IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability studies utilizing rapid-scan microscopy

Author(s): Gonzales, A.J. ; Varker, C.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1970
Conference Location: Washington, DC, USA, USA
Conference Date: 28 October 1970
Page(s): 50
DOI: 10.1109/IEDM.1970.188246
Regular:

The conventional slow-scanning electron-microscope system has permitted limited monitoring of dynamic events. The information is recorded on sheet photographic film requiring 30-60 sec exposure... View More

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