IEEE - Institute of Electrical and Electronics Engineers, Inc. - A V-Band Network Analyzer/Reflection Test Unit

Author(s): Yuan, L.T. ; Yamaguchi, G.M. ; Raue, J.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1976
Conference Location: Cherry Hill, NJ, USA, USA
Conference Date: 14 June 1976
Page(s): 221 - 223
DOI: 10.1109/MWSYM.1976.1123702
Regular:

This paper describes the design, fabrication and performance of a novel V-band network analyzer/reflection test unit which is capable of operation over a wide frequency range in the 50 to 75 GHz... View More

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