IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement techniques for evaluating thin-film piezoelectric transducers

1968 IEEE International Solid-State Circuits Conference

Author(s): Bahr, A. ; Reeder, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1968
Conference Location: Philadelphia, PA, USA, USA
Conference Date: 14 February 1968
Volume: XI
Page(s): 14 - 15
DOI: 10.1109/ISSCC.1968.1154600
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