IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Model for the Failure of Bipolar Silicon Integrated Circuits Subjected to Electrostatic Discharge

Author(s): Speakman, Thomas S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1974
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 2 April 1974
Page(s): 60 - 69
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1974.362628
Regular:

The results are presented of a study into the mechanism by which failure occurs in an integrated circuit when it is subjected to a discharge of static electricity. The current that flows through... View More

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