IEEE - Institute of Electrical and Electronics Engineers, Inc. - Universal test sets for logic networks

13th Annual Symposium on Switching and Automata Theory (swat 1972)

Author(s): Akers, Sheldon B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1972
Conference Location: USA, USA
Conference Date: 25 October 1972
Page(s): 177 - 184
ISSN (Paper): 0272-4847
DOI: 10.1109/SWAT.1972.30
Regular:

This paper examines the problem of finding a single universal test set that will test any of a variety of different implementations of a given switching function. It is shown that, for and/or... View More

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