IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave measurements of dielectrics in free space

1950 Conference on Electrical Insulation

Author(s): D. J. Epstein
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1950
Conference Location: Pocono Manor, PA, USA
Conference Date: 1 November 1950
Page(s): 97
ISBN (Paper): 978-1-5090-3127-6
DOI: 10.1109/CEI.1950.7513623
Regular:

The measurement of dielectric properties in the microwave band is usually accomplished by placing the sample in a waveguide or resonant cavity. Free-space methods, while lacking the general... View More

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