IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resistive-gate CTD area image sensor

1978 IEEE International Solid-State Circuits Conference

Author(s): H. Heyns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1978
Conference Location: San Francisco, CA, USA, USA
Conference Date: 15 February 1978
Volume: XXI
Page(s): 32 - 33
DOI: 10.1109/ISSCC.1978.1155820
Regular:

The resistive gate sensor concept that combines high functional density, good blue sensitivity and an effective anti-blooming operating, will be described. A super-8 format 300 × 200 element... View More

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