IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new generalized likelihood ratio philosophy

1970 IEEE Symposium on Adaptive Processes Decision and Control

Author(s): C. P. Hatsell ; L. W. Nolte
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1970
Conference Location: Austin, TX, USA, USA
Conference Date: 7 December 1970
Page(s): 72
DOI: 10.1109/SAP.1970.269961
Regular:

A new philosophy for designing detection devices is presented which embodies some of the better features of the classical generalized likelihood ratio test and the classical Bayes test. A feature... View More

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