IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computer calculations of avalanche-induced relaxation oscillations in silicon diodes

Author(s): Ward, A.L. ; Udelson, B.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1967
Conference Location: Washington, DC, USA, USA
Conference Date: 18 October 1967
Page(s): 48
DOI: 10.1109/IEDM.1967.187809
Regular:

In a computer study of breakdown in silicon diodes, relaxation oscillations were found to occur. The computer program treats field-dependent ionization coefficients, recombination, field-dependent... View More

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