IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Method of Detecting Hot Spots on Semiconductors using Liquid Crystals

Author(s): Hiatt, John
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1981
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 7 April 1981
Page(s): 130 - 133
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1981.362984
Regular:

This paper presents a failure analysis technique which uses cholesteric liquid crystals and polarized light to locate areas of high power dissipation on an integrated circuit. The technique is... View More

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