IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Application of Automatic, High-Speed Measurement Techniques to Cytology

Author(s): Tolles, W.E. ; Bostrom, R.C. ; Sawyer, H.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1956
Conference Location: New York, NY, USA, USA
Conference Date: 19 March 1956
Page(s): 17 - 23
DOI: 10.1109/IRENC.1956.199148
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