IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Transmission Line Model for Silicided Diffusions: Impact on the Performance of VLSI Circuits

Author(s): Scott, D. B. ; Hunter, W. R. ; Shichijo, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1981
Conference Location: Maui, HI, USA, USA
Conference Date: 9 September 1981
Page(s): 94 - 95
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