IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computer-Aided Tolerance Optimization Applied to Microwave Circuits

S-MTT International Microwave Symposium Digest

Author(s): Bandler, J.W. ; Liu, P.C. ; Chen, J.H.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1974
Conference Location: Atlanta, Georgia, USA
Conference Date: 1 June 1974
Volume: 74
Page(s): 275 - 277
DOI: 10.1109/MWSYM.1974.1123571
Regular:

A very important practical problem in microwave circuit design is the problem of optimal design subject to component tolerances. An approach which treats the component tolerance assignment as an... View More

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