IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bias Instability in Two-Layer MIS Structures

Author(s): Curry, J. J. ; Nigh, H. E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1970
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 7 April 1970
Page(s): 29 - 33
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1970.362429
Regular:

MIS structures consisting of a deposited film of A12O3 or Si3N4 on thermally grown SiO2 were studied to determine the effect that charge accumulation at the deposited film-SiO2 interface has on... View More

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