge - Measurement and Statistical Characteristics

1981 IEEE International Symposium on Electromagnetic Compatibility

Author(s): Tasuku Takagi ; Hiroshi Inoue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1981
Conference Location: Boulder, Colorado, USA, USA
Conference Date: 18 August 1981
Page(s): 1 - 6
ISBN (Paper): 978-1-5090-3167-2
DOI: 10.1109/ISEMC.1981.7569957
Advertisement