IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability of memory technologies

9th Reliability Physics Symposium

Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1971
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 31 March 1971
Page(s): 67 - 68
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1971.362494
Regular:

The subject of the session as put to the panel and audience by Will Kauffman, was a comparison of the various competing memory technologies with respect to: 1. Reliability; 2. Performance; and 3.... View More

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