IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurment of Phase Characteristics of Tapered Slow Wave Structures

Author(s): Kowalski, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1969
Conference Location: London, UK, UK
Conference Date: 8 September 1969
Page(s): 427 - 428
DOI: 10.1109/EUMA.1969.331935
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