IEEE - Institute of Electrical and Electronics Engineers, Inc. - Autoclave vs. 85-¦C/85% R. H. Testing - A Comparison

Author(s): McGarvey, William J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1979
Conference Location: San Diego, CA, USA, USA
Conference Date: 24 April 1979
Page(s): 136 - 142
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1979.362883
Regular:

The wide use of plastic encapsulated MOS-LSI integrated circuits (IC) has aroused much concern regarding moisture integrity testing. This paper discusses the results of both unbiased autoclave... View More

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