IEEE - Institute of Electrical and Electronics Engineers, Inc. - Avalanche breakdown of evaporated SiO thin films

Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1972

Author(s): Nuio Tsuchida ; Minoru Ueda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1972
Conference Location: Buck Hill Falls, PA, USA, USA
Conference Date: 23 October 1972
Page(s): 353 - 358
ISBN (Paper): 978-0-309-02112-8
DOI: 10.1109/CEIDP.1972.7734187
Regular:

Many experimental results and theories have been presented on the dielectric breakdown phenomenon of various thin films.1,2 We have studied the dielectric breakdown phenomenon of... View More

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