IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental measurement of noise in charge-coupled devices

Author(s): Carnes, J.E. ; Kosonocky, W.F. ; Levine, P.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1972
Conference Location: Washington, DC, USA, USA
Conference Date: 4 December 1972
Page(s): 52
DOI: 10.1109/IEDM.1972.249282
Regular:

Various workers have predicted that the CCD should be a low-noise device. This paper will discuss measurements of noise in 32, 64 and 128 bit 2-phase silicon/aluminum gate CCD's which tend to... View More

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