IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave measurements of dielectrics in free space
1950 Conference on Electrical Insulation
Author(s): | D. J. Epstein |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 November 1950 |
Conference Location: | Pocono Manor, PA, USA |
Conference Date: | 1 November 1950 |
Page(s): | 97 |
ISBN (Paper): | 978-1-5090-3127-6 |
DOI: | 10.1109/CEI.1950.7513623 |
Regular:
The measurement of dielectric properties in the microwave band is usually accomplished by placing the sample in a waveguide or resonant cavity. Free-space methods, while lacking the general... View More