IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory Retention Life at Various Environmental and Life Tests

Author(s): Isagawa, Masaaki ; Oniyama, Hideo ; Azegami, Hideo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1981
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 7 April 1981
Page(s): 52 - 55
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1981.362973
Regular:

The memory retention life and its repeatability was examined under conditions of high temperature storage, temperature cycling, bias operating, and high humidity, and after write/erase cycles for... View More

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