IEEE - Institute of Electrical and Electronics Engineers, Inc. - Factors Affecting the Reliability of Wet Tantalum Capacitors

Author(s): Rowe, W. M. ; Eisenberg, P. H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1967
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 6 November 1967
Page(s): 243 - 255
ISSN (Paper): 0735-0791
DOI: 10.1109/IRPS.1967.362417
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