IEEE - Institute of Electrical and Electronics Engineers, Inc. - Buried injector logic: Second generation I2L performance

1978 IEEE International Solid-State Circuits Conference

Author(s): A. Yiannoulos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1978
Conference Location: San Francisco, CA, USA, USA
Conference Date: 15 February 1978
Volume: XXI
Page(s): 12 - 13
DOI: 10.1109/ISSCC.1978.1155812
Regular:

A vertically structured I2L gate, integrated with linear SBC processing, will be discussed. Previous (standard I2L) logic/linear function conflicts stemming from structural... View More

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