IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exact modeling of time-dependent phenomena in an MOS structure

Author(s): Collins, T.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1973
Conference Location: Washington, DC, USA, USA
Conference Date: 3 December 1973
Page(s): 342 - 345
DOI: 10.1109/IEDM.1973.188725
Regular:

The main thrust of this work was to develop new numerical methods to obtain viable solutions for the exact set of time-dependent equations that govern the dynamics of a metal-insulator-semiView More

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