IEEE - Institute of Electrical and Electronics Engineers, Inc. - A systematic approach to test and fault isolation of digital avionics

Author(s): Lee, E.C. ; Schmaltz, C.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1978
Conference Location: San Diego, CA, USA, USA
Conference Date: 1 January 1978
Page(s): 143 - 146
DOI: 10.1109/AUTEST.1978.764355
Regular:

Testing and fault isolation techniques described provided for a thorough testing of Complex Digital Avionic Systems at actual system clock speeds with a high fault isolation rate. Significant ly... View More

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