IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of tube storage life degradation by means of mass spectrometer analysis

Author(s): Gray, H.F. ; Haas, G.A. ; Thomas, R.E. ; Pankey, T., Jr.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1976
Conference Location: Washigton, DC, USA, USA
Conference Date: 6 December 1976
Page(s): 651 - 654
DOI: 10.1109/IEDM.1976.189130
Regular:

Electron tubes with small internal volume often fail by arcing when turned on after extended shelf life. We have identified the major failure mechanism in a particular tube type which has an... View More

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