IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental and Theoretical Characterization of Near Surface Cracks in Solids by Photoacoustic Microscopy

Author(s): Kuo, P.K. ; Inglehart, L.J. ; Favro, L.O. ; Thomas, R.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1981
Conference Location: Chicago, IL, USA, USA
Conference Date: 14 October 1981
Page(s): 837 - 839
DOI: 10.1109/ULTSYM.1981.197741
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