IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental Confirmation of Precipitation and Oxidation in Evanohm Condensate Thin Films

Author(s): Levinson, David W. ; Stewart, Robert G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1964
Conference Location: Chicago, IL, USA, USA
Conference Date: 29 September 1964
Page(s): 281 - 305
ISSN (Paper): 0097-2088
DOI: 10.1109/IRPS.1964.362292
Regular:

BY ELECTRON and optical microscopic techniques, the precipitation out of the original solid solution of a phase based on Ni3Al has been observed in the metal films condensed from the alloy... View More

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