IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect Characterization by Ultrasonic Signal Process Techniques

Author(s): Elsley, R.K. ; Tittman, B.R. ; Nadler, H.L. ; Ahlberg, L.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1977
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 26 October 1977
Page(s): 48 - 52
DOI: 10.1109/ULTSYM.1977.196791
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