IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Evolution of Automated Microwave Measurements

Author(s): Meyer, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1975
Conference Location: Palo Alto, CA, USA, USA
Conference Date: 12 May 1975
Page(s): 92 - 94
DOI: 10.1109/MWSYM.1975.1123292
Regular:

Microwave measurements lend themselves to automation because many readings and much computation is often needed to achieve reasonable accuracies. The expense of automated microwave measurements... View More

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