IEEE - Institute of Electrical and Electronics Engineers, Inc. - Current Noise Measurement as a Failure Analysis Tool for Film Resistors

Author(s): Curtis, J. G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1962
Conference Location: Chicago, IL, USA, USA
Conference Date: 26 September 1962
Page(s): 204 - 213
ISSN (Paper): 0097-2088
DOI: 10.1109/IRPS.1962.359996
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