IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transient drift dominated bipolar conduction with recombination

Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1976

Author(s): Markus Zahn ; Richard J. Sojka
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1976
Conference Location: Buck Hill Falls, PA, USA, USA
Conference Date: 18 October 1976
Page(s): 117 - 127
ISBN (Paper): 978-0-309-02860-8
DOI: 10.1109/CEIDP.1976.7733921
Regular:

A drift-dominated conduction model is often used in conduction analysis where the velocities of charge carriers are proportional to the local electric field through their mobilities, and in turn... View More

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