IEEE - Institute of Electrical and Electronics Engineers, Inc. - Stray capacitance in thin film circuits

Author(s): Happ, W.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1962
Conference Location: Washington, DC, USA, USA
Conference Date: 25 October 1962
Page(s): 42
DOI: 10.1109/IEDM.1962.187300
Regular:

The interelectrode capacitance in film-type circuits becomes a critical design limitation as dimensions decrease and as substrates of high dielectric constants are developed. Design charts and... View More

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